WO2005098086A3 - Procedes telecommandes destines a eliminer des depots de surface dans des chambres - Google Patents

Procedes telecommandes destines a eliminer des depots de surface dans des chambres Download PDF

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Publication number
WO2005098086A3
WO2005098086A3 PCT/US2005/010692 US2005010692W WO2005098086A3 WO 2005098086 A3 WO2005098086 A3 WO 2005098086A3 US 2005010692 W US2005010692 W US 2005010692W WO 2005098086 A3 WO2005098086 A3 WO 2005098086A3
Authority
WO
WIPO (PCT)
Prior art keywords
removing surface
surface deposits
remote chamber
improvement
chamber methods
Prior art date
Application number
PCT/US2005/010692
Other languages
English (en)
Other versions
WO2005098086A2 (fr
Inventor
Herbert Harold Sawin
Bo Bai
Original Assignee
Du Pont
Massachusetts Inst Technology
Herbert Harold Sawin
Bo Bai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Du Pont, Massachusetts Inst Technology, Herbert Harold Sawin, Bo Bai filed Critical Du Pont
Priority to JP2007505282A priority Critical patent/JP2007531288A/ja
Priority to EP05760380A priority patent/EP1733072A2/fr
Priority to BRPI0508205-6A priority patent/BRPI0508205A/pt
Publication of WO2005098086A2 publication Critical patent/WO2005098086A2/fr
Publication of WO2005098086A3 publication Critical patent/WO2005098086A3/fr

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32853—Hygiene
    • H01J37/32862—In situ cleaning of vessels and/or internal parts
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4405—Cleaning of reactor or parts inside the reactor by using reactive gases
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F4/00—Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02C—CAPTURE, STORAGE, SEQUESTRATION OR DISPOSAL OF GREENHOUSE GASES [GHG]
    • Y02C20/00—Capture or disposal of greenhouse gases
    • Y02C20/30—Capture or disposal of greenhouse gases of perfluorocarbons [PFC], hydrofluorocarbons [HFC] or sulfur hexafluoride [SF6]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Plasma & Fusion (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning In General (AREA)
  • ing And Chemical Polishing (AREA)

Abstract

L'invention concerne un procédé de nettoyage télécommandé de plasma amélioré destiné à éliminer ls dépôts de surface d'une surface, notamment l'intérieur d'une chambre de dépôt utilisée dans la fabrication de dispositifs électroniques. L'amélioration réside dans l'utilisation d'un gaz activé à une température neutre élevée d'environ au moins 3 000 K. Elle consiste également à optimiser l'oxygène à des rapports de fluorocarbure afin de permettre un meilleur taux de gravure et une meilleure régulation du gaz d'émission.
PCT/US2005/010692 2004-03-24 2005-03-24 Procedes telecommandes destines a eliminer des depots de surface dans des chambres WO2005098086A2 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007505282A JP2007531288A (ja) 2004-03-24 2005-03-24 表面堆積物を除去するための遠隔チャンバ方法
EP05760380A EP1733072A2 (fr) 2004-03-24 2005-03-24 Procedes telecommandes destines a eliminer des depots de surface dans des chambres
BRPI0508205-6A BRPI0508205A (pt) 2004-03-24 2005-03-24 métodos de remoção de depósitos de superfìcie

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US55622704P 2004-03-24 2004-03-24
US60/556,227 2004-03-24
US64044404P 2004-12-30 2004-12-30
US64083304P 2004-12-30 2004-12-30
US60/640,444 2004-12-30
US60/640,833 2004-12-30

Publications (2)

Publication Number Publication Date
WO2005098086A2 WO2005098086A2 (fr) 2005-10-20
WO2005098086A3 true WO2005098086A3 (fr) 2006-05-04

Family

ID=34965582

Family Applications (3)

Application Number Title Priority Date Filing Date
PCT/US2005/010691 WO2005095670A2 (fr) 2004-03-24 2005-03-24 Procedes d'elimination de depots de surface par enceinte a distance
PCT/US2005/010692 WO2005098086A2 (fr) 2004-03-24 2005-03-24 Procedes telecommandes destines a eliminer des depots de surface dans des chambres
PCT/US2005/010693 WO2005090638A2 (fr) 2004-03-24 2005-03-24 Procede a chambre separee pour l'elimination des depots de surface

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/US2005/010691 WO2005095670A2 (fr) 2004-03-24 2005-03-24 Procedes d'elimination de depots de surface par enceinte a distance

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/US2005/010693 WO2005090638A2 (fr) 2004-03-24 2005-03-24 Procede a chambre separee pour l'elimination des depots de surface

Country Status (6)

Country Link
EP (3) EP1737998A2 (fr)
JP (3) JP2007531288A (fr)
KR (3) KR20070040748A (fr)
BR (3) BRPI0508205A (fr)
TW (3) TWI281715B (fr)
WO (3) WO2005095670A2 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0697467A1 (fr) * 1994-07-21 1996-02-21 Applied Materials, Inc. Procédé et dispositif de nettoyage d'une chambre de dépÔt
US7581549B2 (en) * 2004-07-23 2009-09-01 Air Products And Chemicals, Inc. Method for removing carbon-containing residues from a substrate
RU2008108010A (ru) * 2005-08-02 2009-09-10 Массачусетс Инститьют Оф Текнолоджи (Us) Способ применения фторида серы для удаления поверхностных отложений
US9034199B2 (en) 2012-02-21 2015-05-19 Applied Materials, Inc. Ceramic article with reduced surface defect density and process for producing a ceramic article
US9212099B2 (en) * 2012-02-22 2015-12-15 Applied Materials, Inc. Heat treated ceramic substrate having ceramic coating and heat treatment for coated ceramics
WO2014094103A1 (fr) * 2012-12-18 2014-06-26 Seastar Chemicals Inc. Traitement et procédé de nettoyage à sec in situ de réacteurs de dépôt de film mince et de couches de film mince
JP6202423B2 (ja) * 2013-03-05 2017-09-27 パナソニックＩｐマネジメント株式会社 プラズマクリーニング方法およびプラズマクリーニング装置
US9850568B2 (en) 2013-06-20 2017-12-26 Applied Materials, Inc. Plasma erosion resistant rare-earth oxide based thin film coatings
US10109496B2 (en) * 2013-12-30 2018-10-23 The Chemours Company Fc, Llc Chamber cleaning and semiconductor etching gases
KR102662111B1 (ko) * 2018-12-25 2024-05-03 가부시끼가이샤 레조낙 부착물 제거 방법 및 성막 방법
US11854773B2 (en) 2020-03-31 2023-12-26 Applied Materials, Inc. Remote plasma cleaning of chambers for electronics manufacturing systems
CN116145106A (zh) * 2023-02-21 2023-05-23 苏州鼎芯光电科技有限公司 一种用于半导体镀膜工艺腔室的清洁方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1304731A1 (fr) * 2001-03-22 2003-04-23 Research Institute of Innovative Technology for the Earth Procede de nettoyage d'un dispositif cvd et dispositif nettoyant afferent

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5158644A (en) * 1986-12-19 1992-10-27 Applied Materials, Inc. Reactor chamber self-cleaning process

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1304731A1 (fr) * 2001-03-22 2003-04-23 Research Institute of Innovative Technology for the Earth Procede de nettoyage d'un dispositif cvd et dispositif nettoyant afferent

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ALLGOOD C ET AL: "Evaluation of octafluorocyclobutane as a chamber clean gas in a plasma-enhanced silicon dioxide chemical vapor deposition reactor", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, ELECTROCHEMICAL SOCIETY. MANCHESTER, NEW HAMPSHIRE, US, vol. 150, no. 2, 2003, pages G122 - G126, XP002280013, ISSN: 0013-4651 *
CRUDEN BRETT A ET AL: "Neutral gas temperature estimate in CF4/O2/Ar inductively coupled plasmas", APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, vol. 81, no. 6, 5 August 2002 (2002-08-05), pages 990 - 992, XP012033207, ISSN: 0003-6951 *

Also Published As

Publication number Publication date
JP2007531288A (ja) 2007-11-01
JP2007530792A (ja) 2007-11-01
TW200623281A (en) 2006-07-01
JP2007531289A (ja) 2007-11-01
EP1733072A2 (fr) 2006-12-20
TW200623251A (en) 2006-07-01
WO2005095670A3 (fr) 2006-05-04
WO2005090638A9 (fr) 2006-01-26
EP1733071A2 (fr) 2006-12-20
WO2005090638A8 (fr) 2006-11-16
WO2005090638A3 (fr) 2006-04-13
BRPI0508214A (pt) 2007-07-17
BRPI0508204A (pt) 2007-07-17
KR20070037434A (ko) 2007-04-04
KR20070043697A (ko) 2007-04-25
KR20070040748A (ko) 2007-04-17
TWI281715B (en) 2007-05-21
BRPI0508205A (pt) 2007-07-17
TWI284929B (en) 2007-08-01
WO2005090638A2 (fr) 2005-09-29
EP1737998A2 (fr) 2007-01-03
WO2005098086A2 (fr) 2005-10-20
WO2005095670A2 (fr) 2005-10-13
TW200623240A (en) 2006-07-01
TWI281714B (en) 2007-05-21

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