WO2008132845A1 - 非破壊識別方法及び非破壊識別装置 - Google Patents

非破壊識別方法及び非破壊識別装置 Download PDF

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Publication number
WO2008132845A1
WO2008132845A1 PCT/JP2008/001071 JP2008001071W WO2008132845A1 WO 2008132845 A1 WO2008132845 A1 WO 2008132845A1 JP 2008001071 W JP2008001071 W JP 2008001071W WO 2008132845 A1 WO2008132845 A1 WO 2008132845A1
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WO
WIPO (PCT)
Prior art keywords
image
energy
nondestructive identification
reference sample
processing device
Prior art date
Application number
PCT/JP2008/001071
Other languages
English (en)
French (fr)
Inventor
Masayo Kato
Koichi Nittoh
Hitoshi Sakai
Chikara Konagai
Katsumi Hosaka
Original Assignee
Kabushiki Kaisha Toshiba
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushiki Kaisha Toshiba filed Critical Kabushiki Kaisha Toshiba
Priority to US12/597,072 priority Critical patent/US8363781B2/en
Priority to EP08751596.1A priority patent/EP2149788A4/en
Publication of WO2008132845A1 publication Critical patent/WO2008132845A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/626—Specific applications or type of materials radioactive material

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

　非破壊識別装置は、既知の材質からなる標準試料５及び被検体３にＸ線２を放射する線源１と、これらを透過した放射線を検出するセンサ４と、センサ４の信号を画像に変換する信号処理装置７と、得られた画像における標準試料５部分の輝度値或いは輝度値と標準試料５の厚みの関係が、線源１のエネルギーを第１のエネルギーとした場合の第１の画像と、第２のエネルギーとした場合の第２の画像とにおいて同じになるように当該第２の画像全体に調整を施し、調整を施した第２の画像と第１の画像との差分或いは比を取る演算処理を行う画像演算処理装置８と、画像を表示する表示装置９とを具備している。
PCT/JP2008/001071 2007-04-23 2008-04-23 非破壊識別方法及び非破壊識別装置 WO2008132845A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/597,072 US8363781B2 (en) 2007-04-23 2008-04-23 Nondestructive identification method and nondestructive identification device
EP08751596.1A EP2149788A4 (en) 2007-04-23 2008-04-23 Non-descriptive identification method and non-descriptive identification device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007113169A JP2008268076A (ja) 2007-04-23 2007-04-23 非破壊識別方法及び非破壊識別装置
JP2007-113169 2007-04-23

Publications (1)

Publication Number Publication Date
WO2008132845A1 true WO2008132845A1 (ja) 2008-11-06

Family

ID=39925316

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001071 WO2008132845A1 (ja) 2007-04-23 2008-04-23 非破壊識別方法及び非破壊識別装置

Country Status (4)

Country Link
US (1) US8363781B2 (ja)
EP (1) EP2149788A4 (ja)
JP (1) JP2008268076A (ja)
WO (1) WO2008132845A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2401964A1 (en) * 2009-02-26 2012-01-04 National University Corporation Hokkaido University Target tracking device and radiation therapy apparatus
US20120269320A1 (en) * 2009-10-16 2012-10-25 University Of Technology, Sydney Waste receptacle
CN107561098A (zh) * 2017-10-12 2018-01-09 中国科学院上海应用物理研究所 一种用于软x射线近边吸收谱测量的原位标样系统

Families Citing this family (14)

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JP2010203863A (ja) * 2009-03-02 2010-09-16 Toshiba Corp 放射性廃棄物検査方法及び放射性廃棄物検査装置
JP5404143B2 (ja) * 2009-04-07 2014-01-29 株式会社東芝 密閉容器の非破壊検査方法及び非破壊検査装置
GB201102614D0 (en) * 2011-02-15 2011-03-30 Oxford Instr Nanotechnology Tools Ltd Material identification using multiple images
KR101287548B1 (ko) 2011-10-10 2013-07-18 포항공과대학교 산학협력단 Ｘ-선 방사선 촬영법을 이용한 유체 부피 측정법
US9378522B2 (en) 2013-02-26 2016-06-28 W.W. Grainger, Inc. Methods and systems for the nonintrusive identification and ordering of component parts
WO2014136194A1 (ja) 2013-03-04 2014-09-12 東京エレクトロン株式会社 Ｘ線非破壊検査装置
JP6399967B2 (ja) * 2014-09-17 2018-10-03 三菱電機株式会社 樹脂片の選別方法及び樹脂片の選別装置
JP6359474B2 (ja) * 2015-03-10 2018-07-18 株式会社東芝 放射線を用いたろう付け接合長さの定量評価のための装置および方法
GB2544118B (en) * 2015-11-09 2020-12-09 Res & Innovation Uk Inspection of nuclear waste
JP6764709B2 (ja) * 2016-06-30 2020-10-07 株式会社日立製作所 Ｘ線自動判定装置、ｘ線自動判定方法
CN109254312B (zh) * 2018-10-31 2020-12-22 中南大学 一种基于伽玛能谱测量铅污染的快速检测方法
JP7360841B2 (ja) * 2019-08-09 2023-10-13 株式会社日立ソリューションズ Ｘ線画像処理システムおよびその方法、そのプログラム
CN111832433B (zh) * 2020-06-24 2023-12-29 奇点微(上海)光电科技有限公司 一种由图像提取物体特性的装置及其工作方法
CN113804708A (zh) * 2021-08-28 2021-12-17 南昌大学 一种x射线屏蔽材料的屏蔽性能测试方法

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See also references of EP2149788A4

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2401964A1 (en) * 2009-02-26 2012-01-04 National University Corporation Hokkaido University Target tracking device and radiation therapy apparatus
EP2401964A4 (en) * 2009-02-26 2012-07-25 Univ Hokkaido Nat Univ Corp TARGET TRACKING DEVICE AND RADIATION THERAPY APPARATUS
US8761863B2 (en) 2009-02-26 2014-06-24 National University Corporation Hokkaido University Target tracking device and radiation therapy apparatus
US20120269320A1 (en) * 2009-10-16 2012-10-25 University Of Technology, Sydney Waste receptacle
CN107561098A (zh) * 2017-10-12 2018-01-09 中国科学院上海应用物理研究所 一种用于软x射线近边吸收谱测量的原位标样系统

Also Published As

Publication number Publication date
JP2008268076A (ja) 2008-11-06
EP2149788A1 (en) 2010-02-03
US20100119037A1 (en) 2010-05-13
EP2149788A4 (en) 2014-06-04
US8363781B2 (en) 2013-01-29

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