WO2007090772A2 - Dispositif de commutation et dispositif de contrôle - Google Patents

Dispositif de commutation et dispositif de contrôle Download PDF

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Publication number
WO2007090772A2
WO2007090772A2 PCT/EP2007/050933 EP2007050933W WO2007090772A2 WO 2007090772 A2 WO2007090772 A2 WO 2007090772A2 EP 2007050933 W EP2007050933 W EP 2007050933W WO 2007090772 A2 WO2007090772 A2 WO 2007090772A2
Authority
WO
WIPO (PCT)
Prior art keywords
conductors
test
conductor
column
row
Prior art date
Application number
PCT/EP2007/050933
Other languages
German (de)
English (en)
Other versions
WO2007090772A3 (fr
Inventor
Erwin Hetzenecker
Gerhard Wild
Original Assignee
Continental Automotive Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Continental Automotive Gmbh filed Critical Continental Automotive Gmbh
Publication of WO2007090772A2 publication Critical patent/WO2007090772A2/fr
Publication of WO2007090772A3 publication Critical patent/WO2007090772A3/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60R—VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
    • B60R21/00—Arrangements or fittings on vehicles for protecting or preventing injuries to occupants or pedestrians in case of accidents or other traffic risks
    • B60R21/01—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents
    • B60R21/015—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents including means for detecting the presence or position of passengers, passenger seats or child seats, and the related safety parameters therefor, e.g. speed or timing of airbag inflation in relation to occupant position or seat belt use
    • B60R21/01512—Passenger detection systems
    • B60R21/0153—Passenger detection systems using field detection presence sensors
    • B60R21/01532—Passenger detection systems using field detection presence sensors using electric or capacitive field sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60R—VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
    • B60R21/00—Arrangements or fittings on vehicles for protecting or preventing injuries to occupants or pedestrians in case of accidents or other traffic risks
    • B60R21/01—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents
    • B60R2021/01122—Prevention of malfunction
    • B60R2021/01184—Fault detection or diagnostic circuits

Definitions

  • the invention relates to a circuit arrangement and a test device for checking row conductors and / or column conductors, which form supply lines of electrically matrix-shaped circuit elements connected in rows and columns.
  • EP 0 895 091 A2 there is disclosed a method of monitoring the integrity of leads in an array of circuit elements which are connected in a matrix.
  • the arrangement of circuit elements forms an nx m matrix with n row conductors and m column conductors. Each row conductor has a free end and a connection end.
  • An additional column conductors will each have a resistance ⁇ element connected to the free end of each of the n row conductors over.
  • the additional column conductor also has a free end and a connection end. ⁇ a counter reading value between the connection end of the additional Spal ⁇ tenleiters and the connection end of the respective Zeilenlei ⁇ ters is measured.
  • an additional row conductor which also has a free end and a connection end and which is connected to the free end of each of the n column conductors via a respective resistance element.
  • a resistance value between the connection end of the additional row conductor and the connection end of the column conductor jewei ⁇ time is measured.
  • the object of the invention is to provide a circuit arrangement and a test device which is simple.
  • the object is solved by the features of the independent claims.
  • Advantageous developments of the invention are characterized in the subclaims.
  • the invention features, a circuit arrangement for checking at least three row conductors and / or tern of at least three Spaltenlei ⁇ form the leads of electrically interconnected in matrix form in rows and columns circuit elements. At least two line test conductors and / or two column test conductors are provided. Each of the at least three row conductors and the column conductors is at least three each egg ⁇ nem associated with the at least two or at least two Zeilenprüfleiter Spaltenprüfleiter. Each of the at least two Zeilenprüfleiter and / or the at least two Spaltenprüflei ⁇ is assigned at least one row conductor and at least one column conductor ter.
  • At least one of the at least two row test conductors and the at least two column test conductors are assigned at least two row conductors or at least two column conductors.
  • the at least three row conductors or the at least three column conductors are each connected to a first end via a test element with the associated Zeilenprüfleiter or Spaltenprüfleiter. Further, the at least three lines or at least three conductors Spal ⁇ tenleiter and the at least two or at least two Zeilenprüfleiter Spaltenprüfleiter are each coupled to a second end to an evaluation unit.
  • the advantage is that not a separate test line is required for each lenleiter to be checked Zei ⁇ or column conductor. As a result, the circuit arrangement is simple and comes with a few additional test conductors. This agreement makes contact with the evaluation unit. Furthermore, the evaluation unit can be designed simply.
  • the provision of two or more line test conductors or column test conductors allows greater freedom of design with regard to a course of the supply lines and with respect to a placement of the test elements.
  • the provision of at least two line test conductors or at least two column test conductors makes it possible to carry out a further conductor between them. This is particularly advantageous if the row conductors and the column conductors are guided on mutually different planes without through-connection.
  • the invention is characterized by a circuit arrangement for checking at least one row conductor and at least one column conductor, which form supply lines of circuit elements electrically connected in an array in rows and columns.
  • the at least one row conductor and the at least one column conductor are each connected to a first end via a test element with a common test conductor.
  • the at least one row conductor and the at least one column conductor and the common ⁇ test leads are coupled to a second end to an evaluation unit.
  • the advantage is that the common test conductor allows a particularly simple contact of the evaluation and the evaluation can be particularly simple. Checking the supply lines can be done very easily, since in addition to the supply lines only the common test conductor must be controlled.
  • the invention is characterized by a test apparatus comprising a circuit arrangement and an evaluation unit.
  • the circuit arrangement comprises electrically matrix-shaped circuit elements interconnected in rows and columns by leads.
  • the scarf ⁇ tion arrangement further comprises at least two test conductors.
  • Each supply line is assigned to one of the at least two test conductors.
  • Each of the at least two test conductors is assigned at least one supply line.
  • the supply lines are each connected to a first end via a test element with the associated test conductor.
  • the leads are further formed as a row conductor or as a column conductor.
  • the at least two test conductors and the supply lines are each coupled to the evaluation unit with a second end.
  • In the off ⁇ evaluation unit at least two of the at least two test ⁇ conductors are connected to each other and form a common test conductor.
  • the at least two test conductors do not have to be connected in the circuit arrangement by a through-connection. Further, the provision of the at least two test conductor allows for greater design freedom bezüg ⁇ Lich a course of the leads or the Study Director or with respect to the placement of the test elements, without the complexity of the evaluation circuit that substantially increased. By providing the common test conductor, the evaluation unit may be particularly easily formed, since it must be driven at ⁇ addition to those leads only the common test conductor.
  • FIG. 1 shows a first embodiment of a testing device
  • FIG. 2 shows a second embodiment of the testing device
  • Figure 3 shows a third embodiment of the test apparatus
  • FIG. 4 shows a fourth embodiment of the test device.
  • a first embodiment of a test apparatus comprises a first embodiment of a circuit arrangement and a first embodiment of an evaluation unit AE (FIG. 1).
  • the circuitry includes circuit elements SE that are elekt ⁇ driven in matrix form in rows and columns connected to each other through leads. The leads are formed by row conductors and column conductors. Each circuit element is connected to a row conductor and a column conductor.
  • the circuit elements are for example sensors, eg pressure sensors.
  • the circuit arrangement is for example mat-shaped and is provided for example in a motor vehicle seat for detecting a seat occupancy. For example, it can be distinguished by a suitable evaluation of sensor signals of the pressure sensors, whether the motor vehicle seat is occupied by a person, a child seat or an object such as a bag.
  • the row conductors and the column conductors are arranged, for example, on different levels. This allows the Row conductors and the column conductors to be arranged crossing each other running without being electrically connected to each other.
  • the planes are each formed as a film on which the leads are formed.
  • the row conductors are formed by a first row conductor Z1, a second row conductor Z2, a third row conductor Z3 and a fourth row conductor Z4.
  • the column conductors are formed by a first column conductor Sl, a second column conductor S2, a third column conductor S3 and a fourth column conductor S4.
  • the row conductors and the column conductors each have a first end and a second end.
  • the first, second and third conductor lines Zl, Z2, Z3 are each ⁇ wells connected with its first end on a test element having a first PE Zeilenprüfleiter ZPL.
  • the fourth row conductor Z4 is connected at its first end via a test element PE to a second line test conductor ZP2.
  • the first, second and third column conductor Sl, S2, S3 each connected by its first end via a test element PE with egg ⁇ nem first Spaltenprüfleiter are SPl.
  • the fourth column conductor S4 is connected at its first end via a test element PE to a second column test conductor SP2.
  • the test elements PE are each designed, for example, as an ohmic resistor.
  • the ohmic resistance ⁇ preferably has a predetermined resistance value.
  • the test elements can also be designed, for example, in each case as a diode.
  • the first, second and third row conductors Z1, Z2, Z3 form a first subset of the row conductors.
  • the fourth Zeilenlei ⁇ ter Z4 forms a second subset of the row conductor.
  • decision Speaking form the first, second and third column conductor Sl, S2, S3 a first subset of the column conductors and the fourth column conductor S4 constituting a second subset of the Spal ⁇ tenleiter.
  • Each test conductor ie in each case the first line test conductor ZP1, the second line test conductor SP1 and the second column test conductor SP2, is assigned one of these mutually different subsets, ie each row conductor or each column conductor is only one of the row test conductors or column test conductors assigned and each Zeilenprüfleiter or Spaltenprüfleiter is assigned at least one row conductor or at least one column conductor.
  • at least one of the subsets of the row conductors or the subsets of the column conductors comprises at least two row conductors or column conductors.
  • the respective subsets preferably comprise a plurality of row conductors or column conductors.
  • One of the subsets of the row conductors is assigned to each of the first and the second row test conductors ZPL, ZP2.
  • the first and the second column test conductors SP1, SP2 are each assigned one of the subsets of the column conductors.
  • row conductors or column conductors It is also possible to provide more or fewer row conductors or column conductors. However, at least three row conductors and / or at least three column conductors are provided. Furthermore, at least two line test conductors and / or at least two column test conductors are provided.
  • the Spaltenlei ⁇ ter By its second end the row conductors, the Spaltenlei ⁇ ter, the Zeilenprüfleiter and Spaltenprüfleiter to the evaluation unit AE are coupled.
  • the at least two line test conductors and / or the at least two column test conductors By providing the at least two line test conductors and / or the at least two column test conductors, the design freedom with respect to a profile of the row conductors or the column conductors and with respect to an arrangement or placement of the test elements PE is improved. If the scarf ⁇ tion arrangement, for example, used for the seat occupancy ⁇ detection in the vehicle seat, then the circuit arrangement can be particularly well adapted to the respective seat geometry of the vehicle seat.
  • the first Zeilenprüfleiter ZPL associated inspection elements PE and the second Zeilenprüfleiter can ZP2 associated test element PE are arranged on different sides of the KraftGermansit ⁇ zes.
  • the circuit arrangement is possibly exposed to considerable mechanical loads. Due to the improved-shaping ⁇ freedom it is thus possible to place the test elements PE in areas of the motor vehicle seat, which are mechanically heavily loaded less. Accordingly, the leads and the row and / or column test conductors can be arranged so that they are exposed to the lowest possible mechanical loads. Thereby, a possible wear of the circuit arrangement can be reduced.
  • the Heidelbergsanord ⁇ tion can be operated permanently reliable.
  • Figure 2 shows a second embodiment of the circuit arrangement and the test apparatus, which substantially corresponds to the first embodiment.
  • the first row conductor Z1 and the second row conductor Z2 form the first subset of the row conductors associated with the first row test conductor ZPL.
  • the third row conductor Z3 and the fourth row conductor Z4 form the second subset of the row conductors associated with the second row test conductor ZP2.
  • the first column ter Sl and the second column conductor S2 the first subset of the column conductors, which is assigned to the first column test conductor SPl.
  • the third column conductor S3 and the fourth slot ⁇ th conductor S4 form the second subset of the column conductors, which is associated with the second column test conductor SP2.
  • the additional conductor L does not have to be part of the circuit arrangement.
  • the further conductor L is, for example, as a further At ⁇ line to one or more further elements formed which do not form part of the circuit arrangement Müs ⁇ sen.
  • a further element for example, a tem perature sensor ⁇ which detects a temperature in the motor vehicle seat, for example to be able to distinguish reliably between the subject of the seat occupancy of the vehicle seat by a person or by a Ge ⁇ .
  • the further element and the further conductor L can also be designed for a different purpose.
  • test conductor may be electrically coupled in a simple manner the further element or more ⁇ re additional elements to the evaluation unit AE or another unit by the provision of at least two Zeilenprüfleiter and / or the at least two columns, which leads the Row conductors or the column conductors of the circuit must cross.
  • the additional conductor L does not have to be arranged in an additional plane, but can be arranged in the same plane as the row conductors and the row test conductors or the column conductors and the column test conductors.
  • FIG. 3 shows a third embodiment of the circuit arrangement and the test apparatus.
  • all row conductors and all column conductors are assigned to a common test conductor P, ie the first, second, third and fourth row conductors Z1, Z2, Z3, Z4 are each connected to the common test conductor P via a test element PE and the first, second , Third and fourth column conductors Sl, S2, S3, S4 are each connected via a test element PE with the common test conductor P.
  • This makes it possible to check the row conductors and the column conductors over the common test conductor P.
  • the circuit arrangement requires a via, eg when the row conductors and the column conductors are arranged in different planes.
  • the evaluation unit AE For contacting the evaluation unit AE, only one additional connection for the common test conductor P is required in addition to connections for the row conductors and the column conductors. Characterized the contacting of the AE evaluation unit is particularly simple and the evaluation unit AE can be formed easily be ⁇ Sonders. In particular, an application specific integrated circuit ASIC may be particularly easily formed, the unit optionally in the evaluation ⁇ AE is provided. The application-specific integ ⁇ tured ASIC circuit must therefore, in addition to the connections for the row conductors and column conductors only provide a connection for the joint study director P.
  • FIG. 4 shows a fourth embodiment of the circuit arrangement and the test apparatus.
  • first, second, third and fourth row conductors Z1, Z2, Z3, Z4 are assigned to the first row test conductor ZPL and the first column test conductor SP1 is assigned the first, second, third and fourth column conductors S1, S2, S3, S4.
  • the evaluation unit AE must have only two terminals for the first row test conductor ZPl and the first column test conductor SP1.
  • the first line test conductor ZPl and the first column test conductor SP1 are electrically conductively connected to one another in the evaluation unit AE and thus form the common test conductor P.
  • the application-specific integrated circuit ASIC which may be provided in the evaluation unit AE, in addition to the connections for the row conductors and the column conductor requires only one more connection for the common test conductor P.
  • the application-specific integrated circuit ASIC can be designed to be particularly simple. Furthermore, no through-contacting is required in the circuit arrangement.
  • the first embodiment and the second embodiment may be combined with each other, ie, the other conductor L may also be provided in the first embodiment, for example.
  • the fourth embodiment can be combined with the first or the second embodiment, for example, by electrically connecting the first conductive Zeilenprüfleiters ZPL, the second Zeilenprüfleiters ZP2, the ERS ⁇ th Spaltenprüfleiters SPl and / or the second Spaltenprüfleiters SP2 to the common strigleiter P.
  • the application-specific integrated circuit ASIC may also be provided in the first or the second embodiment, or may form the evaluation unit AE.
  • at least one column conductor and at least one row conductor can be assigned to the same test conductor.
  • the measured resistance value differs, for example, a pre- ⁇ given amount or by a predetermined factor of the predetermined resistance value of each test element PE from, the corresponding row conductor or column conductor or the associated Zeilenprüfleiter or Spaltenprüfleiter optionally faulty.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

L'invention vise à contrôler au moins trois conducteurs de ligne et/ou au moins trois conducteurs de colonne formant des conduites d'éléments de commutation (SE) connectés électriquement sous forme de matrice en lignes et en colonnes. A cet effet, le dispositif de contrôle selon l'invention comporte au moins deux conducteurs de contrôle de ligne et/ou de colonne. Chaque conducteur de ligne ou de colonne est respectivement affecté à un des conducteurs de contrôle de ligne et/ou de colonne. Au moins un conducteur de ligne ou de colonne est affecté à chaque conducteur de contrôle de ligne et/ou de colonne. Au moins deux conducteurs de ligne ou de colonne sont affectés à au moins un conducteur de contrôle de ligne et/ou de colonne. Les conducteurs de ligne ou de colonne sont respectivement connectés avec une première extrémité au conducteur de contrôle de ligne et/ou de colonne au moyen d'un élément de contrôle (PE). Les conducteurs de ligne ou de colonne et les conducteurs de contrôle de ligne et/ou de colonne peuvent par ailleurs être connectés respectivement avec une deuxième extrémité à une unité d'évaluation (AE).
PCT/EP2007/050933 2006-02-03 2007-01-31 Dispositif de commutation et dispositif de contrôle WO2007090772A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006005051.7 2006-02-03
DE102006005051A DE102006005051A1 (de) 2006-02-03 2006-02-03 Schaltungsanordnung und Prüfvorrichtung

Publications (2)

Publication Number Publication Date
WO2007090772A2 true WO2007090772A2 (fr) 2007-08-16
WO2007090772A3 WO2007090772A3 (fr) 2007-09-20

Family

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Application Number Title Priority Date Filing Date
PCT/EP2007/050933 WO2007090772A2 (fr) 2006-02-03 2007-01-31 Dispositif de commutation et dispositif de contrôle

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WO (1) WO2007090772A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3059114A1 (fr) * 2016-11-23 2018-05-25 Continental Automotive France Procede de diagnostic d'une alimentation de polarisation pour un systeme d'acquisition comprenant un dispositif matriciel d'interface

Citations (6)

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Publication number Priority date Publication date Assignee Title
US4940934A (en) * 1987-10-15 1990-07-10 Matsushita Electric Industrial Co., Ltd. Method of electrically testing active matrix substrate
US5113134A (en) * 1991-02-28 1992-05-12 Thomson, S.A. Integrated test circuit for display devices such as LCD's
US5481499A (en) * 1992-07-17 1996-01-02 U.S. Philips Corporation Integrated matrix memory, comprising a circuit arrangement for testing the addressing
EP0895091A2 (fr) * 1997-07-30 1999-02-03 I.E.E. International Electronics & Engineering S.à.r.l. Méthode et circuit pour surveiller l'intégrité des conducteurs dans un arrangement d'éléments de circuit connectés en matrice
EP1045265A2 (fr) * 1999-04-16 2000-10-18 Agilent Technologies Inc., A Delaware Corporation Commutateur optique ayant des ports d'essais
US6613650B1 (en) * 1995-07-31 2003-09-02 Hyundai Electronics America Active matrix ESD protection and testing scheme

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Publication number Priority date Publication date Assignee Title
US4374384A (en) * 1980-08-28 1983-02-15 Westinghouse Electric Corp. Matrix encoder for resistive sensor arrays
DE19910194C2 (de) * 1999-03-09 2001-06-28 Bosch Gmbh Robert Schaltungsanordnung zum Messen der Widerstände einer drucksensitiven Widerstandsmatte

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4940934A (en) * 1987-10-15 1990-07-10 Matsushita Electric Industrial Co., Ltd. Method of electrically testing active matrix substrate
US5113134A (en) * 1991-02-28 1992-05-12 Thomson, S.A. Integrated test circuit for display devices such as LCD's
US5481499A (en) * 1992-07-17 1996-01-02 U.S. Philips Corporation Integrated matrix memory, comprising a circuit arrangement for testing the addressing
US6613650B1 (en) * 1995-07-31 2003-09-02 Hyundai Electronics America Active matrix ESD protection and testing scheme
EP0895091A2 (fr) * 1997-07-30 1999-02-03 I.E.E. International Electronics & Engineering S.à.r.l. Méthode et circuit pour surveiller l'intégrité des conducteurs dans un arrangement d'éléments de circuit connectés en matrice
EP1045265A2 (fr) * 1999-04-16 2000-10-18 Agilent Technologies Inc., A Delaware Corporation Commutateur optique ayant des ports d'essais

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3059114A1 (fr) * 2016-11-23 2018-05-25 Continental Automotive France Procede de diagnostic d'une alimentation de polarisation pour un systeme d'acquisition comprenant un dispositif matriciel d'interface
WO2018096275A1 (fr) * 2016-11-23 2018-05-31 Continental Automotive France Procédé de diagnostic d'une alimentation de polarisation pour un système d'acquisition comprenant un dispositif matriciel d'interface
CN109983351A (zh) * 2016-11-23 2019-07-05 法国大陆汽车公司 用于包括阵列接口装置的采集系统的偏置电源的诊断方法
US11269007B2 (en) 2016-11-23 2022-03-08 Continental Automotive France Method for diagnosing a bias supply for an acquiring system comprising a matrix-array interface device

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Publication number Publication date
WO2007090772A3 (fr) 2007-09-20
DE102006005051A1 (de) 2007-08-16

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