WO2013089305A1 - 전자빔 조사를 이용한 몰리브덴 박막의 전도도 향상 방법 - Google Patents
전자빔 조사를 이용한 몰리브덴 박막의 전도도 향상 방법 Download PDFInfo
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- WO2013089305A1 WO2013089305A1 PCT/KR2011/010278 KR2011010278W WO2013089305A1 WO 2013089305 A1 WO2013089305 A1 WO 2013089305A1 KR 2011010278 W KR2011010278 W KR 2011010278W WO 2013089305 A1 WO2013089305 A1 WO 2013089305A1
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- thin film
- solar cell
- film
- molybdenum thin
- molybdenum
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- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 title claims abstract description 92
- 229910052750 molybdenum Inorganic materials 0.000 title claims abstract description 92
- 239000011733 molybdenum Substances 0.000 title claims abstract description 92
- 238000000034 method Methods 0.000 title claims abstract description 52
- 238000010894 electron beam technology Methods 0.000 title claims abstract description 19
- 239000010409 thin film Substances 0.000 title abstract description 97
- 230000002708 enhancing effect Effects 0.000 title abstract 2
- 230000008569 process Effects 0.000 claims abstract description 39
- 238000004519 manufacturing process Methods 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 21
- 230000001678 irradiating effect Effects 0.000 claims abstract description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 239000007789 gas Substances 0.000 claims description 5
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 238000012805 post-processing Methods 0.000 abstract 2
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 210000004027 cell Anatomy 0.000 description 85
- 239000010408 film Substances 0.000 description 74
- 239000010949 copper Substances 0.000 description 35
- 230000031700 light absorption Effects 0.000 description 35
- 230000000052 comparative effect Effects 0.000 description 33
- 239000010410 layer Substances 0.000 description 25
- 239000000463 material Substances 0.000 description 16
- 239000011669 selenium Substances 0.000 description 16
- 239000002243 precursor Substances 0.000 description 12
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 11
- 150000001875 compounds Chemical class 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 11
- 239000011521 glass Substances 0.000 description 11
- 239000004065 semiconductor Substances 0.000 description 11
- 229910052717 sulfur Inorganic materials 0.000 description 11
- 239000011593 sulfur Substances 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 238000005259 measurement Methods 0.000 description 8
- 238000004544 sputter deposition Methods 0.000 description 8
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 7
- 229910052738 indium Inorganic materials 0.000 description 7
- 229910052711 selenium Inorganic materials 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 238000009713 electroplating Methods 0.000 description 4
- 229910052733 gallium Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 239000011135 tin Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 3
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- 239000007858 starting material Substances 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- XIMIGUBYDJDCKI-UHFFFAOYSA-N diselenium Chemical compound [Se]=[Se] XIMIGUBYDJDCKI-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010549 co-Evaporation Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 229920005570 flexible polymer Polymers 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 230000008570 general process Effects 0.000 description 1
- 239000002784 hot electron Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- 238000003852 thin film production method Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
- H01L31/0749—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type including a AIBIIICVI compound, e.g. CdS/CulnSe2 [CIS] heterojunction solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a solar cell manufacturing method, and more particularly, to a manufacturing method of a solar cell capable of improving the conductivity of the molybdenum thin film constituting the solar cell.
- the solar cell is a device for directly converting solar energy into electrical energy, and may be classified into silicon based solar cells, compound based solar cells, and organic based solar cells according to materials used.
- Silicon based solar cells are classified into monocrystalline silicon solar cells, polycrystalline silicon solar cells and amorphous silicon solar cells, and compound based solar cells are GaAs, InP, CdTe solar cells, CuInSe 2 (copper.indium.diselenide) or CuInS 2 ( Hereinafter referred to as "CIS" solar cell, Cu (InGa) Se 2 (copper.indium.gallium.selenium) or Cu (InGa) S 2 (hereinafter referred to as "CIGS”) solar cell and Cu 2 ZnSnS 4 ( Copper, zinc, tin, sulfur, hereinafter referred to as "CZTS").
- CIS CuInSe 2
- CuInGa) Se 2 copper.indium.gallium.selenium
- Cu (InGa) S 2 hereinafter referred to as "CIGS”
- CZTS Copper, zinc, tin, sulfur
- the organic solar cell may be classified into an organic molecular solar cell, an organic-inorganic hybrid solar cell, and a dye-sensitized solar cell.
- the single crystal silicon solar cell and the polycrystalline silicon solar cell are very disadvantageous in terms of cost reduction because the substrate is provided with a light absorption film.
- the amorphous silicon solar cell Since the amorphous silicon solar cell has a light absorption film that is a thin film, the amorphous silicon solar cell may be manufactured to have a thickness of about 1/100 of the thickness of the crystalline silicon solar cell.
- an amorphous silicon solar cell has a problem that the efficiency is lower than that of a single crystal silicon solar cell, and the efficiency decreases sharply when exposed to light due to the characteristics of the silicon material.
- Organic-based solar cells have a problem that not only the efficiency is very low but also the oxidation is reduced when exposed to oxygen.
- CZTS solar cells CZTS solar cells
- CIS solar cells CZTS solar cells
- CIGS solar cells which are compound solar cells
- these conversion efficiencies have been obtained in the laboratory, and there are a number of things that need to be supplemented to make CZTS solar cells, CIS solar cells and CIGS solar cells practical.
- molybdenum Mo 110
- a glass substrate through a DC sputtering process to form a back electrode.
- a special post-treatment process is not performed after the molybdenum electrode layer is formed, and a molybdenum thin film having a resistivity of about 3 ⁇ 10 ⁇ 5 and a thickness of 400 nm to 1000 nm is used as a back electrode.
- An object of the present invention is to provide a solar cell manufacturing method capable of reducing the specific resistance of the molybdenum thin film, which is a back electrode, and reducing the thickness thereof, thereby improving the conductivity of the molybdenum thin film.
- the solar cell manufacturing method comprises the steps of forming a molybdenum thin film on the substrate; And performing a post-treatment process on the molybdenum thin film to form a back electrode, wherein the post-treatment process on the molybdenum thin film is made by irradiating an electron beam to the molybdenum thin film.
- the post-treatment process for the molybdenum thin film is performed with a DC power of 2.5 to 3.5 Kv and an RF power of 200 to 300 W in a process chamber under argon gas atmosphere conditions at a pressure of 7 x 10E -7 torr and a flow rate of 5 to 10 sccm. It is preferably carried out using an electron beam of.
- the solar cell manufacturing method according to the present invention as described above can reduce the specific resistance while reducing the thickness of the molybdenum thin film in the step of forming the back electrode and at the same time can reduce the electrode material and shorten the process time.
- FIG. 1 schematically shows the structure of a Cu-Zn-Sn-S (Cu 2 ZnSnS 4 ) solar cell, a CuInS 2 , a Cu (InGa) Se 2 solar cell, and a Cu (InGa) S 2 solar cell according to the present invention. drawing.
- FIG. 2A-2G illustrate the steps of manufacturing the solar cell shown in FIG. 1.
- Example 3 is a photograph showing the molybdenum thin film prepared in Comparative Example 1 and Example 1, respectively, the left photograph shows the molybdenum thin film according to Comparative Example 1, and the right photograph shows the molybdenum thin film according to Example 1.
- Example 4 is a photograph showing the molybdenum thin film prepared in Comparative Example 2 and Example 2, respectively, the left photograph shows the molybdenum thin film according to Comparative Example 2, and the right photograph shows the molybdenum thin film according to Example 2.
- Example 5 is a photograph showing the molybdenum thin film prepared in Comparative Example 3 and Example 3, respectively, the left photograph shows the molybdenum thin film according to Comparative Example 3, and the right photograph shows the molybdenum thin film according to Example 3.
- Example 6 is a photograph showing a molybdenum thin film prepared in Comparative Example 4 and Example 4, respectively, the left photograph shows a molybdenum thin film according to Comparative Example 4, and the right photograph shows a molybdenum thin film according to Example 4.
- FIG. 7 is a graph showing the results of the measurement of the resistivity of the molybdenum thin film according to Comparative Examples 1, 2, 3 and 4 and the molybdenum thin film according to Examples 1, 2, 3 and 4, the left graph according to Comparative Examples 1 to 4 The resistivity measurement results of the molybdenum thin film, the graph on the right shows the resistivity measurement results of the molybdenum thin film according to Examples 1 to 4.
- CZTS Cu-Zn-Sn-S
- CIS CuInSe 2 or CuInS 2
- CIS CuInGa Se 2 Or Cu (InGa) S 2
- CGS Cu-Zn-Sn-S
- CZTS solar cells, CIS solar cells and CIGS solar cells have the same structure. That is, the CZTS solar cell, the CIS solar cell, and the CIGS solar cell each have a back electrode 20, a light absorption film 30, a buffer film 40, a window film 50, and an anti-reflection film 60 on the substrate 10.
- the substrate 10 may be made of glass.
- the substrate 10 may be made of a ceramic such as alumina, stainless steel, a metal material such as copper tape, and a polymer.
- Inexpensive soda lime glass can be used as the material of the glass substrate.
- a flexible polymer material such as polyimide or a stainless steel thin plate may also be used as the material of the substrate 10.
- Molybdenum (Mo) may be used as a material of the back electrode 20 formed on the substrate 10.
- Molybdenum has high electrical conductivity and has high temperature stability under ohmic bonding with a Cu-Zn-Sn-S (Cu2ZnSnS4) light absorbing film to be described later and in a sulfur (S) atmosphere.
- molybdenum has high temperature stability under ohmic bonding with a CuInSe 2 light absorbing film or a CuInS 2 light absorbing film described later, and in a selenium (Se) or sulfur (S) atmosphere.
- the molybdenum thin film should have a low specific resistance as an electrode, and should be excellent in adhesion to a glass substrate so that peeling does not occur due to a difference in thermal expansion coefficient.
- the light absorption film 30 formed on the rear positive electrode 20 is actually a p-type semiconductor that absorbs light.
- the light absorption film 30 is made of Cu—Zn—Sn—S (specifically, Cu 2 ZnSnS 4 ).
- Cu 2 ZnSnS 4 has an energy band gap of 1.0 eV or more and has the highest light absorption coefficient among semiconductors.
- the film made of these materials is ideally suited as a light absorbing film for solar cells.
- the manufacturing process is very difficult.
- Physical thin film manufacturing methods include evaporation, sputtering + selenization, and chemical plating, such as electroplating. Various methods may be used depending on the type of starting material (metal, binary compound, etc.) in each method. have.
- a CuInSe 2 film or a CuInS 2 film in a CIS solar cell, a CuInSe 2 film or a CuInS 2 film, and in a CIGS solar cell, a Cu (InGa) Se 2 film or a Cu (InGa) S 2 film functions as a light absorption film 30. Since CuInSe 2 and CuInS 2 and Cu (InGa) Se 2 and Cu (InGa) S 2 have an energy band gap of 1.0 eV or more and the light absorption coefficient is the highest among semiconductors and is extremely optically stable, films made of these materials are solar cells. It is very ideal as a light absorption film.
- CIS thin film and CIGS thin film which are light absorption films, are multi-component compounds, the manufacturing process is very difficult.
- Physical thin film production methods include evaporation, sputtering + selenization, and chemical plating, such as electroplating. Various methods may be used depending on the type of starting material (metal, binary compound, etc.) in each method. have. Simultaneous evaporation, known to achieve the best efficiency, uses four metal elements (Cu, In, Ga, Se) as starting materials.
- An InGa) Se 2 thin film or Cu (InGa) S 2 thin film (light absorption film) forms a pn junction with a zinc oxide (ZnO) thin film used as a window film (described below) as an n-type semiconductor.
- a buffer film 40 having an energy band gap having a value between the energy band values of the two materials is required to form a good junction.
- Cadmium sulfide (CdS) is preferable as the material of the buffer film 40 of the solar cell.
- the window film 50 forms a pn junction with the light absorption film 40 (CZTS film, CIS film, or CIGS film) as an n-type semiconductor, and functions as a transparent electrode on the front of the solar cell.
- CZTS film, CIS film, or CIGS film the light absorption film 40
- the window film 50 is made of a material having high light transmittance and excellent electrical conductivity, for example, zinc oxide (ZnO).
- Zinc oxide has an energy band gap of about 3.3 eV and a high light transmittance of about 80% or more.
- an anti-reflection film 60 is formed on the window film 50, and magnesium fluoride (MgF 2) is usually used as a material of the anti-reflection film 60 that suppresses reflection of sunlight.
- MgF 2 magnesium fluoride
- the grid electrode 70 performs a function of collecting current on the surface of the solar cell, and is formed of aluminum (Al) or nickel / aluminum (Ni / Al).
- the grid electrode 70 is formed in the patterned area of the antireflection film 60.
- a light absorption film 30 ie, a Cu 2 ZnSnS 4 thin film in a CZTS solar cell, a CuInSe 2 thin film or a CuInS 2 thin film in a CIS solar cell
- An electron-hole pair is generated between the Cu (InGa) Se2 thin film or Cu (InGa) S 2 thin film) in the CIGS solar cell and the window film 50 which is an n-type semiconductor film, and the generated electrons are transferred to the window film 60.
- the collected and generated holes are collected in the light absorption film 30, so that photovoltage is generated.
- a CZTS solar cell, a CIS solar cell, and a CIGS solar cell manufacturing method according to the present invention having such a structure will be described with reference to FIGS. 1 and 2A through 2G.
- the substrate 10 may be made of glass, ceramic or metal.
- the back electrode 20 is formed on the substrate 10.
- the process of forming the back electrode is as follows.
- a sputtering process for molybdenum is performed to form a molybdenum thin film on the glass substrate 10.
- the final molybdenum back electrode 20 is formed by irradiating an electron beam to the entire surface of the molybdenum thin film, preferably the molybdenum thin film.
- the electron beam used in the present invention is not a hot electron concept by applying current to the filament, but a method of separating and irradiating ions and electrons by forming a high-density plasma (Ar), the grid lens and the electro-plating (Electroplating) has an effect that can effectively separate the electron / ion and large area.
- a precursor film 30a for forming a light absorption film 30 of FIG. 1 is formed on the molybdenum thin film 20.
- a stacked structure including a copper (Cu) layer, a zinc (Zn) layer, a tin (Sn) layer, and a sulfur (S) layer is formed on the molybdenum thin film 20.
- a single layer consisting of a compound of copper, zinc, tin and sulfur.
- a copper (Cu) layer, an indium (In) layer, and a selenium (Se) layer (or sulfur (S) layer) are formed on the molybdenum thin film 20. It is possible to form a laminated structure consisting of, or to form a single layer composed of a compound of copper, indium and selenium (or sulfur).
- a copper (Cu) layer, an indium (In) layer, a gallium (Ga) layer, and a selenium (Se) layer (or sulfur) are formed on the molybdenum thin film 20.
- (S) layer) can be formed, or a single layer made of a compound of copper, indium, gallium and selenium or sulfur can be formed.
- a light absorption precursor film 30a is formed by performing a sputtering process or a co-evaporation process.
- a diffusion barrier layer 30b is formed on the light absorption precursor layer 30a.
- the diffusion barrier 30b is formed through physical vapor deposition (PVD) or chemical vapor deposition (CVD).
- the substrate 10 may be made of glass, and sulfur (S), which is one of the components (Cu-Zn-Sn-S) of the light absorption precursor layer 30a for the CZTS solar cell, is a volatile element. (violation element).
- the glass substrate 10 may be deformed by heat.
- sulfur may be volatilized in the light absorption precursor layer 30a during the heat treatment process, and thus the composition ratio of the components constituting the light absorption precursor layer 30a may be changed.
- the light absorption film 30 is formed (see FIG. 2E).
- the light absorption layer 30 is exposed by removing the diffusion barrier layer 30b through a (wet or dry) etching process.
- a BOE solution Bouffered Oxide Etchant-wet time
- a fluorine-based gas dry etching
- the buffer film 40 is formed on the exposed light absorption film 30, and the window film 50 is formed on the buffer film 40.
- the light absorption film 30 and the window film 50 have a large difference in energy bandgap, and thus it is difficult to form a good p-n junction.
- a buffer consisting of a material (eg, cadmium sulfide having an energy bandgap of 2.46 eV) whose energy bandgap between the light absorption film 30 and the window film 50 is between the bandgaps of these two materials. It is desirable to form the film 40.
- the window film 50 is an n-type semiconductor, forms a pn junction with the light absorption film 30, and functions as a transparent electrode on the front of the solar cell. Therefore, the window film 50 is made of a material having high light transmittance and excellent electrical conductivity, for example, zinc oxide (ZnO). Zinc oxide has an energy band gap of about 3.3 eV and a high light transmittance of about 80% or more.
- the anti-reflection film 60 is formed on the window film 50 through, for example, a sputtering process, and the anti-reflection film 60 is patterned on a portion of the anti-reflection film 60.
- the grid electrode 70 is formed.
- Magnesium fluoride (MgF 2) is used as the material of the anti-reflection film 60 which reduces the reflection loss of sunlight incident on the solar cell, and the grid electrode 70 collecting current on the solar cell surface is made of aluminum (Al), or It is formed of nickel / aluminum (Ni / Al).
- Molybdenum was deposited on the glass substrate using only a general process, ie, a DC sputtering process, to form a molybdenum thin film having a predetermined thickness.
- Conditions in the process chamber during the molybdenum deposition process are as follows.
- the thin film was deposited by depositing molybdenum under the conditions of 10 mtorr (Comparative Example 1), 5 mtorr (Comparative Example 2), 3 mtorr (Comparative Example 3), and 1 mtorr (Comparative Example 4). Formed respectively.
- a molybdenum thin film having a predetermined thickness was formed on a glass substrate by using a DC sputtering process.
- Conditions in the process chamber in the molybdenum deposition process are as follows.
- Thin films were deposited by depositing molybdenum under operating conditions of 10 mtorr (Example 1), 5 mtorr (Example 2), 3 mtorr (Example 3) and 1 mtorr (Example 4) in the process chamber of the above atmosphere. Formed respectively.
- the electron beam was irradiated on the entire surface of the molybdenum thin film in order to make the specific resistance of the molybdenum thin film uniform.
- Example 1 Example 2
- Example 3 Example 4
- Working pressure 10 mtorr 5 mtorr 3 mtorr 1 mtorr Resistivity 6.5E-04 ⁇ cm 2.2E-04 ⁇ cm 8.0E-05 ⁇ cm 3.5E-05 ⁇ cm
- Example 3 is a photograph showing a molybdenum thin film prepared in Comparative Example 1 and Example 1, respectively, the left photograph shows a molybdenum thin film according to Comparative Example 1, and the right photograph shows a molybdenum thin film according to Example 1.
- Example 4 is a photograph showing a molybdenum thin film prepared in Comparative Example 2 and Example 2, respectively, the left photograph shows a molybdenum thin film according to Comparative Example 2, and the right photograph shows a molybdenum thin film according to Example 2.
- Example 5 is a photograph showing a molybdenum thin film prepared in Comparative Example 3 and Example 3, respectively, the left photograph shows a molybdenum thin film according to Comparative Example 3, and the right photograph shows a molybdenum thin film according to Example 3.
- Example 6 is a photograph showing a molybdenum thin film prepared in Comparative Example 4 and Example 4, respectively, the left photograph shows a molybdenum thin film according to Comparative Example 4, and the right photograph shows a molybdenum thin film according to Example 4.
- the molybdenum thin film according to Examples 1, 2, 3 and 4 has a less dense structure compared to the molybdenum thin film according to Comparative Examples 1, 2, 3 and 4, and thus, Examples 1 and 2 , Molybdenum thin films according to 3 and 4 have a specific resistance smaller than that of the molybdenum thin films according to Comparative Examples 1, 2, 3 and 4.
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Abstract
Description
비교예 1 | 비교예 2 | 비교예 3 | 비교예 4 | |
작동 압력 | 10 mtorr | 5 mtorr | 3 mtorr | 1 mtorr |
비저항 | 9.2E-04Ω·cm | 5.5E-04Ω·cm | 2.9E-04Ω·cm | 5.4E-05Ω·cm |
실시예 1 | 실시예 2 | 실시예 3 | 실시예 4 | |
작동 압력 | 10 mtorr | 5 mtorr | 3 mtorr | 1 mtorr |
비저항 | 6.5E-04Ω·cm | 2.2E-04Ω·cm | 8.0E-05Ω·cm | 3.5E-05Ω·cm |
Claims (4)
- 태양 전지 제조 방법에 있어서,기판 상에 후면 전극을 형성하는 단계; 및후면 전극에 대한 후처리 공정을 진행하는 단계를 포함하되,후면 전극은 몰리브덴으로 이루어지며, 후면 전극에 대한 후처리 공정은 몰리브덴 후면 전극에 전자 빔을 조사하여 이루어지는 것을 특징으로 하는 태양 전지 제조 방법
- 제 1 항에 있어서, 전자 빔은 후면 전극의 전체 표면에 대하여 실시되는 것을 특징으로 하는 태양 전지 제조 방법.
- 제 1 항에 있어서, 전자빔 후처리 공정은 7×10E-7 torr의 압력 그리고 5 내지 10 sccm의 유량의 아르곤 가스 분위기 조건 하의 공정 챔버 내에서 2.5 내지 3.5 Kv의 DC 파워 및 200 내지 300 W의 RF 파워의 전자 빔을 이용하여 실시되는 것을 특징으로 하는 태양 전지 제조 방법.
- 제 3 항에 있어서, 전자빔 처리 시간은 5분 이하인 것을 특징으로 하는 태양 전지 제조 방법.
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US14/358,702 US20150093852A1 (en) | 2011-12-15 | 2011-12-29 | Method for enhancing conductivity of molybdenum thin film by using electron beam irradiation |
JP2014544639A JP2015504611A (ja) | 2011-12-15 | 2011-12-29 | 電子ビーム照射を利用したモリブデン薄膜の伝導度の向上方法 |
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KR1020110135838A KR101300791B1 (ko) | 2011-12-15 | 2011-12-15 | 전자빔 조사를 이용한 몰리브덴 박막의 전도도 향상 방법 |
KR10-2011-0135838 | 2011-12-15 |
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JP (1) | JP2015504611A (ko) |
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WO (1) | WO2013089305A1 (ko) |
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DE102014217165A1 (de) * | 2014-08-28 | 2016-03-03 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Halbleiterstruktur, Verfahren zu deren Herstellung und deren Verwendung |
KR101646556B1 (ko) * | 2014-09-29 | 2016-08-09 | 재단법인대구경북과학기술원 | Czts 박막 태양전지의 제조방법 및 이에 따라 제조되는 czts 박막 태양전지 |
US10541346B2 (en) * | 2017-02-06 | 2020-01-21 | International Business Machines Corporation | High work function MoO2 back contacts for improved solar cell performance |
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- 2011-12-29 WO PCT/KR2011/010278 patent/WO2013089305A1/ko active Application Filing
- 2011-12-29 JP JP2014544639A patent/JP2015504611A/ja active Pending
- 2011-12-29 US US14/358,702 patent/US20150093852A1/en not_active Abandoned
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KR20130068565A (ko) | 2013-06-26 |
KR101300791B1 (ko) | 2013-08-29 |
JP2015504611A (ja) | 2015-02-12 |
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