WO2005085884A2 - System and method for reducing temperature variation during burn in - Google Patents

System and method for reducing temperature variation during burn in Download PDF

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Publication number
WO2005085884A2
WO2005085884A2 PCT/US2005/006830 US2005006830W WO2005085884A2 WO 2005085884 A2 WO2005085884 A2 WO 2005085884A2 US 2005006830 W US2005006830 W US 2005006830W WO 2005085884 A2 WO2005085884 A2 WO 2005085884A2
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WO
WIPO (PCT)
Prior art keywords
integrated circuit
under test
ambient temperature
bias voltage
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2005/006830
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English (en)
French (fr)
Other versions
WO2005085884A3 (en
WO2005085884A9 (en
Inventor
Eric Chien-Li Sheng
David H. Hoffman
John Laurence Niven
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Transmeta Inc
Original Assignee
Transmeta Inc
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Filing date
Publication date
Application filed by Transmeta Inc filed Critical Transmeta Inc
Priority to CN200580006776.3A priority Critical patent/CN1926439B/zh
Priority to JP2007501961A priority patent/JP4768710B2/ja
Publication of WO2005085884A2 publication Critical patent/WO2005085884A2/en
Publication of WO2005085884A9 publication Critical patent/WO2005085884A9/en
Publication of WO2005085884A3 publication Critical patent/WO2005085884A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

Definitions

  • Embodiments in accordance with the present writing relate to systems and methods for reducing temperature variation during burn in.
  • Figure 1 illustrates an exemplary arrangement of integrated circuit devices configured for a burn-in operation, in accordance with embodiments of the present invention.
  • Figure 2 illustrates a flow chart for a computer-implemented method of reducing power during burn in testing, in accordance with embodiments of the present invention.
  • Figure 3 illustrates an exemplary arrangement of integrated circuit devices cunfigured for a. burn-in operation, in accordance with othor embodiments of the present invention.
  • Figure 4 illustrates a flow chart for a computer-implemented method of reducing power during burn in testing, in accordance with embodiments of the present invention.
  • Figure 5 illustrates ⁇ flow chart for a computer-implemented method of determining a junction temperature of an integrated circuit, in accordance with embodiments of the present invention.
  • DETAILED DESCRIPTION In the following detailed deseri li ⁇ of the present invention, system and method for reducing temperature variation during burn in, numerous epecific details are set forth in order to provide a thorough understanding of the present invention. However, it will be recognized by one skilled in the art that the present invention may be practiced without these specific details or with equivalents thereof. In other instances, well-known methods, procedures, components, and circuits have not been described in detail as not to unnecessarily obscure aspects of the present invention.
  • these quantities take the form of electrical or magnetic signals capable of being stored, transferred, combined, compared, and otherwise manipulated in a computer system. It has proven convenient at times, principally for reasons of common usage, to refer to these signals as bits, values, elements, symbols, characters, terms, numbers, or the like.
  • Embodiments in accordance with the present invention are described in the context of design and operation of integrated semiconductors. More particularly, embodiments of the present invention relate to systems and methods for reducing temperature variation during burn-in testing of integrated circuits. It is appreciated, however, that elements of the present invention may be utilized in other areas of semiconductor operation.
  • embodiments in accordance with the present invention are equally applicable to coupling ⁇ body-bias voltage to nFETs (or n-type MOSFETS) formed in surface P-wells via a conductive sub-surface region of P-type doping when an n-type substrate and a P-well process are utilized. Consequently, ' embodiments in accordance with the present invention are well suited to semiconductors formed in n-type materials, and such embodiments are considered within the scope of the present invention.
  • Burn-in operations to detect integrated circuit defects are generally performed at stressing temperatures, e.g., 150 degrees Celsius, stressing voltages, e.g., 1.5 times nominal operating voltage, and at low operating frequencies, usually orders of magnitude slower than normal operatin »gg frequencies. Under these conditions, leakage current tends to dominate power consumption and heat production of the integrated circuit device.
  • FIG. 1 illustrates an exemplary arrangement 100 of integrated circuit devices configured for a burn-in operation, in accordance with embodiments of the present invention.
  • Arrangement 100 comprises a plurality of integrated circuit devices under test, 101, 102 through N.
  • the integrated circuits may be typically arrayed on a printed wiring board 110, which may include sockets for accepting the integrated circuit devices u der test.
  • wiring board 110 is typically placed in a temperature chamber capable of temperature regulation, e.g., adding or removing heat, at high temperatures, e.g., 150 degrees Celsius.
  • Atypical burn-in chamber may comprise a plurality of similar wiring boards.
  • Wiring board 110 comprises a distribution network, e.g., wiring traces, to conduct electrical signals between various power supplies, test controllers and/or instrumentation and the integrated circuit devices under test.
  • Wiring board 110 comprises an operating voltage (Vdd) supply distribution network 141 and a test control distribution network 142. It is appreciated that such wiring networks can be configured in a wide varied of well known networks, including h e, point to-po nt, and individual topologies in accordance with embodiments of the present invention.
  • Qperating voltage supply 140 and test controller 150 are shown on wiring board 110. Embodiments in accordance with the present invention are well suited to situating such oomponente elsewhere within a test environment.
  • operating voltage supply 140 is frequently located outside of a thermal chamber, and wired to a connector on wiring board 110.
  • Test control distribution network 142 couples a plurality of signals between test controller 150 and the integrated circuit devices under test.
  • operating voltage supply distribution network 141 couples a plurality of signals between operating voltage supply 140 and Lhe integrated circuit devices under test.
  • test unit controller 150 typically stimulates the integrated circuit devices under test with a test pattern sequence and/or test commands and accesses a result.
  • JTAG Joint Test Action Group
  • ABIST array built-in self test
  • Operating voltage supply 140 provides voltage and current to operate the integrated circuit devices under test, typically at a stressing voltage, e.g., 1.5 times nominal operating voltage for the integrated circuit devices under test.
  • Current consumption, particularly leakage current consumption, in most semiconductors increases with increasing operating voltage and with increases in operating temperature. Such current increases are generally exponential in nature, e.g., a ten percent increase in operating voltage can cause a 100 percent increase in leakage current consumption.
  • Operating the integrated circuit devices under test at a stressing elevated temperature also greatly increases their current requirements. As a deleterious consequence, operating voltage supply 140 must have a significantly greater current capacity to operate the integrated circuit devices under test in comparison to a current capacity required to operate the same integrated circuit devices under nominal temperature and voltage conditions.
  • a typical burn-in configuration can comprise several tens of integrated circuil devices under test per wiring board 110, and numerous wiring boards per chamber, the requirements placed upon operating voltage supply 140 can easily be measured in multiple kilowatts.
  • a precision voltage supply capable of supplying such power and suitable for testing integrated circuit devices can be prohibitively expensive.
  • Static power consumption in modern semiconductor processes e.g., processes with a minimum feature size of about 0.13 microns and smaller, is no longer a negligible component of total power consumption. Further, static power, as a percentage of total power, is tending to increase with successive ' generations of semiconductor process.
  • maximum operating frequency is generally proportional to the quantity (1- Vt Vdd), that is, one minus the threshold voltage divided by the supply voltage (for small process geometries).
  • supply voltage (Vdd) typically also is decreased in order to avoid deleterious effects such as oxide breakdown. Consequently, threshold voltage should also be decreased in order to maintain or increase a desirable maximum operating frequency.
  • gate oxides are made thinner so that a gate can maintain control of the channel. A thinner gate oxide learls to an i creased gate capacitance. Since "off" or leakage current of a CMOS device is generally proportional to gate capacitance, the trend to make gate oxides thinner tends to increase leakage current.
  • positive bias voltage generator 120 is coupled to positive bias voltage distribution network 1°,1 , which in turn is coupled to the integrated circuits under test.
  • Positive bias voltage generator 120 provides a body-biasing voltage, e.g., zero to five volts, to n type wells disposed beneath pFET devices in the integrated circuit devices under test. Such body biasing enables adjustment of threshold voltages of the pFET devices, for example, to reduce leakage current of the pFET devices.
  • negative bias voltage generator 130 is coupled to negative bias voltage distribution network 131, which in turn is coupled to the ! integrated circuits under test.
  • Negative bias voltage generator 130 provides a body-biasing voltage, e.g., -5 to zero volts, to p type wells disposed beneath nFET devices in the integrated circuit devices under test. Such body biasing enables adjustment of threshold voltages of the nFET devices, for example, to reduce leakage current of the nFET devices.
  • bias voltage distribution networks 121 and 131 can be ⁇ nfigured in a wide varied of well known networks, including buo, point-to-point, and individual topologies in accordance with embodiments of the present invention.
  • bias voltage generators 120 and 130 are variable voltage sources. Their output voltage can be set (within a rango) to a specific value. It is desirable, but not required, that such specific values be set digitally, e.g., by a command from test controller 150. Body biasing currents are typically on the order of low micro amps per integrated circuit. Consequently, bias voltage generators 120 and 130 generally can be relatively small and inexpensive voltage sources.
  • Figure 2 illuHtrates a flow chart for a computer-implemented method 200 of reducing power during burn in testing, in accordance with embodiments of the present invention.
  • an integrated circuit device is tested to determine a set of body bias voltages which minimise leakage current.
  • the testing will determine a unique n well voltage and a unique p well voltage for the integrated circuit device.
  • semiconductor packaging does not affect leakage current; therefore leakage current may be accurately meaaurod on an unpackaged device, e.g., on a wafer tester.
  • Body bias voltages that minimize leakage current will generally be determined outside of a burn-in process, for example during wafer testing.
  • a set of body bias voltages that minimize leakage current may be determined for an entire batch of integrated circuits, e.g., for a wafer or for multiple w ⁇ fore processes at the same time.
  • embodiments in accordance with the present invention are well suited to determining body bias voltages that rninirnize leakage current for individual integrated circuits.
  • information of the set of body bias voltages is stored in a computer usable media.
  • block 210 and block 240, below are well suited to boing performed on different test equipment, physically separated, e.g., on different continents, at different times, e.g., weeks or months apart. Storing information of the set of body bias voltages enables transmission and/or retrieval of this information for use over distances in time and space.
  • information of the set of body bias voltages is accessed from a computer usable media.
  • the computer usable media of block 220 may differ from the computer usable media of block 230.
  • information (data) may be copied and/or transmitted in a variety of ways from media to media.
  • the body bias voltages determined in block 210 are applied to an integrated circuit during burn-in testing.
  • power consumption and dissipation of the integrated circuits under test can be reduced by orders of magnitude.
  • An a . beneficial consequence of such greatly reduced power consumption uch less capable and much less oxpeneive operating voltage supplies and thermal chambers may be utilized for perforrning bum-in testing.
  • greater numbers of integrated circuits can be burned in with existing equipment, thereby increasing throughput of a burn-in process.
  • expensive exotic heat sinking arrangements conventionally utilized with high function integrated circuits are no longer required.
  • junction temperatures there will generally be a distribution of junction temperatures, "chip temperatures,'' in a population of integrated circuits undergoing bum in. For example, most temperature chambers are unable to maintain a precisely uniform ambient temperature at all locations within the chamber.
  • manufacturing variations among the integrated circuits under test contribute to differences in power consumption, and hence differences in heat output between the various integrated circuits. Consequently, such differences in ambient temperature and heat output contribute to variations in junction temperatures among the integrated circuits under test.
  • junction temperature variation has been addressed by mechanical temperature control of each integrated circuit, e.g., forcing heat into and drawing heat out of each integrated circuit in order to adjust its junction temperature to the desired temperature.
  • mechanical temperature control of each integrated circuit e.g., forcing heat into and drawing heat out of each integrated circuit in order to adjust its junction temperature to the desired temperature.
  • such conventional individual device temperature control is ineehaiiically complex and expensive.
  • such structures for externally applied heating and cooling generally have their own relatively large thermal mass, which greatly limits their ability to respond to changes in thermal requirements.
  • the coupling of heating and cooling, as well as temperature measurements are generally made to integrated circuit packaging, rather than directly to junctions. Consequently, the junction temperature of the integrated circuit is controlled to an undesirable appro- ⁇ mation.
  • T temperature
  • P power consumed by the integrated circuit
  • ⁇ i the lumped thermal resistance of the integrated circuit package comprising, for example, a thermal resistance from the integrated circuit to a coupled heatsink to ambient and or a thermal resistance from the integrated circuit to a circuit board.
  • thermal resistance of the integrated circuit package ⁇ i
  • ⁇ i the thermal resistance of the integrated circuit package
  • a desire of a burn-in process is to operate the integrated circuits under test at a specific operating voltage, e.g., l.C times nominal operating voltage.
  • a specific operating voltage e.g., l.C times nominal operating voltage.
  • Current requirements of an integrated circuit in general, are a function of attributes of that integrated circuit and the voltage applied.
  • the power consumed by a particular integrated circuit is essentially fixed for that integrated circuit under the conventional art.
  • power consumption of an integrated circuit can be adjusted by adjusting threshold voltage(s) of the integrated circuit, even if operating voltage of the integrated circuit is held constant.
  • Threshold voltage(s) can be adjusted by adjusting body-bias voltage(s) supplied to body-biasing wells disposed beneath active semiconductors of the integrated circuit.
  • Adjusting threshold voltage(s) of an integrated circuit can make changes in, e.g., incre ⁇ so or decrease, Ihe leakage curront of the integrated circuit, which is a significant component of an integrated circuit's power consumption, especially during low frequency operation, for example, during a burn-in process.
  • junction temperature of an integrated circuit under test can he controlled by controlling the power consumed by the integrated circuit.
  • the power consumed by the integrated circuit operating at a fixed operating voltage can be controlled by adjusting body biasing voltages to the integrated circuit, which in turn influence leakage current of the integrated circuit.
  • FIG. 3 illustrates an exemplary arrangement 300 of integrated circuit devices configured for a hurn-in operation, in accordance with embodiments of the present invention.
  • Arrangement 300 comprises a plurality of integrated circuit devices under test, 101, 102 through N.
  • the integrated circuits are typically arrayed on a printed wiring board 310, which may comprise sockets for accepting the integrated circuit devices under test. Because it is desirable to operate the integrated circuit devices under Lest at a stressing elevated temperature, wiring board 310 is typically placed in a temperature chamber capable of temperature regulation, e.g., adding or removing heat, at high temperatures, e.g., 150 degrees Celsius.
  • a typical burn-in chamber may comprise a plurality of similar wiring boards.
  • Wiring board 310 comprises an operating voltage supply 340, which may be similar to operating voltage supply 140.
  • Operating voltage supply 340 provido ⁇ voltage and current to integrated circuit devices under test 101, 102, etc., thoug current monitors 801, 302, etc.
  • Operating voltage supply 340 is shown on wiring board 310.
  • Embodiments in accordance with the present invention are well suited to situating such components elsewhere within a test environment. For e ⁇ ample, operating voltage supply 340 is frequently loc ⁇ tod outside of a thermal chamber, and wired to a connector on wiring board 310.
  • test controller 350 provides significantly more function than test controller 150 ( Figure 1). As will be d scussed in more detail below, test controller 350 is coupled to voltage supplies, current measurement devices and ambienL temperature aensor( ⁇ ) in order to measure and control electrical parameters related to power consumption and temperature of the integrated circuit devices under test.
  • Test controller 350 is desirably located on wiring board 310. However, due to various factors, e.g., the physical size and/or nature of equipment used to implement test controller 350, embodiments in accordance with the present invention are well suited to situating test controller 350 components elsewhere wit-bin a test environment, e.g., on a separate wiring board coupled to wiring board 310, or outside of a thermal chamber. For example, if test controller 350 were implemented as a workstation computer, it would generally be impractical to place such a workstation in a thermal chamber due to its size and operating temperature limits.
  • test unit controller which mayor may not be apart of test controller 350, typically stimulates the integrated circuit devices under test with a test pattern sequence and/or test commands and accesses a result.
  • Embodiments in accordance with the present invention are well suited to a wide variety of test unit controllers and testing methods, mcluding, for example, Joint Test Action Group (JTAG) boundary scan and array built-in self test (ABIST).
  • JTAG Joint Test Action Group
  • ABIST array built-in self test
  • current monitor 301 measures current supplied to integrated circuit 101
  • current monitor 302 measures current supplied to integrated circuit 102. Each current measurement is reported back to test controller 350, tor example via a digital bus.
  • ⁇ lher wiring arrangomente for reporting individual integrated circuit currents are well suited to embodiments in accordance with the present invention.
  • Test controller 350 is further coupled to operating voltage supply 340, such that test controller 350 has knowledge of the operating voltage supplied to each integrated circuit under test.
  • the operating voltage for each integrated circuit under tost will be the same.
  • embodiments in accordance with the present invention are well suited to a variety of operating voltages for the integrated circuits under test.
  • Each integrated circuit under test is coupled to an associated positive and/or negative body-bias voltage source.
  • integrated circuit 101 is coupled to positive body-bias voltage source 321 and negative body-bias voltage source 831.
  • integrated circuit 102 is coupled to positive body-bias voltage source 322 and negative body-bias voltage source 332.
  • the body-bias voltage sources are in turn coupled to, and controlled by test controller 350.
  • test controller 350 can determine the power consumed by each integrated circuit under test.
  • Ambient temperature sensor 360 provides an ambient temperature measurement to test controller 350.
  • one ambient temperature sensor per wiring board 31 provides a good approximation of the ambient temperature for integrated circuits under test on wiring board 310.
  • it is generally less complex and less oxpeneive to measure ambient temperature than to directly measure junction temperature of the integrated circuits under test.
  • the number of ambient temperature sensors utilized can be adjusted based upon cost constraints, accuracy requirements and understanding of thermal variations within a particular chamber.
  • test controller 350 can adjust the positive and/or negative body biases of each integrated circuit under teat to increase or decrease threshold voltage, and thus leakage current, and consequently power consumption and in turn to achieve the desired junction temperature.
  • Figure 4 illustrates a flow chart for a computer-implemented method 400 of reducing power during burn in testing, in accordance with embodiments of the present invention.
  • power consumed by an integrated circuit during a test process is measured. For example, current and voltage to the integrated circuit can be measured.
  • an ambient temperature associated with the integrated circuit is measured.
  • the ambient temperature should be more closely associated with the integrated circuit than a "set point" of a temperature chamber.
  • the ambient temperature can be measured by a single ambient temperature sensor on a wiring board, e.g., wiring board 310 of Figure 3, comprising an array of integrated circuits.
  • the ambient temperature can be measured by an ambient temperature sensor in close ⁇ proximity to the integrated circuit.
  • a body bias voltage of the integrated circuit is adjusted to adiieve a desired junction temperature of the integrated circuit.
  • body-biasing voltage can affect threshold voltages, which in turn affect leakage current which is a significant component of integrated circuit power consumption.
  • the junction temperature of an integrated circuit can be directly manipulated. In combination with information of an ambient temperature of the integrated circuit, a desired junction temperature can be achieved.
  • a junction temperature of an integrated circuit can be controlled without directly measuring the junction temperature of the integrated circuit. It is generally less complex and less expensive to measure ambient temperature than to directly measure junction temperature of an integrated circuit. Further, systems to measure power and control low current voltages are typically less complex and less expensive than creating individual thermal environments for large numbers of integrated circuits. As a beneficial result, embodiments in accordance with the present invention reduce temperature variation during burn in with much less cost, much less complexity and with greater reliability than the conventional practice.
  • Figure 5 illustrates a flow chart for a computer-implemented method 500 of dete ⁇ riining a junction temperature of an integrated circuit, in accordance with embodiments of the present invention.
  • an ambient temperature in a region proximate to the integrated circuit is measured.
  • the ambient temperature sensing device should be m the same thermal conditions as the integrated circuit.
  • electrical power utilized by the integrated circuit is measured. Typically, such measurement is performed by measuring voltage and curront supplied to the integrated circuit,
  • a thermal resistance value for the integrated circuit is accessed, for example, from computer memory.
  • the thermal resistance value can be determined from packaging design information, but is typically measured during development of the integrated circuit and its packaging.
  • a junction temperature of the integrated circuit is determined. For example, using power, ambient temperature and thermal resistance, junction temperature can be computed using Relation 1, above.
  • a junction temperature of an integrated circuit can be determined without directly measuring the junction temperaturo of the integrated circuit. It is generally less complex and less expensive to measure ambient temperature than to directly measure junction temperature of an integrated circuit. Further, power utilized by an integrated circuit can be measured in a straightforward manner. Beneficially, embodiments in accordance with the present invention determine a junction temperature of an integrated circuit in a less costly and less complex manner than under the conventional art.

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  • Environmental & Geological Engineering (AREA)
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  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
PCT/US2005/006830 2004-03-01 2005-03-01 System and method for reducing temperature variation during burn in Ceased WO2005085884A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN200580006776.3A CN1926439B (zh) 2004-03-01 2005-03-01 用于减少老化期间的温度差异的系统和方法
JP2007501961A JP4768710B2 (ja) 2004-03-01 2005-03-01 バーンイン中の温度のばらつきを低減するためのシステムおよび方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/791,099 2004-03-01
US10/791,099 US7248988B2 (en) 2004-03-01 2004-03-01 System and method for reducing temperature variation during burn in

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WO2005085884A2 true WO2005085884A2 (en) 2005-09-15
WO2005085884A9 WO2005085884A9 (en) 2006-02-09
WO2005085884A3 WO2005085884A3 (en) 2006-08-03

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US (4) US7248988B2 (enExample)
JP (1) JP4768710B2 (enExample)
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US20070271061A1 (en) 2007-11-22
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