WO2012153926A3 - 자기 공명 세차 현상과 이중 스핀 필터 효과를 이용한 스핀전달토크 자기 메모리 소자 - Google Patents
자기 공명 세차 현상과 이중 스핀 필터 효과를 이용한 스핀전달토크 자기 메모리 소자 Download PDFInfo
- Publication number
- WO2012153926A3 WO2012153926A3 PCT/KR2012/003345 KR2012003345W WO2012153926A3 WO 2012153926 A3 WO2012153926 A3 WO 2012153926A3 KR 2012003345 W KR2012003345 W KR 2012003345W WO 2012153926 A3 WO2012153926 A3 WO 2012153926A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- spin
- memory device
- magnetic memory
- magnetization
- filtering effect
- Prior art date
Links
- 230000000694 effects Effects 0.000 title abstract 2
- 238000001914 filtration Methods 0.000 title 1
- 230000005415 magnetization Effects 0.000 abstract 4
- 230000010354 integration Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014510243A JP6028018B2 (ja) | 2011-05-12 | 2012-04-30 | 磁気共鳴歳差現象と2重スピンフィルター効果とを利用するスピン伝達トルク磁気メモリ素子 |
US14/116,959 US20140159175A1 (en) | 2011-05-12 | 2012-04-30 | Spin transfer torque magnetic memory device using magnetic resonance precession and the spin filtering effect |
US14/814,163 US9478729B2 (en) | 2011-05-12 | 2015-07-30 | Spin transfer torque magnetic memory device using magnetic resonance precession and the spin filtering effect |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020110044587A KR101195041B1 (ko) | 2011-05-12 | 2011-05-12 | 자기 공명 세차 현상을 이용한 스핀전달토크 자기 메모리 소자 |
KR10-2011-0044587 | 2011-05-12 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/116,959 A-371-Of-International US20140159175A1 (en) | 2011-05-12 | 2012-04-30 | Spin transfer torque magnetic memory device using magnetic resonance precession and the spin filtering effect |
US14/814,163 Division US9478729B2 (en) | 2011-05-12 | 2015-07-30 | Spin transfer torque magnetic memory device using magnetic resonance precession and the spin filtering effect |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012153926A2 WO2012153926A2 (ko) | 2012-11-15 |
WO2012153926A3 true WO2012153926A3 (ko) | 2013-01-17 |
Family
ID=47139766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2012/003345 WO2012153926A2 (ko) | 2011-05-12 | 2012-04-30 | 자기 공명 세차 현상과 이중 스핀 필터 효과를 이용한 스핀전달토크 자기 메모리 소자 |
Country Status (4)
Country | Link |
---|---|
US (2) | US20140159175A1 (ko) |
JP (1) | JP6028018B2 (ko) |
KR (1) | KR101195041B1 (ko) |
WO (1) | WO2012153926A2 (ko) |
Families Citing this family (33)
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JP5982794B2 (ja) * | 2011-11-30 | 2016-08-31 | ソニー株式会社 | 記憶素子、記憶装置 |
US9013916B2 (en) * | 2012-05-31 | 2015-04-21 | Northrop Grumman Systems Corporation | Josephson magnetic memory cell system |
JP6237162B2 (ja) * | 2013-11-27 | 2017-11-29 | 富士通株式会社 | 磁気抵抗メモリ素子および磁気抵抗メモリ |
JP6018599B2 (ja) * | 2014-03-20 | 2016-11-02 | 株式会社東芝 | 不揮発性記憶装置 |
KR20160019253A (ko) * | 2014-08-11 | 2016-02-19 | 에스케이하이닉스 주식회사 | 전자 장치 |
WO2016148394A1 (ko) * | 2015-03-18 | 2016-09-22 | 한양대학교 산학협력단 | 메모리 소자 |
WO2016148393A1 (ko) * | 2015-03-18 | 2016-09-22 | 한양대학교 산학협력단 | 메모리 소자 |
KR101721618B1 (ko) * | 2015-03-18 | 2017-03-30 | 한양대학교 산학협력단 | 메모리 소자 |
US10580964B2 (en) | 2015-03-18 | 2020-03-03 | Industry-University Cooperation Foundation Hanyang University | Memory device |
KR101698532B1 (ko) * | 2015-03-18 | 2017-01-20 | 한양대학교 산학협력단 | 메모리 소자 |
KR101756883B1 (ko) * | 2015-03-18 | 2017-07-12 | 한양대학교 산학협력단 | 메모리 소자 |
US9728712B2 (en) | 2015-04-21 | 2017-08-08 | Spin Transfer Technologies, Inc. | Spin transfer torque structure for MRAM devices having a spin current injection capping layer |
US10468590B2 (en) | 2015-04-21 | 2019-11-05 | Spin Memory, Inc. | High annealing temperature perpendicular magnetic anisotropy structure for magnetic random access memory |
US9853206B2 (en) * | 2015-06-16 | 2017-12-26 | Spin Transfer Technologies, Inc. | Precessional spin current structure for MRAM |
US9773974B2 (en) | 2015-07-30 | 2017-09-26 | Spin Transfer Technologies, Inc. | Polishing stop layer(s) for processing arrays of semiconductor elements |
US10134808B2 (en) | 2015-11-02 | 2018-11-20 | Qualcomm Incorporated | Magnetic tunnel junction (MTJ) devices with heterogeneous free layer structure, particularly suited for spin-torque-transfer (STT) magnetic random access memory (MRAM) (STT MRAM) |
US9741926B1 (en) | 2016-01-28 | 2017-08-22 | Spin Transfer Technologies, Inc. | Memory cell having magnetic tunnel junction and thermal stability enhancement layer |
US20190109276A1 (en) * | 2016-03-30 | 2019-04-11 | Sony Corporation | Magnetoresistive element, memory element, and electronic apparatus |
US10672976B2 (en) | 2017-02-28 | 2020-06-02 | Spin Memory, Inc. | Precessional spin current structure with high in-plane magnetization for MRAM |
US10665777B2 (en) | 2017-02-28 | 2020-05-26 | Spin Memory, Inc. | Precessional spin current structure with non-magnetic insertion layer for MRAM |
US10332576B2 (en) * | 2017-06-07 | 2019-06-25 | International Business Machines Corporation | Magnetic exchange coupled MTJ free layer with double tunnel barriers having low switching current and high data retention |
US10510390B2 (en) * | 2017-06-07 | 2019-12-17 | International Business Machines Corporation | Magnetic exchange coupled MTJ free layer having low switching current and high data retention |
US10339993B1 (en) | 2017-12-30 | 2019-07-02 | Spin Memory, Inc. | Perpendicular magnetic tunnel junction device with skyrmionic assist layers for free layer switching |
US10468588B2 (en) | 2018-01-05 | 2019-11-05 | Spin Memory, Inc. | Perpendicular magnetic tunnel junction device with skyrmionic enhancement layers for the precessional spin current magnetic layer |
JP6424999B1 (ja) * | 2018-02-28 | 2018-11-21 | Tdk株式会社 | スピン素子の安定化方法及びスピン素子の製造方法 |
US10686123B2 (en) * | 2018-08-16 | 2020-06-16 | International Business Machines Corporation | Multilayered magnetic free layer structure for spin-transfer torque (STT) MRAM |
US11195991B2 (en) * | 2018-09-27 | 2021-12-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetic random access memory assisted devices and methods of making |
US10580827B1 (en) | 2018-11-16 | 2020-03-03 | Spin Memory, Inc. | Adjustable stabilizer/polarizer method for MRAM with enhanced stability and efficient switching |
US10797227B2 (en) | 2018-12-06 | 2020-10-06 | Sandisk Technologies Llc | Spin-transfer torque MRAM with a negative magnetic anisotropy assist layer and methods of operating the same |
US10862022B2 (en) | 2018-12-06 | 2020-12-08 | Sandisk Technologies Llc | Spin-transfer torque MRAM with magnetically coupled assist layers and methods of operating the same |
US10811596B2 (en) | 2018-12-06 | 2020-10-20 | Sandisk Technologies Llc | Spin transfer torque MRAM with a spin torque oscillator stack and methods of making the same |
KR102710350B1 (ko) | 2019-10-02 | 2024-09-27 | 삼성전자주식회사 | 자기 기억 소자 |
GB2588151B (en) * | 2019-10-09 | 2022-05-04 | Huo Suguo | Hybrid perpendicular and in-plane STT-MRAM |
Citations (4)
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KR20040092342A (ko) * | 2003-04-25 | 2004-11-03 | 재단법인서울대학교산학협력재단 | 비휘발성 자기 메모리 셀, 동작 방법 및 이를 이용한다진법 비휘발성 초고집적 자기 메모리 |
US20080180991A1 (en) * | 2006-11-01 | 2008-07-31 | Yadav Technology | Current-Confined Effect of Magnetic Nano-Current-Channel (NCC) for Magnetic Random Access Memory (MRAM) |
US20080259508A2 (en) * | 2003-08-19 | 2008-10-23 | New York University | High speed low power magnetic devices based on current induced spin-momentum transfer |
JP2009252909A (ja) * | 2008-04-03 | 2009-10-29 | Nec Corp | 磁気抵抗効果素子、及び磁気ランダムアクセスメモリ |
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US6765819B1 (en) * | 2002-07-25 | 2004-07-20 | Hewlett-Packard Development Company, Lp. | Magnetic memory device having improved switching characteristics |
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JP2007081280A (ja) * | 2005-09-16 | 2007-03-29 | Fujitsu Ltd | 磁気抵抗効果素子及び磁気メモリ装置 |
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WO2009020251A1 (en) | 2007-08-07 | 2009-02-12 | Chang Young Choi | Nonflammable paint composition |
US7982275B2 (en) * | 2007-08-22 | 2011-07-19 | Grandis Inc. | Magnetic element having low saturation magnetization |
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JP4724196B2 (ja) | 2008-03-25 | 2011-07-13 | 株式会社東芝 | 磁気抵抗効果素子及び磁気ランダムアクセスメモリ |
US7985994B2 (en) * | 2008-09-29 | 2011-07-26 | Seagate Technology Llc | Flux-closed STRAM with electronically reflective insulative spacer |
KR101178767B1 (ko) | 2008-10-30 | 2012-09-07 | 한국과학기술연구원 | 이중 자기 이방성 자유층을 갖는 자기 터널 접합 구조 |
JP2010016408A (ja) * | 2009-10-19 | 2010-01-21 | Toshiba Corp | 磁気抵抗素子及び磁気メモリ |
JP5485846B2 (ja) | 2010-09-17 | 2014-05-07 | 富士通テン株式会社 | 情報記録装置 |
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JP5514059B2 (ja) * | 2010-09-17 | 2014-06-04 | 株式会社東芝 | 磁気抵抗効果素子及び磁気ランダムアクセスメモリ |
-
2011
- 2011-05-12 KR KR1020110044587A patent/KR101195041B1/ko not_active IP Right Cessation
-
2012
- 2012-04-30 JP JP2014510243A patent/JP6028018B2/ja active Active
- 2012-04-30 US US14/116,959 patent/US20140159175A1/en not_active Abandoned
- 2012-04-30 WO PCT/KR2012/003345 patent/WO2012153926A2/ko active Application Filing
-
2015
- 2015-07-30 US US14/814,163 patent/US9478729B2/en active Active
Patent Citations (4)
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KR20040092342A (ko) * | 2003-04-25 | 2004-11-03 | 재단법인서울대학교산학협력재단 | 비휘발성 자기 메모리 셀, 동작 방법 및 이를 이용한다진법 비휘발성 초고집적 자기 메모리 |
US20080259508A2 (en) * | 2003-08-19 | 2008-10-23 | New York University | High speed low power magnetic devices based on current induced spin-momentum transfer |
US20080180991A1 (en) * | 2006-11-01 | 2008-07-31 | Yadav Technology | Current-Confined Effect of Magnetic Nano-Current-Channel (NCC) for Magnetic Random Access Memory (MRAM) |
JP2009252909A (ja) * | 2008-04-03 | 2009-10-29 | Nec Corp | 磁気抵抗効果素子、及び磁気ランダムアクセスメモリ |
Also Published As
Publication number | Publication date |
---|---|
US20150340595A1 (en) | 2015-11-26 |
US20140159175A1 (en) | 2014-06-12 |
JP2014517516A (ja) | 2014-07-17 |
US9478729B2 (en) | 2016-10-25 |
WO2012153926A2 (ko) | 2012-11-15 |
JP6028018B2 (ja) | 2016-11-16 |
KR101195041B1 (ko) | 2012-10-31 |
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