WO2010098306A1 - 溝加工ツールおよびこれを用いた薄膜太陽電池の溝加工方法およびスクライブ装置 - Google Patents
溝加工ツールおよびこれを用いた薄膜太陽電池の溝加工方法およびスクライブ装置 Download PDFInfo
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- WO2010098306A1 WO2010098306A1 PCT/JP2010/052704 JP2010052704W WO2010098306A1 WO 2010098306 A1 WO2010098306 A1 WO 2010098306A1 JP 2010052704 W JP2010052704 W JP 2010052704W WO 2010098306 A1 WO2010098306 A1 WO 2010098306A1
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- solar cell
- cutting edge
- thin film
- grooving tool
- film solar
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- 239000010409 thin film Substances 0.000 title claims abstract description 56
- 238000000034 method Methods 0.000 title description 16
- 238000005520 cutting process Methods 0.000 claims abstract description 73
- 239000000758 substrate Substances 0.000 claims abstract description 48
- 238000012545 processing Methods 0.000 claims description 63
- 230000031700 light absorption Effects 0.000 claims description 10
- 238000003825 pressing Methods 0.000 claims description 7
- 230000000630 rising effect Effects 0.000 claims description 7
- 238000003672 processing method Methods 0.000 claims description 6
- 229910003460 diamond Inorganic materials 0.000 claims description 4
- 239000010432 diamond Substances 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 238000000059 patterning Methods 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 20
- 239000010408 film Substances 0.000 description 13
- 238000003754 machining Methods 0.000 description 9
- 238000005498 polishing Methods 0.000 description 7
- 238000000926 separation method Methods 0.000 description 7
- 229910052951 chalcopyrite Inorganic materials 0.000 description 6
- -1 chalcopyrite compound Chemical class 0.000 description 6
- 239000002346 layers by function Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000001788 irregular Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000000224 chemical solution deposition Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002243 precursor Substances 0.000 description 2
- 239000005361 soda-lime glass Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D13/00—Tools or tool holders specially designed for planing or slotting machines
- B23D13/005—Tools or tool holders adapted to operate in both the forward and return stroke
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D13/00—Tools or tool holders specially designed for planing or slotting machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D1/00—Planing or slotting machines cutting by relative movement of the tool and workpiece in a horizontal straight line only
- B23D1/02—Planing or slotting machines cutting by relative movement of the tool and workpiece in a horizontal straight line only by movement of the work-support
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
- H01L31/0463—PV modules composed of a plurality of thin film solar cells deposited on the same substrate characterised by special patterning methods to connect the PV cells in a module, e.g. laser cutting of the conductive or active layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a groove processing tool, a groove processing method, and a scribing apparatus using the groove processing tool when manufacturing an integrated thin film solar cell such as a chalcopyrite compound integrated thin film solar cell.
- the chalcopyrite compound includes CIGS (Cu (In, Ga) (Se, S) 2 ), CIS (CuInS 2 ) and the like in addition to CIGS (Cu (In, Ga) Se 2 ).
- FIG. 6 is a schematic diagram showing a manufacturing process of a CIGS thin film solar cell.
- a Mo electrode layer 2 serving as a plus-side lower electrode is formed on an insulating substrate 1 made of soda lime glass (SLG) or the like by sputtering, and then a light absorption layer is formed.
- a groove S for lower electrode separation is formed on the previous thin film solar cell substrate by scribing.
- a light absorption layer 3 made of a compound semiconductor (CIGS) thin film is formed on the Mo electrode layer 2 by vapor deposition, sputtering, or the like, and on that, for heterojunction.
- a buffer layer 4 made of a ZnS thin film is formed by a CBD method (chemical bath deposition method), and an insulating layer 5 made of a ZnO thin film is formed thereon.
- an insulating layer 5 made of a ZnO thin film is formed thereon.
- a transparent electrode layer 6 as an upper electrode made of a ZnO: Al thin film is formed on the insulating layer 5, and each functional layer necessary for power generation using photoelectric conversion is formed.
- An electrode separation groove M2 reaching the lower Mo electrode layer 2 is formed by scribing, using the solar cell substrate provided.
- a groove for electrode separation is formed by irradiating laser light emitted by exciting an Nd: YAG crystal with a continuous discharge lamp such as an arc lamp.
- a continuous discharge lamp such as an arc lamp.
- the mechanical scribing method is performed by pressing a cutting edge of a groove processing tool such as a metal needle (needle) having a tapered tip against a substrate while applying a predetermined pressure.
- a groove processing tool such as a metal needle (needle) having a tapered tip against a substrate while applying a predetermined pressure.
- This is a technique for processing a groove for electrode separation by moving the electrode.
- this mechanical scribing method is often performed.
- the shape of the cutting edge of the grooving tool is tapered, but strictly speaking, the portion to be pressed against the thin film solar cell has a contact area.
- the tip is cut substantially horizontally so that it is flat for widening. That is, as shown in FIG. 7, the tip portion has a truncated cone shape. While pressing the groove processing tool 8 ′ having such a shape against the thin film (various functional layers such as the upper and lower electrodes and the light absorption layer) on which the groove of the thin film solar cell substrate is to be formed, along the scribe planned line in the Y direction Groove processing is performed by relatively moving.
- the contact area with the thin film is increased, so that the groove processing can be performed relatively stably.
- the thin film is irregularly peeled off due to frictional resistance caused by a large contact surface, and unnecessary parts may be removed, resulting in a decrease in the characteristics and yield of solar cells. .
- the degree of peeling of the thin film In particular, in order to maintain the scribe line width constant and to achieve the quality (photoelectric conversion efficiency, etc.) planned in the product design and to improve the quality uniformity (reproducibility), the degree of peeling of the thin film must be constant. Therefore, the degree of peeling can be adjusted to some extent by adjusting the load that presses the blade according to the properties of the thin film, etc., but the pressing force against the thin film surface increases and decreases uniformly, so fine adjustment is very difficult. there were.
- the cutting edge of the above-described grooving tool has a truncated cone shape having a tapered surface. Therefore, when the cutting edge is worn or spilled, the cutting edge is polished to increase the diameter of the cutting edge, and as a result, the scribed groove width becomes wider than before polishing. For this reason, there is a problem that the same cutting edge cannot be used for a long period of time or cannot be repeatedly used after being polished, which is uneconomical.
- the present invention provides a chalcopyrite compound-based integrated thin film solar cell substrate (for example, a precursor before forming a transparent electrode) and light formed between electrode separation grooves and upper and lower electrodes in other integrated thin film solar cells.
- a chalcopyrite compound-based integrated thin film solar cell substrate for example, a precursor before forming a transparent electrode
- the grooves can be processed with good yield with a constant groove width and quality uniformity as a product such as photoelectric conversion efficiency.
- the purpose is to provide a processing tool.
- a groove processing tool for an integrated thin film solar cell which has been made to solve the above-mentioned problems, comprises a rod-shaped body and a cutting edge region formed at the tip of the body, and the cutting edge region is an elongated rectangular bottom surface. And a front surface and a rear surface rising from the short side edge of the bottom surface, and a left side and a right side surface standing at a right angle from the long side edge of the bottom surface and forming a pair of parallel surfaces. The corner formed by the one surface and the bottom surface is the cutting edge.
- the groove processing method of the integrated thin film solar cell according to the present invention made to solve the above problems, while pressing with the cutting edge of the groove processing tool along the scribe line of the integrated thin film solar cell substrate,
- the solar cell substrate and the groove processing tool are moved relative to each other on the solar cell (for example, various functional layers including at least a light absorption layer, particularly including at least a light absorption layer of a precursor before forming a transparent electrode layer).
- An integrated thin-film solar cell grooving method for forming a scribe line in each functional layer wherein the grooving tool comprises a rod-shaped body and a cutting edge region formed at the tip of the body, and the cutting edge region Is an elongated rectangular bottom surface, front and rear surfaces rising from the short side edges of the bottom surface, and a left surface that rises at right angles from the long side edges of the bottom surface and forms a pair of parallel surfaces, A corner formed by one of the front and rear surfaces and the bottom surface forms a blade edge, the long axis direction of the bottom surface forming a rectangle is arranged along the moving direction, and the front surface or the rear surface of the blade edge region is Groove machining is performed by inclining toward the advancing direction within an angle of 50 to 80 degrees, particularly 65 degrees to 75 degrees with the surface to be processed of the solar cell.
- the groove processing tool of the present invention when processing the groove for the upper and lower electrode contact in various functional layers such as the groove for electrode separation in the integrated thin film solar cell and the light absorption layer formed between the upper and lower electrodes, Processing can be performed with a constant groove width, and the yield is improved.
- the cutting edge can be repaired by polishing the bottom surface and the front and rear surfaces as necessary.
- the bottom surface is polished, since the left and right side surfaces of the blade edge portion are parallel surfaces, there is no change in the left and right width dimensions of the blade.
- the groove width to be scribed can be kept the same as that before polishing.
- two cutting edges of the grooving tool are formed at the front and rear corners, if one is worn or damaged, the other cutting edge can be used as a new one by changing the mounting direction of the tool.
- a groove processing tool having a shape in which corner portions of the bottom surface and the front surface or the rear surface are formed as blade edges is used for patterning.
- the cutting edge of the corner portion can come into contact with the substrate by line contact close to point contact, and the thin film can be smoothly peeled off.
- the angle between the front surface or rear surface of the cutting edge portion of the grooving tool and the upper surface of the substrate is 50 to 80 degrees, particularly 65 degrees to 75 degrees. Eliminates scribe line breaks due to bouncing (when the tilt angle is lower than the above set value) and irregular thin film peeling (when the tilt angle is higher than the above set value) due to high pressure load A straight and clean scribe line can be formed.
- the angle of the cutting edge formed by the bottom surface and the front and back surfaces is a right angle.
- the bottom surface and the front and rear surfaces can be set at a right angle, which facilitates the polishing operation.
- the grooving tool is preferably made of cemented carbide or diamond. As a result, the tool has a long life and little deformation, so that it can be accurately scribed over a long period of time.
- the enlarged view of the bottom face of the groove processing tool of FIG. The figure which shows the state of the blade-tip part at the time of a scribe.
- FIG. 1 is a perspective view showing an embodiment of an integrated thin film solar cell scribing apparatus SC using a groove processing tool according to the present invention.
- the scribing device SC includes a table 18 that can move in the horizontal direction (Y direction) and that can rotate 90 degrees and an angle ⁇ in a horizontal plane.
- the table 18 substantially serves as a means for holding the solar cell substrate W. Form.
- the bridge 19 composed of the support pillars 20 and 20 on both sides provided across the table 18 and the guide bar 21 extending in the X direction is provided so as to straddle the table 18.
- the holder support 23 is attached to be movable along a guide 22 formed on the guide bar 21, and moves in the X direction by the rotation of the motor 24.
- a scribe head 7 is provided on the holder support 23, and a groove processing tool 8 for scribing the thin film surface of the solar cell substrate W placed on the table 18 is held below the scribe head 7.
- a holder 9 is provided. The holder 9 can adjust the angle of attachment to the scribe head 7, and the angle between the groove processing tool 8 and the solar cell substrate W can be adjusted by adjusting the angle of attachment.
- the cameras 10 and 11 are provided on the pedestals 12 and 13 that can move in the X and Y directions, respectively.
- the pedestals 12 and 13 move along a guide 15 extending in the X direction on the support base 14.
- the cameras 10 and 11 can be moved up and down by manual operation, and the focus of imaging can be adjusted. Images taken by the cameras 10 and 11 are displayed on the monitors 16 and 17.
- An alignment mark for specifying a position is provided on the surface of the solar cell substrate W placed on the table 18, and the position of the solar cell substrate W is obtained by imaging the alignment mark with the cameras 10 and 11. Adjust. Specifically, the alignment marks on the surface of the solar cell substrate W supported by the table 18 are imaged by the cameras 10 and 11, and the position of the alignment mark is specified. Based on the position of the specified alignment mark, a deviation in direction when the surface of the solar cell substrate W is placed is detected, and the deviation is corrected by rotating the table 18 by a predetermined angle.
- the scribe head 7 is lowered to move in the X direction with the cutting edge of the groove processing tool 8 pressed against the surface of the solar cell substrate W.
- the surface of W is scribed along the X direction.
- the table 18 is rotated 90 degrees and the same operation as described above is performed.
- FIG. 2 and 3 show a grooving tool 8 used in the present invention.
- FIG. 2 is a perspective view seen from below
- FIG. 3 is an enlarged view of the bottom surface of the grooving tool 8.
- the grooving tool 8 is composed of a cylindrical body 81 that is substantially a mounting portion to the scribe head 7 and a cutting edge region 82 that is integrally formed at the front end portion by electric discharge machining or the like. Made of hard material such as diamond.
- the cutting edge region 82 includes a rectangular bottom surface 83, a front surface 84 and a rear surface 85 rising at right angles from the short side edge of the bottom surface 83, and a left surface rising at right angles from the long side edge of the bottom surface 83 and parallel to each other. , Right side surfaces 88 and 89. Corner portions formed by the bottom surface 83 and the front and back surfaces 84 and 85 are cutting edges 86 and 87, respectively.
- the left and right width L1 of the bottom surface 83 is preferably 50 to 60 ⁇ m, but can be set to 25 to 80 ⁇ m according to the required groove width of the scribe.
- the effective height of the cutting edge region 82 that is, the height L2 of the left and right side surfaces 88 and 89 and the front and rear surfaces 84 and 85 of the cutting edge region is preferably about 0.5 mm.
- the diameter of the cylindrical body 81 is preferably about 2 to 3 mm. Note that the body 81 of the grooving tool 8 is not limited to a columnar shape, but may be formed in a quadrangular cross section or a polygonal shape.
- the front surface of the cutting edge portion 82 with respect to the solar cell substrate W with the major axis direction of the bottom surface 83 of the cutting edge region 82 along the moving direction of the tool. 84 or the rear surface 85 is attached to the scribe head 7 in a state where it is inclined by a predetermined angle.
- the inclination angle is preferably in the range of 50 to 80 degrees, particularly 65 to 75 degrees.
- FIG. 4 is a schematic diagram showing results obtained by experiments on the relationship between the mounting angle of the groove processing tool 8 and the processing state of the solar cell substrate W when grooving the solar cell substrate W using the groove processing tool 8. It is.
- FIG. 4 (a) shows the result when the grooving tool 8 is attached and scribed at a preferred inclination angle of 50 to 80 degrees, particularly 65 to 75 degrees.
- the groove M formed in the solar cell substrate W could be formed neatly along the scribe line without peeling off excess portions.
- FIG. 4B shows a result when the grooving tool 8 is attached and scribed at an inclination angle of less than 50 degrees. The cutting edge of the groove processing tool 8 was observed to break in the groove M to be processed by bouncing on the removed film scrap.
- FIG.4 (c) shows the result at the time of attaching and scribing the groove processing tool 8 with the inclination angle exceeding 80 degree
- the present invention by inclining the front surface 84 or the rear surface 85 of the grooving tool 8 toward the traveling direction side with respect to the solar cell substrate W, a corner formed by the front surface or the rear surface and the bottom surface, that is, the blade edge 86. Or the blade edge
- the angle of the cutting edge region of the grooving tool 8 with respect to the front surface 84 or the rear surface 85 and the top surface of the substrate W is removed by inclining toward the traveling direction within a range of 50 to 80 degrees, particularly 65 to 75 degrees. It is possible to form a straight and clean scribe line by eliminating the breakage of the scribe line caused by bouncing on the film scrap and the occurrence of irregular thin film peeling caused by a high pressing load. .
- the cutting edges 86 and 87 of the grooving tool 8 are formed at two front and rear corners, if one of them is worn or damaged, the other cutting edge can be replaced with a new one by changing the mounting direction of the grooving tool 8. Can be used as In addition, when any of the cutting edges is worn, the cutting edge can be repaired by polishing the bottom face 83 and the front and rear faces 84 and 85 as necessary.
- FIG. 5 shows image data comparing a scribe line formed by a conventional processing tool and a scribe line formed by the groove processing tool of the present invention.
- the scribe process was performed by moving the scribe head 7 to a X direction, since it is sufficient if the scribe head 7 and the solar cell substrate W can move relatively, the solar cell substrate W is sufficient.
- the scribe head 7 may be moved in the X direction and the Y direction in a fixed state, or only the solar cell substrate W may be moved in the X direction and the Y direction without moving the scribe head 7.
- the typical Example of this invention was described, this invention is not necessarily limited only to the structure of said Example, A deformation
- the angle of the cutting edge formed by the bottom surface and the front and back surfaces is preferably a substantially right angle as described in the above embodiment, but it may be formed to be somewhat obtuse.
- Embodiment 2 Next, an embodiment in which the grooving tool of Embodiment 1 is modified will be described.
- the angle formed by the front surface 84 of the grooving tool 8 and the surface to be processed (referred to as a scribe angle) is within an appropriate angle range.
- the groove processing tool 8 when the groove processing tool 8 is new, the thin film adjacent to the groove is peeled off even if the groove is set at an appropriate scribe angle, and a portion having a wide groove is generated. There was a case. Furthermore, there was a tendency that the Mo film was relatively easily damaged. Even when it is not a new article, the same problem may occur in rare cases.
- the groove processing tool 8 can be further improved to suppress the peeling of the thin film adjacent to the groove, so that a groove having a certain width can be stably formed, and the film below the thin film to be grooved is formed. Created a groove machining tool with a structure that is not easily scratched.
- the grooving tool includes a rod-shaped body and a rectangular parallelepiped cutting edge region formed at the tip of the body, and the cutting edge region includes a pair of short sides and a pair of long sides. 5 planes consisting of a rectangular bottom surface, a front surface and a rear surface orthogonal to the bottom surface on the two short sides of the bottom surface, and a right surface and a left surface orthogonal to the bottom surface on the two long sides of the bottom surface, respectively.
- a vertical cutting edge is formed at the corner between the front surface and the right side surface, and a corner portion between the front surface and the left side surface, and a horizontal cutting edge is formed at the corner portion between the front surface and the bottom surface.
- the grooving tool of the present invention is performed by inclining the grooving tool toward the advancing direction side so that the cutting edges of the corners of the front surface and the bottom surface come into contact with the work surface and are scribed in a pressure contact state. I do.
- the corner portion between the bottom surface and the right side surface and the corner portion between the bottom surface and the left side surface are chamfered, so this portion is not sharp.
- these corner portions do not come into contact with the thin film and are peeled off, and a clean straight groove can be formed.
- the occasional peeling of the thin film see FIG. 4C can be completely suppressed.
- an inclined surface may be formed at the corner between the bottom surface and the front surface.
- the angle formed between the inclined surface and the bottom surface is in the range of 10 degrees to 40 degrees.
- the angle between the front surface and the work surface (referred to as the scribe angle) Is between 50 degrees (the angle between the inclined surface and the bottom surface is 40 degrees) to 80 degrees (the angle between the inclined surface and the bottom surface is 10 degrees), and clean scribing as described in Fig. 4 (a) Can be set to a range that can.
- vertical edges are formed at the corners of the rear surface and the right side and the corners of the rear surface and the left side, and at the corners of the rear surface and the bottom surface.
- a horizontal cutting edge may be formed.
- an inclined surface may be formed at the corner between the bottom surface and the rear surface.
- the scribing apparatus SC using the second grooving tool can use the same apparatus as the scribing apparatus described in FIG. 1 in the first embodiment, the description thereof is omitted by attaching the same reference numerals.
- FIG. 8 is a perspective view seen from below
- FIG. 9 is a perspective view with an enlarged bottom surface
- FIG. 10 is a bottom view. It is an enlarged view. Note that the same reference numerals are given to the same portions as those of the grooving tool 8 described in FIG.
- This grooving tool 8a is composed of a cylindrical body 81 serving as an attachment portion to the scribe head 7, and a rectangular parallelepiped cutting edge region 82 formed integrally at the tip thereof by electric discharge machining or the like. Or it is made of a hard material such as diamond.
- the blade edge region 82 includes an elongated rectangular bottom surface 83 surrounded by a pair of short sides and a pair of long sides, and a bottom surface on the short side of the bottom surface 83 (before the inclined surfaces 90 and 96 described later are formed).
- the front surface 84 and the rear surface 85 are formed so as to be orthogonal to each other, and the left side surface 88 and the right side surface 89 are formed so as to be orthogonal to the bottom surface side on the long side of the bottom surface 83 and are parallel to each other.
- the corners of the bottom surface 83 and the front surface 84 of the cutting edge region 82 are chamfered, and an inclined surface 90 is formed.
- the grooving tool 8a is moved in a direction parallel to the left side surface 88 and the right side surface 89 with the inclined surface 90 in contact with the surface to be processed of the solar cell substrate. Thereby, the to-be-processed surface of a solar cell substrate is scribed.
- the main reason for providing the inclined surface 90 is to enable scribing in the state of a grooving tool after it has been worn since it is new, but in addition to this, if the cutting edge is too sharp, it will be localized.
- the inclined surface 90 is schematically shown larger in the drawing, but the inclined surface 90 may be smaller than this as long as the inclined surface 90 abuts on the surface to be processed and can be scribed.
- the length (chamfering width) from the bottom surface side to the front surface side of the inclined surface 90 is set to about 3 ⁇ m to 20 ⁇ m.
- the surface to be processed of the solar cell substrate may be scribed by moving to. In that case, there is a risk of damaging the Mo film when it is used for the first time in a new state, but if the scribing is performed several times, the corners of the bottom surface 83 and the front surface 84 are worn away, and the possibility of damaging the Mo film is eliminated.
- the groove processing tool 8 a is configured to chamfer the corner portion 91 between the bottom surface 83 and the left side surface 88 and the corner portion 92 between the bottom surface 83 and the right side surface 89.
- This chamfering is preferably C-face machining, but R-face machining may also be used.
- the width of the chamfer (the length from the bottom side to the left side and from the bottom side to the right side) is about 3 ⁇ m to 8 ⁇ m.
- corner portion 93 between the front surface 84 and the left side surface 88 and the corner portion 94 between the front surface 84 and the right side surface 89 are sharply finished without chamfering so as to be a cutting edge in the vertical direction (vertical direction). is there.
- the angle between the inclined surface 90 and the bottom surface 83 is 10 degrees to 40 degrees, preferably 15 degrees to 25 degrees. That is, when the inclined surface 90 is in contact with the work surface, the scribe angle ⁇ formed by the front surface 84 and the inclined surface 90 is in the range of 50 to 80 degrees, preferably in the range of 65 to 75 degrees. It is. This scribe angle falls within a range where the appropriate scribe processing described with reference to FIG.
- FIG. 11 is a diagram showing the state of the cutting edge portion at the time of scribing, in which FIG. 11 (a) shows a state when it is new, and FIG. 11 (b) shows a state after being used for a while.
- the new inclined surface 90 is worn as the number of scribing increases, and is eventually used in the inclined surface 90a whose length increases in the front-rear direction. Even if the inclined surface 90 changes to the inclined surface 90a, Since the surface contact length is only slightly changed, the influence on the processed surface does not change greatly. Further, since the inclined surface 90a does not expand in the left and right side directions and wears in parallel with the inclined surface 90, stable scribe processing can be performed with the same line width and the same scribe angle ⁇ after the wear. .
- corner portions 93 and 94 are not chamfered and are sharp edges, and the corner portions 91 and 92 are chamfered, excellent processing quality can be obtained.
- FIG. 12 is a perspective view of a grooving tool 8b according to another embodiment
- FIG. 13 is an enlarged perspective view of the bottom surface thereof.
- the same portions as those of the groove machining tool 8a shown in FIGS. 8 to 10 are denoted by the same reference numerals, and description thereof is omitted.
- not only the front surface 84 but also the corners 97 and 98 on the rear surface 85 side are sharpened without chamfering and are used as vertical cutting edges.
- an inclined surface 96 is formed, and a corner 99 between the inclined surface 96 and the rear surface 85 is used as a horizontal cutting edge.
- the present invention can be applied, for example, to a groove processing tool used in manufacturing an integrated thin film solar cell using a chalcopyrite compound semiconductor film.
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Abstract
Description
ここでカルコパイライト化合物とは、CIGS(Cu(In,Ga)Se2)の他に、CIGSS(Cu(In,Ga)(Se,S)2)、CIS(CuInS2)等が含まれる。
先端部分が円錐台形状の溝加工ツールを用いることにより、薄膜との接触面積が大きくなるので比較的安定して溝加工を行うことができる。その一方で、大きな接触面による摩擦抵抗等によって薄膜が不規則に大きく剥がれてしまい、不必要な部分まで除去してしまうことがあり、太陽電池の特性および歩留まりが低下するといった問題点があった。
また、上記課題を解決するためになされた本発明にかかる集積型薄膜太陽電池の溝加工方法は、集積型薄膜太陽電池基板のスクライブ予定ラインに沿って、溝加工ツールの刃先で押圧しながら、前記太陽電池基板と前記溝加工ツールを相対的に移動させて前記太陽電池上(例えば、少なくとも光吸収層を含む各種の機能層、特に透明電極層形成前の前駆体の少なくとも光吸収層を含む各機能層)にスクライブラインを形成する集積型薄膜太陽電池の溝加工方法であって、前記溝加工ツールが、棒状のボディと、ボディの先端部に形成された刃先領域とからなり、刃先領域は細長く延びる長方形の底面と、底面の短手方向の端辺から立ち上がる前面並びに後面と、底面の長手方向の端辺から直角に立ち上がって互いに平行な一対の面をなす左、右側面とからなり、前後面のいずれか片面と底面とによって形成される角部が刃先をなし、長方形をなす底面の長軸方向が前記移動方向に沿って配置され、刃先領域の前面若しくは後面が太陽電池の被加工面との間になす角度が50~80度、特には65度~75度の範囲内で進行方向側に傾斜させて溝加工を行うようにしている。
さらに加えて、溝加工ツールの刃先を、前後の角部に2カ所形成した場合には、一方が摩耗または破損すればツールの取り付け方向を変えることにより他方の刃先を新品として使用できる。
これにより、ツールの寿命が長く、変形も少ないことから、長期間にわたって精度よくスクライブ加工することができる。
以下において、本発明の詳細を、その実施の形態を示す図面に基づいて詳細に説明する。
図1は本発明にかかる溝加工ツールを用いた集積型薄膜太陽電池用スクライブ装置SCの実施形態を示す斜視図である。スクライブ装置SCは、水平方向(Y方向)に移動可能で、かつ、水平面内で90度および角度θ回転可能なテーブル18を備えており、テーブル18は実質的に太陽電池基板Wの保持手段を形成する。
図4(a)は、溝加工ツール8を50~80度、特には65度~75度の好ましい傾斜角度で取り付けてスクライブさせた場合の結果を示す。太陽電池基板Wに形成される溝Mは余分な部分が剥離されることなく、スクライブラインに沿って直線状にきれいに形成することができた。
図4(b)は、溝加工ツール8を50度未満の傾斜角度で取り付けてスクライブさせた場合の結果を示す。溝加工ツール8の刃先は、除去した膜屑に乗り上げてバウンドすることにより加工される溝Mに断絶の発生が見られた。
図4(c)は、溝加工ツール8を、80度を超える傾斜角度で取り付けてスクライブさせた場合の結果を示す。溝加工ツール8の押圧荷重が高くなることによって加工された溝Mに不規則な薄膜の剥離が発生した。
次に、実施形態1の溝加工ツールを変形した実施形態について説明する。図2,図3で説明した溝加工ツール8では、図4で説明したように、溝加工ツール8の前面84と被加工面とのなす角度(スクライブ角度という)が適切な角度範囲内になるように傾斜させてスクライブすることにより、連続した一定幅の溝が形成できる。
そして本発明の溝加工ツールによれば、溝加工ツールを進行方向側に傾斜させることで前面と底面との角部の刃先を被加工面に当接し、圧接状態でスクライブするようにして溝加工を行う。
具体的には、これらの角部が薄膜に接することによって、ときたま発生する不規則な薄膜の剥離(図4(c)参照)を完全に抑えることができる。
前面と後面とを入れ替えることにより、片側面が破損し、または、十分に摩耗した場合でも他方に切り替えて使用を続けることができる。
刃先領域82は、一対の短辺と一対の長辺とで囲まれる細長い長方形の底面83と、(後述する傾斜面90,96が形成される前の状態で)底面83の短辺側で底面に対し直交するように形成される前面84、後面85と、底面83の長辺側で底面側に対し直交するように形成され、互いに平行をなす左側面88、右側面89とを有する。
本実施形態では、前面84だけでなく、後面85側の角部97,98も面取りを行わず鋭利に仕上げて縦方向の刃先としてある。さらに傾斜面96を形成して、傾斜面96と後面85との角部99を横方向の刃先としてある。
7 スクライブヘッド
8,8a,8b 溝加工ツール
81 ボディ
82 刃先領域
83 底面
84 前面
85 後面
86 刃先
87 刃先
88 左側面
89 右側面
90,96 傾斜面
91,92 角部(面取り)
93,94,95 角部(刃先)
97,98,99 角部(刃先)
Claims (12)
- 棒状のボディと、ボディの先端に形成された刃先領域とからなり、
刃先領域は細長く延びる長方形の底面と、底面の短手方向の端辺から立ち上がる前面並びに後面と、底面の長手方向の端辺から直角に立ち上がって互いに平行な一対の面をなす左、右側面とからなり、
少なくとも前後面のいずれか片面と底面とによって形成される角部が刃先となる集積型薄膜太陽電池用の溝加工ツール。 - 底面と前後面とによって形成される刃先の角度が直角である請求項1に記載の溝加工用ツール。
- 前記溝加工ツールが、超硬合金またはダイヤモンドで形成されている請求項1に記載の未溝加工ツール。
- 集積型薄膜太陽電池基板のスクライブ予定ラインに沿って、溝加工ツールの刃先で押圧しながら、前記太陽電池基板と溝加工ツールを相対的に移動させて前記太陽電池の上にスクライブラインを形成する集積型薄膜太陽電池の溝加工方法であって、
前記溝加工ツールが、棒状のボディと、ボディの先端部に形成された刃先領域とからなり、刃先領域は細長く延びる長方形の底面と、底面の短手方向の端辺から立ち上がる前面並びに後面と、底面の長手方向の端辺から直角に立ち上がって互いに平行な一対の面をなす左、右側面とからなり、前後面のいずれか片面と底面とによって形成される角部が刃先をなし、
長方形をなす底面の長軸方向が前記移動方向に沿って配置され、刃先領域の前面若しくは後面が太陽電池の被加工面との間になす角度が50度~80度の範囲内で進行方向側に傾斜させて溝加工を行うことを特徴とする集積型薄膜太陽電池の溝加工方法。 - 集積型薄膜太陽電池基板の少なくとも光吸収層を含む層に溝加工を行う請求項4記載の集積型薄膜太陽電池の溝加工方法。
- 集積型薄膜太陽電池基板が透明電極層を形成される前の集積型薄膜太陽電池基板である請求項5記載の集積型薄膜太陽電池の溝加工方法。
- 棒状のボディと、ボディの先端に形成された直方体状の刃先領域からなり、
前記刃先領域は、一対の短辺と一対の長辺とで囲まれる長方形の底面、底面の2つの短辺側でそれぞれ底面に対し直交する前面および後面、底面の2つの長辺側でそれぞれ底面に対し直交する右側面および左側面からなる5つの平面で形成され、
前面と右側面との角部、および、前面と左側面との角部に縦方向の刃先が形成され、
前面と底面との角部に横方向の刃先が形成され、
底面と右側面との角部、および、底面と左側面との角部は面取りが行われることを特徴とする溝加工ツール。 - 底面と前面との角部に傾斜面が形成される請求項7に記載の溝加工ツール。
- 傾斜面と底面とのなす角が10度~40度の範囲である請求項8に記載の溝加工ツール。
- さらに、後面と右側面との角部、および、後面と左側面との角部に縦方向の刃先が形成されるとともに、後面と底面との角部に横方向の刃先が形成される請求項7に記載の溝加工ツール。
- 底面と後面との角部に傾斜面が形成される請求項10に記載の溝加工ツール。
- 請求項7~請求項11のいずれかに記載の溝加工ツールと、太陽電池基板が載置されるテーブルと、前記溝加工ツールの底面を、前記太陽電池基板に対し傾斜させた状態でスクライブさせるスクライブヘッドとを備えたことを特徴とするスクライブ装置。
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2010
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- 2010-02-22 TW TW102138305A patent/TWI501415B/zh not_active IP Right Cessation
- 2010-02-23 KR KR1020117017097A patent/KR101311292B1/ko active IP Right Grant
- 2010-02-23 WO PCT/JP2010/052704 patent/WO2010098306A1/ja active Application Filing
- 2010-02-23 CN CN201080009004.6A patent/CN102325621B/zh active Active
- 2010-02-23 JP JP2011501594A patent/JP5269183B2/ja active Active
- 2010-02-23 EP EP10746187.3A patent/EP2402100B1/en not_active Not-in-force
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2012
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EP2343173A1 (en) * | 2010-01-08 | 2011-07-13 | Mitsuboshi Diamond Industrial Co., Ltd. | Groove machining tool for use with a thin-film solar cell |
JP2012089559A (ja) * | 2010-10-15 | 2012-05-10 | Nichia Chem Ind Ltd | 窒化物系化合物半導体素子の製造方法 |
JP2012119610A (ja) * | 2010-12-03 | 2012-06-21 | Mitsuboshi Diamond Industrial Co Ltd | 薄膜太陽電池用溝加工ツール |
EP2469587A3 (en) * | 2010-12-21 | 2017-05-03 | Mitsuboshi Diamond Industrial Co., Ltd. | Groove processing tool and groove processing device for thin-film solar cell |
CN103030265A (zh) * | 2011-10-04 | 2013-04-10 | 三星钻石工业股份有限公司 | 玻璃基板刻划方法 |
WO2013103045A1 (ja) * | 2012-01-06 | 2013-07-11 | 富士フイルム株式会社 | スクライブ方法 |
JP2013146811A (ja) * | 2012-01-18 | 2013-08-01 | Mitsuboshi Diamond Industrial Co Ltd | 溝加工ツールおよび溝加工方法 |
CN103213203A (zh) * | 2012-01-18 | 2013-07-24 | 三星钻石工业股份有限公司 | 沟槽加工工具及沟槽加工方法 |
JP2014107485A (ja) * | 2012-11-29 | 2014-06-09 | Mitsuboshi Diamond Industrial Co Ltd | パターン付き基板の分割方法 |
CN103846560A (zh) * | 2012-11-29 | 2014-06-11 | 三星钻石工业股份有限公司 | 具有图案的基板的分割方法 |
CN109940294A (zh) * | 2012-11-29 | 2019-06-28 | 三星钻石工业股份有限公司 | 具有图案的基板的分割方法 |
JP2014065291A (ja) * | 2013-03-28 | 2014-04-17 | Mitsuboshi Diamond Industrial Co Ltd | 金属膜積層セラミックス基板溝加工用ツール |
CN103706821A (zh) * | 2013-12-27 | 2014-04-09 | 无锡雨田精密工具有限公司 | 一种焊接式车用沟槽刀 |
Also Published As
Publication number | Publication date |
---|---|
EP2402100A1 (en) | 2012-01-04 |
JP5351998B2 (ja) | 2013-11-27 |
TW201104904A (en) | 2011-02-01 |
JPWO2010098306A1 (ja) | 2012-08-30 |
TW201407807A (zh) | 2014-02-16 |
CN102325621B (zh) | 2015-11-25 |
JP2013042153A (ja) | 2013-02-28 |
JP5469723B2 (ja) | 2014-04-16 |
CN102325621A (zh) | 2012-01-18 |
KR101311292B1 (ko) | 2013-09-25 |
TWI501415B (zh) | 2015-09-21 |
TWI424580B (zh) | 2014-01-21 |
JP5469722B2 (ja) | 2014-04-16 |
JP2013049131A (ja) | 2013-03-14 |
EP2402100A4 (en) | 2015-05-06 |
KR20110097984A (ko) | 2011-08-31 |
JP5269183B2 (ja) | 2013-08-21 |
JP2013056414A (ja) | 2013-03-28 |
EP2402100B1 (en) | 2017-05-31 |
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