WO2008126540A1 - α型窒化ケイ素蛍光体及びその製造方法 - Google Patents
α型窒化ケイ素蛍光体及びその製造方法 Download PDFInfo
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- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/0883—Arsenides; Nitrides; Phosphides
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- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7715—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing cerium
- C09K11/77217—Silicon Nitrides or Silicon Oxynitrides
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- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7728—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing europium
- C09K11/77347—Silicon Nitrides or Silicon Oxynitrides
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- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7743—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing terbium
- C09K11/77497—Silicon Nitrides or Silicon Oxynitrides
Definitions
- the present invention relates to an ⁇ -type nitride nitride phosphor comprising an ⁇ -type nitride nitride powder that emits fluorescence and a method for producing the same.
- Sintered silicon nitride is a typical ceramic for structural materials, and its bearings are applied to automotive glow plugs.
- ⁇ -type nitride nitride powders with controlled particle morphology have been applied to fillers of various materials.
- High-purity ⁇ -type nitride nitride powder is also used as a raw material for phosphors of oxynitrides and nitrides.
- 3 6 3 5 5 4 discloses a yellow ⁇ -sialon phosphor.
- ⁇ Sialon is used as a yellow phosphor in conventional white light-emitting diodes.
- Y 3 A 15 O! 2 Since the phosphor has more red component than Ce 3 + (YAG), a warm white color can be obtained. Therefore, it is expected as a phosphor for future lighting applications. Disclosure of the invention
- nitride nitride As described above, a method of synthesizing phosphor powder using nitride nitride as a raw material has been disclosed, but there has been no successful example of using nitride nitride as a phosphor. As described above, the nitride nitride is widely used in various fields, and further application development can be expected by adding a fluorescence function. For example, it is thought that a new application comes out when the nitride nitride used as a filler emits light.
- the present invention provides a new application of ⁇ -type nitride nitride, that is, ⁇ -type nitride nitride capable of emitting fluorescence.
- ⁇ -type nitride nitride has never been used as a phosphor. The reason is that it is impossible to put a practical amount of a light emitting element in the ⁇ -type nitride nitride crystal.
- the ⁇ sialon having an ⁇ -type nitride-type crystal structure has been confirmed to function as a phosphor. In such crystals, the ⁇ -type nitride nitride can be introduced so that a light-emitting element can be introduced into the crystal structure.
- An object of the present invention is to provide a practical new phosphor material made of model nitride nitride.
- the present inventors In order to obtain ⁇ -type nitride nitride having a fluorescence function, the present inventors originally produced ⁇ -type nitride nitride using a precursor of ⁇ -type nitride nitride added with a light emitting element. The inventors have found that ⁇ -type nitride nitride, which does not become a phosphor, becomes a phosphor, leading to the present invention.
- the present invention relates to an ⁇ -type silicon nitride phosphor containing an element capable of emitting fluorescence entirely from the surface to the inside of ⁇ -type nitride nitride particles.
- the entire element contains an element capable of emitting fluorescence, and the concentration of the element capable of emitting light
- the present invention relates to an ⁇ -type nitride nitride phosphor having a high portion in an island shape.
- the ⁇ -type nitride nitride phosphor is characterized in that the element capable of emitting fluorescence is a lanthanide metal. More preferably, the ⁇ -type nitride nitride is characterized in that the lanthanide metal is at least one lanthanide metal selected from Ce, Eu, Tb, Dy, and Yb. It relates to a phosphor.
- the present invention is capable of emitting fluorescence to silicon nitride (S i (NH) 2 ) or amorphous nitride powder obtained by thermal decomposition of silicon diimide (S i (NH) 2 ).
- the present invention relates to a method for producing the above-described diamond nitride phosphor, wherein powders of elements are added and mixed, and the mixture is fired in a non-oxidizing atmosphere.
- the present invention uses, as a raw material, amorphous zinc nitride powder obtained by thermal decomposition of silicon nitride (S i (NH) 2 ) or silicon nitride (S i (NH) 2 ). Provides a practical new phosphor material made of model nitrided nitride powder.
- FIG. 1 is an X-ray diffraction pattern of the silicon nitride powder obtained in Example 1 and Comparative Example 1.
- Fig. 2A is an electron micrograph of the diamond nitride phosphor of the present invention obtained in Example 1
- Fig. 2B is an ⁇ -type nitrogen nitride phosphor of the present invention obtained in Comparative Example 1. It is an electron micrograph of a body.
- Fig. 3 ⁇ is a fluorescence spectrum diagram of the nitride nitride powder obtained in Example 1 and Comparative Example 1.
- Fig. 3B is a diagram of the nitride nitride powder obtained in Example 1 and Comparative Example 1. It is an excitation spectrum diagram.
- FIG. 4 is an X-ray diffraction pattern of the silicon nitride powder obtained in Example 2 and Comparative Example 2.
- FIG. 5 is a fluorescence spectrum diagram of the silicon nitride powder obtained in Example 2 and Comparative Example 2.
- FIG. 6 is a graph showing the fluorescence characteristics of the Eu-added ⁇ -type nitride nitride phosphors obtained in Examples 3-8.
- FIG. 7 is a graph showing the fluorescence characteristics of the Ce-added ⁇ -type nitride nitride phosphors obtained in Examples 9 to 13.
- FIG. 8 is a fluorescence spectrum diagram of the silicon nitride powder obtained in Example 14 and Comparative Example 3.
- FIG. 9 is a fluorescence spectrum diagram of the silicon nitride powder obtained in Example 15 and Comparative Example 4.
- FIG. 10 is a fluorescence spectrum diagram of the silicon nitride powder obtained in Example 16 and Comparative Example 5.
- the ⁇ -type nitride nitride phosphor having a fluorescence function of the present invention contains an element capable of emitting fluorescence in the entire particle from the inside to the inside of the a-type nitride nitride particle.
- an element capable of emitting fluorescence in the entire particle from the inside to the inside of the a-type nitride nitride particle Conventionally, it has not been possible to put a practical amount of a light emitting element in ⁇ -type silicon nitride crystals, so even if there is an element that emits fluorescence on the surface of the particle, it will fluoresce deep inside the particle.
- the ⁇ -type nitride nitride of the present invention is characterized by containing an element capable of emitting fluorescence in the entire particle from the surface to the inside.
- a portion having a high concentration of light-emitting element (for example, reference numerals 1 to 3) is provided. Exists in an island shape.
- Lanthanide metal is preferable as the element capable of emitting fluorescence. . Furthermore, the lanthanide metal is preferably at least one lanthanide metal selected from Ce, Eu, Tb, Dy, and Yb.
- Example 1 in FIG. 1 is an X-ray diffraction pattern of an example of a diamond nitride nitride phosphor using Eu as the lanthanide metal of the present invention. This diffraction pattern shows that the powder of the present invention is ⁇ -type nitride nitride.
- the oxygen content is preferably 2% by weight or more and 3% by weight or less. If it is 2% by weight or less, the light emission intensity is low, and if it is 3% by weight or more, the light emission intensity is reduced.
- the graph of Example 1 in FIG. 3 shows the fluorescence spectrum (excitation wavelength: 3565 nm) of the powder of the present invention. Strong fluorescence with a peak wavelength of 560 nm is observed, and it can be seen that the obtained Q! -Type nitride nitride is a good phosphor. Furthermore, the graph of Example 1 in FIG. 3B shows the excitation spectrum (fluorescence wavelength 560 nm) of the powder of the present invention. Excitation peaks are observed around 300 nm and 400 nm.
- the ⁇ -type nitride nitride phosphor of the present invention is produced using a precursor of nitride nitride. More specifically, it is obtained by adding and mixing a powder made of an element capable of emitting fluorescence to a precursor of nitride nitride, and firing the mixture in a non-oxidizing atmosphere.
- precursors of silicon nitride include silicon nitride (S i (NH) 2 ) or amorphous nitride powder obtained by thermal decomposition of silicon nitride (S i (NH) 2 ). It is done.
- ⁇ -type nitride precursor examples include lanthanide metals such as Ce, Eu, Tb, Dy, and Yb.
- a nitrogen atmosphere may be used as the non-oxidizing atmosphere.
- Comparative Example 1 in FIG. 1 is an X-ray pattern of the obtained comparative powder. From the results of X-ray diffraction, it can be seen that this comparative soot powder contains ⁇ -type nitride nitride and jS-type nitride nitride.
- the main crystal phase is the same as that of the ⁇ -type silicon nitride of the present invention, but its fluorescence characteristics are greatly different.
- the graph of Comparative Example 1 in Fig. 3 is the fluorescence spectrum of the comparative powder.
- This comparative powder ⁇ -type nitride nitride hardly emits fluorescence.
- the light-emitting element penetrates into the ⁇ -type nitride nitride by a diffusion reaction in a region very close to the surface, and it is considered that light is emitted. In that case, the emission intensity is very small because only the surface of the particle emits light.
- the ⁇ -type nitride nitride containing the light-emitting element of the present invention is characterized by the fact that the light-emitting element is dispersed throughout from the surface of the particle to the inside by a unique manufacturing method. it can. Compared with Example 1, the fluorescence intensity of Comparative Example 1 is judged to emit little light.
- nitride nitride when using a precursor of nitride nitride, it is possible to obtain a crystalline ⁇ -type silicon nitride that emits sufficiently bright fluorescence, in which the light-emitting elements are dispersed throughout the surface from the inside of the particle.
- ⁇ -type nitride when crystallized silicon nitride is used as a starting material, ⁇ -type nitride that emits fluorescence cannot be obtained. The reason for this is that when a light emitting element is present in the precursor of ⁇ -type nitride nitride, ⁇ -type nitride nitride is formed while incorporating the light emitting element when the precursor is crystallized.
- the nitride nitride raw material is used, the light emitting element does not enter the crystal, and the ⁇ -type nitride nitride does not contain the light emitting element.
- rare earth elements such as Eu would not enter into ⁇ -type nitride nitride, but the crystal structure of ⁇ -type nitride nitride has sites where large ions can easily enter.
- the precursor crystallizes it is speculated that such ions can be incorporated. And, it is considered that the charge neutrality is compensated for by defects or oxygen substitution of nitrogen.
- the precursor of the nitride nitride used in the present invention can be obtained, for example, by reacting tetrachlorosilane with ammonia. In this case, you will get a silicon imide. It is also possible to thermally decompose the imide and use it as an amorphous nitride nitride. It is also possible to use a mixture of silicon nitride and amorphous nitride. The mixing ratio of silicon nitride and amorphous nitride can be freely changed depending on the thermal decomposition temperature when the silicon nitride is heated to produce amorphous nitride.
- Amorphous silicon nitride powder is a There is no folding peak and it is in the so-called amorphous state. Depending on the heat treatment conditions, a powder exhibiting a weak X-ray diffraction peak can also be obtained. Such a powder is also included in the amorphous nitride powder referred to in the present invention.
- the amorphous silicon nitride powder may contain a nitrogen-containing silane compound having an oxygen content adjusted to 1 to 5% by mass.
- the element capable of emitting fluorescence may be any known luminescent element, but rare earth elements are suitable because they can emit strong fluorescence. Among these, divalent Eu and trivalent Ce are preferable because they emit light by the df transition and thus provide strong fluorescence. They can be added in the form of oxides, carbonates, nitrides, chlorides, nitrates, etc. containing these elements. The amount of addition can be in the range of 0.1 to 0.6 mol, preferably in the range of 0.05 to 0.2 mol in terms of metal component, with respect to 1 mol of nitride nitride. If there are few luminescent elements, the luminescence intensity will be low and the phosphor will not be practical. On the other hand, if the amount is too large, the emission intensity decreases.
- the method of mixing the silicon nitride precursor and the light-emitting element there are no particular restrictions.
- a dry mixing method a wet method in an inert solvent that does not substantially react with the raw materials.
- a method of removing the solvent after mixing can be employed.
- the mixing device a V-type mixer, a rocking mixer, a ball mill, a vibration mill, a medium stirring mill, and the like are preferably used.
- the nitrogen-containing silane compound and / or amorphous silicon nitride powder are extremely sensitive to moisture and moisture, the starting materials should be mixed in a controlled inert gas atmosphere. is necessary.
- the mixture of starting materials is calcined at 1300 to 1800, preferably 1400 to 1650 in an atmosphere of nitrogen-containing inert gas at 1 atm,
- the desired ⁇ -type nitride nitride powder is obtained.
- the firing temperature is lower than 1300 X: it takes a long time to produce the desired ⁇ -type silicon nitride powder, which is not practical. If the firing temperature exceeds 1800, an undesirable situation occurs in which the nitrided silicon undergoes sublimation decomposition and free silicon is produced.
- the starting raw material mixed powder can be fired in a temperature range of 16 00 to 20 00, preferably 16 00 to 19 00, under a pressurized nitrogen gas atmosphere.
- the nitrogen gas pressurization suppresses the sublimation decomposition of the silicon nitride at a high temperature, and a desired ⁇ .
- Type nitride nitride phosphor can be obtained in a short time.
- the firing temperature can be increased by increasing the nitrogen gas pressure. For example, the pressure is 1600 to 1850 when the nitrogen gas pressure is 5 atm, and 1600 when the nitrogen gas pressure is 10 atm. It can be fired at ⁇ 200.
- the heating furnace used for firing the powder mixture such as a batch-type electric furnace, high-pressure induction kiln, fluidized firing furnace, pusher-type electric furnace using a high-frequency induction heating method or a resistance heating method.
- a batch-type electric furnace high-pressure induction kiln
- fluidized firing furnace pusher-type electric furnace using a high-frequency induction heating method or a resistance heating method.
- a crucible a carbon crucible, a crucible, a nitride key crucible, or the like can be used.
- silicon nitride (S i (NH) 2 ) or amorphous silicon nitride powder obtained by thermally decomposing silicon diimide (S i (NH) 2 ) is used as a raw material.
- Si (NH) 2 silicon nitride
- amorphous silicon nitride powder obtained by thermally decomposing silicon diimide (S i (NH) 2 ) is used as a raw material.
- Silica obtained by reacting tetrachlorosilane with ammonia was weighed to have the composition shown in Table 1.
- the weighed powder was mixed by a vibration mill for 1 hour in a nitrogen atmosphere.
- Fill the BN crucible with the mixed powder set in a high-frequency heating furnace, and in a nitrogen gas atmosphere, from room temperature to 1 2 0 0 for 1 hour, from 1 2 0 0 to 1 4 0 0 for 4 hours From 1400 to 1600, the mixture was heated with a heating schedule of 2 hours to obtain Eu-containing ⁇ -type silicon nitride powder.
- the speckled part was a part where there was a particularly large amount of Eu.
- many Eu existed in areas other than the speckled part.
- the diffraction pattern of Q! -Type silicon nitride was shown. This confirms that the EU is in the crystal of 0! Type silicon nitride.
- the amount of Eu in the glass phase part was larger than that in the interior of the particle, and it was found that Eu that could not be dissolved in the interior of the particle exists as a glass phase on the particle surface.
- the oxygen content of this powder was 2.5% by weight when measured with an oxygen-nitrogen simultaneous analyzer TC-1336 manufactured by LECO.
- the fluorescence spectrum was evaluated with a fluorescence measuring device at an excitation wavelength of 3 65 nm. The results are shown in Fig. 3A. An emission peak due to fluorescence was observed around 560 nm.
- Figure 3B shows the excitation spectrum when the fluorescence wavelength is 560 nm. Peak pattern that are considered light emission by E u 2 + were observed. This remarkable fluorescence is observed because Eu that emits fluorescence exists inside the particle and exists in a crystallographic size where the Eu can emit light.
- a powder was produced in the same manner as in Example 1 except that crystalline nitride nitride having a specific surface area of about 1 O m 2 / g was used in place of the amorphous silicon nitride used in Example 1.
- the crystal structure of the obtained powder was examined using an X-ray diffractometer in the same manner as in Example 1. The results are shown in Figure 1. (27.0, around 33.7 degrees) Weak peaks of type 3 nitride were observed, but all other peaks were ⁇ -type nitride nitride, and this powder was mostly ⁇ -type nitride nitride. It was hot.
- Example 1 a cross-sectional sample of this powder was made, and the transmission type The amount of Eu present inside the particles was investigated using an electron microscope. The form of the particles is shown in Fig. 2B. Unlike Example 1, the inside of the particles was uniform. As a result of the analysis, compared to Example 1, almost no Eu was present inside the particles. On the other hand, there is a lot of Eu in the glass phase adhering to the surface. In the case of the ⁇ -type nitride nitride of Comparative Example 1, Eu does not enter the inside of the particle, but only in the surface glass phase. It was a feature. When the oxygen content of this powder was measured in the same manner as in Example 1, it was 1.6% by weight.
- Example 2 the fluorescence spectrum was measured in the same manner as in Example 1. The results are shown in Fig. 3A. Although a peak is observed in the vicinity of 5600 nm, it is very low compared to the emission intensity of Example 1, and it can be seen that a crystalline phosphor is not a good phosphor when crystalline silicon nitride is used. This weak fluorescence is likely to be emitted because Eu is also present in the glass phase. However, since it is Eu emission in the glass phase, its emission intensity must be low. Another possibility is that Eu may enter the inside of the diamond nitride due to the diffusion reaction on the very surface. In this case, there is an ⁇ -type nitride nitride layer that can emit light on the surface.
- the light-emitting ⁇ -type nitride nitride of the present invention is characterized in that a light-emitting element exists entirely from the surface to the inside of the particle, and a particle such that a part of the surface emits light. Is essentially different. As shown in Fig. 3 ( b) , unlike the peak shape of Example 1, the excitation spectrum could not be determined as the emission of Eu 2 +.
- Example 1 cerium oxide was weighed so as to have the composition shown in Table 1, and powder was prepared in the same manner as in Example 1.
- the crystal phase was confirmed by X-ray, fluorescence spectrum, and excitation spectrum were measured.
- Fig. 4 shows the X-ray diffraction pattern.
- the crystal phase slightly contained ⁇ -type nitride nitride, but was mostly ⁇ -type nitride nitride, and the diffraction pattern was the same as in Comparative Example 1.
- Figure 5 shows the fluorescence spectrum when the excitation wavelength of this powder is 3 65 nm. A clear fluorescence with a peak at about 4 75 nm was observed.
- a powder was prepared in the same manner as in Example 2 except that the crystalline nitride nitride used in Comparative Example 1 was used in place of the amorphous nitride nitride used in Example 2, and X-rays were performed in the same manner as in Example 2. Diffraction and fluorescence spectra were measured. Fig. 4 shows the X-ray diffraction pattern. The crystal phase contained a slight amount of type nitride nitride, but was mostly ⁇ -type nitride nitride. Fig. 5 shows the fluorescent spectrum of this powder. The excitation wavelength was 3 65 nm. As a result of the measurement, almost no fluorescence was observed. When crystalline silicon nitride is used in this way, it is not possible to produce a powder that emits good fluorescence.
- the fluorescence spectrum was investigated by changing the amount of Eu added in Example 1 at the rate shown in Table 1.
- FIG. 6 shows the fluorescence intensity and its wavelength at an excitation wavelength of 36.5 nm, including Example 1.
- FIG. The maximum fluorescence intensity was exhibited when the addition amount of Eu was 0.1 mol, and the fluorescence intensity decreased when the addition amount was higher.
- concentration quenching occurs when the number of activation elements increases, but the same thing occurs in the powder of the present invention. This is also considered to be evidence that Eu exists inside ⁇ -type silicon nitride.
- the fluorescence wavelength shifted from 5 50 nm to 6 10 nm, shifting to the longer wavelength side along with the amount of Eu added.
- Such changes in fluorescence wavelength have also been observed in other phosphors including Eu, where Eu is ⁇ -type It is thought that it is dissolved in the inside of the nitride nitride.
- the oxygen content of the powder of No. 3 and the powders of Example 5 and Example 8 was measured in the same manner as in Example 1. It was.
- a powder was prepared in the same manner as in Example 3 except that Eu in Example 3 was replaced with Ce.
- the amount of Ce added is shown in Table 1.
- Figure 7 shows the amount of Ce added and the fluorescence intensity when the excitation wavelength is 3 65 nm. When the concentration of Ce was 0.15 mol, the maximum value was reached, and when the amount added was higher than that, the fluorescence intensity decreased.
- ytterbium oxide (Y b) was weighed so as to have the composition shown in Table 1, and powder was prepared by the same method as in Example 1, and the crystal phase was confirmed by X-ray. The fluorescence spectrum and the excitation spectrum were measured. As a result of X-ray measurement, most of the phases were ⁇ -type nitrogen nitride.
- Fig. 8 shows the fluorescence spectrum when the excitation wavelength of this powder is 25 4 nm. A clear fluorescence with a peak at about 555 nm was observed.
- a powder was prepared in the same manner as in Example 14 except that the crystalline nitride nitride used in Comparative Example 1 was used instead of the amorphous nitride nitride used in Example 14. Similarly, X-ray diffraction and fluorescence spectra were measured. The crystalline phase was mostly diamond nitride. Fig. 8 shows the fluorescence spectrum of this powder. The excitation wavelength was 2 5 4 nm. As a result of the measurement, almost no fluorescence was observed.
- T b Terbium oxide instead of europium oxide in Example 1
- the powder was prepared by the same method as in Example 1, and the confirmation of the crystal phase by X-rays, the fluorescence spectrum, and the excitation spectrum were measured.
- Figure 9 shows the fluorescence spectrum when the excitation wavelength of this powder was set at 2544 nm. Clear fluorescence with peaks at about 5 45, ⁇ 90 and 6 35 nm was observed.
- Example 15 Instead of the amorphous nitride nitride used in 5, a comparative example
- a powder was prepared in the same manner as in Example 15 except that the crystalline silicon nitride used in 1 was used, and X-ray diffraction and fluorescence spectrum were measured in the same manner as in Example 15. .
- the crystal phase was mostly ⁇ - type nitride nitride.
- Figure 9 shows the fluorescence spectrum of this powder.
- the excitation wavelength was 2 5 4 ⁇ m. As a result of the measurement, almost no fluorescence was observed.
- Dy dysprosium oxide
- Table 1 the composition shown in Table 1
- the powder was prepared by the same method as in Example 1, and the crystal phase was confirmed by X-ray.
- the fluorescence spectrum and the excitation spectrum were measured.
- most of the phases were type nitrogen nitride.
- Figure 10 shows the fluorescence spectrum when the excitation wavelength of this powder was set to 25 4 nm. A clear fluorescence with a peak at about 584 nm was observed.
- a powder was prepared in the same manner as in Example 16 except that the crystalline silicon nitride used in 1 was used, and X-ray diffraction and fluorescence spectrum were measured in the same manner as in Example 16 .
- the crystal phase was mostly ⁇ - type nitride nitride.
- the fluorescent spectrum of this powder is shown in Fig. 10. Excitation wavelength is 2 5 4 n m. As a result of the measurement, almost no fluorescence was observed.
- Example 2 silicon nitride prepared by the reaction of silicon tetrachloride and ammonia was weighed to the composition shown in Table 1, and the same method as in Example 1 was used. The crystal phase was confirmed by X-ray. As a result, most of the phases were ⁇ -type nitride nitride. When the fluorescence spectrum was measured when the excitation wavelength of this powder was 3 65 nm, the same intense fluorescence as in Example 1 was observed. Industrial applicability
- a practical new phosphor material made of ⁇ -type silicon nitride powder is provided.
- Cyanide nitride is widely used in various fields, and it can be expected to develop various applications by adding fluorescence function. For example, it is thought that a new application will come out when the nitride nitride used as a filler emits light.
- the industrial applicability of the phosphor material comprising the ⁇ -type silicon nitride powder of the present invention is clear.
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JP2009508984A JP5136547B2 (ja) | 2007-03-23 | 2008-03-04 | α型窒化ケイ素蛍光体及びその製造方法 |
EP08721667A EP2128220A4 (en) | 2007-03-23 | 2008-03-04 | ALPHA-LICIUM PHOSPHORATED NITRIDE AND METHOD FOR PRODUCING THE SAME |
US12/532,710 US8613869B2 (en) | 2007-03-23 | 2008-03-04 | α-type silicon nitride phosphor and production method thereof |
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KR101347594B1 (ko) * | 2011-10-26 | 2014-01-10 | 선문대학교 산학협력단 | 인광체용 질화규소 세라믹스, 이를 이용한 인광체 및 그 제조방법 |
CN104178144A (zh) * | 2013-05-24 | 2014-12-03 | 北京有色金属研究总院 | 一种具有类Si3N4结构荧光粉的制备方法及其所制成的荧光粉 |
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CN104178144A (zh) * | 2013-05-24 | 2014-12-03 | 北京有色金属研究总院 | 一种具有类Si3N4结构荧光粉的制备方法及其所制成的荧光粉 |
Also Published As
Publication number | Publication date |
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US20100108946A1 (en) | 2010-05-06 |
US8613869B2 (en) | 2013-12-24 |
EP2128220A4 (en) | 2010-12-08 |
JPWO2008126540A1 (ja) | 2010-07-22 |
JP5136547B2 (ja) | 2013-02-06 |
EP2128220A1 (en) | 2009-12-02 |
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