WO2013026217A1 - 玻璃基板的检测装置 - Google Patents

玻璃基板的检测装置 Download PDF

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Publication number
WO2013026217A1
WO2013026217A1 PCT/CN2011/079422 CN2011079422W WO2013026217A1 WO 2013026217 A1 WO2013026217 A1 WO 2013026217A1 CN 2011079422 W CN2011079422 W CN 2011079422W WO 2013026217 A1 WO2013026217 A1 WO 2013026217A1
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Prior art keywords
glass substrate
control
detecting
electromagnetic
movement
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PCT/CN2011/079422
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English (en)
French (fr)
Inventor
郑文达
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深圳市华星光电技术有限公司
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Priority to US13/375,715 priority Critical patent/US8963571B2/en
Publication of WO2013026217A1 publication Critical patent/WO2013026217A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133302—Rigid substrates, e.g. inorganic substrates
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the invention belongs to the technical field of liquid crystal display, and in particular relates to a detecting device for a glass substrate.
  • the glass substrate In the production process of a liquid crystal display, the glass substrate needs to be inspected.
  • FIG. 1A-1B is a schematic diagram of an apparatus for detecting a glass substrate in the prior art.
  • the device includes a needle holder 101 and a test pin 102.
  • the test pin 102 When detecting the glass substrate, the test pin 102 is inserted into a gasket of a glass substrate (not shown), and a voltage is input through the needle holder 101, and the test on the needle holder 101 is performed. The pin 102 transmits the voltage to the glass substrate for detection.
  • test pin 102 is fixed on the needle holder 101 in the prior art, once the number of test pins 102 is different from the number of pads on the glass substrate to be tested, it is necessary to stop the setting of the corresponding test pin 102. For example, the excess test pin 102 is pulled out, or the insufficient test pin 102 is inserted into the needle holder 101. Referring to FIG. 1B, assuming that the number of pads on the glass substrate is 7, and the number of test pins 102 on the needle holder 101 is 14, it is necessary to stop the unnecessary 7 probes in FIG. 1A to form the structure of FIG. 1B. .
  • An object of the present invention is to provide a glass substrate detecting device, which solves the problem that in the prior art, when detecting a glass substrate, it takes a long time to set the test pin by stopping the operation, and the glass substrate is reduced. Detection efficiency, technical problems of wasting capacity.
  • the invention provides a detecting device for a glass substrate, comprising a test pin and a needle seat, the detecting device of the glass substrate further comprising a telescopic controller and a control circuit, wherein the test pin is disposed on the telescopic controller,
  • the telescopic controller is configured to control the test pin to extend relative to the hub when receiving an electrical signal; and to control the test pin to be retracted relative to the needle when the electrical signal is suspended return;
  • the control circuit controls input or no input of an electrical signal to the telescoping controller.
  • the telescopic controller comprises a movement control panel, an extension control member and a retracting control member, and the movement control panel is fixedly connected to the test needle;
  • the extension control member is configured to control movement of the movement control plate to extend the test needle relative to the needle seat when receiving an electrical signal
  • the retracting control member is configured to control movement of the movement control plate to retract the test pin relative to the hub.
  • the extension control member includes a first electromagnetic member and a second electromagnetic member
  • the first electromagnetic component is disposed on the movement control board, and the second electromagnetic component is disposed on the needle seat;
  • the first electromagnetic member and the second electromagnetic member are attracted to each other to control movement of the movement control plate to cause the test needle to protrude relative to the needle holder.
  • the retracting control member is a spring structure.
  • an attractive force generated between the first electromagnetic member and the second electromagnetic member is greater than a maximum elastic force of the spring structure.
  • the detecting device of the glass substrate of the present invention further includes a wire electrically connected to the first electromagnetic member.
  • the detecting device for the glass substrate further includes an upper cover for arranging the wires.
  • the upper cover is a printed circuit board, and the printed circuit board has the control circuit.
  • the invention relates to a detecting device for a glass substrate, comprising a test pin and a needle seat, the detecting device of the glass substrate further comprising a telescopic controller, wherein the test pin is disposed on the telescopic controller
  • the telescopic controller is configured to control the test pin to protrude relative to the hub when receiving an electrical signal
  • test pin is retracted relative to the hub when the electrical signal is aborted.
  • the telescopic controller comprises a movement control panel, an extension control member and a retracting control member, and the movement control panel is fixedly connected to the test needle;
  • the extension control member is configured to control movement of the movement control plate to extend the test needle relative to the needle seat when receiving an electrical signal
  • the retracting control member is configured to control movement of the movement control plate to retract the test pin relative to the hub.
  • the extension control member includes a first electromagnetic member and a second electromagnetic member
  • the first electromagnetic component is disposed on the movement control board, and the second electromagnetic component is disposed on the needle seat;
  • the first electromagnetic member and the second electromagnetic member are attracted to each other to control the movement control plate to extend the test needle relative to the needle holder.
  • the retracting control member is a spring structure.
  • an attractive force generated between the first electromagnetic member and the second electromagnetic member is greater than a maximum elastic force of the spring structure.
  • the detecting device of the glass substrate of the present invention further includes a wire electrically connected to the first electromagnetic member.
  • the detecting device for the glass substrate further includes an upper cover for arranging the wires.
  • the detecting device for the glass substrate further includes a control circuit that controls the input or non-input of the electric signal.
  • the detecting device for the glass substrate further includes an upper cover, which is a printed circuit board.
  • the printed circuit board has a control circuit to control the wire input or not to input an electric signal.
  • the invention solves the technical problem in the prior art that when the glass substrate is detected, the test needle is set up due to the need to stop, and the technical problem of detecting the efficiency of the glass substrate is reduced, and the technical problem is improved.
  • the production capacity when the glass substrate is detected, the test needle is set up due to the need to stop, and the technical problem of detecting the efficiency of the glass substrate is reduced, and the technical problem is improved.
  • FIG. 1A-1B are schematic views showing a detecting device of a prior art glass substrate
  • FIG. 2 is a schematic structural view of a preferred embodiment of a detecting device for a glass substrate according to the present invention
  • FIG. 3 is a schematic structural view of the telescopic controller of FIG. 2;
  • Fig. 4 is a view showing the operation of the glass substrate detecting apparatus shown in Fig. 2;
  • FIG. 2 is a schematic structural view of a preferred embodiment of a glass substrate detecting apparatus according to the present invention.
  • the glass substrate detecting device includes a needle holder 21, a plurality of test pins 22, a plurality of telescopic controllers 23 (FIG. 3), an upper cover 24, and a plurality of wires 25.
  • Each telescopic controller 23 corresponds to one test pin 22.
  • the telescopic controller 23 controls the extension of the test pin 22 in a predetermined direction B1 such that the test pin 22 protrudes relative to the hub 21, and the telescopic controller 23 also controls the test pin 22 to follow
  • the predetermined direction B1 is moved in the opposite direction such that the test pin 22 is retracted relative to the hub 21.
  • the predetermined direction B1 is a direction in which the test pin 22 is inserted into a glass substrate to be inspected (not shown).
  • FIG. 3 is a schematic structural diagram of the telescopic controller 23 of FIG.
  • the telescopic controller 23 includes a movement control board 231, and further includes an extension control member 233 and a retraction control member 232.
  • the movement control board 231 is fixedly coupled to the test pin 22.
  • the extension control member 233 includes a first electromagnetic member 234 and a second electromagnetic member 235.
  • the first electromagnetic member 234 is disposed on the movement control board 231, and the second electromagnetic member 235 is disposed.
  • the extension control member 233 may also be other structures as long as the test needle 22 can be controlled to move by a predetermined distance D in a predetermined direction B1 when an electrical signal is received. Wherein, when the test pin 22 is moved by a predetermined distance D in a predetermined direction B1, it can be inserted into the glass substrate to be inspected.
  • the retracting control member 232 is a resilient member, preferably a spring structure.
  • the preset distance D may be moved in a direction B2 opposite to the predetermined direction B1.
  • the upper cover 24 is used to set the wires 25, and a control circuit (not shown) controls the input or non-input of the electrical signals to the respective wires 25.
  • the wire 25 is electrically connected to the first electromagnetic member 234.
  • the control circuit inputs an electrical signal to the wire 25, an attractive force generated between the first electromagnetic member 234 and the second electromagnetic member 235 is greater than a maximum value of the elastic force of the retracting control member 232, so that The extension control member 233 is capable of controlling the test needle 22 to move by a predetermined distance D in a predetermined direction B1.
  • the upper cover 24 can also be a printed circuit board.
  • the printed circuit board is provided with a control circuit (not shown).
  • the control circuit is electrically connected to each of the wires 25 and controls input or non-input to each of the wires 25.
  • the electrical signal controls the first electromagnetic member 234 and the second electromagnetic member 235.
  • the control circuit controls the wire 25 corresponding to the seven test pins 22 on the right side in FIG. 4 to be energized (please refer to FIG. 2 together), and after the wire 25 is energized, the first The electromagnetic member 234 receives the electrical signal and attracts the second electromagnetic member 235.
  • the movement control board 231 is moved by a predetermined distance D along the predetermined direction B1, so that the test pin 22 fixed to the movement control board 231 is moved by a predetermined distance D in the predetermined direction B1 to protrude relative to the needle holder 21. Inserted into the glass substrate to be inspected for detection.
  • the control circuit controls the wires 25 corresponding to the seven test pins 22 on the left side of FIG. 4 (please refer to FIG. 2 together) in a non-energized state, because the corresponding first to seventh test pins 22 are not received by the first electromagnetic member 234. There is no attraction between the electrical signal (ie, the electrical signal is suspended) and the second electromagnetic member 235.
  • the retracting control member 232 controls the movement control plate 231 to move in the direction B2 opposite to the predetermined direction B1.
  • the distance D is set such that the test pin 22 fixed to the movement control plate 231 is retracted relative to the hub 21.
  • the invention does not need to stop the test pin 22, but flexibly controls the extension or retraction of the corresponding test pin 22 according to the number of pads of the glass substrate to be inspected, which greatly improves the detection efficiency.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

一种玻璃基板的检测装置，包括测试针（22）和针座（21），所述装置还包括伸缩控制器（23），所述测试针（22）设置在所述伸缩控制器（23）上，所述伸缩控制器（23），用于在接收到电信号时，控制所述测试针（22）相对于所述针座（21）伸出；以及在所述电信号中止时，控制所述测试针（22）相对于所述针座（21）缩回，从而，提高了对玻璃基板的检测效率。

Description

玻璃基板的检测装置 技术领域
本发明属于液晶显示技术领域，特别是涉及一种玻璃基板的检测装置。
 背景技术
液晶显示器的生产过程中，需要对玻璃基板进行检测。
请参阅图1A-1B，图1 A-1B为现有技术中对玻璃基板进行检测的设备示意图。
所述设备包括针座101和测试针102，在对玻璃基板进行检测时，测试针102插入到玻璃基板的衬垫内（图未示），通过针座101输入电压，针座101上的测试针102将电压传输至玻璃基板进行检测。
但是由于现有技术中测试针102是固定在针座101上，一旦出现测试针102的数量与待测玻璃基板上衬垫的数量不同的情况，则需要停机进行相应的测试针102的设置，譬如将多余的测试针102拔掉，或者将不足的测试针102插入针座101。请参阅图1B，假设玻璃基板上衬垫的数量为7，而针座101上测试针102的数量为14，则需要停机将图1A中多余的7个探针拔掉，形成图1B的结构。
综上，在玻璃基板进行检测时，由于需要停机对测试针进行设置，需要花费较多的时间，降低了对玻璃基板的检测效率，浪费产能。
 技术问题
本发明的一个目的在于提供一种玻璃基板的检测装置，以解决现有技术中在玻璃基板进行检测时，由于需要停机对测试针进行设置，需要花费较多的时间，降低了对玻璃基板的检测效率，浪费产能的技术问题。
 技术解决方案
本发明构造了一种玻璃基板的检测装置，包括测试针和针座，所述玻璃基板的检测装置还包括伸缩控制器及控制电路，所述测试针设置在所述伸缩控制器上，
所述伸缩控制器，用于在接收到电信号时，控制所述测试针相对于所述针座伸出；以及在所述电信号中止时，控制所述测试针相对于所述针座缩回；
所述控制电路控制向所述伸缩控制器输入或者不输入电信号。
在本发明的玻璃基板的检测装置中，所述伸缩控制器包括移动控制板，伸出控制件以及缩回控制件，所述移动控制板固定连接所述测试针；
所述伸出控制件，用于在接收到电信号时，控制所述移动控制板移动以使所述测试针相对于所述针座伸出；
所述缩回控制件，用于控制所述移动控制板移动以使所述测试针相对于所述针座缩回。
在本发明的玻璃基板的检测装置中，所述伸出控制件包括第一电磁件与第二电磁件，
所述第一电磁件设置在所述移动控制板上，所述第二电磁件设置在所述针座上；
在接收到所述电信号时，所述第一电磁件与所述第二电磁件相互吸引，以控制所述移动控制板移动使所述测试针相对于所述针座伸出。
在本发明的玻璃基板的检测装置中，所述缩回控制件为一弹簧结构。
在本发明的玻璃基板的检测装置中，在所述伸出控制件接收到电信号时，所述第一电磁件和第二电磁件之间产生的吸引力大于所述弹簧结构的弹力最大值。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括导线，所述导线与所述第一电磁件电性连接。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括上盖，该上盖用于设置所述导线。
在本发明的玻璃基板的检测装置中，所述上盖为一印刷电路板，所述印刷电路板具有所述控制电路。
本发明构造了一种玻璃基板的检测装置，包括测试针和针座，所述玻璃基板的检测装置还包括伸缩控制器，所述测试针设置在所述伸缩控制器上，
所述伸缩控制器，用于在接收到电信号时，控制所述测试针相对于所述针座伸出；以及
在所述电信号中止时，控制所述测试针相对于所述针座缩回。
在本发明的玻璃基板的检测装置中，所述伸缩控制器包括移动控制板，伸出控制件以及缩回控制件，所述移动控制板固定连接所述测试针；
所述伸出控制件，用于在接收到电信号时，控制所述移动控制板移动以使所述测试针相对于所述针座伸出；
所述缩回控制件，用于控制所述移动控制板移动以使所述测试针相对于所述针座缩回。
在本发明的玻璃基板的检测装置中，所述伸出控制件包括第一电磁件与第二电磁件，
所述第一电磁件设置在所述移动控制板上，所述第二电磁件设置在所述针座上；
在接收到所述电信号时，所述第一电磁件与所述第二电磁件相互吸引，以控制所述移动控制板使所述测试针相对于所述针座伸出。
在本发明的玻璃基板的检测装置中，所述缩回控制件为一弹簧结构。
在本发明的玻璃基板的检测装置中，在所述伸出控制件接收到电信号时，所述第一电磁件和第二电磁件之间产生的吸引力大于所述弹簧结构的弹力最大值。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括导线，所述导线与所述第一电磁件电性连接。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括上盖，该上盖用于设置所述导线。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括一控制电路，该控制电路控制向导线输入或者不输入电信号。
在本发明的玻璃基板的检测装置中，所述玻璃基板的检测装置还包括上盖，该上盖为一印刷电路板。
在本发明的玻璃基板的检测装置中，所述印刷电路板具有控制电路控制向导线输入或者不输入电信号。
 有益效果
本发明相对于现有技术，解决了现有技术中在玻璃基板进行检测时，由于需要停机对测试针进行设置，需要花费较多的时间，降低了对玻璃基板的检测效率的技术问题，提高了产能。
 附图说明
图1A-1B为一种现有技术玻璃基板的检测设备示意图；
图2为本发明玻璃基板的检测装置的较佳实施例的结构示意图；
图3为图2中伸缩控制器的结构示意图；
图4为图2所示的玻璃基板的检测装置的操作效果示意图。
 本发明的最佳实施方式
以下各实施例的说明是参考附图，用以例示本发明可用以实施的优选实施例。
请参阅图2及图3，图2为本发明玻璃基板的检测装置的较佳实施例的结构示意图。所述玻璃基板的检测装置包括针座21、多个测试针22、多个伸缩控制器23（图3）、上盖24及多条导线25。每个伸缩控制器23对应一个测试针22。所述伸缩控制器23控制所述测试针22沿预定方向B1延伸运动，使得所述测试针22相对于所述针座21伸出，所述伸缩控制器23还控制所述测试针22沿与预定方向B1相反的方向运动，使得所述测试针22相对于针座21收回。所述预定方向B1为所述测试针22插入待检测玻璃基板（图未示）的方向。
请参阅图3，图3为图2中伸缩控制器23的结构示意图。所述伸缩控制器23包括移动控制板231，还包括伸出控制件233和缩回控制件232。所述移动控制板231固定连接所述测试针22。
请参阅图3，所述伸出控制件233包括第一电磁件234和第二电磁件235，所述第一电磁件234设置在所述移动控制板231上，所述第二电磁件235设置在所述针座21上。在具体实施过程中，所述伸出控制件233也可以是其它的结构，只要能够在接收到电信号时，控制所述测试针22沿预定方向B1移动预设距离D即可。其中，所述测试针22沿预定方向B1移动预设距离D时，可以插入到待检测玻璃基板上。
在图2所示的实施例中，所述缩回控制件232为弹性元件，优选为弹簧结构，当然也可以是其它的结构，只要能够在所述电信号中止时，控制所述测试针22沿与所述预定方向B1相反的方向B2移动预设距离D即可。
所述上盖24用于设置导线25，一控制电路（图未示）控制向各条导线25输入或者不输入电信号。所述导线25电性连接第一电磁件234。当所述控制电路向所述导线25输入电信号后，所述第一电磁件234和所述第二电磁件235之间产生的吸引力大于所述缩回控制件232的弹力最大值，使所述伸出控制件233能够控制所述测试针22沿预定方向B1移动预设距离D。
所述上盖24也可以是一印刷电路板，该印刷电路板设置有控制电路（图未示），该控制电路与各条导线25电性连接，并控制向各条导线25输入或者不输入电信号，从而控制第一电磁件234及第二电磁件235。
图2所示的较佳实施例的工作原理为：
请一并参阅图3和图4，在对玻璃基板进行检测时，假设玻璃基板上衬垫的数量为7，而本发明玻璃基板的检测装置的测试针22的数量为14。此时，根据玻璃基板上衬垫的位置，由控制电路控制对图4中的右侧的7个测试针22对应的导线25通电（请一并参阅图2），导线25通电后，第一电磁件234接收到电信号，与第二电磁件235相互吸引，由于第一电磁件234和第二电磁件235之间产生的吸引力大于所述缩回控制件232的弹力最大值，因此，移动控制板231将沿预定方向B1移动一预设距离D，进而使固定在所述移动控制板231的测试针22沿预定方向B1移动一预设距离D而相对所述针座21伸出，插入到待检测玻璃基板进行检测。
同时，控制电路控制图4中左侧的7个测试针22对应的导线25（请一并参阅图2）处于不通电状态，由于对应的1至7号测试针22第一电磁件234没有接收到电信号（即电信号中止），与第二电磁件235之间不会产生吸引力，此时，缩回控制件232控制所述移动控制板231沿与预定方向B1相反的方向B2移动预设距离D，使固定在所述移动控制板231的测试针22相对所述针座21缩回。
本发明无须停机对测试针22进行设置，而是灵活的根据待检测玻璃基板的衬垫数量控制相应的测试针22的伸出或者缩回，极大地提高了检测效率。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。
 本发明的实施方式
工业实用性
序列表自由内容

Claims (18)

  1. 一种玻璃基板的检测装置，包括测试针和针座，其特征在于，所述玻璃基板的检测装置还包括伸缩控制器及控制电路，所述测试针设置在所述伸缩控制器上，
    所述伸缩控制器，用于在接收到电信号时，控制所述测试针相对于所述针座伸出；以及在所述电信号中止时，控制所述测试针相对于所述针座缩回；
    所述控制电路控制向所述伸缩控制器输入或者不输入电信号。
  2. 根据权利要求1所述的玻璃基板的检测装置，其特征在于，所述伸缩控制器包括移动控制板，伸出控制件以及缩回控制件，所述移动控制板固定连接所述测试针；
    所述伸出控制件，用于在接收到电信号时，控制所述移动控制板移动以使所述测试针相对于所述针座伸出；
    所述缩回控制件，用于控制所述移动控制板移动以使所述测试针相对于所述针座缩回。
  3. 根据权利要求2所述的玻璃基板的检测装置，其特征在于，所述伸出控制件包括第一电磁件与第二电磁件，
    所述第一电磁件设置在所述移动控制板上，所述第二电磁件设置在所述针座上；
    在接收到所述电信号时，所述第一电磁件与所述第二电磁件相互吸引，以控制所述移动控制板移动使所述测试针相对于所述针座伸出。
  4. 根据权利要求3所述的玻璃基板的检测装置，其特征在于，所述缩回控制件为一弹簧结构。
  5. 根据权利要求4所述的玻璃基板的检测装置，其特征在于，在所述伸出控制件接收到电信号时，所述第一电磁件和第二电磁件之间产生的吸引力大于所述弹簧结构的弹力最大值。
  6. 根据权利要求3所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括导线，所述导线与所述第一电磁件电性连接。
  7. 根据权利要求6所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括上盖，该上盖用于设置所述导线。
  8. 根据权利要求1所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括一上盖，该上盖为一印刷电路板，所述印刷电路板具有所述控制电路。
  9. 一种玻璃基板的检测装置，包括测试针和针座，其特征在于，所述玻璃基板的检测装置还包括伸缩控制器，所述测试针设置在所述伸缩控制器上，
    所述伸缩控制器，用于在接收到电信号时，控制所述测试针相对于所述针座伸出；以及
    在所述电信号中止时，控制所述测试针相对于所述针座缩回。
  10. 根据权利要求9所述的玻璃基板的检测装置，其特征在于，所述伸缩控制器包括移动控制板，伸出控制件以及缩回控制件，所述移动控制板固定连接所述测试针；
    所述伸出控制件，用于在接收到电信号时，控制所述移动控制板移动以使所述测试针相对于所述针座伸出；
    所述缩回控制件，用于控制所述移动控制板移动以使所述测试针相对于所述针座缩回。
  11. 根据权利要求10所述的玻璃基板的检测装置，其特征在于，所述伸出控制件包括第一电磁件与第二电磁件，
    所述第一电磁件设置在所述移动控制板上，所述第二电磁件设置在所述针座上；
    在接收到所述电信号时，所述第一电磁件与所述第二电磁件相互吸引，以控制所述移动控制板移动使所述测试针相对于所述针座伸出。
  12. 根据权利要求11所述的玻璃基板的检测装置，其特征在于，所述缩回控制件为一弹簧结构。
  13. 根据权利要求12所述的玻璃基板的检测装置，其特征在于，在所述伸出控制件接收到电信号时，所述第一电磁件和第二电磁件之间产生的吸引力大于所述弹簧结构的弹力最大值。
  14. 根据权利要求11所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括导线，所述导线与所述第一电磁件电性连接。
  15. 根据权利要求14所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括上盖，该上盖用于设置所述导线。
  16. 根据权利要求14所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括一控制电路，该控制电路控制向所述导线输入或者不输入电信号。
  17. 根据权利要求14所述的玻璃基板的检测装置，其特征在于，所述玻璃基板的检测装置还包括上盖，该上盖为一印刷电路板。
  18. 根据权利要求17所述的玻璃基板的检测装置，其特征在于，所述印刷电路板具有控制电路控制向所述导线输入或者不输入电信号。
PCT/CN2011/079422 2011-08-24 2011-09-07 玻璃基板的检测装置 WO2013026217A1 (zh)

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