WO2009122605A1 - ボンディング装置及びボンディング方法 - Google Patents
ボンディング装置及びボンディング方法 Download PDFInfo
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- WO2009122605A1 WO2009122605A1 PCT/JP2008/068247 JP2008068247W WO2009122605A1 WO 2009122605 A1 WO2009122605 A1 WO 2009122605A1 JP 2008068247 W JP2008068247 W JP 2008068247W WO 2009122605 A1 WO2009122605 A1 WO 2009122605A1
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
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Definitions
- the present invention relates to the structure of a bonding apparatus and a bonding method used for the bonding apparatus.
- a wire bonding apparatus In the process of manufacturing a semiconductor device, a wire bonding apparatus is often used which connects a pad which is an electrode of a semiconductor chip and a lead which is an electrode of a lead frame with a wire which is a metal fine wire.
- the wire is inserted into the capillary, the wire extended from the tip of the capillary is formed into an initial ball by spark or the like, the capillary is lowered toward the pad, and the initial ball is crimped to the pad by the capillary tip.
- the capillary is raised as the crimped ball, the capillary is raised from the capillary tip, the capillary is looped from the crimped ball to the lead, the capillary is lowered toward the lead, the wire is crimped to the lead by the capillary tip, and then the capillary is raised. After cutting the wire, it is often moved to the position of the next pad, and the method of bonding the pad and the lead sequentially with the wire is often used.
- Alignment is performed by capturing an image of a semiconductor chip or lead frame using a camera or the like, and counting the number of pixels between the position of the pad or lead on the image and the optical axis of the camera which is the center of the field of vision. Many methods of measuring the distance and acquiring the position of the pad or lead are used.
- the distance between the optical axis of the camera and the pad or lead directly becomes the distance between the central axis of the capillary and the pad or lead. If the tip of the capillary is moved by that distance, bonding can be performed with the tip of the capillary aligned with the position of the pad or lead.
- the optical axis of the camera and the central axis of the capillary are arranged coaxially, the capillary and the bonding arm block the field of view, making it impossible to see through the pad or lead to be bonded. It is arranged offset from the central axis.
- the wire bonding device drives an X-axis motor or Y-axis motor attached to an XY table that drives a bonding head with a capillary or camera attached to the XY direction, or a bonding arm with a capillary attached to the tip in the Z direction Since a heat source such as a Z-axis motor or a heat block for heating the lead frame is provided, the temperature change of the wire bonding apparatus due to such a heat source causes the capillary central axis and the optical axis of the camera to Variations in relative position may occur. Then, an error due to this fluctuation appears as bonding position deviation or position deviation of the press-bonded ball with respect to the pad.
- the optical axis of the camera is moved to the center position of the pressure-bonded ball bonded after bonding, and the offset amount is set based on the shift amount and the offset amount at this time.
- Methods for making corrections have been proposed.
- the edge of the press-bonded ball is detected from three directions connecting points outside the press-bonded ball within the pad center taught in advance and instructing the wire bonding portion during bonding.
- a method has been proposed in which the center position of the press-bonded ball is calculated from the edges of the three press-bonded balls and the offset amount is corrected based on the amount of deviation between the center position of the pad and the center position of the press-bonded ball.
- a temporary ball center is set as a method of detecting the center coordinates of the press-bonded ball, and the main ball is inclined 45 degrees from the X direction, Y direction and X and Y directions with reference to the temporary ball center.
- the crimped ball edge is searched for a total of 8 directions on the plus side and the minus side of the tilting direction, and it is divided into four groups, and a vertical line is drawn from each center coordinate, and the center position of the crimped ball from the coordinates of the intersection point
- Other ways of acquiring have been proposed.
- Patent Document 2 proposes a method for acquiring the size of the press-bonded ball by the same method when acquiring the center position of the press-bonded ball.
- An object of the present invention is to effectively correct the offset amount even in the case of bonding to a semiconductor chip with a fine pitch in a bonding apparatus to improve bonding accuracy.
- Another object of the present invention is to confirm the size of a press-bonded ball during bonding to improve the stability of bonding quality.
- a bonding apparatus includes a bonding head moving in the XY direction by an XY table, a bonding arm attached to the bonding head, and operating a bonding tool attached to the tip in a contact / separation direction with respect to a pad of a semiconductor chip.
- the optical axis is offset by a predetermined amount in the X and Y directions with respect to the center line of the bonding tool at the time of bonding and attached to the bonding head, and the camera acquires the image of the pad and the crimped ball bonded to the pad And a control unit that controls the position of the bonding tool central axis in the X and Y directions based on the image and offset amount of the pad, and the control unit processes the image acquired by the camera to And the outline of the crimped ball Of the offset amount based on each of the clearance lengths acquired by the clearance length acquisition unit, and clearance length acquisition unit for acquiring each clearance length between each side of the pad and the contour of the press-bonded ball And offset amount correcting means for performing correction.
- the contour acquiring unit acquires each side of at least one pad and each contour of each pressure-bonded ball bonded to each pad, and the gap length acquiring unit determines the X direction of each pad.
- the distance in the Y direction between the sides extending in each direction and the contours of the respective press-bonded balls is taken as the Y-direction gap length, and the distance in the X direction between each side extending in the Y-direction of each pad and each contour of each press-bonded ball
- the offset amount correction means acquires as the direction gap length and compares whether or not each X direction gap length and each Y direction gap length are within a preset allowable range, and among the X direction gap lengths, If at least one of the above is outside the allowable range, the offset amount in the X direction is changed according to the difference between each X direction clearance length and the median value of the allowable range, and at least one of the Y direction clearance lengths is If out of tolerance range, each Y Changing the offset amount of the Y-dire
- the contour acquiring unit acquires each side of the plurality of pads having the same design gap length and each contour of the pressure-bonded balls bonded to each pad, and the offset amount correcting unit
- the offset amount in the X direction is changed according to the difference between the average value of each X direction clearance length and the median value of the tolerance range, and the difference between the average value of each Y direction clearance length and the median value of the tolerance range It is also preferable to change the offset amount in the Y direction.
- the gap length acquiring unit acquire the X direction gap length and the Y direction gap length one by one with the same pad, or the X direction gap length and
- the Y-direction gap length is also suitable as the distance between the adjacent two sides and the contour of the press-bonded ball in the Y direction and the distance in the X direction.
- the gap length obtaining unit includes each side of the plurality of pads included in the first group having the same design gap length in the X direction and each pressure-bonded ball bonded to each pad.
- Each X direction clearance length is acquired from the contour, and each contour of a plurality of pads included in the second group having the same design clearance length in the Y direction and each contour of each crimped ball bonded to each pad It is also preferable to acquire each Y direction clearance length from.
- a press-bonded ball diameter calculation means for calculating the diameter of the press-bonded ball based on each gap length obtained by the gap length obtaining means and the pad width, and a display means for displaying the calculated press-bonded ball diameter. It is also preferable to have and.
- the contour acquiring unit acquires each side of a plurality of pads having the same pad width and design gap length and each contour of each pressure-bonded ball bonded to each pad, and the gap length is obtained.
- the acquiring means sets the distance in the Y direction between each side of each pad extending in the X direction and each contour of each crimped ball as each Y direction gap length, and each side extending in the Y direction of each pad and each contour of each crimped ball.
- the distance between the X direction and the X direction is acquired as each X direction clearance length
- the compression ball diameter calculation means subtracts twice the average value of the clearance lengths in either or both directions from the pad width It is also preferable to calculate the outline, and the outline acquisition means acquires each side of a plurality of pads having the same pad width and design gap length and each outline of each crimped ball bonded to each pad.
- the gap length acquisition means The distance in the pad width direction between each side of the pad width direction plus side and extending in the direction perpendicular to the pad width direction and each contour of each crimped ball is obtained as each pad width direction plus side gap length, and each pad width direction The distance in the pad width direction between each side extending on the minus side and extending in the direction perpendicular to the pad width direction and the contour of each crimped ball is obtained as the gap width on the minus side in each pad width direction. It is also preferable to have crimped ball diameter calculation means for calculating the crimped ball diameter by subtracting the average value of the plus side clearance length and the average value of each pad width direction minus side clearance length.
- the bonding method of the present invention comprises a bonding head moving in the XY direction by an XY table, a bonding arm attached to the bonding head, and operating a bonding tool attached to the tip in a contact / separation direction with respect to a pad of a semiconductor chip. And a camera mounted on the bonding head with an optical axis offset by a predetermined amount in the X and Y directions with respect to the center line of the bonding tool at the time of bonding and acquiring an image of the pad and the crimped ball bonded to the pad.
- the contour acquiring step acquires each side of at least one pad and each contour of each pressure-bonded ball bonded to each pad
- the gap length acquiring step calculates the X direction of each pad
- the distance in the Y direction between the sides extending in each direction and the contours of the respective press-bonded balls is taken as the Y-direction gap length, and the distance in the X direction between each side extending in the Y-direction of each pad and each contour of each press-bonded ball
- the direction gap length is obtained as the direction gap length
- the offset amount correction process compares whether each X direction gap length and each Y direction gap length are within a preset allowable range, and If at least one of the above is outside the allowable range, the offset amount in the X direction is changed according to the difference between each X direction clearance length and the median value of the allowable range, and at least one of the Y direction clearance lengths is If out of tolerance range, each Y Changing the offset amount of the Y-direction according to the difference between the difference between the difference between
- the contour acquiring step acquires each side of the plurality of pads having the same design gap length and each contour of the pressure-bonded balls bonded to each pad
- the offset amount correcting step The offset amount in the X direction is changed according to the difference between the average value of each X direction clearance length and the median value of the tolerance range, and the difference between the average value of each Y direction clearance length and the median value of the tolerance range It is also preferable to change the offset amount in the Y direction, and in the gap length obtaining step, each side of the plurality of pads included in the first group having the same design gap length in the X direction, Each X direction clearance length is acquired from each contour of each crimped ball bonded to each pad, and each side of a plurality of pads included in the second group having the same design clearance length in the Y direction, and each Each crimp bolt bonded to a pad Obtaining a respective Y direction gap length from the respective contour of the Le, also suitable as.
- the present invention is effective in that, in the case of bonding to a fine pitch semiconductor chip in the bonding apparatus, the offset amount can be corrected effectively to improve the bonding accuracy. Further, the present invention has an effect that it is possible to confirm the size of the press-bonded ball during bonding and to improve the stability of bonding quality.
- FIG. 1 is a plan view showing a semiconductor device bonded by a wire bonding apparatus according to an embodiment of the present invention. It is a flowchart which shows operation
- FIG. 11 is an explanatory view showing an angle between a line segment of a pad side acquired by processing the image shown in FIG.
- the wire bonding apparatus 10 of this embodiment performs bonding to a semiconductor chip with a fine pitch, and an XY table 11 freely moved in the XY direction by an X axis motor 18 and a Y axis motor 19
- the bonding head 12 freely moved in the XY direction by the XY table 11, the bonding arm 15 having the capillary 13 as a bonding tool attached at its tip, and the bonding head 12 rotate the bonding arm 15 around the Z axis And a camera 16 attached to the bonding head 12.
- the feed direction of the lead frame 21 is the X direction
- the direction perpendicular to the X direction along the surface of the lead frame 21 is the Y direction
- the vertical direction perpendicular to the surface of the lead frame 21 is the Z direction.
- the capillary 13 attached to the tip of the bonding arm 15 has a conical shape with a tapered tip, and at the center thereof, a hole through which a wire is inserted is provided.
- the tip end of the capillary 13 operates in the contact / separation direction with respect to the lead frame 21 or the semiconductor chip 23 attached to the lead frame 21 by the Z-axis motor 20 and the bonding arm 15.
- the capillary central axis 14 is disposed such that the tip of the capillary is in vertical contact with the surface of the semiconductor chip 23 or the lead frame 21.
- the camera 16 includes an optical system constituted by a lens and an imaging surface such as a CCD for converting an image formed by the optical system into an electric signal, and a camera optical axis 17 which is a central axis of the optical system is an imaging surface Is a line passing through the center of, and passing through the center position of the acquired image.
- the camera optical axis 17 is disposed perpendicular to the surface of the semiconductor chip 23 or lead frame 21 to be imaged.
- both the capillary central axis 14 and the camera optical axis 17 are arranged to be perpendicular to the surface of the semiconductor chip 23 or the lead frame 21, the capillary central axis 14 and the camera optical axis 17 become substantially parallel. There is. Further, as shown in FIG. 1, the camera optical axis 17 is disposed away from the capillary central axis 14 by the X direction offset amount Xw and the Y direction offset amount Yw.
- the capillary 13 is attached to the bonding head 12 via the bonding arm, and the camera 16 is fixed to the bonding head 12. Therefore, the capillary central axis 14 and the camera optical axis 17 always have an X-direction offset Xw in the Y direction.
- the offset amount W including the offset amount Yw is simultaneously moved in the X and Y directions while being separated by the offset amount W.
- the X-axis motor 18 for driving the XY table 11 of the wire bonding apparatus 10, the Y-axis motor 19, the Z-axis motor 20 for driving the bonding arm 15, and the camera 16 are connected to the control unit 60 and driven by commands from the control unit 60.
- the control unit 60 has a CPU 61 for processing and calculating signals, a memory 63 for storing control data, and instructions from the CPU 61 for the camera 16, the X-axis motor 18, the Y-axis motor 19, and the Z-axis motor 20.
- the X-axis motor interface 65, the Y-axis motor interface 66, and the Z-axis motor interface 67 are included.
- the respective interfaces 64, 65, 66, 67, the memory 63 and the CPU 61 are connected by a data bus 62, and are configured to be able to exchange signals with each other.
- the control unit 60 constitutes one computer.
- the wire bonding apparatus 10 processes the image acquired from the camera 16 to calculate the diameter of the crimped ball formed on the semiconductor chip, and displays the diameter of the crimped ball on the display unit 25 through the display unit interface 68. Is configured.
- the pads 30, 130, 130a, 230, 230a, 330, 330a, 430a and the lead frame 21 on the fine pitch semiconductor chip 23 are formed by the wire bonding apparatus 10 configured as described above.
- the respective wires 24, 124, 124 a, 224 a, 224 a, 224 a, 224 a, 324 a, 324 a, 324 a, 324 a, 324 a, 324 a, 324 a, and the semiconductor chip 23 are connected to the respective leads 22 of the It is arranged to be directed to each lead 22 substantially radially from the center of the.
- press-bonded balls 50, 150, 150a, 250, 250a, 350, 350a, 450a are formed on the upper surfaces of the pads 30, 130, 130a, 230, 230a, 330, 330a, 430a, respectively.
- the ultrasonic vibration at the time of bonding the initial ball to the pad is small, so the output is small, so on each pad 30, 130, 130a, 230, 230a, 330, 330a, 430a.
- the respective press-bonded balls 50, 150, 150a, 250, 250a, 350, 350a, 450a thus formed are hard to be influenced by the vibration direction of the ultrasonic wave output, so that they are hardly elliptical and substantially round.
- FIG. 3 is a flowchart showing each step of correcting the offset amount W.
- the CPU 61 of the control unit 60 shown in FIG. 1 outputs a command to move the camera optical axis 17 shown in FIG. 1 to the position of the offset amount W correction pad 30 shown in FIG. Do.
- the pad 30 for correcting the offset amount W is a substantially square, and each side thereof is a pad in the X direction and the Y direction, respectively.
- the command from the CPU is converted into control signals for the X-axis and Y-axis motors 18 and 19 by the X-axis motor interface 65 and the Y-axis motor interface 66 shown in FIG. 1, respectively, and the bonding head 12 is moved in the XY direction. .
- This moves the camera optical axis 17 to the position of the pad 30. This movement may be at a position where the field of view of the camera 16 includes the pad 30 and the crimped ball 50 bonded onto the pad 30.
- step S102 of FIG. 3 when the movement of the camera 16 is completed, the CPU 61 of the control unit 60 outputs a command to acquire an image of the pad 30 and the pressure-bonded ball 50 contained in the field of view of the camera 16. Do.
- This command is converted by the camera interface 64 shown in FIG. 1 into a control signal that acquires an image within the field of view of the camera 16 as an electrical signal, acquires an image from the camera 16, and stores it in the memory 63.
- the image acquired as shown in FIG. 4 includes the pad 30, the press-bonded ball 50 crimped to the pad 30, and the wire 24 extending obliquely from the press-bonded ball 50. Since the pads 30 are arranged at a fine pitch, their size is small, and the crimped ball 50 has a small diameter that can fit into the small pads 30. Therefore, the diameter of the press-bonded ball 50 is slightly larger than the diameter of the wire 24. As shown in FIG. 4, in the acquired image, the upper right of the pad 30 is mostly hidden below the wire 24. It is in the state.
- the CPU 61 of the control unit 60 shown in FIG. 1 processes the image stored in the memory 63 and outputs a command for acquiring the sides of the pad 30 and the outline of the press-bonded ball 50. .
- the CPU 61 reads out the image data stored in the memory 63, and recognizes and acquires each side of the pad 30 as a line from a planar image by, for example, binarization processing, and acquires the contour of the pressure-bonded ball 50 as a curve. Do.
- the four sides constituting the pad 30 are a line segment 32 between the points 31 and 33, a line segment 34 between the points 33 and 35, and the points It is acquired as four line segments of line segment 36 between 35 and point 37 and line segment 38 between point 37 and point 39.
- the portion between the point 31 and the point 39 is a portion hidden by the wire 24 extending from the press-bonded ball 50, and the surface of the pad 30 and the height position thereof are different.
- the contrast of the portion of the wire 24 is lowered due to the focus shift, and the contour can not be acquired. Therefore, the outline of the side can not be recognized even by the binarization process or the like, and the line segment is not acquired.
- the outline of the pressure-bonded ball 50 can be acquired, for example, by binarizing the high contrast portion of the image in which the surface of the pad 30 is in focus.
- the portion of the wire 24 extending from the press-bonded ball 50 is different from the surface of the pad 30 and the height position thereof, in the image focused on the surface of the pad 30, the portion applied to the wire 24 is out of focus Falls and the contour can not be acquired.
- the outline of the press-bonded ball 50 is obtained as a curve 53 between the point 51 and the point 52 excluding the rising portion to the wire 24.
- the CPU 61 of the control unit 60 shown in FIG. 1 is a line representing a side extending in the X direction in the line segments 32, 34, 36, 38 indicating the obtained sides of the pad 30. Determine if you can recognize the minutes. If a line segment representing a side extending in the X direction can not be recognized in the acquired line segment, it is determined that the X direction offset amount Xw can not be corrected using the acquired line segment, and the step of FIG. As shown in S105, the camera optical axis 17 is moved to the next pad, and steps S102 to S104 in FIG. 3 are executed until a line segment representing the side extending in the X direction of the pad 30 is obtained.
- the line segments 32 and 36 are line segments representing sides extending in the X direction
- the CPU 61 of the control unit 60 recognizes that the line segments representing two sides extending in the X direction can be acquired.
- step S106 of FIG. 3 when it is recognized that the line segments 32 and 36 are line segments respectively representing sides extending in the X direction, the CPU 61 of the control unit 60 shown in FIG. Thus, a tangent 41 is set which is in contact with a curve 53 extending in the X direction and indicating the contour of the press-bonded ball 50.
- a line extending in the X direction is moved in the Y direction, and acquired as a tangent 41 passing through a point 55 where the intersection point of the line segment and the curve 53 becomes one from two.
- the press-bonded ball formed on the pad of the semiconductor chip with fine pitch has a substantially circular shape, so that the contour can be approximated with high accuracy even if the contour is approximated as a circular arc.
- step S107 of FIG. 3 when the tangent 41 can be set, as shown in step S108 of FIG. It is acquired as a Y-direction gap length Gy between sides and stored in the memory 63.
- the curve 53 indicating the outline of the press-bonded ball 50 extends only to the point 51, the tangent of the outline extending in the X direction can not be set on the line segment 32 side.
- the tangent line 41 can not be set to. For this reason, one Y-direction gap length Gy can be acquired from the image of one pad 30.
- step S107 of FIG. 3 setting of the tangent line 41 on either side of the line segments 32 and 36 representing the side of the pad 30 If it can not be performed, the CPU 61 of the control unit 60 executes step S109 of FIG. 3 without acquiring the Y-direction gap length Gy.
- the CPU 61 of the control unit 60 can recognize a line segment representing a side extending in the Y direction among the line segments 32, 34, 36, and 38 indicating each side of the acquired pad 30, as shown in step S109 of FIG. To judge. If a line segment representing a side extending in the Y direction can not be recognized in the acquired line segment, it is determined that the Y direction offset amount Yw can not be corrected using the acquired line segment, and the step of FIG. As shown in S105, the camera optical axis 17 is moved to the next pad, and steps S102 to S109 in FIG. 3 are executed until a line segment representing the side of the pad 30 extending in the Y direction is obtained.
- the line segments 34 and 38 are line segments representing sides extending in the Y direction, and the CPU 61 of the control unit 60 recognizes that the line segments representing two sides extending in the Y direction can be acquired.
- the tangent line 42 extending in the Y direction of the curve 53 is set in the same manner as described above, and the distance between the tangent line 42 and the line segment 34 is set.
- the X-direction gap length Gx between the outline of the pressure-bonded ball 50 and the side of the pad 30 is acquired and stored in the memory 63.
- step S113 of FIG. 3 when the CPU 61 of the control unit 60 shown in FIG. 1 can not acquire either the X-direction gap length Gx or the Y-direction gap length Gy, the step of FIG. As shown in S105, the camera optical axis 17 is moved onto the next pad, and the operations from step S102 to step S112 are repeated until the X-direction gap length Gx and the Y-direction gap length Gy are obtained. As shown in FIG. 6, an X-direction gap length Gx and a Y-direction gap length Gy between two line segments 34 and 36 on adjacent sides of the same pad 30 and a curve 53 indicating the outline of the press-bonded ball 50. Is acquired, the CPU 61 of the control unit 60 proceeds to step S114 in FIG. 3 without repeating the operations from step S102 to step S112.
- both the X-direction gap length Gx and the Y-direction gap length Gy can be obtained as shown in step S114 of FIG. 3, the CPU 61 of the control unit 60 shown in FIG.
- the direction gap length Gx and the Y direction gap length Gy are compared with the allowable range of each gap length stored in the memory 63. Then, as shown in step S115 of FIG. 3, when the X-direction gap length Gx or the Y-direction gap length Gy is out of the allowable range, as shown in step S116 of FIG.
- the offset amount W is corrected by changing the amount Xw and the Y direction offset amount Yw.
- the allowable range is a value obtained by adding the resolution length of the camera 16 to each gap length on design as the upper limit, and a value obtained by subtracting the resolution length of the camera 16 from each gap length on the design as the lower limit
- the upper limit is the value obtained by adding the tolerance for bonding to each gap length on the design
- the lower limit is the value obtained by subtracting the tolerance for bonding from the design gap length. It is good.
- the median value of the allowable range is the designed gap length.
- the allowable range may be fixed or may be changed according to the semiconductor chip 23.
- Changes in the X direction and Y direction offset amounts Xw and Yw change the X direction offset amount Xw by the difference between the X direction gap length Gx and the median value of the tolerance range, and the Y direction gap length Gy and tolerance range By changing the Y-direction offset amount Yw by the difference from the median value of.
- changes in the X direction and Y direction offset amounts Xw and Yw are the X direction offset amount Xw by an amount obtained by multiplying the difference between the X direction gap length Gx and the central value of the allowable range by a predetermined coefficient smaller than 1.
- the offset amount W is corrected by changing the Y-direction offset amount Yw by an amount obtained by multiplying the difference between the Y-direction gap length Gy and the central value of the allowable range by a predetermined coefficient smaller than 1. Good. In this case, for example, a predetermined coefficient is halved, the offset amounts Xw and Yw are changed several times, and the offset amount W is corrected by sequentially approaching the median value of the allowable range. It is also good.
- the offset amount W can be corrected only by the gap length in each direction between each side of the pad 30 and the contour of the press-bonded ball 50 without obtaining the center position of the press-bonded ball 50. Also in the case of bonding to a fine pitch semiconductor in which the diameter of the press-bonded ball 50 and the diameter of the wire 24 become the same size, the offset amount can be corrected effectively to improve the bonding accuracy. Play an effect.
- the pad 30 is a square in which both the pad widths in the X and Y directions are the pad width Pw, and the pad width Pw is stored in the memory 63 of the control unit 60.
- the CPU 61 of the control unit 60 reads the pad width Pw from the memory 63, and doubles the X-direction gap length Gx from Pw or twice the Y-direction gap length Gy, or the X-direction gap length Gx and the Y-direction gap
- the diameter of the press-bonded ball 50 is calculated by subtracting twice the average value of the length Gy.
- the CPU 61 of the control unit 60 When the calculation of the diameter of the press-bonded ball 50 is completed, the CPU 61 of the control unit 60 outputs the diameter of the press-bonded ball 50 to the display unit interface 68 shown in FIG. 1 and drives the display unit 25 by the output of the display unit interface 68 The CPU 61 of the unit 60 displays the diameter of the press-bonded ball 50 on the display unit 25. When the difference between the calculated diameter of the pressure-bonded ball 50 and the design value is large, the display of the display unit 25 may be displayed in red, for example, to warn the operator.
- the diameter of the crimped ball can be calculated only by the gap length in each direction between the width of the pad 30, the contour of the crimped ball 50, the side of the pad 30, and the contour of the crimped ball 50.
- the diameter of the press-bonded ball 50 can be calculated effectively.
- the wire bonding apparatus 10 of the present embodiment has an effect of being able to improve the stability of the bonding quality.
- FIG. 7 shows an image acquired by the camera 16 in a state in which the press-bonded ball 50 is bonded so as to protrude from the pad 30.
- each side of the pad 30 can be acquired as each line segment 32, 34 a, 34 b, 36 a, 36 b, 38 from the image in a state where the pressure-bonded ball 50 protrudes from the side of the pad 30 and is bonded.
- the curve 53 of the contour of the press-bonded ball 50 can also be obtained in the same manner as the embodiment described above, and if the tangent lines 41 and 42 in contact with this can be set similarly, the tangent line 41 and the line segment
- the distance between the line 36a and the line segment 36b can be acquired as the Y-direction gap length Gy, and the distance between the tangent 42 and the line segment 34a or the line segment 34b can be acquired as the X-direction gap length Gx.
- both the X-direction gap length Gx and the Y-direction gap length Gy are negative.
- the offset amount W can be corrected based on the X-direction gap length Gx and the Y-direction gap length Gy in the same manner as in the embodiment described above.
- the present embodiment exhibits the same effect as that of the embodiment described above, and also exhibits the effect of being able to effectively correct the offset amount W even when the press-bonded ball 50 protrudes from the pad 30. .
- FIGS. 9 to 12 Another embodiment of the present invention will be described with reference to FIGS. 9 to 12.
- the same parts as those of the embodiment described above with reference to FIGS. 1 to 6 are denoted by the same reference numerals, and the description thereof will be omitted.
- the offset amount W is corrected based on the acquired X-direction gap length Gx and the Y-direction gap length Gy obtained one by one, but in the present embodiment, the X-direction width of each pad Px, Y-direction width Py is the same, and the gap length in each direction in the design is in the same group, each side of the plurality of pads and each contour of the pressure-bonded ball bonded to each pad.
- the gap length Gx and the Y direction gap length Gy are acquired, and the offset amount W is corrected based on the respective average values of the acquired X direction gap length Gx and Y direction gap length Gy and the center of the allowable range of the gap length. To do.
- the CPU 61 of the control unit 60 shown in FIG. 1 obtains an image of the offset amount W correction pad group 70 including a plurality of pads in the same pad size group shown in FIG. A command to move the camera optical axis 17 shown in FIG. 1 to a position where it can be output is output.
- the pad group 70 for offset amount W correction includes three pads 130, 230, and 330. Each pad 130, 230, 330 is substantially square and the pad width Px in the X direction is the same, and the pad width Py in the Y direction is also the same. The sides of the pads 150, 250, and 350 are in the X direction and the Y direction, respectively.
- This movement includes the three pads 130, 230, 330 contained in the pad group 70 and the respective crimped balls 150, 250, 350 bonded to the respective pads 130, 230, 330 in the field of view of the camera 16. It is sufficient if the camera optical axis 17 can be moved to the position.
- step S202 of FIG. 9 when the movement of the camera 16 is completed, the CPU 61 of the control unit 60 sets the three pads 130 of the pad group 70 for correcting the offset amount W contained in the field of view of the camera 16
- a command for acquiring an image of the pressure-bonded balls 150, 250, 350 bonded to the pads 230, 330 and each pad is output, and the image is acquired from the camera 16 according to this command and stored in the memory 63.
- the acquired image is, as shown in FIG. 10, three pads 130, 230, and 330 each having a pad width Px in the X direction and a pad width Py in the Y direction, and respective compression balls 150 and 250 bonded to the respective pads. , 350 and respective wires 124, 224, 324 extending from respective crimped balls 150, 250, 350.
- the CPU 61 of the control unit 60 shown in FIG. 1 reads out the image data stored in the memory 63, and pads 130, 230, 330 from planar images by binarization processing, for example.
- the sides of each are recognized as lines and acquired, and the contours of the pressure-bonded balls 150, 250, 350 are acquired as curves.
- the four sides constituting the pad 130 are a line segment 132 between the point 131 and the point 133, and a line between the point 133 and the point 135. It is acquired as four line segments of the minute 134, the line segment 136 between the point 135 and the point 137, and the line segment 138 between the point 137 and the point 139. Since the portion between the point 131 and the point 139 is a portion hidden by the wire 124, the outline of the side can not be recognized even by binarization processing or the like, and a line segment is not acquired.
- the CPU 61 of the control unit 60 similarly performs image processing on the other two pads 230 and 330, and four line segments 232, 234, 236 and 238 and line segments 332, 334, 336 and 338 as sides of each pad, respectively. To get In addition, line segments are not acquired because portions between the point 231 and the point 239 and between the point 331 and the point 339 are portions hidden by the wires 224 and 324.
- the CPU 61 of the control unit 60 shown in FIG. 1 excludes the contours of the press-bonded balls 150, 250, 350 except for the rising portions to the wires 124, 224, 324 as in the embodiment described above. Also, a curve 153 between the points 151 and 152, a curve 253 between the points 251 and 252, and a curve 353 between the points 351 and 352 are obtained.
- step S204 of FIG. 9 the CPU 61 of the control unit 60 shown in FIG. 1 selects a line segment representing a side extending in the X direction among the acquired line segments 132 to 138, 232 to 238, and 332 to 338. Determine if it can be recognized. If a line segment representing a side extending in the X direction can not be recognized in the acquired line segments, it is determined that the pad group 70 can not correct the X direction offset amount Xw, and step S205 of FIG. Thus, the camera optical axis 17 is moved to the next pad group 70, and steps S202 and S203 of FIG. 9 are repeated until it is possible to acquire a line segment representing a side extending in the X direction.
- the six line segments 132, 136, 232, 236, 332, 336 are the line segments representing the sides extending in the X direction, and the CPU 61 of the control unit 60 sets the six sides extending in the X direction. It recognizes that the line segment to represent can be acquired.
- line segments 132, 136, 232. 236, 332, and 336 are each a line segment representing a side extending in the X direction, as shown in step S206 of FIG. 9, the control unit 60 shown in FIG.
- the CPU 61 as shown in FIG. 12, extends in the X direction and shows the curves 153, 253, 353 indicating the contours of the press-bonded balls 150, 250, 350 and the respective tangents 141, 241, 341 contacting the contacts 155, 255, 355.
- Set The setting of the tangent line is performed by the same method as the embodiment described above.
- step S207 of FIG. 9 when the tangent lines 141, 241, and 341 can be set, as shown in step S208 of FIG.
- the Y-direction gap length Gy between 1 and the side of the pad 130 is obtained, and the distance between the tangent 241 and the line segment 236 is the Y-direction gap length Gy between the outline of the crimped ball 250 and the side of the pad 230 obtained as 2, to obtain the distance between the tangent line 341 and the line segment 336 as a Y direction gap length Gy 3 between the sides of the contour and the pad 330 of the press-bonded ball 350 is stored in the memory 63.
- tangent lines 141, 241, and 341 can not be set on the side of the line segments 132, 232, and 332. Therefore, each of the images one Y direction gap length Gy 1 of each pad 130, 230, 330, Gy 2, Gy 3 can be obtained.
- the curve 53 indicating the contour of the press-bonded ball 50 can not be obtained sufficiently, and as shown in step S207 of FIG. 9, the tangent line 141 on any side of the line segments 132, 136, 232, 236, 332, 336 , 241 can not be set, the CPU 61 of the control unit 60 executes step S209 of FIG. 9 without acquiring the Y-direction gap length Gy.
- the CPU 61 of the control unit 60 acquires the line segments 132 to 138, 232 to 238, and 332 as in the case of obtaining Y direction clearance lengths Gy 1 , Gy 2 and Gy 3 . It is determined whether a line segment representing a side extending in the Y direction can be recognized in 338. If a line segment representing a side extending in the Y direction can not be recognized in the obtained line segments, it is determined that the Y direction offset amount Yw can not be corrected in the pad group 70, and step S205 of FIG. As described above, the camera optical axis 17 is moved to the next pad group 70, and steps S202 to S209 of FIG.
- the six line segments 134, 138, 238, 238, 334 and 338 are line segments representing sides extending in the Y direction, and the CPU 61 of the control unit 60 sets six sides extending in the Y direction. It recognizes that the line segment to represent can be acquired. Then, in the same manner as described above, set tangents 142, 242, 342 which extend in the Y direction of the curves 153, 253, 353 and contact the curves 153, 253, 353 at the contacts 154, 254, 354. .
- the distance between the tangent 142 and the line segment 134 is obtained as the X-direction gap length Gx 1 between the outline of the press-bonded ball 150 and the side of the pad 130, and the distance between the tangent 242 and the line segment 234 is the press-bonded ball 250
- the X direction clearance length Gx 2 between the contour of the pad 230 and the side of the pad 230 is obtained, and the distance between the tangent 342 and the line segment 334 is the X direction clearance length between the contour of the crimped ball 350 and the side of the pad 330 It is acquired as Gx 3 and stored in the memory 63.
- step S213 of FIG. 9 the CPU 61 of the control unit 60 shown in FIG. 1 determines a predetermined number of X-direction gap lengths Gx and Y-direction gap lengths Gy necessary to calculate an average value. If it can not be acquired, as shown in step S205 in FIG. 9, the capillary center axis 14 is moved onto the next pad group 70, and a predetermined number of X-direction gap lengths Gx and Y-direction gap lengths are obtained. The operations from step S202 to step S212 are repeated until the value Gy is obtained.
- the X-direction gap lengths Gx 1 , Gx 2 and Gx 3 may be any if they are bonded as designed. Should also be within the acceptable range including design values. Further, since each of the Y direction gap length design of the pad 130, 230, 330 is also the same, both if it is bonded to the design each Y direction gap length Gy 1, Gy 2, Gy 3 is It should be within the allowable range including the design value.
- the allowable range is a value obtained by adding the resolution length of the camera 16 to each gap length on design as the upper limit, and a value obtained by subtracting the resolution length of the camera 16 from each gap length on the design as the lower limit
- the upper limit is the value obtained by adding the tolerance for bonding to each gap length on the design
- the lower limit is the value obtained by subtracting the tolerance for bonding from the design gap length. It is good.
- the median value of the allowable range is the designed gap length.
- the allowable range may be fixed or may be changed according to the semiconductor chip 23.
- step S214 of FIG. 9 CPU 61 of control unit 60 shown in FIG. 1, the X direction gap length stored in the memory 63 Gx 1, Gx 2, Gx 3 and Y direction gap length Gy 1 , Gy 2 and Gy 3 with the tolerances of the gap lengths stored in the memory 63. Then, as shown in step S215 of FIG. 9, when any one of the X-direction gap lengths Gx 1 , Gx 2 and Gx 3 is out of the allowable range, it is shown in step S216 of FIG. as such, the average value Gxa of each X direction gap length Gx 1, Gx 2, Gx 3 calculates, as shown in step S217 of FIG.
- the center of the allowable range of the average value Gxa and X direction gap length The X-direction offset amount Xw is changed by the difference from the value.
- the average value of the Y-direction gap lengths Gy 1 , Gy 2 and Gy 3 is obtained.
- Gya is calculated, and the Y-direction offset amount Yw is changed by the difference between the average value Gya and the central value of the allowable range of the Y-direction gap length. In this manner, the offset amount W is corrected by changing the X-direction offset amount Xw and the Y-direction offset amount Yw.
- changes in the X direction and Y direction offset amounts Xw and Yw are the X direction offset amount Xw by an amount obtained by multiplying the difference between the X direction gap length Gx and the central value of the allowable range by a predetermined coefficient smaller than 1. Even if the offset amount W is corrected by changing the Y-direction offset amount Yw by an amount obtained by multiplying the difference between the Y-direction gap length Gy and the central value of the allowable range by a predetermined coefficient smaller than 1. Good. In this case, for example, a predetermined coefficient is halved, the offset amounts Xw and Yw are changed several times, and the offset amount W is corrected by sequentially approaching the median value of the allowable range. It is also good.
- the offset amounts Xw and Yw in the X direction and the Y direction have the gap lengths Gx 1 , Gx 2 and Gx 3 of the X direction, respectively.
- an image of the pad group 70 including three pads having the same gap length in each design direction is acquired, and X-direction gap lengths Gx 1 , Gx 2 , and Gx 3 are obtained.
- the Y-direction gap lengths Gy 1 , Gy 2 and Gy 3 have been described as acquired, if the gap lengths in the respective directions in design are the same, images of a plurality of pads are sequentially acquired and the X direction is obtained.
- a plurality of gap lengths Gx and Y-direction gap lengths Gy may be sequentially obtained, and the offset amount W may be corrected based on the average value thereof.
- the X-direction gap length Gx and the Y-direction gap length Gy may be acquired from the gap between the adjacent two sides of each pad and the outline of the press-bonded ball.
- the pad widths Px and Py shown in FIG. 10 and FIG. 13 are the same pad width Pw, the X direction clearance length Gx 1 to Gx 4 and the Y direction clearance
- the operation of calculating and displaying the diameter of the press-bonded ball 50 based on the lengths Gy 1 to Gy 4 and the pad width Pw will be described.
- the acquisition of the X-direction gap lengths Gx 1 to Gx 4 and the Y-direction gap lengths Gy 1 to Gy 4 from the acquisition of the image is the same as the correction of the offset amount W described above.
- the pad width Pw is stored in the memory 63 of the control unit 60.
- the CPU 61 of the control unit 60 reads the pad width Pw from the memory 63, and from the pad width Pw, doubles the average value of the X direction gap lengths Gx 1 to Gx 4 or the average value of the Y direction gap lengths Gy 1 to Gy 4
- the diameter of the pressure-bonded ball 50 is calculated by subtracting twice the total average value of the X-direction gap lengths Gx 1 to Gx 4 and the Y-direction gap lengths Gy 1 to Gy 4 by two times the above. Since the press-bonded ball formed on the pad of the semiconductor chip of fine pitch as in the present embodiment is substantially round, the diameter of the press-bonded ball 50 can be determined with a practical level of accuracy by the above method.
- the CPU 61 of the control unit 60 displays the diameter of the pressure-bonded ball 50 on the display unit 25 shown in FIG.
- the wire bonding apparatus 10 calculates the diameter of the press-bonded ball 50 based on the average value of the gaps in each direction, in addition to the same effect as the embodiment described above.
- the effect of being able to calculate the diameter of the pressure-bonded ball 50 with a small error can be obtained.
- FIG. 14 Another embodiment will be described with reference to FIG.
- This embodiment is an embodiment in which the pad of the semiconductor chip 23 is rectangular.
- the semiconductor chip 23 is provided with rectangular pads 530, 630, 730, 830.
- the pads 530 and 630 are vertically long pads in which the width in the X direction is Px 1 and the width in the Y direction is the same Py 1 and the width Py 1 in the Y direction is larger than the width Px 1 in the X direction.
- the pads 730 and 830 are Px 2 having the same width in the X direction and Py 2 having the same width in the Y direction, and the width Px 2 in the X direction is a laterally long pad larger than the width Py 2 in the Y direction. .
- Crimping balls 550, 650, 750, 850 are formed on portions of the pads 530, 630, 730, 830 away from the center of the semiconductor chip 23, respectively. Each wire 524, 624, 724, 824 extends outward.
- the diameter of each crimped ball 550, 650, 750, 850 is slightly smaller than the smaller width Px 1 or Py 2 of each pad.
- the pads 530 and 630 have the same design X-direction gap length in the design of the crimped balls 550 and 650 bonded to the pads 530 and 630, and the pads 730 and 830 are bonded to the pads 730 and 830.
- the designed Y-direction gap lengths of the press-bonded balls 750 and 850 are the same.
- pad groups 500 and 600 each include three pads 530 and 630 having the same design X-direction gap length
- pad groups 700 and 800 each have three pads having the same design Y-direction gap length. 730, 830 are included.
- the CPU 61 of the control unit 60 acquires the X-direction gap length from the pad groups 500 and 600, and acquires the Y-direction gap length from the pad groups 700 and 800.
- the CPU 61 of the control unit 60 acquires the image of each pad 530, 630 included in the pad group 500, 600 and the image of the pressure-bonded ball 550, 650 formed on each pad 530, 630, and the embodiment described above Similarly, X-direction gap lengths Gx 1 to Gx 8 of the pads 530 and 630 are acquired. In addition, the CPU 61 of the control unit 60 acquires the images of the pads 730 and 830 in the pad groups 700 and 800 and the images of the press-bonded balls 750 and 850 formed on the pads 730 and 830, and the embodiment described above Similarly, Y-direction gap lengths Gy 1 to Gy 8 of the pads 730 and 830 are obtained.
- the CPU 61 of the control unit 60 shown in FIG. 1 calculates the X-direction gap lengths Gx 1 to Gx 8 stored in the memory 63 and the X-direction gaps stored in the memory 63.
- the allowable range is a value obtained by adding the resolution length of the camera 16 to each gap length on design as the upper limit, and a value obtained by subtracting the resolution length of the camera 16 from each gap length on the design as the lower limit
- the upper limit is the value obtained by adding the tolerance for bonding to each gap length on the design
- the lower limit is the value obtained by subtracting the tolerance for bonding from the design gap length. It is good.
- the median value of the allowable range is the designed gap length.
- the allowable range may be fixed or may be changed according to the semiconductor chip 23. Then, if any one of them is out of the allowable range, the average value Gxa of the X-direction gap lengths Gx 1 to Gx 8 is calculated, and the average value Gxa and the allowable range of the X-direction gap length The X-direction offset amount Xw is changed by the difference from the central value of. Also, the Y-direction gap lengths Gy 1 to Gy 8 are compared with the allowable range of the Y-direction gap length stored in the memory 63.
- the offset amount W is corrected by changing the Y-direction offset amount Yw by an amount obtained by multiplying the difference between the Y-direction gap length Gy and the central value of the allowable range by a predetermined coefficient smaller than 1. Good. In this case, for example, a predetermined coefficient is halved, the offset amounts Xw and Yw are changed several times, and the offset amount W is corrected by sequentially approaching the median value of the allowable range. It is also good.
- the present embodiment has the same effects as the above-described embodiment, and in addition, rectangular pads are grouped into a plurality of pads having the same design gap length in each direction, and each group is divided into X and Y directions. Since the gap length in the direction is determined, the offset amount W can be effectively adjusted even in the semiconductor chip 23 having a non-square pad shape.
- the acquisition of the X-direction gap lengths Gx 1 to Gx 8 and the Y-direction gap lengths Gy 1 to Gy 8 from the acquisition of the image is the same as the correction of the offset amount W described above.
- the pad widths Px 1 and Py 2 are stored in the memory 63 of the control unit 60, respectively.
- the diameter of the press-bonded ball 50 is calculated by subtracting twice the average value of the Y-direction gap lengths Gy 1 to Gy 8 from the above.
- the CPU 61 of the control unit 60 displays the diameter of the pressure-bonded ball 50 on the display unit 25 shown in FIG.
- the CPU 61 of the control unit 60 calculates the diameter of the press-bonded ball 50 and the Y-direction gap length Gy calculated based on the X-direction gap lengths Gx 1 to Gx 8.
- An average value of the diameter of the press-bonded ball 50 calculated based on 1 to Gy 8 may be displayed on the display unit 25 as the diameter of the press-bonded ball 50.
- the X direction plus side gap length Gxa + is calculated by averaging the plus side X direction gap lengths Gx 1 , Gx 3 , Gx 5 , Gx 7 toward each X direction of the pads 530 and 630, and minus X direction gap length of the side Gx 2, Gx 4, Gx 6 , X -direction negative side clearance on average Gx 8 length Gxa - was calculated, the X-direction positive side clearance length in the X direction from the pad width Px 1 Gxa + and X-direction negative side gap length Gxa - and may be obtained diameter of the bonded ball 550 and 650 pull the.
- the Y direction plus side gap length Gya + is calculated by averaging the plus side Y direction gap lengths Gy 2 , Gy 4 , Gy 6 and Gy 8 toward the respective Y directions of the pads 730 and 830, minus Y direction gap length Gy 1 side, Gy 3, Gy 5, the Gy 7 average Y-direction negative side gap length Gya - was calculated, Y-direction positive side gap length in the Y direction from the pad width Py 2 Gya + and Y-direction negative side gap length Gya - and may be obtained diameter of the bonded ball 750,850 pull.
- the diameter of the press-bonded ball is effective. Can be calculated.
- This embodiment exhibits the same effects as the embodiment described above, and also exhibits the effect that the diameter of the pressure-bonded ball 50 can be effectively calculated even in the semiconductor chip 23 having a non-square pad shape.
- the Y-direction gap length in the longitudinal direction of each rectangular pad 530, 630 is The case where correction of offset amount W is performed is shown by acquiring the X direction crevice length of a longitudinal direction.
- the X-direction gap lengths Gx 1 ′ to Gx 3 ′ on the center side of the semiconductor chip 23 of the pad 730 and the X-direction gap lengths Gx 4 ′ to Gx on the center side of the semiconductor chip 23 of the pad 830 are identical in design. 6 'is identical in design.
- pad groups 500 and 600 each include three pads 530 and 630 having the same design Y-direction gap length
- pad groups 700 and 800 each have three pads having the same design X-direction gap length. 730, 830 are included.
- the CPU 61 of the control unit 60 shown in FIG. 1 acquires the Y-direction gap length from the pad groups 500 and 600 and acquires the X-direction gap length from the pad groups 700 and 800 in the same manner as in the previous embodiment. .
- the CPU 61 of the control unit 60 shown in FIG. 1 compares the X-direction gap lengths Gx 1 ′ to Gx 6 ′ with the allowable range of the X-direction gap length, If any one of them is out of the allowable range, the average value Gxa of the X-direction gap lengths Gx 1 ′ to Gx 6 ′ is calculated, and the average range Gxa and the allowable range of the X-direction gap length
- the X-direction offset amount Xw is changed according to the difference with the median value of Y, and the Y-direction gap lengths Gy 1 'to Gy 6 ' are compared with the allowable range of the Y-direction gap length.
- this embodiment has an effect that the offset amount W can be effectively adjusted even in the semiconductor chip 23 having a non-square pad shape.
- this invention is not only a wire bonding apparatus, but if it is a bonding apparatus which forms a crimp ball on the pad of a semiconductor chip
- this invention can apply also to other bonding devices, such as a bump bonding device.
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Abstract
Description
Claims (13)
- ボンディング装置であって、
XYテーブルによってXY方向に移動するボンディングヘッドと、
ボンディングヘッドに取り付けられ、先端に取り付けられたボンディングツールを半導体チップのパッドに対して接離方向に動作させるボンディングアームと、
ボンディングの際のボンディングツールの中心線に対してXY方向に所定量だけ光軸がオフセットされてボンディングヘッドに取り付けられ、パッドおよびパッドにボンディングされた圧着ボールの画像を取得するカメラと、
カメラによって取得したパッドの画像とオフセット量とに基づいてボンディングツール中心軸のXY方向位置を制御する制御部と、を含み、
制御部は、
カメラによって取得した画像を処理してパッドの各辺と、圧着ボールの輪郭と、を取得する輪郭取得手段と、
パッド各辺と圧着ボールの輪郭との各隙間長さを取得する隙間長さ取得手段と、
隙間長さ取得手段によって取得した各隙間長さに基づいてオフセット量の修正を行うオフセット量修正手段と、
を有することを特徴とするボンディング装置。 - 請求の範囲1に記載のボンディング装置であって、
輪郭取得手段は、少なくとも1つのパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
隙間長さ取得手段は、各パッドのX方向に延びる各辺と各圧着ボールの各輪郭とのY方向の距離を各Y方向隙間長さとし、各パッドのY方向に延びる各辺と各圧着ボールの各輪郭とのX方向の距離を各X方向隙間長さとして取得し、
オフセット量修正手段は、
各X方向隙間長さ及び各Y方向隙間長さが予め設定した許容範囲にあるか否かを比較し、各X方向隙間長さのうちの少なくとも1つが許容範囲外の場合には、各X方向隙間長さと許容範囲の中央値との差に応じてX方向のオフセット量を変化させ、各Y方向隙間長さのうちの少なくとも1つが許容範囲外の場合には、各Y方向隙間長さと許容範囲の中央値との差に応じてY方向のオフセット量を変化させること、
を特徴とするボンディング装置。 - 請求の範囲2に記載のボンディング装置であって、
輪郭取得手段は、設計隙間長さが同一の複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
オフセット量修正手段は、
各X方向隙間長さの平均値と許容範囲の中央値との差に応じてX方向のオフセット量を変化させ、各Y方向隙間長さの平均値と許容範囲の中央値との差に応じてY方向のオフセット量を変化させること、
を特徴とするボンディング装置。 - 請求の範囲2に記載のボンディング装置であって、
隙間長さ取得手段は、同一のパッドでX方向隙間長さ及びY方向隙間長さを1つずつ取得すること、
を特徴とするボンディング装置。 - 請求の範囲4に記載のボンディング装置であって、
X方向隙間長さ及びY方向隙間長さは、隣接する2辺と圧着ボールの輪郭とのY方向の距離とX方向の距離であること、
を特徴とするボンディング装置。 - 請求の範囲3に記載のボンディング装置であって、
隙間長さ取得手段は、X方向の設計隙間長さが同一の第1のグループに含まれる複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とから各X方向隙間長さを取得し、Y方向の設計隙間長さが同一の第2のグループに含まれる複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とから各Y方向隙間長さを取得すること、
を特徴とするボンディング装置。 - 請求の範囲1に記載のボンディング装置であって。
隙間長さ取得手段によって取得した各隙間長さとパッドの幅とに基づいて圧着ボールの径を算出する圧着ボール径算出手段と、
算出した圧着ボール径を表示する表示手段と、
を有することを特徴とするボンディング装置。 - 請求の範囲7に記載のボンディング装置であって、
輪郭取得手段は、パッド幅と設計隙間長さが同一の複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
隙間長さ取得手段は、各パッドのX方向に延びる各辺と各圧着ボールの各輪郭とのY方向の距離を各Y方向隙間長さとし、各パッドのY方向に延びる各辺と各圧着ボールの各輪郭とのX方向の距離を各X方向隙間長さとして取得し、
圧着ボール径算出手段は、パッド幅からXYいずれか一方向または両方向の隙間長さの平均値の2倍を引いて圧着ボール径を算出すること、
を特徴とするボンディング装置。 - 請求の範囲7に記載のボンディング装置であって、
輪郭取得手段は、パッド幅と設計隙間長さが同一の複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
隙間長さ取得手段は、パッド幅方向プラス側にあってパッド幅方向と直角方向に延びる各辺と各圧着ボールの各輪郭とのパッド幅方向の距離を各パッド幅方向プラス側隙間長さとして取得し、各パッド幅方向マイナス側にあってパッド幅方向と直角方向に延びる各辺と各圧着ボールの各輪郭とのパッド幅方向の距離を各パッド幅方向マイナス側隙間長さとして取得し、
パッド幅から各パッド幅方向プラス側隙間長さの平均値と各パッド幅方向マイナス側隙間長さの平均値とを引いて圧着ボール径を計算する圧着ボール径算出手段と、
を有することを特徴とするボンディング装置。 - ボンディング方法であって、
XYテーブルによってXY方向に移動するボンディングヘッドと、ボンディングヘッドに取り付けられ、先端に取り付けられたボンディングツールを半導体チップのパッドに対して接離方向に動作させるボンディングアームと、ボンディングの際のボンディングツールの中心線に対してXY方向に所定量だけ光軸がオフセットされてボンディングヘッドに取り付けられ、パッドおよびパッドにボンディングされた圧着ボールの画像を取得するカメラと、を含み、カメラによって取得したパッドの画像とオフセット量とに基づいてボンディングツール中心軸のXY方向位置を制御するボンディング装置を用意し、
カメラによって取得した画像を処理してパッドの各辺と、圧着ボールの輪郭とを取得し、
パッド各辺と圧着ボールの輪郭との各隙間長さを取得し、
隙間長さ取得工程によって取得した各隙間長さに基づいてオフセット量の修正を行うこと、
を有することを特徴とするボンディング方法。 - 請求の範囲10に記載のボンディング方法であって、
少なくとも1つのパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
各パッドのX方向に延びる各辺と各圧着ボールの各輪郭とのY方向の距離を各Y方向隙間長さとし、各パッドのY方向に延びる各辺と各圧着ボールの各輪郭とのX方向の距離を各X方向隙間長さとして取得し、
各X方向隙間長さ及び各Y方向隙間長さが予め設定した許容範囲にあるか否かを比較し、各X方向隙間長さのうちの少なくとも1つが許容範囲外の場合には、各X方向隙間長さと許容範囲の中央値との差に応じてX方向のオフセット量を変化させ、各Y方向隙間長さのうちの少なくとも1つが許容範囲外の場合には、各Y方向隙間長さと許容範囲の中央値との差に応じてY方向のオフセット量を変化させること、
を特徴とするボンディング方法。 - 請求の範囲11に記載のボンディング方法であって、
設計隙間長さが同一の複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とを取得し、
各X方向隙間長さの平均値と許容範囲の中央値との差に応じてX方向のオフセット量を変化させ、各Y方向隙間長さの平均値と許容範囲の中央値との差に応じてY方向のオフセット量を変化させること、
を特徴とするボンディング方法。 - 請求の範囲12に記載のボンディング方法であって、
X方向の設計隙間長さが同一の第1のグループに含まれる複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とから各X方向隙間長さを取得し、Y方向の設計隙間長さが同一の第2のグループに含まれる複数のパッドの各辺と、各パッドにボンディングされた各圧着ボールの各輪郭とから各Y方向隙間長さを取得すること、
を特徴とするボンディング方法。
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JP2009246111A (ja) | 2009-10-22 |
KR101037080B1 (ko) | 2011-05-26 |
KR20100105803A (ko) | 2010-09-29 |
CN101981679A (zh) | 2011-02-23 |
JP4247299B1 (ja) | 2009-04-02 |
US8091761B2 (en) | 2012-01-10 |
TW200941603A (en) | 2009-10-01 |
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US20110114704A1 (en) | 2011-05-19 |
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