WO2011137967A1 - Verfahren zum funkenverdampfen mit keramischen targets - Google Patents

Verfahren zum funkenverdampfen mit keramischen targets Download PDF

Info

Publication number
WO2011137967A1
WO2011137967A1 PCT/EP2011/001856 EP2011001856W WO2011137967A1 WO 2011137967 A1 WO2011137967 A1 WO 2011137967A1 EP 2011001856 W EP2011001856 W EP 2011001856W WO 2011137967 A1 WO2011137967 A1 WO 2011137967A1
Authority
WO
WIPO (PCT)
Prior art keywords
arc
target plate
target
source according
cathode spot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2011/001856
Other languages
German (de)
English (en)
French (fr)
Inventor
Markus Lechthaler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oerlikon Surface Solutions AG Pfaeffikon
Original Assignee
Oerlikon Trading AG Truebbach
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oerlikon Trading AG Truebbach filed Critical Oerlikon Trading AG Truebbach
Priority to EP11716177.8A priority Critical patent/EP2566999B1/de
Priority to CA2798210A priority patent/CA2798210C/en
Priority to JP2013508382A priority patent/JP5721813B2/ja
Priority to CN2011800222872A priority patent/CN102859027A/zh
Priority to KR1020127031710A priority patent/KR101814228B1/ko
Priority to US13/695,839 priority patent/US20130220800A1/en
Publication of WO2011137967A1 publication Critical patent/WO2011137967A1/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/32Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
    • C23C14/325Electric arc evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/32Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3426Material

Definitions

  • the present invention relates to a method for coating workpieces by means of cathodic spark evaporation and electrically conductive ceramic targets.
  • the invention relates to a source for a coating installation for carrying out the above-mentioned method.
  • the invention particularly relates to a coating system for carrying out the above-mentioned method.
  • droplet vaporizing plays a key role in the sputtering of metallic tagrgets: rapid local heating of the metallic target material causes macroscopic spatters resulting from molten target material to be thrown from the target, which then precipitates onto the surfaces to be coated as a droplet.
  • Such droplets can extremely negatively affect coating properties, such as wear resistance or surface roughness. Therefore, much effort is made to substantially avoid such droplets.
  • CONFIRMATION COPY is to filter out the droplets before they can settle on the substrate.
  • a measure is complex and usually has a negative impact on the coating rate. Since the droplet formation is greater, the slower the arc moves on the metallic target surface, there is also the possibility to reduce the droplet problem by forcing the arc on the target surface, for example by means of horizontally radially oriented magnetic field lines in a rapid movement.
  • the published patent application WO200016373 discloses a configuration of a coating source in which magnetic means are provided behind the metallic target which leads to such a desired magnetic field distribution outside the central region of the target. Since there are vertical components of the magnetic field in the central region of the target, which would virtually capture the arc, the cover prevents the arc from getting there. For example, boron nitride and / or titanium nitride are indicated as the cover. As described therein, these materials have a lower secondary electron emission rate and a lower surface energy than the metallic target material.
  • the droplet problem is essentially not given.
  • the melting of the target material by the high melting point is much more complex than in such metallic compounds. Evaporation is more likely to be a sublimation process.
  • Most of the pieces knocked out of the ceramic target surface by the arc are so large that they do not reach the workpieces to be coated due to gravity, but deposit themselves at the bottom of the coating chamber.
  • the layer formed on the workpieces still comprises measurable so-called droplets. However, these are so sparse that no further measures against them are necessary.
  • ceramic targets are essentially not used industrially in spark evaporation.
  • An exception to this is tungsten carbide, whose thermal shock resistance in comparison to other ceramic materials in particular such as titanium nitride (TiN), titanium diboride (TiB 2 ), ZrB2, NbB2 tungsten boride (WB) or tungsten nitride (W2N) is lower.
  • TiN titanium nitride
  • TiB 2 titanium diboride
  • ZrB2 ZrB2 tungsten boride
  • WB tungsten nitride
  • W2N tungsten nitride
  • the invention is therefore based on the object, even those layer materials of ceramic targets can evaporate economically by means of electric arc, for which this has not been possible in any case on an industrial scale.
  • TiN, TiB 2 , WB and / or W 2 N targets for vaporization by means of an arc, without early target breakage occurring.
  • the inventors therefore investigated how the thermal shock transmitted to the target by the are can be efficiently trapped.
  • sputtering technology which is a PVD coating method alternative to spark evaporation, to bond the sputtering target material with so-called cooling plates in order to enable efficient heat removal.
  • Such cooling plates have a high thermal conductivity and are attached to the sputtering target material as widely as possible and with good thermal bridges.
  • these cooling plates have a similar coefficient of expansion as the target material used for sputtering. Due to the high target power during sputtering, due to the comparatively high discharge voltage, a high thermal input occurs on the sputtering target, albeit distributed uniformly over the entire target.
  • thermal stresses which can occur during spark evaporation and which can lead to thermal shock are localized and characterized by high temperature gradients, which leads to a mechanical overstressing of the ceramic target.
  • thermal shock resistance due to the uniform temperature distribution m target is not relevant during sputtering.
  • the inventors have found that, surprisingly, some measures that result in a reduction of the droplet problem associated with the sputtering of metallic targets, in connection with the ceramic targets, reliably and without damaging the ceramic and cold plate target Sparking can be applied. According to the invention, therefore, the spark evaporation is carried out in such a way that is evaporated by a ceramic target, on the back of a cooling plate is bonded by arc, characterized in that the arc is forced to rapid movement on the target surface.
  • An arc source according to the invention for coating installations for arc evaporation therefore comprises at least one ceramic target, on whose rear side with good thermal contact, preferably bonded, a cooling plate is provided, characterized in that means are provided in the installation of which the cathode spot of the arc is forced to move, which reduce the local heating and thereby the formation of microcracks and prevent even in the case of the formation of small microcracks at this point increased residence probability of the cathode spot.
  • Fig. 1 shows a source according to the invention with inventive target plate in a schematic side view.
  • FIG. 2 shows an embodiment of an inventive component of the arc source.
  • FIG. 3 shows a further embodiment of an inventive component of the arc source.
  • Fig. 1 an inventive arc evaporator source is shown, as it is used in an arc evaporation chamber for coating substrates. It usually includes an ignition device 20 - as shown purely schematically - to ignite the arc. Furthermore, an electrical high-current I H , low-voltage U L DC voltage source 23 is connected between the target plate 1 and an anode 21, again shown purely schematically.
  • the arc source according to the invention comprises the electrically conductive ceramic target plate 1 with surface 2 to be vaporized.
  • a cooling plate 10 is provided with the target plate 1 in a thermally effective manner ,
  • the cooling plate 10 is made of a material having high thermal conductivity.
  • the cooling plate is able to distribute the local energy input occurring through the cathode spot onto the target surface 2 rapidly and efficiently over the entire target cross section.
  • the risk of destruction of the target plate 1 due to thermal shock is thus already somewhat mitigated by this precaution.
  • the cooling plate is additionally electrically conductive, the electrical contact can take place the target plate 1 to the voltage source 23 via the cooling plate 10 may be realized.
  • molybdenum may be considered as a cold plate material, but other materials known in sputtering technology may be used.
  • the thermal bonding is made by bonding the cooling plate to the target plate.
  • the stain therefore remains at this point, which means that the thermal shock assumes orders of magnitude which even the cooling plate can no longer absorb.
  • the arc source according to the invention therefore also comprises means which force the cathode spot or, if appropriate, the cathode spots of the arc to move over the target and optionally away from microcracks.
  • these means comprise behind the cooling plate arranged inner permanent magnet 1 1 and an outer ring magnet 13 which is oriented opposite to the inner permanent magnet 1 1 opposite pole. Due to the inner permanent magnet 11 and the outer ring magnet 13, there are magnetic field lines extending from north to south or from south to north over the surface 2 to be vaporized.
  • a cover 3 is arranged in a central region on the surface 2 of the electrically conductive ceramic target plate 1, wherein the cover 3 is such that no additional supply of electrons is ensured in this region, which could feed the arc at the cathode spot.
  • at least the surface of the cover 3 is made of non-conductive material, such as Al 2 0 3 or boron nitride. It is conceivable but also to make the cover 3 of conductive material, however, to isolate them from the voltage source 23 or bring at least in worse electrical contact with the voltage source 23. Thus, with such an arrangement of the electron supply is prevented or at least greatly inhibited.
  • the cathode spot of the arc will preferably migrate where sufficient electron replenishment is provided, thus avoiding the central region 6 in which vertical components of the magnetic field predominate.
  • FIG. 2 schematically shows a target plate 1 with a bonded cooling plate 10.
  • the target plate has a central bore and the cooling plate 10 has an internal thread, so that a shield 3 according to the invention is screwed to the combination of target plate 1 and cooling plate 10 by means of a likewise shown screw 15 can.
  • FIG. 3 shows a further embodiment according to the invention of a target plate 1 with bonded cooling plate 10 and shielding 3.
  • the shield 3 is embedded in a large-area hole of the target plate 1.
  • there is a small transition of the shield 3 over the target plate 1 so as to prevent the cathode spot from approaching an edge of the target plate 1 and being caught there.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
PCT/EP2011/001856 2010-05-04 2011-04-13 Verfahren zum funkenverdampfen mit keramischen targets Ceased WO2011137967A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
EP11716177.8A EP2566999B1 (de) 2010-05-04 2011-04-13 Verdampfungsquelle und verfahren zum funkenverdampfen mit keramischen targets
CA2798210A CA2798210C (en) 2010-05-04 2011-04-13 Method for spark deposition using ceramic targets
JP2013508382A JP5721813B2 (ja) 2010-05-04 2011-04-13 セラミックターゲットによって火花蒸着をする方法
CN2011800222872A CN102859027A (zh) 2010-05-04 2011-04-13 用于借助陶瓷靶进行电弧气相沉积的方法
KR1020127031710A KR101814228B1 (ko) 2010-05-04 2011-04-13 세라믹 타겟을 사용한 스파크 증착 방법
US13/695,839 US20130220800A1 (en) 2010-05-04 2011-04-13 Method for spark deposition using ceramic targets

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US33093510P 2010-05-04 2010-05-04
US61/330,935 2010-05-04

Publications (1)

Publication Number Publication Date
WO2011137967A1 true WO2011137967A1 (de) 2011-11-10

Family

ID=44121711

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2011/001856 Ceased WO2011137967A1 (de) 2010-05-04 2011-04-13 Verfahren zum funkenverdampfen mit keramischen targets

Country Status (7)

Country Link
US (1) US20130220800A1 (enExample)
EP (1) EP2566999B1 (enExample)
JP (1) JP5721813B2 (enExample)
KR (1) KR101814228B1 (enExample)
CN (2) CN102859027A (enExample)
CA (1) CA2798210C (enExample)
WO (1) WO2011137967A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT16480U1 (de) * 2018-04-20 2019-10-15 Plansee Composite Mat Gmbh Target und Verfahren zur Herstellung eines Targets

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111315915A (zh) * 2017-10-03 2020-06-19 欧瑞康表面处理解决方案股份公司普费菲孔 具有受限磁场的电弧源
EP3556901B1 (en) * 2018-04-20 2021-03-31 Plansee Composite Materials Gmbh Vacuum arc source

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6442575A (en) * 1987-08-10 1989-02-14 Kobe Steel Ltd Ceramic target having high melting point for vacuum deposition with arc
DE4329155A1 (de) * 1993-08-30 1995-03-02 Bloesch W Ag Magnetfeldkathode
WO2000016373A1 (de) 1998-09-14 2000-03-23 Unaxis Trading Ag Targetanordnung für eine arc-verdampfungs-kammer
EP1862565A1 (en) * 2005-03-25 2007-12-05 Ferrotec Corporation Droplet removing device and method in plasma generator
US20080110749A1 (en) * 2006-05-16 2008-05-15 Siegfried Krassnitzer Arc source and magnet configuration
WO2009038532A1 (en) * 2007-09-17 2009-03-26 Seco Tools Ab Method of producing a layer by arc-evaporation from ceramic cathodes

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3625848A (en) * 1968-12-26 1971-12-07 Alvin A Snaper Arc deposition process and apparatus
US4198283A (en) * 1978-11-06 1980-04-15 Materials Research Corporation Magnetron sputtering target and cathode assembly
US4512867A (en) * 1981-11-24 1985-04-23 Andreev Anatoly A Method and apparatus for controlling plasma generation in vapor deposition
DE4017111C2 (de) * 1990-05-28 1998-01-29 Hauzer Holding Lichtbogen-Magnetron-Vorrichtung
US5298136A (en) * 1987-08-18 1994-03-29 Regents Of The University Of Minnesota Steered arc coating with thick targets
JPH01263265A (ja) * 1988-04-13 1989-10-19 Kobe Steel Ltd 真空アーク蒸着法
JPH02213463A (ja) * 1989-02-13 1990-08-24 Nippon Sheet Glass Co Ltd 透明導電膜の製造方法
US5271817A (en) * 1992-03-19 1993-12-21 Vlsi Technology, Inc. Design for sputter targets to reduce defects in refractory metal films
DE4301516C2 (de) * 1993-01-21 2003-02-13 Applied Films Gmbh & Co Kg Targetkühlung mit Wanne
JP3315302B2 (ja) * 1995-12-18 2002-08-19 株式会社神戸製鋼所 真空アーク蒸着方法
US6103074A (en) * 1998-02-14 2000-08-15 Phygen, Inc. Cathode arc vapor deposition method and apparatus
JP3917348B2 (ja) * 1999-05-26 2007-05-23 株式会社神戸製鋼所 アーク蒸発源、真空蒸着装置及び真空蒸着方法
US6495002B1 (en) * 2000-04-07 2002-12-17 Hy-Tech Research Corporation Method and apparatus for depositing ceramic films by vacuum arc deposition
EP1346085B1 (en) * 2000-11-30 2011-10-12 North Carolina State University Method for producing group iii metal nitride based materials
US6787010B2 (en) * 2000-11-30 2004-09-07 North Carolina State University Non-thermionic sputter material transport device, methods of use, and materials produced thereby
US20020139662A1 (en) * 2001-02-21 2002-10-03 Lee Brent W. Thin-film deposition of low conductivity targets using cathodic ARC plasma process
CH696828A5 (de) * 2003-11-18 2007-12-14 Oerlikon Trading Ag Zündvorrichtung.
CN100419117C (zh) * 2004-02-02 2008-09-17 株式会社神户制钢所 硬质叠层被膜、其制造方法及成膜装置
HUE028868T2 (en) * 2007-04-17 2017-01-30 Oerlikon Surface Solutions Ag Pfäffikon Vacuum Evaporator Source with Arched Vacuum Evaporator and Arched Vacuum Evaporator Source
JP5344864B2 (ja) * 2008-07-31 2013-11-20 富士フイルム株式会社 成膜装置および成膜方法
AT12021U1 (de) * 2010-04-14 2011-09-15 Plansee Se Beschichtungsquelle und verfahren zu deren herstellung

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6442575A (en) * 1987-08-10 1989-02-14 Kobe Steel Ltd Ceramic target having high melting point for vacuum deposition with arc
DE4329155A1 (de) * 1993-08-30 1995-03-02 Bloesch W Ag Magnetfeldkathode
WO2000016373A1 (de) 1998-09-14 2000-03-23 Unaxis Trading Ag Targetanordnung für eine arc-verdampfungs-kammer
US20010035348A1 (en) * 1998-09-14 2001-11-01 Hans Braendle Target array for an arc vapor deposition chamber including arc vapor deposition source and target plates thereof
EP1862565A1 (en) * 2005-03-25 2007-12-05 Ferrotec Corporation Droplet removing device and method in plasma generator
US20080110749A1 (en) * 2006-05-16 2008-05-15 Siegfried Krassnitzer Arc source and magnet configuration
WO2009038532A1 (en) * 2007-09-17 2009-03-26 Seco Tools Ab Method of producing a layer by arc-evaporation from ceramic cathodes

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
VON O. KNOTEK, F. LÖFFLER: "Für TiB2 Targets wird dementsprechend im Artikel ceramic cathodes for arc-physical vapor deposition: development and application", SURFACE AND COATING TECHNOLOGY, vol. 49, 1991, pages 263 - 267

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT16480U1 (de) * 2018-04-20 2019-10-15 Plansee Composite Mat Gmbh Target und Verfahren zur Herstellung eines Targets

Also Published As

Publication number Publication date
EP2566999A1 (de) 2013-03-13
US20130220800A1 (en) 2013-08-29
EP2566999B1 (de) 2018-12-12
JP2013525611A (ja) 2013-06-20
CA2798210C (en) 2018-08-21
JP5721813B2 (ja) 2015-05-20
CN106435488A (zh) 2017-02-22
CN102859027A (zh) 2013-01-02
KR101814228B1 (ko) 2018-01-04
KR20130097644A (ko) 2013-09-03
CA2798210A1 (en) 2011-11-10

Similar Documents

Publication Publication Date Title
EP2566999B1 (de) Verdampfungsquelle und verfahren zum funkenverdampfen mit keramischen targets
WO2011160766A1 (de) Arc-verdampfungsquelle mit definiertem elektrischem feld
DE60224984T2 (de) Bogenbeschichtung mit Drehkathoden
WO1992003841A2 (de) Vorrichtung zur materialverdampfung mittels vakuumlichtbogenentladung und verfahren
DE3008893C2 (de) Kathodenstrahlröhre
EP0024604B1 (de) Verfahren und Vorrichtung zum Aufdampfen von elektrisch leitenden Stoffen (Metallen) im Hochvakuum
WO2006029615A2 (de) Herrichten und betreiben eines verdampferkörpers für eine pvd-metallisierungsanlage
DE102004054092B4 (de) Zündvorrichtung
DE4026185A1 (de) Verfahren zum vermindern der verunreinigung von schmelzen hoher temperatur
DE102014207454B4 (de) Vorrichtung zur Ausbildung einer Beschichtung auf einer Substratoberfläche
DE8703520U1 (de) Von einem Begrenzungsring mit elektrisch leitender Oberfläche umgebene Kathode für eine Lichtbogenentladung
EP0282540A1 (de) Verfahren und vorrichtung zum metallisieren von folienoberflächen.
WO2012139707A1 (de) Kohlenstofffunkenverdampfung
EP0389506B1 (de) Verfahren zum erzeugen dünner schichten aus hochschmelzendem oder bei hoher temperatur sublimierendem material welches aus unterschiedlichen chemischen verbindungen zusammengesetzt ist auf einem substrat
DE19600993A1 (de) Vorrichtung und Verfahren zur anodischen Verdampfung eines Materials mittels einer Vakuumlichtbogenentladung
DE3801957A1 (de) Verfahren und einrichtung zur verdampfung mittels bogenentladungsverdampfer
EP3012856A1 (de) Verfahren und vorrichtung zur erzeugung einer elektrischen entladung
DE10352516B4 (de) Verfahren und Vorrichtung zur Abscheidung dünner Schichten auf einem organischen Substrat
DE10318363A1 (de) Verfahren und Einrichtung zum plasmaaktivierten Hochrate-Bedampfen großflächiger Substrate
DE102010035315A1 (de) Verfahren zum langzeitstabilen plasmaaktivierten Vakuumbedampfen
DE102010028777B4 (de) Verfahren und Vorrichtung zur Entfernung einer Rückseitenbeschichtung auf einem Substrat
EP2559050B1 (de) Target für funkenverdampfung mit räumlicher begrenzung der ausbreitung des funkens
WO1994021099A1 (de) Verfahren zur herstellung von gehäusen mit wenigstens einer metallischen abschirmschicht
DD277472A1 (de) Verfahren zum betreiben eines vakuum-bogenentladungsverdampfers
DD234175A3 (de) Einrichtung zur plasmagestuetzten vakuumbeschichtung von schuettguetern

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201180022287.2

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11716177

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2011716177

Country of ref document: EP

ENP Entry into the national phase

Ref document number: 2013508382

Country of ref document: JP

Kind code of ref document: A

Ref document number: 2798210

Country of ref document: CA

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 10194/DELNP/2012

Country of ref document: IN

ENP Entry into the national phase

Ref document number: 20127031710

Country of ref document: KR

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 13695839

Country of ref document: US