WO2006080146A1 - プローブカード、およびその製造方法。 - Google Patents
プローブカード、およびその製造方法。 Download PDFInfo
- Publication number
- WO2006080146A1 WO2006080146A1 PCT/JP2005/022614 JP2005022614W WO2006080146A1 WO 2006080146 A1 WO2006080146 A1 WO 2006080146A1 JP 2005022614 W JP2005022614 W JP 2005022614W WO 2006080146 A1 WO2006080146 A1 WO 2006080146A1
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- WIPO (PCT)
- Prior art keywords
- probe card
- fine
- substrate
- manufacturing
- nozzle
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49126—Assembling bases
Definitions
- the present invention relates to a method for forming a bump by discharging a liquid material containing ultrafine metal particles by a fine ink jet method, and a method for manufacturing a probe force code by forming a bump serving as a probe on a substrate.
- the present invention also relates to a probe card in which a fine diameter bump formed by a fine ink jet method is provided on a substrate as a probe, and to a probe card in which a bump is formed on a flexible resin.
- a semiconductor test is generally performed by bringing a probe card having a plurality of three-dimensional metal terminals (probes) into contact with a semiconductor bare chip.
- methods for forming a probe on a probe card include a plating method, a method using a metal needle directly, a method using solder, and a method using tearing a bonding wire.
- the distance between terminals of semiconductors is rapidly narrowing, and these methods are no longer compatible.
- Patent Document 1 discloses a method in which a liquid composition containing a conductive material is discharged onto a substrate, waits for the liquid droplets to solidify on the substrate, and are repeatedly stacked to form bumps.
- this method since the layers are stacked while being further sintered, it takes too much time to make a sufficiently high structure.
- it is not possible to reduce the amount of droplets ejected onto the substrate it is difficult to form fine bumps, and it is impossible to meet the demand for a narrow pitch of semiconductor terminals.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2003-218149
- An object of the present invention is to provide a probe card manufacturing method capable of simplifying the manufacturing process and saving energy and resources. Another object of the present invention is to provide a probe card that can flexibly cope with narrowing of the terminal pitch, diversification of the terminal arrangement, frequent changes thereof, and the like, and a manufacturing method thereof.
- a further object of the present invention is to provide a probe card that exhibits a cushioning effect against the pressure at the time of contact with a semiconductor chip and enables all the probe terminals to be evenly contacted, and a method for manufacturing the same.
- the flexible bump is provided on the substrate, and the fine bump is formed on the top of the grease.
- the fine ink jet method is a method of forming the fine bumps in which the fine droplets fly and adhere by concentration of an electric field and the droplets are deposited by drying and solidifying (1) to (5) The method of manufacturing a probe card according to item 1 above.
- a probe card comprising fine bumps formed by discharging a liquid material containing metal ultrafine particles onto a substrate by a fine ink jet method.
- the manufacturing process of the probe card can be simplified by using ink jet, and energy and resources can be saved.
- the probe card manufacturing method of the present invention by changing the process data for controlling the ejection of the ink jet, it is possible to form fine bumps with various patterns and to flexibly change the terminal arrangement frequently. It can correspond to.
- the drying power of the fine droplets discharged during the formation of the fine bumps is high, there is no need for a sintering step for each droplet discharge, and the fine bumps that become the probe Can be formed in a short time.
- the probe card obtained by the manufacturing method of the present invention uses fine bumps as probes, it can meet the demand for narrow pitch.
- the probe card also exhibits a cushioning effect against the contact pressure of the probe, enabling even contact of all of the probe terminals.
- FIG. 1 is a schematic diagram showing a manufacturing process of a fine three-dimensional structure according to the manufacturing method of the present invention at each stage of an initial stage (A), a middle stage (B), and a late stage (C).
- FIG. 2 schematically shows an example of a probe card manufactured by the manufacturing method of the present invention. It is a fragmentary sectional view.
- FIG. 4 is a schematic diagram for explaining the calculation of the electric field strength of the nozzle in the manufacturing method of the present invention.
- FIG. 5 is a drawing-substituting photograph showing a laser micrograph of bumps on the probe card obtained in Example 1.
- FIG. 6 is a drawing-substituting photograph showing a micrograph (magnification of 5,000 times) of bumps on the probe card obtained in Example 1.
- FIG. 7 is a drawing-substituting photograph showing a micrograph (magnification of 2,000 times) of bumps on the probe card obtained in Example 2.
- Fine droplets Fine droplets
- the probe card manufacturing method of the present invention is characterized in that a fine ink jet method is used to form bumps (hereinafter referred to as a three-dimensional structure or a three-dimensional structure!) To be a probe.
- a fine ink jet method is used to form bumps (hereinafter referred to as a three-dimensional structure or a three-dimensional structure?) To be a probe.
- a micro fluid is caused to fly to a substrate using an electric field, and the solid liquid is rapidly solidified using the quick drying property of micro droplets to form a three-dimensional structure.
- the fine droplets used for the formation of the three-dimensional structure preferably have a droplet diameter of 15 m or less, more preferably 5 ⁇ m or less, even more preferably 3 ⁇ m or less, particularly preferably 1 ⁇ m. m or less.
- the structure formed by the fine droplets (in the present invention, the structure formed by the fine droplets may be referred to as a fine bump or a fine three-dimensional structure, or simply a bump or a three-dimensional structure).
- the diameter is preferably 50 m or less, more preferably 20 m or less, even more preferably 15 m or less, even more preferably 5 / zm or less, even more preferably 3 ⁇ m or less, Particularly preferably, it is 1 ⁇ m or less.
- the interval between the three-dimensional structures (the distance between the nearest wall surfaces of two adjacent three-dimensional structures) is large or small according to the required terminal arrangement.
- You can also Forces that can be manufactured with a probe pitch (15 to 10 O / zm) of ordinary probe cards are naturally possible.
- 10 / zm or less for example, about 5 ⁇ m
- a narrow pitch It is also possible.
- the three-dimensional structure formed by the method for manufacturing a probe card of the present invention is planar. Without a three-dimensional height, preferably with a height equal to or greater than the cross-sectional diameter of the base, in other words, with an aspect ratio of 1 or more, A ratio of 2 or more is preferred Aspect ratio of 3 or more is more preferred Aspect ratio of 5 or more is particularly preferred. If the three-dimensional structure can be self-supported even if there is a slight bending with an upper limit on the height or aspect ratio of the three-dimensional structure, it can be grown to an aspect ratio of 100 or more or 200 or more.
- the height of the three-dimensional structure is preferably 5 to 50 ⁇ 111, more preferably 10 to 30 m in consideration of use as a probe.
- the shape of the three-dimensional structure may be a hollow structure, for example, a cylinder, an elliptical column, a cone, a truncated cone, or a projection shape from above may be a linear shape or a box shape.
- bumps formed by the fine ink jet method are called fine bumps.
- the three-dimensional structure is formed by discharging fine droplets using a fine ink jet method. These fine droplets have an extremely high evaporation rate due to the surface tension and the specific surface area. Therefore, the droplets are dried and solidified (in the present invention, unless otherwise specified, “dry solidification” means that the viscosity of the droplets is increased to such an extent that they can be stacked at least by evaporation drying).
- a structure with a height can be formed by appropriately controlling energy and electric field concentration.
- nozzle a droplet
- the directional stress constantly adheres to the tip of the needle-like fluid ejector (hereinafter also referred to as “nozzle”).
- nozzle a droplet
- Also referred to as” preceding landing droplet acts on the tip of the structure formed by solidification. That is, once the structure begins to grow, the electric field can be concentrated at the top of the structure. For this reason, the discharged liquid droplets can be reliably and accurately attached to the apex of the structure attached in advance.
- the electric field is generated by an electrode provided at a position different from the nozzle that is not applied between the liquid discharge nozzle and the substrate. May be used. Also, the drive voltage, drive voltage waveform, drive frequency, etc. may be changed as the structure grows.
- FIG. (A) shows the initial stage of three-dimensional structure formation.
- fine droplets 102 ejected from the nozzles 101 on the substrate 100 become droplets (droplet solidified product) 103 landed and solidified on the substrate 100.
- (B) shows the middle term.
- a structure 104 is shown in which the droplets land and solidify continuously.
- C shows a later stage, and shows that the three-dimensional structure 105 is formed by concentrating and landing fine droplets at the apex of the deposited structure.
- the liquid material discharged from the fine ink jet for forming the three-dimensional structure is preferably a fluid material having a high dielectric constant and a high conductivity.
- a dielectric constant of 1 or more is more preferable, preferably 2 to: LO, and a conductivity of 10 _5 S Zm or more is preferably used.
- the fluid material is preferably one that easily causes electric field concentration. It is preferable that the dielectric constant of the liquid material and the solid material thereof is higher than that of the substrate material. An electric field is generated on the substrate surface by the voltage applied to the nozzle.
- the density of electric lines of force passing through the liquid becomes higher than that of the non-attached substrate portion.
- This state is called a state where electric field concentration has occurred on the substrate.
- the tip of the structure is polarized by an electric field, or electric lines of force due to its shape are concentrated. The droplets fly along the lines of electric force and are attracted to the highest density part, that is, the tip of the previously formed structure. For this reason, the liquid droplets flying later are selectively deposited on the tip of the structure and the force is surely deposited.
- the substrate is preferably made of a material that can provide good performance when used as a probe card.
- the substrate will be described below.
- the substrate is preferably an insulator.
- the term “flexible” includes elasticity, and flexibility or elasticity enough to absorb variations in bump height). This means that when the bump is brought into contact with the semiconductor chip as a probe, the contact pressure is absorbed.
- bump height variation The contact can be alleviated and evenly contacted (in the present invention, the term “equally contacted” means a state in which a contact state with which conductivity is obtained can be widely secured between a plurality of bumps). Enables highly accurate measurement.
- Examples of the flexible substrate include polyimide, polyethylene terephthalate, and silicone resin
- examples of the low flexibility substrate include glass, silicon, ceramics, and epoxy resin.
- a flexible resin may be provided between the substrate and the three-dimensional structure.
- Flexible rosin is preferably thermoplastic and Z or light curable
- the thickness of the resin layer is not particularly limited, but 1 to: LOOO / z m force is preferable, and 5 to 500 m force is more preferable. Further, it is preferable to provide the resin on the entire surface of the substrate or at least a part below the bumps. At this time, it is not necessary for the bump and the resin to be in contact with each other, and it is sufficient that the resin is located below the bump so as to absorb the variation in the height of the bump. Examples of the method of forming the resin include ejection printing by fine ink jet, patterning by a dispenser or the like, letterpress printing, intaglio printing, exposure technology, laser exposure, laser etching, electron beam exposure, and the like.
- the method of providing electrodes on the substrate and Z or resin includes, for example, ejection formation by fine inkjet, etching, exposure technology, dispensing, letterpress printing, intaglio printing, exposure technology, laser exposure, laser etching, Examples include electron beam exposure.
- the thickness of the electrode is not particularly limited. For example, 0.1 to: LOO / z m is preferable, and 1 to 50 / ⁇ ⁇ is more preferable.
- the electrode material may be a commonly used material, for example, gold, copper, silver and the like.
- the heat resistance of a material used as a probe card such as a substrate, resin, or electrode is preferably 150 ° C or higher, more preferably 200 ° C or higher.
- the liquid material used for forming the three-dimensional structure is, for example, a liquid material containing metal ultrafine particles (for example, a metal ultrafine particle base).
- a liquid material containing metal ultrafine particles for example, a metal ultrafine particle base.
- Polymer solutions such as polybulufenol ethanol solution (for example, Marcarinka (trade name)), ceramic sol-gel solutions, low molecular weight solutions such as oligothiophene, photosensitive curing resin, thermosetting coating Fats and microbead fluids can be used, and one type of these solutions may be used, or a plurality of solutions may be used in combination.
- it is preferable as a probe and it is preferable to use a liquid material containing ultrafine metal particles in order to provide conductivity.
- a metal species of a liquid material containing ultrafine metal particles used in the present invention are examples of a liquid material containing ultrafine metal particles used in the present invention.
- the power of most types of metals or their oxides are gold, silver, copper, platinum, palladium, tungsten, tantalum, bismuth, lead, tin, indium, zinc, titanium, nickel, iron, cobalt, Gold, silver, copper, platinum, or gold, which is more preferable for conductive materials such as aluminum, is particularly preferable. Further, it may be one kind of metal or two or more kinds of metal power alloys.
- the particle size of the ultrafine metal particles is preferably 1 to 100 nm, more preferably 1 to 20 nm, and particularly preferably 2 to 10 nm.
- the three-dimensional structure may be composed of one kind of material or two or more kinds of materials (for example, in a multi-layer structure). However, in order to ensure conductivity as a probe, at least the surface layer portion is formed. Is preferably made of a conductive material. In the case of two or more kinds of materials, it is preferable that the core part (core part) is made of a material having hardness and the surface layer part is made of a material having good conductivity. It is particularly preferable to use it. According to this configuration, it is possible to achieve both strength and conductivity when used as a probe.
- the core portion is composed of a silver material and the surface layer portion is composed of a gold material (in the present invention, the outer surface force of the three-dimensional structure is about 0.1 to:
- the core part preferred to be in the LO / zm range is its interior;).
- the core portion may be formed of a material other than a metal material (for example, a resin material such as a polymer), and the surface layer portion may be formed of a metal material (for example, a gold material).
- FIG. 2 shows an example of a probe card manufactured by the probe card manufacturing method of the present invention as a preferred embodiment.
- a flexible moonlight 205 force is provided on the substrate 201, and the electrode 202 is provided thereon.
- a bump is formed on the top of the tree moon 205.
- the bump has a two-layer structure including a core portion 203 and a surface layer portion 204.
- heat treatment may be performed after bumps are formed (in the present invention, heat treatment includes sintering unless otherwise specified).
- the treatment temperature can be appropriately set according to the properties such as the melting point of the metal or alloy used, and pores are formed inside the bumps (in the present invention, pores are obtained by sintering ultrafine metal particles to each other by heat treatment. It is preferred that the temperature be such that voids are formed.
- the heat treatment temperature is preferably 50 to 300 ° C, more preferably 100 to 250 ° C.
- the heat treatment may be performed by a normal method, for example, laser irradiation, infrared irradiation, high-temperature gas or steam.
- As the atmosphere at the time of heat treatment air, inert gas atmosphere, reduced pressure atmosphere, reducing gas atmosphere such as hydrogen can be used, and in order to prevent oxidation of metal ultrafine particles, a reducing gas atmosphere is used.
- a reducing gas atmosphere is used as the atmosphere at the time of heat treatment.
- the bumps are plastically deformed, and the height can be corrected (variation in bump height is corrected).
- the contact pressure it is possible to use the contact pressure to promote a uniform deformation.
- any number of bumps may be provided on the probe card, but 1 to: LOO, 000 power S is preferable, 10 to 1000 is more preferable, and any arrangement is possible. Also good.
- the size of the probe card is not particularly limited. For example, it is preferable that the equivalent circle diameter when converted to a circle is about 250 mm or less.
- the pitch of the bumps can be widened or narrowed. Therefore, it is possible to design in accordance with the types of bumps used as probe terminals and the specifications of the semiconductor.
- the probe terminal group fine bump group
- the probe terminal group is finely arranged at an extremely high density. It can also be set up.
- the probe terminal group is provided at a high density, for example, 1000 / mm 2 can be used, and 10,000 / mm 2 can also be used.
- the solvent of the liquid material used in the present invention water, tetradecane, toluene, alcohols, and the like can be used. A higher concentration of metal fine particles in the solvent is preferable, and 40% by mass or more and 55% by mass or more are more preferable.
- the fluidity of the solvent, vapor pressure, boiling point, and other properties, as well as the formation conditions of the three-dimensional structure, such as the atmosphere and The temperature can be determined in consideration of the temperature of the substrate, the vapor pressure, the amount of ejected droplets, and the like. This is because, for example, when the boiling point of the solvent is low, the solvent component evaporates during the flight or landing of the droplet, and the charged concentration is often significantly different when landing on the substrate.
- the viscosity of the liquid material used in the present invention is preferably high in order to form a three-dimensional structure, but it needs to be in a range where ink jetting is possible, and care must be taken in determining the viscosity. It also depends on the type of paste. For example, in the case of silver nanopaste, 3 to 50 centipoise (more preferably 8 to 30 centipoise) is preferable.
- the boiling point of the solvent used for the liquid material is not particularly limited as long as it is preferably dried and solidified, but is preferably 300 ° C or lower, more preferably 250 ° C or lower, and more preferably 220 ° C or lower. .
- a material whose viscosity greatly changes due to drying at a certain drying rate can be preferably used as a material for forming a three-dimensional structure.
- the time for drying and solidifying, the flying speed of the droplets, the vapor pressure of the solvent in the atmosphere, etc. can be appropriately set according to the solution as the forming material.
- the drying and solidifying time is preferably 2 seconds or less, more preferably 1 second or less, and more preferably 0.1 second or less.
- the flying speed is preferably 4 mZs or more, more preferably lOmZs or more, more preferably 6 mZs or more. There is no upper limit on the flight speed, but 20mZs or less is practical.
- the atmosphere is preferably performed at a temperature lower than the saturated vapor pressure of the solvent.
- the discharged droplets can be made small, and a three-dimensional structure having a cross-sectional diameter smaller than the diameter of the droplets at the time of discharge can be formed.
- a three-dimensional structure having a cross-sectional diameter smaller than the diameter of the droplets at the time of discharge can be formed.
- Such control is determined by considering the work efficiency such as the formation time of the three-dimensional structure in addition to the target cross-sectional diameter.
- the applied voltage is increased to increase the amount of liquid to be discharged, and the sediment that has been dried and solidified first is dissolved again, and then the voltage is lowered to suppress the liquid volume.
- the method of promoting the deposition and growth in the height direction again can be adopted. In this way, by changing the applied voltage and repeatedly increasing and decreasing the liquid volume, it is possible to control the required cross-sectional diameter to form a three-dimensional structure.
- control range of the cross-sectional diameter is preferably 20 times or less the inner diameter of the nozzle tip and more preferably 5 times or less when the cross-sectional diameter is increased.
- the temperature of the substrate is controlled by controlling the temperature of the substrate surface.
- the volatilization of the liquid can be promoted, and the viscosity of the landing droplet can be increased in a desired time. Therefore, for example, even under conditions where the amount of liquid droplets is large and deposition is usually difficult, heating the substrate surface promotes drying and solidification, allowing the solidification of droplets to be deposited and forming a three-dimensional structure. Can be realized.
- by increasing the speed of drying and solidification it is possible to shorten the droplet discharge interval and improve the working efficiency.
- the substrate temperature control means is not particularly limited, and examples include a Peltier element, an electric heater, an infrared ray heater, a heater using a fluid such as an oil heater, a silicon rubber heater, or a thermistor.
- the substrate temperature is a force that can be appropriately controlled according to the volatility of the fluid or droplet as a material, preferably 20 to 150 ° C, more preferably 25 to 70 ° C, particularly 30 to 50 ° C. preferable.
- the control of the substrate temperature is preferably set so as to be higher than the temperature at which the droplet lands, and is preferably set higher than about 5 ° C, more preferably higher than about 10 ° C.
- the manufacturing method of the present invention does not require a complicated apparatus or the like, and controls the substrate surface temperature.
- a three-dimensional structure can be produced by an industrially preferable method.
- FIG. 3 is a partial cross-sectional view showing one embodiment of a fine ink jet apparatus suitable for carrying out the present invention (in the present invention, fine droplets are caused to fly and adhere by concentration of an electric field.
- the method of depositing the droplets by drying and solidifying to form the fine bumps is called a fine ink jet method, and the droplet discharge device is called a fine ink jet (device).
- a fine ink jet method the droplet discharge device
- a fine ink jet (device) the droplet discharge device
- a fine ink jet (device) In order to realize the size, it is preferable that a low-conductance flow path be provided in the vicinity of the nozzle 1 or the nozzle 1 itself be of a low-conductance.
- a fine glass tube made of glass is suitable, but a conductive material coated with an insulating material is also possible.
- nozzle 1 is preferably made of glass
- the reason why nozzle 1 is preferably made of glass is that it can easily form a nozzle of several meters, and in the case of glass nozzles, the taper angle is added, so the electric field concentrates at the nozzle tip and is not necessary again. This is because the solution moves upward due to surface tension, does not stay at the nozzle end, and does not cause clogging, and has appropriate flexibility.
- the low conductance is preferably 10 to: L0m 3 Zs or less.
- the shape of low conductance is not limited thereto, but, for example, a structure in which the inner diameter of a cylindrical flow path is reduced or the flow resistance is provided inside even if the flow path diameter is the same. For example, a shape provided with a bent, bent, or provided with a valve.
- the inner diameter of the nozzle tip is preferably 0.01 ⁇ m or more for the convenience of production.
- the upper limit of the inner diameter of the nozzle tip is determined by the inner diameter of the nozzle tip when the electrostatic force exceeds the surface tension and the inner diameter of the nozzle tip when the discharge condition is satisfied by the local electric field strength. Is preferred. Further, in view of the amount of droplets to be ejected, it is preferable to adjust the nozzle diameter that is preferably suppressed to an amount that can be cured and deposited by evaporation.
- the inner diameter of the nozzle is affected by the voltage to be applied and the type of fluid to be used, but according to general conditions, 15 m or less is preferable and 10 m or less is more preferable. Furthermore, in order to more effectively use the local electric field concentration effect, the inner diameter of the nozzle tip is particularly preferably in the range of 0.01 to 8 / ⁇ ⁇ .
- the outer diameter of the nozzle tip is appropriately determined according to the inner diameter of the nozzle tip, but is preferably 15 ⁇ m or less, more preferably 10 ⁇ m or less, and particularly preferably 8 ⁇ m or less.
- the nozzle is preferably needle-shaped.
- the nozzle 1 is not limited to a capillary single tube, but may be a two-dimensional pattern nozzle formed by microfabrication. Alternatively, a needle-shaped electrode and a nozzle for supplying fluid may be formed separately and positioned close together!
- the nozzle 1 is made of glass with good formability, use the nozzle as an electrode. Therefore, for example, an electrode made of a metal wire (metal electrode wire) 2 such as a tungsten wire may be inserted into the nozzle 1, or an electrode may be formed in the nozzle by a mesh. In the case where the nozzle 1 itself is formed of a conductive material, an insulating material may be coated thereon. There is no particular restriction on the position where the electrode is disposed, and it is also possible to arrange the reeds on the inner side, the outer side, or a position different from the nozzle.
- the nozzle 1 is filled with a solution 3 to be discharged. At this time, when an electrode is inserted into the nozzle, the electrode 2 is arranged so as to be immersed in the solution 3. Solution (fluid) 3 is supplied from a solution source (not shown). Nozzle 1 is attached to holder 6 by shield rubber 4 and nozzle clamp 5 so that pressure does not leak!
- the pressure adjusted by the pressure regulator 7 is transmitted to the nozzle 1 through the pressure tube 8.
- the nozzle, electrode, solution, shield rubber, nozzle clamp, holder and pressure holder are shown in a side sectional view.
- a substrate 13 is disposed by a substrate support (substrate holder) 14 in the vicinity of the tip of the nozzle.
- the role of the pressure adjusting device used in the method for manufacturing a probe card of the present invention is to adjust the conductance or to the inside of the nozzle, rather than the force that can be used to push out the fluid by applying high pressure to the nozzle force. It is particularly effective for use in filling of the solution of this, removal of nozzle clogs, and the like. It is also effective for controlling the position of the liquid level and forming a meniscus. It also plays a role in controlling the minute discharge amount by controlling the force acting on the liquid in the nozzle by adding a phase difference with the voltage pulse.
- the discharge signal from the computer 9 is sent to the arbitrary waveform generator 10 and controlled.
- the arbitrary waveform voltage generated from the arbitrary waveform generator 10 is transmitted to the electrode 2 through the high voltage amplifier 11.
- the solution 3 in the nozzle 1 is charged by this voltage. This increases the concentrated electric field strength at the tip of the nozzle.
- FIG. 4 schematically shows a state in which conductive ink (fluid for droplets) is injected into a nozzle having an inner diameter d at the tip of the nozzle and positioned perpendicular to the height of the infinite plate conductor cover h.
- Is. R indicates the direction parallel to the infinite flat conductor, and Z is the vertical axis ( (Height) direction is shown.
- L indicates the length of the flow path, and p indicates the radius of curvature.
- Q is the charge induced at the nozzle tip.
- Q ' is a mirror image charge with the opposite sign induced at a symmetrical position in the substrate. For this reason, it is not necessary to make the substrate 13 or the substrate support 14 conductive or to apply a voltage to the substrate 13 or the substrate support 14 unlike the prior art. Further, by increasing the concentration electric field strength concentrated on the nozzle tip, the applied voltage is reduced. Further, the voltage applied to the electrode 2 may be either positive or negative.
- the distance between the nozzle 1 and the substrate 13 (hereinafter, unless otherwise specified, “the distance between the nozzle and the substrate” refers to the distance from the nozzle tip to the surface on the nozzle side of the substrate). It can be adjusted as appropriate according to the landing accuracy by force, or the amount of evaporation of droplets in flight, that is, the increase in viscosity of droplets by drying during flight. Further, it may be adjusted according to the growth of the structure so as to obtain a higher aspect ratio. On the contrary, in order to avoid the influence of the adjacent structure, the tip of the nozzle may be arranged at a position lower than the height of the adjacent structure.
- the distance between the nozzle 1 and the substrate 13 is preferably 500 m or less.
- 100 m or less is preferable.
- 50 m or less is more preferable.
- over 5 m is preferred so as not to get too close, over 20 / z m is more preferred.
- feedback control is performed by detecting the nozzle position so that the nozzle 1 is kept constant with respect to the substrate 13.
- the substrate 13 may be placed and held in a conductive or insulating substrate holder.
- the height of the bumps can be controlled by the discharge time, voltage change, substrate temperature, nozzle height, and the like.
- the thickness of the bump the three-dimensional structure is more easily formed as the discharge amount is decreased.
- the landed object that has started to grow is likely to become an elongated structure because it grows rapidly.
- the fine ink jet device used in the method for producing a probe card of the present invention is compact and has a high degree of freedom of installation, and therefore can perform multi-nozzle filing.
- the fine ink jet apparatus can be preferably used.
- the voltage to be applied is preferably a pulse voltage with an optimized duty ratio, an alternating current, and an alternating current with a DC bias, but may be a direct current.
- the probe card manufacturing method of the present invention it is practical to adjust the position of forming the structure by placing a substrate holder on the X-Y-Z stage and operating the position of the substrate 13. Regardless of this, it is also possible to place nozzle 1 on the X-Y-Z stage. Further, the distance between the nozzle and the substrate can be adjusted to an appropriate distance using a position fine adjustment device. Furthermore, the nozzle position can be kept constant with an accuracy of 1 ⁇ m or less by moving the Z-axis stage with closed-loop control based on the distance data from the laser rangefinder.
- a vector scan method may be employed in addition to the raster scan method.
- a single-nozzle inkjet to draw a circuit by vector scanning itself is described in, for example, Journal of icroelectromechanical systems, b. B. Fuller et al. , Vol. 11, No.l, p.54 (2002).
- raster scanning During raster scanning, newly developed control software may be used so that the drawing location can be specified interactively on the computer screen.
- complex pattern drawing can be automatically performed by reading a vector data file.
- raster scanning method a method performed by a normal printer can be used as appropriate.
- vector scan method a method used in a normal plotter can be used as appropriate.
- the stage in the case of raster scanning, is preferably moved at a pitch of 1 ⁇ m to 100 ⁇ m and linked with the movement, and ejection can be performed by voltage pulses.
- the stage in the case of vector scanning, the stage can be moved continuously based on vector data. According to these discharge position adjusting methods in the probe card manufacturing method of the present invention, the formation position of the three-dimensional structure can be quickly adjusted to a free position by setting and inputting control data.
- the probe card manufacturing method of the present invention since the liquid droplets ejected from the fine ink jet are fine, force depending on the type of solvent used for the ink is instantly evaporated and the liquid droplets instantaneously. Fixed on the spot.
- the drying speed at this time is orders of magnitude faster than the speed at which droplets with a size of several tens of ⁇ m are dried by the conventional ink jet technology. This is because the vapor pressure becomes extremely high due to the finer droplets. Therefore, fine bumps can be formed in a short time.
- one bump (depending on material, structure, size, etc.) can be formed preferably in 0.1 to 300 seconds. Preferably, it can be formed in 5 to 120 seconds. In conventional ink jet technology using a piezo method or the like, it is difficult to form bumps that are fine enough to be formed by the manufacturing method of the present invention in a short time, and landing accuracy is also poor.
- a probe card of the present invention According to the method for manufacturing a probe card of the present invention, it is possible to form fine bumps whose aspect ratio can be freely set with high accuracy and productivity, and to provide a precise and highly accurate probe force mode. Can do. Sarakuko can also manufacture interposers and laminated substrates by applying the probe card manufacturing method of the present invention.
- the probe card manufacturing method of the present invention a prototype can be easily made without the need for a photomask or a mold that requires very little energy consumption. In addition, there is an advantage that the necessary amount of resources can be invested in the necessary place.
- the probe card obtained by the production method of the present invention is an electronic component, a display element, an IC, an LSI, a biochip. It can be used in the field of inspection technology for various electronic components such as bio-type electrodes and bio-electronics.
- a silver ultrafine particle paste (produced by Harima Kasei Co., Ltd., silver nanopaste, silver content 58 mass%, specific gravity 1.72, viscosity 8.4 cps) was ejected by the ink jet shown in FIG.
- a bump core was formed on the substrate.
- the inner diameter of the nozzle tip is 1 ⁇ m, room temperature (22 ° C) atmosphere, the voltage applied to the paste in the nozzle is about 450 V at the peak AC voltage, and the distance between the nozzle and the substrate is about Each was set to 100 m.
- the time required to form the core of one bump was 10 seconds.
- a gold particulate paste (Bruno, Lima Kasei, gold nano paste NPG- J, gold content: 66.9 mass 0/0, specific gravity 2. 15, Viscosity 29. Ocps) was discharged to form the surface layer of the bump, and a probe card was produced.
- the time required to form the surface layer of one bump was 5 seconds.
- the inner diameter of the nozzle tip is l / zm, room temperature (22 ° C) atmosphere, the voltage applied to the paste in the nozzle is about 200V at AC peak 'peak' peak voltage, and the distance between nozzle and substrate is Each was set to about 100 ⁇ m.
- the cross section diameter of the probe card bump (the total of the core and surface layers) was about 5 ⁇ m, the height was about 20 ⁇ m, and the pitch of each bump was 50 ⁇ m.
- Figure 5 shows laser micrographs of the six bumps that were formed.
- FIG. 6 shows a photomicrograph (magnification 5,000 times) in which one of the bumps in FIG. 5 is further enlarged.
- a bump core portion was formed in the same manner as the bump core portion forming method shown in Example 1, except that the nozzle was swung at a turning radius of 7.5 m.
- a bump surface layer portion was formed in the same manner as in the bump surface layer portion formation method described in Example 1, and a probe card was prepared.
- the bump on the fabricated probe card has a hollow frustoconical shape, the wall thickness is about 3 ⁇ m, the frustoconical section diameter near the tip is about 8 m, and the height is about 40 m. Atsuta o
- FIG. 7 a micrograph (magnification of 2,000 times) of the formed bump is placed.
- the probe card obtained by the manufacturing method of the present invention can be used in the field of inspection technology for various electronic parts such as electronic parts, display elements, ICs, LSIs, biochips, biomedical electrodes, and the bioelectronics field. it can.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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CN2005800491394A CN101142487B (zh) | 2005-01-31 | 2005-12-09 | 探针卡及其制造方法 |
US11/883,226 US7683646B2 (en) | 2005-01-31 | 2005-12-09 | Probe card and method of producing the same by a fine inkjet process |
EP05814723.2A EP1845382B1 (en) | 2005-01-31 | 2005-12-09 | Probe card and method for manufacturing same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2005024117A JP4798557B2 (ja) | 2005-01-31 | 2005-01-31 | プローブカード、およびその製造方法。 |
JP2005-024117 | 2005-01-31 |
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WO2006080146A1 true WO2006080146A1 (ja) | 2006-08-03 |
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PCT/JP2005/022614 WO2006080146A1 (ja) | 2005-01-31 | 2005-12-09 | プローブカード、およびその製造方法。 |
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US (1) | US7683646B2 (ja) |
EP (1) | EP1845382B1 (ja) |
JP (1) | JP4798557B2 (ja) |
CN (1) | CN101142487B (ja) |
WO (1) | WO2006080146A1 (ja) |
Families Citing this family (9)
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KR100971732B1 (ko) * | 2008-08-06 | 2010-07-21 | 윌테크놀러지(주) | 프로브 본딩 방법과 이를 포함하는 프로브 카드의 리페어방법 |
JP2010087208A (ja) * | 2008-09-30 | 2010-04-15 | Fujifilm Corp | 立体構造物の形成方法、半導体装置の製造方法、および半導体装置 |
US7880489B2 (en) * | 2008-11-04 | 2011-02-01 | Formfactor, Inc. | Printing of redistribution traces on electronic component |
JP2010238825A (ja) * | 2009-03-30 | 2010-10-21 | Murata Mfg Co Ltd | 導電性インク、バンプ形成方法及び電子部品 |
JP5427536B2 (ja) * | 2009-10-01 | 2014-02-26 | 東京エレクトロン株式会社 | プローブカード |
EP3023385A1 (en) * | 2014-11-19 | 2016-05-25 | Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO | System and method for manufacturing a micropillar array |
US20200233033A1 (en) * | 2019-01-17 | 2020-07-23 | Intel Corporation | Test probe for wafer-level and panel-level testing |
JP2021043054A (ja) * | 2019-09-11 | 2021-03-18 | 国立大学法人東北大学 | プローブ、プローブユニットおよびプローブカード、並びに、それらの製造方法 |
KR102194251B1 (ko) * | 2019-11-21 | 2020-12-22 | (재)한국나노기술원 | 반도체 디바이스를 검사하기 위한 테스트 콘택터 |
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JPH10140325A (ja) * | 1996-11-08 | 1998-05-26 | Vacuum Metallurgical Co Ltd | 微小な金属バンプ |
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JP2004165587A (ja) * | 2002-02-21 | 2004-06-10 | National Institute Of Advanced Industrial & Technology | 超微細流体ジェット装置 |
JP2005109467A (ja) * | 2003-09-12 | 2005-04-21 | National Institute Of Advanced Industrial & Technology | 基板及びその製造方法 |
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DE3107079A1 (de) * | 1981-02-25 | 1982-09-09 | Siemens AG, 1000 Berlin und 8000 München | Partielle beschichtung von kontaktbauteilen mit edelmetallen |
TW324847B (en) * | 1996-12-13 | 1998-01-11 | Ind Tech Res Inst | The structure of composite bump |
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JP3988227B2 (ja) * | 1997-12-01 | 2007-10-10 | 日立化成工業株式会社 | 半導体チップ搭載用基板の製造法および半導体装置 |
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JP3900248B2 (ja) * | 2001-03-30 | 2007-04-04 | ハリマ化成株式会社 | 多層配線板およびその形成方法 |
JP2003218149A (ja) | 2002-01-22 | 2003-07-31 | Seiko Epson Corp | 電子部品製造方法及び電子部品、半導体装置の製造方法並びに電子機器 |
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2005
- 2005-01-31 JP JP2005024117A patent/JP4798557B2/ja active Active
- 2005-12-09 EP EP05814723.2A patent/EP1845382B1/en not_active Not-in-force
- 2005-12-09 US US11/883,226 patent/US7683646B2/en active Active
- 2005-12-09 WO PCT/JP2005/022614 patent/WO2006080146A1/ja active Application Filing
- 2005-12-09 CN CN2005800491394A patent/CN101142487B/zh not_active Expired - Fee Related
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JPH0772171A (ja) * | 1993-09-03 | 1995-03-17 | Toshiba Corp | 配線板用電気検査治具 |
JPH10140325A (ja) * | 1996-11-08 | 1998-05-26 | Vacuum Metallurgical Co Ltd | 微小な金属バンプ |
JP2002340933A (ja) * | 2001-05-17 | 2002-11-27 | Seiko Epson Corp | 半導体装置の検査治具およびその製造方法 |
JP2004165587A (ja) * | 2002-02-21 | 2004-06-10 | National Institute Of Advanced Industrial & Technology | 超微細流体ジェット装置 |
JP2005109467A (ja) * | 2003-09-12 | 2005-04-21 | National Institute Of Advanced Industrial & Technology | 基板及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
CN101142487B (zh) | 2010-05-26 |
US7683646B2 (en) | 2010-03-23 |
EP1845382A4 (en) | 2010-06-23 |
US20080111567A1 (en) | 2008-05-15 |
JP2006208324A (ja) | 2006-08-10 |
EP1845382A1 (en) | 2007-10-17 |
CN101142487A (zh) | 2008-03-12 |
JP4798557B2 (ja) | 2011-10-19 |
EP1845382B1 (en) | 2013-05-22 |
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