CN1926439B - 用于减少老化期间的温度差异的系统和方法 - Google Patents

用于减少老化期间的温度差异的系统和方法 Download PDF

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Publication number
CN1926439B
CN1926439B CN200580006776.3A CN200580006776A CN1926439B CN 1926439 B CN1926439 B CN 1926439B CN 200580006776 A CN200580006776 A CN 200580006776A CN 1926439 B CN1926439 B CN 1926439B
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China
Prior art keywords
integrated circuit
tested
bias voltage
temperature
environment temperature
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Expired - Lifetime
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Chinese (zh)
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CN1926439A (zh
Inventor
埃里克·千里·盛
戴维·H·霍夫曼
约翰·劳伦斯·尼文
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Qualcomm LLC
Transmeta Inc
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Transmeta Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

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  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CN200580006776.3A 2004-03-01 2005-03-01 用于减少老化期间的温度差异的系统和方法 Expired - Lifetime CN1926439B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/791,099 US7248988B2 (en) 2004-03-01 2004-03-01 System and method for reducing temperature variation during burn in
US10/791,099 2004-03-01
PCT/US2005/006830 WO2005085884A2 (en) 2004-03-01 2005-03-01 System and method for reducing temperature variation during burn in

Publications (2)

Publication Number Publication Date
CN1926439A CN1926439A (zh) 2007-03-07
CN1926439B true CN1926439B (zh) 2010-06-09

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CN200580006776.3A Expired - Lifetime CN1926439B (zh) 2004-03-01 2005-03-01 用于减少老化期间的温度差异的系统和方法

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Country Link
US (4) US7248988B2 (enExample)
JP (1) JP4768710B2 (enExample)
CN (1) CN1926439B (enExample)
WO (1) WO2005085884A2 (enExample)

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US20090316750A1 (en) 2009-12-24
JP4768710B2 (ja) 2011-09-07
CN1926439A (zh) 2007-03-07
WO2005085884A2 (en) 2005-09-15
JP2007526486A (ja) 2007-09-13
US7565259B2 (en) 2009-07-21
WO2005085884A3 (en) 2006-08-03
US20090289654A1 (en) 2009-11-26
US20070271061A1 (en) 2007-11-22
US8843344B2 (en) 2014-09-23
WO2005085884A9 (en) 2006-02-09
US20050192773A1 (en) 2005-09-01

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