WO2010046957A1 - 直交振幅復調器、復調方法およびそれらを利用した半導体装置および試験装置 - Google Patents
直交振幅復調器、復調方法およびそれらを利用した半導体装置および試験装置 Download PDFInfo
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- WO2010046957A1 WO2010046957A1 PCT/JP2008/003036 JP2008003036W WO2010046957A1 WO 2010046957 A1 WO2010046957 A1 WO 2010046957A1 JP 2008003036 W JP2008003036 W JP 2008003036W WO 2010046957 A1 WO2010046957 A1 WO 2010046957A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L27/00—Modulated-carrier systems
- H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
- H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
- H04L27/36—Modulator circuits; Transmitter circuits
- H04L27/362—Modulation using more than one carrier, e.g. with quadrature carriers, separately amplitude modulated
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing
- H03D7/14—Balanced arrangements
- H03D7/1425—Balanced arrangements with transistors
- H03D7/1458—Double balanced arrangements, i.e. where both input signals are differential
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing
- H03D7/14—Balanced arrangements
- H03D7/1425—Balanced arrangements with transistors
- H03D7/1466—Passive mixer arrangements
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L27/00—Modulated-carrier systems
- H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
- H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
- H04L27/38—Demodulator circuits; Receiver circuits
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D2200/00—Indexing scheme relating to details of demodulation or transference of modulation from one carrier to another covered by H03D
- H03D2200/0001—Circuit elements of demodulators
- H03D2200/0019—Gilbert multipliers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D2200/00—Indexing scheme relating to details of demodulation or transference of modulation from one carrier to another covered by H03D
- H03D2200/0041—Functional aspects of demodulators
- H03D2200/0082—Quadrature arrangements
Definitions
- the present invention relates to digital data transmission technology.
- the digital wireless communication system transmits / receives multi-bit information on a carrier signal. That is, the data rate is not directly limited to the carrier frequency.
- a QAM (Quadrature ⁇ ⁇ Amplitude Modulation) transmission method which is the most basic orthogonal modulation / demodulation method can realize four-value transmission with one channel.
- 64QAM 64-value transmission can be realized with one carrier. That is, the transfer capacity can be improved by such a multi-level modulation method without increasing the carrier frequency.
- Such a modulation / demodulation method is not limited to wireless communication but can be performed by wired communication, and has already begun to be applied as a PAM (Pulse Amplitude Modulation), QPSK (Quadrature Phase Shift Keying), or DQPSK (Differential QPSK) method.
- PAM Pulse Amplitude Modulation
- QPSK Quadrature Phase Shift Keying
- DQPSK Downifferential QPSK
- the conventional quadrature amplitude modulator / demodulator has to be configured using a high-speed device, it is not easy to design, or a high-frequency bipolar process or a Bi-CMOS process is required, which increases the manufacturing cost of the device. was there.
- the present invention has been made in view of such a situation, and one of its exemplary purposes is to provide a quadrature amplitude demodulator that can be easily implemented.
- An aspect of the present invention relates to a quadrature amplitude demodulator that demodulates a modulated signal subjected to quadrature amplitude modulation.
- the quadrature amplitude demodulator includes an oscillator that generates a rectangular wave, a trapezoidal wave, or an in-phase carrier signal having a waveform similar to these, and a quadrature carrier signal whose phase is shifted by 1 ⁇ 4 period with respect to the in-phase carrier signal, and a modulated signal.
- the first and second mixers for mixing the in-phase carrier signal and the quadrature carrier signal, respectively, and the output signals of the first and second mixers are integrated for a predetermined period according to the period of the in-phase carrier signal and the quadrature carrier signal, respectively.
- First and second integrators, and first and second A / D converters for converting the outputs of the first and second integrators into digital values, respectively.
- a rectangular wave, a trapezoidal wave, or a similar waveform is also understood as a signal having a constant value at the peak and bottom of the period.
- a rectangular wave or trapezoidal wave is used instead of a sine wave (cosine wave) as a demodulation carrier signal (also referred to as an RF signal), and a mixed (down-converted) signal is converted into a symbol period or a carrier period.
- Baseband components can be extracted.
- the quadrature amplitude demodulator further includes first and second sample and hold circuits that sample and hold the output signals of the first and second integrators at intervals between symbols that are temporally adjacent to each other. May be.
- the first and second A / D converters may convert the output signals of the first and second sample and hold circuits into digital values, respectively.
- the modulated signal, the in-phase carrier signal, and the quadrature carrier signal are each in a differential format, and the first and second mixers may each be a Gilbert cell mixer that mixes the modulated signal and the corresponding carrier signal.
- This configuration is compatible with a CMOS (Complementary Metal Metal Oxide Semiconductor) process.
- Each of the first and second integrators includes a first capacitor provided between a line through which the output signals of the first and second mixers propagate and a fixed voltage terminal, and a break between symbols that are temporally adjacent to each other.
- a first switch that initializes the charge of the first capacitor. This configuration is compatible with a CMOS (Complementary Metal Metal Oxide Semiconductor) process.
- CMOS Complementary Metal Metal Oxide Semiconductor
- the output signals of the first and second mixers may be in a differential format.
- a pair of the first integrator and the first sample and hold circuit, and a pair of the second integrator and the second sample and hold circuit, respectively, are first input terminals to which a first polarity signal of the differential output signal of the corresponding mixer is input.
- a second switch in which a first terminal is connected to the first input terminal, a predetermined fixed voltage is input to the second terminal, a third terminal is connected to one end of the second capacitor, and the first, second,
- a third switch including a third terminal, wherein the second terminal is connected to the first input terminal, a predetermined fixed voltage is input to the first terminal, and the third terminal is connected to one end of the third capacitor; , Second and third terminals, the second terminal is connected to the output terminal, and the first end Is connected to the second input terminal, the third terminal is connected to the other end of the second capacitor, the first switch, the second switch, the third terminal, the first terminal is connected to the output terminal,
- a fifth switch in which the second terminal is connected to the second input terminal, the third terminal is connected to the other end of the third capacitor, one end is connected to the output terminal, and a fixed potential is applied to the other end And a switch.
- the second to fifth switches have a first state in which the first terminal and the third terminal are in conduction and a second state in which the second terminal and the third terminal are in conduction for each break between adjacent symbols in time.
- the sixth switch may be turned on for a predetermined time prior to the symbol switching. In this case, the circuit area can be reduced.
- Each of the first and second A / D converters includes a plurality of comparators that compare the output signals of the corresponding integrators with threshold voltages set to the respective integrators, and an encoder that receives and encodes the output signals of the plurality of comparators.
- a latch circuit that latches at least one of the outputs of the plurality of comparators or the outputs of the encoder. In this case, since it is not necessary to provide a sample-and-hold circuit before the A / D converter, the circuit area can be reduced.
- Each of the first and second mixers has a first input terminal to which a first polarity signal of a differential modulated signal is input, and a second input terminal to which a second polarity signal of the modulated signal is input.
- the first and second gates provided in series between the first and second input terminals and the first and second input terminals provided in parallel with the path formed by the first and second gates in series.
- a differential amplifier that differentially amplifies the potential at the connection point of the third and fourth gates, the connection point of the first and second gates, and the potential of the connection point of the third and fourth gates. .
- the pair of first and third gates and the pair of second and fourth gates may be repeatedly turned on and off in a complementary manner. This configuration is also compatible with the CMOS process.
- the first and second integrators integrate one cycle of the carrier signal and the output signals of the first and second mixers, respectively. Also good.
- the first and second integrators respectively output n periods of the carrier signal and output signals of the first and second mixers. You may integrate.
- Another aspect of the present invention relates to a test apparatus for testing a quadrature amplitude modulated signal output from a device under test.
- This apparatus includes a quadrature amplitude modulator according to any one of the above-described modes that demodulates a signal from a device under test, and a determination unit that compares data demodulated by the quadrature amplitude modulator with an expected value.
- Still another aspect of the present invention is a semiconductor device.
- This apparatus includes the quadrature amplitude modulator according to any one of the above-described aspects.
- Yet another embodiment of the present invention relates to a demodulation method of a modulated signal subjected to quadrature amplitude modulation.
- This method includes the following processes. 1. An in-phase carrier signal having a rectangular wave, a trapezoidal wave, or a waveform similar to these, and a quadrature carrier signal having a phase shifted by 1 ⁇ 4 period with respect to the in-phase carrier signal are generated. 2. An in-phase carrier signal and a quadrature carrier signal are mixed with the modulated signal. 3. The in-phase component and the quadrature component obtained by mixing are integrated for a predetermined period according to the period of the in-phase carrier signal and the quadrature carrier signal, respectively. 4). Each of the in-phase component and the quadrature component obtained by the integration is converted into a digital value.
- a low-pass filter that is difficult to design becomes unnecessary.
- FIG. 3 is a time chart showing the operation of the quadrature amplitude demodulator of FIG. 1.
- 6 is another time chart showing the operation of the quadrature amplitude demodulator of FIG. 1.
- 6 is still another time chart showing the operation of the quadrature amplitude demodulator of FIG.
- It is a circuit diagram which shows the specific structural example of a mixer and an integrator. 6 is a time chart showing a reset signal RST and a sample hold signal S & H in FIG. 5. It is a circuit diagram which shows the specific structural example of an integrator and a sample hold circuit. It is a time chart which shows the operation
- FIG. 7 It is a circuit diagram which shows the specific structural example of an A / D converter. 10 is a time chart showing the operation of the A / D converter of FIG. 9. It is a circuit diagram which shows another structural example of a mixer. It is a block diagram which shows the structure of the test apparatus carrying the quadrature amplitude demodulator which concerns on embodiment.
- the state in which the member A is connected to the member B means that the member A and the member B are electrically connected in addition to the case where the member A and the member B are physically directly connected. The case where it is indirectly connected through another member that does not affect the state is also included.
- the state in which the member C is provided between the member A and the member B refers to the case where the member A and the member C or the member B and the member C are directly connected, as well as an electrical condition. It includes the case of being indirectly connected through another member that does not affect the connection state.
- FIG. 1 is a circuit diagram showing a configuration of a transmission system 300 using a quadrature amplitude demodulator 200 according to an embodiment.
- the transmission system 300 includes a quadrature amplitude modulator 100, a transmission channel 102, a baseband data generation unit 104, and a demodulator 200.
- the quadrature amplitude modulator 100 generates a modulated signal M subjected to multilevel quadrature amplitude modulation, such as 16QAM, 64QAM, and 256QAM, and transmits the modulated signal M to the demodulator 200 via the transmission channel 102.
- multilevel quadrature amplitude modulation such as 16QAM, 64QAM, and 256QAM
- the transmission system 300 is used for data transmission between different semiconductor devices as an example.
- the baseband data generation unit 104 and the quadrature amplitude modulator 100 are mounted on the transmission-side semiconductor device
- the demodulator 200 is mounted on the reception-side semiconductor device.
- the configuration on the quadrature amplitude modulator 100 side will be described.
- the configuration of the quadrature amplitude modulator 100 may be general.
- the baseband data generation unit 104 generates (2 m ) -value in-phase baseband data and (2 m ) -value quadrature baseband data.
- In-phase baseband data and quadrature baseband data are output as m-bit binary data (B0, B1) and (B2, B3), respectively.
- the quadrature amplitude modulator 100 receives the (2 m ) -value in-phase baseband data (B1, B0) and the (2 m ) -value quadrature baseband data (B3, B2), and receives (2 m ) binary values.
- a modulated signal M subjected to quadrature amplitude modulation is generated.
- the quadrature amplitude modulator 100 includes D / A converters 12i and 12q, low-pass filters 14i and 14q, an oscillator 10, a phase shifter 15, mixers 18i and 18q, and an adder 20.
- the oscillator 10 generates a sinusoidal in-phase carrier signal RecSin.
- the phase shifter 15 shifts the phase of the in-phase carrier signal RecSin by 90 degrees (1/4 period) to generate a quadrature carrier signal RecCos.
- D / A converters 12i and 12q perform digital / analog conversion, respectively, to convert baseband data (B1, B0) and (B3, B2) into analog baseband signals BBI and BBQ.
- the mixers 18i and 18q respectively multiply the analog baseband signals BBI and BBQ with the corresponding carrier signals RecSin and RecCos. That is, the mixer 18 amplitude-modulates the carrier signal using the baseband signal as a modulation signal.
- the modulated signals MI and MQ are output from the mixers 18i and 18q, respectively.
- the adder 20 adds the modulated signal MI on the I-phase side and the modulated signal MQ on the Q-phase side.
- the configuration of the modulator that generates the modulated signal M is not limited to that of FIG. 1, and for example, a rectangular wave, a trapezoidal wave, or a similar waveform may be used as the carrier signal.
- the demodulator 200 includes an amplifier 41, oscillators 40i and 40q, mixers 42i and 42q, integrators 44i and 44q, sample hold circuits 46i and 46q, and A / D converters 48i and 48q.
- the amplifier 41 amplifies the modulated signal RR propagated through the transmission channel 102.
- the amplifier 41 may be a simple amplifier or an equalizer that compensates for attenuation caused by the transmission channel 102. If the received modulated signal RR is attenuated or its waveform is negligible, the amplifier 41 can be omitted.
- the oscillator 40i generates an in-phase carrier signal RecSin having a rectangular wave, a trapezoidal wave, or a similar waveform.
- the oscillator 40q generates a quadrature carrier signal RecCos whose phase is shifted by 1 ⁇ 4 period with respect to the in-phase carrier signal RecSin.
- the carrier signals RecSin and RecCos generated by the oscillators 40i and 40q need to be synchronized with the carrier signal of the received modulated signal R.
- a general carrier reproduction technique may be used for synchronization of the carrier signal.
- the first mixer 42i and the second mixer 42q respectively mix the modulated signal R from the amplifier 41 with the in-phase carrier signal RecSin and the quadrature carrier signal RecCos, and down-convert them into low-frequency signals.
- the first integrator 44i and the second integrator 44q respectively output the output signals RI and RQ of the first mixer 42i and the second mixer 42q to predetermined integration periods corresponding to the periods of the in-phase carrier signal RecSin and the orthogonal carrier signal RecCos, respectively. Integrate.
- the predetermined period is set as follows. 1. When the frequencies of the carrier signals RecSin and RecCos (carrier frequency) are equal to the symbol rate of the modulated signal R, the predetermined integration period is one period of the carrier signal, in other words, a symbol period.
- the predetermined integration period is 2.1 n period of carrier signal, in other words, symbol period 2.2 It can be set to any one period of carrier signal.
- the integration period is one period of the carrier signal (2.2)
- the integration result is obtained n times during one symbol.
- the integrator 44 may output any of the n integration results, or may output data obtained by performing statistical processing such as averaging on them.
- the integrators 44i and 44q have their output values reset at the timing of the reset signal RST that is asserted every integration period.
- the first sample-and-hold circuit 46i and the second sample-and-hold circuit 46q respectively output the outputs UI and UQ of the first integrator 44i and the second integrator 44q, respectively, at each interval between symbols that are temporally adjacent, that is, symbols Sample and hold every period.
- the sample hold circuits 46i and 46q sample the input signal at the timing of the sample hold signal S & H that is asserted every symbol period.
- the first A / D converter 48i and the second A / D converter 48q respectively convert the output signals SI and SQ of the first sample hold circuit 46i and the second sample hold circuit 46q from analog to digital, and baseband signals (B1, B0). (B3, B2) is generated.
- FIG. 2 is a time chart showing the operation of the quadrature amplitude demodulator 200.
- a modulated signal R shown in FIG. 2 is a signal that is generated using a sine wave (cosine wave) carrier signal in the quadrature amplitude modulator 100 and received via a lossless transmission channel 102. Moreover, the case where a symbol rate and a carrier frequency are equal is shown.
- FIG. 3 is another time chart showing the operation of the quadrature amplitude demodulator 200.
- the modulated signal R in FIG. 3 is a signal generated by the quadrature amplitude modulator 100 using a rectangular wave carrier signal and received via the lossless transmission channel 102.
- FIG. 4 is still another time chart showing the operation of the quadrature amplitude demodulator 200.
- the modulated signal R in FIG. 4 is generated by the quadrature amplitude modulator 100 using a rectangular wave carrier signal, and is received via a 0.4 m lossy transmission channel 102 formed on a printed circuit board. Signal.
- the quadrature amplitude demodulator 200 of FIG. 1 can also restore the baseband signal for the modulated signal R of FIGS.
- the low-pass filter used in the conventional demodulator can be replaced with an integrator.
- the low-pass filter has many design items such as a cut-off frequency and a slope characteristic, and the mounting area becomes large.
- the integrator has an advantage that the design is easy and the area can be reduced.
- FIG. 5 is a circuit diagram showing a specific configuration example of the mixer 42 and the integrator 44. Since the mixers 42i and 42q have the same configuration and the integrators 44i and 44q have the same configuration, only the circuit blocks 42i and 44i that process the in-phase component will be described here.
- the modulated signal R output from the amplifier 41 has a differential format.
- the first mixer 42i is a Gilbert cell mixer that mixes the modulated signal R and the corresponding carrier signal RecSin.
- the mixer 42i includes transistors M40 to M45, current sources CS40 to CS42, and resistors R40 and R41.
- the transistors M40 to M45 may be bipolar transistors instead of MOSFETs.
- the load circuit of this Gilbert cell mixer is characterized in that it is a current source CS40, CS41.
- the mixed signal is output as a differential current signal to the integrator 44i in the subsequent stage.
- the integrator 44i includes first capacitors C41p and 41n and first switches SW41p and SW41n.
- the first capacitors C41p and C41n are respectively provided between the line through which the output signals RIp and RIn of the differential mixer 42i propagate and a fixed voltage terminal (ground terminal).
- the initialization voltage VR generated by the voltage source 45 is applied to one end of each of the first switches SW41p and SW41n.
- the first switches SW41p and SW41n are turned on at each symbol break in synchronization with the reset signal RST to initialize the charges of the first capacitors C41p and C41n.
- the initialization voltage VR may be a common voltage of the differential signals RIp and RIn.
- FIG. 6 is a time chart showing the reset signal RST and the sample hold signal S & H.
- the reset signal RST is asserted, the first switches SW41p and SW41n are turned on, and the charges of the first capacitors C41p and C41n are initialized. Thereafter, the first capacitors C41p and C41n are charged or discharged by the output current of the mixer 42i, and the output of the mixer 42i is integrated.
- the sample hold signal S & H is asserted, and the potentials UIp and UIn of the first capacitors C41p and C41n are sampled. The sampled differential potentials UIp and UIn are output as a single-ended signal SI.
- FIG. 7A and 7B are circuit diagrams showing specific configuration examples of the integrator 44 and the sample hold circuit 46.
- FIG. 7A the integrator 44 and the sample hold circuit 46 are integrally configured.
- the configuration of the mixer 42 is the same as that of FIG. 5 and outputs differential current signals RIp and RIn.
- a pair of the first integrator 44i and the first sample and hold circuit 46i, and the pair of the second integrator 44q and the second sample and hold circuit 46q are configured similarly.
- a pair of the first integrator 44i and the first sample hold circuit 46i includes a first input terminal IN1, a second input terminal IN2, an output terminal OUT, a second capacitor C42, a third capacitor C43, a second switch SW42 to a sixth switch. SW46 is included.
- the first polarity signal RIp of the differential output signal of the mixer 42i is input to the first input terminal IN1.
- the second polarity signal RIn of the differential output signal of the mixer 42i is input to the second input terminal IN2.
- the second switch SW42 to the fifth switch SW45 include first, second, and third terminals T1 to T3, respectively.
- the first terminal T1 of the second switch SW42 is connected to the first input terminal IN1.
- a predetermined reset voltage VR is input to the second terminal T2.
- the third terminal T3 is connected to one end of the second capacitor C42.
- the second terminal of the third switch SW43 is connected to the first input terminal IN1.
- the reset voltage VR is input to the first terminal, and the third terminal is connected to one end of the third capacitor C43.
- the second terminal of the fourth switch SW44 is connected to the output terminal OUT, the first terminal is connected to the second input terminal IN2, and the third terminal is connected to the other end of the second capacitor C42.
- the first terminal of the fifth switch SW45 is connected to the output terminal OUT, the second terminal is connected to the second input terminal IN2, and the third terminal is connected to the other end of the third capacitor C43.
- the sixth switch SW46 has one end connected to the output terminal OUT and the other end to which the reset voltage VR is applied.
- the first terminal T1 and the third terminal T3 are set for each segment between temporally adjacent symbols according to the capacitor selection signal CapSel generated by the capacitor control unit 49.
- the first state of conduction and the second state of conduction between the second terminal T2 and the third terminal T3 are alternately switched.
- the sixth switch SW46 is turned on prior to symbol switching during a predetermined discharge period in which the discharge control signal DisCharge generated by the discharge controller 47 is asserted.
- the sixth switch SW46 is turned on, the charge of either the second capacitor C42 or the third capacitor C43 is initialized.
- FIG. 8 is a time chart showing the operations of the integrator 44i and the sample hold circuit 46i of FIG.
- the output signal (B1, B0) of the A / D converter 48i is valid for a period indicated by “Valid” in the drawing, that is, for a period from the transition of the capacitor selection signal CapSel to the timing when the discharge control signal DisCharge is asserted. .
- FIG. 9 is a circuit diagram showing a specific configuration example of the A / D converter 48.
- the A / D converters 48i and 48q are configured similarly.
- the first A / D converter 48i includes a comparison unit 50i, a latch unit 52i, and an encoder 54i.
- the comparison unit 50i includes a plurality of comparators CMP1 to CMP3, and each of the comparators CMP1 to CMP3 compares the output signal of the integrator 44i with the threshold voltages Vth1 to Vth3 set respectively.
- the latch unit 52i is provided for each of the comparators CMP1 to CMP3, and includes latch circuits L1 to L3 that latch the outputs of the corresponding comparators. Each of the latch circuits L1 to L3 latches corresponding data at the timing of the positive edge of the latch signal Latch generated by the latch control unit 56. The latch signal Latch is asserted every time the symbols are switched.
- the encoder 54i receives the output signals of the plurality of comparators CMP1 to CMP3 latched by the latch unit 52i and encodes them into a format that is optimal for subsequent processing. Since the outputs of the comparators CMP1 to CMP3 are so-called thermometer codes, the encoder of FIG. 9 converts them into binary data. Specifically, the encoder 54 i includes an AND gate 57 and an OR gate 58.
- FIG. 10 is a time chart showing the operation of the A / D converter 48 of FIG. Since the latch signal Latch is asserted every symbol period, the finally generated binary data B1 and B0 are valid for one symbol period. That is, if the A / D converter 48 of FIG. 9 is used, the sample and hold circuit is not required in the previous stage, and the circuit area can be reduced.
- the latch unit 52i is arranged at the subsequent stage of the comparison unit 50i.
- the final generated binary data B1 and B0 may be latched by arranging the latch unit 52i at the subsequent stage of the encoder 54i. .
- FIG. 11 is a circuit diagram showing another configuration example of the mixer 42. Other configurations are the same as those in FIG.
- the differential modulated signal Rp / Rn is input to the mixer 42i.
- the first polarity signal Rp and the second polarity signal Rn of the modulated signal R are input to the first and second input terminals IN1 and IN2, respectively.
- the first gate TG1 and the second gate TG2 are provided in series between the first input terminal IN1 and the second input terminal IN2.
- the third gate TG3 and the fourth gate TG4 are provided in parallel with the path formed by the first and second gates TG1 and TG2 between the first input terminal IN1 and the second input terminal IN2.
- transfer gates and analog switches can be preferably used as the first gate TG1 to the fourth gate TG4.
- the pair of the first gate TG1 and the third gate TG3 and the pair of the second gate TG2 and the fourth gate TG4 are repeatedly turned on and off in a complementary manner according to the corresponding carrier signal RecSin.
- the differential amplifier 43 differentially amplifies the potential at the connection point between the first gate TG1 and the second gate TG2 and the potential at the connection point between the third gate TG3 and the fourth gate TG4.
- the differential amplifier 43 includes transistors M50 and M51 forming a differential input pair, current sources CS50 and CS51 provided as loads for the differential input pair, resistors R50 and R51 provided on the source side of the transistors M50 and M51, and a tail.
- a current source CS52 is included.
- the differential output of the differential amplifier 43 is output to the integrator 44i in the subsequent stage.
- the quadrature amplitude demodulator 200 can be mounted in a receiving unit of a semiconductor device, and can also be used in a test apparatus that tests a semiconductor device capable of transmitting a 16QAM signal, as will be described below.
- FIG. 12 is a block diagram showing a configuration of a test apparatus 400 equipped with the quadrature amplitude demodulator 200 according to the embodiment.
- the test apparatus 400 includes a plurality of I / O terminals 402a, 402b, 402c,... Provided for each I / O port of the DUT.
- the number of I / O ports is arbitrary, but in the case of a memory or MPU, tens to hundreds or more are provided.
- Each of the plurality of I / O terminals 402 is connected to a corresponding I / O port of the DUT 410 via a transmission line.
- the test apparatus 400 includes a plurality of data transmission / reception units 2a, 2b, 2c,... And determination units 8a, 8b, 8c,... Provided for each of the plurality of I / O terminals 402a, 402b, 402c,. Since the plurality of data transmission / reception units 2 and the determination unit 8 have the same configuration, only the configuration of the data transmission / reception unit 2a and the determination unit 8a is shown in detail.
- Each data transmitter / receiver 2 (1) Using a pattern signal (baseband data) to be supplied to the DUT 410 as a modulation signal, a square wave or trapezoid wave carrier signal (carrier wave) is subjected to multi-level QAM modulation and output to the corresponding I / O port of the DUT 410 Function and (2) a function of receiving a modulated signal output from the DUT 410 and demodulating the modulated signal; Is provided. The demodulated data is compared with the expected value, and the quality of the DUT 410 is determined.
- baseband data baseband data
- carrier wave carrier wave
- the data transmitter / receiver 2 includes a pattern generator 4, a timing generator 6, an output buffer BUF1, an input buffer BUF2, a digital modulator 100, and a digital demodulator 200.
- the pattern generator 4 generates a test pattern to be supplied to the DUT 410.
- Each data (also referred to as pattern data) of the test pattern has the number of bits corresponding to the digital modulation / demodulation format used for data transmission between the DUT 410 and the test apparatus 400. For example, in the case of 16QAM, each data is 4 bits, and in the case of 64QAM, it is 6 bits.
- the timing generator 6 generates a timing signal and outputs it to the digital modulator 100.
- the timing generator 6 can finely adjust the phase of the timing signal for each cycle of pattern data, for example, in the order of several ps to several ns.
- the timing generator 6 and the pattern generator 4 can use a known circuit used in a test apparatus used in a conventional system that performs binary transmission.
- the digital modulator 100 generates a modulated signal that has been subjected to quadrature amplitude modulation (for example, 16QAM) according to the pattern data, and outputs it as a test signal.
- the test signal is output to the DUT 410 by the output buffer BUF1.
- the input buffer BUF2 receives the signal under test output from the DUT 410 and outputs it to the digital demodulator 200.
- the digital demodulator 200 demodulates the modulated data and extracts digital data.
- the digital demodulator 200 is configured using the architecture of the quadrature amplitude demodulator 200 described above.
- the determination unit 8 a compares the data demodulated by the digital demodulator 200 with the expected value data output from the pattern generator 4.
- the output buffer BUF1 and the input buffer BUF2 may be configured as bidirectional buffers.
- the multilevel QAM signal can be demodulated on a logic circuit basis, so that the design is facilitated and the cost is reduced.
- Certain aspects of the present invention can be used in signal transmission technology.
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Abstract
Description
この場合、回路面積を小さくできる。
この場合、A/Dコンバータの前段にサンプルホールド回路を設けなくてよいため、回路面積を削減できる。
この構成も、CMOSプロセスに適合している。
1. 矩形波、台形波もしくはこれらに類する波形の同相キャリア信号と、同相キャリア信号に対して位相が1/4周期シフトした直交キャリア信号と、を生成する。
2. 被変調信号に、同相キャリア信号、直交キャリア信号をそれぞれミキシングする。
3. ミキシングにより得られた同相成分、直交成分をそれぞれ、同相キャリア信号、直交キャリア信号の周期に応じた所定期間、積分する。
4. 積分により得られた同相成分、直交成分をそれぞれ、デジタル値に変換する。
同様に、「部材Cが、部材Aと部材Bの間に設けられた状態」とは、部材Aと部材C、あるいは部材Bと部材Cが直接的に接続される場合のほか、電気的な接続状態に影響を及ぼさない他の部材を介して間接的に接続される場合も含む。
アンプ41は、伝送チャネル102を伝搬した被変調信号RRを増幅する。アンプ41は、単なる増幅器であってもよいし、伝送チャネル102による減衰を補償するイコライザであってもよい。受信した被変調信号RRの減衰や波形の劣化が無視しうる場合、アンプ41は省略することもできる。
1. キャリア信号RecSin、RecCosの周波数(キャリア周波数)が、被変調信号Rのシンボルレートと等しいとき、所定の積分期間は、キャリア信号の1周期、いいかえればシンボル周期となる。
2.1 キャリア信号のn周期、いいかえればシンボル周期
2.2 キャリア信号の1周期
のいずれかに設定できる。積分期間をキャリア信号の1周期とした場合(2.2)、1シンボルの間にn回、積分結果が得られる。積分器44は、n個の積分結果のいずれかを出力してもよいし、それらに平均化などの統計的処理を施したデータを出力してもよい。
第1ミキサ42iは、被変調信号Rと、対応するキャリア信号RecSinとをミキシングするギルバートセルミキサである。具体的には、ミキサ42iは、トランジスタM40~M45、電流源CS40~CS42、抵抗R40、R41を備える。トランジスタM40~M45は、MOSFETに変えて、バイポーラトランジスタであってもよい。このギルバートセルミキサの負荷回路は、電流源CS40、CS41である点が特徴である。ミキシングされた信号は、差動の電流信号として後段の積分器44iへと出力される。
第1キャパシタC41p、C41nはそれぞれ、差動形式のミキサ42iの出力信号RIp、RInそれぞれが伝搬するラインと固定電圧端子(接地端子)間に設けられる。第1スイッチSW41p、SW41nそれぞれの一端は、電圧源45により生成される初期化電圧VRが印加される。第1スイッチSW41p、SW41nはそれぞれ、リセット信号RSTと同期して、シンボルの区切れ目ごとにオンとなって、第1キャパシタC41p、C41nの電荷を初期化する。初期化電圧VRは、差動信号RIp、RInのコモン電圧であってもよい。
第1積分器44iと第1サンプルホールド回路46iのペアは、第1入力端子IN1、第2入力端子IN2、出力端子OUT、第2キャパシタC42、第3キャパシタC43、第2スイッチSW42~第6スイッチSW46を含む。
第1入力端子IN1には、ミキサ42iの差動出力信号の第1極性の信号RIpが入力される。第2入力端子IN2には、ミキサ42iの差動出力信号の第2極性の信号RInが入力される。
第2スイッチSW42の第1端子T1は、第1入力端子IN1と接続される。その第2端子T2には、所定のリセット電圧VRが入力される。その第3端子T3は、第2キャパシタC42の一端と接続される。
第3スイッチSW43の第2端子は、第1入力端子IN1と接続される。その第1端子にはリセット電圧VRが入力され、第3端子は第3キャパシタC43の一端に接続される。
第5スイッチSW45の第1端子は、出力端子OUTと接続され、その第2端子は第2入力端子IN2と接続され、その第3端子は第3キャパシタC43の他端と接続される。
第6スイッチSW46は、一端が出力端子OUTと接続され、他端にリセット電圧VRが印加される。
第1ゲートTG1、第2ゲートTG2は、第1入力端子IN1と第2入力端子IN2の間に直列に設けられる。第3ゲートTG3と第4ゲートTG4は、第1入力端子IN1と第2入力端子IN2の間に、第1、第2ゲートTG1、TG2が成す経路と並列に設けられる。第1ゲートTG1~第4ゲートTG4は、トランスファゲートやアナログスイッチが好適に利用できる。
(1)DUT410に供給すべきパターンデータ(ベースバンドデータ)を変調信号として、矩形波もしくは台形波のキャリア信号(搬送波)を多値QAM変調し、DUT410の対応するI/Oポートへと出力する機能と、
(2)DUT410から出力される被変調信号を受け、これを復調する機能と、
を備える。復調されたデータは、期待値と比較され、DUT410の良否が判定される。
Claims (12)
- 直交振幅変調が施された被変調信号を復調する直交振幅復調器であって、
矩形波、台形波もしくはこれらに類する波形の同相キャリア信号と、前記同相キャリア信号に対して位相が1/4周期シフトした直交キャリア信号と、を生成する発振器と、
前記被変調信号に、前記同相キャリア信号、前記直交キャリア信号をそれぞれミキシングする第1、第2ミキサと、
前記第1、第2ミキサの出力信号をそれぞれ、前記同相キャリア信号、直交キャリア信号の周期に応じた所定期間、積分する第1、第2積分器と、
前記第1、第2積分器の出力をそれぞれ、デジタル値に変換する第1、第2A/Dコンバータと、
を備えることを特徴とする直交振幅復調器。 - 前記第1、第2積分器の出力信号をそれぞれ、時間的に隣接するシンボル間の区切れ目ごとにサンプリングして保持する第1、第2サンプルホールド回路をさらに備え、
前記第1、第2A/Dコンバータはそれぞれ、前記第1、第2サンプルホールド回路の出力信号をデジタル値に変換することを特徴とする請求項1に記載の直交振幅復調器。 - 前記被変調信号、前記同相キャリア信号、前記直交キャリア信号はそれぞれ差動形式であり、
前記第1、第2ミキサはそれぞれ、前記被変調信号と、対応するキャリア信号とをミキシングするギルバートセルミキサであることを特徴とする請求項1または2に記載の直交振幅復調器。 - 前記第1、第2積分器はそれぞれ、
前記第1、第2ミキサの出力信号が伝搬するラインと固定電圧端子間に設けられた第1キャパシタと、
時間的に隣接するシンボル間の区切れ目ごとに、前記第1キャパシタの電荷を初期化する第1スイッチと、
を含むことを特徴とする請求項1または2に記載の直交振幅復調器。 - 前記第1、第2ミキサそれぞれの出力信号は差動形式であり、
前記第1積分器と前記第1サンプルホールド回路のペア、前記第2積分器と前記第2サンプルホールド回路のペアはそれぞれ、
対応するミキサの差動出力信号の第1極性の信号が入力される第1入力端子と、
前記対応するミキサの差動出力信号の第2極性の信号が入力される第2入力端子と、
出力端子と、
第2キャパシタと、
第3キャパシタと、
第1、第2、第3端子を含み、前記第1端子が前記第1入力端子と接続され、前記第2端子に所定の固定電圧が入力され、前記第3端子が前記第2キャパシタの一端と接続された第2スイッチと、
第1、第2、第3端子を含み、前記第2端子が前記第1入力端子と接続され、前記第1端子に所定の固定電圧が入力され、前記第3端子が前記第3キャパシタの一端に接続された第3スイッチと、
第1、第2、第3端子を含み、前記第2端子が前記出力端子と接続され、前記第1端子が前記第2入力端子と接続され、前記第3端子が前記第2キャパシタの他端と接続された第4スイッチと、
第1、第2、第3端子を含み、前記第1端子が前記出力端子と接続され、前記第2端子が前記第2入力端子と接続され、前記第3端子が前記第3キャパシタの他端と接続された第5スイッチと、
一端が前記出力端子と接続され、他端に固定電位が印加された第6スイッチと、
を含み、
前記第2から第5スイッチは、時間的に隣接するシンボル間の区切れ目ごとに、前記第1端子と前記第3端子が導通する第1状態と、前記第2端子と前記第3端子間が導通する第2状態とが交互に切り換えられ、
前記第6スイッチは、前記シンボルの切り換えに先立ち所定時間オンすることを特徴とする請求項2に記載の直交振幅復調器。 - 前記第1、第2A/Dコンバータはそれぞれ、
対応する前記積分器の出力信号を、それぞれに設定されたしきい値電圧と比較する複数のコンパレータと、
前記複数のコンパレータの出力信号を受け、エンコードするエンコーダと、
前記複数のコンパレータの出力または前記エンコーダの出力の少なくとも一方をラッチするラッチ回路と、
を含むことを特徴とする請求項1に記載の直交振幅復調器。 - 前記第1、第2ミキサはそれぞれ、
差動形式の前記被変調信号の第1極性の信号が入力される第1入力端子と、
前記被変調信号の第2極性の信号が入力される第2入力端子と、
前記第1、第2入力端子の間に直列に設けられた第1、第2ゲートと、
前記第1、第2入力端子の間に直列に、前記第1、第2ゲートが成す経路と並列に設けられた第3、第4ゲートと、
前記第1、第2ゲートの接続点の電位と、前記第3、第4ゲートの接続点の電位と、を差動増幅する差動増幅器と、
を含み、
対応する前記キャリア信号に応じて、前記第1、第3ゲートのペアと、前記第2、第4ゲートのペアは、相補的にオン、オフを繰り返すことを特徴とする請求項1に記載の直交振幅復調器。 - 前記同相キャリア信号、直交キャリア信号の周波数が、前記被変調信号のシンボルレートと等しいとき、前記第1、第2積分器はそれぞれ、前記キャリア信号の1周期、前記第1、第2ミキサの出力信号を積分することを特徴とする請求項1に記載の直交振幅復調器。
- 前記同相キャリア信号、直交キャリア信号の周波数が、前記被変調信号のシンボルレートのn倍であるとき、前記第1、第2積分器はそれぞれ、前記キャリア信号のn周期、前記第1、第2ミキサの出力信号を積分することを特徴とする請求項1に記載の直交振幅復調器。
- 被試験デバイスから出力される直交振幅変調された信号を試験する試験装置であって、
前記信号を復調する請求項1から9のいずれかに記載の直交振幅変調器と、
前記直交振幅変調器により復調されたデータを期待値と比較する判定部と、
を備えることを特徴とする試験装置。 - 請求項1から9のいずれかに記載の直交振幅変調器を備えることを特徴とする半導体装置。
- 直交振幅変調が施された被変調信号の復調方法であって、
矩形波、台形波もしくはこれらに類する波形の同相キャリア信号と、前記同相キャリア信号に対して位相が1/4周期シフトした直交キャリア信号と、を生成するステップと、
前記被変調信号に、前記同相キャリア信号、前記直交キャリア信号をそれぞれミキシングするステップと、
ミキシングにより得られた同相成分、直交成分をそれぞれ、前記同相キャリア信号、直交キャリア信号の周期に応じた所定期間、積分するステップと、
積分により得られた同相成分、直交成分をそれぞれ、デジタル値に変換するステップと、
を備えることを特徴とする方法。
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US20110018626A1 (en) | 2011-01-27 |
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