WO2009131363A3 - 점착 필름 및 이를 사용한 백그라인딩 방법 - Google Patents

점착 필름 및 이를 사용한 백그라인딩 방법 Download PDF

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Publication number
WO2009131363A3
WO2009131363A3 PCT/KR2009/002082 KR2009002082W WO2009131363A3 WO 2009131363 A3 WO2009131363 A3 WO 2009131363A3 KR 2009002082 W KR2009002082 W KR 2009002082W WO 2009131363 A3 WO2009131363 A3 WO 2009131363A3
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WO
WIPO (PCT)
Prior art keywords
pressure
sensitive adhesive
adhesive film
same
grinding
Prior art date
Application number
PCT/KR2009/002082
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English (en)
French (fr)
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WO2009131363A9 (ko
WO2009131363A2 (ko
Inventor
김세라
백윤정
김장순
손현희
홍종완
박현우
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(주)Lg화학
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Application filed by (주)Lg화학 filed Critical (주)Lg화학
Priority to CN200980114076.4A priority Critical patent/CN102015937B/zh
Priority to EP09735160.5A priority patent/EP2267090B8/en
Priority to US12/988,774 priority patent/US20110091676A1/en
Priority to JP2011506192A priority patent/JP6176432B2/ja
Publication of WO2009131363A2 publication Critical patent/WO2009131363A2/ko
Publication of WO2009131363A9 publication Critical patent/WO2009131363A9/ko
Publication of WO2009131363A3 publication Critical patent/WO2009131363A3/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2423/00Presence of polyolefin
    • C09J2423/006Presence of polyolefin in the substrate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2427/00Presence of halogenated polymer
    • C09J2427/006Presence of halogenated polymer in the substrate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2433/00Presence of (meth)acrylic polymer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2467/00Presence of polyester
    • C09J2467/006Presence of polyester in the substrate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2475/00Presence of polyurethane
    • C09J2475/006Presence of polyurethane in the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
    • H01L2221/68386Separation by peeling
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/14Layer or component removable to expose adhesive
    • Y10T428/1476Release layer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/26Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
    • Y10T428/263Coating layer not in excess of 5 mils thick or equivalent
    • Y10T428/264Up to 3 mils
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/26Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
    • Y10T428/266Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension of base or substrate
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • Y10T428/2852Adhesive compositions
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • Y10T428/2852Adhesive compositions
    • Y10T428/2878Adhesive compositions including addition polymer from unsaturated monomer
    • Y10T428/2887Adhesive compositions including addition polymer from unsaturated monomer including nitrogen containing polymer [e.g., polyacrylonitrile, polymethacrylonitrile, etc.]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • Y10T428/2852Adhesive compositions
    • Y10T428/2878Adhesive compositions including addition polymer from unsaturated monomer
    • Y10T428/2891Adhesive compositions including addition polymer from unsaturated monomer including addition polymer from alpha-beta unsaturated carboxylic acid [e.g., acrylic acid, methacrylic acid, etc.] Or derivative thereof

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Organic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Laminated Bodies (AREA)

Abstract

본 발명은 점착 필름 및 이를 사용한 반도체 웨이퍼의 백그라인딩 방법에 관한 것이다. 본 발명에서는, 예를 들면, 반도체 제조 공정에서 절단성 및 부착성이 탁월하고, 또한 우수한 쿠션성을 가져, 웨이퍼 백그라인딩의 반도체 제조 공정에서 생산 효율을 현저하게 향상시킬 수 있는 점착 필름이 제공된다. 또한, 본 발명에서는, 탁월한 내수성을 나타내면서도, 박리 특성, 재박리성 및 웨이퍼로의 젖음성이 우수한 점착 필름 및 이를 사용한 백그라인딩 방법을 제공할 수 있다.
PCT/KR2009/002082 2008-04-21 2009-04-21 점착 필름 및 이를 사용한 백그라인딩 방법 WO2009131363A2 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN200980114076.4A CN102015937B (zh) 2008-04-21 2009-04-21 压敏粘合剂膜和使用该压敏粘合剂膜的背磨方法
EP09735160.5A EP2267090B8 (en) 2008-04-21 2009-04-21 Pressure-sensitive adhesive film and back-grinding method using the same
US12/988,774 US20110091676A1 (en) 2008-04-21 2009-04-21 Pressure-sensitive adhesive film and back-grinding method using the same
JP2011506192A JP6176432B2 (ja) 2008-04-21 2009-04-21 粘着フィルム及びこれを使用したバックグラインディング方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0036718 2008-04-21
KR20080036718 2008-04-21

Publications (3)

Publication Number Publication Date
WO2009131363A2 WO2009131363A2 (ko) 2009-10-29
WO2009131363A9 WO2009131363A9 (ko) 2010-01-21
WO2009131363A3 true WO2009131363A3 (ko) 2010-03-11

Family

ID=41217255

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/002082 WO2009131363A2 (ko) 2008-04-21 2009-04-21 점착 필름 및 이를 사용한 백그라인딩 방법

Country Status (6)

Country Link
US (1) US20110091676A1 (ko)
EP (1) EP2267090B8 (ko)
JP (2) JP6176432B2 (ko)
CN (1) CN102015937B (ko)
TW (1) TWI553083B (ko)
WO (1) WO2009131363A2 (ko)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110091676A1 (en) * 2008-04-21 2011-04-21 Lg Chem, Ltd Pressure-sensitive adhesive film and back-grinding method using the same
TWI400311B (zh) * 2008-05-14 2013-07-01 Lg Chemical Ltd 壓敏性黏著劑組成物、壓敏性黏著板和使用彼之半導體晶圓背面研磨方法
JP5743110B2 (ja) 2009-06-15 2015-07-01 エルジー・ケム・リミテッド ウェーハ加工用シート
US8298041B2 (en) * 2010-10-08 2012-10-30 Taiwan Semiconductor Manufacturing Company, Ltd. System and method for wafer back-grinding control
JP5361092B2 (ja) * 2011-09-16 2013-12-04 リンテック株式会社 ダイシングシート用基材フィルムおよびダイシングシート
US8486214B2 (en) * 2011-09-27 2013-07-16 Source Photonics, Inc. Ramped, variable power UV adhesive cure process for improved alignment
KR101539133B1 (ko) * 2012-07-10 2015-07-23 (주)엘지하우시스 반도체 웨이퍼 표면보호 점착필름 및 그의 제조방법
KR102070091B1 (ko) 2013-02-20 2020-01-29 삼성전자주식회사 기판 연마 방법 및 이를 이용한 반도체 발광소자 제조방법
TWI558539B (zh) * 2013-06-19 2016-11-21 Lg化學股份有限公司 層壓板
JP5700466B2 (ja) * 2013-07-19 2015-04-15 日東電工株式会社 再剥離粘着剤組成物、粘着シート及びテープ
JP6404475B2 (ja) * 2015-07-03 2018-10-10 三井化学東セロ株式会社 半導体ウエハ表面保護フィルムおよび半導体装置の製造方法
JP6623098B2 (ja) * 2016-03-29 2019-12-18 リンテック株式会社 ガラスダイシング用粘着シートおよびその製造方法
JP6673734B2 (ja) * 2016-03-29 2020-03-25 リンテック株式会社 ガラスダイシング用粘着シートおよびその製造方法
JP6661438B2 (ja) * 2016-03-29 2020-03-11 リンテック株式会社 ガラスダイシング用粘着シートおよびその製造方法
DE102016205822A1 (de) * 2016-04-07 2017-10-12 Tesa Se Haftklebmasse

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004256595A (ja) * 2003-02-24 2004-09-16 Lintec Corp 粘着シートおよびその使用方法
KR20050118302A (ko) * 2003-04-08 2005-12-16 데이진 듀폰 필름 가부시키가이샤 반도체 웨이퍼 가공용 베이스 필름
JP2006013452A (ja) * 2004-05-21 2006-01-12 Nitto Denko Corp 半導体装置の製造方法、及びそれに用いる半導体基板加工用の粘着シート
JP2006335860A (ja) * 2005-06-01 2006-12-14 Lintec Corp 接着シート
JP2007045965A (ja) * 2005-08-11 2007-02-22 Nitto Denko Corp 粘着シートとその製造方法、及び、製品の加工方法
WO2007109326A2 (en) * 2006-03-21 2007-09-27 Promerus Llc Methods and materials useful for chip stacking, chip and wafer bonding

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5712641A (en) * 1980-06-27 1982-01-22 Toray Industries Laminated film
JPS58101054A (ja) * 1981-12-10 1983-06-16 東レ株式会社 ポリアミド系複合二軸配向フイルム
JP3177149B2 (ja) * 1996-03-15 2001-06-18 リンテック株式会社 粘着テープ用基材、該基材を用いた粘着テープ、および該基材の製造方法
JP3763636B2 (ja) * 1996-09-18 2006-04-05 ダイセル化学工業株式会社 架橋性ポリマー組成物およびその架橋成形体
JP2000003892A (ja) * 1998-04-13 2000-01-07 Mitsui Chemicals Inc 半導体ウエハの製造方法
US6159827A (en) * 1998-04-13 2000-12-12 Mitsui Chemicals, Inc. Preparation process of semiconductor wafer
JP3739570B2 (ja) * 1998-06-02 2006-01-25 リンテック株式会社 粘着シートおよびその利用方法
JP3383227B2 (ja) * 1998-11-06 2003-03-04 リンテック株式会社 半導体ウエハの裏面研削方法
JP2002069396A (ja) * 2000-08-29 2002-03-08 Mitsui Chemicals Inc 半導体ウエハ保護用粘着フィルム及びそれを用いる半導体ウエハの裏面加工方法
JP2002285105A (ja) * 2001-01-22 2002-10-03 Sony Chem Corp 粘着剤組成物及び粘着シート
JP2003200533A (ja) * 2001-08-09 2003-07-15 Teijin Ltd 積層体の製造方法
JP2003173993A (ja) * 2001-12-04 2003-06-20 Sekisui Chem Co Ltd バックグラインドテープ及び半導体ウエハの研磨方法
US6893718B2 (en) * 2002-05-20 2005-05-17 3M Innovative Properties Company Pressure sensitive adhesive composition, articles made therewith and method of use
KR100696287B1 (ko) * 2004-01-28 2007-03-19 미쓰이 가가쿠 가부시키가이샤 반도체 웨이퍼의 보호방법
US20050244631A1 (en) * 2004-04-28 2005-11-03 Mitsui Chemicals, Inc. Surface protecting film for semiconductor wafer and method of protecting semiconductor wafer using the same
JP4452127B2 (ja) * 2004-06-01 2010-04-21 三井化学株式会社 半導体ウェハ表面保護用粘着フィルム及び該粘着フィルムを用いる半導体ウェハ保護方法
JP2006156754A (ja) * 2004-11-30 2006-06-15 Furukawa Electric Co Ltd:The ダイシングダイボンドテープ
NL1028411C2 (nl) * 2005-02-25 2006-08-29 Nat Starch & Chemical B V Pressure sensitive kleefmiddelsamenstelling alsmede werkwijzen voor het aanbrengen en de bereiding daarvan.
JP2007100064A (ja) * 2005-09-07 2007-04-19 Furukawa Electric Co Ltd:The ダイシング用粘着テープ
JP4608422B2 (ja) * 2005-12-05 2011-01-12 共同技研化学株式会社 粘接着フィルム
JP2007238802A (ja) * 2006-03-09 2007-09-20 Sekisui Chem Co Ltd 電子部品の加工方法
JP2007262213A (ja) * 2006-03-28 2007-10-11 Nitto Denko Corp 再剥離用粘着シート
TW200800584A (en) * 2006-04-03 2008-01-01 Gunze Kk Surface protective tape used for back grinding of semiconductor wafer and base film for the surface protective tape
JP2007314636A (ja) * 2006-05-24 2007-12-06 Nitto Denko Corp 粘着シート
US20110091676A1 (en) * 2008-04-21 2011-04-21 Lg Chem, Ltd Pressure-sensitive adhesive film and back-grinding method using the same

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004256595A (ja) * 2003-02-24 2004-09-16 Lintec Corp 粘着シートおよびその使用方法
KR20050118302A (ko) * 2003-04-08 2005-12-16 데이진 듀폰 필름 가부시키가이샤 반도체 웨이퍼 가공용 베이스 필름
JP2006013452A (ja) * 2004-05-21 2006-01-12 Nitto Denko Corp 半導体装置の製造方法、及びそれに用いる半導体基板加工用の粘着シート
JP2006335860A (ja) * 2005-06-01 2006-12-14 Lintec Corp 接着シート
JP2007045965A (ja) * 2005-08-11 2007-02-22 Nitto Denko Corp 粘着シートとその製造方法、及び、製品の加工方法
WO2007109326A2 (en) * 2006-03-21 2007-09-27 Promerus Llc Methods and materials useful for chip stacking, chip and wafer bonding

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CN102015937A (zh) 2011-04-13
TW201009036A (en) 2010-03-01
WO2009131363A9 (ko) 2010-01-21
EP2267090A4 (en) 2016-05-25
US20110091676A1 (en) 2011-04-21
EP2267090B8 (en) 2018-10-17
JP2011518251A (ja) 2011-06-23
EP2267090B1 (en) 2018-09-12
TWI553083B (zh) 2016-10-11
JP6176432B2 (ja) 2017-08-09
JP2016047933A (ja) 2016-04-07
WO2009131363A2 (ko) 2009-10-29
EP2267090A2 (en) 2010-12-29

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