WO2008083658A3 - Verfahren und vorrichtung zur untersuchung eines gegenstandes - Google Patents

Verfahren und vorrichtung zur untersuchung eines gegenstandes Download PDF

Info

Publication number
WO2008083658A3
WO2008083658A3 PCT/DE2007/002316 DE2007002316W WO2008083658A3 WO 2008083658 A3 WO2008083658 A3 WO 2008083658A3 DE 2007002316 W DE2007002316 W DE 2007002316W WO 2008083658 A3 WO2008083658 A3 WO 2008083658A3
Authority
WO
WIPO (PCT)
Prior art keywords
examined
light sources
surface segment
housing
light
Prior art date
Application number
PCT/DE2007/002316
Other languages
English (en)
French (fr)
Other versions
WO2008083658A2 (de
Inventor
Wolfgang Weinhold
Original Assignee
Wolfgang Weinhold
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wolfgang Weinhold filed Critical Wolfgang Weinhold
Priority to EP07870190A priority Critical patent/EP2118641A2/de
Priority to CA2675028A priority patent/CA2675028C/en
Priority to JP2009545058A priority patent/JP5393479B2/ja
Priority to CN2007800495479A priority patent/CN101617213B/zh
Publication of WO2008083658A2 publication Critical patent/WO2008083658A2/de
Publication of WO2008083658A3 publication Critical patent/WO2008083658A3/de
Priority to US12/500,064 priority patent/US9322644B2/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Die Erfindung betrifft ein Verfahren und eine Vorrichtung (01, 17) zur Untersuchung eines Gegenstandes, insbesondere hinsichtlich dessen Oberflächengestalt, - mit einem transportablen Gehäuse (02), das über dem zu untersuchenden Oberflächensegment des Gegenstandes insbesondere von Hand positioniert werden kann, - mit zumindest drei Lichtquellen (06), die mit ihren optischen Strahlachsen (07) im schrägen Einfallswinkel relativ zum zu untersuchenden Oberflächensegment ausgerichtet sind, - wobei die Lichtquellen (07) innerhalb des Gehäuses angeordnet sind und das zu untersuchende Oberflächensegment durch eine Beleuchtungsöffnung (08) im Gehäuse (02) beleuchten können, - mit zumindest einem Lichtsensor (09) zur Erfassung des am zu untersuchenden Oberflächensegment reflektierten Lichts, - mit einer Steuer- und Auswerteeinheit, die mit den Lichtquellen (06) und dem Lichtsensor (09) verbunden ist. Die Lichtquellen (06) sind dabei derart angeordnet, dass ihre optischen Strahlachsen (07) in jeweils unterschiedlichen, nicht parallelen Bezugsebenen verlaufen.
PCT/DE2007/002316 2007-01-09 2007-12-28 Verfahren und vorrichtung zur untersuchung eines gegenstandes WO2008083658A2 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP07870190A EP2118641A2 (de) 2007-01-09 2007-12-28 Verfahren und vorrichtung zur untersuchung eines gegenstandes
CA2675028A CA2675028C (en) 2007-01-09 2007-12-28 Method and apparatus for the examination of an object
JP2009545058A JP5393479B2 (ja) 2007-01-09 2007-12-28 物体の検査方法及び検査装置
CN2007800495479A CN101617213B (zh) 2007-01-09 2007-12-28 用于物体检查的方法和设备
US12/500,064 US9322644B2 (en) 2007-01-09 2009-07-09 Method and apparatus for the examination of an object

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007002106.4 2007-01-09
DE102007002106A DE102007002106B3 (de) 2007-01-09 2007-01-09 Verfahren und Vorrichtung zur Untersuchung eines Gegenstandes

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/500,064 Continuation US9322644B2 (en) 2007-01-09 2009-07-09 Method and apparatus for the examination of an object

Publications (2)

Publication Number Publication Date
WO2008083658A2 WO2008083658A2 (de) 2008-07-17
WO2008083658A3 true WO2008083658A3 (de) 2008-09-18

Family

ID=39466044

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2007/002316 WO2008083658A2 (de) 2007-01-09 2007-12-28 Verfahren und vorrichtung zur untersuchung eines gegenstandes

Country Status (8)

Country Link
US (1) US9322644B2 (de)
EP (1) EP2118641A2 (de)
JP (1) JP5393479B2 (de)
KR (1) KR101582694B1 (de)
CN (1) CN101617213B (de)
CA (1) CA2675028C (de)
DE (1) DE102007002106B3 (de)
WO (1) WO2008083658A2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9245062B2 (en) * 2012-03-22 2016-01-26 Virtek Vision International Inc. Laser projection system using variable part alignment
KR101526495B1 (ko) * 2013-04-29 2015-06-05 주식회사 인포피아 바이오 센서의 식별정보 판독 장치
CN105143861A (zh) * 2013-05-14 2015-12-09 杭州慧缘泰医疗器械有限公司 免疫胶体金试板及生化参数光电检测仪定量检测crp的方法
DE102013213894B4 (de) * 2013-07-16 2018-07-05 Deutsches Zentrum für Luft- und Raumfahrt e.V. Effektor und Verfahren zum Prüfen von Werkstücken
JP6438703B2 (ja) * 2014-08-21 2018-12-19 バンドー化学株式会社 異物検査装置、異物検査システム及び異物検査方法
DE202014104531U1 (de) * 2014-09-23 2014-10-02 Leuze Electronic Gmbh + Co. Kg Sensor zur Erfassung von Objekten in einem Überwachungsbereich
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
US10488261B2 (en) * 2015-12-18 2019-11-26 Nix Sensor Ltd. Compact portable color sensor
CN108603812B (zh) * 2015-12-28 2024-07-30 倍耐力轮胎股份公司 用于检查轮胎的装置
CN105387806A (zh) * 2016-01-04 2016-03-09 东莞市三姆森光电科技有限公司 一种多曲面玻璃量测设备
KR102597197B1 (ko) * 2018-01-24 2023-11-01 사이버옵틱스 코포레이션 거울 표면을 위한 구조화 광의 투영
EP3584933A1 (de) * 2018-06-19 2019-12-25 FRONIUS INTERNATIONAL GmbH Optoelektronische bedieneinheit zur bedienung einer vorrichtung, insbesondere eines wechselrichters und wechselrichtergehäuse
CN109596056A (zh) * 2018-12-25 2019-04-09 深圳市联建光电有限公司 一种手持式无线感应校准装置
CN111692998B (zh) * 2020-06-11 2022-02-11 西格迈股份有限公司 一种活塞杆表面粗糙度检测系统
DE102021101155A1 (de) 2021-01-20 2022-07-21 Lippert Gmbh & Co. Kg Verfahren zur optischen Detektion von Fehlern in keramischen Artikeln
CN113884502A (zh) * 2021-12-07 2022-01-04 武汉华工激光工程有限责任公司 基于线阵相机的载板检测及激光标记系统和方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5612782A (en) * 1993-11-22 1997-03-18 Spectra-Physics Visiontech Oy Calibration method and calibration unit for calibrating a spectrometric device based upon two calibration samples
DE19716228A1 (de) * 1997-04-18 1998-10-22 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Überprüfung einer Oberfläche einer optischen Komponente
US5905570A (en) * 1997-09-18 1999-05-18 Department Of Water And Power City Of Los Angeles Remote electro-optical sensor system for water quality monitoring
US5963333A (en) * 1996-09-12 1999-10-05 Color Savvy Systems Limited Color sensor
US20010017698A1 (en) * 1996-02-05 2001-08-30 Thakur Randhir P.S. Reflectance method for evaluating the surface characteristics of opaque materials
WO2002090952A1 (de) * 2001-05-08 2002-11-14 Wolfgang Weinhold Verfahren und vorrichtung zur berührungsfreien untersuchung eines gegenstandes, insbesondere hinsichtlich dessen oberflächengestalt
WO2003010521A1 (en) * 2001-07-24 2003-02-06 The Board Of Regents For Oklahoma State University Optical spectral reflectance sensor and controller
WO2004051320A2 (en) * 2002-11-26 2004-06-17 Sensys Medical, Inc. Spectroscopic system and method using a ceramic optical reference
DE10319543A1 (de) * 2003-04-30 2004-11-18 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4029420A (en) * 1974-12-27 1977-06-14 Romilly John Simms Light reflectance instrument
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
JP3142852B2 (ja) * 1990-02-20 2001-03-07 株式会社日立製作所 表面欠陥検査装置
DE4123916C2 (de) * 1990-07-19 1998-04-09 Reinhard Malz Verfahren und Vorrichtung zum beleuchtungsdynamischen Erkennen und Klassifizieren von Oberflächenmerkmalen und -defekten eines Objektes
DE19716264C2 (de) * 1997-04-18 2002-07-25 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Überprüfung einer Oberfläche eines Gegenstands
JP3815903B2 (ja) * 1997-11-12 2006-08-30 花王株式会社 測色装置
JP3843636B2 (ja) * 1999-02-22 2006-11-08 富士ゼロックス株式会社 光量測定装置及びカラー画像形成装置
DE19962779B4 (de) * 1999-12-23 2009-06-25 Byk-Gardner Gmbh Vorrichtung zur quantifizierten Bestimmung der Qualität von Oberflächen
US7110901B2 (en) * 2000-11-10 2006-09-19 Arkray, Inc. Correction method for sensor output
JP4516220B2 (ja) * 2001-01-15 2010-08-04 富士機械製造株式会社 部品装着精度関連部分の相対位置関係取得方法および電気部品装着システム
US6633382B2 (en) * 2001-05-22 2003-10-14 Xerox Corporation Angular, azimuthal and displacement insensitive spectrophotometer for color printer color control systems
DE10149780B4 (de) * 2001-10-09 2019-09-05 Byk Gardner Gmbh Einrichtung zur Beleuchtung einer Messfläche und Vorrichtung und Verfahren zur Bestimmung der visuellen Eigenschaften von Körpern
WO2004008022A2 (en) * 2002-07-12 2004-01-22 Electro Scientific Industries, Inc. Method and apparatus for uniform lighting source
JP2004279119A (ja) * 2003-03-13 2004-10-07 Bio Media Co Ltd 測定装置
DE10336493A1 (de) * 2003-08-08 2005-03-03 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
JP3103990U (ja) * 2004-03-12 2004-08-26 コロナ電業株式会社 赤外線発光手段内臓カメラ
JP2005283199A (ja) * 2004-03-29 2005-10-13 A A N Corporation Kk センサーユニットおよび該センサーユニットを用いた印刷状態検査装置
DE102004034167A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften
JP4600763B2 (ja) * 2005-09-20 2010-12-15 横河電機株式会社 配向計
US7777897B1 (en) * 2007-08-03 2010-08-17 Ventek, Inc. Veneer roughness detection

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5612782A (en) * 1993-11-22 1997-03-18 Spectra-Physics Visiontech Oy Calibration method and calibration unit for calibrating a spectrometric device based upon two calibration samples
US20010017698A1 (en) * 1996-02-05 2001-08-30 Thakur Randhir P.S. Reflectance method for evaluating the surface characteristics of opaque materials
US5963333A (en) * 1996-09-12 1999-10-05 Color Savvy Systems Limited Color sensor
DE19716228A1 (de) * 1997-04-18 1998-10-22 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Überprüfung einer Oberfläche einer optischen Komponente
US5905570A (en) * 1997-09-18 1999-05-18 Department Of Water And Power City Of Los Angeles Remote electro-optical sensor system for water quality monitoring
WO2002090952A1 (de) * 2001-05-08 2002-11-14 Wolfgang Weinhold Verfahren und vorrichtung zur berührungsfreien untersuchung eines gegenstandes, insbesondere hinsichtlich dessen oberflächengestalt
WO2003010521A1 (en) * 2001-07-24 2003-02-06 The Board Of Regents For Oklahoma State University Optical spectral reflectance sensor and controller
WO2004051320A2 (en) * 2002-11-26 2004-06-17 Sensys Medical, Inc. Spectroscopic system and method using a ceramic optical reference
DE10319543A1 (de) * 2003-04-30 2004-11-18 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2118641A2 *

Also Published As

Publication number Publication date
WO2008083658A2 (de) 2008-07-17
CN101617213A (zh) 2009-12-30
DE102007002106B3 (de) 2008-07-03
CN101617213B (zh) 2012-12-19
EP2118641A2 (de) 2009-11-18
KR101582694B1 (ko) 2016-01-05
CA2675028C (en) 2016-10-18
US9322644B2 (en) 2016-04-26
US20100033715A1 (en) 2010-02-11
CA2675028A1 (en) 2008-07-17
KR20090102845A (ko) 2009-09-30
JP2010515889A (ja) 2010-05-13
JP5393479B2 (ja) 2014-01-22

Similar Documents

Publication Publication Date Title
WO2008083658A3 (de) Verfahren und vorrichtung zur untersuchung eines gegenstandes
WO2009049834A3 (en) Optical sensor device
EP2081015A3 (de) Vorrichtung zur Lebensmittelüberprüfung
WO2007131162A3 (en) Apparatus and method for angular colorimetry
EP1764034A3 (de) Implantierbarer selbstkalibrierender optischer Sensor
WO2009104871A3 (ko) 암시야 검사장치
EP2442095A3 (de) Lochprüfung
WO2006122640A3 (de) Automatisches belichtungssystem für ein berührungslos messendes automobilservicegerät
WO2009007977A3 (en) Method and apparatus for duv transmission mapping
WO2007112300A3 (en) Systems and methods for measuring one or more characteristics of patterned features on a specimen
WO2006120690A3 (en) Endoscopic measurement techniques
TW200712479A (en) Surface defect inspection apparatus and surface defect inspection method
GB0508927D0 (en) Arrangement for microscopic observation and/or detection and usage
WO2003027652A1 (fr) Dispositif d'inspection de defauts
WO2007090147A3 (en) Method and apparatus for measurement of optical properties in tissue
WO2007132378A3 (en) Imaging system for three-dimensional imaging of the interior of an object
WO2007112215A3 (en) Optical design of a measurement system having multiple sensor or multiple light source paths
DE502006004474D1 (de) Messvorrichtung
JP2010169496A5 (de)
TW200711019A (en) Test apparatus, imaging appatus and test method
TW200727882A (en) Illumination characteristic selection system for imaging during an ophthalmic laser procedure and associated methods
WO2007047123A3 (en) Shadow moire using non-zero talbot distance
TW200643367A (en) An apparatus and method for improving the measuring accuracy in the determination of structural data
EP2381245A3 (de) Bildinspektionsvorrichtung und Bilderzeugungsvorrichtung
TW200736593A (en) Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200780049547.9

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 07870190

Country of ref document: EP

Kind code of ref document: A2

WWE Wipo information: entry into national phase

Ref document number: 3947/CHENP/2009

Country of ref document: IN

ENP Entry into the national phase

Ref document number: 2009545058

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 2675028

Country of ref document: CA

WWE Wipo information: entry into national phase

Ref document number: 2007870190

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 1020097016593

Country of ref document: KR