WO2009060515A1 - 搬送装置および電子部品ハンドリング装置 - Google Patents

搬送装置および電子部品ハンドリング装置 Download PDF

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Publication number
WO2009060515A1
WO2009060515A1 PCT/JP2007/071569 JP2007071569W WO2009060515A1 WO 2009060515 A1 WO2009060515 A1 WO 2009060515A1 JP 2007071569 W JP2007071569 W JP 2007071569W WO 2009060515 A1 WO2009060515 A1 WO 2009060515A1
Authority
WO
WIPO (PCT)
Prior art keywords
kst
arm
sensing plate
electronic component
tray
Prior art date
Application number
PCT/JP2007/071569
Other languages
English (en)
French (fr)
Inventor
Daisuke Takano
Kenichi Takahashi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to PCT/JP2007/071569 priority Critical patent/WO2009060515A1/ja
Priority to JP2009539900A priority patent/JP5137965B2/ja
Priority to KR1020107009747A priority patent/KR101187306B1/ko
Publication of WO2009060515A1 publication Critical patent/WO2009060515A1/ja

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Abstract

カスタマトレイKSTを搬送するトレイ搬送アーム205であって、アーム基板2と、アーム基板21の下面の略四隅に設けられた近接センサ24と、近接センサ24の下側に位置する検知プレート27とを備え、アーム基板21の下側両側部には、ブロック部材25を介して支持板26が設けられており、検知プレート27は、その両側部にて支持板26に支持されている。かかるトレイ搬送アーム205が、収納部20からICデバイス2がはみ出したカスタマトレイKSTを保持すると、検知プレート27がICデバイス2に接触してZ軸上方向に移動し、近接センサ24がそれを検知する。これにより、ICデバイス2がカスタマトレイKSTの収納部20からはみ出していることを検出することができ、また、はみ出しているICデバイス2の破損を防止することができる。
PCT/JP2007/071569 2007-11-06 2007-11-06 搬送装置および電子部品ハンドリング装置 WO2009060515A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PCT/JP2007/071569 WO2009060515A1 (ja) 2007-11-06 2007-11-06 搬送装置および電子部品ハンドリング装置
JP2009539900A JP5137965B2 (ja) 2007-11-06 2007-11-06 搬送装置および電子部品ハンドリング装置
KR1020107009747A KR101187306B1 (ko) 2007-11-06 2007-11-06 반송장치 및 전자부품 핸들링 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/071569 WO2009060515A1 (ja) 2007-11-06 2007-11-06 搬送装置および電子部品ハンドリング装置

Publications (1)

Publication Number Publication Date
WO2009060515A1 true WO2009060515A1 (ja) 2009-05-14

Family

ID=40625430

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/071569 WO2009060515A1 (ja) 2007-11-06 2007-11-06 搬送装置および電子部品ハンドリング装置

Country Status (3)

Country Link
JP (1) JP5137965B2 (ja)
KR (1) KR101187306B1 (ja)
WO (1) WO2009060515A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104716079A (zh) * 2013-12-13 2015-06-17 株式会社东芝 半导体制造装置
US11353502B2 (en) 2020-03-12 2022-06-07 Advantest Corporation Electronic component handling apparatus and electronic component testing apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101489372B1 (ko) * 2013-11-04 2015-02-12 주식회사 넥스트솔루션 씨 트레이의 디바이스 안착불량 검출장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6175134U (ja) * 1984-10-19 1986-05-21
JP2001004702A (ja) * 1999-06-22 2001-01-12 Advantest Corp 半導体試験装置のicハンドラ装置
JP2001343424A (ja) * 2000-05-31 2001-12-14 Hioki Ee Corp 基板検査装置における被検査基板の浮き上がり検出機構
JP2003167020A (ja) * 2001-12-03 2003-06-13 Seiko Epson Corp 浮き検出方法、浮き検出装置、icハンドラ及びic検査装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6175134U (ja) * 1984-10-19 1986-05-21
JP2001004702A (ja) * 1999-06-22 2001-01-12 Advantest Corp 半導体試験装置のicハンドラ装置
JP2001343424A (ja) * 2000-05-31 2001-12-14 Hioki Ee Corp 基板検査装置における被検査基板の浮き上がり検出機構
JP2003167020A (ja) * 2001-12-03 2003-06-13 Seiko Epson Corp 浮き検出方法、浮き検出装置、icハンドラ及びic検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104716079A (zh) * 2013-12-13 2015-06-17 株式会社东芝 半导体制造装置
JP2015115516A (ja) * 2013-12-13 2015-06-22 株式会社東芝 半導体製造装置
US9824905B2 (en) 2013-12-13 2017-11-21 Toshiba Memory Corporation Semiconductor manufacturing device and semiconductor manufacturing method
US11353502B2 (en) 2020-03-12 2022-06-07 Advantest Corporation Electronic component handling apparatus and electronic component testing apparatus

Also Published As

Publication number Publication date
KR20100074247A (ko) 2010-07-01
KR101187306B1 (ko) 2012-10-05
JP5137965B2 (ja) 2013-02-06
JPWO2009060515A1 (ja) 2011-03-17

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