WO2008105322A1 - 光リフレクトメトリ測定方法および装置 - Google Patents
光リフレクトメトリ測定方法および装置 Download PDFInfo
- Publication number
- WO2008105322A1 WO2008105322A1 PCT/JP2008/052991 JP2008052991W WO2008105322A1 WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1 JP 2008052991 W JP2008052991 W JP 2008052991W WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1
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- WO
- WIPO (PCT)
- Prior art keywords
- optical
- measuring
- refractometry
- measuring method
- optical refractometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008800048107A CN101611301B (zh) | 2007-02-28 | 2008-02-21 | 光反射测定方法以及装置 |
EP08711774.3A EP2128588B1 (en) | 2007-02-28 | 2008-02-21 | Optical refractometry measuring method and device |
US12/525,287 US8149419B2 (en) | 2007-02-28 | 2008-02-21 | Optical reflectometry and optical reflectometer |
JP2009501211A JP4917640B2 (ja) | 2007-02-28 | 2008-02-21 | 光リフレクトメトリ測定方法および装置 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007050769 | 2007-02-28 | ||
JP2007-050769 | 2007-02-28 | ||
JP2007-282319 | 2007-10-30 | ||
JP2007282319 | 2007-10-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008105322A1 true WO2008105322A1 (ja) | 2008-09-04 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/052991 WO2008105322A1 (ja) | 2007-02-28 | 2008-02-21 | 光リフレクトメトリ測定方法および装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8149419B2 (ja) |
EP (2) | EP2339316B1 (ja) |
JP (1) | JP4917640B2 (ja) |
CN (1) | CN101611301B (ja) |
WO (1) | WO2008105322A1 (ja) |
Cited By (12)
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JP2010271137A (ja) * | 2009-05-20 | 2010-12-02 | Nippon Telegr & Teleph Corp <Ntt> | 光周波数領域反射測定方法及び光周波数領域反射測定装置 |
WO2011039116A1 (de) * | 2009-09-30 | 2011-04-07 | Lios Technology Gmbh | Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern |
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JP2016161512A (ja) * | 2015-03-04 | 2016-09-05 | 日本電信電話株式会社 | 光ファイバ振動測定方法及びシステム |
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JP2019052938A (ja) * | 2017-09-14 | 2019-04-04 | 日本電信電話株式会社 | 光反射測定装置及びその方法 |
WO2021131315A1 (ja) | 2019-12-25 | 2021-07-01 | 国立研究開発法人産業技術総合研究所 | 光学的測定装置及び測定方法 |
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WO2023170821A1 (ja) * | 2022-03-09 | 2023-09-14 | 日本電信電話株式会社 | 複数の光ファイバの損失を一括で測定する装置及び方法 |
TWI821319B (zh) * | 2018-07-05 | 2023-11-11 | 美商應用材料股份有限公司 | 利用先進控制方式的整合cmos源極汲極形成 |
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2008
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- 2008-02-21 WO PCT/JP2008/052991 patent/WO2008105322A1/ja active Application Filing
- 2008-02-21 EP EP08711774.3A patent/EP2128588B1/en active Active
- 2008-02-21 US US12/525,287 patent/US8149419B2/en active Active
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Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185842A (ja) * | 2009-02-13 | 2010-08-26 | Nippon Telegr & Teleph Corp <Ntt> | 光周波数領域反射測定方法及び装置 |
JP2010271137A (ja) * | 2009-05-20 | 2010-12-02 | Nippon Telegr & Teleph Corp <Ntt> | 光周波数領域反射測定方法及び光周波数領域反射測定装置 |
WO2011039116A1 (de) * | 2009-09-30 | 2011-04-07 | Lios Technology Gmbh | Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern |
CN104038281A (zh) * | 2014-06-20 | 2014-09-10 | 天津大学 | 非线性相位估计的长距离高分辨率光频域反射解调方法 |
CN104038281B (zh) * | 2014-06-20 | 2017-07-11 | 天津大学 | 非线性相位估计的长距离高分辨率光频域反射解调方法 |
JP2016161512A (ja) * | 2015-03-04 | 2016-09-05 | 日本電信電話株式会社 | 光ファイバ振動測定方法及びシステム |
JP2019020143A (ja) * | 2017-07-11 | 2019-02-07 | 日本電信電話株式会社 | 光ファイバ振動検知センサおよびその方法 |
JP2019020276A (ja) * | 2017-07-18 | 2019-02-07 | 日本電信電話株式会社 | 空間多重光伝送路評価装置及び方法 |
JP2019052938A (ja) * | 2017-09-14 | 2019-04-04 | 日本電信電話株式会社 | 光反射測定装置及びその方法 |
US11309404B2 (en) * | 2018-07-05 | 2022-04-19 | Applied Materials, Inc. | Integrated CMOS source drain formation with advanced control |
TWI821319B (zh) * | 2018-07-05 | 2023-11-11 | 美商應用材料股份有限公司 | 利用先進控制方式的整合cmos源極汲極形成 |
WO2021131315A1 (ja) | 2019-12-25 | 2021-07-01 | 国立研究開発法人産業技術総合研究所 | 光学的測定装置及び測定方法 |
WO2023170821A1 (ja) * | 2022-03-09 | 2023-09-14 | 日本電信電話株式会社 | 複数の光ファイバの損失を一括で測定する装置及び方法 |
Also Published As
Publication number | Publication date |
---|---|
EP2128588A1 (en) | 2009-12-02 |
JPWO2008105322A1 (ja) | 2010-06-03 |
CN101611301B (zh) | 2012-11-07 |
JP4917640B2 (ja) | 2012-04-18 |
US8149419B2 (en) | 2012-04-03 |
EP2128588A4 (en) | 2010-09-15 |
EP2128588B1 (en) | 2013-04-10 |
CN101611301A (zh) | 2009-12-23 |
EP2339316A1 (en) | 2011-06-29 |
EP2339316B1 (en) | 2012-07-25 |
US20100097615A1 (en) | 2010-04-22 |
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