WO2007049750A1 - パラジウム選択的エッチング液およびエッチングの選択性を制御する方法 - Google Patents
パラジウム選択的エッチング液およびエッチングの選択性を制御する方法 Download PDFInfo
- Publication number
- WO2007049750A1 WO2007049750A1 PCT/JP2006/321512 JP2006321512W WO2007049750A1 WO 2007049750 A1 WO2007049750 A1 WO 2007049750A1 JP 2006321512 W JP2006321512 W JP 2006321512W WO 2007049750 A1 WO2007049750 A1 WO 2007049750A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- etching
- compound
- palladium
- gold
- etching solution
- Prior art date
Links
- 238000005530 etching Methods 0.000 title claims abstract description 163
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 title claims abstract description 138
- 229910052763 palladium Inorganic materials 0.000 title claims abstract description 63
- 238000000034 method Methods 0.000 title claims description 25
- 239000010931 gold Substances 0.000 claims abstract description 79
- 229910052737 gold Inorganic materials 0.000 claims abstract description 68
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 66
- 239000000654 additive Substances 0.000 claims abstract description 48
- -1 amide compounds Chemical class 0.000 claims abstract description 48
- 150000001875 compounds Chemical class 0.000 claims abstract description 42
- 230000000996 additive effect Effects 0.000 claims abstract description 40
- 239000000463 material Substances 0.000 claims abstract description 25
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims abstract description 15
- 239000011630 iodine Substances 0.000 claims abstract description 14
- 229910052740 iodine Inorganic materials 0.000 claims abstract description 14
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 claims abstract description 13
- ZMZDMBWJUHKJPS-UHFFFAOYSA-N thiocyanic acid Chemical class SC#N ZMZDMBWJUHKJPS-UHFFFAOYSA-N 0.000 claims abstract description 13
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 41
- SOIFLUNRINLCBN-UHFFFAOYSA-N ammonium thiocyanate Chemical compound [NH4+].[S-]C#N SOIFLUNRINLCBN-UHFFFAOYSA-N 0.000 claims description 10
- ZNNZYHKDIALBAK-UHFFFAOYSA-M potassium thiocyanate Chemical compound [K+].[S-]C#N ZNNZYHKDIALBAK-UHFFFAOYSA-M 0.000 claims description 5
- 229940116357 potassium thiocyanate Drugs 0.000 claims description 5
- ZMZDMBWJUHKJPS-UHFFFAOYSA-M Thiocyanate anion Chemical compound [S-]C#N ZMZDMBWJUHKJPS-UHFFFAOYSA-M 0.000 claims description 2
- 229940126062 Compound A Drugs 0.000 claims 1
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 claims 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims 1
- 150000003949 imides Chemical class 0.000 claims 1
- 230000003100 immobilizing effect Effects 0.000 claims 1
- 229910052744 lithium Inorganic materials 0.000 claims 1
- 150000001298 alcohols Chemical class 0.000 abstract description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 13
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 13
- 229910052757 nitrogen Inorganic materials 0.000 description 13
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 12
- ATHHXGZTWNVVOU-UHFFFAOYSA-N N-methylformamide Chemical compound CNC=O ATHHXGZTWNVVOU-UHFFFAOYSA-N 0.000 description 10
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 9
- KMTRUDSVKNLOMY-UHFFFAOYSA-N Ethylene carbonate Chemical compound O=C1OCCO1 KMTRUDSVKNLOMY-UHFFFAOYSA-N 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical compound [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 description 6
- HNJBEVLQSNELDL-UHFFFAOYSA-N pyrrolidin-2-one Chemical compound O=C1CCCN1 HNJBEVLQSNELDL-UHFFFAOYSA-N 0.000 description 6
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 5
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 5
- 238000004090 dissolution Methods 0.000 description 5
- 229940044613 1-propanol Drugs 0.000 description 4
- KDSNLYIMUZNERS-UHFFFAOYSA-N 2-methylpropanamine Chemical compound CC(C)CN KDSNLYIMUZNERS-UHFFFAOYSA-N 0.000 description 4
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- DMBHHRLKUKUOEG-UHFFFAOYSA-N diphenylamine Chemical compound C=1C=CC=CC=1NC1=CC=CC=C1 DMBHHRLKUKUOEG-UHFFFAOYSA-N 0.000 description 4
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical compound I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 description 4
- 150000002484 inorganic compounds Chemical class 0.000 description 4
- 229910010272 inorganic material Inorganic materials 0.000 description 4
- 229910052705 radium Inorganic materials 0.000 description 4
- HCWPIIXVSYCSAN-UHFFFAOYSA-N radium atom Chemical compound [Ra] HCWPIIXVSYCSAN-UHFFFAOYSA-N 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 description 3
- YAMHXTCMCPHKLN-UHFFFAOYSA-N imidazolidin-2-one Chemical compound O=C1NCCN1 YAMHXTCMCPHKLN-UHFFFAOYSA-N 0.000 description 3
- 239000003446 ligand Substances 0.000 description 3
- 150000002894 organic compounds Chemical class 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- PQYIVUDIIIJJDM-UHFFFAOYSA-N 2,5-dinaphthalen-1-yl-1,3,4-thiadiazole Chemical compound C1=CC=C2C(C3=NN=C(S3)C=3C4=CC=CC=C4C=CC=3)=CC=CC2=C1 PQYIVUDIIIJJDM-UHFFFAOYSA-N 0.000 description 2
- PMUNIMVZCACZBB-UHFFFAOYSA-N 2-hydroxyethylazanium;chloride Chemical compound Cl.NCCO PMUNIMVZCACZBB-UHFFFAOYSA-N 0.000 description 2
- QCXJEYYXVJIFCE-UHFFFAOYSA-N 4-acetamidobenzoic acid Chemical compound CC(=O)NC1=CC=C(C(O)=O)C=C1 QCXJEYYXVJIFCE-UHFFFAOYSA-N 0.000 description 2
- ZHNUHDYFZUAESO-UHFFFAOYSA-N Formamide Chemical compound NC=O ZHNUHDYFZUAESO-UHFFFAOYSA-N 0.000 description 2
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical compound NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- 125000003368 amide group Chemical group 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- DDRJAANPRJIHGJ-UHFFFAOYSA-N creatinine Chemical compound CN1CC(=O)NC1=N DDRJAANPRJIHGJ-UHFFFAOYSA-N 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- ZSIAUFGUXNUGDI-UHFFFAOYSA-N hexan-1-ol Chemical compound CCCCCCO ZSIAUFGUXNUGDI-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- WRIRWRKPLXCTFD-UHFFFAOYSA-N malonamide Chemical compound NC(=O)CC(N)=O WRIRWRKPLXCTFD-UHFFFAOYSA-N 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- NAYYNDKKHOIIOD-UHFFFAOYSA-N phthalamide Chemical compound NC(=O)C1=CC=CC=C1C(N)=O NAYYNDKKHOIIOD-UHFFFAOYSA-N 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- JDVPQXZIJDEHAN-UHFFFAOYSA-N succinamic acid Chemical compound NC(=O)CCC(O)=O JDVPQXZIJDEHAN-UHFFFAOYSA-N 0.000 description 2
- KZNICNPSHKQLFF-UHFFFAOYSA-N succinimide Chemical compound O=C1CCC(=O)N1 KZNICNPSHKQLFF-UHFFFAOYSA-N 0.000 description 2
- FDDDEECHVMSUSB-UHFFFAOYSA-N sulfanilamide Chemical compound NC1=CC=C(S(N)(=O)=O)C=C1 FDDDEECHVMSUSB-UHFFFAOYSA-N 0.000 description 2
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 2
- XFNJVJPLKCPIBV-UHFFFAOYSA-N trimethylenediamine Chemical compound NCCCN XFNJVJPLKCPIBV-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- DFQUBYCHLQAFOW-NSCUHMNNSA-N (e)-4-(methylamino)-4-oxobut-2-enoic acid Chemical compound CNC(=O)\C=C\C(O)=O DFQUBYCHLQAFOW-NSCUHMNNSA-N 0.000 description 1
- BSSNZUFKXJJCBG-OWOJBTEDSA-N (e)-but-2-enediamide Chemical compound NC(=O)\C=C\C(N)=O BSSNZUFKXJJCBG-OWOJBTEDSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- ZFPGARUNNKGOBB-UHFFFAOYSA-N 1-Ethyl-2-pyrrolidinone Chemical compound CCN1CCCC1=O ZFPGARUNNKGOBB-UHFFFAOYSA-N 0.000 description 1
- JTPZTKBRUCILQD-UHFFFAOYSA-N 1-methylimidazolidin-2-one Chemical compound CN1CCNC1=O JTPZTKBRUCILQD-UHFFFAOYSA-N 0.000 description 1
- KYEACNNYFNZCST-UHFFFAOYSA-N 1-methylpyrrolidine-2,5-dione Chemical compound CN1C(=O)CCC1=O KYEACNNYFNZCST-UHFFFAOYSA-N 0.000 description 1
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 1
- SNTWKPAKVQFCCF-UHFFFAOYSA-N 2,3-dihydro-1h-triazole Chemical compound N1NC=CN1 SNTWKPAKVQFCCF-UHFFFAOYSA-N 0.000 description 1
- FWPHQUJGZVELBK-UHFFFAOYSA-N 2,3-dihydropyrrole-1-carboxamide Chemical compound NC(=O)N1CCC=C1 FWPHQUJGZVELBK-UHFFFAOYSA-N 0.000 description 1
- VPMMJSPGZSFEAH-UHFFFAOYSA-N 2,4-diaminophenol;hydrochloride Chemical compound [Cl-].NC1=CC=C(O)C([NH3+])=C1 VPMMJSPGZSFEAH-UHFFFAOYSA-N 0.000 description 1
- MUNFOTHAFHGRIM-UHFFFAOYSA-N 2,5-dinaphthalen-1-yl-1,3,4-oxadiazole Chemical compound C1=CC=C2C(C3=NN=C(O3)C=3C4=CC=CC=C4C=CC=3)=CC=CC2=C1 MUNFOTHAFHGRIM-UHFFFAOYSA-N 0.000 description 1
- YHUMTHWQGWPJOQ-UHFFFAOYSA-N 2,6-dichloro-4-chloroiminocyclohexa-2,5-dien-1-one Chemical compound ClN=C1C=C(Cl)C(=O)C(Cl)=C1 YHUMTHWQGWPJOQ-UHFFFAOYSA-N 0.000 description 1
- MIJDSYMOBYNHOT-UHFFFAOYSA-N 2-(ethylamino)ethanol Chemical compound CCNCCO MIJDSYMOBYNHOT-UHFFFAOYSA-N 0.000 description 1
- DXANYXRZRNXGSC-UHFFFAOYSA-N 2-[3-[(4-amino-2-methylpyrimidin-5-yl)methyl]-4-methyl-1,3-thiazol-3-ium-5-yl]ethyl sulfate Chemical compound CC1=C(CCOS([O-])(=O)=O)SC=[N+]1CC1=CN=C(C)N=C1N DXANYXRZRNXGSC-UHFFFAOYSA-N 0.000 description 1
- UFDFFEMHDKXMBG-UHFFFAOYSA-N 2-acetamidoprop-2-enoic acid Chemical compound CC(=O)NC(=C)C(O)=O UFDFFEMHDKXMBG-UHFFFAOYSA-N 0.000 description 1
- INZUQGFQRYAKQQ-UHFFFAOYSA-N 2-acetylisoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(C(=O)C)C(=O)C2=C1 INZUQGFQRYAKQQ-UHFFFAOYSA-N 0.000 description 1
- WKNMKGVLOWGGOU-UHFFFAOYSA-N 2-aminoacetamide;hydron;chloride Chemical compound Cl.NCC(N)=O WKNMKGVLOWGGOU-UHFFFAOYSA-N 0.000 description 1
- KSILMCDYDAKOJD-UHFFFAOYSA-N 2-aminoisoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(N)C(=O)C2=C1 KSILMCDYDAKOJD-UHFFFAOYSA-N 0.000 description 1
- BNZCDZDLTIHJAC-UHFFFAOYSA-N 2-azaniumylethylazanium;sulfate Chemical compound NCC[NH3+].OS([O-])(=O)=O BNZCDZDLTIHJAC-UHFFFAOYSA-N 0.000 description 1
- BHPYMZQTCPRLNR-UHFFFAOYSA-N 2-cyanoethanethioamide Chemical compound NC(=S)CC#N BHPYMZQTCPRLNR-UHFFFAOYSA-N 0.000 description 1
- LTHNHFOGQMKPOV-UHFFFAOYSA-N 2-ethylhexan-1-amine Chemical compound CCCCC(CC)CN LTHNHFOGQMKPOV-UHFFFAOYSA-N 0.000 description 1
- JZDSOQSUCWVBMV-UHFFFAOYSA-N 2-ethylisoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(CC)C(=O)C2=C1 JZDSOQSUCWVBMV-UHFFFAOYSA-N 0.000 description 1
- CFMZSMGAMPBRBE-UHFFFAOYSA-N 2-hydroxyisoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(O)C(=O)C2=C1 CFMZSMGAMPBRBE-UHFFFAOYSA-N 0.000 description 1
- QBBRHCGHMJKLIR-UHFFFAOYSA-N 2-methyl-n,n-di(propan-2-yl)propanamide Chemical compound CC(C)N(C(C)C)C(=O)C(C)C QBBRHCGHMJKLIR-UHFFFAOYSA-N 0.000 description 1
- NJBCRXCAPCODGX-UHFFFAOYSA-N 2-methyl-n-(2-methylpropyl)propan-1-amine Chemical compound CC(C)CNCC(C)C NJBCRXCAPCODGX-UHFFFAOYSA-N 0.000 description 1
- AOPRXJXHLWYPQR-UHFFFAOYSA-N 2-phenoxyacetamide Chemical compound NC(=O)COC1=CC=CC=C1 AOPRXJXHLWYPQR-UHFFFAOYSA-N 0.000 description 1
- FFOHTSTWXWJGQR-UHFFFAOYSA-N 2-piperazin-1-yl-n-propan-2-ylacetamide Chemical compound CC(C)NC(=O)CN1CCNCC1 FFOHTSTWXWJGQR-UHFFFAOYSA-N 0.000 description 1
- GSCPDZHWVNUUFI-UHFFFAOYSA-N 3-aminobenzamide Chemical compound NC(=O)C1=CC=CC(N)=C1 GSCPDZHWVNUUFI-UHFFFAOYSA-N 0.000 description 1
- SKLUWKYNZNXSLX-UHFFFAOYSA-N 4-Acetamidobenzaldehyde Chemical compound CC(=O)NC1=CC=C(C=O)C=C1 SKLUWKYNZNXSLX-UHFFFAOYSA-N 0.000 description 1
- UZTFMUBKZQVKLK-UHFFFAOYSA-N 4-acetamidobutanoic acid Chemical compound CC(=O)NCCCC(O)=O UZTFMUBKZQVKLK-UHFFFAOYSA-N 0.000 description 1
- GQBONCZDJQXPLV-UHFFFAOYSA-N 4-aminoisoindole-1,3-dione Chemical compound NC1=CC=CC2=C1C(=O)NC2=O GQBONCZDJQXPLV-UHFFFAOYSA-N 0.000 description 1
- UWDMKTDPDJCJOP-UHFFFAOYSA-N 4-hydroxy-2,2,6,6-tetramethylpiperidin-1-ium-4-carboxylate Chemical compound CC1(C)CC(O)(C(O)=O)CC(C)(C)N1 UWDMKTDPDJCJOP-UHFFFAOYSA-N 0.000 description 1
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- GVNWZKBFMFUVNX-UHFFFAOYSA-N Adipamide Chemical compound NC(=O)CCCCC(N)=O GVNWZKBFMFUVNX-UHFFFAOYSA-N 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- KHBQMWCZKVMBLN-UHFFFAOYSA-N Benzenesulfonamide Chemical compound NS(=O)(=O)C1=CC=CC=C1 KHBQMWCZKVMBLN-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- XBPCUCUWBYBCDP-UHFFFAOYSA-N Dicyclohexylamine Chemical compound C1CCCCC1NC1CCCCC1 XBPCUCUWBYBCDP-UHFFFAOYSA-N 0.000 description 1
- RPNUMPOLZDHAAY-UHFFFAOYSA-N Diethylenetriamine Chemical compound NCCNCCN RPNUMPOLZDHAAY-UHFFFAOYSA-N 0.000 description 1
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- 239000004471 Glycine Substances 0.000 description 1
- ZRALSGWEFCBTJO-UHFFFAOYSA-N Guanidine Chemical compound NC(N)=N ZRALSGWEFCBTJO-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 102000004317 Lyases Human genes 0.000 description 1
- 108090000856 Lyases Proteins 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- PEEHTFAAVSWFBL-UHFFFAOYSA-N Maleimide Chemical compound O=C1NC(=O)C=C1 PEEHTFAAVSWFBL-UHFFFAOYSA-N 0.000 description 1
- AYAZZQJGORVQSN-UHFFFAOYSA-N N,N-dimethylbenzamide Chemical compound CN(C(C1=CC=CC=C1)=O)C.CN(C(C1=CC=CC=C1)=O)C AYAZZQJGORVQSN-UHFFFAOYSA-N 0.000 description 1
- NQTADLQHYWFPDB-UHFFFAOYSA-N N-Hydroxysuccinimide Chemical compound ON1C(=O)CCC1=O NQTADLQHYWFPDB-UHFFFAOYSA-N 0.000 description 1
- ZSBDPRIWBYHIAF-UHFFFAOYSA-N N-acetyl-acetamide Natural products CC(=O)NC(C)=O ZSBDPRIWBYHIAF-UHFFFAOYSA-N 0.000 description 1
- PVCJKHHOXFKFRP-UHFFFAOYSA-N N-acetylethanolamine Chemical compound CC(=O)NCCO PVCJKHHOXFKFRP-UHFFFAOYSA-N 0.000 description 1
- GHAZCVNUKKZTLG-UHFFFAOYSA-N N-ethyl-succinimide Natural products CCN1C(=O)CCC1=O GHAZCVNUKKZTLG-UHFFFAOYSA-N 0.000 description 1
- HDFGOPSGAURCEO-UHFFFAOYSA-N N-ethylmaleimide Chemical compound CCN1C(=O)C=CC1=O HDFGOPSGAURCEO-UHFFFAOYSA-N 0.000 description 1
- OHLUUHNLEMFGTQ-UHFFFAOYSA-N N-methylacetamide Chemical compound CNC(C)=O OHLUUHNLEMFGTQ-UHFFFAOYSA-N 0.000 description 1
- HBGGSRBGCBWUBT-UHFFFAOYSA-N O.O.O.[K].[K].[K] Chemical compound O.O.O.[K].[K].[K] HBGGSRBGCBWUBT-UHFFFAOYSA-N 0.000 description 1
- ZQMQTZAPHTVMBH-UHFFFAOYSA-N O.O.[Na].[Na].[Na].OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O Chemical compound O.O.[Na].[Na].[Na].OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O ZQMQTZAPHTVMBH-UHFFFAOYSA-N 0.000 description 1
- REYJJPSVUYRZGE-UHFFFAOYSA-N Octadecylamine Chemical compound CCCCCCCCCCCCCCCCCCN REYJJPSVUYRZGE-UHFFFAOYSA-N 0.000 description 1
- ZCQWOFVYLHDMMC-UHFFFAOYSA-N Oxazole Chemical compound C1=COC=N1 ZCQWOFVYLHDMMC-UHFFFAOYSA-N 0.000 description 1
- WTKZEGDFNFYCGP-UHFFFAOYSA-N Pyrazole Chemical compound C=1C=NNC=1 WTKZEGDFNFYCGP-UHFFFAOYSA-N 0.000 description 1
- SKZKKFZAGNVIMN-UHFFFAOYSA-N Salicilamide Chemical compound NC(=O)C1=CC=CC=C1O SKZKKFZAGNVIMN-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 1
- QIOZLISABUUKJY-UHFFFAOYSA-N Thiobenzamide Chemical compound NC(=S)C1=CC=CC=C1 QIOZLISABUUKJY-UHFFFAOYSA-N 0.000 description 1
- SLINHMUFWFWBMU-UHFFFAOYSA-N Triisopropanolamine Chemical compound CC(O)CN(CC(C)O)CC(C)O SLINHMUFWFWBMU-UHFFFAOYSA-N 0.000 description 1
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 1
- VYTBPJNGNGMRFH-UHFFFAOYSA-N acetic acid;azane Chemical compound N.N.CC(O)=O.CC(O)=O.CC(O)=O.CC(O)=O VYTBPJNGNGMRFH-UHFFFAOYSA-N 0.000 description 1
- WDSCBUNMANHPFH-UHFFFAOYSA-N acexamic acid Chemical compound CC(=O)NCCCCCC(O)=O WDSCBUNMANHPFH-UHFFFAOYSA-N 0.000 description 1
- 229960004582 acexamic acid Drugs 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- XJHABGPPCLHLLV-UHFFFAOYSA-N benzo[de]isoquinoline-1,3-dione Chemical compound C1=CC(C(=O)NC2=O)=C3C2=CC=CC3=C1 XJHABGPPCLHLLV-UHFFFAOYSA-N 0.000 description 1
- VJLOFJZWUDZJBX-UHFFFAOYSA-N bis(2-hydroxyethyl)azanium;chloride Chemical compound [Cl-].OCC[NH2+]CCO VJLOFJZWUDZJBX-UHFFFAOYSA-N 0.000 description 1
- DNSISZSEWVHGLH-UHFFFAOYSA-N butanamide Chemical compound CCCC(N)=O DNSISZSEWVHGLH-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 239000004202 carbamide Substances 0.000 description 1
- 150000001718 carbodiimides Chemical class 0.000 description 1
- VXIVSQZSERGHQP-UHFFFAOYSA-N chloroacetamide Chemical compound NC(=O)CCl VXIVSQZSERGHQP-UHFFFAOYSA-N 0.000 description 1
- HPXRVTGHNJAIIH-UHFFFAOYSA-N cyclohexanol Chemical compound OC1CCCCC1 HPXRVTGHNJAIIH-UHFFFAOYSA-N 0.000 description 1
- XCIXKGXIYUWCLL-UHFFFAOYSA-N cyclopentanol Chemical compound OC1CCCC1 XCIXKGXIYUWCLL-UHFFFAOYSA-N 0.000 description 1
- TYNBFJJKZPTRKS-UHFFFAOYSA-N dansyl amide Chemical compound C1=CC=C2C(N(C)C)=CC=CC2=C1S(N)(=O)=O TYNBFJJKZPTRKS-UHFFFAOYSA-N 0.000 description 1
- TUTWLYPCGCUWQI-UHFFFAOYSA-N decanamide Chemical compound CCCCCCCCCC(N)=O TUTWLYPCGCUWQI-UHFFFAOYSA-N 0.000 description 1
- TVMUHOAONWHJBV-UHFFFAOYSA-N dehydroglycine Chemical compound OC(=O)C=N TVMUHOAONWHJBV-UHFFFAOYSA-N 0.000 description 1
- 125000005266 diarylamine group Chemical group 0.000 description 1
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 229940043237 diethanolamine Drugs 0.000 description 1
- LVTYICIALWPMFW-UHFFFAOYSA-N diisopropanolamine Chemical compound CC(O)CNCC(C)O LVTYICIALWPMFW-UHFFFAOYSA-N 0.000 description 1
- 229940043276 diisopropanolamine Drugs 0.000 description 1
- 229940043279 diisopropylamine Drugs 0.000 description 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- XHFGWHUWQXTGAT-UHFFFAOYSA-N dimethylamine hydrochloride Natural products CNC(C)C XHFGWHUWQXTGAT-UHFFFAOYSA-N 0.000 description 1
- IQDGSYLLQPDQDV-UHFFFAOYSA-N dimethylazanium;chloride Chemical compound Cl.CNC IQDGSYLLQPDQDV-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 229960001484 edetic acid Drugs 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- UAUDZVJPLUQNMU-KTKRTIGZSA-N erucamide Chemical compound CCCCCCCC\C=C/CCCCCCCCCCCC(N)=O UAUDZVJPLUQNMU-KTKRTIGZSA-N 0.000 description 1
- XWBDWHCCBGMXKG-UHFFFAOYSA-N ethanamine;hydron;chloride Chemical compound Cl.CCN XWBDWHCCBGMXKG-UHFFFAOYSA-N 0.000 description 1
- 229940031098 ethanolamine Drugs 0.000 description 1
- 229940073579 ethanolamine hydrochloride Drugs 0.000 description 1
- SBNKFTQSBPKMBZ-UHFFFAOYSA-N ethenzamide Chemical compound CCOC1=CC=CC=C1C(N)=O SBNKFTQSBPKMBZ-UHFFFAOYSA-N 0.000 description 1
- VRHAQNTWKSVEEC-UHFFFAOYSA-N ethyl 1,3-dioxoisoindole-2-carboxylate Chemical compound C1=CC=C2C(=O)N(C(=O)OCC)C(=O)C2=C1 VRHAQNTWKSVEEC-UHFFFAOYSA-N 0.000 description 1
- LIWAQLJGPBVORC-UHFFFAOYSA-N ethylmethylamine Chemical compound CCNC LIWAQLJGPBVORC-UHFFFAOYSA-N 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- RNYJXPUAFDFIQJ-UHFFFAOYSA-N hydron;octadecan-1-amine;chloride Chemical compound [Cl-].CCCCCCCCCCCCCCCCCC[NH3+] RNYJXPUAFDFIQJ-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- VFQXVTODMYMSMJ-UHFFFAOYSA-N isonicotinamide Chemical compound NC(=O)C1=CC=NC=C1 VFQXVTODMYMSMJ-UHFFFAOYSA-N 0.000 description 1
- JJWLVOIRVHMVIS-UHFFFAOYSA-N isopropylamine Chemical compound CC(C)N JJWLVOIRVHMVIS-UHFFFAOYSA-N 0.000 description 1
- ZLTPDFXIESTBQG-UHFFFAOYSA-N isothiazole Chemical compound C=1C=NSC=1 ZLTPDFXIESTBQG-UHFFFAOYSA-N 0.000 description 1
- CTAPFRYPJLPFDF-UHFFFAOYSA-N isoxazole Chemical compound C=1C=NOC=1 CTAPFRYPJLPFDF-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- HNQIVZYLYMDVSB-UHFFFAOYSA-N methanesulfonimidic acid Chemical compound CS(N)(=O)=O HNQIVZYLYMDVSB-UHFFFAOYSA-N 0.000 description 1
- SCZVXVGZMZRGRU-UHFFFAOYSA-N n'-ethylethane-1,2-diamine Chemical compound CCNCCN SCZVXVGZMZRGRU-UHFFFAOYSA-N 0.000 description 1
- LNOPIUAQISRISI-UHFFFAOYSA-N n'-hydroxy-2-propan-2-ylsulfonylethanimidamide Chemical compound CC(C)S(=O)(=O)CC(N)=NO LNOPIUAQISRISI-UHFFFAOYSA-N 0.000 description 1
- UNBDDZDKBWPHAX-UHFFFAOYSA-N n,n-di(propan-2-yl)formamide Chemical compound CC(C)N(C=O)C(C)C UNBDDZDKBWPHAX-UHFFFAOYSA-N 0.000 description 1
- NZMAJUHVSZBJHL-UHFFFAOYSA-N n,n-dibutylformamide Chemical compound CCCCN(C=O)CCCC NZMAJUHVSZBJHL-UHFFFAOYSA-N 0.000 description 1
- MBHINSULENHCMF-UHFFFAOYSA-N n,n-dimethylpropanamide Chemical compound CCC(=O)N(C)C MBHINSULENHCMF-UHFFFAOYSA-N 0.000 description 1
- DKLYDESVXZKCFI-UHFFFAOYSA-N n,n-diphenylacetamide Chemical compound C=1C=CC=CC=1N(C(=O)C)C1=CC=CC=C1 DKLYDESVXZKCFI-UHFFFAOYSA-N 0.000 description 1
- OMNKZBIFPJNNIO-UHFFFAOYSA-N n-(2-methyl-4-oxopentan-2-yl)prop-2-enamide Chemical compound CC(=O)CC(C)(C)NC(=O)C=C OMNKZBIFPJNNIO-UHFFFAOYSA-N 0.000 description 1
- HVAAHUDGWQAAOJ-UHFFFAOYSA-N n-benzylethanamine Chemical compound CCNCC1=CC=CC=C1 HVAAHUDGWQAAOJ-UHFFFAOYSA-N 0.000 description 1
- GYLDXXLJMRTVSS-UHFFFAOYSA-N n-butylacetamide Chemical compound CCCCNC(C)=O GYLDXXLJMRTVSS-UHFFFAOYSA-N 0.000 description 1
- XRKQMIFKHDXFNQ-UHFFFAOYSA-N n-cyclohexyl-n-ethylcyclohexanamine Chemical compound C1CCCCC1N(CC)C1CCCCC1 XRKQMIFKHDXFNQ-UHFFFAOYSA-N 0.000 description 1
- QHCCDDQKNUYGNC-UHFFFAOYSA-N n-ethylbutan-1-amine Chemical compound CCCCNCC QHCCDDQKNUYGNC-UHFFFAOYSA-N 0.000 description 1
- NCCHARWOCKOHIH-UHFFFAOYSA-N n-methylbenzamide Chemical compound CNC(=O)C1=CC=CC=C1 NCCHARWOCKOHIH-UHFFFAOYSA-N 0.000 description 1
- QJQAMHYHNCADNR-UHFFFAOYSA-N n-methylpropanamide Chemical compound CCC(=O)NC QJQAMHYHNCADNR-UHFFFAOYSA-N 0.000 description 1
- QNILTEGFHQSKFF-UHFFFAOYSA-N n-propan-2-ylprop-2-enamide Chemical compound CC(C)NC(=O)C=C QNILTEGFHQSKFF-UHFFFAOYSA-N 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- NUXCOKIYARRTDC-UHFFFAOYSA-N o-ethylhydroxylamine;hydron;chloride Chemical compound Cl.CCON NUXCOKIYARRTDC-UHFFFAOYSA-N 0.000 description 1
- LYRFLYHAGKPMFH-UHFFFAOYSA-N octadecanamide Chemical compound CCCCCCCCCCCCCCCCCC(N)=O LYRFLYHAGKPMFH-UHFFFAOYSA-N 0.000 description 1
- FATBGEAMYMYZAF-KTKRTIGZSA-N oleamide Chemical compound CCCCCCCC\C=C/CCCCCCCC(N)=O FATBGEAMYMYZAF-KTKRTIGZSA-N 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000003791 organic solvent mixture Substances 0.000 description 1
- WCPAKWJPBJAGKN-UHFFFAOYSA-N oxadiazole Chemical compound C1=CON=N1 WCPAKWJPBJAGKN-UHFFFAOYSA-N 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- FYRHIOVKTDQVFC-UHFFFAOYSA-M potassium phthalimide Chemical compound [K+].C1=CC=C2C(=O)[N-]C(=O)C2=C1 FYRHIOVKTDQVFC-UHFFFAOYSA-M 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 1
- IPEHBUMCGVEMRF-UHFFFAOYSA-N pyrazinecarboxamide Chemical compound NC(=O)C1=CN=CC=N1 IPEHBUMCGVEMRF-UHFFFAOYSA-N 0.000 description 1
- KPIIGXWUNXGGCP-UHFFFAOYSA-N pyridine-4-carbothioamide Chemical compound NC(=S)C1=CC=NC=C1 KPIIGXWUNXGGCP-UHFFFAOYSA-N 0.000 description 1
- 229960000581 salicylamide Drugs 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 229960002317 succinimide Drugs 0.000 description 1
- PBCZLFBEBARBBI-UHFFFAOYSA-N sulfabenzamide Chemical compound C1=CC(N)=CC=C1S(=O)(=O)NC(=O)C1=CC=CC=C1 PBCZLFBEBARBBI-UHFFFAOYSA-N 0.000 description 1
- 229960004730 sulfabenzamide Drugs 0.000 description 1
- IIACRCGMVDHOTQ-UHFFFAOYSA-N sulfamic acid Chemical compound NS(O)(=O)=O IIACRCGMVDHOTQ-UHFFFAOYSA-N 0.000 description 1
- 150000003536 tetrazoles Chemical class 0.000 description 1
- VLLMWSRANPNYQX-UHFFFAOYSA-N thiadiazole Chemical compound C1=CSN=N1.C1=CSN=N1 VLLMWSRANPNYQX-UHFFFAOYSA-N 0.000 description 1
- DPJRMOMPQZCRJU-UHFFFAOYSA-M thiamine hydrochloride Chemical compound Cl.[Cl-].CC1=C(CCO)SC=[N+]1CC1=CN=C(C)N=C1N DPJRMOMPQZCRJU-UHFFFAOYSA-M 0.000 description 1
- 229960000344 thiamine hydrochloride Drugs 0.000 description 1
- 235000019190 thiamine hydrochloride Nutrition 0.000 description 1
- 239000011747 thiamine hydrochloride Substances 0.000 description 1
- YUKQRDCYNOVPGJ-UHFFFAOYSA-N thioacetamide Chemical compound CC(N)=S YUKQRDCYNOVPGJ-UHFFFAOYSA-N 0.000 description 1
- 150000003567 thiocyanates Chemical class 0.000 description 1
- 150000003852 triazoles Chemical class 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/32—Alkaline compositions
- C23F1/40—Alkaline compositions for etching other metallic material
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32134—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
Definitions
- the present invention relates to a technique for etching a material in which gold and palladium coexist.
- Metals such as gold and palladium are generally widely used as electrode wiring materials for semiconductors and liquid crystal display devices.
- As a microfabrication technique for these metal electrode wirings there is a wet etching method using chemicals.
- the flip chip method has become the mainstream for bonding electrode wiring, and an etching solution is frequently used in the bump formation process.
- an iodine-based etching solution containing an organic solvent is known as such an etching solution (for example, Patent Document 1).
- Patent Document 1 an iodine-based etching solution containing an organic solvent
- the etching solution can stably perform gold etching with little change in etching performance, when etching the underlying palladium together with the gold bump in the gold bump forming process, the etching amount of each metal is reduced. I could't control it.
- Patent Document 2 a method of etching gold, noradium and alloys thereof using an etchant mainly composed of iodine.
- Patent Document 2 a method of etching gold, noradium and alloys thereof using an etchant mainly composed of iodine.
- the method using the etching solution was able to etch gold and palladium in the same manner and suppress damage to the bumps, that is, etching of gold, and could not selectively remove the underlying palladium.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2004-211142
- Patent Document 2 JP-A-49-123132
- An object of the present invention is to provide a method of controlling selectivity of etching with respect to palladium, an etching solution, and etching with respect to palladium, which is used when etching a material in which palladium and gold coexist. It is to be.
- the present inventors have found that the etching rate ratio can be changed by adding a specific additive while intensively researching to achieve the above object.
- the present invention has been completed.
- the present invention is an iodine-based etching solution for etching a material in which palladium and gold coexist, and includes a nitrogen-containing five-membered ring compound, an alcohol compound, an amido compound, a ketone compound, and thiocyanate.
- Compound strength including compound, amine compound, and imido compound.
- Containing at least one selected additive, etching rate ratio for noradium and gold (etching rate for palladium, etching rate for gold) Relates to the etching solution.
- the present invention also relates to the above-mentioned etching solution containing a nitrogen-containing five-membered ring compound or a thiocyanic acid compound as an additive.
- the present invention relates to the etching solution, wherein the nitrogen-containing five-membered ring compound is N-methyl 2 pyrrolidinone.
- the present invention also relates to the above-mentioned etching solution containing 50 to 80% by volume of N-methyl-2-pyrrolidinone with respect to the etching solution.
- the present invention relates to the etching solution, wherein the thiocyanate compound is ammonium thiocyanate or potassium thiocyanate.
- the present invention also relates to the above-mentioned etching solution containing 0.1-15-1. OmolZL of ammonium thiocyanate or 0.3-1. OmolZL of potassium thiocyanate.
- the present invention provides a nitrogen-containing five-membered ring compound, an alcohol compound, an amidy compound, a ketone compound, a thiocyanic acid compound when etching a material in which palladium and gold coexist with an iodine-based etching solution.
- the present invention relates to a method for controlling the selectivity of etching with respect to palladium by changing the concentration of at least one selected additive in the etching solution. .
- the present invention is a group comprising a nitrogen-containing five-membered ring compound, an alcohol compound, an amide compound, a ketone compound, a thiocyanate compound, an amine compound and an imido compound in an iodine-based etching solution.
- the addition of at least one selected additive increases the etch rate for nordium, while the etch rate for gold decreases or hardly changes, resulting in an etch rate for palladium of Z gold. It is based on the discovery that the etching rate for increases. This effect is due to the fact that the above additives tend to be more coordinated with palladium than gold.
- the solution force of iodine ions involved in dissolution must be supplied to the surface of the material and the movement of the iodide produced by the dissolution into the solution must proceed rapidly.
- the driving force is the diffusion due to the concentration difference of the reactive species between the surface of the material, which is the reaction field, and the solution.
- the water-organic solvent mixture system suppresses dissociation of the reactive species into ions, lowering the overall activity and reducing the surface of the material and the solution. It is considered that the concentration difference between the two decreases, that is, the diffusion rate decreases.
- the etching rate is increased due to the effect of the dissolution promotion by the ligand (additive).
- the etching rate is considered to decrease or hardly change.
- the etching solution of the present invention it is possible to control the etching rate ratio of palladium to gold (etching rate against palladium Z etching rate against gold) to be 1 or more.
- the etching solution of the present invention has an etching rate ratio of 1 to more than palladium and gold. Therefore, it is possible to perform selective etching on palladium, which has been difficult in the past, and can cope with fine etching. Etching rate specific force for noradium and gold. Etching of radium that does not cause further damage to gold because the etching force for palladium is equal to or higher than that for gold. Is possible.
- the forces of nitrogen-containing five-membered ring compounds, alcohol compounds, amide compounds, ketone compounds, thiocyanate compounds, amine compounds and imido compounds are also obtained.
- the etching rate for noradium and the etching rate for gold can be arbitrarily controlled.
- the selectivity of etching with respect to palladium can be changed arbitrarily.
- the etching solution of the present invention is iodine-based, that is, an etching solution containing an iodide such as iodine or potassium iodide, and includes a nitrogen-containing five-membered ring compound, an alcohol compound, an amidy compound, and a ketone compound.
- the etching rate ratio for palladium and gold indicates the etching rate for palladium and the etching rate for gold (hereinafter abbreviated as PdZAu ratio), and the PdZAu ratio is 1 or more in the etching solution of the present invention.
- a PdZAu ratio of 1 or more is obtained by improving the etching power against palladium and suppressing the etching power against gold, and in a material in which gold and palladium coexist, palladium can be etched with higher selectivity than gold.
- the PdZAu ratio is preferably 1.5 or more.
- a higher PdZAu ratio is preferable, and the upper limit is not particularly limited, but may be 50 or 12, for example.
- the additive used in the present invention may be an organic compound or an inorganic compound!
- nitrogen-containing five-membered ring compounds include pyrrolidinone and imidazolidinone.
- nitrogen-containing five-membered ring compound examples include N-methyl 2-pyrrolidinone (NMP), 2-pyrrolidinone, polyvinyl pyrrolidinone, 1-ethyl-2-pyrrolidinone, 1,3 dimethyl-2 imidazolidinone, 2 imidazolidinone, 2 Imino 1-Methyl-4 Imidazolidinone, 1-Methyl-2-Imidazolidinone, 2, 5-bis (1-phenol) 1, 1, 3, 4-oxazole, 2, 5 Bis (1
- Examples of the alcohol compound include alcohols having 1 to 10 carbon atoms, which are saturated or unsaturated, or have a hydroxyl group that may be linear, branched, or cyclic. It may be a polyol having two or more.
- Preferable specific examples of the alcohol compound include linear alcohols such as methanol, ethanol, 1 propanol and hexanol, and cyclic alcohols such as 1-cyclopentanol and 1-cyclohexanol. Of these, ethanol, 1 propanol and the like are more preferable.
- the amidy compound may have a substituent such as a nitro group, a phenol group, or a halogen as long as it has an amide group.
- a substituent such as a nitro group, a phenol group, or a halogen as long as it has an amide group.
- the amide compound include N-methylformamide, N, N dimethylformamide, N, N jetylformamide, N-methylacetamide, N, N dimethylacetamide, N-methylpropionamide, acrylamide, Adipamide, acetoamide, 2-acetamidoacrylic acid, 4-acetamidobenzoic acid, 2-acetamido benzoate methyl, acetamidoacetate ethyl, 4-acetamidophenol, 2-acetamidofluorine, 6-acetamidohexanoic acid, p-acetamidobenzaldehyde , 3-case Jetyl toamidomalonate, 4-acetamido
- Examples of the ketone compound include ketone compounds having 3 to 10 carbon atoms.
- Preferred specific examples of the ketone compound include acetone, methyl ethyl ketone, cyclohexanone, dioxane, 4-hydroxy 2 —Methylpentanone, ethylene carbonate, propylene carbonate and the like. Of these, acetone, ethylene carbonate and the like are more preferable.
- amine compound examples include urea, glycine, imino-acetic acid, N-acetylethanolamine, N-acetyldiphenylamine, arylamine, arylamine hydrochloride, arylcyclohexylamine, isobutylamine, isobutylamine, Isopropanol Min, Isopropylamine, Ethanolamine, Ethanolamine Hydrochloride, Ethylamine Hydrochloride, N Ethylethanolamine, N Ethyl Ethylene Diamine, N Ethyl Diisopropyl Amamine, N Ethyl Jetanol Amine, N Ethyl Dicyclo Hexylamine, N-ethyl n-butylamine, 2-ethylhexylamine, N-ethylbenzylamine, N-ethylmethylamine, ethylene diamine sulfate, ethylene diamine sulfate, ethylene diamine
- imido compounds include succinimide, hydroxysuccinimide, N-odosuccinimide, N-ataryloxysuccinimide, N-acetylphthalimide, 3-aminophthalimide, 4-amino.
- Minophthalimide N-aminophthalimide, Imidourea, N-ethylphthalimide, N-ethylmaleimide, N-carbethoxyphthalimide, carbodiimide, N-chloroconuccinimide, cycloxyimide, 2, 6 dichloroquinone chloroimide, 3, 3 dimethylmethyltaltalimide, 1,8 naphthalimide, 3-trophthalimide, 4-trophthalimide, N-hydroxyphthalimide, potassium phthalimide, maleic imide, N-methylsuccinimide, odosuccinimide, etc. Examples thereof include a chain or cyclic imido compound.
- additives from the viewpoint of increasing the PdZAu ratio, alcohol compounds or ketonic compounds are preferred, and 1 propanol, acetone, etc. are particularly preferred.
- an additive with low volatility is preferable because the etching rate of palladium can be kept stable.
- additives include nitrogen-containing five-membered ring compounds. In particular, NMP, which has good wettability after etching, is preferred.
- the amount of the organic compound additive used varies depending on the type of additive, it is suitable depending on the type. It is preferable to adjust the usage amount. In general, it can be used in the range of 1 to 100% by volume, preferably 10 to 85% by volume, more preferably 20 to 80% by volume. For example, when the additive is NMP, the amount used is preferably 50 to 80% by volume, more preferably 60 to 80% by volume.
- thiocyanic acid compounds include thiocyanic acid ammonium salts, salts with alkaline earth metals such as magnesium and calcium, and alkali metals such as sodium and potassium. Salt. Of these salts, ammonium thiocyanate or potassium thiocyanate having a high PdZAu ratio is preferred. Inorganic compound additives have the advantage of being able to improve the PdZAu ratio even in small amounts.
- the amount of the inorganic compound additive is preferably adjusted according to the type of additive, but is preferably 0.01 to 2 molZL, more preferably 0.1 to 1. 5 mol ZL, more preferably 0.2 mol ZL ⁇ : Lmol ZL.
- the additive is ammonium thiocyanate
- the amount used is preferably 0.15-1. Omol / L, more preferably 0.4 to 1. Omol / L, still more preferably 0.4 to 0. 8molZL.
- the additive is potassium thiosocyanate
- the amount used is preferably 0.3 to 1. OmolZL, more preferably 0.4 to 1. OmolZL, still more preferably 0.6 to 0.8 molZL. is there. Within such a range, the etching power against palladium can be improved and the etching power against gold can be suppressed.
- the etching rate ratio with respect to noradium and gold by adjusting the amount of additive used.
- the etching rate for gold is higher than the etching rate for palladium at NMPO volume%.
- NMP is about 50% by volume or more
- PdZAu ratio is 1 or more (for example, PdZAu ratio when NMP60 capacity 0/0 is about 1.64). In this way, the PdZAu ratio can be arbitrarily controlled by adjusting the amount of NMP used.
- the use amount of the additive capable of reversing the etching rate of gold and palladium is about 60% or more by volume when 2-pyrrolidinone is used as shown in FIG.
- DMI dimethyl-2-imidazolidinone
- EC ethylene carbonate
- ethanol it is about 60% or more by volume as shown in FIG. 5
- N 1-pronool V-NP
- N is about 40% or more by volume as shown in FIG.
- N-methylformamide when used, it is about 40% or more by volume as shown in FIG. 8, and N, N-dimethylacetamide is added. When used, it is about 60% by volume or more as shown in FIG. 9. When ammonium thiocyanate is used, it is about 0.15 molZL or more as shown in FIG. 10, and when potassium thiocyanate is used, about 0. More than 3molZL.
- the PdZAu ratio can be arbitrarily controlled, and can be made 1 or more as desired. Therefore, for example, in the gold bump formation process, damage to the gold bump can be suppressed as much as possible, and the underlying palladium film can be removed.
- the etching solution of the present invention can be produced by adding the above-mentioned additive to a known iodine-based etching solution, or mixing iodine, iodide and the additive in water. Further, the etching solution of the present invention does not need to be prepared in advance. For example, an additive may be added to the iodine-based etching solution during etching.
- the etching method of the present invention is not particularly limited as long as it uses the etching solution of the present invention! /, And a known method may be used.
- Examples of the contact method between the etching object and the etching solution include a dipping method in which the container is filled with the etching solution and the etching object is immersed. At that time, it is preferable to perform the etching uniformly by swinging the object to be etched or forcibly circulating the etching solution in the tank.
- a spray method in which an etching solution is sprayed on the surface of an etching target and a spin method in which an etching solution is discharged to a rotating etching target by a nozzle.
- the etching time is not particularly limited, but about 1 to 60 minutes is sufficient, and the etching temperature is not particularly limited.
- the etching can be performed at 20 to 50 ° C.
- the material to which the etching solution of the present invention is applied is a material in which gold and palladium coexist.
- a material in which gold and palladium coexist there is no particular limitation. Specific examples include semiconductor materials such as semiconductor substrates, silicon wafers, and transparent conductive electrodes. Among these, a semiconductor substrate is preferable.
- the test was conducted assuming the etching of palladium on a wafer in which noradium and gold coexist.
- 200 mL each of four types of etching solutions were prepared by blending 20, 40, 60, or 80% by volume of N-methyl-2-pyrrolidinone (NMP) with the etching solution of the above comparative example.
- NMP N-methyl-2-pyrrolidinone
- a 2 X 2 cm noradium specimen and a gold specimen were immersed in the above etching solution for 1 minute while being weakly stirred at a liquid temperature of 30 ° C, and etched.
- the etching rate for palladium and gold was calculated from the gravimetric method, and the Pd / Au ratio was calculated. The results are shown in Table 1 and Fig. 1.
- the etching rate for palladium is relatively higher than the etching rate for gold, and the Pd / Au ratio is improved. It can also be seen that the Pd / Au ratio varies depending on the concentration of the additive, and by selecting the appropriate concentration of the additive, the etching rate for palladium and gold is reversed, and the Pd / Au ratio exceeds 1.
- Etching was performed in the same manner as in Example 1 except that the compounds shown in Table 2 were used instead of NMP in Example 1.
- the results are shown in Table 2.
- Figures 4, 5, 7 and 9 show the relationship between the amount of each additive and the etching rate when ethylene carbonate, ethanol, acetone and N, N-dimethylacetamide are used as additives. It can be seen that by adding the additive, the etching rate for radium is relatively higher than that for gold, and the Pd / Au ratio is improved. In addition, by appropriately selecting the concentration of the additive, the etching rate for palladium and gold is reversed, and the Pd / Au ratio exceeds one.
- Etching was performed in the same manner as in Example 1 except that the compounds shown in Table 3 were used instead of NMP in Example 1. The results are shown in Table 3.
- Figure 6 shows the relationship between the amount of ammonium thiocyanate and the etching rate. It can be seen that adding the additive improves the etching rate for palladium and improves the Pd / Au ratio. It can also be seen that the etching rate for palladium and gold is reversed by appropriately selecting the concentration of the additive, and the Pd / Au ratio exceeds 1. Compared with Examples 1 and 2, the compounds shown in Table 3 can improve the etching rate ratio even if the amount is extremely small.
- FIG. 1 shows the relationship between the amount of N-methyl-2-pyrrolidinone (NMP) added and the etching rate when etching a material in which palladium and gold coexist.
- NMP N-methyl-2-pyrrolidinone
- FIG. 2 Shows the relationship between the amount of 2-pyrrolidinone added and the etching rate when etching materials in which palladium and gold coexist.
- FIG. 3 1,3 dimethyl when etching materials in which palladium and gold coexist 1-2
- the relationship between the amount of imidazolidinone (DMI) added and the etching rate is shown.
- FIG. 4 shows the relationship between the amount of ethylene carbonate (EC) added and the etching rate when etching a material in which noradium and gold coexist.
- FIG. 5 shows the relationship between the added amount of ethanol and the etching rate when etching a material in which palladium and gold coexist.
- FIG. 6 Shows the relationship between the amount of 1-propanol (NPA) added and the etching rate when etching materials in which palladium and gold coexist.
- FIG. 7 shows the relationship between the amount of acetone added and the etching rate when etching a material in which palladium and gold coexist.
- FIG. 8 shows the relationship between the amount of N-methylformamide added and the etching rate when etching a material in which palladium and gold coexist.
- FIG. 9 shows the relationship between the amount of added N and N dimethylacetamide and the etching rate when etching a material in which palladium and gold coexist.
- FIG. 10 shows the relationship between the amount of ammonium thiocyanate added and the etching rate when etching materials in which palladium and gold coexist.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/084,230 US20090184092A1 (en) | 2005-10-28 | 2006-10-27 | Palladium-Selective Etching Solution and Method for Controlling Etching Selectivity |
CN200680040225A CN100595894C (zh) | 2005-10-28 | 2006-10-27 | 钯选择性蚀刻液以及控制蚀刻的选择性的方法 |
KR1020087012043A KR101321084B1 (ko) | 2005-10-28 | 2006-10-27 | 팔라듐 선택적 에칭액 및 에칭의 선택성을 제어하는 방법 |
JP2007542688A JP5011122B2 (ja) | 2005-10-28 | 2006-10-27 | パラジウム選択的エッチング液およびエッチングの選択性を制御する方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005314160 | 2005-10-28 | ||
JP2005-314160 | 2005-10-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2007049750A1 true WO2007049750A1 (ja) | 2007-05-03 |
Family
ID=37967858
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2006/321512 WO2007049750A1 (ja) | 2005-10-28 | 2006-10-27 | パラジウム選択的エッチング液およびエッチングの選択性を制御する方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20090184092A1 (ja) |
JP (1) | JP5011122B2 (ja) |
KR (1) | KR101321084B1 (ja) |
CN (1) | CN100595894C (ja) |
TW (1) | TWI406971B (ja) |
WO (1) | WO2007049750A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014082480A (ja) * | 2012-09-28 | 2014-05-08 | Kanto Chem Co Inc | ヨウ素系エッチング液およびエッチング方法 |
JP7138983B1 (ja) * | 2021-11-25 | 2022-09-20 | 株式会社イオックス | 金属溶解剤及び金属を溶解する方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2751296A1 (en) * | 2011-09-01 | 2014-07-09 | Dedek, Petr | Method for the removal and recovery of metals and precious metals from substrates |
US10483108B2 (en) * | 2017-04-28 | 2019-11-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of manufacture |
US10312106B2 (en) * | 2017-07-31 | 2019-06-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method |
CN112322294B (zh) * | 2020-09-27 | 2022-04-22 | 威科赛乐微电子股份有限公司 | 一种vcsel芯片金薄膜蚀刻液及其蚀刻方法 |
CN112941516A (zh) * | 2020-12-29 | 2021-06-11 | 苏州运宏电子有限公司 | 一种精控式蚀刻液及其蚀刻方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49123132A (ja) * | 1973-03-30 | 1974-11-25 | ||
JP2000129470A (ja) * | 1998-10-22 | 2000-05-09 | Meltex Inc | パラジウムまたはパラジウム合金の剥離液 |
JP2003109949A (ja) * | 2001-09-28 | 2003-04-11 | Mitsubishi Chemicals Corp | エッチング液及びエッチング方法 |
JP2004211142A (ja) * | 2002-12-27 | 2004-07-29 | Kanto Chem Co Inc | エッチング液 |
JP2006291341A (ja) * | 2005-04-14 | 2006-10-26 | Kanto Chem Co Inc | 金属選択性エッチング液 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1442535A (fr) * | 1965-05-07 | 1966-06-17 | Comp Generale Electricite | Procédé d'attaque sélective du silicium |
US5714407A (en) * | 1994-03-31 | 1998-02-03 | Frontec Incorporated | Etching agent, electronic device and method of manufacturing the device |
-
2006
- 2006-10-27 CN CN200680040225A patent/CN100595894C/zh not_active Expired - Fee Related
- 2006-10-27 WO PCT/JP2006/321512 patent/WO2007049750A1/ja active Application Filing
- 2006-10-27 US US12/084,230 patent/US20090184092A1/en not_active Abandoned
- 2006-10-27 JP JP2007542688A patent/JP5011122B2/ja active Active
- 2006-10-27 TW TW095139778A patent/TWI406971B/zh active
- 2006-10-27 KR KR1020087012043A patent/KR101321084B1/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49123132A (ja) * | 1973-03-30 | 1974-11-25 | ||
JP2000129470A (ja) * | 1998-10-22 | 2000-05-09 | Meltex Inc | パラジウムまたはパラジウム合金の剥離液 |
JP2003109949A (ja) * | 2001-09-28 | 2003-04-11 | Mitsubishi Chemicals Corp | エッチング液及びエッチング方法 |
JP2004211142A (ja) * | 2002-12-27 | 2004-07-29 | Kanto Chem Co Inc | エッチング液 |
JP2006291341A (ja) * | 2005-04-14 | 2006-10-26 | Kanto Chem Co Inc | 金属選択性エッチング液 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014082480A (ja) * | 2012-09-28 | 2014-05-08 | Kanto Chem Co Inc | ヨウ素系エッチング液およびエッチング方法 |
JP7138983B1 (ja) * | 2021-11-25 | 2022-09-20 | 株式会社イオックス | 金属溶解剤及び金属を溶解する方法 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2007049750A1 (ja) | 2009-04-30 |
CN101297396A (zh) | 2008-10-29 |
TWI406971B (zh) | 2013-09-01 |
TW200730667A (en) | 2007-08-16 |
KR20080064873A (ko) | 2008-07-09 |
KR101321084B1 (ko) | 2013-10-23 |
CN100595894C (zh) | 2010-03-24 |
US20090184092A1 (en) | 2009-07-23 |
JP5011122B2 (ja) | 2012-08-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2007049750A1 (ja) | パラジウム選択的エッチング液およびエッチングの選択性を制御する方法 | |
JP5758065B2 (ja) | 金とニッケルの選択エッチング液 | |
JP6203586B2 (ja) | ヨウ素系エッチング液およびエッチング方法 | |
JP4744181B2 (ja) | 金属選択性エッチング液 | |
CN107227463B (zh) | 铜/钼膜或铜/钼合金膜的蚀刻液组合物 | |
KR20160012947A (ko) | 에칭액 조성물 및 에칭방법 | |
US7947130B2 (en) | Troika acid semiconductor cleaning compositions and methods of use | |
CN105807577B (zh) | 一种光阻残留物清洗液 | |
US20150225645A1 (en) | Etching liquid, etching method using the same, and method of producing semiconductor device | |
US7354890B2 (en) | Cleaning composition and method | |
CN105022237B (zh) | 一种金属低刻蚀光刻胶剥离液 | |
KR20060094487A (ko) | 티탄, 알루미늄 금속 적층막 에칭액 조성물 | |
JP4839968B2 (ja) | レジスト除去用組成物及びレジストの除去方法 | |
JP2003109949A (ja) | エッチング液及びエッチング方法 | |
WO2014129584A1 (ja) | 酸化防止処理方法、これを用いた電子デバイスの製造方法、及びこれらに用いられる金属防食剤 | |
CN102227518B (zh) | 一种含氟组合物及其应用 | |
CN106292207B (zh) | 一种光阻残留物清洗液 | |
KR100262528B1 (ko) | 반도체 소자의 실리콘 산화막 식각방법 | |
CN104570628B (zh) | 一种金属低刻蚀的光刻胶剥离液及其应用 | |
JPH06199504A (ja) | 低表面張力硫酸組成物 | |
TW202413721A (zh) | 表面處理液以及銅之表面處理方法、以及銅與錫之接合方法與接合體之製造方法 | |
JPH04325599A (ja) | 低表面張力を有する硫酸組成物 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 200680040225.3 Country of ref document: CN |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
ENP | Entry into the national phase |
Ref document number: 2007542688 Country of ref document: JP Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1020087012043 Country of ref document: KR |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 06822473 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 12084230 Country of ref document: US |