EP2273278B1 - Système de contrôle d'un agencement de conduite et procédé de fabrication d'un agencement de conduite - Google Patents

Système de contrôle d'un agencement de conduite et procédé de fabrication d'un agencement de conduite Download PDF

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Publication number
EP2273278B1
EP2273278B1 EP10006976.4A EP10006976A EP2273278B1 EP 2273278 B1 EP2273278 B1 EP 2273278B1 EP 10006976 A EP10006976 A EP 10006976A EP 2273278 B1 EP2273278 B1 EP 2273278B1
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EP
European Patent Office
Prior art keywords
contacts
connector
terminals
terminal assembly
memory
Prior art date
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EP10006976.4A
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German (de)
English (en)
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EP2273278A3 (fr
EP2273278A2 (fr
Inventor
Uwe Engberts
Rainer Decker
Marco Xanke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ENGBERTS MESS- STEUER- und REGELSYSTEME GmbH
Original Assignee
Engberts Mess- Steuer- und Regelsysteme GmbH
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Publication of EP2273278A2 publication Critical patent/EP2273278A2/fr
Publication of EP2273278A3 publication Critical patent/EP2273278A3/fr
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/60—Identification of wires in a multicore cable

Definitions

  • the invention relates to a testing system for testing a conduit assembly, an adapter for use in such a testing system, a testing apparatus for use in such a testing system, and a method of making a conduit assembly.
  • Such a conduit assembly includes a plurality of connectors configured to be coupled to respective connectors of the respective modules, and leads each interconnecting contacts of different connectors.
  • Such conduit assemblies are commonly referred to as harnesses, and the connectors typically include plugs, sockets, or the like.
  • conduit arrangement is a component essential to the operation of the electrical system, there is a need to test the conduit assembly after its manufacture and prior to its integration into the electrical system.
  • a testing system for testing a conduit arrangement which comprises a plurality of adapters, which on the one hand are connected to a test device and on the other hand each have a connector which is adapted for coupling to a connector the line arrangement to be tested is configured.
  • the connectors thereof are coupled to the connectors of the adapters such that the tester is electrically connected to the contacts of the connectors of the conduit assembly.
  • the tester may then test various electrical characteristics of the conduit arrangement, such as resistances and inductances of individual lines and insulation resistances and capacitances between different lines.
  • errors in the line arrangement such as unwanted short circuits, interruptions or incorrectly interconnected contacts of connectors can be determined in this way.
  • the end DE 195 00 113 A1 known test system has a flexibility in that it can be converted for the testing of line assemblies of various types.
  • To convert the test system from testing a conduit assembly to testing another conduit assembly the adapters previously attached to the tester are removed and the adapters needed for the new conduit assembly are connected to the tester. Connecting the adapters to the tester is time consuming and error prone.
  • Adapters of different types can be connected to a connection analyzer.
  • the adapters each have a module that has processor functionalities and a memory.
  • the connection analyzer is configured to read out and use the data of the memory. This allows the link analyzer to distinguish between the different adapter types.
  • Another test system is in US7112969 disclosed.
  • test system for testing a conduit assembly, adapters for use in such a test system, and a test apparatus for use in such a test system, which facilitate retrofitting of the test system for testing various conduit arrangements.
  • Embodiments of the invention provide an adapter for connecting connectors of a line assembly to be tested to a tester.
  • the Adapters include a first connector configured for coupling to a corresponding connector of the lead assembly to be tested, a second connector for connection to the tester, and a bundle of leads connecting contacts of the first connector to contacts of the second connector.
  • the adapter comprises a data memory with terminals, which are connected to contacts of the second connector.
  • the second connector thus has two functions: On the one hand, the electrical connection between the tester and the connectors of the line assembly to be tested is produced and, secondly, an electrical connection is created between the tester and the data memory of the adapter, so that the tester can read the data memory via the second connector of the adapter.
  • the adapter thus enables a tester to which the adapter is connected with its second connector to determine the type of adapter and a connection position of the adapter to the tester. For this purpose, the tester only has to make a series of readout tests in succession via different combinations of its connections and to evaluate a result of these readout attempts. Only with a combination of connections, the Auslese pulp for a particular adapter success, so that it is determined to which terminals the second connector of the adapter is connected, in which case the read data content of the data memory provides information about the identity of the connected adapter.
  • the data memory is arranged in the second connector of the adapter, which is provided for connection to the tester.
  • the data memory in the first connector which is configured for connection to the connector of the line arrangement to be tested, is arranged and connected by lines of the line bundle to the contacts of the second connector.
  • the contacts of the second connector which are connected to a terminal of the data memory, are not connected to contacts of the first connector.
  • This can have the advantage that the data memory can not influence the measurement of electrical properties of the line arrangement.
  • at least one contact of the second connector, which is connected to a terminal of the data memory is also connected to one of the contacts of the first connector of the adapter. This has the advantage that a smaller number of contacts must be provided on the second connector compared to the embodiment explained above.
  • a testing device for testing a line arrangement which has a connection assembly on which a plurality of contacts are held and which are provided for connection of adapters, a measuring device with at least two connections for measuring at least one electrical property, a memory readout device includes at least two terminals and a switch matrix for selectively connecting the terminals of the measuring device or the terminals of the memory readout device with contacts of the terminal assembly. It is thus possible, by operating the switching matrix, to connect the terminals of the memory read-out device successively with different combinations of contacts of the connection module connect and perform each memory readout attempt by the memory readout device to determine which contacts of the connector assembly which adapter is connected.
  • the switching matrix can then be controlled to connect the measuring device successively with different combinations of the contacts of the terminal assembly in order to carry out these measurements of the electrical properties of the line arrangement to be tested and to compare the results of these measurements with information, for example in a memory or a Database of the tester are stored in order to determine a fault of the line arrangement.
  • the contacts of the terminal assembly are juxtaposed such that the second connectors of the adapters can be engaged with the terminal assembly in a variety of different positions.
  • the memory read-out device can be connected to the contacts of the connection module via the switch matrix, an automatic identification of the positions, on which certain adapters are connected via the second connector to the terminal assembly, possible, so that also necessary for testing the line arrangement measuring method can be adapted to the respective connection situation.
  • the test apparatus for this purpose comprises a computer control, which controls the switching matrix, the memory read-out device and the measuring device and which results of memory read-out tests from the memory read-out device and results of measurements from the measuring device receives and these results with information stored in a memory to a configuration of to be tested line arrangement to determine an error in the line arrangement to be tested.
  • a test system which comprises at least one adapter as described above and a testing device as described above.
  • a method of fabricating a lead assembly comprises: coupling connectors of the lead assembly to first connectors of adapters of a test system, driving a switch matrix of the test system such that the at least two terminals of the test system measuring device are connected in series with different contacts of the connectors of the tester Conduction are performed and performing at least one measurement of at least one electrical property by a measuring device of the test system at different actuations of the switching matrix.
  • the measurements made by the measuring device are evaluated and errors in the line arrangement can be determined.
  • the method of manufacture further comprises correcting the detected failure in the conduit assembly by changing a configuration of the conduit arrangement, such as changing a terminal pattern of leads of the conduit assembly to contacts of connectors thereof.
  • FIG. 1 shows a schematic representation of a test system 1 for testing a line assembly 3 according to an embodiment of the invention.
  • the line arrangement 3 to be tested comprises a bundle 5 of a plurality of lines 7, wherein each line 7 connects two end contacts 8 and 9 to one another electrically.
  • the end contacts 8 and 9, respectively, are mechanically supported in connectors 10, the connectors 10 being configured to be coupled to respective connectors of modules of an electrical system into which the lead assembly 3 integrates shall be.
  • the connector 10 may be formed as a plug or sockets or the like and in addition to the function of electrical contacting of the contacts 8, 9 also provide other functions, such as splash water protection or coupling of water or compressed air hoses.
  • the task of the test system 1 is to check the electrical function of the line arrangement 3.
  • the test includes a check as to whether the desired contacts 8 and 9 are electrically connected together and a connection resistance is less than a desired value, whether there is an undesired short circuit between two contacts 8 or if an insulation resistance between different contacts 8 is greater than a predetermined value.
  • the test may also include measurements of capacitances between different lines and inductances of individual lines.
  • the test system 1 can also be extended to check other functions of the line arrangement 3, as mentioned above.
  • the conduit arrangement 3 for the purpose of easier representation in FIG. 1 shown as a simple line arrangement with only six lines 7 and two connectors 10.
  • line assemblies to be tested may be much more complex and comprise substantially more lines, the bundles of which are branched into a plurality of connectors.
  • the test system 1 comprises adapters 37, which are explained in detail below, and a tester 13.
  • the tester 13 comprises a measuring device 15 with two terminals 16 and 17, which is configured to measure at least one electrical property of an electrical circuit, the the terminals 16, 17 is connected.
  • the electrical property may include an ohmic resistance, a capacitance, and an inductance.
  • the measuring device 15 has two terminals 16 and 17.
  • the measuring device has a larger number of terminals.
  • a four-terminal measuring device may be provided to allow 4-pole measurement of the electrical characteristics.
  • the two connections 16, 17 of the measuring device 15 are to be connected to the contacts 8, 9 of the line arrangement 3 in various combinations, so that measurements can be made on the line arrangement 3 by the measuring device 15 and with predetermined setpoint values for the respective measurements can be compared to determine a correctness of the configuration of the conduit assembly 3 or to detect an error in the conduit assembly 3.
  • the measuring device 15 is controlled by a computer control 19, which also reads out measurement results of the measuring arrangement 15 and carries out the corresponding comparative calculations.
  • the computer control 19 comprises a memory 21 in which information about the configuration of the line arrangement 3 to be tested and, if appropriate, other line arrangements of a different type, which can be subsequently checked, are stored.
  • the testing device 13 further comprises a switching matrix 27, which is controlled by the computer control 19.
  • the switching matrix 27 includes a plurality of individual switches 29 for selectively connecting the terminals 16, 17 of the measuring device 15 to contacts 31 provided on a terminal assembly 33 of the tester 13.
  • the terminal assembly 33 supports these contacts 31 such that these are accessible from the outside and can be connected to contacts 35 of the adapter 37, which serve to couple the connectors 10 of the line arrangement 3 to be tested to the test device 37.
  • the adapters 37 each comprise a bundle 39 of lines 41, which on the one hand connect contacts 42 for connection to the contacts 8, 9 of the line arrangement 3 with the contacts 35 for connection to the contacts 31 of the terminal subassembly 33 on the other hand.
  • the contacts 42 of the adapter 37 are supported on a connector 43 that is configured to be coupled to a corresponding connector 10 of the lead assembly 3.
  • the contacts 35 are supported on a connector 45 that is configured to simultaneously connect the contacts 35 of the connector 45 to a group of adjacent contacts 31 of the terminal assembly 33 by attaching them to a suitable position of the terminal assembly 33.
  • the connector 45 may be coupled to the terminal assembly 33 at various selectable locations such that the contacts 35 of the connector 45 contact other groups of contacts 31 of the connector assembly 33, depending on the location selected.
  • the tester 13 is configured to automatically detect positions at which the connectors 45 are connected to the terminal assembly 33.
  • the adapter 37 comprises a memory 49 with terminals 51, which are also provided by the connector 45 Contacts 31 are connected so that the terminals 51 of the memory 49 are in contact with the contacts 31 of the terminal assembly 33 as soon as the connector 45 is connected to the terminal assembly 33.
  • the memory read-out device 53 and the measuring device 15 are separate components, each having its own terminals 54, 55; 16, 17 are connected to the switching matrix 27.
  • the controller 19 may then operate either one or the other of the memory readout device and the measuring device.
  • the controller may then selectively operate this common module in a mode for performing the measurement of the at least one electrical characteristic or the other mode of reading the data memories, while driving the switching matrix, the terminals of the sensing component supplied to one side of the switching matrix, which functions both combined to selectively connect to the contacts 31 on the other side of the switching matrix.
  • the tester 13 further comprises a memory readout device 53 with terminals 54 and 55, which are connected to the switching matrix 27, so that switches 29 of the switching matrix 27 can be operated by the computer control 19 so that the terminals 54 and 55 the memory read-out device 53 are connected to the terminals 51 of the memory 49.
  • the memory read-out device 53 can read out the contents of the memory 49 and transmit them to the computer control 19.
  • the contents of the memory 49 may include information that allows the adapter 37 to be uniquely identified and thus also to identify the type of connector 10 of the conduit assembly 3 that is connected to the connector assembly 33 via the connector 45.
  • the computer control 19 controls the switching matrix 27 in sequence such that the terminals 54, 55 of the memory readout device are connected to different combinations of pairs of the terminals 31 of the terminal assembly 33. In each combination of the contacts 31 connected to the terminals 54, 55, the computer control 19 initiates a memory read-out by the memory read-out device 53.
  • This readout attempt will succeed only if the pair of contacts 31 are connected to the terminals 54, 55 of the memory read-out device by the switch matrix 53 is connected, to which the terminals 51 of the memory 49 of the adapter 37 are connected. Then, the memory readout attempt also provides the information for identifying the connected adapter 37. Thus, by systematically driving the switching matrix and performing a memory readout attempt on each drive of the switch matrix, it is possible to detect the position of the contacts 31 on the terminal board 33 which a connector 45 of a particular adapter 37 is connected.
  • FIG. 1 shows the connection of the connector 45 in two orientations by the in FIG. 1 connector 45 of the memory module 49 is arranged in the connector 45 above, while in the in FIG. 1 Bottom connector 45 is arranged below.
  • the memory 49 is arranged in the connector 45 such that the memory read-out attempt is successful only if, for example, the connection 54 of the memory read-out device 53 is connected via the switching matrix 27 to the contact 31 arranged at the edge of the connector 45 and connected to the memory 49, while the terminal 55 of the memory read-out device 53 is connected to the contact 35 of the connector 45 remote from the edge of the connector 45 and connected to the memory 49.
  • the computer controller 19 By executing the illustrated program by the computer controller 19, ie, by sequentially connecting the terminals 54, 55 of the memory readout device 53 successively with different combinations of pairs of contacts 31 of the terminal board 33, it is thus possible to identify the adapter 37 connected to the terminal board 33 and determine the positions at which the connectors 45 of the adapters 37 are connected to the terminal assembly 33.
  • the computer control 19 can then execute the program for measuring the electrical properties of the line arrangement 3 by connecting the connections 16, 17 of the measuring device 15 successively with different pairs of the connections 31 the connection assembly 33 are connected and at each control of the switching matrix 27, one or more electrical properties of the line assembly 3 are measured.
  • the test system 1 Due to the automatic recognition of the adapters 37 connected to the terminal assembly 33 and the recognition of the positions to which they are connected, it is possible to easily convert the test system 1 from a configuration for testing a line arrangement to a configuration for testing another line arrangement one of the one line arrangement has different design, retrofit. Namely, a person performing the retrofitting can connect the adapters necessary for checking the respective wiring arrangement to any free positions of the terminal board 33, without having to pay attention that the connectors of the adapters have to be mounted at predetermined positions in predetermined orientations.
  • FIG. 2 shows a schematic representation of an embodiment of an adapter 37a for connecting a line arrangement to be tested (in FIG. 2 not shown) to a terminal assembly of a tester (in FIG. 2 not shown).
  • the adapter 37a comprises a A plurality of leads 41a, which connect contacts 51a, on the one hand, to contacts 42a, on the other hand.
  • the contacts 42a are supported on a connector 43a, which is configured for connection to a corresponding connector of the line assembly to be tested.
  • the contacts 51a are supported on a connector 45a which is configured to be connected to the terminal assembly of the tester.
  • FIG. 2 shows a schematic representation of an embodiment of an adapter 37a for connecting a line arrangement to be tested (in FIG. 2 not shown) to a terminal assembly of a tester (in FIG. 2 not shown).
  • the adapter 37a comprises a A plurality of leads 41a, which connect contacts 51a, on the one hand, to contacts 42a, on the other hand.
  • the contacts 42a are supported on
  • a reservoir 49a of the adapter 37a is not disposed in the connector 45a configured to be connected to the terminal assembly, but in the connector 43a configured to be connected to the corresponding connector of the lead assembly to be tested.
  • Terminals 51a of the memory arrangement 49a are connected via lines 41a of the line bundle 39a to the contacts 51a, so that the content of the memory 49a can be read out via the contacts 51a.
  • FIG. 2 also illustrates a further embodiment of the invention, according to which one of the terminals 51a of the memory 49a is connected to a contact 51a, which is additionally connected to one of the contacts 42a, which are provided for coupling to contacts of the line arrangement to be tested.
  • This contact thus provides two functions: it can be used to read the contents of the memory 49a, and it can also be used to make measurements of electrical characteristics of the line arrangement to be tested.
  • the memory 49a has two terminals, and only one of the terminals is connected to one of the contacts 51a, which are also used for measuring the electrical characteristics.
  • both terminals 51a of the memory 49a with such contacts 51a and it is also possible that the memory 49a has more than two terminals, which are completely, partially or not at all connected to such terminals, which are also used for the measurement of electrical properties.
  • FIG. 3 shows a plan view of contact pins 31b of a terminal assembly 33b for connecting connectors of adapters for connection of a line assembly to be tested.
  • the contacts 31b are arranged in three rows next to each other as a regular grid. According to other embodiments, arrangements of contacts may be provided in single, double or more than three rows.
  • a broken line 45b 'represents another possible position where the connector can be coupled to the connector assembly 33b to contact 12 contacts 31b. It will be appreciated that the connector 45b may be connected to the terminal assembly 33b in a plurality of staggered positions.
  • a controller due to the memory provided in the adapter, it is possible for a controller to recognize the actual connector position of the connector to control the measurement of electrical characteristics over the switch matrix in response thereto.
  • FIG. 4 is a partial view of a tester 13c according to another embodiment of the invention.
  • the tester 13c includes a terminal assembly 33c in which groups of six contacts 31c on connectors 63 are provided.
  • the connectors 63 are for connecting connectors (reference numeral 45 in FIG FIG. 1 ) of adapters (Reference numeral 37 in FIG FIG. 1 ) to which to be tested line arrangements can be connected.
  • Each connector of the adapter can thus be connected to various free connectors 63 of the terminal assembly 33c to contact a group of six contacts 31c.
  • a memory provided in the adapter serves to detect the position on the terminal assembly 33c and the connector 63, respectively, to which the respective adapter is connected to the terminal assembly 33c.
  • An example of a data store employable in accordance with embodiments of the present invention is a 1024-bit, 1-wire EEPROM, which may be obtained under the designation DS2431 from MAXIM INTEGRATED PRODUCTS, INC., SUNNYVALE, CA, USA.
  • the memory readout device is configured to apply to the terminals of the data memory a train of electrical signals and to make measurements of electrical characteristics that are necessary according to the specification of the data memory for reading it out.
  • the measuring device for measuring the at least one property of the line arrangement can be integrated with the memory read-out device.
  • test systems for testing a line arrangement comprise a memory which can be connected to one side of a switch matrix together with test leads for testing the line arrangement.
  • a measuring device for measuring at least one electrical property
  • a memory read-out device for reading out the memory.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Claims (15)

1. Système de test servant à tester un ensemble de lignes (3), dans lequel l'ensemble de lignes (3) comprend une pluralité de connecteurs (10) connectés par des lignes (7) et dans lequel le système de test (1) comprend :
au moins un adaptateur (37), qui comprend une mémoire de données (49), un premier connecteur (43), qui est configuré pour le couplage à un des connecteurs (10) de l'ensemble de lignes (3), un deuxième connecteur (45) et un faisceau (39) de lignes (41) qui connectent des contacts (42) du premier connecteur (43) à des contacts (35) du deuxième connecteur (45), et dans lequel des raccordements (51) de la mémoire de données (49) sont connectés à des contacts (35) du deuxième connecteur (45) ;
un appareil de test (13), comprenant
un groupe de raccordement (33), sur lequel est fixée une pluralité de contacts (31), dans lequel les contacts (35) du deuxième connecteur (45) sont aptes à être connectés à un groupe sélectionnable de contacts (35) adjacents les uns aux autres du groupe de raccordement (33) ; dans lequel les contacts (31) du groupe de raccordement (33) sont disposés côte à côte de manière que le deuxième connecteur (45) soit apte à être amené en prise avec le groupe de raccordement (33) dans une pluralité de positions différentes ;
un dispositif de mesure (15) avec au moins deux raccordements (16, 17) pour la mesure d'au moins une propriété électrique ;
un dispositif de lecture de mémoire (53) avec au moins deux raccords (54, 55) pour la lecture de la mémoire de données (49) de l'adaptateur (37) ; et
une matrice de commutation (27) pour la connexion au choix des raccordements (16, 17) du dispositif de mesure (15) et des raccordements (54, 55) du dispositif de lecture de mémoire (53) d'une part aux contacts (31) du groupe de raccordement (33) d'autre part ;
caractérisé en ce que l'appareil de test (33) est réalisé pour connecter, par un actionnement de la matrice de commutation (27), les raccordements du dispositif de lecture de matrice (53) les uns après les autres avec différentes combinaisons de contacts du groupe de raccordement (33) et, par le dispositif de lecture de mémoire (53), respectivement pour faire effectuer un essai de lecture de mémoire et pour identifier en fonction de ce qui précède pour le deuxième connecteur (45) une position de la pluralité de positions, sur laquelle l'adaptateur (37) est raccordé par l'intermédiaire du deuxième connecteur (45) au groupe de raccordement (33).
Système de test selon la revendication 1, dans lequel les contacts (31b) du groupe de raccordement (33b) sont disposés en au moins une rangée à des distances respectivement identiques les uns des autres et dans lequel le deuxième connecteur (45b) est disposable au choix sur plusieurs positions (45b') de la rangée, pour connecter les contacts de ce deuxième connecteur aux contacts (31b) du groupe de raccordement (33b).
Système de test selon la revendication 1 ou 2, dans lequel le groupe de raccordement (33c) présente une pluralité de connecteurs (63), qui comprennent respectivement un groupe de contacts (31c) du groupe de raccordement (33c) et qui sont configurés pour le couplage aux deuxièmes connecteurs des adaptateurs.
Système de test selon l'une des revendications 1 à 3, dans lequel la mémoire de données (49) est disposée dans le deuxième connecteur (45) de l'adaptateur (37).
Système de test selon l'une des revendications 1 à 3, dans lequel la mémoire de données (49a) est disposée dans le premier connecteur (43a) de l'adaptateur (37a) et dans lequel les raccordements (51a) de la mémoire de données (49a) sont connectés aux contacts (51a) du deuxième connecteur (45a) par des lignes (41a) du faisceau (39a) de lignes.
Système de test selon l'une des revendications 1 à 5, dans lequel tous les contacts (35) du deuxième connecteur (45) qui sont connectés à un raccordement (51) de la mémoire de données (49) ne sont pas connectés à des contacts (42) du premier connecteur (43).
Système de test selon l'une des revendications 1 à 5, dans lequel au moins un contact (51a) du deuxième connecteur (45a) qui est connecté à un raccordement (51a) de la mémoire de données (49a) est également connecté à un des contacts (42a) du premier connecteur (43a).
Utilisation d'un adaptateur dans un système de test selon l'une des revendications 1 à 7, dans lequel l'adaptateur comprend :
un premier connecteur, qui est configuré pour le couplage à un connecteur d'un ensemble de lignes à tester ;
un deuxième connecteur ;
un faisceau de lignes, qui connectent des contacts du premier connecteur à des contacts du deuxième connecteur, et
une mémoire de données avec des raccordements, lesquels sont connectés à des contacts du deuxième connecteur.
Appareil de test servant à tester un ensemble de lignes et pour l'utilisation dans un système de test selon l'une des revendications 1 à 7, dans lequel l'appareil de test comprend :
un groupe de raccordement, sur lequel est fixée une pluralité de contacts ; dans lequel les contacts (35) du deuxième connecteur (45) sont aptes à être connectés à un groupe sélectionnable de contacts (35) adjacents les uns aux autres du groupe de raccordement (33) ; dans lequel les contacts (31) du groupe de raccordement (33) sont disposés côte à côte de manière que le deuxième connecteur (45) soit apte à être amené en prise avec le groupe de raccordement (33) dans une pluralité de positions différentes ;
un dispositif de mesure avec au moins deux raccordements pour la mesure d'au moins une propriété électrique ;
un dispositif de lecture de mémoire avec au moins deux raccordements pour la lecture des mémoires de données dans l'adaptateur, lesquels peuvent être raccordés par des connecteurs aux contacts du groupe de raccordement ; et
une matrice de commutation pour la connexion au choix des raccordements du dispositif de mesure et des raccordements du dispositif de lecture de mémoire d'une part aux contacts du groupe de raccordement d'autre part ;
caractérisé en ce que l'appareil de test (33) est réalisé pour connecter, par un actionnement de la matrice de commutation (27), les raccordements du dispositif de lecture de mémoire (53) les uns après les autres avec des combinaisons différentes de contacts du groupe de raccordement (33) et, par le dispositif de lecture de mémoire (53), respectivement pour faire effectuer un essai de lecture de mémoire et pour identifier en fonction de ce qui précède pour le deuxième connecteur (45) une position de la pluralité de positions, sur laquelle l'adaptateur (37) est raccordé par l'intermédiaire du deuxième connecteur (45) au groupe de raccordement (33).
Appareil de test selon la revendication 9, comprenant en outre un contrôleur d'ordinateur avec une mémoire, dans laquelle l'information concernant au moins une configuration d'un ensemble de lignes à tester est mémorisée.
Appareil de test selon la revendication 10, dans lequel le contrôleur d'ordinateur est configuré
pour piloter la matrice de commutation de telle manière que les au moins deux raccordements du dispositif de lecture de mémoire soient connectés tour à tour à différents contacts du groupe de raccordement, et
pour, à chaque pilotage de la matrice de commutation, piloter le dispositif de lecture de mémoire, effectuer l'essai de lecture de mémoire et transmettre au contrôleur d'ordinateur un résultat de l'essai de lecture de mémoire.
Appareil de test selon la revendication 11, dans lequel le contrôleur d'ordinateur est configurée en outre pour piloter en fonction des résultats des essais de lecture de mémoire et de l'information concernant la configuration de l'ensemble de lignes à tester la matrice de commutation de manière que les au moins deux raccordements du dispositif de mesure soient connectés tout à tour à différents contacts du groupe de raccordement, et
pour tout pilotage de la matrice de commutation, piloter le dispositif de mesure pour mesurer l'au moins une propriété électrique et pour transférer un résultat de la mesure au contrôleur d'ordinateur.
Procédé servant à fabriquer un ensemble de lignes, dans lequel le procédé comprend :
le couplage de connecteurs de l'ensemble de lignes à des premiers connecteurs d'adaptateurs du système de test selon l'une des revendications 1 à 7,
piloter la matrice de commutation du système de test de manière que les au moins deux raccordements du dispositif de mesure du système de test sont connectés tour à tour à différents contacts des connecteurs de l'ensemble de lignes, et
exécuter une mesure par le dispositif de mesure à chaque pilotage de la matrice de commutation.
Procédé selon la revendication 13, comprenant en outre une analyse des mesures menées par le dispositif de mesure et la détermination d'une anomalie dans l'ensemble de lignes.
Procédé selon la revendication 14, comprenant en outre la suppression de l'anomalie déterminée dans l'ensemble de lignes.
EP10006976.4A 2009-07-06 2010-07-06 Système de contrôle d'un agencement de conduite et procédé de fabrication d'un agencement de conduite Active EP2273278B1 (fr)

Applications Claiming Priority (1)

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DE200910031892 DE102009031892B4 (de) 2009-07-06 2009-07-06 Prüfsystem zum Prüfen einer Leitungsanordnung, Verwendung eines Adapters in einem Prüfsystem und Prüfgerät zum Prüfen einer Leitungsanordnung sowie Verfahren zum Herstellen einer Leitungsanordnung

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EP2273278A2 EP2273278A2 (fr) 2011-01-12
EP2273278A3 EP2273278A3 (fr) 2014-11-26
EP2273278B1 true EP2273278B1 (fr) 2018-09-05

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011101467B4 (de) * 2011-05-13 2015-09-10 Engberts Mess-, Steuer- Und Regelsysteme Gmbh Verfahren zum prüfen und herstellen einer elektrischen schaltung
AT516348B1 (de) 2014-10-07 2019-11-15 Omicron Electronics Gmbh Prüfanordnung und Verfahren zur Prüfung einer Schaltanlage
AT518178B1 (de) * 2016-02-15 2017-08-15 Omicron Electronics Gmbh Prüfgerät zum Prüfen einer Steuereinheit einer Schaltvorrichtung einer Schaltanlage
AT518368B1 (de) * 2016-02-15 2021-06-15 Omicron Electronics Gmbh Prüfgerät und Verfahren zum Prüfen einer Steuereinheit einer Schaltvorrichtung einer Schaltanlage
CN107907776B (zh) * 2017-10-26 2024-03-12 中国石油天然气集团有限公司 随钻测斜仪的扶正器内部线路测试盒
CN108152650A (zh) * 2017-12-27 2018-06-12 上海应用技术大学 多芯电缆自动查线系统
DE102019133227B3 (de) * 2019-12-05 2021-03-04 Engberts Mess-, Steuer- Und Regelsysteme Gmbh Prüfsystem für eine Leitungsanordnung
FR3136062B1 (fr) 2022-05-24 2024-05-24 Safran Aircraft Engines Bretelle de raccordement, module et procédé de diagnostic de l’état de santé d’une pluralité de câbles électriques

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4218745A (en) * 1978-09-11 1980-08-19 Lockheed Corporation Microcomputer assisted electrical harness fabrication and testing system
US5072185A (en) * 1990-11-13 1991-12-10 Cablescan, Inc. Wire harness modular interface adapter system and testing apparatus
DE19500113C2 (de) 1995-01-04 1996-03-28 Klaus Wurmhoeringer Kabeltestadapter
DE29920214U1 (de) * 1999-11-17 2000-01-20 TSK Prüfsysteme für elektrische Komponenten GmbH, 32457 Porta Westfalica Einrichtung zum Testen von mit Steckern versehenen Kabeln
DE10019860C1 (de) * 2000-04-18 2001-10-31 Wee Electrotest Engineering Gm Verfahren und Einrichtung zum Prüfen von Kabelbäumen
ES1046798Y (es) * 2000-07-07 2001-07-01 Abad Ind S A Dispositivo ficha-contraficha para test de cableados industriales.
US6718284B2 (en) * 2002-01-30 2004-04-06 Cirris Systems Corporation Smart module and adapter apparatus
US7112969B1 (en) * 2006-02-17 2006-09-26 Thomas Geoffrey L Electrical interconnect interface and wire harness test and test development system and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

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EP2273278A3 (fr) 2014-11-26
DE102009031892A8 (de) 2011-04-21
EP2273278A2 (fr) 2011-01-12
DE102009031892B4 (de) 2015-05-13
DE102009031892A1 (de) 2011-01-13

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