WO2012066667A1 - 回転角検出装置 - Google Patents
回転角検出装置 Download PDFInfo
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- WO2012066667A1 WO2012066667A1 PCT/JP2010/070585 JP2010070585W WO2012066667A1 WO 2012066667 A1 WO2012066667 A1 WO 2012066667A1 JP 2010070585 W JP2010070585 W JP 2010070585W WO 2012066667 A1 WO2012066667 A1 WO 2012066667A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/30—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/142—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices
- G01D5/145—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices influenced by the relative movement between the Hall device and magnetic fields
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
- G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
- G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
- G01D5/2451—Incremental encoders
Definitions
- the present invention relates to a rotation angle detection device.
- a general magnetic rotation angle detector uses a magnetic sensor to detect a magnetic field formed by a multi-pole magnetic pattern of a rotating drum in which N and S poles are alternately magnetized on the outer periphery of the rotating drum at a magnetization pitch ⁇ . Using the result, the rotation angle of the rotating drum is detected as the rotation angle of a rotating body such as a motor connected to the rotating drum via a shaft.
- a magnetoresistive effect element (MR element) such as an AMR element is used for the magnetic sensor, and the magnetic sensor utilizes the property of the AMR element that the electric resistance changes with respect to the change of the magnetic field.
- the change in the magnetic field caused by the rotation of the rotating drum is detected by the MR element, and the rotation angle of the rotating drum is detected based on the sinusoidal detection signal obtained thereby.
- the magnetic sensor outputs a sine wave (A phase) detection signal and a cosine wave (B phase) detection signal that are 90 degrees out of phase by arranging MR elements in an array. It is configured.
- a subsequent arithmetic unit that receives the detection signals from these magnetic sensors calculates the rotation angle of the rotating drum by performing an arctangent calculation of the A-phase detection signal and the B-phase detection signal.
- the MR characteristic curve for converting the magnetic flux density into the detection signal (resistance change rate) of the MR element has a quadratic function shape having a minimum point at the position where the magnetic flux density is zero. This is because the output is saturated at a magnetic field (magnetic flux density) larger than the inflection point (out of the shape of the next function), and the MR waveform is close to a rectangular shape.
- Patent Document 1 in a magnetic sensor for detecting the position of a rotating drum on which magnetic signals are recorded at a pitch ⁇ , another MR element is separated from one MR element by ⁇ / 10, ⁇ / 6, ⁇ / 6 + ⁇ / 10. A configuration in which a plurality of are arranged is described.
- the fifth and third harmonics can be canceled from the output signal of the magnetic sensor by adding the output signals of these four MR elements with the differential amplifier at the subsequent stage. It is possible to cancel the waveform distortion in the output signal of the magnetic sensor caused by the saturation of the MR element.
- each MR element is formed of a ferromagnetic thin film, and itself is known to collect a magnetic field from a rotating drum. For this reason, when the MR elements are arranged according to the waveform distortion removal rule, the arrangement intervals of the MR elements are always unequal. That is, in the magnetic sensor described in Patent Document 1, spatial distortion of magnetic flux density is generated due to variations in the MR magnetic collection effect. Therefore, between signals of a pair of MR elements arranged in a positional relationship for removing fifth-order distortion. As a result, an unbalance occurs, and an unbalance tends to occur between signals of a pair of MR elements arranged in a positional relationship for removing third-order distortion. This may reduce the accuracy of removing waveform distortion in the output signal of the magnetic sensor (rotation angle detection device).
- the present invention has been made in view of the above, and an object thereof is to obtain a rotation angle detection device capable of improving the accuracy of removing waveform distortion in a detection signal of the rotation angle detection device.
- a rotation angle detection device is a rotation that detects a rotation angle of a rotary drum having a multipolar magnetic pattern with a magnetization pitch ⁇ on the outer periphery.
- An angle detection device comprising a detection track for detecting the multipolar magnetic pattern, wherein the detection track should be removed from a plurality of high frequency components superimposed on a fundamental wave component of a detection signal of the multipolar magnetic pattern It has a plurality of first magnetoresistive elements arranged at intervals of ⁇ / (2n), where n is the order of the high frequency component, and the first magnetoresistive element arranged between the first reference potential and the output terminal.
- the magnetic flux collection effect of the plurality of first magnetoresistive elements and the plurality of first dummy magnetoresistive elements can be made uniform, and the spatial distribution of the magnetic flux density in the vicinity of the plurality of first magnetoresistive elements can be obtained. It can be made uniform. Further, the magnetic flux collection effect of the plurality of second magnetoresistive elements and the plurality of second dummy magnetoresistive elements can be made uniform, and the spatial distribution of the magnetic flux density in the vicinity of the plurality of second magnetoresistive elements can be made uniform. Thereby, the removal accuracy of the waveform distortion in the detection signal of the rotation angle detection device can be improved.
- FIG. 1 is a diagram illustrating a configuration of the rotation angle detection device according to the first embodiment.
- FIG. 2 is a diagram illustrating the configuration of the magnetic sensor according to the first embodiment.
- FIG. 3 is a diagram showing a configuration of the detection track in the first embodiment.
- FIG. 4 is a diagram showing the effect of the first embodiment.
- FIG. 5 is a diagram showing the configuration of the detection track in the second embodiment.
- FIG. 6 is a diagram showing the configuration of the detection track in the third embodiment.
- FIG. 7 is a diagram illustrating a configuration of the magnetic sensor according to the fourth embodiment.
- FIG. 8 is a diagram illustrating a configuration of a magnetic sensor in a comparative example.
- FIG. 9 is a diagram showing the configuration of the detection track in the comparative example.
- FIG. 1 is a diagram illustrating a schematic configuration of a rotation angle detection device 30 according to the first embodiment.
- FIG. 2 is a diagram illustrating a configuration of the magnetic sensor 10 according to the first embodiment.
- the rotation angle detection device 30 detects the rotation angle of the rotary drum 1 as shown in FIG.
- the rotating drum 1 has a multipolar magnetic pattern 3 and a magnetic pattern 4 on the outer periphery.
- the multipolar magnetic pattern 3 is alternately magnetized with N and S poles alternately at a magnetization pitch ⁇ .
- the magnetic pattern 4 is magnetized at one location so as to indicate the origin in the collecting direction of the rotary drum 1.
- the rotation angle detection device 30 includes a magnetic sensor 10 and a rotation angle calculation unit 20.
- the magnetic sensor 10 is disposed so as to face the outer periphery of the rotating drum 1.
- the magnetic sensor 10 detects a change in the magnetic field received when the rotating drum 1 rotates, and outputs the detection result to the rotation angle calculation unit 20.
- the rotation angle calculation unit 20 calculates the rotation angle of the rotary drum 1 based on the detection result by the magnetic sensor 10.
- the magnetic sensor 10 includes a substrate 11, an A phase detection track 12, a B phase detection track (second detection track) 13, and a Z phase detection track 14.
- the substrate 11 is disposed at a position facing the outer periphery of the rotating drum 1 in the magnetic sensor 10, and forms a surface facing the outer periphery of the rotating drum 1.
- the substrate 11 has a rectangular shape, for example.
- the substrate 11 is formed of, for example, a material whose main component is glass.
- the A phase detection track 12 is arranged at a position facing the multipolar magnetic pattern 3 on the substrate 11 (on the surface facing the outer periphery of the rotating drum 1).
- the A-phase detection track 12 detects the multipolar magnetic pattern 3.
- the A-phase detection track 12 includes a plurality of magnetoresistive elements MR11 to MR24, and changes in the magnetic field received from the multipolar magnetic pattern 3 when the rotary drum 1 rotates changes in the resistances of the magnetoresistive elements MR11 to MR24. Convert to and detect.
- the A-phase detection track 12 outputs the detection result (voltage corresponding to the change in resistance of the magnetoresistive elements MR11 to MR24) to the rotation angle calculation unit 20 as an A-phase (sine wave) detection signal (sin ⁇ ).
- the B-phase detection track 13 is a position that is perpendicular to the circumferential direction of the rotary drum 1 with respect to the A-phase detection track 12, and is a multipolar magnet on the substrate 11 (on the surface facing the outer periphery of the rotary drum 1). It is arranged at a position facing the pattern 3.
- the B phase detection track 13 detects the multipolar magnetic pattern 3 with a phase difference of ⁇ / 4 with respect to the A phase detection track 12.
- the B-phase detection track 13 has a plurality of magnetoresistive elements MR11 to MR24, and the phase difference of ⁇ / 4 from the multipolar magnetic pattern 3 when the rotary drum 1 rotates (with respect to the A-phase detection track 12).
- the change in the received magnetic field is detected by converting the change in the resistance of the magnetoresistive elements MR11 to MR24.
- the B phase detection track 13 outputs the detection result (voltage corresponding to the change in resistance of the magnetoresistive elements MR11 to MR24) to the rotation angle calculation unit 20 as a B phase (cosine wave) detection signal (cos ⁇ ).
- the Z-phase detection track 14 is a position that is perpendicular to the circumferential direction of the rotary drum 1 with respect to the A-phase detection track 12 and the B-phase detection track 13, and is on the substrate 11 (the surface facing the outer periphery of the rotary drum 1). It is arranged at a position facing the magnetic pattern 4 in the upper).
- the Z phase detection track 14 detects the magnetic pattern 4. That is, the B-phase detection track 13 detects a change in the magnetic field received from the magnetic pattern 4 when the rotary drum 1 rotates and outputs the detection result to the rotation angle calculation unit 20 as a Z-phase (origin position) detection signal. .
- the A phase detection track 12 and the B phase detection track 13 have the same width and position in the circumferential direction of the rotary drum 1.
- the A phase detection track 12 and the B phase detection track 13 both have a common pattern surrounded by a broken line, and the position of the common pattern in the circumferential direction of the rotary drum 1 is shifted by ⁇ / 4.
- Dummy magnetoresistive elements D701 to D715 are arranged on the right side in the drawing with respect to the common pattern in the A phase detection track 12, and dummy magnetoresistive elements D601 to D615 on the left side in the drawing with respect to the common pattern in the B phase detection track 13. Is arranged.
- the A phase detection track 12 and the B phase detection track 13 have the same width and position in the circumferential direction of the rotary drum 1.
- FIG. 3 is a diagram showing a configuration of a common pattern in the A-phase detection track 12 or the B-phase detection track 13.
- the common pattern includes a detection element group (first detection element group) MR1, a detection element group (second detection element group) MR2, a dummy element group D1, and a dummy element group D2. ing.
- the detection element group MR1 is arranged between the power supply potential (first reference potential) Vcc and the output terminal Tout.
- the detection element group MR1 has one end connected to the power supply potential Vcc and the other end connected to the output terminal Tout and one end of the second detection element group MR2.
- the detection element group MR1 has a plurality of magnetoresistance elements (a plurality of first magnetoresistance elements) MR11 to MR14.
- Each of the magnetoresistive elements MR11 to MR14 extends in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the magnetoresistive elements MR11 to MR14 is formed of a material mainly composed of a ferromagnetic material having an AMR (Anisotropic Magnet Resistance) effect, and has a magnetic flux collecting effect.
- Each of the magnetoresistive elements MR11 to MR14 is formed of, for example, permalloy.
- the plurality of magnetoresistive elements MR11 to MR14 are to be removed from the plurality of high frequency components superimposed on the fundamental wave component (sine wave or cosine wave) of the detection signal of the multipolar magnetic pattern 3.
- the order of (high-frequency distortion) is n, they are arranged at intervals of ⁇ / (2n).
- this arrangement rule is a rule for removing the waveform distortion of the detection signal of the multipolar magnetic pattern 3, and therefore will be referred to as a first waveform distortion removal rule.
- the detection element group MR1 converts and detects the change in the magnetic field received from the multipolar magnetic pattern 3 into the change in the resistance of the plurality of magnetoresistive elements arranged according to the first waveform distortion removal rule.
- a signal (voltage) corresponding to the combined change in resistance of the resistance element is output to the output terminal Tout as a detection result.
- the detection element group MR1 has a positional relationship for removing fifth-order distortion (pitch P 5 ) and a positional relationship for removing third-order distortion (pitch P 3 ) Including a plurality of magnetoresistive elements MR11 to MR14 arranged in accordance with a first waveform distortion removal rule.
- the detection element group MR2 is arranged between the ground potential (second reference potential) GND and the output terminal Tout.
- the detection element group MR2 has one end connected to the ground potential GND and the other end connected to the output terminal Tout and the other end of the first detection element group MR1.
- the detection element group MR2 includes a plurality of magnetoresistance elements (a plurality of second magnetoresistance elements) MR21 to MR24.
- Each of the magnetoresistive elements MR21 to MR24 extends in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the magnetoresistive elements MR21 to MR24 is made of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- the magnetoresistive elements MR21 to MR24 are made of, for example, permalloy.
- the plurality of magnetoresistive elements MR21 to MR24 are to be removed from the plurality of high frequency components superimposed on the fundamental wave component (sine wave or cosine wave) of the detection signal of the multipolar magnetic pattern 3.
- the order of (high-frequency distortion) is n, they are arranged at an interval of ⁇ / (2n). That is, the detection element group MR2 detects a change in the magnetic field received from the multipolar magnetic pattern 3 by converting it into a change in the resistance of a plurality of magnetoresistance elements arranged according to the first waveform distortion removal rule.
- a signal (voltage) corresponding to the combined change in resistance of the resistance element is output to the output terminal Tout as a detection result.
- detecting element group MR2 is 3 if and fifth-order harmonic distortion should be removed, 5 positional relationship for distortion removal (pitch P 5) and the third-order distortion positional relationship for the removal (pitch P 3 ) Including a plurality of magnetoresistive elements MR21 to MR24 arranged in accordance with a first waveform distortion removal rule.
- the order of the high-frequency component (high-frequency distortion) to be removed among a plurality of high-frequency components superimposed on the fundamental wave component (sine wave or cosine wave) of the detection signal of the multipolar magnetic pattern 3 is p.
- the pitch from the corresponding magnetoresistive element in the detection element group MR1 is ⁇ / p.
- this arrangement rule is different from the above rule for removing the waveform distortion of the detection signal of the multipolar magnetic pattern 3, and therefore will be referred to as a second waveform distortion removal rule. That is, signals output from the magnetoresistive elements corresponding to each other in the detection element group MR1 and the detection element group MR2 to the output terminal Tout cancel each other so as to remove the p-order high-frequency distortion.
- the magnetoresistive elements corresponding to each other in the detection element group MR1 and the detection element group MR2 include the second relationship including the positional relationship (pitch P 2 ) for removing the secondary high-frequency distortion when the secondary high-frequency distortion should be removed. It is arranged according to the waveform distortion removal rule.
- a signal obtained by canceling the signal from the magnetoresistive element MR11 and the signal from the magnetoresistive element MR21 can be regarded approximately as F3 ( ⁇ ) ⁇ F4 ( ⁇ ).
- the dummy element group D1 has a plurality of dummy magnetoresistive elements (a plurality of first dummy magnetoresistive elements) D11 to D15.
- the dummy magnetoresistive elements D11 to D15 have the same shape and dimensions as the magnetoresistive elements MR11 to MR14, and extend in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the dummy magnetoresistive elements D11 to D15 is formed of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- the dummy magnetoresistive elements D11 to D15 are made of, for example, permalloy.
- the plurality of dummy magnetoresistive elements D11 to D15 are arranged between the plurality of magnetoresistive elements MR11 to MR14.
- the plurality of dummy magnetoresistive elements D11 to D15 are arranged such that the spacings P11 to P18 between adjacent magnetoresistive elements among the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 are equal to each other.
- the adjacent magnetoresistive elements A plurality of dummy magnetoresistive elements are arranged so that the interval is ⁇ / (mK) (m is an integer of 2 or more).
- a plurality of dummy magnetoresistives are set so that the intervals P11 to P18 between adjacent magnetoresistive elements are ⁇ / 30.
- Elements D11 to D15 are arranged.
- the dummy magnetoresistive element D11 is disposed between the magnetoresistive element MR11 and the magnetoresistive element MR12 at a position of ⁇ / 30 from the magnetoresistive element MR11.
- the dummy magnetoresistive element D12 is disposed between the magnetoresistive element MR11 and the magnetoresistive element MR12 at a position of ⁇ / 30 from the magnetoresistive element MR12.
- the dummy magnetoresistive element D13 is disposed between the magnetoresistive element MR12 and the magnetoresistive element MR13 at a distance of ⁇ / 30 from both.
- the dummy magnetoresistive element D14 is disposed between the magnetoresistive element MR13 and the magnetoresistive element MR14 at a position of ⁇ / 30 from the magnetoresistive element MR13.
- the dummy magnetoresistive element D14 is arranged between the magnetoresistive element MR13 and the magnetoresistive element MR14 at a distance of ⁇ / 30 from the magnetoresistive element MR14.
- the dummy element group D2 includes a plurality of dummy magnetoresistive elements (a plurality of second dummy magnetoresistive elements) D21 to D25.
- the dummy magnetoresistive elements D21 to D25 have the same shape and dimensions as the magnetoresistive elements MR21 to MR24, and extend in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the dummy magnetoresistive elements D21 to D25 is formed of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- Each of the dummy magnetoresistive elements D21 to D25 is made of, for example, permalloy.
- the plurality of dummy magnetoresistive elements D21 to D25 are arranged between the plurality of magnetoresistive elements MR21 to MR24.
- the plurality of dummy magnetoresistive elements D21 to D25 are arranged such that the spacings P21 to P28 between adjacent magnetoresistive elements among the plurality of magnetoresistive elements MR21 to MR24 and the plurality of dummy magnetoresistive elements D21 to D25 are equal to each other.
- the adjacent magnetoresistive elements A plurality of dummy magnetoresistive elements are arranged so that the interval is ⁇ / (mK) (m is an integer of 2 or more).
- a plurality of dummy magnetoresistors are set so that the spacings P21 to P28 between adjacent magnetoresistive elements are ⁇ / 30.
- Elements D21 to D25 are arranged.
- the dummy magnetoresistive element D21 is arranged between the magnetoresistive element MR21 and the magnetoresistive element MR22 at a position of ⁇ / 30 from the magnetoresistive element MR21.
- the dummy magnetoresistive element D22 is disposed between the magnetoresistive element MR21 and the magnetoresistive element MR22 at a position of ⁇ / 30 from the magnetoresistive element MR22.
- the dummy magnetoresistive element D23 is disposed between the magnetoresistive element MR22 and the magnetoresistive element MR23 at a distance of ⁇ / 30 from both.
- the dummy magnetoresistive element D24 is disposed between the magnetoresistive element MR23 and the magnetoresistive element MR24 at a position of ⁇ / 30 from the magnetoresistive element MR23.
- the dummy magnetoresistive element D24 is arranged between the magnetoresistive element MR23 and the magnetoresistive element MR24 at a position of ⁇ / 30 from the magnetoresistive element MR24.
- the dummy magnetoresistive elements D601 to D615 shown in FIG. 2 have the same shape and dimensions as the magnetoresistive elements MR11 to MR24, and are striped in a direction substantially perpendicular to the circumferential direction of the rotary drum 1. It extends.
- Each of the dummy magnetoresistive elements D601 to D615 is made of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- the dummy magnetoresistive elements D601 to D615 are made of, for example, permalloy.
- the dummy magnetoresistive elements D701 to D715 shown in FIG. 2 have the same shape and dimensions as the magnetoresistive elements MR11 to MR24, and are striped in a direction substantially perpendicular to the circumferential direction of the rotary drum 1. It extends.
- Each of the dummy magnetoresistive elements D701 to D715 is formed of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- Each of the dummy magnetoresistive elements D701 to D715 is made of permalloy, for example.
- FIG. 4 shows a simulation result on the relationship between the tolerance of the arrangement interval of the magnetoresistive elements and the strain removal rate.
- the horizontal axis of FIG. 4 shows the tolerance of the arrangement interval of the magnetoresistive elements. This tolerance is equivalent to the average arrangement interval (for example, the above-mentioned ⁇ //) of the average interval of the magnetoresistive elements adjacent to each other among the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 on the detection element group MR1 side. 30), the ratio obtained by dividing the deviation amount from 30) by the uniform arrangement interval (for example, the above-mentioned ⁇ / 30) is expressed in%.
- the vertical axis in FIG. 4 indicates the waveform distortion removal rate (distortion removal rate) in the detection signal of the rotation angle detection device 130. This distortion removal rate is expressed as a percentage obtained by dividing the level of waveform distortion removed by the level of waveform distortion before removal.
- the adjacent magnetoresistive elements are evenly within a tolerance of ⁇ 10%. If it arrange
- the common pattern of the A-phase detection track 112 and the B-phase detection track 113 does not include the dummy element group D1 and the dummy element group D2.
- the arrangement intervals of the magnetoresistive elements are not uniform.
- Equation 12 Since the third-order distortion term (( ⁇ 1 ⁇ 2 ) sin 3 ⁇ ) in Equation 4 remains, the signal corresponding to the combined resistance change of the magnetoresistive element MR11 and the magnetoresistive element MR13 is The third-order high-frequency distortion remains without being removed.
- the interval (P3-P5) between the magnetoresistive elements MR22 and MR23 is smaller than the interval P5 between the magnetoresistive elements MR21 and MR22, and the arrangement interval of the magnetoresistive elements is not uniform.
- a spatial distortion of the magnetic flux density is generated due to the variation in the magnetic flux collection effect of the plurality of magnetoresistive elements MR11 to MR14. Therefore, between the signals of the pair of magnetoresistive elements arranged in a positional relationship for removing the fifth order distortion. Unbalance occurs, and unbalance tends to occur between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing third-order distortion.
- the common pattern of the A-phase detection track 12 and the B-phase detection track 13 includes the dummy element group D1 and the dummy element group D2.
- the plurality of dummy magnetoresistive elements D11 to D15 in the dummy element group D1 are arranged between the plurality of magnetoresistive elements MR11 to MR14.
- the intervals P11 to P18 between adjacent magnetoresistive elements among the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 are equal to each other.
- the magnetic flux collecting effect of the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 can be made uniform on the detection element group MR1 side, and the magnetic flux density in the vicinity of the plurality of magnetoresistive elements MR11 to MR14 can be increased. Since the spatial distribution can be made uniform, for example, the unbalance between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing fifth-order distortion can be reduced, and for example, in a positional relationship for removing third-order distortion. Unbalance can be reduced between signals of a pair of magnetoresistive elements arranged side by side.
- the plurality of dummy magnetoresistive elements D21 to D25 in the dummy element group D2 are arranged between the plurality of magnetoresistive elements MR21 to MR24.
- the spacings P21 to P28 between the adjacent magnetoresistive elements are equal to each other.
- the magnetic flux collecting effects of the plurality of magnetoresistive elements MR21 to MR24 and the plurality of dummy magnetoresistive elements D21 to D25 can be equalized on the detection element group MR2 side, and the magnetic flux density in the vicinity of the plurality of magnetoresistive elements MR21 to MR24 can be increased. Since the spatial distribution can be made uniform, for example, the unbalance between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing fifth-order distortion can be reduced, and for example, in a positional relationship for removing third-order distortion. Unbalance can be reduced between signals of a pair of magnetoresistive elements arranged side by side.
- the intervals between adjacent magnetoresistive elements among the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 are equal to each other within a tolerance of ⁇ 10%. Further, among the plurality of magnetoresistive elements MR21 to MR24 and the plurality of dummy magnetoresistive elements D21 to D25, the intervals between the adjacent magnetoresistive elements are equal to each other within a tolerance of ⁇ 10%. Thereby, the waveform distortion removal accuracy required for the rotation angle detection device 30 in practice can be achieved.
- the plurality of magnetoresistive elements MR11 to MR14 and the plurality of magnetoresistive elements MR21 to MR24 are self-heated when energized. Even in this case, the plurality of magnetoresistance elements MR11 to MR14, the plurality of dummy magnetoresistance elements D11 to D15, the plurality of magnetoresistance elements MR21 to MR24, and the plurality of dummy magnetoresistance elements D21 to D25 are mainly composed of a ferromagnetic material.
- the substrate 11 is made of a material mainly composed of glass.
- the heat generated in the plurality of magnetoresistive elements MR11 to MR14 and the plurality of magnetoresistive elements MR21 to MR24 is converted to a plurality of dummy magnetoresistive elements D11 to D15 and a plurality of dummy magnetoresistive elements D11 to D15 formed of a material having higher thermal conductivity than the substrate 11.
- Heat can be radiated by the dummy magnetoresistive elements D21 to D25. Thereby, it is possible to suppress the deterioration of the elements due to the self-heating of the plurality of magnetoresistive elements MR11 to MR14 and the plurality of magnetoresistive elements MR21 to MR24.
- the A-phase detection track 112 and the B-phase detection track 113 have different widths and positions in the circumferential direction of the rotary drum 1.
- the spatial distribution of the magnetic flux density is generated due to the distribution of the magnetic flux density corresponding to the regions 11b and 11c that are not, so that, for example, a pair of magnetoresistive elements (detecting element group MR1) arranged in a positional relationship for removing secondary distortion And the magnetoresistive elements corresponding to each other in the detection element group MR2 tend to be unbalanced.
- the A phase detection track 12 and the B phase detection track 13 have the same width and position in the circumferential direction of the rotary drum 1. That is, dummy magnetoresistive elements D701 to D715 are arranged on the right side in the drawing with respect to the common pattern in the A phase detection track 12, and dummy magnetoresistive elements D601 to D615 on the left side in the drawing with respect to the common pattern in the B phase detection track 13. Is arranged. Thereby, the A phase detection track 12 and the B phase detection track 13 have the same width and position in the circumferential direction of the rotary drum 1.
- the distribution of the magnetic flux density corresponding to the region between the A phase detection track 12 and the B phase detection track 13 on the substrate 11 can be made uniform, and the magnetic flux between the A phase detection track 12 and the B phase detection track 13 can be made. Since the spatial distribution of density can be made uniform, unbalance can be reduced between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing secondary distortion, for example.
- the substrate 11 may be formed of a material mainly containing zirconia or silicon instead of the material mainly containing glass.
- the common pattern of the A-phase detection track 12 and the B-phase detection track 13 may be a configuration in which the configuration shown in FIG. 3 is repeatedly arranged in the horizontal direction.
- the arrangement configuration of the detection element group MR1 and the detection element group MR2 in the common pattern of the A-phase detection track 12 and the B-phase detection track 13 is the first waveform distortion removal rule (see FIG. 3).
- the third-order and fifth-order high-frequency distortion is removed by a rule for removing distortion by the sum of signals), and the second-order high-frequency is obtained by a second waveform distortion removal rule (rule for removing distortion by a signal difference).
- the configuration is not limited to removing distortion.
- the second-order and fifth-order high-frequency distortion is removed by the first waveform distortion removal rule
- the third-order high-frequency distortion is removed by the second waveform distortion removal rule.
- the structure which removes may be sufficient.
- the arrangement configuration in the detection element group MR1 and the detection element group MR2 removes second-order and third-order high-frequency distortion by the first waveform distortion removal rule, and fifth-order high-frequency distortion by the second waveform distortion removal rule. It may be configured to remove distortion.
- Embodiment 2 the rotation angle detection device 30i according to the second embodiment will be described. Below, it demonstrates focusing on a different part from Embodiment 1.
- FIG. 1 the rotation angle detection device 30i according to the second embodiment will be described. Below, it demonstrates focusing on a different part from Embodiment 1.
- the rotation angle detection device 30i is different from the first embodiment in the configuration in the common pattern of the A-phase detection track 12i and the B-phase detection track 13i. That is, as shown in FIG. 5, the common pattern further includes a dummy element group D3i and a dummy element group D4i.
- FIG. 5 is a diagram showing a configuration in a common pattern of the A-phase detection track 12i and the B-phase detection track 13i.
- the dummy element group D3i is arranged on both outer sides of the detection element group MR1.
- the dummy element group D3i includes a plurality of dummy magnetoresistive elements (a plurality of third dummy magnetoresistive elements) D31i and D32i.
- the dummy magnetoresistive elements D31i and D32i have the same shape and dimensions as the magnetoresistive elements MR11 to MR14, and extend in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the dummy magnetoresistive elements D31i and D32i is formed of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- Each dummy magnetoresistive element D31i, D32i is formed of, for example, permalloy.
- the plurality of dummy magnetoresistive elements D31i and D32i include a plurality of magnetoresistive elements MR11 to MR14, a plurality of dummy magnetoresistive elements D11 to D15, and an interval between adjacent ones of the plurality of dummy magnetoresistive elements D31i and D32i.
- P11 to P18, P31i, and P32i are arranged on both outer sides of the detection element group MR1 so that they are equal to each other.
- the dummy magnetoresistive element D31i is arranged on the opposite side of the dummy magnetoresistive element D11 across the magnetoresistive element MR11 and at a distance of P31i (for example, ⁇ / 30) from the magnetoresistive element MR11.
- the dummy magnetoresistive element D32i is disposed on the opposite side of the dummy magnetoresistive element D15 across the magnetoresistive element MR14 and at a distance of P32i (for example, ⁇ / 30) from the magnetoresistive element MR14.
- the dummy element group D4i is arranged on both outer sides of the detection element group MR2.
- the dummy element group D4i includes a plurality of dummy magnetoresistive elements (a plurality of third dummy magnetoresistive elements) D41i and D42i.
- the dummy magnetoresistive elements D41i and D42i have the same shape and dimensions as the magnetoresistive elements MR21 to MR24, and extend in stripes in a direction substantially perpendicular to the circumferential direction of the rotary drum 1.
- Each of the dummy magnetoresistive elements D41i and D42i is formed of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetic flux collecting effect.
- Each dummy magnetoresistive element D41i, D42i is made of permalloy, for example.
- the plurality of dummy magnetoresistive elements D41i and D42i are the intervals between adjacent magnetoresistive elements among the plurality of magnetoresistive elements MR21 to MR24, the plurality of dummy magnetoresistive elements D21 to D25, and the plurality of dummy magnetoresistive elements D41i and D42i.
- P21 to P28, P41i, and P42i are arranged on both outer sides of the detection element group MR2 so as to be equal to each other.
- the dummy magnetoresistive element D41i is disposed on the opposite side of the dummy magnetoresistive element D21 across the magnetoresistive element MR21 and at a distance of P41i (for example, ⁇ / 30) from the magnetoresistive element MR21.
- the dummy magnetoresistive element D42i is disposed on the opposite side of the dummy magnetoresistive element D25 across the magnetoresistive element MR24 and at a distance of P42i (for example, ⁇ / 30) from the magnetoresistive element MR24.
- the plurality of magnetoresistive elements MR11 to MR14 among the plurality of magnetoresistive elements MR11 to MR14, the plurality of dummy magnetoresistive elements D11 to D15, and the plurality of dummy magnetoresistive elements D31i and D32i on the detection element group MR1 side.
- the intervals P11 to P18, P31i, and P32i between adjacent magnetoresistive elements are equal to each other.
- the magnetic collecting effects of the plurality of magnetoresistive elements MR11 to MR14, the plurality of dummy magnetoresistive elements D11 to D15, and the plurality of dummy magnetoresistive elements D31i and D32i can be equalized. It is possible to balance the spatial distribution of the magnetic flux density in the vicinity of the magnetoresistive elements MR11 and MR14 and the spatial distribution of the magnetic flux density in the vicinity of the other magnetoresistive elements MR12 and MR13.
- a plurality of magnetoresistive elements MR21 to MR24, a plurality of dummy magnetoresistive elements D21 to D25, and a distance P21 between adjacent magnetoresistive elements among the plurality of dummy magnetoresistive elements D41i and D42i. P28, P41i, and P42i are equal to each other.
- the magnetic collecting effects of the plurality of magnetoresistive elements MR21 to MR24, the plurality of dummy magnetoresistive elements D21 to D25, and the plurality of dummy magnetoresistive elements D41i and D42i can be equalized. It is possible to balance the spatial distribution of the magnetic flux density in the vicinity of the magnetoresistive elements MR21 and MR24 and the spatial distribution of the magnetic flux density in the vicinity of the other magnetoresistive elements MR22 and MR23.
- the dummy magnetoresistive elements are equally arranged on both the outer sides of the detection element group MR1 and both the outer sides of the detection element group MR2, the correspondence is provided at both ends of the detection element group MR1 and both ends of the detection element group MR2. Since the distribution of the magnetic flux density in the region can be made uniform, for example, signals of a pair of magnetoresistive elements arranged in a positional relationship for removing secondary distortion (corresponding magnetoresistive elements in the detection element group MR1 and the detection element group MR2). Unbalance can be reduced.
- the number of dummy magnetoresistive elements in the dummy element group D3i arranged on both outer sides of the detection element group MR1 may be two or more.
- the number of dummy magnetoresistive elements in the dummy element group D4i disposed on both outer sides of the detection element group MR2 may be two or more.
- the rotation angle detection device 30i may have a configuration in which one of the dummy element group D3i and the dummy element group D4i is omitted.
- Embodiment 3 the rotation angle detection device 30j according to the third embodiment will be described. Below, it demonstrates focusing on a different part from Embodiment 1.
- FIG. 1 the rotation angle detection device 30j according to the third embodiment.
- the rotation angle detection device 30j is different from the first embodiment in the configuration in the common pattern of the A-phase detection track 12j and the B-phase detection track 13j. That is, as shown in FIG. 6, the common pattern further includes a dummy element group D5j.
- FIG. 6 is a diagram showing a configuration in a common pattern of the A-phase detection track 12i and the B-phase detection track 13i.
- the dummy element group D5j is arranged between the detection element group MR1 and the detection element group MR2.
- the dummy element group D5j includes a plurality of dummy magnetoresistive elements (a plurality of fourth dummy magnetoresistive elements) D51j to D55j.
- the dummy magnetoresistive elements D51j to D55j have the same shape and dimensions as the magnetoresistive elements MR11 to MR14 and MR21 to MR24, and extend in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotary drum 1. Yes.
- Each of the dummy magnetoresistive elements D51j to D55j is made of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- Each of the dummy magnetoresistive elements D51j to D55j is made of permalloy, for example.
- the plurality of dummy magnetoresistive elements D51j to D55j include a plurality of magnetoresistive elements MR11 to MR14, a plurality of dummy magnetoresistive elements D11 to D15, a plurality of magnetoresistive elements MR21 to MR24, a plurality of dummy magnetoresistive elements D21 to D25, and Among the plurality of dummy magnetoresistive elements D51j to D55j, the distances P11 to P18, P51j to P56j, and P21 to P28 between the adjacent magnetoresistive elements are equal to each other between the detecting element group MR1 and the detecting element group MR2. It is arranged in.
- the dummy magnetoresistive element D51j is disposed between the magnetoresistive element MR14 and the magnetoresistive element MR21 and at a distance of P51j (for example, ⁇ / 30) from the magnetoresistive element MR14.
- the dummy magnetoresistive element D52j is disposed between the magnetoresistive element MR14 and the magnetoresistive element MR21 at a distance of P51j + P52j (for example, 2 ⁇ ⁇ / 30) from the magnetoresistive element MR14.
- the dummy magnetoresistive element D53j is disposed between the magnetoresistive element MR14 and the magnetoresistive element MR21 at a distance of P51j + P52j + P53j (for example, 3 ⁇ ⁇ / 30) from the magnetoresistive element MR14.
- the dummy magnetoresistive element D54j is disposed between the magnetoresistive element MR14 and the magnetoresistive element MR21 at a distance of P55j + P56j (for example, 2 ⁇ ⁇ / 30) from the magnetoresistive element MR21.
- the dummy magnetoresistive element D55j is arranged between the magnetoresistive element MR14 and the magnetoresistive element MR21 at a distance of P56j (for example, ⁇ / 30) from the magnetoresistive element MR21.
- the distribution of magnetic flux density can be made uniform between the magnetoresistive elements corresponding to each other in the detection element group MR1 and the detection element group MR2, so that, for example, a pair of magnetoresistive elements arranged in a positional relationship for removing secondary distortion Unbalance can be reduced between signals of (magnetoresistance elements corresponding to each other in the detection element group MR1 and the detection element group MR2).
- Embodiment 4 FIG. Next, the rotation angle detection device 30k according to the fourth embodiment will be described. Below, it demonstrates focusing on a different part from Embodiment 1. FIG.
- the rotation angle detection device 30k is different from the first embodiment in the configuration of the magnetic sensor 10k. That is, as shown in FIG. 7, the magnetic sensor 10k further includes a dummy element group D7k and a dummy element group D8k.
- FIG. 7 is a diagram showing the configuration of the magnetic sensor 10k.
- the dummy element group D7k and the dummy element group D8k are arranged above and below the A-phase detection track 12 and the B-phase detection track 13, respectively.
- the dummy element group D7k includes a plurality of dummy magnetoresistive elements (a plurality of fifth dummy magnetoresistive elements) D71k to D7qk.
- the dummy element group D8k includes a plurality of dummy magnetoresistive elements (a plurality of fifth dummy magnetoresistive elements) D81k to D8qk.
- the dummy magnetoresistive elements D71k to D7qk, D81k to D8qk have lengths L7k and L8k that are not less than the distances P11 to P18 (see FIG.
- the rotating drum 1 extends in a stripe shape in a direction substantially perpendicular to the circumferential direction of the rotating drum 1.
- Each of the dummy magnetoresistive elements D71k to D7qk, D81k to D8qk is made of a material mainly composed of a ferromagnetic material having an AMR effect, and has a magnetism collecting effect.
- the dummy magnetoresistive elements D71k to D7qk and D81k to D8qk are made of, for example, permalloy.
- the plurality of dummy magnetoresistive elements D71k to D7qk and D81k to D8qk are respectively a plurality of magnetoresistive elements MR11 to MR14, a plurality of dummy magnetoresistive elements D11 to D15, a plurality of dummy magnetoresistive elements D701 to D715, and a plurality of dummy magnetic elements.
- the resistor elements D601 to D615 are arranged at corresponding positions above and below at intervals G7k and G8k.
- the intervals G7k and G8k are equal to the interval G between the A-phase detection track 12 and the B-phase detection track 13.
- the upper gap G7k and the lower gap G8k are equal.
- the plurality of dummy magnetoresistive elements D71k to D7qk and D81k to D8qk are respectively the plurality of magnetoresistive elements MR11 to MR14, the plurality of dummy magnetoresistive elements D11 to D15,
- the dummy magnetoresistive elements D701 to D715 and the plurality of dummy magnetoresistive elements D601 to D615 are arranged at equal positions G7k and G8k at the corresponding positions above and below.
- the magnetic flux collecting effect of the plurality of magnetoresistive elements MR11 to MR14 and the plurality of dummy magnetoresistive elements D11 to D15 can be equalized in the vertical direction. Since the spatial distribution of the magnetic flux density in the vicinity of the plurality of magnetoresistive elements MR11 to MR14 can be made more uniform, for example, the unbalance between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing fifth-order distortion can be achieved. For example, the imbalance can be further reduced between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing third-order distortion.
- the magnetic flux collecting effect of the plurality of magnetoresistive elements MR21 to MR24 and the plurality of dummy magnetoresistive elements D21 to D25 can be equalized in the vertical direction. Since the spatial distribution of the magnetic flux density in the vicinity of the plurality of magnetoresistive elements MR21 to MR24 can be made more uniform, for example, the unbalance between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing fifth-order distortion can be achieved. For example, the imbalance can be further reduced between signals of a pair of magnetoresistive elements arranged in a positional relationship for removing third-order distortion.
- the waveform distortion removal accuracy in the detection signal of the rotation angle detection device 30k can be further improved.
- the rotation angle detection device is useful for detecting the rotation angle of a motor or the like.
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Abstract
Description
実施の形態1にかかる回転角検出装置30について図1及び図2を用いて説明する。図1は、実施の形態1にかかる回転角検出装置30の概略構成を示す図である。図2は、実施の形態1における磁気センサ10の構成を示す図である。
θ=tan-1((sinθ)/(cosθ))・・・数式1
により、回転ドラム1の回転角θを演算する。
F1(θ)=sinθ+α1sin3θ・・・数式2
と表される。このとき、磁気抵抗素子MR11からλ/6の距離、すなわち電気角60度の位置に配された磁気抵抗素子MR13の出力する信号F2(θ)は、
F2(θ)=sin(θ+60°)+α2sin3(θ+60°)・・・数式3
と表される。
F1(θ)+F2(θ)=sinθ+α1sin3θ+sin(θ+60°)+α2sin(3θ+180°)
=sinθ+α1sin3θ+sin(θ+60°)-α2sin3θ
=sinθ+sin(θ+60°)+(α1-α2)sin3θ・・・数式4
と表すことができる。このとき、
α1=α2・・・数式5
であれば、
F1(θ)+F2(θ)=sinθ+sin(θ+60°)・・・数式6
となって、3次の高周波歪みが除去される。
F3(θ)=sinθ+β1sin2θ・・・数式7
と表される。このとき、磁気抵抗素子MR11からλ/2の距離、すなわち電気角180度の位置に配された磁気抵抗素子MR21の出力する信号F4(θ)は、
F4(θ)=sin(θ+180°)+β2sin2(θ+180°)・・・数式8
と表される。
F3(θ)-F4(θ)=sinθ+β1sin2θ-sin(θ+180°)-β2sin(2θ+360°)
=sinθ+β1sin2θ+sinθ-β2sin2θ
=2sinθ+(β1-β2)sin2θ・・・数式9
と表すことができる。このとき、
β1=β2・・・数式10
であれば、
F3(θ)-F4(θ)=2sinθ・・・数式11
となって、2次の高周波歪みが除去される。
α1≠α2・・・数式12
となり、数式4における3次歪の項((α1-α2)sin3θ)が残ってしまうので、磁気抵抗素子MR11及び磁気抵抗素子MR13の抵抗の変化が合成されたものに応じた信号は、3次の高周波歪みが除去されずに残ってしまう。
次に、実施の形態2にかかる回転角検出装置30iについて説明する。以下では、実施の形態1と異なる部分を中心に説明する。
次に、実施の形態3にかかる回転角検出装置30jについて説明する。以下では、実施の形態1と異なる部分を中心に説明する。
次に、実施の形態4にかかる回転角検出装置30kについて説明する。以下では、実施の形態1と異なる部分を中心に説明する。
3 多極磁気パターン
4 磁気パターン
10 磁気センサ
11 基板
12、12i、12j A相検出トラック
13、13i、13j B相検出トラック
14 Z相検出トラック
20 回転角度演算部
30、30i、30j、30k 回転角検出装置
112 A相検出トラック
113 B相検出トラック
130 回転角検出装置
D1 ダミー素子群
D2 ダミー素子群
D3i ダミー素子群
D4i ダミー素子群
D5j ダミー素子群
D7k ダミー素子群
D8k ダミー素子群
D11~D15 ダミー磁気抵抗素子
D21~D25 ダミー磁気抵抗素子
D31i、D32i ダミー磁気抵抗素子
D41i、D42i ダミー磁気抵抗素子
D51j~D55j ダミー磁気抵抗素子
D71k~D7qk ダミー磁気抵抗素子
D81k~D8qk ダミー磁気抵抗素子
D601~D615 ダミー磁気抵抗素子
D701~D715 ダミー磁気抵抗素子
MR1 検出素子群
MR2 検出素子群
MR11~MR14 磁気抵抗素子
MR21~MR24 磁気抵抗素子
Claims (7)
- 着磁ピッチλの多極磁気パターンを外周に有する回転ドラムの回転角を検出する回転角検出装置であって、
前記多極磁気パターンを検出する検出トラックを備え、
前記検出トラックは、
前記多極磁気パターンの検出信号の基本波成分に重畳された複数の高周波成分のうち除去すべき高周波成分の次数をnとするときλ/(2n)の間隔で配された複数の第1の磁気抵抗素子を有しており、第1の基準電位と出力端子との間に配された第1の検出素子群と、
λ/(2n)の間隔で配された複数の第2の磁気抵抗素子を有しており、前記出力端子と第2の基準電位との間に配された第2の検出素子群と、
前記複数の第1の磁気抵抗素子の間に配された複数の第1のダミー磁気抵抗素子と、
前記複数の第2の磁気抵抗素子の間に配された複数の第2のダミー磁気抵抗素子と、
を有し、
前記複数の第1の磁気抵抗素子及び前記複数の第1のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、互いに均等であり、
前記複数の第2の磁気抵抗素子及び前記複数の第2のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、互いに均等である
ことを特徴とする回転角検出装置。 - 前記検出トラックは、
前記第1の検出素子群及び前記第2の検出素子群の少なくとも一方の両外側に配された複数の第3のダミー磁気抵抗素子をさらに有し、
前記複数の第1の磁気抵抗素子、前記複数の第1のダミー磁気抵抗素子、及び前記複数の第3のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、互いに均等である、あるいは、前記複数の第2の磁気抵抗素子、前記複数の第2のダミー磁気抵抗素子、及び前記複数の第3のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、互いに均等である
ことを特徴とする請求項1に記載の回転角検出装置。 - 前記検出トラックは、
前記第1の検出素子群と前記第2の検出素子群との間に配された複数の第4のダミー磁気抵抗素子をさらに有し、
前記複数の第1の磁気抵抗素子、前記複数の第1のダミー磁気抵抗素子、前記複数の第4のダミー磁気抵抗素子、前記複数の第2の磁気抵抗素子、及び前記複数の第2のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、互いに均等である
ことを特徴とする請求項1に記載の回転角検出装置。 - 前記検出トラックに対してλ/4の位相差で前記多極磁気パターンを検出する第2の検出トラックをさらに備え、
前記検出トラックと前記第2の検出トラックとは、前記回転ドラムの周方向における幅及び位置が均等である
ことを特徴とする請求項1に記載の回転角検出装置。 - 前記検出トラック及び前記第2の検出トラックの上下に均等な間隔で配された複数の第5のダミー磁気抵抗素子をさらに備えた
ことを特徴とする請求項4に記載の回転角検出装置。 - 前記複数の第1の磁気抵抗素子及び前記複数の第1のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、±10%の公差内で互いに均等であり、
前記複数の第2の磁気抵抗素子及び前記複数の第2のダミー磁気抵抗素子のうち互いに隣接する磁気抵抗素子の間隔は、±10%の公差内で互いに均等である
ことを特徴とする請求項1に記載の回転角検出装置。 - 前記検出トラックは、
前記複数の第1の磁気抵抗素子、前記複数の第1のダミー磁気抵抗素子、前記複数の第2の磁気抵抗素子、及び前記複数の第2のダミー磁気抵抗素子が配された基板をさらに有し、
前記複数の第1の磁気抵抗素子、前記複数の第1のダミー磁気抵抗素子、前記複数の第2の磁気抵抗素子、及び前記複数の第2のダミー磁気抵抗素子は、それぞれ、強磁性体を主成分とする材料で形成されており、
前記基板は、ガラスを主成分とする材料で形成されている
ことを特徴とする請求項1に記載の回転角検出装置。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/879,731 US9234738B2 (en) | 2010-11-18 | 2010-11-18 | Rotation-angle detection device |
CN201080070197.6A CN103221790B (zh) | 2010-11-18 | 2010-11-18 | 旋转角度检测装置 |
KR20137014168A KR101479888B1 (ko) | 2010-11-18 | 2010-11-18 | 회전각 검출 장치 |
PCT/JP2010/070585 WO2012066667A1 (ja) | 2010-11-18 | 2010-11-18 | 回転角検出装置 |
DE112010006016.9T DE112010006016B4 (de) | 2010-11-18 | 2010-11-18 | Rotationswinkel-Erfassungsvorrichtung |
JP2012544059A JP5706440B2 (ja) | 2010-11-18 | 2010-11-18 | 回転角検出装置 |
TW100116436A TWI468648B (zh) | 2010-11-18 | 2011-05-11 | 旋轉角檢測裝置 |
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JP (1) | JP5706440B2 (ja) |
KR (1) | KR101479888B1 (ja) |
CN (1) | CN103221790B (ja) |
DE (1) | DE112010006016B4 (ja) |
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Cited By (4)
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JP2015190882A (ja) * | 2014-03-28 | 2015-11-02 | Dmg森精機株式会社 | 位置検出装置 |
JP2015190881A (ja) * | 2014-03-28 | 2015-11-02 | Dmg森精機株式会社 | 位置検出装置 |
JP2016090243A (ja) * | 2014-10-30 | 2016-05-23 | 三菱電機株式会社 | 磁気式位置検出装置 |
US10024691B2 (en) | 2014-03-10 | 2018-07-17 | Dmg Mori Seiki Co., Ltd. | Position detecting device |
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EP3321638B1 (en) * | 2016-11-14 | 2019-03-06 | Melexis Technologies SA | Measuring an absolute angular position |
JP7240387B2 (ja) * | 2018-05-11 | 2023-03-15 | 株式会社三共製作所 | 角度検出器 |
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2010
- 2010-11-18 CN CN201080070197.6A patent/CN103221790B/zh active Active
- 2010-11-18 JP JP2012544059A patent/JP5706440B2/ja active Active
- 2010-11-18 KR KR20137014168A patent/KR101479888B1/ko active IP Right Grant
- 2010-11-18 US US13/879,731 patent/US9234738B2/en active Active
- 2010-11-18 WO PCT/JP2010/070585 patent/WO2012066667A1/ja active Application Filing
- 2010-11-18 DE DE112010006016.9T patent/DE112010006016B4/de active Active
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US10024691B2 (en) | 2014-03-10 | 2018-07-17 | Dmg Mori Seiki Co., Ltd. | Position detecting device |
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JP2016090243A (ja) * | 2014-10-30 | 2016-05-23 | 三菱電機株式会社 | 磁気式位置検出装置 |
Also Published As
Publication number | Publication date |
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JPWO2012066667A1 (ja) | 2014-05-12 |
DE112010006016T5 (de) | 2013-08-22 |
US20130200885A1 (en) | 2013-08-08 |
TW201221918A (en) | 2012-06-01 |
DE112010006016B4 (de) | 2014-11-06 |
KR20130093652A (ko) | 2013-08-22 |
KR101479888B1 (ko) | 2015-01-06 |
CN103221790B (zh) | 2016-02-03 |
CN103221790A (zh) | 2013-07-24 |
JP5706440B2 (ja) | 2015-04-22 |
US9234738B2 (en) | 2016-01-12 |
TWI468648B (zh) | 2015-01-11 |
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