WO2008105322A1 - 光リフレクトメトリ測定方法および装置 - Google Patents

光リフレクトメトリ測定方法および装置 Download PDF

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Publication number
WO2008105322A1
WO2008105322A1 PCT/JP2008/052991 JP2008052991W WO2008105322A1 WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1 JP 2008052991 W JP2008052991 W JP 2008052991W WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1
Authority
WO
WIPO (PCT)
Prior art keywords
optical
measuring
refractometry
measuring method
optical refractometry
Prior art date
Application number
PCT/JP2008/052991
Other languages
English (en)
French (fr)
Inventor
Xinyu Fan
Fumihiko Ito
Yusuke Koshikiya
Original Assignee
Nippon Telegraph And Telephone Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph And Telephone Corporation filed Critical Nippon Telegraph And Telephone Corporation
Priority to EP08711774.3A priority Critical patent/EP2128588B1/en
Priority to CN2008800048107A priority patent/CN101611301B/zh
Priority to US12/525,287 priority patent/US8149419B2/en
Priority to JP2009501211A priority patent/JP4917640B2/ja
Publication of WO2008105322A1 publication Critical patent/WO2008105322A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Abstract

　本発明は、測定距離によらず高い精度を得ることの可能な光リフレクトメトリ測定方法および光リフレクトメトリ測定装置を提供することを目的とする。 　本発明は、光周波数領域リフレクトメトリ測定方法（ＯＦＤＲ）を用いて測定対象における後方散乱光強度の光伝搬方向に対する分布を測定する光リフレクトメトリ測定方法および光リフレクトメトリ測定装置において、周波数掃引光源１のコヒーレンス特性をモニタするコヒーレンスモニタ部１２を設け、そのモニタの結果に基づいて測定部１１における測定結果を補正することを特徴とする。
PCT/JP2008/052991 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置 WO2008105322A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08711774.3A EP2128588B1 (en) 2007-02-28 2008-02-21 Optical refractometry measuring method and device
CN2008800048107A CN101611301B (zh) 2007-02-28 2008-02-21 光反射测定方法以及装置
US12/525,287 US8149419B2 (en) 2007-02-28 2008-02-21 Optical reflectometry and optical reflectometer
JP2009501211A JP4917640B2 (ja) 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007050769 2007-02-28
JP2007-050769 2007-02-28
JP2007282319 2007-10-30
JP2007-282319 2007-10-30

Publications (1)

Publication Number Publication Date
WO2008105322A1 true WO2008105322A1 (ja) 2008-09-04

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/052991 WO2008105322A1 (ja) 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置

Country Status (5)

Country Link
US (1) US8149419B2 (ja)
EP (2) EP2339316B1 (ja)
JP (1) JP4917640B2 (ja)
CN (1) CN101611301B (ja)
WO (1) WO2008105322A1 (ja)

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JP2010185842A (ja) * 2009-02-13 2010-08-26 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び装置
JP2010271137A (ja) * 2009-05-20 2010-12-02 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び光周波数領域反射測定装置
WO2011039116A1 (de) * 2009-09-30 2011-04-07 Lios Technology Gmbh Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern
CN104038281A (zh) * 2014-06-20 2014-09-10 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
JP2016161512A (ja) * 2015-03-04 2016-09-05 日本電信電話株式会社 光ファイバ振動測定方法及びシステム
JP2019020143A (ja) * 2017-07-11 2019-02-07 日本電信電話株式会社 光ファイバ振動検知センサおよびその方法
JP2019020276A (ja) * 2017-07-18 2019-02-07 日本電信電話株式会社 空間多重光伝送路評価装置及び方法
JP2019052938A (ja) * 2017-09-14 2019-04-04 日本電信電話株式会社 光反射測定装置及びその方法
WO2021131315A1 (ja) 2019-12-25 2021-07-01 国立研究開発法人産業技術総合研究所 光学的測定装置及び測定方法
US11309404B2 (en) * 2018-07-05 2022-04-19 Applied Materials, Inc. Integrated CMOS source drain formation with advanced control
WO2023170821A1 (ja) * 2022-03-09 2023-09-14 日本電信電話株式会社 複数の光ファイバの損失を一括で測定する装置及び方法
TWI821319B (zh) * 2018-07-05 2023-11-11 美商應用材料股份有限公司 利用先進控制方式的整合cmos源極汲極形成

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EP2730947A1 (de) 2012-11-12 2014-05-14 Technische Universität Hamburg-Harburg Lidar-Messsystem und Lidar-Messverfahren
CN102997937B (zh) * 2012-12-12 2014-07-30 天津大学 一种可抑制光源相位噪声的光频域反射装置和解调方法
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JP6236369B2 (ja) * 2014-09-03 2017-11-22 日本電信電話株式会社 光ファイバの温度・歪み分布測定方法および装置
CN104296965A (zh) * 2014-09-20 2015-01-21 江苏骏龙电力科技股份有限公司 一种ofdr实验系统
US10250323B2 (en) * 2015-05-28 2019-04-02 Telefonaktiebolaget L M Ericsson (Publ) Device and method for monitoring optical fibre link
CN106556415A (zh) * 2015-09-28 2017-04-05 中兴通讯股份有限公司 激光器相位噪声消除装置、系统及方法
CN106705863B (zh) * 2017-01-16 2019-03-22 南京大学 一种提高光频域反射仪的最大测试距离的方法
JP6828227B2 (ja) * 2017-04-27 2021-02-10 アンリツ株式会社 光周波数領域反射測定装置及び光周波数領域反射測定方法
WO2019069633A1 (ja) * 2017-10-05 2019-04-11 コニカミノルタ株式会社 二次元フリッカ測定装置及び二次元フリッカ測定方法
WO2019145843A1 (en) 2018-01-23 2019-08-01 Amo Wavefront Sciences, Llc Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity
JP7069993B2 (ja) * 2018-04-09 2022-05-18 日本電信電話株式会社 光スペクトル線幅演算方法、装置およびプログラム
KR102196035B1 (ko) * 2018-12-26 2020-12-29 (주)미래컴퍼니 펄스 위상 이동을 이용한 3차원 거리측정 카메라의 비선형 거리 오차 보정 방법
JP7331373B2 (ja) * 2019-02-12 2023-08-23 日本電信電話株式会社 光周波数反射計測装置およびその計測方法
CN110579177B (zh) * 2019-07-30 2021-04-27 天津大学 基于相对相位变化的光频域反射分布式传感解调方法
CN110749419B (zh) * 2019-09-12 2021-04-13 芯华创(武汉)光电科技有限公司 一种ofdr检测方法
US11942986B2 (en) * 2021-09-24 2024-03-26 Viavi Solutions Inc. Optical time-domain reflectometer (OTDR) including channel checker
CN116659394B (zh) * 2023-06-07 2024-03-01 哈尔滨工业大学 一种基于延时重采样的扫频干涉测量非线性同步误差校正方法

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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185842A (ja) * 2009-02-13 2010-08-26 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び装置
JP2010271137A (ja) * 2009-05-20 2010-12-02 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び光周波数領域反射測定装置
WO2011039116A1 (de) * 2009-09-30 2011-04-07 Lios Technology Gmbh Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern
CN104038281A (zh) * 2014-06-20 2014-09-10 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
CN104038281B (zh) * 2014-06-20 2017-07-11 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
JP2016161512A (ja) * 2015-03-04 2016-09-05 日本電信電話株式会社 光ファイバ振動測定方法及びシステム
JP2019020143A (ja) * 2017-07-11 2019-02-07 日本電信電話株式会社 光ファイバ振動検知センサおよびその方法
JP2019020276A (ja) * 2017-07-18 2019-02-07 日本電信電話株式会社 空間多重光伝送路評価装置及び方法
JP2019052938A (ja) * 2017-09-14 2019-04-04 日本電信電話株式会社 光反射測定装置及びその方法
US11309404B2 (en) * 2018-07-05 2022-04-19 Applied Materials, Inc. Integrated CMOS source drain formation with advanced control
TWI821319B (zh) * 2018-07-05 2023-11-11 美商應用材料股份有限公司 利用先進控制方式的整合cmos源極汲極形成
WO2021131315A1 (ja) 2019-12-25 2021-07-01 国立研究開発法人産業技術総合研究所 光学的測定装置及び測定方法
WO2023170821A1 (ja) * 2022-03-09 2023-09-14 日本電信電話株式会社 複数の光ファイバの損失を一括で測定する装置及び方法

Also Published As

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EP2128588A4 (en) 2010-09-15
US8149419B2 (en) 2012-04-03
CN101611301B (zh) 2012-11-07
EP2339316B1 (en) 2012-07-25
JPWO2008105322A1 (ja) 2010-06-03
EP2128588A1 (en) 2009-12-02
US20100097615A1 (en) 2010-04-22
JP4917640B2 (ja) 2012-04-18
EP2128588B1 (en) 2013-04-10
CN101611301A (zh) 2009-12-23
EP2339316A1 (en) 2011-06-29

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