WO2005001154A1 - 多元系被膜の製造安定化装置と方法および多元系膜被覆工具 - Google Patents
多元系被膜の製造安定化装置と方法および多元系膜被覆工具 Download PDFInfo
- Publication number
- WO2005001154A1 WO2005001154A1 PCT/JP2004/009158 JP2004009158W WO2005001154A1 WO 2005001154 A1 WO2005001154 A1 WO 2005001154A1 JP 2004009158 W JP2004009158 W JP 2004009158W WO 2005001154 A1 WO2005001154 A1 WO 2005001154A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plasma
- raw material
- evaporating
- sequentially
- melting
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B27/00—Tools for turning or boring machines; Tools of a similar kind in general; Accessories therefor
- B23B27/14—Cutting tools of which the bits or tips or cutting inserts are of special material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B51/00—Tools for drilling machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
- B23P15/00—Making specific metal objects by operations not covered by a single other subclass or a group in this subclass
- B23P15/28—Making specific metal objects by operations not covered by a single other subclass or a group in this subclass cutting tools
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
Definitions
- the present invention relates to a production stabilizing apparatus and method capable of easily producing a nitride, carbide, boride, oxide or silicide having a metal component of two or more elements such as TiAIN, as compared with the prior art. And a coated tool formed by using the same method.
- PVD Physical Vapor Deposition
- the ion plating method which is a form of the PVD method and combines a part of the vacuum deposition method and the sputtering process, is used to coat metal compounds such as metal carbides, metal nitrides, and metal oxides, or composites of these. Is a surface treatment method for forming. This method is important at present, particularly as a surface coating method for sliding members and cutting tools.
- nitrides having two or more metal components have been produced exclusively by an arc method or a sputtering method.
- an alloy target serving as an evaporating material is expensive, and it is necessary to prepare a target having a composition according to a target film composition.
- the inevitable unreacted metal droplets adhere and the film quality cannot be said to be good.
- the sputtering method can form a very smooth film, but generally has a low film forming speed.
- the melt evaporation type ion plating method (hereinafter, abbreviated as melting method) has an advantage that most of the input raw material can be evaporated and the utilization rate of the raw material metal is high. For this reason, it is particularly advantageous when a metal having a high raw material price or a metal that is difficult to process is used as a raw material. However, it has been difficult for conventional melting methods to uniformly evaporate two or more metal raw materials with significantly different melting points.
- the composition of the obtained film depends on the difference in the melting points, and the film on the base material side becomes a film in which the ratio of the high melting point metal increases toward the surface layer where the ratio of the low melting point metal increases.
- the composition distribution depends solely on the melting point, and it is difficult to control the composition of the film in the film thickness direction.
- FIG. 3 shows a film formation state of a TiAIN film using a conventional alloy melting material.
- the alloy 104 as a melting raw material is formed in a large area, and is placed on a water-cooled 110-type crucible 103.
- the alloy vapor is ionized by the focused plasma 107.
- the molten portion 104a of the alloy largely overlaps the unmelted portion 104b.
- an evaporation raw material containing at least two or more metals, alloys, or intermetallic compounds is dissolved and evaporated in a single crucible or hearth and converged by an electric field or a magnetic field.
- a multi-component coating is formed using plasma.
- a part of the raw material is melted and evaporated, and then an unmelted portion of the raw material is sequentially melted and evaporated.
- the sequential melting and evaporation of the unmelted portion of the raw material supplies the initial power required to evaporate the raw material, and supplies the power that is gradually increased from the initial power after a predetermined time to the required maximum power. Or the plasma is converged to the first plasma region necessary to evaporate the raw material, and the next plasma is moved and expanded sequentially from the first plasma region to maximize the plasma region It is preferable to continuously move and enlarge the image up to the point where it is performed.
- each component of a metal having a significantly different melting point such as TiAIN, has a desired film composition distribution over the entire film thickness to obtain a good film quality. It is possible.
- the evaporation source does not need to exactly match the target film composition. It is possible to use a raw material alloy having a metal component that is almost similar to the target film composition.
- the raw material is preferably a sintered body or a green compact.
- a molten portion can be separated from an unmelted portion.
- the raw material can be used effectively by dissolving and evaporating the unmelted portion in sequence and using the whole almost effectively.
- the coated tool according to the present invention uses a high-speed tool steel, a die steel, a cemented carbide, a cermet, or the like as a cutting tool base material, and includes a plurality of metal elements on the base material by the above-described method of the present invention. Form a nitride, carbide, boride, oxide or silicide coating.
- the inventors attempted to form a TiAIN film using 50 g of a TiAl alloy as a melting raw material under the conditions for obtaining a general TiN film. At this time, the entire TiAl alloy was melted within a few minutes. The resulting coating had a composition in which the proportion of Ti increased as it went to the surface layer with more A1 on the base metal side. This is because A1 has a lower melting point than the T-beam and preferentially evaporates the dissolved raw material. The film thus obtained was a film having lower film hardness and poor adhesion as compared with the TiN film.
- the inventors of the present invention have considered the replenishment of A1 that dies due to evaporation, and have conducted experiments such as additional injection of A1 into the melting site during melting.
- the electric power used to dissolve the raw material is generally controlled at a substantially constant electric power that is initially selected as the optimum power except at the start of melting.
- the present inventors gradually increase this electric power at a predetermined time during melting, so that the unmelted portion starts to newly melt, and replenishes the coating with the low melting point metal contained in the unmelted portion. We inferred that we could do that, and after many experiments, we were able to prove this.
- the plasma region used for melting the raw material can be obtained by excluding the start of melting.
- control is performed in a substantially constant plasma region which is initially selected as optimal.
- the inventors moved the plasma region sequentially and expanded the plasma region to obtain the first region. It was inferred that similar effects could be obtained by performing plasma control that continuously moves and expands from the plasma region to the largest plasma region. Was proved.
- the present invention is based on such findings of the inventors.
- the production stabilizing apparatus uses a sintered body or a green compact containing at least two or more kinds of metals or intermetallic compounds as an evaporation raw material, and dissolves and evaporates the raw material to form a multi-component coating.
- the production stabilizing apparatus includes a single vacuum crucible or hearth in which a vacuum container 1 for accommodating a member to be coated, that is, a work 2, and a green compact 4 of a raw material provided in the container. With 3.
- the apparatus further includes an HCD (Hollow Cathode Gun) gun 5 for supplying electric power to the crucible to cause an arc discharge and evaporating and ionizing the raw material by the heat and plasma 7.
- a power supply device 6 and a plasma control device 9 including an electromagnetic coil 8 for controlling a magnetic field for converging plasma when evaporating a raw material are provided.
- the manufacturing stabilization apparatus of the present embodiment has the same configuration as that of the conventional apparatus based on the melt evaporation type ion plating method, except for the power supply device 6 and the plasma control device 9, and the same components are no more. Is omitted.
- the power supply device 6 has a configuration capable of gradually increasing power to be supplied and sequentially increasing power supply for sequentially melting unmelted portions of the raw material.
- the power supply device 6 of the present embodiment When sequentially increasing power supply, the power supply device 6 of the present embodiment first supplies 3000 W of power necessary for evaporating the raw material. After that, the equipment supplies 500W more power than the power just supplied, after a predetermined time of one minute. In this way, the power increased by 500 W is repeatedly supplied until the required maximum power reaches 8000 W, and the unmelted portions are sequentially melted.
- the plasma control device 9 has a configuration in which the control of the magnetic field for converging the plasma when evaporating the raw material can be changed.
- the plasma control device 9 when performing variable plasma control, first includes a first plasma region necessary for evaporating the raw material, for example, a region having a diameter of 10 mm at the approximate center of the green compact 4, To converge the plasma. The device is then Control to sequentially move and expand the plasma. In this way, the plasma moves and expands continuously * until it reaches the maximum plasma region with a diameter of 40 mm covering almost the entire green compact, and gradually melts the unmelted part.
- plasma control is performed to continuously move and expand the plasma beam diameter from a region of approximately 10 mm in diameter at the center of the green compact to cover the entire green compact of approximately 40 mm in diameter. Then, unmelted portions were sequentially dissolved.
- a TiAIN film was formed on a high-speed drill and a carbide end mill which had been previously coated with TiCN as a base.
- Cutting method drilling, 5 cutting each
- a multi-layer coating having a metal component having a significantly different melting point, such as TiAIN has a good film quality such that each component of a different metal has a desired coating distribution over the entire film thickness.
- a raw material alloy having a metal component almost close to the target film composition can be used, and almost the entire material can be effectively used. Is high.
- FIG. 2 shows a molten state of the green compact 4 of the raw material in the production stabilizing apparatus.
- the green compact 4 is cylindrical and placed in a water-cooled 10-type crucible 3.
- the crucible 3 in the vacuum vessel is turned into plasma, and the plasma 7 is controlled to converge on the raw material.
- the central portion of the green compact 4 is melted and evaporated by the heat generated when plasma is generated, and the vapor is ionized.
- a sintered body or a green compact having a void has a greater heat insulating effect than an alloy material or the like, and its volume decreases when it is melted. For this reason, the melted portion and the unmelted portion can be easily separated.
- Example 2 The coating was performed on the cemented carbide insert (A30) under the conditions of Example 1 and heated and maintained at 900 ° C. for 1 hour in the atmosphere.
- the results of measuring the thickness of the surface oxide layer of this insert are also shown in Table 1 (item: oxide thickness). It can be seen that, compared to the arc method (conventional example), since the number of film defects such as droplets is smaller, the oxidation progresses slowly, and the thickness of the oxide layer is also reduced (the oxidation resistance is improved).
- a carbide end mill previously coated with a TiCN film under the conditions of Example 1 was coated with a TiAIN film.
- the flank wear width was measured at a cutting length of 60 m (Table 1 item: End mill flank wear). The cutting specifications are shown below.
- Cut 10mm in axial direction, 0.2mm in radial direction
- Carbide end mills showed equal or slightly better wear resistance than TiAIN films formed by the arc method. Since the components of the coating are the same, it is considered that the reduction in droplets contributes to the improvement in oxidation resistance.
- the melting, evaporation and ionization of the raw material are performed by plasma, but the melting, evaporation and ionization of the raw material may be performed separately by using a heating device capable of changing a heating region.
- a force electric field utilizing a magnetic field may be used for the convergence control of the plasma.
- Example 1 only one of the powers for forming the film by using the power supply control and the plasma control together may be used.
- FIG. 1 is a schematic diagram showing the overall configuration of a multi-layer coating production stabilization apparatus according to an embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view for explaining a molten state of a raw material compact in the apparatus of FIG. 1.
- FIG. 3 is a schematic cross-sectional view of a crucible for describing a molten state when an alloy material having a large area is used.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Drilling Tools (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04746627A EP1642999A1 (en) | 2003-06-30 | 2004-06-29 | Multinary deposition film production stabilizing device and method, and tool with multinary deposition film |
US10/561,248 US20060280877A1 (en) | 2003-06-30 | 2004-06-29 | Multinary deposition film production stabilizing device and method, and tool with multinary deposition film |
JP2005511083A JPWO2005001154A1 (ja) | 2003-06-30 | 2004-06-29 | 多元系被膜の製造安定化装置と方法および多元系膜被覆工具 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003187564 | 2003-06-30 | ||
JP2003-187564 | 2003-06-30 | ||
JP2003325405 | 2003-09-18 | ||
JP2003-325405 | 2003-09-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005001154A1 true WO2005001154A1 (ja) | 2005-01-06 |
Family
ID=33554492
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/009158 WO2005001154A1 (ja) | 2003-06-30 | 2004-06-29 | 多元系被膜の製造安定化装置と方法および多元系膜被覆工具 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20060280877A1 (ja) |
EP (1) | EP1642999A1 (ja) |
JP (1) | JPWO2005001154A1 (ja) |
KR (1) | KR20060032964A (ja) |
WO (1) | WO2005001154A1 (ja) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62211376A (ja) * | 1986-02-06 | 1987-09-17 | Mitsubishi Electric Corp | 膜成長制御装置 |
JPH02101160A (ja) * | 1988-10-06 | 1990-04-12 | Asahi Glass Co Ltd | イオンプレーティング方法 |
JPH03193868A (ja) * | 1989-12-21 | 1991-08-23 | Toyota Motor Corp | 薄膜の形成方法 |
JPH0665466U (ja) * | 1993-03-02 | 1994-09-16 | 中外炉工業株式会社 | イオンプレーティング装置 |
JPH06264225A (ja) * | 1993-03-12 | 1994-09-20 | Ulvac Japan Ltd | イオンプレーティング装置 |
JP2001001202A (ja) * | 1999-04-23 | 2001-01-09 | Hitachi Tool Engineering Ltd | 被覆工具 |
JP2002212712A (ja) * | 2001-01-15 | 2002-07-31 | Shin Meiwa Ind Co Ltd | 成膜方法、真空成膜装置の制御装置、及び真空成膜装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0385475A3 (en) * | 1989-03-02 | 1991-04-03 | Asahi Glass Company Ltd. | Method of forming a transparent conductive film |
-
2004
- 2004-06-29 WO PCT/JP2004/009158 patent/WO2005001154A1/ja not_active Application Discontinuation
- 2004-06-29 EP EP04746627A patent/EP1642999A1/en not_active Withdrawn
- 2004-06-29 US US10/561,248 patent/US20060280877A1/en not_active Abandoned
- 2004-06-29 JP JP2005511083A patent/JPWO2005001154A1/ja not_active Withdrawn
- 2004-06-29 KR KR1020057025301A patent/KR20060032964A/ko not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62211376A (ja) * | 1986-02-06 | 1987-09-17 | Mitsubishi Electric Corp | 膜成長制御装置 |
JPH02101160A (ja) * | 1988-10-06 | 1990-04-12 | Asahi Glass Co Ltd | イオンプレーティング方法 |
JPH03193868A (ja) * | 1989-12-21 | 1991-08-23 | Toyota Motor Corp | 薄膜の形成方法 |
JPH0665466U (ja) * | 1993-03-02 | 1994-09-16 | 中外炉工業株式会社 | イオンプレーティング装置 |
JPH06264225A (ja) * | 1993-03-12 | 1994-09-20 | Ulvac Japan Ltd | イオンプレーティング装置 |
JP2001001202A (ja) * | 1999-04-23 | 2001-01-09 | Hitachi Tool Engineering Ltd | 被覆工具 |
JP2002212712A (ja) * | 2001-01-15 | 2002-07-31 | Shin Meiwa Ind Co Ltd | 成膜方法、真空成膜装置の制御装置、及び真空成膜装置 |
Non-Patent Citations (1)
Title |
---|
KIMURA A, ET AL: "Hot-pressed Ti-Al targets for synthesizing Ti1-xAlxN films by the arc ion plating method", THIN SOLID FILMS, vol. 382, 2001, pages 101 - 105, XP002903405 * |
Also Published As
Publication number | Publication date |
---|---|
EP1642999A1 (en) | 2006-04-05 |
KR20060032964A (ko) | 2006-04-18 |
JPWO2005001154A1 (ja) | 2006-11-09 |
US20060280877A1 (en) | 2006-12-14 |
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