WO2005019284A1 - 含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 - Google Patents
含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 Download PDFInfo
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- WO2005019284A1 WO2005019284A1 PCT/JP2004/011937 JP2004011937W WO2005019284A1 WO 2005019284 A1 WO2005019284 A1 WO 2005019284A1 JP 2004011937 W JP2004011937 W JP 2004011937W WO 2005019284 A1 WO2005019284 A1 WO 2005019284A1
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F236/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds
- C08F236/02—Copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds the radical having only two carbon-to-carbon double bonds
- C08F236/20—Copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds the radical having only two carbon-to-carbon double bonds unconjugated
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F236/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L47/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds; Compositions of derivatives of such polymers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0395—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
Definitions
- the present invention relates to a fluorine-containing copolymer, a method for producing the same, and a resist composition containing the same.
- the present invention relates to a novel fluorine-containing copolymer, a method for producing the same, and a resist composition.
- a fluorine-containing polymer having a functional group a functional group-containing fluorine-containing polymer used for a fluorine-based ion exchange membrane, a curable fluorine resin paint, and the like is known. These are linear polymers whose basic skeleton is obtained by copolymerization of a fluoroolefin represented by tetrafluoroethylene with a monomer having a functional group.
- polymers having a functional group and having a fluorinated aliphatic ring structure in the main chain are also known.
- a method for introducing a functional group into a polymer having a fluorinated aliphatic ring structure in the main chain a method utilizing terminal groups of a polymer obtained by polymerization, a method of treating a polymer at a high temperature, a side chain of a polymer, or There are known a method of forming a functional group by oxidatively decomposing the terminal, and a method of introducing a monomer having a functional group by copolymerization and adding a treatment such as hydrolysis as necessary (for example, Patent Documents). See 1, 2, 3, and 4.)
- Patent Document 1 JP-A-4-1189880
- Patent Document 2 Japanese Patent Application Laid-Open No. 4-226177
- Patent Document 3 JP-A-6-220232
- Patent Document 4 WO 02/064648 pamphlet
- the present invention provides a fluorine-containing copolymer having a high functional group concentration and sufficient properties of the functional group, and having high transparency in a wide wavelength range, and a method for producing the same. Further, the present invention is particularly applicable to deep ultraviolet rays such as KrF and ArF excimer lasers and F excimer lasers.
- the present invention has been made to solve the above-mentioned problems, and has the following gist.
- R 1 is a hydrogen atom, an alkyl group having 20 or less carbon atoms which may have an etheric oxygen atom, an alkoxycarbonyl group having 15 or less carbon atoms, or CH R 2 (R 2 is
- alkyl group of R 1 , the alkoxycarbonyl group, and R 2 may have some or all of their hydrogen atoms replaced with fluorine atoms.
- R 3 and R 4 are each independently a hydrogen atom, a fluorine atom, an alkyl group having 3 or less carbon atoms, a fluoroalkyl group having 3 or less carbon atoms, or a cyclic aliphatic hydrocarbon group, and Q is a functional group or a functional group.
- Q represents an alkylene group, an oxyalkylene group, a fluoroalkylene group, or an oxyfluoroalkylene group having a group-containing side chain group.
- R 1 is a hydrogen atom, an alkyl group having 20 or less carbon atoms which may have an etheric oxygen atom, an alkoxycarbonyl group having 15 or less carbon atoms, or CH R Z (R Z is 5 or less alkoxycarbonyl group), wherein the alkyl group of R 1 , the alkoxycarbonyl group, and R 2 may have some or all of their hydrogen atoms replaced with fluorine atoms.
- R 5 represents a hydrogen atom, a fluorine atom, an alkyl group having 3 or less carbon atoms, or a fluoroalkyl group having 3 or less carbon atoms.
- R 6 represents an alkyl group having 20 or less carbon atoms, and a part of the hydrogen atoms of the alkyl group may be substituted with a fluorine atom, an alkyl group or a fluoroalkyl group.
- a radical is formed by reacting the fluorinated gen represented by the above formula (1) with the fluorinated gen represented by the above formula (2) or the acrylic monomer represented by the above formula (3)
- a resist composition comprising: a resist composition;
- a fluorine-containing copolymer having an aliphatic ring structure in the main chain and a functional group in a side chain can be produced.
- the fluorinated copolymer obtained in the present invention has high chemical stability and heat resistance. Since a functional group is introduced into the ring side chain, sufficient functional group characteristics can be exhibited without lowering Tg, which has been difficult to achieve with conventional fluorine-containing polymers. It has high transparency in a wider wavelength range.
- the resist composition of the present invention can be used as a chemically amplified resist, and is particularly transparent to far ultraviolet rays such as KrF and ArF excimer lasers and vacuum ultraviolet rays such as F excimer lasers.
- a resist pattern excellent in sensitivity, dry etching property, sensitivity, resolution, flatness, heat resistance and the like can be easily formed.
- a unit derived from a monomer unit generated by cyclopolymerization of a fluorinated gen represented by the following formula (1) (hereinafter referred to as fluorinated gen (1)) is represented by the following formula: It is formed by cyclopolymerization of the functional group-containing fluorinated gen represented by (2) (excluding the fluorinated gen represented by the formula (1); hereinafter, referred to as fluorinated gen (2)).
- a fluorinated copolymer (A2) having a monomer unit formed by polymerization of a monomer (hereinafter, referred to as an acrylic monomer (3)) can be obtained.
- R 1 is a hydrogen atom, an alkyl group having 20 or less carbon atoms which may have an etheric oxygen atom, an alkoxycarbonyl group having 15 or less carbon atoms, or CH R 2 (R 2 is
- alkyl group of R 1 , the alkoxycarbonyl group, and R 2 may have some or all of their hydrogen atoms replaced with fluorine atoms.
- the alkyl group having 20 or less carbon atoms which may have an etheric oxygen atom includes an aryl group substituted by a cycloalkyl group, an alkyl group, a cycloalkyl group And an alkoxymethyl group and a cyclic ether group.
- the cycloalkyl group here is a polycyclic cycloalkyl group such as a bridged polycycloalkyl group such as an adamantyl group which is not limited to a monocyclic cycloalkyl group such as a cyclohexyl group, or a linked polycycloalkyl group such as a bicyclohexyl group. And the like.
- the alkyl group portion of the alkoxy group in the above alkoxymethyl group and the like may be the above-described cycloalkyl group.
- the alkyl group may have an etheric oxygen atom between carbon atoms (provided that an alkoxymethyl group is one of them).
- the aryl group and the cycloalkyl group may have a substituent such as an alkyl group or an alkoxy group.
- alkyl group having 20 or less carbon atoms that may have an etheric oxygen atom include a methyl group, a methoxymethyl group, an ethoxymethyl group, a 2-methoxyethyl group, a CH (CH) OC H, -CH ⁇ CH (tert-C H), -CH OCH CF, -CH OCF CF, _C
- alkoxycarbonyl group a tert-butoxycarbonyl group (one COO (t_C)
- 2_AdM is a 2_methyladamantino-2-yl group.
- R 1 is a hydrogen atom, methoxymethyl group, t-butyl A tert-butoxycarbonyl group, a 2-cyclohexylcyclohexyloxymethyl group, a mentoxymethyl group or a cyclohexyloxymethyl group.
- R 3 and R 4 are each independently a hydrogen atom, a fluorine atom, an alkyl group having 3 or less carbon atoms, a fluoroalkyl group having 3 or less carbon atoms, or a cyclic aliphatic hydrocarbon group, and Q is a functional group or a functional group.
- Q represents an alkylene group, an oxyalkylene group, a fluoroalkylene group, or an oxyfluoroalkylene group having a group-containing side chain group. It is particularly preferred that R 3 is a fluorine atom and R 4 is a hydrogen atom.
- Q is a functional group or a functional group-containing side chain organic group
- the functional group in the present invention represents a group that imparts a desired function, and includes an ion exchange group, an adhesive group, a crosslinking group
- a functional group is exemplified.
- OR 7 R 7 is a hydrogen atom, an alkyl group having 20 or less carbon atoms which may have an etheric oxygen atom, an alkoxycarbonyl group having 15 or less carbon atoms or CH, and R 8 Is an alkoxycarbonyl group having 15 or less carbon atoms
- CO ⁇ R 9 R 9 is water
- R 7 A sulfonic acid group, an amino group, an epoxy group, a trialkoxysilyl group, a cyano group, and the like.
- R 7 include the same as those described above.
- OR 7 or COOR 9 is preferable, and in that case, the functional group substitution rate in the fluoropolymer (A1) (the sum of OR 1 and OR 7 or COOR 9 in (Formula 1))
- the proportion of R 7 and R 7 other than a hydrogen atom is preferably 0 to 95 mol%, more preferably 5 to 75 mol%, particularly preferably 10 to 60%.
- Examples of the functional group-containing side chain organic group include monovalent organic groups such as a functional group-containing alkyl group, a functional group-containing fluoroalkyl group, a functional group-containing alkoxy group, and a functional group-containing fluoroalkoxy group. You.
- the number of carbon atoms in the portion where the functional group of the functional group-containing side chain organic group is removed is preferably 8 or less, particularly preferably 6 or less.
- the acrylic monomer (3) in the present invention is a compound represented by the following formula (3).
- R 5 is a hydrogen atom, a fluorine atom, alkyl group having 3 or less carbon atoms or represents a Furuoroarukiru group having 3 hereinafter carbons, particularly because of easy availability, a hydrogen atom, fluorine atom, methyl group or triflate It is preferably an orthomethyl group.
- R 6 represents an alkyl group having 20 or less carbon atoms, and a part of hydrogen atoms of the alkyl group is substituted with a fluorine atom, an alkyl group or a fluoroalkyl group.
- Examples of the alkyl group having 20 or less carbon atoms include an aryl group and an alkyl group which may be substituted with a cycloalkyl group, Examples include a kill group, an alkoxymethyl group, a cyclic ether group, and a cyclic ester group.
- the cycloalkyl group may be a monocyclic cycloalkyl group such as a cyclohexyl group, a bridged polycycloalkyl group such as an adamantyl group, or a polycyclic cycloalkyl group such as a linked polycycloalkyl group such as a bicyclohexyl group. And the like.
- the alkyl group portion of the alkoxy group in the alkoxymethyl group or the like may be a cycloalkyl group as described above.
- the alkyl group may have an etheric oxygen atom between carbon atoms (however, an alkoxymethyl group is one of them).
- the aryl group and the cycloalkyl group may have a substituent such as an alkyl group, a hydroxyl group and an alkoxy group.
- R 6 does not have a cyclic structure as described above, it is particularly preferably an alkyl group having 6 or less carbon atoms or a fluoroalkyl group having 6 or less carbon atoms.
- R 5 is a hydrogen atom, a fluorine atom, a methyl group or a trifluoromethyl group
- R 6 is an alkyl group having 6 or less carbon atoms or a fluoroalkyl group having 6 or less carbon atoms. It is preferably a group.
- acrylic monomer (3) examples include the following acrylates.
- acrylic monomers (3) having various structures can be easily synthesized.
- R 1 and R 6 are each other than a hydrogen atom with respect to the functional group substitution rate (the sum of OR 1 in (Formula 1) and COOR 6 in (Formula 3)). Is 0) One 95 mol% is preferred. 5 to 75 mol% is more preferred. Particularly, 10 to 60% is preferred.
- a unit derived from a monomer unit generated by cyclopolymerization of the fluorinated gen (1) is referred to as a monomer unit (1).
- the proportion of the monomer units (1) Z monomer unit (2) is 10 90 mole 0/0/90 10 mole 0/0, it is good Masure,
- a monomer unit of (1) / monomer unit (2) is 50- 90 Monore 0 / OZ50 10 Monore 0/0 and it forces preferably Rere.
- the ratio of the same monomeric units (1) Z monomer unit (3) is 10 90 mole 0/0/90 10 mole 0/0, it is good Masure, In particular, Mo Nomar unit (1) Z monomer unit (3), it forces S preferably 50 90 Monore 0 / OZ50- 10 Monore 0/0.
- the fluorinated copolymer (A1) contains the monomer unit (1) and the monomer unit (2) as essential components, but other radically polymerizable monomers (hereinafter referred to as "others") as long as their properties are not impaired. Monomer unit).). The proportion of other monomer units is preferably at most 50 mol%, particularly preferably at most 15 mol%. The same applies to the fluorinated copolymer (A2). Of course, the monomer unit (1), the monomer unit (2) and the monomer unit (3) are all included.
- ⁇ -olefins such as ethylene, propylene and isobutylene
- fluorine-containing olefins such as tetrafluoroethylene and hexafluoropropylene
- perfluoropropyl bier ether examples include ⁇ -olefins such as ethylene, propylene and isobutylene, fluorine-containing olefins such as tetrafluoroethylene and hexafluoropropylene, and perfluoropropyl bier ether.
- Fluorine-containing vinyl ethers such as fluorinated cyclic monomers such as perfluoro (2,2-dimethyl-1,3-dioxole), and perfluorogens such as perfluoro (buturbul ether) which can be subjected to cyclopolymerization; Alkyl (meth) acrylates, such as idrofuronologens, methyl acrylate, and ethyl methacrylate; butyl esters, such as butyl acetate, benzoyl butyl, and adamantyl acrylate; Athenoles such as vinylene etheres, cyclohexene, Bornene, cyclic Orefin such as Noruborunajen, maleic anhydride, and salts of vinyl and the like.
- the fluorinated copolymer (A1) or the fluorinated copolymer ( ⁇ 2) of the present invention is a fluorinated gen It can be obtained by copolymerizing (1), a fluorinated gen (2) or an acrylic monomer (3) and, if necessary, another monomer under a polymerization initiation source.
- the polymerization initiation source is not particularly limited as long as it causes the polymerization reaction to proceed radically, and examples thereof include a radical generator, light, and ionizing radiation.
- peroxides, azo compounds, persulfates and the like, which are preferred by radical generators are exemplified.
- radical generator examples include azoisobisbutyronitrile, benzoylperoxide, diisopropylperoxydicarbonate, di-t-butylperoxydicarbonate, t-butylperoxybivalate, Fluorobutyryl peroxide, perfluorobenzoyl peroxide, and the like.
- the method of polymerization is also not particularly limited.
- Balta polymerization in which the monomer is directly subjected to the polymerization; fluorinated hydrocarbon, chlorohydrocarbon, fluorinated hydrocarbon, alcohol, hydrocarbon, Examples include solution polymerization performed in other organic solvents; suspension polymerization performed in an aqueous medium in the presence or absence of a suitable organic solvent; and emulsion polymerization performed by adding an emulsifier to an aqueous medium.
- the temperature and pressure at which the polymerization is carried out are not particularly limited, but are preferably set appropriately in consideration of factors such as the boiling point of the monomer, the required heating source, and the removal of the heat of polymerization.
- a suitable temperature can be set between 0 ° C and 200 ° C, and if the room temperature is about 100 ° C, a practically suitable temperature can be set.
- the polymerization can be carried out under reduced pressure or under pressure. Practically, the polymerization can be carried out at a normal pressure of about 100 atm, or even at a normal pressure of about 10 atm.
- the molecular weight of the fluorinated copolymer (A1) or (A2) of the present invention is not particularly limited as long as it can be uniformly dissolved in an organic solvent (C) described later and can be uniformly applied to a substrate.
- the number average molecular weight in terms of polystyrene is suitably 1,000 to 100,000, and preferably 2,000 to 50,000.
- the number average molecular weight is 1000 or more, when used in a resist composition, a better resist pattern is obtained, the residual film ratio after development is sufficient, and the shape stability during pattern heat treatment is better. It becomes.
- the coatability of the resist composition can be improved, and sufficient developability can be maintained.
- the fluorinated copolymer (A1) of the present invention has two or more monomer units (1) having different R 1. You may do it. Similarly, it may have two or more different monomer units (2). The same applies to the fluorine-containing copolymer (A2).
- the fluorine-containing copolymer (A1) of the present invention is a fluorine-containing copolymer having a monomer unit (1) in which R 1 is a hydrogen atom, or when the functional group in the monomer unit (2) is a hydroxyl group
- the hydrogen atom of the monomer unit (1) or the hydrogen atom of the hydroxyl group of the monomer unit (2) can be converted to an organic group by a known method such as the Williamson synthesis method.
- fluorocopolymer in (A1) and (A2) when R 1 is a group other than hydrogen atom can be converted to R 1 a hydrogen atom by hydrolysis or the like.
- the organic group after the conversion is such that R 1 is other than a hydrogen atom.
- R 1 is preferred.
- the organic group after converting the hydroxyl group into an organic group is preferably the above-mentioned OR 7 (where R 7 is other than a hydrogen atom).
- the side chain functional group of the monomer unit (2) of the monomer unit (1) and the COOR 6 of the monomer unit (3) in the fluorocopolymer (A1) and (A2) are respectively After formation of the copolymer, it can be converted to another group.
- the other groups are preferably in the range of each of the groups described above.
- the “unit derived from a monomer unit” in the present invention means a monomer unit itself and a unit obtained by chemically converting a monomer unit after polymerization by functional group conversion or the like.
- the following monomer units (a) to (c) are produced by the polymerization of the fluorogen (1) in the present invention, and the ring of the fluorogen (1) is determined based on the results of spectroscopic analysis and the like. It is considered that a polymer having at least one monomer unit selected from the monomer units (a), (b) and (c) is obtained by the chemical polymerization.
- the main chain of this polymer is composed of carbon atoms that constitute a polymerizable unsaturated bond (in the case of fluorinated gen (1), four carbon atoms that constitute a polymerizable unsaturated double bond). Let's check the carbon chain.
- the following monomer units (d) to (f) are generated by the cyclopolymerization of the fluorine-containing diene (2) in the present invention. It is considered that a polymer having a structure containing at least one monomer unit selected from the monomer units (d), (e) and (f) is obtained by the cyclopolymerization of 2).
- the main chain of the polymer is composed of carbon atoms constituting a polymerizable unsaturated bond (in the case of fluorinated gen (2), four carbon atoms constituting a polymerizable unsaturated double bond). A carbon chain.
- the present invention relates to a fluorinated copolymer (Al) or a fluorinated copolymer (A2)
- the copolymer (A1) or the fluorinated copolymer (A2) is also collectively referred to as a fluorinated copolymer.
- An acid generating compound (B) that generates an acid upon irradiation with light and an organic solvent (C).
- the acid generating compound (B) which generates an acid upon irradiation with light generates an acid upon exposure.
- This acid cleaves (deblocks) the blocked acidic group present in the fluorinated copolymer.
- the exposed portion of the resist film becomes easily soluble in an alkaline developer, and a positive resist pattern is formed by the alkaline developer.
- an acid-generating compound used in a general chemically amplified resist material can be used, such as an onium salt and a halogen-containing compound.
- diazoketone compounds, sulfone compounds and sulfonic acid compounds examples include the following.
- Examples of the above-mentioned onium salt include a rhododium salt, a sulfonium salt, a phosphonium salt, a diazonium salt, a pyridinium salt and the like.
- Specific examples of preferred onium salts include diphenyleodonium triflate, diphenyleodomine pyrene sulfonate, diphenyleodonium dodecylbenzenesulfonate, and bis (4_tert-butylphenyl) eodonate.
- Triflate bis (4_tert_butylphenyl) odonium dimethyl benzene sulfonate, triphenyl sulfonium triflate, triphenyl sulfonium mononate, triphenyl sulfonium perfluorooctane sulfonate, triphenyl norlesulfonium hexane Fluoroantimonate, 1- (naphthylacetomethyl) thiolanium triflate, cyclohexylmethyl (2-oxocyclohexyl) sulfonium triflate, dicyclohexyl (2-oxocyclohexyl) sulfonium triflate Frates, dimethinole (4-hydroxynaphthyl) sulfonium tosylate, dimethyl (4-hydroxynaphthyl) sulfonium dodecylbenzenesulfonate, di
- halogen-containing compound examples include a haloalkyl group-containing hydrocarbon compound and a haloalkyl group-containing heterocyclic compound.
- Specific examples include phenolic bis (trichloromethinole) _s-triazine, methoxyphenylinbis (trichloromethinole) _s —Triazine, naphthyl-bis (trichloromethyl) -S-triazine and other (trichloromethyl) -S-triazine derivatives, and 1,1_bis (4-chlorophenyl) -2,2,2_trichloroethane I can do it.
- Examples of the sulfone compound include / 3-ketosulfone, j3-sulfonylsulfone, and a azo compound of these compounds. Specific examples include 4-trisphenacylsulfone, mesitylphenacylsulfone, and bis (phenylsulfoninole) methane.
- Examples of the sulfonic acid compound include an alkylsulfonic acid ester, an alkylsulfonic acid imide, a haloalkylsulfonic acid ester, an arylsulfonic acid ester, and an iminosulfonate. Specific examples include benzoin tosylate, 1,8_naphthalenedicarboxylic acid imide triflate, and the like.
- the acid generating compound (B) can be used alone or in combination of two or more.
- the organic solvent (C) in the present invention is not particularly limited as long as it dissolves both components of the fluorinated copolymer and the acid generating compound (B).
- Alcohols such as methyl alcohol and ethyl alcohol; ketones such as acetone, methyl isobutyl ketone and cyclohexanone; acetates such as ethyl acetate and butyl acetate; aromatic hydrocarbons such as toluene and xylene; propylene glycol monomethyl ether Glycol monoalkyl ethers such as propylene glycol monoethyl ether; glycol monoalkyl ether esters such as propylene glycol monomethyl ether acetate and carbitol acetate;
- the proportion of each component in the resist composition of the present invention is usually 0.1 to 20 parts by mass of the acid generating compound (B) and 50 to 2000 parts by mass of the organic solvent (C) based on 100 parts by mass of the fluorinated copolymer. Parts are appropriate.
- the acid-generating compound (B) is 0.1 to 10 parts by mass and the organic solvent (C) 100 is 1000 parts by mass with respect to 100 parts by mass of the fluorinated copolymer.
- the amount of the acid generating compound (B) is 0.1 parts by mass or more, sufficient sensitivity and image developability can be provided. When the amount is 10 parts by mass or less, transparency to radiation can be obtained. Properties are sufficiently maintained, and a more accurate resist pattern can be obtained.
- the resist composition of the present invention has an acid-cleavable additive for improving pattern contrast, Surfactants to improve coatability, nitrogen-containing basic compounds to adjust acid generation pattern, adhesion aids to improve adhesion to substrates, and A storage stabilizer and the like can be appropriately added according to the purpose.
- the resist composition of the present invention it is preferable to use filtered through a filter of 0. 1 2 M m after mixing the components uniformly.
- a resist film is formed by applying and drying the resist composition of the present invention on a substrate such as a silicone wafer. Spin coating, flow coating, roll coating, etc. are adopted as the coating method. Light irradiation is performed via a mask in which a pattern is drawn on the formed resist film, and then development processing is performed to form a pattern.
- the light to be irradiated includes ultraviolet rays such as a g-line having a wavelength of 436 nm, an i-line having a wavelength of 365 nm, a KrF excimer laser having a wavelength of 248 nm, an ArF excimer laser having a wavelength of 193 nm, and a wavelength of 157 ⁇ ! ! ! of?
- ultraviolet rays such as excimer lasers and vacuum ultraviolet rays are exemplified. Regis of the present invention
- the composition is useful in applications where ultraviolet light having a wavelength of 250 nm or less, particularly ultraviolet light having a wavelength of 200 nm or less (ArF excimer laser light or F excimer laser light) is used as a light source.
- a resist composition that can be used even for exposure using the so-called immersion technique, in which the resolution is improved by using the refractive index of water and other organic compounds containing fluorine atoms, etc. is there.
- aqueous alkaline solutions are applied as the developing solution.
- alkali include sodium hydroxide, potassium hydroxide, ammonium hydroxide, tetramethylammonium hydroxide, oxide and triethylamine.
- THF tetrahydrofuran.
- AIBN azobisisobutyronitrile.
- BPO benzoyl peroxide.
- PSt polystyrene.
- R225 Dichloropentafluoropropane (solvent).
- IPP diisopropyl peroxydicarbonate.
- PFB perfluorobutyryl peroxide.
- monomer 2 precursor (54-56 ° C./0.08 kPa, hereinafter referred to as monomer 2 precursor).
- the mixture was acidified and heated at 60 ° C for 19 hours.
- the reaction solution was cooled to room temperature, 30 mL of water was added, and the mixture was separated.
- the organic layer was further washed with 150 ml of water to obtain 63 g of a crude liquid.
- 30 g of zinc, 78 g of dioxane and 22 g of water were placed in a 200 mL glass reactor, and heated to 85 ° C. 63 g of the above crude liquid was added dropwise thereto, and the mixture was stirred for 24 hours.
- the reaction solution was filtered and diluted hydrochloric acid was added to separate the solution.
- Example 1 6.00 g of Monomer 1, 0.35 g of t-butynolemethallate, and 6.36 g of ethynole acetate were charged into a 30 mL internal pressure glass reactor. Next, 0.190 g of PFBP O was added as a polymerization initiator. After freezing and degassing the inside of the system, the tube was sealed and polymerized in a constant temperature shaking tank (70 ° C) for 18 hours. After the polymerization, the reaction solution was dropped into hexane to reprecipitate the polymer, followed by vacuum drying at 125 ° C for 10 hours.
- polymer 1A a non-crystalline polymer having a fluorinated ring structure in the main chain
- Mn number average molecular weight
- Mw weight average molecular weight
- Mw / Mn 1.94.
- DSC differential scanning calorimetry
- the reaction solution was dropped into hexane to reprecipitate the polymer, followed by vacuum drying at 125 ° C for 10 hours.
- polymer 2A a non-crystalline polymer having a fluorinated ring structure in the main chain
- Mn number average molecular weight
- Mw weight average molecular weight
- the polymer When measured by differential scanning calorimetry (DSC), the Tg was 114 ° C.
- the polymer was a color powder.
- the obtained polymer is soluble in acetone, THF, ethyl acetate, methanol, 2_perfluorohexylethanol, and insoluble in R225, perfluoro (2-butyltetrahydrofuran), and perfluoro- n -octane. there were.
- Olg of a non-crystalline polymer having a fluorinated ring structure in the main chain (hereinafter referred to as polymer 3A) was obtained.
- the obtained polymer was soluble in acetone, THF, ethyl acetate, methanol, 2_perfluorohexylethanol, and insoluble in perfluoro (2-butyltetrahydrofuran) and perfluoro_n-octane.
- polymer 4A a non-crystalline polymer having a fluorinated ring structure in the main chain
- Mn number average molecular weight
- Mw weight average molecular weight
- Mw / Mn 2.91.
- DSC differential scanning calorimetry
- the obtained polymer was soluble in acetone, THF, ethyl acetate, methanol, and 2-perfluorohexylethanol, and was insoluble in R225, perfluoro (2-butyltetrahydrofuran) and perfluoro-n-octane. .
- polymer 5A a non-crystalline polymer having a fluorinated ring structure in the main chain
- Mn number average molecular weight
- Mw weight average molecular weight
- Mw / Mn 1.92.
- DSC differential scanning calorimetry
- the obtained polymer is soluble in acetone, THF, ethyl acetate, 2_perfluorohexylethanol, methanol, R225, perfluoro (2-butyltetrahydrofuran), perfluoro-n-octane. was insoluble.
- the reaction solution was dropped into hexane to reprecipitate the polymer, followed by vacuum drying at 120 ° C for 24 hours.
- Mn number average molecular weight
- Mw weight average molecular weight
- Mw / Mn 2.50.
- DSC differential scanning calorimetry
- the obtained polymer was soluble in acetone, THF, ethyl acetate, methanol, 2_perfluorohexylethanol, and insoluble in perfluoro (2-butyltetrahydrofuran) and perfluoro_n-octane.
- the obtained polymer was dissolved in 50 ml of methanol, 2 ml of a separately prepared methanol solution containing 0.12 g of sodium hydroxide was added dropwise, and the mixture was stirred overnight at room temperature under a nitrogen atmosphere. Next, methanol was removed with an evaporator, and after adding 50 ml of THF, 0.4 g of CF 2 CHOCHCl was added dropwise under a nitrogen atmosphere. As it is, nitrogen for 2 days
- the reaction solution was suspended in white due to the formation of sodium chloride.
- the reaction solution was filtered through celite and concentrated with an evaporator.
- the concentrate was dissolved in R225, washed with water and separated.
- the R225 layer was dropped into hexane to reprecipitate the polymer, followed by vacuum drying at 100 ° C for 20 hours.
- the obtained polymer was soluble in acetone, THF, ethyl acetate, methanol, and 2-perfluorohexylethanol, and was insoluble in perfluoro (2-butyltetrahydrofuran) and perfluoro_n-octane.
- Example 7 instead of 0.4 g of CF CH OCH C1, chloromethylcyclohexyl was used.
- Example 7 The same operation as in Example 7 was carried out except that 0.44 g of ether was used, to obtain 550 g of a non-crystalline polymer having a fluorine-containing ring structure in the main chain.
- Mn number average molecular weight
- Mw weight average molecular weight
- MwZMn 2.49.
- Tg was 103 ° C. and the polymer was a white powder at room temperature.
- the obtained polymer was soluble in acetone, THF, ethyl acetate, methanol, 2_perfluorohexylethanol, and insoluble in perfluoro (2-butyltetrahydrofuran) and perfluoro_n-octane.
- Example 15 1 g of the polymer 1A, 2A, 3A, 4A or 5A synthesized in 1-5 and 0.05 g of trimethylsulfonium triflate were dissolved in 10 g of propylene glycol monomethyl ether acetate, and the pore size was 0.2 ⁇ The resultant was filtered using a PTFE filter manufactured by the above-mentioned method to produce a resist composition.
- the above resist composition was spin-coated on a silicon substrate treated with hexamethyldisilazane, and heated at 80 ° C for 2 minutes after coating to form a 0.3 ⁇ m-thick resist film. Formed.
- the substrate on which the resist film was formed was placed in a nitrogen-substituted exposure experiment apparatus, and a mask formed by drawing a pattern on a quartz plate with chromium was adhered to the substrate. KrF excimer laser light was irradiated through the mask, and after that, exposure was performed at 100 ° C for 2 minutes, and then beta was performed.
- Example 9 1 A 5 3 0 .16 Example 10 2 A 4 8 0 .16 Example 1 13 A 5 0 .0 16 Example 1 24 A 4 7 0 .16 Example 1 3 5 A 2 1 0. 1 7 Industrial applicability
- the fluorinated copolymer of the present invention can be used, for example, for ion-exchange resins, ion-exchange membranes, fuel cells, various battery materials, optical fibers, electronic materials, transparent film materials, and high density It can be used for films, adhesives, fiber materials, weather-resistant paints, etc.
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- Polymers & Plastics (AREA)
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Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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EP04771898A EP1657264A1 (en) | 2003-08-21 | 2004-08-19 | Fluorocopolymer, process for producing the same, and resist composition containing the same |
US11/353,149 US20060135663A1 (en) | 2003-08-21 | 2006-02-14 | Fluorinated copolymer process for its production and resist composition containing it |
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JP2003-297404 | 2003-08-21 | ||
JP2003297404 | 2003-08-21 | ||
JP2004-131485 | 2004-04-27 | ||
JP2004131485A JP2005097531A (ja) | 2003-08-21 | 2004-04-27 | 含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 |
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US11/353,149 Continuation US20060135663A1 (en) | 2003-08-21 | 2006-02-14 | Fluorinated copolymer process for its production and resist composition containing it |
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US (1) | US20060135663A1 (ja) |
EP (1) | EP1657264A1 (ja) |
JP (1) | JP2005097531A (ja) |
KR (1) | KR20060040609A (ja) |
TW (1) | TW200516348A (ja) |
WO (1) | WO2005019284A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2006132287A1 (ja) * | 2005-06-08 | 2006-12-14 | Asahi Glass Company, Limited | 含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 |
Families Citing this family (11)
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JP2005060664A (ja) * | 2003-07-31 | 2005-03-10 | Asahi Glass Co Ltd | 含フッ素化合物、含フッ素ポリマーとその製造方法およびそれを含むレジスト組成物 |
EP1679297B1 (en) * | 2003-10-31 | 2009-08-05 | Asahi Glass Company, Limited | Fluorine compound, fluoropolymer, and process for producing the same |
JP4407358B2 (ja) * | 2004-04-14 | 2010-02-03 | 旭硝子株式会社 | 含フッ素ポリマーおよびレジスト組成物 |
JPWO2005108446A1 (ja) * | 2004-05-07 | 2008-03-21 | 旭硝子株式会社 | 含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 |
EP1772468A4 (en) * | 2004-07-30 | 2008-07-30 | Asahi Glass Co Ltd | FLUORINE-CONTAINING COMPOUND, FLUORINE-CONTAINING POLYMER, RESIST COMPOSITION, AND RESISTANT PROTECTIVE FILM COMPOSITION |
JP4736522B2 (ja) * | 2005-04-28 | 2011-07-27 | 旭硝子株式会社 | エッチング処理された処理基板の製造方法 |
JP4742665B2 (ja) * | 2005-04-28 | 2011-08-10 | 旭硝子株式会社 | エッチング処理された処理基板の製造方法 |
US20090042148A1 (en) * | 2007-08-06 | 2009-02-12 | Munirathna Padmanaban | Photoresist Composition for Deep UV and Process Thereof |
JP5320720B2 (ja) * | 2007-10-17 | 2013-10-23 | 旭硝子株式会社 | 新規な、含フッ素化合物および含フッ素重合体 |
JP5690500B2 (ja) * | 2010-03-26 | 2015-03-25 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、及びそれを用いたパターン形成方法 |
CN118715256A (zh) * | 2022-02-21 | 2024-09-27 | Agc株式会社 | 含氟聚合物、组合物、防潮涂布剂及物品 |
Citations (2)
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WO2002064648A1 (fr) * | 2001-02-09 | 2002-08-22 | Asahi Glass Company, Limited | Composes et polymeres contenant du fluor et leurs procedes de production |
WO2002065212A1 (fr) * | 2001-02-09 | 2002-08-22 | Asahi Glass Company, Limited | Composition de reserve |
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JP2001302725A (ja) * | 2000-04-26 | 2001-10-31 | Asahi Glass Co Ltd | 含フッ素ジエン、その製造方法およびその重合体 |
ATE289082T1 (de) * | 2000-06-13 | 2005-02-15 | Asahi Glass Co Ltd | Resistzusammensetzung |
WO2001098834A1 (fr) * | 2000-06-21 | 2001-12-27 | Asahi Glass Company, Limited | Composition de reserve |
JP4010160B2 (ja) * | 2002-03-04 | 2007-11-21 | 旭硝子株式会社 | レジスト組成物 |
EP1553110A4 (en) * | 2002-08-21 | 2008-02-13 | Asahi Glass Co Ltd | FLUOROUS COMPOUNDS, FLUORO POLYMERS AND MANUFACTURING METHOD THEREFOR |
WO2004042475A1 (ja) * | 2002-11-07 | 2004-05-21 | Asahi Glass Company, Limited | レジスト組成物 |
KR20050084631A (ko) * | 2002-11-07 | 2005-08-26 | 아사히 가라스 가부시키가이샤 | 함불소 폴리머 |
EP1679297B1 (en) * | 2003-10-31 | 2009-08-05 | Asahi Glass Company, Limited | Fluorine compound, fluoropolymer, and process for producing the same |
JP4407358B2 (ja) * | 2004-04-14 | 2010-02-03 | 旭硝子株式会社 | 含フッ素ポリマーおよびレジスト組成物 |
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- 2004-04-27 JP JP2004131485A patent/JP2005097531A/ja active Pending
- 2004-08-19 WO PCT/JP2004/011937 patent/WO2005019284A1/ja active Application Filing
- 2004-08-19 EP EP04771898A patent/EP1657264A1/en not_active Withdrawn
- 2004-08-19 KR KR1020057025229A patent/KR20060040609A/ko not_active Application Discontinuation
- 2004-08-20 TW TW093125257A patent/TW200516348A/zh unknown
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- 2006-02-14 US US11/353,149 patent/US20060135663A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002064648A1 (fr) * | 2001-02-09 | 2002-08-22 | Asahi Glass Company, Limited | Composes et polymeres contenant du fluor et leurs procedes de production |
WO2002065212A1 (fr) * | 2001-02-09 | 2002-08-22 | Asahi Glass Company, Limited | Composition de reserve |
Cited By (1)
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WO2006132287A1 (ja) * | 2005-06-08 | 2006-12-14 | Asahi Glass Company, Limited | 含フッ素共重合体とその製造方法およびそれを含むレジスト組成物 |
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JP2005097531A (ja) | 2005-04-14 |
US20060135663A1 (en) | 2006-06-22 |
TW200516348A (en) | 2005-05-16 |
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