WO2006075760A1 - 変調機能付光源装置とその駆動方法 - Google Patents
変調機能付光源装置とその駆動方法 Download PDFInfo
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- WO2006075760A1 WO2006075760A1 PCT/JP2006/300551 JP2006300551W WO2006075760A1 WO 2006075760 A1 WO2006075760 A1 WO 2006075760A1 JP 2006300551 W JP2006300551 W JP 2006300551W WO 2006075760 A1 WO2006075760 A1 WO 2006075760A1
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- 238000000034 method Methods 0.000 title claims description 32
- 239000004065 semiconductor Substances 0.000 claims abstract description 132
- 230000003287 optical effect Effects 0.000 claims abstract description 76
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- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
- G02F1/3534—Three-wave interaction, e.g. sum-difference frequency generation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
- G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/433—Modulation spectrometry; Derivative spectrometry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B2006/12083—Constructional arrangements
- G02B2006/12097—Ridge, rib or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0078—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping for frequency filtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0092—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping for nonlinear frequency conversion, e.g. second harmonic generation [SHG] or sum- or difference-frequency generation outside the laser cavity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4012—Beam combining, e.g. by the use of fibres, gratings, polarisers, prisms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
Definitions
- the present invention relates to a visible, mid-infrared or infrared light source using a second harmonic generation, difference frequency generation, or sum frequency generation effect generated in a nonlinear optical medium, and more particularly, the intensity of generated light. It is related with the light source device with a modulation function which can change.
- FIG. 1 shows a configuration of a conventional quasi phase matching type wavelength conversion element. Pumping light A (wavelength ⁇ ) from a semiconductor laser light source and pumping light ⁇ (wavelength ⁇ ) from another semiconductor laser light source
- the excitation light ⁇ is converted into a difference frequency light C having a wavelength
- the difference frequency light C and the excitation light B are separated by the duplexer 13.
- excitation light A having relatively high intensity and excitation light B are combined by a multiplexer 11 and incident on a nonlinear waveguide 12 having a polarization inversion structure.
- wavelength-converted light C of the excitation light A and the excitation light B is generated and emitted from the waveguide 12.
- the wavelength of excitation light A is set to 1.06 / m
- the wavelength of excitation light B is set to 1.
- a yellow visible light source using a wavelength conversion element by sum frequency generation can be used as a light source for refractive index measurement, instead of the conventional D-line light source of a Na lamp.
- a yellow visible light source using a wavelength conversion element using sum frequency generation has a significant effect on increasing the sensitivity of optical instruments using visible light such as a fluorescence microscope.
- a 1.06 ⁇ m semiconductor laser whose wavelength is stabilized by using an external resonator using a fiber Bragg grating (FBG) as excitation light, and an oscillation wavelength
- FBG fiber Bragg grating
- a DFB (Distributed Feedback) laser with a wavelength of 1.32 xm, a multiplexing means such as a WDM coupler, and a modularized wavelength conversion element are mounted on the case.
- the light source used as the excitation light is preferably a single-mode oscillating light source such as a DBR (Distributed Bragg Reflector) laser or a DFB laser.
- DBR Distributed Bragg Reflector
- the FBG is a fiber optic device in which a Bragg diffraction grating is formed in the core portion of an optical fiber, and has a characteristic of reflecting only light of a specific wavelength.
- a Bragg diffraction grating is formed in the core portion of an optical fiber, and has a characteristic of reflecting only light of a specific wavelength.
- it is widely used as a wavelength control element, optical sensor element, and dispersion compensation element because of its low loss, good coupling characteristics with optical fibers, and excellent reflection characteristics. It's being used.
- a DFB laser creates a periodic shape inside a laser chip, acts as a diffraction grating, and reflects only light of a specific wavelength, thereby confining the light in an active region, and It is a semiconductor laser that oscillates.
- the monochromaticity of the wavelength of the laser beam is excellent, and it is suitable for transmission of optical signals of several kilometers or more.
- FIG. 2 shows the quasi-phase matching conditions for obtaining green light having a wavelength of 0.53 ⁇ m by second harmonic generation.
- Lithium niobate is used as the nonlinear optical material and the polarization inversion period is 6.
- This figure shows the calculated quasi-phase matching curve when using a wavelength converter with a length of 76 mm and a length of 10 mm.
- the horizontal axis represents the wavelength of the excitation light, and the vertical axis represents the normalized second-harmonic light intensity.
- the quasi-phase matching band is less than 0.2 nm. Therefore, the oscillation wavelength of a 1.06 xm semiconductor laser needs to be stabilized within the spectral width of 0.2 nm.
- wavelength stabilization is an indispensable requirement because the quasi-phase matching bandwidth of the wavelength conversion element used to obtain visible light is narrow.
- the wavelength-converted light C generated under such conditions has a coherent characteristic that inherits the characteristics of the semiconductor laser, which is the excitation light, and can be used as a visible light source to increase the sensitivity of refractive index measurement.
- it is effective in increasing the sensitivity of fluorescent protein observation with a fluorescence microscope.
- it is necessary to increase the extinction ratio, and it is important to have a ⁇ N / ⁇ FF modulation function.
- ON / OFF modulation has been performed by using a semiconductor laser alone as a visible light source or by connecting an AO modulator to a solid-state laser. That is, the ON / OFF modulation function has not yet been realized in a light source that generates a difference frequency or a sum frequency using an optical waveguide made of a nonlinear optical material and two semiconductor laser light sources.
- FIG. 3 shows the current-to-light output characteristics of a 1.06- ⁇ m semiconductor laser with an external FBG connected.
- This FBG-connected semiconductor laser normally has a reflection band of about 2 nm by FBG, and is in a multimode state in which multiple wavelengths oscillate within that range.
- Differentiated light output by current is called differential efficiency.
- APC optical output stabilization control
- Fig. 11A shows the current-optical output characteristics of a 1.32 xm band DFB laser. 1.
- the wavelength-converted light output is turned ON / OFF based on the current-optical output characteristics shown in Fig. 11A, and the light source device with modulation function can have a conversion function. wear.
- the differential efficiency is indicated by a broken line. Except for the threshold, there is no discontinuity in the differential efficiency characteristics, and there is no module jump at the oscillation wavelength.
- the operating current of the 1.32 z m-band DFB laser is used up to 300 mA, the temperature inside the device rises, and the force oscillation wavelength, which is a single wavelength, moves by about 0.8 nm.
- the fluctuation range of the oscillation wavelength of 0.8nm is more than 4 times wider than the quasi phase matching band described above.
- the portion outside the quasi-phase matching band does not contribute to the wavelength converted light.
- the current can only flow up to about 80mA, which is about 1mA4 with an operating current of 300mA, and the resulting optical output is reduced to about 1/4.
- the output intensity of the wavelength-converted light is similarly reduced to about 1Z4. Because of this, it was not possible to obtain a practical output intensity of wavelength-converted light by simply modulating with a 1.32 x m-band DFB laser.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2003-140214
- the present invention has been made in view of such problems, and an object of the present invention is to provide a light source device that includes a quasi phase matching type wavelength conversion element and emits a difference frequency or a sum frequency. Another object of the present invention is to provide a light modulation method and a light source device with a modulation function for performing modulation while ensuring practical light intensity.
- One aspect of the light source device with a modulation function includes an optical waveguide made of a nonlinear optical material having a structure in which a nonlinear constant is periodically modulated, and the optical waveguide has first and second wavelengths different from each other.
- a light source device that outputs a difference frequency generated by combining and entering excitation light from two semiconductor laser light sources, or a light source that outputs second harmonics from a second semiconductor laser light source.
- the second semiconductor laser light source is configured to modulate the semiconductor laser, the FBG, and the semiconductor laser, and the reflection band of the FBG is larger than the resonance wavelength interval determined by the element length of the semiconductor laser. narrow.
- the lower limit of the current modulation amplitude to the second semiconductor laser light source is equal to or less than a threshold value, and the emission wavelength is quasi phase matching of a nonlinear optical material.
- the wavelength can be set to the short wavelength side of the band, and the upper limit can be set to a current value lower than the current value that gives the first kink that occurs in the current-optical output characteristics.
- a force S can be added to the FBG.
- the optical waveguide having a nonlinear optical material force having a structure in which the nonlinear constant is periodically modulated is provided, and excitation light from the first and second semiconductor laser light sources having different wavelengths is supplied to the optical waveguide.
- the first semiconductor The laser light source has a built-in diffraction grating and includes means for modulating the output light emitted from the semiconductor laser.
- the lower limit of the current modulation amplitude for the first semiconductor laser light source is equal to or less than the threshold, and the emission wavelength immediately after the threshold is
- the upper limit of the current modulation amplitude is set to be shorter than the peak wavelength of the pseudo phase matching band of the nonlinear optical material, and the output wavelength immediately after the threshold value. Longer wave side It may be a current value as a long.
- the first semiconductor laser light source includes means for modulating output light emitted from the semiconductor laser and can be synchronized with each other.
- the nonlinear optical crystal is LiNbO
- At least one selected from the group consisting of Mg and Zn as an additive is at least one selected from the group consisting of Mg and Zn as an additive.
- the light source device with a modulation function can be incorporated into a fluorescence microscope apparatus.
- an optical waveguide having a first semiconductor laser, a second semiconductor laser, and a nonlinear optical material force having a structure in which a nonlinear constant is periodically modulated.
- a light modulation method using a light source device comprising: a second semiconductor laser; Emitting the modulated light, entering the light modulated in the emitting step into an FBG having a reflection band narrower than the resonant wavelength interval determined by the element length of the second semiconductor laser, and the first The step of combining the light emitted from the semiconductor laser and the light emitted from the FBG to enter the optical waveguide, and the difference frequency of the light from the first and second semiconductor lasers from the optical waveguide, Or a step of emitting a sum frequency.
- the method further includes the step of entering the light emitted from the FBG into the isolator, and the step of entering the optical waveguide is emitted from the first semiconductor laser.
- a step of combining the light and the light emitted from the isolator can be provided.
- the method may further comprise a step of controlling the temperature of the FBG within a certain range.
- the lower limit of the current amplitude modulation to the second semiconductor laser light source is not more than a threshold value, and the emission wavelength is shorter than the quasi phase matching band of the nonlinear optical material.
- setting the upper limit of the current amplitude modulation to be a current value lower than the current value that provides the first kink that occurs in the current-to-light output characteristics.
- a sum frequency comprising a first semiconductor laser having a built-in diffraction grating, a second semiconductor laser, and an optical waveguide made of a nonlinear optical material having a structure in which a nonlinear constant is periodically modulated is provided.
- the step of emitting modulated light from the first semiconductor laser, the light emitted from the first semiconductor laser, and the light emitted from the second semiconductor laser force A step of combining and entering the optical waveguide; a step of emitting a difference frequency or a sum frequency of light from the first and second semiconductor lasers from the optical waveguide; and a current amplitude modulation for the first semiconductor laser light source
- the light modulation of the second semiconductor laser is synchronized with the light modulation.
- the method may further comprise the step of modulating the light of the first semiconductor laser.
- a light source device with a modulation function having practical light intensity can be manufactured.
- fluorescence protein observation using a fluorescence microscope is possible. The sensitivity can be increased.
- FIG. 1 is a diagram for explaining the principle of wavelength conversion according to the present invention.
- FIG. 2 is a diagram showing a quasi-phase matching curve for obtaining green light having a wavelength of 0.53 ⁇ m by second harmonic generation.
- FIG. 3 is a diagram for explaining direct modulation of a conventional 1 ⁇ 064 / m band laser.
- FIG. 4 is a diagram showing a manufacturing process of a wavelength conversion element.
- FIG. 5 is a diagram showing a wavelength conversion element module.
- FIG. 6 is a diagram showing a configuration of a light source device with a modulation function according to the present invention.
- FIG. 7A is a diagram for explaining the direct modulation of the 1.064 / m band laser in Example 1.
- FIG. 7B is a diagram showing the laser drive current dependence of the center wavelength of the 1 ⁇ 064 / im band laser of Example 1.
- FIG. 8A is a diagram for explaining the direct modulation of the 1.064z m-band laser of Example 2.
- FIG. 8B is a diagram showing the laser drive current dependence of the center wavelength of the 1.064 ⁇ m band laser of Example 2.
- FIG. 9 is a diagram showing a configuration of a light source device with a modulation function according to a third embodiment.
- FIG. 10 is a diagram illustrating a configuration of a light source device with a modulation function according to a fourth embodiment.
- FIG. 11A is a diagram illustrating direct modulation of a 32 ⁇ m band DFB laser.
- FIG. 11B is a diagram showing the laser drive current dependence of the center wavelength of a 1.32 x m-band DFB laser.
- FIG. 12 is a diagram showing a configuration in which the light source device with a modulation function of the present invention is incorporated in a fluorescence microscope apparatus.
- FIG. 13 is a flowchart illustrating a method for driving a light source device with a modulation function according to the present invention.
- FIG. 14 is a diagram showing the IL characteristics of the 1 ⁇ 064 / im band laser of Example 5.
- FIG. 15 shows the laser drive current dependence of the center wavelength of the 1 ⁇ 064 / im band laser in Example 5.
- FIG. 16 is a diagram showing a configuration of a light source device with a modulation function in which feedback is applied to the drive current of the laser with FBG so that the output light intensity of the present invention is constant.
- FIG. 17 is a diagram showing the time change of the laser output intensity when the laser is operated in a thermostatic chamber that changes from 10 ° C. to 40 ° C.
- FIG. 18 is a flowchart illustrating a method for driving a light source device with a modulation function according to the present invention.
- a 1.32 ⁇ band DFB laser or narrow band as an excitation light source.
- a light source device with a practical modulation function could be realized by modulating the drive current of a 1.06 ⁇ m semiconductor laser whose wavelength was stabilized by a single band FBG.
- a light source device with a practical modulation function can also be realized by synchronously modulating the drive current of a 1.32 ⁇ -band DFB laser and a specific drive method with a 1.06 ⁇ semiconductor laser. I also found out.
- Example 1 a wavelength conversion element module using LiNbO as a nonlinear optical material is used.
- a light source device with modulation function that outputs wavelength-converted light by using a 1.064 xm semiconductor laser with a FBG, stabilized wavelength, and a 1.3 ⁇ m band tunable laser as the pumping light source. Is made.
- FIG. 4 shows a manufacturing process of the wavelength conversion element.
- a wavelength conversion element is manufactured using a ridge waveguide structure using a directly bonded substrate. That is, a Z-cut Zn-doped LiNbO substrate 51 in which a periodic domain-inverted structure is prepared in advance as the first substrate, and the second substrate
- a wavelength conversion element by bonding a Z-cut Mg-added LiNbO substrate 52
- the substrates are all 3-inch wafers that are optically polished on both sides, and the substrate thickness is 300 zm.
- Ridge waveguides confine light in two directions (two dimensions) perpendicular to the light propagation direction. It is an optical waveguide with a small optical loss.
- first substrate 51 and second substrate 52 are rendered hydrophilic by normal acid cleaning or alkaline cleaning
- the two substrates are superposed in a clean atmosphere.
- the overlapped first substrate 51 and second substrate 52 are placed in an electric furnace and subjected to diffusion bonding by heat treatment at 500 ° C. for 3 hours.
- the bonded substrate is void-free and does not crack when returned to room temperature.
- polishing is performed until the thickness of the first substrate 51 of the bonded substrate becomes 6 ⁇ m.
- a polishing surface having a mirror surface can be obtained by polishing after the polishing process.
- the polished thin film substrate is set on a dicing saw, and a ridge waveguide having a waveguide width of 10 ⁇ m is fabricated by precision processing using a diamond blade having a particle diameter of 4 ⁇ m or less.
- the produced single-mode ridge waveguide is cut into a strip shape from the substrate, and the end face of the waveguide is optically polished to produce a wavelength conversion element having a length of 60 mm.
- non-doped LiNbO when a LiTaO substrate is used as the second substrate 52
- a long conversion element can be produced.
- a substrate thickness of 200 / im or more and lmm or less can be used.
- FIG. 5 shows the wavelength conversion module.
- the wavelength conversion module is a device that emits wavelength-converted light of difference frequency light or sum frequency light by a nonlinear optical effect when combined excitation light is incident.
- a polarization-maintaining single-mode optical fiber 64 is fused and connected to the fabricated wavelength conversion element 61.
- the wavelength conversion element 61 is bonded to the carrier 62 and mounted in a package 66 containing a Peltier element 67 for temperature adjustment.
- a wavelength conversion module is manufactured by optically coupling with an input fiber using a lens 63 via a finoleta 65.
- FIG. 6 shows a light source device with a modulation function using the produced wavelength conversion module.
- the input side fiber of the wavelength conversion element module 75 and the output fiber of the 1. 06 / 1.32 x mWDM coupler 74 are fusion-spliced.
- the FBG73 is fused and connected to the 1.06 ⁇ input fin 70a of the WDM coupler 74, and the FBG73 and the 1.064 ⁇ m band semiconductor laser 71 are fused.
- the FBG73 is located outside the 1.064 xm band semiconductor laser 71.
- the output fiber of 1.32 mDFB laser 7 2 is fused to the 1 ⁇ 32 / im input fiber 70b of the WDM coupler 74. 1.
- 064 ⁇ -band semiconductor laser 71 is connected to temperature control device 76 and No.
- a light source device with a modulation function is completed by connecting a temperature control device 78 and a DC drive power source 79 to the laser 72 via connection lines 80c and 80d.
- the temperature of the 064 xm band semiconductor laser 7 1 and the 1. band DFB laser 72 is kept constant by the temperature control devices 76 and 78, respectively.
- the 1. 064 M m band semiconductor laser 71 is controlled Ri by the pulsed power supply 77, 1.
- band DFB laser 72 is controlled by a DC drive power source 79.
- the FBG 73 has a reflection band of 0.1 nm which is narrower than the resonance wavelength interval of 0.12 nm determined by the element length of 1.2 mm of the 1.064 ⁇ m band semiconductor laser 71 having a reflectivity of 20%.
- the 1.064 ⁇ m semiconductor laser 71 with FBG73 and stabilized wavelength operates in principle at a single wavelength, but as the current increases, the wavelength shifts to the longer wavelength side due to heat generation. . 1.
- the wavelength band FBG of the output light emitted from the 064 / im semiconductor laser 71 is passed, the mode jump to another mode occurs in the reflection band.
- a kink that causes discontinuity of light output occurs (Fig. 7A).
- the output light emitted from the 1.064 / m semiconductor laser 71 having the wavelength stabilized by providing the FBG 73 has a continuous and smooth differential efficiency characteristic except at the position where the optical output kinks occur.
- the force output light 6mW that generates noise at the kink position is obtained, and the wavelength conversion light of 0.59 / im is turned on at 10Mb / s under the condition that the noise is 10% or less between the peaks. / OFF modulation was possible.
- Example 1 it is possible to use a force of 20 pm or less and a force of 10 pm or less using a FBG reflection band of 0.1 nm.
- a light source device with a modulation function having the same configuration as that of the first embodiment is used.
- the driving conditions of the panelless driving power source 77 are limited.
- FIG. 8B shows the current-light output characteristics at that time.
- Example 2 as in Example 1, The output light emitted from the 064 / m semiconductor laser 71 with FBG73 stabilized wavelength has a continuous and smooth differential efficiency characteristic except at the position where the optical output kinks occur.
- the first kink current value in the current-optical output characteristic is set to be approximately the maximum.
- the lower limit of the current modulation range is equal to or less than the threshold value
- the upper limit is set to a current value slightly lower than the current value that gives the first kinking that occurs in the current-light output characteristics.
- FIG. 9 shows a light source device with a modulation function provided with an isolator 81 immediately after the FBG 73.
- the input side fiber of the wavelength conversion element module 75 and the output fiber of the 1. 06/1. 32 x mWDM coupler 74 are fusion-spliced.
- an isolator 81 is fused to the 1 ⁇ 06 ⁇ -filled cuff fiber 70 a of the WDM coupler 74.
- the FBG 73 is fused and connected to the isolator 81, and the FBG 73 and the 1.064 / im band semiconductor laser 71 are fused and connected.
- the FBG 73 is located outside the 1.064 / im band semiconductor laser 71.
- the output fiber of the 1 ⁇ 32 t mDFB laser 72 is fused and connected to the 1 ⁇ 32 / i m input fiber 70b of the WDM coupler 74.
- 1.064 / m band semiconductor laser 71 is connected to temperature control device 76 and pulse drive power supply 77 via connection lines 80a and 80b.
- 32 m band DFB laser 72 is connected to temperature control device
- the light source device with a modulation function is completed by connecting 78 and the DC drive power source 79 via connection lines 80c and 80d.
- the influence of the reflected return light changes due to changes in the state of the device due to changes in the operating environment temperature, etc., and the operation of the 1.064 xm band semiconductor laser is not effective. It becomes stable. Therefore, by using the isolator 81 immediately after the FBG 73, the operation of the 1.064 zm band semiconductor laser can be used stably in terms of time.
- Figure 10 shows a light source device with a modulation function in which a temperature control function 91 is added to the FBG73.
- the input side fiber of the wavelength conversion element module 75 and the output fiber of the 1. 06/1. 32 x mWDM coupler 74 are fusion-spliced.
- an isolator 81 is fused to the 1 ⁇ 06 ⁇ -filled cuff fiber 70 a of the WDM coupler 74.
- the FBG 73 is fused and connected to the isolator 81, and the FBG 73 and the 1.064 zm band semiconductor laser 71 are fused and connected.
- connection line 90 is fused to the FBG 73, and the FBG 73 and the temperature control device 91 are connected by the connection line 90.
- the FBG 73 is located outside the 1.064 zm band semiconductor laser 71.
- the 1.32 xm human power fino 70b of the WDM cutler 74 and the output fino of the 1.32 ⁇ m DFB laser 72 are fusion spliced.
- thermocontrol 76 and pulse drive power source 77 are connected to 064 zm band semiconductor laser 71 via springs 80a and 80b, and 1.32 ⁇ m band DFB laser 72 has temperature
- the light source device with a modulation function is completed by connecting the control device 78 and the DC drive power source 79 via connection lines 80c and 80d.
- the temperature of the FBG73 is not controlled, assuming that the temperature of the usage environment is stable. However, it can be used in places where the ambient temperature changes significantly during the day. In such a case, there is a problem that the oscillation wavelength of the excitation light changes and the wavelength of the converted light changes accordingly. Therefore, temperature control function 91 is added to FBG73.
- the light source device with a modulation function can be used without any change in the characteristics even if the operating environment temperature changes from 10 ° C to 45 ° C.
- a configuration without the isolator 81 can be used depending on the force specification in which the isolator 81 is used.
- Example 5 a light source device with a modulation function having the same configuration as in Example 1 was used, and the modulation operation was performed when the reflectance of the FBG side end face of the 1.064 ⁇ band semiconductor laser 71 in FIG. Show. 1. If the reflectivity of the FBG side end face of the 064 xm band semiconductor laser 71 remains 1% or more, then both end faces of the 064 xm band semiconductor laser 71 and three reflections of FBG73 exist. A composite resonator is constructed. In the presence of such a composite resonator, the laser wavelength In addition, the laser intensity becomes unstable, and kinks are generated with a current-light output characteristic.
- the reflectance of the FBG side end face of the 1.064 / m band semiconductor laser 71 should be 1% or less, and the side of the 1.064 ⁇ band semiconductor laser 71 not connected to the FBG73.
- the reflectivity of FBG73 was 15%, and the full width at half maximum of its reflection spectrum was 20pm, and it was installed at a location about lm from the 1.064 zm band semiconductor laser 71.
- the longitudinal mode interval is about 100 MHz, which is sufficiently narrower than the full width at half maximum of FBG73.
- the longitudinal mode oscillates in multi-mode, and stable oscillation is possible even when there is external return light.
- the reflectivity of FBG73 is preferably 5% or more.
- the output will decrease, or a large output fluctuation will occur at the kink position as shown in FIG. 7A.
- Fig. 14 shows the current-light output characteristics of laser light with a wavelength of 1064 nm output from the FBG 73 when the reflectance of the FBG side end face of the 1.064 xm band semiconductor laser 71 is 1% or less.
- Figure 15 shows the dependence of the center wavelength of the laser beam on the laser drive current.
- the laser light output from the FBG73 has a large kink that changes by 1% or more of the optical output. No multi-mode oscillation at 100MHz intervals.
- the full width at half maximum increases with increasing current, but the center wavelength changes only below the measurement resolution of 10pm.
- Wavelength converted light of 0.59 / im can be obtained by sum frequency generation. Furthermore, by modulating the 1.064 / im band semiconductor laser 71 using the Norw drive power source 77, the 5.9 NZ FF modulation with lOMbZs is modulated with 10 gradations by converting the wavelength converted light of 0.59 xm. be able to.
- an isolator is not necessarily required after the FBG 73.
- the same characteristics can be obtained not only with a laser of 1064 nm but also with other wavelengths such as 980 nm and 940 nm.
- Figure 16 shows the drive current of the FBG laser so that the output light intensity of the present invention is constant.
- 1 shows a configuration of a light source device with a modulation function subjected to code back.
- the sixth embodiment further includes a beam sampler 1201, a photodetector 1202, a comparison period 1203, and a pulse driving power source 1205 in the configuration of the first embodiment.
- the beam sampler 1201 is installed in the optical path of the laser beam output from the wavelength conversion element module 75, and is optically connected to the wavelength conversion element module 75 and the photodetector 1202.
- the photodetector 1202 is electrically connected to the comparator 1203 so that the detected light intensity can be converted into an electric signal and the electric signal can be transmitted to the comparator 1203.
- the comparator 1203 is also connected to a pulse driving power source 1205, and the pulse driving power source 1205 is further connected to a 1.064 zm band semiconductor laser 71.
- a part of the output intensity is branched by the beam sampler 1201 so that the output light intensity is constant, detected by the photodetector 1202, and the laser with FBG is driven so that the intensity is constant. Feedback can be applied to the current.
- the reflectivity of the beam sampler 120 1 is about 1% to 10%.
- the comparator 1203 compares the electric signal related to the light intensity from the photodetector 1202 with the electric input signal 1204 from the outside, and controls the pulse driving power source 1205 so that both maintain a preset relationship. You can.
- FIG. 17 shows the time change of the laser output intensity when the laser of Example 6 is operated in a thermostatic chamber changing at 10 ° C. force and 40 ° C.
- FIG. Here, the values normalized by the laser output at the start are shown.
- an apparatus having a driving power source having a modulation function is used as a driving power source of 1.32 111 band 13 FB laser.
- the light source device with modulation function has a conversion function.
- a high output 1.064 ⁇ m band semiconductor laser is used for the 1.064xm band semiconductor laser, and the operating current is increased to double the output to 80mW.
- DFB layout Modulation is performed by turning ON / OFF the current from below the threshold to 80mA.
- the intensity of the wavelength converted light of 0.58 ⁇ ⁇ is reduced to about 1/2 and under the condition that noise of 2% or less is allowed between peak peaks, ON / OFF modulation with lOMbZs can be performed on wavelength-converted light of ⁇ ⁇ .
- FIG. 12 shows a configuration in which the light source device with a conversion function is incorporated in the fluorescence microscope apparatus.
- the built-in light source device with a conversion function uses the same device as in Example 1.
- wavelength conversion light is emitted from the wavelength conversion element module 75, and this laser light is reflected by the dichroic mirror 1013, collected through the objective lens 1014, and becomes spot-like laser light on the cell 1016. Irradiated.
- the cell 1016 is stained with a fluorescent dye, and the fluorescent dye of the cell 1016 is excited by the wavelength-converted light and emits fluorescence.
- Fluorescence emitted from the cell 1016 force enters the high-sensitivity camera 1011 via the objective lens 1014, the dichroic mirror 1013, and the prism 1012.
- the high sensitivity camera 1011 converts the incident fluorescence into an electrical signal
- the image display unit generates a fluorescence image based on each electrical signal input from the high sensitivity camera 1011 and outputs it.
- GFP fluorescent protein
- the ON level of the excitation laser of the light source having the characteristics shown in FIGS. 8A and 8B or FIGS. 11A and 1 IB can be set in ten steps with the ON state shown in the figure as the maximum value.
- ONZOFF 10-level modulation at 10 Mb / s can be performed on the wavelength converted light of 0.58 / m under the allowable condition of 5% or less reduction in light intensity between peaks.
- the present invention can also be applied to a modulated light source that generates waves.
- FIG. 13 is a flowchart illustrating a light modulation method using the light source device with a modulation function.
- the light modulation method described here includes all the above-described embodiments. Therefore, the light modulation method in each embodiment does not necessarily include all these steps.
- step 1101 modulated light is emitted from the second semiconductor laser.
- step 1102 the light modulated in step 1101 is incident on an FBG having a reflection band narrower than the resonance wavelength interval determined by the element length of the second semiconductor laser.
- step 1103 the light emitted from the FBG enters the isolator.
- step 1104 the light emitted from the first semiconductor laser and the light emitted from the FBG or isolator are combined and incident on the optical waveguide.
- step 1105 the difference frequency or sum frequency of light from the first and second semiconductor lasers is emitted from the optical waveguide.
- step 1106 the FBG temperature is controlled within a certain range.
- the lower limit of the current amplitude modulation to the second semiconductor laser light source is set to be equal to or smaller than the threshold and the emission wavelength is the short wavelength side wavelength of the quasi phase matching band of the nonlinear optical material, and the upper limit of the current amplitude modulation is set. Is set to be lower than the current value that gives the first kink that occurs in the current-light output characteristics.
- the lower limit of the current amplitude modulation for the first semiconductor laser light source is set to be equal to or smaller than the threshold value and the output wavelength is the short wavelength of the pseudo phase matching band of the nonlinear optical material, and the upper limit of the current amplitude modulation is set. Is set so that the output wavelength is the long wavelength of the quasi phase matching band of the nonlinear optical material.
- each of the light modulation method power steps 1103 and 1106 to 1108 in each embodiment is provided is arbitrary. Also, each insertion position in steps 1106 to 1108 is arbitrary. And the order can be changed.
- FIG. 18 is a flowchart illustrating a light source modulation method using a light source device with a modulation function corresponding to the sixth embodiment. At the bottom of the step in FIG. 13, a step of comparing the light reception signal of the photodetector with the set value and feeding back to step 1107 is added.
- the light source device with modulation function that generates converted light of 0.58 ⁇ m has been described above.
- the first semiconductor laser light source uses a 1.307 xm band DFB laser, and the second A light source device with a modulation function that generates 0.556 zm wavelength-converted light using a 0.9976 ⁇ m-band semiconductor laser that has been stabilized by providing an FBG as the semiconductor laser light source of A modulation function having intensity is obtained.
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Semiconductor Lasers (AREA)
- Lasers (AREA)
Abstract
Description
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EP06711831.5A EP1840638B1 (en) | 2005-01-17 | 2006-01-17 | Light source apparatus with modulating function and light modulation method |
JP2006553023A JP4843506B2 (ja) | 2005-01-17 | 2006-01-17 | 変調機能付光源装置とその駆動方法 |
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JP2009070979A (ja) * | 2007-09-12 | 2009-04-02 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レーザモジュールおよびレーザ光源 |
JP2010054621A (ja) * | 2008-08-26 | 2010-03-11 | Nippon Telegr & Teleph Corp <Ntt> | 波長変換光源 |
DE112012000154T5 (de) | 2011-05-25 | 2013-07-04 | Fuji Electric Co., Ltd. | Lichtquellenvorrichtung, Analysevorrichtung und Verfahren zur Lichterzeugung |
JP2014063933A (ja) * | 2012-09-24 | 2014-04-10 | Shimadzu Corp | レーザ装置及びレーザ装置の製造方法 |
CN105390933A (zh) * | 2014-08-29 | 2016-03-09 | 三菱电机株式会社 | 激光器装置以及激光加工机 |
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Also Published As
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EP1840638A4 (en) | 2011-02-09 |
EP1840638A1 (en) | 2007-10-03 |
JPWO2006075760A1 (ja) | 2008-06-12 |
CN100529937C (zh) | 2009-08-19 |
JP4843506B2 (ja) | 2011-12-21 |
CN101107562A (zh) | 2008-01-16 |
US7729585B2 (en) | 2010-06-01 |
EP1840638B1 (en) | 2016-11-16 |
US20100053720A1 (en) | 2010-03-04 |
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