WO2012073284A1 - Appareil d'inspection de composant électronique et dispositif d'alimentation en pièces - Google Patents

Appareil d'inspection de composant électronique et dispositif d'alimentation en pièces Download PDF

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Publication number
WO2012073284A1
WO2012073284A1 PCT/JP2010/006993 JP2010006993W WO2012073284A1 WO 2012073284 A1 WO2012073284 A1 WO 2012073284A1 JP 2010006993 W JP2010006993 W JP 2010006993W WO 2012073284 A1 WO2012073284 A1 WO 2012073284A1
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WO
WIPO (PCT)
Prior art keywords
electronic component
supply path
bowl
chute
parts feeder
Prior art date
Application number
PCT/JP2010/006993
Other languages
English (en)
Japanese (ja)
Inventor
木村浩之
Original Assignee
上野精機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 上野精機株式会社 filed Critical 上野精機株式会社
Priority to PCT/JP2010/006993 priority Critical patent/WO2012073284A1/fr
Priority to JP2012546572A priority patent/JP5586072B2/ja
Publication of WO2012073284A1 publication Critical patent/WO2012073284A1/fr

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/02—Devices for feeding articles or materials to conveyors
    • B65G47/04—Devices for feeding articles or materials to conveyors for feeding articles
    • B65G47/12—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles
    • B65G47/14—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding
    • B65G47/1407—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding the articles being fed from a container, e.g. a bowl
    • B65G47/1414—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding the articles being fed from a container, e.g. a bowl by means of movement of at least the whole wall of the container
    • B65G47/1421—Vibratory movement

Definitions

  • the present invention relates to an electronic component inspection apparatus that performs various processes while supplying and transporting an electronic component to a transport mechanism, and a parts feeder that supplies the electronic component to the transport mechanism.
  • Post-processing includes marking processing, appearance inspection, electrical property inspection, lead molding processing, classification of electronic components, and packaging.
  • the electronic component inspection apparatus includes various process processing mechanisms on a processing path, a transport mechanism that sequentially aligns and transports electronic components to the process processing mechanism, and a parts feeder that supplies the electronic components to the transport mechanism (for example, patents). Reference 1).
  • the parts feeder extends directly below the transport mechanism and aligns and transports the electronic components to just below the transport mechanism with the front and back surfaces aligned (see, for example, Patent Document 2).
  • This parts feeder is composed of a bowl part, a shooter part and an escape part.
  • the bowl portion is a mortar-shaped container, and a U-shaped groove that rises to the upper edge is spirally engraved on the inner surface.
  • the shooter has a U-shaped rail on a straight line.
  • the escape part reciprocates in parallel from the end of the shooter part to directly below the transport mechanism.
  • the groove of the bowl part and the rail of the shooter part are connected to each other and serve as a supply path for aligning and conveying the electronic components. By vibrating the bowl part and the shooter part respectively, the electronic component is guided to the escape part by the U-shaped groove and rail.
  • the bowl portion and the shooter portion are prepared in advance with supply paths that match the shape and size of the electronic components to be supplied.
  • the bowl part and the chute part were exchanged.
  • the entire parts feeder unit including the bowl and chute is replaced. Therefore, the inspection of the electronic parts is temporarily interrupted by the replacement work of the whole bowl part, chute part, or parts feeder unit and the adjustment after the replacement, and the production efficiency is lowered, and various bowl parts, chute parts, and Since it is necessary to prepare a parts feeder unit, it also contributed to the high cost.
  • the present invention has been proposed in order to solve the above-described problems of the prior art, and provides an electronic component inspection apparatus and a parts feeder that eliminates electronic component switching work as much as possible and improves production efficiency.
  • the purpose is to do.
  • An electronic component inspection apparatus is an electronic component inspection apparatus that performs various process processes while conveying an electronic component, and includes various process processing means arranged alongside the processing path of the electronic component, Conveying means for conveying the electronic component to various process processing means, a bowl portion for accommodating the electronic component, a chute portion disposed between the bowl portion and the conveying means, and the chute from the bowl portion And a supply path for aligning and supplying the electronic components to the conveying means, and the supply path in the bowl portion spirals the inner peripheral surface from the bottom surface to the upper edge of the bowl portion. It is formed by cutting out in a letter shape, and has a step portion that supports the side surface of the electronic component, and a back surface portion that supports the front surface or the back surface.
  • a barrier projecting upward facing the stepped portion, and the barrier is provided in a direction toward the back surface, It has a long slot in the direction toward the step, and any one of jig pins of various diameters is detachably attached through the slot so as to protrude from the back surface in parallel with the step.
  • any one of jig pins of various diameters is detachably attached through the slot so as to protrude from the back surface in parallel with the step.
  • it may be arranged at one point of the supply path.
  • the supply path of the chute portion has a variable width, and includes a base that forms a bottom surface, and a fixed guide and a movable guide that are disposed opposite to the base and that form both side surfaces.
  • the fulcrum may be pivotally supported at one end of a lever pivotally supported by the base, and may be moved in the width direction according to an arrangement angle of the lever with respect to the supply path.
  • the parts feeder according to the present invention is a parts feeder that supplies the electronic components to an electronic component inspection apparatus that performs various process processes while conveying the electronic components by a conveying means, and a bowl portion that houses the electronic components And a chute portion disposed between the bowl portion and the conveying means, and a supply path for supplying the electronic components in alignment with the conveying means from the bowl portion through the chute portion,
  • the supply path in the bowl portion is formed by spirally cutting an inner peripheral surface into an L shape from the bottom surface to the upper edge of the bowl portion, and a step portion that supports the side surface of the electronic component, and a front surface or a back surface It has the back surface part which supports this, It is characterized by the above-mentioned.
  • a barrier projecting upward facing the stepped portion, and the barrier is provided in a direction toward the back surface, It has a long slot in the direction toward the step, and any one of jig pins of various diameters is detachably attached through the slot so as to protrude from the back surface in parallel with the step.
  • any one of jig pins of various diameters is detachably attached through the slot so as to protrude from the back surface in parallel with the step.
  • it may be arranged at one point of the supply path.
  • the supply path of the chute portion has a variable width, and includes a base that forms a bottom surface, and a fixed guide and a movable guide that are disposed opposite to the base and that form both side surfaces.
  • the fulcrum may be pivotally supported at one end of a lever pivotally supported by the base, and may be moved in the width direction according to an arrangement angle of the lever with respect to the supply path.
  • each process processing mechanism can be performed without requiring a switching operation. Can be supplied. Therefore, the burden and time of the switching work are reduced, and the production efficiency is improved.
  • FIG. It is a figure which shows schematic structure of an electronic component inspection apparatus. It is a figure which shows schematic structure of a conveyance mechanism. 2 is a schematic diagram showing an electronic component D.
  • FIG. It is a top view of a parts feeder. It is a side view of a parts feeder. It is sectional drawing of a bowl part. It is sectional drawing which shows a barrier. It is sectional drawing of a chute
  • FIG. 1 is a diagram showing a schematic configuration of an electronic component inspection apparatus.
  • FIG. 2 is a diagram illustrating a schematic configuration of the transport mechanism.
  • FIG. 3 is a schematic diagram showing the front and back of the electronic component D. As shown in FIG.
  • the electronic component inspection apparatus 1 is an apparatus that performs various process processes while aligning and conveying the electronic component D.
  • the electronic component D is a component used for an electrical product, and includes a semiconductor element. Examples of semiconductor elements include transistors, integrated circuits, resistors, capacitors, and the like.
  • the various process processes are mainly inspection processes after each assembly process such as dicing, mounting, bonding, and sealing, and include marking, visual inspection, test contact, sorting and sorting, and packing process. .
  • the electronic component inspection apparatus 1 enables inspection of electronic components D having different sizes by simple adjustment.
  • the electronic component inspection apparatus 1 includes various process processing mechanisms 4 for the electronic component D and a transport mechanism that transports the electronic components D to the various process processing mechanisms 4.
  • the transport mechanism includes a turntable 21.
  • the center of the turntable 21 is supported by a drive shaft of a direct drive motor 22 disposed below.
  • the turntable 21 rotates intermittently at a predetermined angle as the direct drive motor 22 is driven.
  • a plurality of holding means for holding the electronic component D are attached to the outer peripheral end of the turntable 21 at regular intervals along the outer periphery of the turntable 21.
  • the outer periphery of the turntable 21 serves as a processing path for the electronic component D.
  • the transport mechanism holds the electronic component D by the holding means, aligns it on the outer periphery of the turntable 21, and rotates the turntable 21 to transport the electronic component D in the outer peripheral direction.
  • the arrangement interval of the holding means is equal to the rotation angle of one pitch of the turntable 21.
  • the holding means is a suction nozzle 31 that sucks and separates the electronic component D.
  • the suction nozzle 31 is movable up and down with respect to the turntable 21 by a support portion 32 attached to the outer peripheral end of the turntable 21.
  • a drive unit 33 including an operation rod 34 is disposed immediately above the suction nozzle 31. When the operation rod 34 contacts the upper end of the suction nozzle 31 and is pushed downward, the suction nozzle 31 is lowered.
  • the inside of the pipe of the suction nozzle 31 communicates with a pneumatic circuit of a vacuum generator (not shown). The suction nozzle 31 sucks the electronic component D by generating a negative pressure and releases the electronic component D by vacuum break.
  • Various process processing mechanisms 4 surround the turntable 21 and are arranged at equal intervals in the outer circumferential direction.
  • the arrangement interval is the same as or equal to an integral multiple of the rotation angle of one pitch of the turntable 21.
  • the arrangement positions of the various process processing mechanisms 4 coincide with the stop positions P of the holding means.
  • Each of the various transport processing mechanisms is arranged at each stop position P. If the number of stop positions is equal to or greater than the number of transport processing mechanisms 4, these numbers may not be the same, and there may be a stop position P where the transport processing mechanism 4 is not disposed.
  • the various process processing mechanisms 4 for example, the parts feeder 41, the test contact device 42, the marking unit 43, the appearance inspection device 45, the sorting / sorting mechanism 46, the taping unit 47, and the discharge of defective products are sequentially performed in the rotation direction of the turntable 21.
  • a device 48 is arranged.
  • the parts feeder 41 is a device that supplies the electronic component D to the electronic component inspection apparatus 1, and supplies a large number of electronic components D in a line up to just below the outer peripheral edge of the turntable 21.
  • the test contact device 42 has a contact that is a plate-like metal such as beryllium copper, and contacts the lead D1 of the electronic component D to cause a current to flow or a voltage to be applied. Measure and inspect electrical characteristics such as voltage, current, resistance, or frequency.
  • the marking unit 43 has a lens for laser irradiation facing the electronic component D, and performs marking by irradiating the electronic component D with a laser.
  • the appearance inspection apparatus 45 has a camera, images the electronic component D, and inspects the presence or absence of an electrode shape, surface defects, scratches, dirt, foreign matter, and the like of the electronic component D from the image.
  • the classification / sorting mechanism 46 classifies the electronic component D into a defective product and a non-defective product according to the results of the appearance inspection and the electrical property inspection, and classifies and shoots according to the level.
  • the taping unit 47 intermittently transports the carrier tape in which the storage pocket of the electronic component D is formed by embossing, and stores the electronic component D determined to be non-defective in the storage pocket.
  • the defective product discharge device 48 discharges the electronic component D that has not been taped and packed from the electronic component inspection device 1.
  • FIG. 4 is a top view of the parts feeder 41
  • FIG. 5 is a side view of the parts feeder 41.
  • the bowl portion 5 and the chute portion 6 are connected to each other, and the escape portion 7 is further arranged at the end of the chute portion 6.
  • the bowl part 5 is supported by the bowl vibrating body 5a.
  • the chute part 6 is supported by the chute vibrating body 6a.
  • the bowl vibrating body 5a and the chute vibrating body 6a have a combination of an electromagnet and a movable core inside, and vibrate by energization control to the electromagnet.
  • the bowl portion 5 is torsionally vibrated with the vibration of the bowl vibrating body 5a.
  • the chute portion 6 vibrates in an oblique direction that intersects with the extending direction at an angle along with the vibration of the chute vibrator 6a.
  • the bowl portion 5 is a mortar-shaped container and is a storage unit that stores the electronic component D.
  • a supply path 51 is engraved on the inner surface of the bowl portion 5 so as to climb the inner wall surface spirally from the bottom portion toward the upper edge.
  • the electronic parts D are aligned in a row while being guided by the supply path 51 by the torsional vibration of the bowl part 5 and climb the inner wall surface of the bowl part 5.
  • a sensor unit 53 is provided on the supply path 51 of the bowl unit 5.
  • the sensor unit 53 detects the front and back of the electronic component D, and separates the electronic component D from the supply path 51 according to the detection result of the front and back of the electronic component D and returns it to the inside of the bowl unit 5.
  • the sensor unit 53 includes a light projecting / receiving sensor.
  • the front and back of the electronic component D are detected according to the amount of reflection from the sensor area. Since the lead D1 is exposed on the back surface of the electronic component D, the reflection amount is higher than that on the front surface.
  • the sensor unit 53 includes a blower hole that blows air so as to cross the supply path 51 as an excluding means for separating the electronic component D from the supply path 51.
  • the blower hole blows air supplied from a compressor or cylinder (not shown) to the electronic component D and blows it into the bowl portion 5 by air pressure.
  • the sensor unit 53 is electrically connected to the sensor amplifier 8.
  • the sensor amplifier 8 amplifies the signal output from the sensor unit 53.
  • the supply and shutoff of air to the blower hole are switched by the electromagnetic valve 9.
  • the electromagnetic valve 9 turns on or off the pneumatic circuit that leads to the blower hole according to the presence or absence of the signal amplified by the sensor amplifier 8.
  • the presence / absence of a signal can be restated as the presence / absence of a signal exceeding a predetermined threshold.
  • the supply path 51 is formed by cutting out the inner wall surface in a substantially L shape. That is, the supply path 51 of the bowl part 5 is constituted by a step part 51a that forms the bottom surface and a back part 51b that rises from the step part 51a and leans against the electronic part D, and the upper part of the electronic part D is released.
  • the step portion 51a supports one side surface of the electronic component D.
  • the back surface portion 51b supports the front surface or the back surface of the electronic component D.
  • the step portion 51a becomes narrower as it climbs upward.
  • the shape of the supply path 51 of the bowl portion 5 enables various electronic components D having different sizes to be conveyed without replacement.
  • a barrier 52 protruding so as to face the stepped part 51 a above the supply path 51 at a single point is provided in front of the sensor part 53.
  • the barrier 52 is in contact with the upper part of the back surface portion 51b.
  • a predetermined space is formed between the barrier 52 and the step portion 51 a of the supply path 51.
  • the barrier 52 is provided with a long hole 52a extending toward the back surface portion 51b.
  • the long hole 52a is formed long in the direction toward the stepped portion 51a.
  • a jig pin 52b is detachably attached to one point of the supply path 51.
  • the jig pin 52b protrudes in parallel with the stepped portion 51a from the upper end of the back surface portion 51b toward the inside of the bowl portion 5.
  • the barriers 52 abut against other electronic components D stacked on the electronic components D as a result of conveyance by torsional vibration, and are rearranged in a row. As shown in FIGS. 7A and 7B, the lower end position of the barrier 52 can be adjusted according to the diameter of the jig pin 52b. Various diameters of the jig pin 52b are prepared in advance according to the size of the electronic component D supplied to the electronic component inspection apparatus 1.
  • the chute part 6 is a linear rail, and a supply path 61 is provided along the straight line.
  • the supply path 61 of the chute unit 6 is connected to the end of the supply path 51 of the bowl unit 5 at the start end.
  • the supply path 61 of the chute 6 is defined by a base 62, a fixed guide 63 and a movable guide 64.
  • the base 62 defines the bottom surface of the supply path 61.
  • the fixed guide 63 and the movable guide 64 are provided on the upper surface of the base 62 and face each other at a predetermined distance to define the side wall of the supply path 61.
  • the fixed guide 63 is fixed on the base 62, and the movable guide 64 is movable on the base 62 in the width direction of the supply path 61.
  • the movable guide 64 is pivotally supported on the action point 65 a of the S-shaped lever 65.
  • the action point 65 a is set at one end of the S-shaped lever 65.
  • the lever 65 has a bent portion closest to the action point 65 a as a fulcrum 65 b, and the fulcrum 65 b is pivotally supported by the base 62.
  • the other end of the lever 65 different from the action point 65a is a force point 65c.
  • a fixing member 65d is fixed to the base 62 at a position spaced apart from the force point 65c of the lever 65 by a predetermined distance.
  • Jig pins 65e with various diameters can be inserted between the fixing member 65d and the force point 65c.
  • a fixing member 66b is fixed at a position spaced a predetermined distance from the recess 66a.
  • the fixing member 66b faces the recess 66a in a direction orthogonal to the supply path 61.
  • the fixing member 66 b extends from the fixed guide 63 across the supply path 61 so as not to obstruct the supply path 61.
  • Jig pins 66c of various diameters can be inserted between the recess 66a and the fixing member 66b.
  • the arrangement angle of the lever 65 with respect to the supply path 61 is changed depending on the diameter of the jig pin 65e, and the position of the movable guide 64 is displaced in the width direction of the supply path 61 accordingly. That is, the supply path 61 defined by the fixed guide 63, the movable guide 64, and the base 62 is inserted with jig pins 65e and 66c having a diameter corresponding to the size of the electronic component D, and the width thereof is adjusted.
  • the electronic parts D of various sizes can be transported without replacement of parts.
  • the escape part 7 has a stopper for controlling the stop and advance of the electronic component D at the end of the supply path 61 of the chute part 6 and a placement space for placing the electronic part D. It moves in parallel from the end to just below the suction nozzle 31 supported by the turntable 21.
  • Such an electronic component inspection apparatus 1 operates as follows. First, one cycle of the operation of the electronic component inspection apparatus 1 includes conveyance and process processing. In the conveyance, the electronic component D is received, the electronic component D is moved, and the electronic component D is transferred in order.
  • the suction nozzle 31 In receiving the electronic component D, the suction nozzle 31 is lowered, the electronic component D on the stage of the process processing mechanism 4 is sucked, and the suction nozzle 31 is lifted in order. In other words, the movement of the electronic component D is rotation of the turntable 21 by a predetermined angle, that is, movement of the suction nozzle 31 to the next stop position P. In the delivery of the electronic component D, the suction nozzle 31 is lowered, the electronic component D is detached from the stage of the process processing mechanism 4, and the suction nozzle 31 is lifted in order.
  • the turntable 21 rotates by a predetermined angle every cycle and stops for a predetermined time.
  • Each suction nozzle 31 sequentially moves to each stop position P on the outer periphery of the turntable 21 by intermittent rotation of the turntable 21.
  • any kind of process processing mechanism 4 is arranged.
  • the suction nozzle 31 descends toward the stage of the process processing mechanism 4 to detach the electronic component D.
  • the process processing mechanism 4 receives the electronic component D
  • the process processing mechanism 4 processes the electronic component D.
  • the suction nozzle 31 descends again toward the stage, sucks the electronic component D, and rises.
  • the turntable 21 moves to the next cycle and rotates by a predetermined angle.
  • the electronic component D is first accommodated in the bowl portion 5.
  • the electronic components D in the bowl portion 5 are aligned in a line while climbing on the inner wall surface of the bowl portion 5 while being guided by the supply path 51 by torsional vibration.
  • the supply path 51 of the bowl portion 5 is L-shaped and opened upward, the height of the electronic component D is not limited, and various electronic components D can be conveyed.
  • the electronic component D stacked on the other electronic component D is brought into contact with the barrier 52 and dropped into the bowl portion 5.
  • the height between the barrier 52 and the stepped portion 51a is adjusted so as to provide a margin of about 0.2 mm when various electronic components D pass under the barrier 52, for example.
  • This height is obtained by adding the height from the stepped portion 51a at the position where the jig pin 52b and the back surface portion 51b are in contact with the diameter of the jig pin 52b, and from the upper end of the long hole 52a of the barrier 52 to the barrier 52. It is a value obtained by subtracting the length to the lower end. That is, the height adjustment of the barrier 52 is achieved by changing the diameter of the jig pin 52b.
  • the front and back of the electronic component D that passes through the sensor unit 53 is detected.
  • the electromagnetic valve 9 is turned on.
  • the solenoid valve 9 is turned on, the pneumatic circuit communicates with the blower hole, and air blows out from the blower hole.
  • the solenoid valve 9 When the electronic component D is conveyed facing the surface, the solenoid valve 9 remains off and the blower hole and the pneumatic circuit are shut off, so that air does not blow out from the blower hole.
  • the component D passes through the sensor unit 53.
  • the electronic components D that have passed through the sensor unit 53 move to the supply path 61 of the chute unit 6, and are aligned in a row while being guided by the supply path 61 by the vibration of the chute unit 6 and reach the end.
  • the width of the supply path 61 of the chute unit 6 is adjusted in advance according to the size of the electronic component D.
  • the width of the supply path 61 is determined by the diameter of the jig pin 66 c that is brought into contact with each recess 66 a and the force point 65 c of the lever 65.
  • the jig pin 66c is inserted between the recess 66a and the fixing member 66b, the recess 66a and the fixing member 66b are separated according to the diameter of the jig pin 66c. That is, the movable guide 64 is pushed away in the width direction according to the diameter of the jig pin 66c.
  • the jig pin 65e inserted between the force point 65c of the lever 65 and the fixing member 65d rotates the lever 65 by an amount corresponding to its diameter around the fulcrum 65b. Accordingly, the action point 65 a of the lever 65 rotates in the width direction of the supply path 61.
  • the movable guide 64 pivotally supported by the lever 65 moves in the width direction by the rotation of the lever 65. That is, the width adjustment of the supply path 61 of the chute 6 is achieved by changing the diameters of the jig pins 65e and 66c.
  • the electronic component D that has reached the end of the supply path 61 of the chute unit 6 is controlled to stop and advance by the stopper of the escape unit 7, moves to the placement space of the escape unit 7 one by one, and immediately below the suction nozzle 31. Moving.
  • the electronic component D is held by the suction nozzle 31 that is located at the end of the supply path of the parts feeder 41 and has moved right up in the first cycle.
  • the electronic component D held at the end of the conveyance path of the parts feeder 41 is sequentially supplied to the test contact 42, the marking unit 43, the appearance inspection device 45, the sorting / sorting mechanism 46, and the taping unit 47 for each subsequent cycle. A process is performed.
  • the electronic component D that has not been packed is supplied to the defective product discharge device 48 and discharged from the electronic component inspection device 1.
  • the supply path 51 formed in the bowl portion 5 that accommodates the electronic component D has a spiral inner periphery from the bottom surface to the upper edge.
  • the surface is cut into an L shape, and has a stepped portion 51a that supports the side surface of the electronic component D and a back surface portion 51b that supports the front surface or the back surface.
  • the height of the electronic component D is not limited, and any size electronic component D can be supplied to each process processing mechanism 4 without requiring a switching operation. Therefore, the burden and time of the switching work of the electronic component inspection apparatus 1 are reduced, and the production efficiency is improved.
  • a barrier 52 projecting upward facing the stepped portion 51 a is further disposed at one point of the supply path 51 of the bowl portion 5.
  • the barrier 52 is provided in a direction toward the back portion 51b, has a long hole 52a in the direction toward the step portion 51a, and has a jig pin with various diameters so as to protrude from the back portion 51b in parallel with the step portion 51a. Any one of 52b penetrates the long hole 52a and is detachably attached to be arranged at one point of the supply path 51.
  • this barrier 52 whatever size electronic component D is supplied, only the electronic component D stacked on the other electronic component D can be easily changed by changing the diameter of the jig pin 52 b. Can be returned to. Therefore, even if the supply path 51 is cut out in an L shape, the electronic components D can be accurately aligned and supplied to the transport mechanism.
  • the supply path 61 of the chute unit 6 is configured by a base 62 that forms a bottom surface, and a fixed guide 63 and a movable guide 64 that form both side surfaces.
  • the lever 65 is pivotally supported at one end of the lever 65 and is moved in the width direction according to the arrangement angle of the lever 65 with respect to the supply path 61.
  • the transport mechanism may be a linear transport system, or a plurality of turntables 21.
  • a single transport path may be configured.
  • a holding means instead of the suction nozzle 31 for sucking and releasing the electronic component D by generation and breakage of vacuum, an electrostatic suction method, a Bernoulli chuck method, or a chuck mechanism for mechanically holding the electronic component D is arranged. May be.
  • the various process processing mechanisms 4 are not limited to the types described above, and can be replaced with various process processing mechanisms 4, and the arrangement order can be changed as appropriate.

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Sorting Of Articles (AREA)

Abstract

L'invention porte sur un appareil d'inspection de composant électronique par lequel des opérations de commutation de composants électroniques sont éliminées dans la mesure du possible, et le rendement de production est amélioré. Un dispositif d'alimentation en pièces est également décrit. Un chemin d'alimentation (51) d'une section de cuve (5) qui contient des composants électroniques (D) est formé par découpe en spirale, en forme de L, de la surface circonférentielle interne de la section de cuve (5) de la surface inférieure jusqu'au bord supérieur, et le chemin d'alimentation comprend une partie en échelon (51a) qui supporte la surface latérale des composants électroniques (D), et une partie surface arrière (51b) qui supporte la surface avant ou la surface arrière des composants électroniques. Les composants électroniques (D) sur le chemin d'alimentation (51) sont entourés simplement par la partie en échelon (51a) et la partie surface arrière (51b), la partie supérieure étant ouverte, et la hauteur des composants électroniques (D) n'est pas limitée.
PCT/JP2010/006993 2010-11-30 2010-11-30 Appareil d'inspection de composant électronique et dispositif d'alimentation en pièces WO2012073284A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2010/006993 WO2012073284A1 (fr) 2010-11-30 2010-11-30 Appareil d'inspection de composant électronique et dispositif d'alimentation en pièces
JP2012546572A JP5586072B2 (ja) 2010-11-30 2010-11-30 電子部品検査装置及びパーツフィーダ

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Application Number Priority Date Filing Date Title
PCT/JP2010/006993 WO2012073284A1 (fr) 2010-11-30 2010-11-30 Appareil d'inspection de composant électronique et dispositif d'alimentation en pièces

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WO2012073284A1 true WO2012073284A1 (fr) 2012-06-07

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016125075A1 (fr) * 2015-02-06 2016-08-11 Stora Enso Oyj Appareil et procédé d'assemblage de composant
CN106081564A (zh) * 2016-07-11 2016-11-09 平湖市品耀机器自动化有限公司 一种金属短管自动振动送料盘
CN107504996A (zh) * 2017-09-29 2017-12-22 南京冠鼎光电科技有限公司 一种光电探测器自动化测试线

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WO2016125075A1 (fr) * 2015-02-06 2016-08-11 Stora Enso Oyj Appareil et procédé d'assemblage de composant
US10658209B2 (en) 2015-02-06 2020-05-19 Stora Enso, OYJ Apparatus and method for component positining
CN106081564A (zh) * 2016-07-11 2016-11-09 平湖市品耀机器自动化有限公司 一种金属短管自动振动送料盘
CN106081564B (zh) * 2016-07-11 2018-07-06 平湖市品耀机器自动化有限公司 一种金属短管自动振动送料盘
CN107504996A (zh) * 2017-09-29 2017-12-22 南京冠鼎光电科技有限公司 一种光电探测器自动化测试线
CN107504996B (zh) * 2017-09-29 2023-04-25 南京冠鼎光电科技有限公司 一种光电探测器自动化测试线

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