WO2013145853A1 - 電子制御装置 - Google Patents
電子制御装置 Download PDFInfo
- Publication number
- WO2013145853A1 WO2013145853A1 PCT/JP2013/052308 JP2013052308W WO2013145853A1 WO 2013145853 A1 WO2013145853 A1 WO 2013145853A1 JP 2013052308 W JP2013052308 W JP 2013052308W WO 2013145853 A1 WO2013145853 A1 WO 2013145853A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- voltage
- input terminal
- circuit
- power supply
- electronic control
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60W—CONJOINT CONTROL OF VEHICLE SUB-UNITS OF DIFFERENT TYPE OR DIFFERENT FUNCTION; CONTROL SYSTEMS SPECIALLY ADAPTED FOR HYBRID VEHICLES; ROAD VEHICLE DRIVE CONTROL SYSTEMS FOR PURPOSES NOT RELATED TO THE CONTROL OF A PARTICULAR SUB-UNIT
- B60W10/00—Conjoint control of vehicle sub-units of different type or different function
- B60W10/18—Conjoint control of vehicle sub-units of different type or different function including control of braking systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/006—Measuring power factor
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/30—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/30—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations
- G06F1/305—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations in the event of power-supply fluctuations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60W—CONJOINT CONTROL OF VEHICLE SUB-UNITS OF DIFFERENT TYPE OR DIFFERENT FUNCTION; CONTROL SYSTEMS SPECIALLY ADAPTED FOR HYBRID VEHICLES; ROAD VEHICLE DRIVE CONTROL SYSTEMS FOR PURPOSES NOT RELATED TO THE CONTROL OF A PARTICULAR SUB-UNIT
- B60W2556/00—Input parameters relating to data
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60W—CONJOINT CONTROL OF VEHICLE SUB-UNITS OF DIFFERENT TYPE OR DIFFERENT FUNCTION; CONTROL SYSTEMS SPECIALLY ADAPTED FOR HYBRID VEHICLES; ROAD VEHICLE DRIVE CONTROL SYSTEMS FOR PURPOSES NOT RELATED TO THE CONTROL OF A PARTICULAR SUB-UNIT
- B60W2710/00—Output or target parameters relating to a particular sub-units
- B60W2710/18—Braking system
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Definitions
- the present invention relates to an electronic control device mounted on an automobile or the like.
- a reference voltage Vref is generated from the input voltage Vin, the constant voltage circuit that outputs the reference voltage Vref to the control circuit, and the drive voltage Vcc is generated by stepping down the input voltage Vin, and the drive voltage Vcc is used as the control circuit.
- a power supply device that includes an output step-down circuit is known (see Patent Document 1).
- the power supply device includes a power storage unit in which a plurality of electric double layer capacitors are connected in series.
- the voltage Vb of the main power source and the voltage Vc of the power storage unit are higher.
- a voltage that is reduced by the forward voltage of the diode is used as the input voltage Vin.
- the present invention has been made in view of the above-described problems, and its main object is to have a small influence on the circuit mounting area and cost, and to reduce the operating voltage range, and to reduce the operating voltage range. This is to realize voltage abnormality determination.
- An electronic control device includes an arithmetic circuit having a first input terminal and a second input terminal, a power supply circuit for supplying a power supply voltage to the first input terminal, and a divided voltage obtained by dividing the power supply voltage.
- a voltage dividing circuit for output, a capacitor having one end connected to the second input terminal and the other end grounded, connected between the voltage dividing circuit and the second input terminal, and in cooperation with the capacitor;
- a voltage separation element that outputs a reference voltage separated from the power supply voltage and the divided voltage to the second input terminal, and the arithmetic circuit uses the reference voltage input to the second input terminal to Detect abnormalities.
- the present invention it is possible to realize the abnormality determination of the power supply voltage in the electronic control device without affecting the circuit mounting area and the cost and without narrowing the operating voltage range.
- FIG. 1 shows schematic structure of the electronic controller by this invention. It is a figure which shows the structure of the abnormal voltage detection circuit by a comparative example. It is a figure which shows the structure of the reference voltage generation circuit by 1st embodiment of this invention. It is a figure which shows the structure of the reference voltage generation circuit at the time of using resistance for a voltage separation element as 1st embodiment. It is a figure which shows the structure of the reference voltage generation circuit at the time of using a switch circuit for a voltage separation element as 2nd embodiment. It is a figure which shows the structure of the reference voltage generation circuit at the time of using resistance and a switch circuit for a voltage separation element as 3rd embodiment. It is a figure which shows the structure of the reference voltage generation circuit at the time of using another switch circuit for a voltage separation element as 4th embodiment. It is a figure which shows the structure of the reference voltage generation circuit by 5th embodiment of this invention.
- FIG. 1 is a diagram showing a schematic configuration of an ECU (Electronic Control Unit) as an electronic control device according to the present invention.
- the ECU 1 includes a power supply IC 11, a reference voltage generation circuit 12, a microcomputer 13, and an external load drive circuit 15.
- the ECU 1 is used by being mounted on an automobile.
- the power supply IC 11 receives power supply from a battery mounted on the vehicle, and generates a power supply voltage VCC based on the power supply.
- the power supply voltage VCC is supplied from the power supply IC 11 to the microcomputer 13 and is also supplied to various sensors 3 provided outside the ECU 1.
- the various sensors 3 are sensors for detecting the running state of the vehicle, and include, for example, a sensor for detecting the vehicle speed and a sensor for detecting the engine rotation speed. Signals indicating detection results of the various sensors 3 are output from the various sensors 3 to the ECU 1 and used in vehicle control performed by the ECU 1.
- the reference voltage generation circuit 12 takes in the power supply voltage VCC supplied from the power supply IC 11 to the microcomputer 13, and based on this, the divided voltage Vc and the reference voltage Vr used for detecting an abnormality in the power supply voltage VCC in the microcomputer 13. Is output to the microcomputer 13. Details of the reference voltage generation circuit 12 will be described later.
- the microcomputer 13 incorporates an analog-to-digital (A / D) converter 14, and uses the analog-to-digital converter 14 to convert input signals from various sensors 3 into digital values and take them in. Then, a predetermined calculation process is performed using the acquired digital value, and a drive command is output to the external load drive circuit 15 based on the calculation result.
- a / D analog-to-digital
- the external load drive circuit 15 controls the drive of the actuator 4 according to the drive command from the microcomputer 13.
- the actuator 4 is provided to perform various operations in the vehicle, and adjusts the fuel injection amount, for example.
- the microcomputer 13 converts the divided voltage Vc and the reference voltage Vr from the reference voltage generation circuit 12 into digital values using the AD converter 14 in addition to the input signals from the various sensors 3. Capture. Then, by comparing these digital values, when the power supply voltage VCC is abnormal, the abnormality is detected. When detecting that the power supply voltage VCC is abnormal, the microcomputer 13 controls the actuator 4 so as to perform a preset operation when an abnormality occurs, so that the vehicle can be safely stopped.
- FIG. 2 is a diagram showing a configuration of a conventional abnormal voltage detection circuit as a comparative example for comparison with the reference voltage generation circuit 12 according to the present invention.
- the abnormal voltage detection circuit compares the voltage obtained by dividing the VCC voltage by the resistors 31 and 32 with the reference voltage Vref generated by the reference voltage source 33 in the comparator circuit 34.
- the reference voltage source 33 generates a reference voltage Vref based on the band gap energy of silicon.
- the comparison result by the comparator circuit 34 is input to the low voltage detection determination circuit 35. Based on the comparison result from the comparator circuit 34, the low voltage detection determination circuit 35 determines whether or not the VCC voltage is abnormal. If it is determined that the VCC voltage is abnormal, the low voltage detection determination circuit 35 outputs a reset signal for stopping the microcomputer. appear.
- the abnormal voltage detection circuit as described above when the VCC voltage drops below a predetermined value, this can be detected as an abnormal drop in the VCC voltage. However, when the VCC voltage rises above a predetermined value, this cannot be detected as an abnormal rise in the VCC voltage. It should be noted that by combining a plurality of abnormal voltage detection circuits as shown in FIG. 2, it is possible to realize abnormal drop detection and abnormal rise detection of the VCC voltage, but in this case, the circuit configuration becomes complicated and the cost of the electronic control device is reduced. The problem of up occurs.
- the reference voltage Vref is generated regardless of the VCC voltage using the band gap energy of silicon, and the VCC voltage is abnormal by comparing this with the VCC voltage. It is determined whether or not there is. For this reason, there arises a problem that the variation in the VCC voltage caused by the individual difference of the power supply circuit cannot be reflected in the threshold of the abnormal voltage.
- the reference voltage generation circuit 12 is configured as shown in FIG.
- the operation of the reference voltage generation circuit 12 will be described with reference to FIG.
- the reference voltage generation circuit 12 has a circuit configuration as shown in a broken line, and includes a voltage dividing resistor 16, a voltage dividing resistor 17, a voltage separation element 18, and a capacitor 19.
- the voltage dividing resistor 16 and the voltage dividing resistor 17 constitute a voltage dividing circuit, which divides the power supply voltage VCC output from the power supply IC 11 and generates a divided voltage Vc between the voltage dividing resistor 16 and the voltage dividing resistor 17. Generate.
- This divided voltage Vc is output to the input terminal Vcin of the microcomputer 13 and also to the voltage separation element 18.
- the value of the divided voltage Vc is determined by the value of the power supply voltage VCC and the voltage division ratio determined according to the resistance values of the voltage dividing resistor 16 and the voltage dividing resistor 17.
- the capacitor 19 has one end connected to the input terminal Vrin of the microcomputer 13 and the other end grounded.
- the voltage separation element 18 is an element for generating a reference voltage Vr separated from the power supply voltage VCC and the divided voltage Vc in cooperation with the capacitor 19. Connected between.
- the reference voltage Vr generated by the voltage separation element 18 and the capacitor 19 is output to the input terminal Vrin of the microcomputer 13. A specific example and operation of the voltage separation element 18 will be described in detail later.
- the power supply IC 11 supplies the power supply voltage VCC to the input terminal VCCin of the microcomputer 13.
- the microcomputer 13 receives the supply of the power supply voltage VCC, and converts the reference voltage Vr input to the input terminal Vrin and the divided voltage Vc input to the input terminal Vcin into digital values by the AD converter 14, respectively. Convert to and import. Then, these digital values are compared with each other, and an abnormality in the power supply voltage VCC is detected based on the comparison result.
- the microcomputer 13 compares the reference voltage Vr converted into a digital value by the AD converter 14 and the divided voltage Vc, thereby detecting an abnormality in the power supply voltage VCC. . Therefore, it is possible to realize the abnormal rise detection of the VCC voltage, which is impossible in the comparative example described with reference to FIG.
- the reference voltage Vr is generated based on the divided voltage Vc obtained by dividing the power supply voltage VCC, and an abnormality of the power supply voltage VCC is detected using this. Therefore, it is possible to accurately detect an abnormality in the power supply voltage VCC, reflecting variations in the power supply voltage VCC caused by individual differences in the power supply ICs 11.
- FIG. 4 is a diagram showing a configuration of the reference voltage generation circuit 12 when the resistor 20 is used for the voltage separation element 18.
- a resistor 20 and a capacitor 19 constitute an integrating circuit.
- the output from the integration circuit is output to the input terminal Vrin of the microcomputer 13 as the reference voltage Vr.
- the divided voltage Vc and the reference voltage Vr are output with the same magnitude.
- the fluctuation of the reference voltage Vr output from the integrating circuit is delayed according to the time constant determined according to the resistance value of the resistor 20 and the capacitance value of the capacitor 19, and the voltage before the fluctuation even after the power supply voltage VCC fluctuates. The value is held for a certain period. That is, the reference voltage Vr can be output as a voltage separated from the power supply voltage VCC and the divided voltage Vc by the delay action of the integration circuit.
- the microcomputer 13 compares the reference voltage Vr converted into a digital value by the AD converter 14 and the divided voltage Vc, and the power supply voltage VCC is abnormal when the difference between these values exceeds a predetermined value. Therefore, it is possible to detect an abnormality in the power supply voltage VCC.
- the time constant of the integrating circuit in the circuit configuration of FIG. 4 is the time from when the power supply IC 11 starts supplying the power supply voltage VCC to when the operation of the microcomputer 13 is started, or when an abnormality occurs in the power supply voltage VCC. Is preferably set according to the time until the microcomputer 13 detects the abnormality. For example, setting a time constant shorter than the startup time of the microcomputer 13 so that the time constant becomes shorter than the time from when the power supply IC 11 starts supplying the power supply voltage VCC to when the operation of the microcomputer 13 is started. Thus, the charging of the capacitor 19 can be completed before the operation of the microcomputer 13 is started.
- the microcomputer 13 compares the reference voltage Vr with the divided voltage Vc so that the time constant is longer than the time from when the abnormality occurs in the power supply voltage VCC until the microcomputer 13 detects the abnormality.
- the microcomputer 13 compares the reference voltage Vr with the divided voltage Vc so that the time constant is longer than the time from when the abnormality occurs in the power supply voltage VCC until the microcomputer 13 detects the abnormality.
- the microcomputer 13 compares the reference voltage Vr and the divided voltage Vc at a cycle of 1 msec and detects an abnormality in the power supply voltage VCC when the difference between them is 50 mV or more, the capacitance value of the capacitor 19 is changed. 1 ⁇ F and the resistance value of the resistor 20 can be 50 k ⁇ .
- the ECU 1 uses the microcomputer 13 having the input terminal VCCin and the input terminal Vrin, the power supply IC 11 that supplies the power supply voltage VCC to the input terminal VCCin, and the divided voltage obtained by dividing the power supply voltage VCC as the reference voltage generation circuit 12.
- a voltage dividing resistor 16 and a voltage dividing resistor 17 constituting a voltage dividing circuit for outputting Vc, a capacitor 19 having one end connected to the input terminal Vrin and the other end grounded, and the voltage dividing circuit and the input terminal Vrin
- a voltage separation element 18 is provided which is connected between them and cooperates with the capacitor 19 to output the reference voltage Vr separated from the power supply voltage VCC and the divided voltage Vc to the input terminal Vrin.
- the microcomputer 13 detects an abnormality in the power supply voltage VCC using the reference voltage Vr input to the input terminal Vrin. Since this is done, it is possible to realize abnormality determination of the power supply voltage VCC in the ECU 1 without affecting the circuit mounting area and cost and without narrowing the operating voltage range.
- the microcomputer 13 further has an input terminal Vcin for inputting the divided voltage Vc from the voltage dividing circuit, the reference voltage Vr input to the input terminal Vrin, and the divided voltage input to the input terminal Vcin. Compared with Vc, an abnormality in the power supply voltage VCC is detected based on the comparison result. Since it did in this way, the abnormality of the power supply voltage VCC can be detected easily and reliably.
- the voltage separation element 18 includes a resistor 20.
- the resistor 20 and the capacitor 19 constitute an integrating circuit, and the output from the integrating circuit is output as the reference voltage Vr to the input terminal Vrin.
- the time constant of the integration circuit includes the time from when the power supply IC 11 starts supplying the power supply voltage VCC to the operation of the microcomputer 13 and the microcomputer 13 after the abnormality occurs in the power supply voltage VCC. It can be set according to at least one of the time until the abnormality is detected. By doing so, it is possible to complete the charging of the capacitor 19 before the operation of the microcomputer 13 is started, or to detect the abnormality of the power supply voltage VCC more reliably.
- FIG. 5 is a diagram illustrating a configuration of the reference voltage generation circuit 12 when a switch circuit including MOSFETs 21 and 22, a capacitor 23, and diodes 24 and 25 is used as the voltage separation element 18.
- n-type MOSFETs 21 and 22 operate as switch elements by switching the conduction state between the drain and the source in accordance with the gate voltage Vb from the power supply IC 11.
- the sources of the MOSFETs 21 and 22 are connected to each other.
- the drain of the MOSFET 21 is connected to the voltage dividing circuit side, and the drain of the MOSFET 22 is connected to the input terminal Vrin side of the microcomputer 13.
- MOSFETs 21 and 22 having a leakage current as small as possible.
- the capacitor 23 has one end connected between the MOSFET 21 and the MOSFET 22 and the other end grounded.
- Diodes 24 and 25 are provided to protect MOSFETs 21 and 22 from reverse voltages, respectively.
- the diode 24 is connected between both switch ends of the MOSFET 21, that is, between the drain and the source, with the direction from the source side to the drain side, that is, the direction from the capacitor 23 toward the voltage dividing circuit.
- the diode 25 is connected between both switch ends of the MOSFET 22, that is, between the drain and the source, with the direction from the source side to the drain side, that is, the direction from the capacitor 23 toward the input terminal Vrin of the microcomputer 13. Yes.
- the diodes 24 and 25 may be built in the MOSFETs 21 and 22, respectively.
- the power supply IC 11 When the power supply voltage VCC from the power supply IC 11 is a constant normal value, the divided voltage Vc and the reference voltage Vr are output with the same magnitude. At this time, the power supply IC 11 periodically switches and outputs the gate voltage Vb from Low to High as a control signal for controlling the switching operation of the MOSFETs 21 and 22. Then, during the period when the gate voltage Vb is High, the MOSFETs 21 and 22 are switched from the open state to the conductive state, and the capacitors 19 and 23 are charged according to the reference voltage Vr.
- the power supply IC 11 stops the control signal and maintains the gate voltage Vb at a low level. Then, the MOSFETs 21 and 22 are opened, and the voltage dividing circuit constituted by the voltage dividing resistor 16 and the voltage dividing resistor 17 and the input terminal Vrin of the microcomputer 13 are disconnected. As a result, the reference voltage Vr is maintained at the voltage before the change. Thereby, the reference voltage Vr can be output as a voltage separated from the power supply voltage VCC and the divided voltage Vc.
- the microcomputer 13 compares the reference voltage Vr converted into a digital value by the AD converter 14 and the divided voltage Vc, and the power supply voltage VCC is abnormal when the difference between these values exceeds a predetermined value. Therefore, it is possible to detect an abnormality in the power supply voltage VCC.
- the period in which the power supply IC 11 periodically switches the gate voltage Vb from low to high can hold the reference voltage Vr constant when the power supply voltage VCC is a constant normal value. It is preferable to set a value such that VCC is not determined to be abnormal. This can be determined in consideration of the leakage current of the MOSFETs 21 and 22 and the leakage current from the capacitor 19 to the input terminal Vrin of the microcomputer 13.
- the leakage currents of the MOSFETs 21 and 22 and the leakage current from the capacitor 19 to the input terminal Vrin are 1 ⁇ A and 0.2 ⁇ A, respectively, and the microcomputer 13 has a difference between the reference voltage Vr and the divided voltage Vc of 50 mV or more.
- the cycle in which the power supply IC 11 switches the gate voltage Vb can be set to 40 msec.
- the voltage separation element 18 includes a switch circuit for switching the connection state between the voltage dividing circuit constituted by the voltage dividing resistor 16 and the voltage dividing resistor 17 and the input terminal Vrin of the microcomputer 13.
- This switch circuit includes a MOSFET 21 connected to the voltage dividing circuit side, a MOSFET 22 connected to the input terminal Vrin side, a capacitor 23 having one end connected between the MOSFET 21 and the MOSFET 22 and the other end grounded, A diode 24 connected between both switch ends of the MOSFET 21 and having a forward direction from the capacitor 23 toward the voltage dividing circuit and a diode 24 connected between both switch ends of the MOSFET 22 and a direction toward the input terminal Vrin from the capacitor 23 in the forward direction And a diode 25.
- the MOSFETs 21 and 22 are opened, and the voltage dividing circuit and the input terminal Vrin are disconnected.
- the reference voltage Vr before the fluctuation is maintained for a longer time than in the first embodiment, so that the voltage is separated from the power supply voltage VCC and the divided voltage Vc.
- the reference voltage Vr can be output.
- the power supply IC 11 periodically outputs the gate voltage Vb as a control signal for switching the MOSFETs 21 and 22 from the open state to the conductive state to the MOSFETs 21 and 22, and when an abnormality occurs in the power supply voltage VCC The control signal is stopped to disconnect between the voltage dividing circuit and the input terminal Vrin.
- the capacitors 19 and 23 are charged according to the reference voltage Vr when the power supply voltage VCC is normal, and when the power supply voltage VCC is abnormal, the MOSFETs 21 and 22 are opened and the reference voltage Vr is not changed. Voltage can be maintained.
- the example of the switch circuit using the MOSFETs 21 and 22 has been described as the switch element, but other switch elements may be used.
- the capacitor 23 and the diodes 24 and 25 may be deleted if not necessary.
- the connection state between the voltage dividing circuit constituted by the voltage dividing resistor 16 and the voltage dividing resistor 17 and the input terminal Vrin of the microcomputer 13 can be switched, and the connection can be disconnected when an abnormality occurs in the power supply voltage VCC.
- Any switch circuit having any configuration may be used as the voltage separation element 18.
- the gate voltage Vb may be output from other than the power supply IC 11.
- FIG. 6 is a diagram showing a configuration of the reference voltage generation circuit 12 when these are used for the voltage separation element 18.
- the resistor 20 and the switch circuit composed of the MOSFETs 21 and 22, the capacitor 23, and the diodes 24 and 25 perform the same operations as described in the first embodiment and the second embodiment, respectively. .
- the circuit is configured by the resistor 20 and the capacitor 19.
- the reference voltage Vr can be held at a voltage before the fluctuation for a certain period.
- FIG. 7 is a diagram showing a configuration of the reference voltage generation circuit 12 when such a switch circuit different from that of FIG. 5 is used for the voltage separation element 18.
- the switch circuit composed of the MOSFET 22 and the diode 25 performs the same operation as described in the second embodiment.
- the gate voltage Vb is periodically switched from Low to High as a control signal for controlling the switching operation of the MOSFET 22 and output.
- VCC becomes abnormal and changes its size, it is stopped and kept low.
- FIG. 8 is a diagram showing a configuration of the reference voltage generation circuit 12 according to the present embodiment. In the present embodiment, any of those described in the first to fourth embodiments may be used as the voltage separation element 18.
- the microcomputer 13 is not provided with the input terminal Vcin, and the divided voltage Vc from the voltage dividing circuit constituted by the voltage dividing resistor 16 and the voltage dividing resistor 17 is supplied to the microcomputer 13. Not output. Therefore, the microcomputer 13 uses the AD converter 14 to convert the reference voltage Vr inputted to the input terminal Vrin and the power supply voltage VCC inputted to the input terminal VCCin into digital values without using the divided voltage Vc. Convert and import. Then, these digital values are compared with each other, and an abnormality in the power supply voltage VCC is detected based on the comparison result.
- the microcomputer 13 converts each digital value into a digital value by the AD converter 14 based on the power supply voltage VCC. Therefore, when the power supply voltage VCC becomes an abnormal voltage, there is no abnormality in the reference voltage Vr, but the value read by the microcomputer 13 varies. As a result, it is possible to detect an abnormality in the power supply voltage VCC by determining that the power supply voltage VCC is abnormal when these differences are equal to or greater than a predetermined value.
- the microcomputer 13 compares the reference voltage Vr input to the input terminal Vrin with the power supply voltage VCC input to the input terminal VCCin, and detects an abnormality in the power supply voltage VCC based on the comparison result. Since this is done, it is possible to detect an abnormality in the power supply voltage VCC without providing the microcomputer 13 with an input terminal Vcin for taking in the divided voltage Vc.
- the ECU 1 used by being mounted on an automobile has been described as an example.
- the present invention is not limited to this.
- the present invention can be applied to any electronic control device as long as a power supply voltage is supplied to an arithmetic circuit such as a microcomputer and an abnormality in the power supply voltage is detected.
- microcomputer 13 is used as an arithmetic circuit.
- arithmetic circuits such as a DSP (Digital Signal Processor) and a PLD (Programmable Logic Device) may be used.
- ECU 11 Power IC 12 Reference voltage generation circuit 13
- Microcomputer 14 AD converter 15 External load drive circuit 16, 17 Voltage dividing resistor 18 Voltage separation element 19
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Combustion & Propulsion (AREA)
- Transportation (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Dc-Dc Converters (AREA)
- Measurement Of Current Or Voltage (AREA)
- Power Sources (AREA)
- Electronic Switches (AREA)
Abstract
Description
本発明の第一の実施形態について以下に説明する。図1は、本発明による電子制御装置としてのECU(Electronic Control Unit)の概略構成を示す図である。図1に示すように、ECU1は、電源IC11、基準電圧生成回路12、マイコン13および外部負荷駆動回路15を備える。このECU1は、自動車に搭載されて使用されるものである。
次に、本発明の第二の実施形態について説明する。本実施形態では、図3の電圧分離素子18に、分圧抵抗16および分圧抵抗17によって構成される分圧回路とマイコン13の入力端子Vrinとの間の接続状態を切り替えるためのスイッチ回路を用いた場合の例を説明する。図5は、電圧分離素子18に、MOSFET21、22、コンデンサ23、ダイオード24、25により構成されるスイッチ回路を用いた場合の基準電圧生成回路12の構成を示す図である。
次に、本発明の第三の実施形態について説明する。本実施形態では、図3の電圧分離素子18に、図4に示した抵抗20と、図5に示したスイッチ回路とを用いた場合の例を説明する。図6は、電圧分離素子18にこれらを用いた場合の基準電圧生成回路12の構成を示す図である。
次に、本発明の第四の実施形態について説明する。本実施形態では、第二の実施形態で説明した図5のスイッチ回路から、MOSFET21、コンデンサ23およびダイオード24を削除し、MOSFET22およびダイオード25のみを用いてスイッチ回路を構成した場合の例を説明する。図7は、このような図5とは別のスイッチ回路を電圧分離素子18に用いた場合の基準電圧生成回路12の構成を示す図である。
次に、本発明の第五の実施形態について説明する。本実施形態では、マイコン13から分圧電圧Vcを取り込むための図3の入力端子Vcinを削除した例を説明する。図8は、本実施形態による基準電圧生成回路12の構成を示す図である。なお、本実施形態において、電圧分離素子18には、上記第一~第四の各実施形態で説明したもののうちいずれを用いてもよい。
11 電源IC
12 基準電圧生成回路
13 マイコン
14 A-D変換器
15 外部負荷駆動回路
16、17 分圧抵抗
18 電圧分離素子
19 コンデンサ
20 抵抗
21、22 MOSFET
23 コンデンサ
24、25 ダイオード
Claims (15)
- 第1の入力端子および第2の入力端子を有する演算回路と、
前記第1の入力端子に電源電圧を供給する電源回路と、
前記電源電圧を分圧した分圧電圧を出力する分圧回路と、
一端が前記第2の入力端子に接続され、他端が接地されたコンデンサと、
前記分圧回路と前記第2の入力端子との間に接続され、前記コンデンサと協働して、前記電源電圧および前記分圧電圧から分離された基準電圧を前記第2の入力端子へ出力する電圧分離素子とを備え、
前記演算回路は、前記第2の入力端子に入力された前記基準電圧を用いて、前記電源電圧の異常を検知することを特徴とする電子制御装置。 - 請求項1に記載の電子制御装置において、
前記演算回路は、
前記分圧回路から前記分圧電圧を入力するための第3の入力端子をさらに有し、
前記第2の入力端子に入力された前記基準電圧と、前記第3の入力端子に入力された前記分圧電圧とを比較し、その比較結果に基づいて前記電源電圧の異常を検知することを特徴とする電子制御装置。 - 請求項1に記載の電子制御装置において、
前記演算回路は、前記第2の入力端子に入力された前記基準電圧と、前記第1の入力端子に入力された前記電源電圧とを比較し、その比較結果に基づいて前記電源電圧の異常を検知することを特徴とする電子制御装置。 - 請求項1乃至3のいずれか一項に記載の電子制御装置において、
前記電圧分離素子は抵抗を含み、
前記抵抗と前記コンデンサとで積分回路を構成し、該積分回路からの出力を前記基準電圧として前記第2の入力端子へ出力することを特徴とする電子制御装置。 - 請求項4に記載の電子制御装置において、
前記積分回路の時定数は、前記電源回路が前記電源電圧の供給を開始してから前記演算回路の動作が開始されるまでの時間と、前記電源電圧に異常が発生してから前記演算回路がその異常を検知するまでの時間とのいずれか少なくとも一方に応じて設定されることを特徴とする電子制御装置。 - 請求項4に記載の電子制御装置において、
前記電圧分離素子はさらに、前記分圧回路と前記第2の入力端子との間の接続状態を切り替えるためのスイッチ回路を含むことを特徴とする電子制御装置。 - 請求項6に記載の電子制御装置において、
前記スイッチ回路は、
前記分圧回路側に接続された第1のスイッチ素子と、
前記第2の入力端子側に接続された第2のスイッチ素子と、
一端が前記第1のスイッチ素子と前記第2のスイッチ素子との間に接続され、他端が接地されたスイッチ回路コンデンサと、
前記第1のスイッチ素子の両スイッチ端間に接続され、前記スイッチ回路コンデンサから前記分圧回路へ向かう方向を順方向とする第1のダイオードと、
前記第2のスイッチ素子の両スイッチ端間に接続され、前記スイッチ回路コンデンサから前記第2の入力端子へ向かう方向を順方向とする第2のダイオードと、を含み、
前記電源電圧に異常が発生した場合、前記第1のスイッチ素子および前記第2のスイッチ素子を開放状態として、前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項7に記載の電子制御装置において、
前記電源回路は、前記第1のスイッチ素子および前記第2のスイッチ素子を開放状態から導通状態に切り替えるための信号を前記第1のスイッチ素子および前記第2のスイッチ素子へ定期的に出力し、前記信号を停止することで前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項6に記載の電子制御装置において、
前記スイッチ回路は、
スイッチ素子と、
前記スイッチ素子の両スイッチ端間に接続され、前記分圧回路から前記第2の入力端子へ向かう方向または前記第2の入力端子から前記分圧回路へ向かう方向を順方向とするダイオードと、を含み、
前記電源電圧に異常が発生した場合、前記スイッチ素子を開放して、前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項9に記載の電子制御装置において、
前記電源回路は、前記スイッチ素子を開放状態から導通状態に切り替えるための信号を前記スイッチ素子へ定期的に出力すると共に、前記信号を停止することで前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項1乃至3のいずれか一項に記載の電子制御装置において、
前記電圧分離素子は、前記分圧回路と前記第2の入力端子との間の接続状態を切り替えるためのスイッチ回路を含むことを特徴とする電子制御装置。 - 請求項11に記載の電子制御装置において、
前記スイッチ回路は、
前記分圧回路側に接続された第1のスイッチ素子と、
前記第2の入力端子側に接続された第2のスイッチ素子と、
一端が前記第1のスイッチ素子と前記第2のスイッチ素子との間に接続され、他端が接地されたスイッチ回路コンデンサと、
前記第1のスイッチ素子の両スイッチ端間に接続され、前記スイッチ回路コンデンサから前記分圧回路へ向かう方向を順方向とする第1のダイオードと、
前記第2のスイッチ素子の両スイッチ端間に接続され、前記スイッチ回路コンデンサから前記第2の入力端子へ向かう方向を順方向とする第2のダイオードと、を含み、
前記電源電圧に異常が発生した場合、前記第1のスイッチ素子および前記第2のスイッチ素子を開放状態として、前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項12に記載の電子制御装置において、
前記電源回路は、前記第1のスイッチ素子および前記第2のスイッチ素子を開放状態から導通状態に切り替えるための信号を前記第1のスイッチ素子および前記第2のスイッチ素子へ定期的に出力すると共に、前記信号を停止することで前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項11に記載の電子制御装置において、
前記スイッチ回路は、
スイッチ素子と、
前記スイッチ素子の両スイッチ端間に接続され、前記分圧回路から前記第2の入力端子へ向かう方向または前記第2の入力端子から前記分圧回路へ向かう方向を順方向とするダイオードと、を含み、
前記電源電圧に異常が発生した場合、前記スイッチ素子を開放して、前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。 - 請求項14に記載の電子制御装置において、
前記電源回路は、前記スイッチ素子を開放状態から導通状態に切り替えるための信号を前記スイッチ素子へ定期的に出力すると共に、前記信号を停止することで前記分圧回路と前記第2の入力端子との間を切断することを特徴とする電子制御装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/379,709 US9600047B2 (en) | 2012-03-30 | 2013-02-01 | Electronic control unit |
CN201380007983.5A CN104094189B (zh) | 2012-03-30 | 2013-02-01 | 电子控制装置 |
DE112013005691.7T DE112013005691T5 (de) | 2012-03-30 | 2013-02-01 | Elektronische Steuereinheit |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012080820A JP5806159B2 (ja) | 2012-03-30 | 2012-03-30 | 電子制御装置 |
JP2012-080820 | 2012-03-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013145853A1 true WO2013145853A1 (ja) | 2013-10-03 |
Family
ID=49259138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2013/052308 WO2013145853A1 (ja) | 2012-03-30 | 2013-02-01 | 電子制御装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9600047B2 (ja) |
JP (1) | JP5806159B2 (ja) |
CN (1) | CN104094189B (ja) |
DE (1) | DE112013005691T5 (ja) |
WO (1) | WO2013145853A1 (ja) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5387238B2 (ja) * | 2009-08-04 | 2014-01-15 | 株式会社三洋物産 | 遊技機 |
US9778325B2 (en) * | 2014-07-29 | 2017-10-03 | Infineon Technologies Ag | Sensor with micro break compensation |
US9537438B2 (en) * | 2015-01-12 | 2017-01-03 | Cummins Power Generation, Ip, Inc. | Buss potential isolation module |
US10136197B2 (en) | 2015-04-29 | 2018-11-20 | Hewlett-Packard Development Company, L.P. | Connector element information detections |
US10841571B2 (en) | 2015-06-30 | 2020-11-17 | Magna Electronics Inc. | Vehicle camera testing system |
US10215799B2 (en) * | 2016-02-16 | 2019-02-26 | Magna Electronics Inc. | Diagnositc circuitry for powered sensor multiple unique faults diagnostics and resistive fault tolerant interface to microprocessor |
DE112017003178T5 (de) * | 2016-08-31 | 2019-04-04 | Hitachi Automotive Systems, Ltd. | Elektronische Steuervorrichtung |
US10540756B2 (en) | 2017-01-19 | 2020-01-21 | Magna Electronics Inc. | Vehicle vision system with lens shading correction |
US10368063B2 (en) | 2017-04-17 | 2019-07-30 | Magna Electronics Inc. | Optical test device for a vehicle camera and testing method |
FR3066050B1 (fr) * | 2017-05-04 | 2019-06-21 | Stmicroelectronics (Rousset) Sas | Procede et dispositif de controle de l'alimentation d'une unite de traitement |
US10659852B2 (en) | 2017-07-20 | 2020-05-19 | Hewlett-Packard Development Company, L.P. | Connector element information detections |
JP7063223B2 (ja) | 2018-10-05 | 2022-05-09 | 株式会社デンソー | 電子制御装置 |
CN109683109A (zh) * | 2018-12-29 | 2019-04-26 | 厦门科华恒盛股份有限公司 | 故障检测电路及控制、判断故障的方法 |
CN115145349A (zh) | 2021-03-30 | 2022-10-04 | 台达电子工业股份有限公司 | 供电系统及方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS647728A (en) * | 1987-06-30 | 1989-01-11 | Nec Corp | Instantaneous interruption preventing circuit |
JP2001160004A (ja) * | 1999-12-03 | 2001-06-12 | Denso Corp | 電子制御装置 |
JP2008105478A (ja) * | 2006-10-24 | 2008-05-08 | Denso Corp | バッテリ状態検出装置 |
JP2011038997A (ja) * | 2009-08-18 | 2011-02-24 | Renesas Electronics Corp | 電池電圧監視装置と方法 |
WO2011148592A1 (ja) * | 2010-05-25 | 2011-12-01 | パナソニック株式会社 | 過電流検知回路、及び電池パック |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5438270A (en) * | 1994-06-24 | 1995-08-01 | National Semiconductor Corporation | Low battery tester comparing load and no-load battery voltage |
JPH1183912A (ja) * | 1997-09-09 | 1999-03-26 | Matsushita Electric Ind Co Ltd | 電池電圧監視装置 |
JP2005326313A (ja) * | 2004-05-14 | 2005-11-24 | Osaka Gas Co Ltd | 電圧変動検知回路 |
JP4561548B2 (ja) | 2005-09-13 | 2010-10-13 | セイコーエプソン株式会社 | 電圧算出装置 |
JP4573884B2 (ja) * | 2008-06-18 | 2010-11-04 | 三菱電機株式会社 | 車載電子制御装置の電源異常検出回路 |
US20100017381A1 (en) * | 2008-07-09 | 2010-01-21 | Avoca Semiconductor Inc. | Triggering of database search in direct and relational modes |
JP2010074870A (ja) | 2008-09-16 | 2010-04-02 | Panasonic Corp | 電源装置 |
TWI419449B (zh) * | 2009-03-12 | 2013-12-11 | Richtek Technology Corp | 改善暫態變化反應之電源供應電路、及其控制電路與方法 |
JP5501070B2 (ja) * | 2010-03-31 | 2014-05-21 | 本田技研工業株式会社 | 電源電圧保護装置、及び、電源電圧保護方法 |
-
2012
- 2012-03-30 JP JP2012080820A patent/JP5806159B2/ja active Active
-
2013
- 2013-02-01 DE DE112013005691.7T patent/DE112013005691T5/de not_active Withdrawn
- 2013-02-01 US US14/379,709 patent/US9600047B2/en active Active
- 2013-02-01 CN CN201380007983.5A patent/CN104094189B/zh active Active
- 2013-02-01 WO PCT/JP2013/052308 patent/WO2013145853A1/ja active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS647728A (en) * | 1987-06-30 | 1989-01-11 | Nec Corp | Instantaneous interruption preventing circuit |
JP2001160004A (ja) * | 1999-12-03 | 2001-06-12 | Denso Corp | 電子制御装置 |
JP2008105478A (ja) * | 2006-10-24 | 2008-05-08 | Denso Corp | バッテリ状態検出装置 |
JP2011038997A (ja) * | 2009-08-18 | 2011-02-24 | Renesas Electronics Corp | 電池電圧監視装置と方法 |
WO2011148592A1 (ja) * | 2010-05-25 | 2011-12-01 | パナソニック株式会社 | 過電流検知回路、及び電池パック |
Also Published As
Publication number | Publication date |
---|---|
CN104094189B (zh) | 2016-11-09 |
US20150039913A1 (en) | 2015-02-05 |
CN104094189A (zh) | 2014-10-08 |
JP5806159B2 (ja) | 2015-11-10 |
JP2013210855A (ja) | 2013-10-10 |
US9600047B2 (en) | 2017-03-21 |
DE112013005691T5 (de) | 2015-12-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5806159B2 (ja) | 電子制御装置 | |
JP7227844B2 (ja) | バッテリ監視装置及び電動車両の制御装置 | |
US20220021233A1 (en) | In-vehicle backup power source control apparatus and in-vehicle backup power source apparatus | |
JP2008109822A (ja) | 車両用交流発電機の制御装置 | |
US10525913B2 (en) | Electronic control device | |
US11368015B2 (en) | Process for testing the operability of a circuit breaker device | |
JPWO2018225235A1 (ja) | Dc/dcコンバータの制御装置 | |
US10044261B2 (en) | Power supply device | |
US11398748B2 (en) | In-vehicle backup power supply control device and in-vehicle backup power supply | |
JP4882938B2 (ja) | 電源回路 | |
JP4066261B2 (ja) | 並列モニタを有する電気二重層キャパシタ用充電回路 | |
KR101629580B1 (ko) | 개방 검출 기능을 갖는 반도체 장치 | |
JP2014225953A (ja) | 電源装置 | |
US10498272B2 (en) | Control device of electric rotating machine | |
JP2012244826A (ja) | 蓄電装置 | |
JP6421707B2 (ja) | 電源回路 | |
JPH11338556A (ja) | 電源回路 | |
JP2011188694A (ja) | 同期整流型dc/dcコンバータ | |
JP2019186880A (ja) | 負荷駆動装置 | |
JP5582116B2 (ja) | 電子制御装置 | |
US8085012B2 (en) | Semiconductor integrated circuit and sensor driving/measuring system | |
JP2018146459A (ja) | 故障検出回路 | |
US10734827B2 (en) | Power supply system | |
JP2010074870A (ja) | 電源装置 | |
JP4826445B2 (ja) | Dc−dcコンバータの出力制御装置、dc−dcコンバータおよびその制御方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 13768475 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 14379709 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 112013005691 Country of ref document: DE Ref document number: 1120130056917 Country of ref document: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 13768475 Country of ref document: EP Kind code of ref document: A1 |