WO2009046885A1 - Temperierkammer zum temperieren von elektronischen bauelementen, insbesondere ic's - Google Patents
Temperierkammer zum temperieren von elektronischen bauelementen, insbesondere ic's Download PDFInfo
- Publication number
- WO2009046885A1 WO2009046885A1 PCT/EP2008/008158 EP2008008158W WO2009046885A1 WO 2009046885 A1 WO2009046885 A1 WO 2009046885A1 EP 2008008158 W EP2008008158 W EP 2008008158W WO 2009046885 A1 WO2009046885 A1 WO 2009046885A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- components
- trays
- support elements
- housing
- removal opening
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2862—Chambers or ovens; Tanks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
Definitions
- the invention relates to a tempering chamber for tempering electronic components, in particular ICs, according to the preamble of claim 1.
- Electronic devices such as integrated circuit (IC) integrated circuit (IC) devices, are typically tested for functionality before being mounted on printed circuit boards or otherwise used.
- the components to be tested are supplied from a handling machine, usually referred to as a "handler", at high speed to a test device and sorted after the test procedure has been carried out as a function of the test result.
- a handling machine usually referred to as a "handler”
- temper the components before the test procedure in a tempering to certain temperatures.
- these temperatures may range between -60 'and +200 "C.
- the temperature of the components takes place in a correspondingly heat-insulated housing in a convective and / or conductive manner.
- convective temperature control the components in the housing are circulated with a correspondingly tempered air or another gas until they have reached the desired temperature.
- conductive temperature control the components are located on a heating or cooling plate, from which the heat is then transferred to the components.
- the temperature control of the components usually takes a relatively long time, since it takes some time until the components are evenly heated or cooled to the desired temperature. This can slow the test throughput significantly. With known Temperierkarmmern the desired high throughputs often can not be achieved.
- the invention has for its object to provide a temperature chamber of the type mentioned, with which electronic components, in particular ICs, can be tempered in a particularly fast and uniform manner.
- the holding device arranged inside the housing for holding the components has a circulation device with a plurality of circularly circulating support elements and two arranged on opposite sides of the support elements Supporting devices on which the support elements are mounted such that the orientation of the support elements remains the same during their circulation.
- the temperature-control chamber In the case of the temperature-control chamber according to the invention, a large number of components can thus be accommodated and tempered within the housing at the same time by a corresponding number of support elements.
- the feeding and removal of the components can be done in a very efficient and fast manner, since by further rotation of the holding device, those support elements from which the already tempered components have been removed, can be brought in a short path to a position in which they with new, to be tempered components.
- the temperature within the housing can be carried out convectively and very evenly, since the support elements and the components to be tempered are moved through the housing and exposed to different air flows, whereby local heat or cold esters can be avoided.
- the support elements consist of rectangular support plates or support frames, which are designed to receive trays on which the components are located.
- trays trays
- the circulating within the temperature chamber support members are designed such that the trays can be easily and quickly pushed onto the support elements or placed on these.
- AIs can contain special transport trays
- carrier or conventional storage / transport trays ("user trays”), on which the components are arranged isolated, or support means for composite arranged devices ("strips”) are used.
- the support means consist of a first and a second turnstile, which are rotatable about parallel, but laterally offset axes and have rotating arms on which the support elements are rotatably mounted.
- Such a construction allows in a relatively simple manner the desired circulation of the support elements and thus the components to be tempered within the temperature chamber, wherein the support elements always maintain the desired orientation, in particular remain in horizontal planes.
- To move the support elements it is only necessary to drive one of the two hubs. This can be done, for example, by a drive motor which is arranged outside the temperature chamber and acts on one of the two hubs.
- the other turnstile is turned over the support elements.
- drive motors may be provided on both sides of the temperature chamber, which act on both hubs.
- the support elements are mounted in lateral, circular circumferential slide guides, which are provided in the two lateral support means.
- the support elements could, for example, also be provided by a laterally arranged turnstile or by other drive systems. be put into circulation, which act directly on the bearing points of the support elements.
- a "circular" orbit may also mean that the support elements orbit on an oval or approximately polygonal orbit.
- the support elements are each mounted in the region of two diagonally opposite corners on the rotating arms. This results in a particularly tilt-free mounting of the support elements.
- the turnstiles each have 2 to 12, preferably 3 to 7, uniformly distributed over the circumference rotating arms.
- the number of rotating arms or supporting elements corresponds to the number of locking positions which a supporting element passes through until it has returned to its original loading position.
- the housing has a feed and removal opening for trays and a removal opening for the tempered components, wherein the openings are arranged adjacent to each other such that the tray from which the tempered components have been removed in the next round - Detent position of the holding device is located in the region of the feed and removal opening for trays.
- the portion of the circulation path traversed by the trays in the deflated state within the temperature chamber is very short, while the trays filled with components can remain in the temperature chamber for a very long time until they are removed from the temperature chamber via the removal opening.
- FIG. 1 shows a schematic representation of the temperature-control chamber according to the invention and surrounding components which are used in the testing of electronic components
- FIG. 2 shows the tempering chamber of FIG. 2 in a stand-alone position
- Figure 3 the circulation device of the tempering chamber in isolation, with trays are on the support elements, and
- Figure 4 a schematic, partially broken away
- FIG. 1 a possible system for testing electronic components in the form of ICs will first of all be described schematically and by way of example.
- the arrows indicate the path of the components.
- the components are first fed to a loading unit 1.
- the loading unit 1 transports the components to a feed opening 2 of a temperature-control chamber 3 (temperature chamber) in order to temper it within the temperature-control chamber 3 to the predetermined temperature.
- a transport unit 4 which may be, for example, a pick and place unit, removed via a removal opening 5 from the temperature control chamber 3 and fed to a handler central unit 6.
- the handler central unit 6 contains the necessary means for receiving and holding the components, optionally an additional temperature control of the components, and a component movement means for supplying the components to a test head 7 and to remove again from the test head 7 after completion of the test procedure.
- the handler central unit 6 may include certain means to act on the devices under test in a certain way, for example, with accelerations, pressure or inclination of the components.
- the test head 7 is docked in a known manner to the handler central unit 6.
- the test head 7 is part of an electronic test device with which the components are tested and the test results are evaluated.
- the components are removed from the handler central unit 6 again from the test head 7 and by means of a removal unit 8 (Unloader or Pick and
- Sorting unit 9 the components are sorted depending on the test result. Subsequently, the components arrive at an unloading station 10.
- the temperature control can also take place in a tempering chamber 3, which is arranged exclusively in the handler central unit 6.
- the supply of the components to the handler central unit 6 does not have to take place via the transport unit 4 in the form of a pick and place unit, but can also, as is known to the person skilled in the art, be determined by gravity respectively. In this case, it is a so-called gravity handler.
- the tempering chamber 3 is constructed such that it is suitable for receiving trays 11 on which a plurality of components 12 are located.
- trays 11 are special transport trays which, on the one hand, are adapted to the temperature control chamber and, on the other hand, enable the takeover of components from conventional trays 13 (FIG. 4), in which the components 12 are supplied to the loading unit 1.
- the tempering chamber shown in FIGS. 2 to 4 has a heat-insulated housing 14, in which a rotatable circulatory device 15 for a circulating circulating transport of the trays 11 and thus of the components 12 deposited on the trays 11 is arranged.
- the circulating device 15 has two hubs 16, 17 and support elements 18, on which the trays 11 can be placed with the components 12.
- the two hubs 16, 17 are arranged in the vicinity of the two side walls 19, 20 and rotatable in mutually parallel vertical planes.
- the first turnstile 16 is rotatable about a first axis of rotation 21, while the second turnstile 17 is rotatable about a second axis of rotation 22. Both axes of rotation 21, 22 run horizontally and parallel to one another, but are laterally offset by a dimension a.
- the storage of the hubs 16, 17 via axle stub 23, 24, which are rotatably mounted in bearing brackets 25, 26.
- the bearing brackets 25, 26 can be integrated into the side walls 19, 20 or arranged separately from them in the immediate vicinity of the side walls 19, 20. It should be noted that the stub axles 23, 24 extend inwards only up to the respective turnstile 16, 17, which are therefore each mounted only on one side.
- the turnstile 17 is rotated by means of a drive motor 27, a drive belt 28 and a belt pulley 29, which is rotationally coupled to the axle stub 24 which penetrates the side wall 20.
- the other turnstile 16 is rotated about the support members 18.
- the two hubs are rotated in a very simple manner synchronously with each other and in the same direction of rotation.
- the turnstiles 16, 17 have five equally long pivot arms 30, which extend radially outward from the center of the turnstiles 16, 17 and are regularly distributed over the circumference of the turnstiles 16, 17.
- the support elements 18 are arranged horizontally between the two hubs 16, 17. As can be seen, the support elements 18 in diagonally opposite corner areas on the one hand in the free end region of the rotating arms 30 of the first hub 16 and on the other hand, in the free end region of the pivot arms 30 of the two th turnstile 17 rotatably mounted. Since the rotational position of the two hubs 16, 17 is coordinated with each other such that the pivot arms 30 of the two hubs 16, 17 occupy the same angular position, and beyond the two axes of rotation 21, 22 of the hubs 16, 17 offset in a horizontal plane next to each other, the trays 11 are always held in horizontal planes in each rotational position of the turnstile 16, 17.
- the number of support members 18 and thus that of the trays 11 can be arranged thereon thus corresponds to the number of pivot arms 30 of each turnstile 16, 17. If the turnstile 16 in the direction of arrow 31 about the axis 21 and the turnstile 17 in the direction of arrow 32 rotated the axis 22, the support members 18 and thus arranged thereon trays 11 are moved through the tempering without the horizontal orientation of the trays 11 changes.
- the drive motor 27 and the pulley 29 are arranged outside the housing 14. Thus, it is only necessary to guide the axle stub 24 through the side wall 20 of the housing 14 and to make it so long that the pulley 29 can be fastened on the stub axle 24.
- the side wall 20 of the housing has a lateral feed and removal opening 33 in order to be able to feed and remove the trays parallel to the axes of rotation 21, 22 of the turnstiles 16, 17.
- the supply and removal opening 33 (corresponding to the supply opening 2 of Figure 1) is located in an upper region, ie relatively close to the upper end wall of the housing 14 in which the removal opening 5 ( Figure 1) is located, through which tempered Components 12 removed and the handler central unit 6 can be supplied.
- the takeover plate 34 thus represents a laterally projecting loading ramp, via which the trays 11 can be introduced into the temperature control chamber.
- the trays 11 are thereby guided in guide grooves 35 which are provided on the upper side of the transfer plate 34 and the support members 18 in the vicinity and along their lateral edges.
- tion 15 two radiant heaters 37 and another electric heater 37 a for generating the necessary temperature within the housing 14 is arranged.
- a fan drum 38 which is likewise arranged in the bottom area of the temperature-control chamber 3 and extends over the greater part of the width of the housing 14, ensures a uniform distribution of the air heated by the radiant heaters 37 within the temperature-control chamber 3.
- An empty tray 11 (transport tray) is placed on the stack 39 by means of a flip unit 40 in order to lift off the uppermost tray 13 together with the components 11 located therein.
- the flip unit 40 rotates the tray 11 together with the tray 13 supported thereon about a horizontal axis by 180 ', as shown by the arrow 41.
- the tray 13 is now overhead above the transport tray 11, so that the components 11 fall on the transport tray 11.
- the now empty tray 13 is detected by means of a pick and place device 42 arranged above it, laterally displaced in the direction of the arrow 43 and then deposited laterally in the direction of the arrow 44 next to the stack 39, whereby a stack 45 of empty trays 13 is formed.
- the pick and place device 42 in basically already known manner on a holding head 46 which is movable in two orthogonal horizontal directions and movable in the vertical direction is and optionally also in addition to be rotatable about at least one axis.
- the transport tray 11, which is held by the flip unit 40 together with the components 11 in the raised position, which is aligned with the plane of the transfer plate 34 is pushed by a device not shown on the transfer plate 34, as by the arrow 47 indicated. From there, the transport tray 11 is pushed by means of a transport device not shown in detail in the interior of the housing 14 and on the support member 18 a, which is located at the same height as the acquisition plate 34.
- the circulating device 14 is then rotated by means of the drive motor 27 in such a way that the support element 18a together with the tray 11 thereon rotates downwards by a rotation angle of 72 '(1/5 of 360').
- the adjacent support member 18b which was previously in the uppermost position in the region of the removal opening 5, again at the same height as the acquisition plate 34.
- An optional existing empty transport tray 11, which is located on this support element, can now be pushed laterally out of the housing 14 and on the transfer plate 34.
- each support element 18 reaches the area laterally next to the transfer plate 34, so that it can be loaded with a transport tray 11 filled with components 11.
- a loaded support member has covered 18 4/5 of its entire circulation path, it is in its uppermost position directly below the removal opening 5, which is located in the cover part of the housing 14.
- This top support element is provided in Figures 2 and 4 with the reference numeral 18b.
- the components 12 lying on the assigned tray 11 can now be lifted off in the direction of the tray 48 by means of the transport unit 4 (pick and place unit) and fed to the handler central unit 6 (FIGS. 1 and 4).
- the empty tray 11 Since the removal position of the components 11 in the direction of rotation of the circulation device 15 is located immediately before the loading position of the temperature control chamber 3, the empty tray 11 only has to be rotated a very small distance, namely 72 ', in order to return to the loading position. By far the largest part of the circulation path is thus available for the temperature control of the components 11.
- a further advantage is that the uppermost support element 18b, together with the tray 11 lying thereon, can close the upper removal opening 5 almost completely, so that heat flow through the removal opening 5 during the removal of the components 12 can be minimized.
- the lateral feed and removal opening 33 can also kept very small and preferably closed with a sliding or flap mechanism, so that the temperature losses can be minimized through this feed and removal opening 33 therethrough.
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Heat Treatment Of Articles (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/681,706 US20100209864A1 (en) | 2007-10-05 | 2008-09-25 | Tempering chamber for tempering electronic components in particular ic's |
CN2008801100160A CN101815952B (zh) | 2007-10-05 | 2008-09-25 | 用于对电子元件进行调温的调温腔 |
JP2010527356A JP5238031B2 (ja) | 2007-10-05 | 2008-09-25 | 電子部品、特にicを温度調節する温度調節空洞装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007047772.6 | 2007-10-05 | ||
DE102007047772A DE102007047772B4 (de) | 2007-10-05 | 2007-10-05 | Temperierkammer zum Temperieren von elektronischen Bauelementen, insbesondere IC's |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009046885A1 true WO2009046885A1 (de) | 2009-04-16 |
Family
ID=40380320
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2008/008158 WO2009046885A1 (de) | 2007-10-05 | 2008-09-25 | Temperierkammer zum temperieren von elektronischen bauelementen, insbesondere ic's |
Country Status (7)
Country | Link |
---|---|
US (1) | US20100209864A1 (de) |
JP (1) | JP5238031B2 (de) |
KR (1) | KR101259672B1 (de) |
CN (1) | CN101815952B (de) |
DE (1) | DE102007047772B4 (de) |
MY (1) | MY151351A (de) |
WO (1) | WO2009046885A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102011078707A1 (de) * | 2011-07-05 | 2013-01-10 | Dürr Systems GmbH | Fördervorrichtung |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103552843B (zh) * | 2013-11-19 | 2016-03-30 | 宁夏巨能机器人系统有限公司 | 水平旋转料仓 |
US10228189B1 (en) * | 2014-05-15 | 2019-03-12 | Rapid TPC, LLC | Heating system for composite materials |
CN106185280B (zh) * | 2016-08-30 | 2018-07-17 | 朱洋 | 隔磁杆托盘上料机构 |
CN106185297A (zh) * | 2016-08-30 | 2016-12-07 | 吴中区横泾嘉运模具厂 | 隔磁杆托盘上料机构的旋转载料装置 |
CN107487626B (zh) * | 2017-08-11 | 2019-06-21 | 京东方科技集团股份有限公司 | 掩膜板的存储机构、搬运方法及搬运系统 |
CN107585560A (zh) * | 2017-09-08 | 2018-01-16 | 安徽省振华科技工业有限公司 | 一种达克罗处理过程用旋转式冷却装置 |
KR102093641B1 (ko) * | 2018-06-22 | 2020-04-23 | 주식회사 로보스타 | 파티클제거팁 및 그것을 이용한 인덱스형 파티클 제거장치 |
CN112875141B (zh) * | 2021-01-09 | 2021-09-14 | 广东顺德联铸精密制造有限公司 | 一种金属板件自动转运装置及生产线 |
KR102525232B1 (ko) * | 2021-07-23 | 2023-04-24 | 장성철 | 화물 리프트 장치 |
CN114654300B (zh) * | 2022-04-27 | 2023-03-17 | 湖州学院 | 一种组合机床生产线 |
Citations (2)
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DE1285952B (de) * | 1967-10-10 | 1968-12-19 | Mengele & Soehne Masch Karl | Regal-, Schrank- oder sonstige Umlauffoerdervorrichtungen |
US4692694A (en) * | 1983-11-28 | 1987-09-08 | Tsubakimoto Chain Company | Load testing apparatus for electronic components |
Family Cites Families (13)
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---|---|---|---|---|
GB370087A (en) * | 1931-01-28 | 1932-04-07 | Gibbons Brothers Ltd | Improvements in or relating to ovens for the firing of pottery and enamel goods, and for the heat treatment of metals and other purposes |
US1913455A (en) * | 1931-06-30 | 1933-06-13 | Frank W Preston | Method of and apparatus for working plastic materials |
US3063878A (en) * | 1958-05-07 | 1962-11-13 | Wilson Lee | Method of and apparatus for annealing |
US3074360A (en) * | 1960-03-18 | 1963-01-22 | Charles M Vaughan | Oven |
US3214566A (en) * | 1962-12-06 | 1965-10-26 | Robert G Wilson | Oven with circulation of heated air |
US3323280A (en) * | 1963-02-19 | 1967-06-06 | Scott & Sons Co O M | Automatic packaging machine |
US3232247A (en) * | 1963-04-29 | 1966-02-01 | Metal Stamping Co Of Greenvill | Oven assembly |
US4546404A (en) * | 1983-05-23 | 1985-10-08 | Daymarc Corporation | Storage unit for an integrated circuit tester |
KR940011743B1 (ko) * | 1991-05-13 | 1994-12-23 | 금성일렉트론주식회사 | 반도체 소자 예열장치 |
US5711458A (en) * | 1996-01-22 | 1998-01-27 | Fluid Management, Inc. | Paint dispensing apparatus |
JPH11231018A (ja) * | 1998-02-17 | 1999-08-27 | Hitachi Electron Eng Co Ltd | Icデバイス試験用恒温装置 |
JP2004045057A (ja) * | 2002-07-09 | 2004-02-12 | Graphtec Corp | 電子部品試験装置 |
CN1265261C (zh) * | 2004-12-17 | 2006-07-19 | 马敬浩 | 双模式调温电脑机箱 |
-
2007
- 2007-10-05 DE DE102007047772A patent/DE102007047772B4/de not_active Expired - Fee Related
-
2008
- 2008-09-25 US US12/681,706 patent/US20100209864A1/en not_active Abandoned
- 2008-09-25 WO PCT/EP2008/008158 patent/WO2009046885A1/de active Application Filing
- 2008-09-25 JP JP2010527356A patent/JP5238031B2/ja active Active
- 2008-09-25 MY MYPI20101170 patent/MY151351A/en unknown
- 2008-09-25 KR KR1020107006283A patent/KR101259672B1/ko active IP Right Grant
- 2008-09-25 CN CN2008801100160A patent/CN101815952B/zh not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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DE1285952B (de) * | 1967-10-10 | 1968-12-19 | Mengele & Soehne Masch Karl | Regal-, Schrank- oder sonstige Umlauffoerdervorrichtungen |
US4692694A (en) * | 1983-11-28 | 1987-09-08 | Tsubakimoto Chain Company | Load testing apparatus for electronic components |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102011078707A1 (de) * | 2011-07-05 | 2013-01-10 | Dürr Systems GmbH | Fördervorrichtung |
US9284127B2 (en) | 2011-07-05 | 2016-03-15 | Dürr Systems GmbH | Conveyors having a rotatable transfer section |
Also Published As
Publication number | Publication date |
---|---|
DE102007047772A1 (de) | 2009-04-23 |
JP2010540945A (ja) | 2010-12-24 |
DE102007047772B4 (de) | 2011-07-21 |
CN101815952B (zh) | 2013-03-27 |
JP5238031B2 (ja) | 2013-07-17 |
MY151351A (en) | 2014-05-15 |
KR101259672B1 (ko) | 2013-05-02 |
US20100209864A1 (en) | 2010-08-19 |
KR20100055506A (ko) | 2010-05-26 |
CN101815952A (zh) | 2010-08-25 |
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