WO2004114385A1 - 気化方法及び気化器 - Google Patents
気化方法及び気化器 Download PDFInfo
- Publication number
- WO2004114385A1 WO2004114385A1 PCT/JP2004/008718 JP2004008718W WO2004114385A1 WO 2004114385 A1 WO2004114385 A1 WO 2004114385A1 JP 2004008718 W JP2004008718 W JP 2004008718W WO 2004114385 A1 WO2004114385 A1 WO 2004114385A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- raw material
- carrier gas
- material solution
- vaporization
- gas
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
Definitions
- the present invention relates to a vaporization method and a vaporization method capable of atomizing and gasifying and decomposing a liquid raw material without lowering the temperature of an airflow into a high-temperature region such as a MOCVD apparatus or a flow path maintained at a high temperature. It is about a vessel.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2000-216150
- One of the devices indispensable for semiconductor device production is a CVD device.
- Most of the reactive species supplied to this CVD system are gases.
- An example of this is the production of a ferroelectric thin film using a MOCVD apparatus.
- the raw materials must be transported, the raw materials need to be atomized by the best equipment, and the raw materials must be prepared.
- Patent Document 1 As a technique for solving the above problem, a technique described in (Patent Document 1) is known.
- Fig. 1 shows the device.
- This apparatus is a technique for causing a carrier gas to contain an atomized raw material solution and then performing vaporization.
- the carrier gas is heated to a high level by cooling the supply path and the gas path of the raw material solution.
- the vaporizer according to the present invention is a vaporization method characterized in that a raw material solution is brought into contact with a heated carrier gas and transported to the next step.
- a vaporizer according to the present invention, a vaporization chamber, a carrier gas passage communicating with the vaporization chamber, a raw material solution inlet for introducing a raw material solution into the passage, and heating the carrier gas. Means for performing the above-mentioned steps.
- the raw material solution that is sheared by the carrier gas and contained in the carrier gas in the form of a mist or mist with a particle size of 1 ⁇ m or less does not gasify in the vaporization chamber for any reason, and the fine particles are vaporized. It was presumed that it was introduced into the deposition chamber as it was and solidified.
- a heated carrier gas is used as the carrier gas, whereby the fine particles in the film can be significantly reduced.
- Any means may be used as a means for introducing the raw material into the carrier gas and performing a mistake.
- the means for heating the carrier gas is not limited. Heat at least until it comes into contact with the raw material solution.
- FIG. 1 is a cross-sectional view showing a main part of a vaporizer for MOCVD used in an embodiment.
- the temperature of the heated carrier gas is 100 to 300 ° C.
- the temperature of the heated carrier gas is 200 to 250 ° C.
- the raw material solution is characterized in that an organic metal compound is dissolved in a solvent.
- an organic metal compound is dissolved in a solvent.
- scattering of the fine particles is particularly likely to occur.
- the scattering of the fine particles can be significantly reduced in the present invention.
- the carrier gas is an inert gas.
- the carrier gas is a gas containing an oxidizing gas in an inert gas.
- an oxidizing gas is included in the carrier gas, the carbon content during film formation is significantly reduced, and the number of fine particles is also reduced.
- the raw material solution is introduced by setting the velocity of the carrier gas to a subsonic velocity.
- Carrier gas flows below the speed of sound.
- the feed solution may condense.
- the speed be equal to or higher than the subsonic speed.
- the shearing effect on the raw material solution acts more slowly, and the raw material solution has a particle diameter of 1 / m or less, and is misted in the carrier gas.
- the raw material solution is introduced into the carrier gas passage through a hole having a diameter of 0.05 mm to 0.5 mm.
- the raw material solution is preferably introduced through a hole having a diameter of 0.05 mm to 0.5 mm.
- the carrier gas before the introduction of the raw material solution may contain a solvent for the raw material solution. By including the solvent, it is possible to effectively prevent the condensation of the raw material solution.
- the raw material concentration in the raw material solution is 0.2 molZL or less. Uniform mist is achieved by using a raw material solution of 0.2 mol / L or less.
- the present invention is more effective for power MOCVD raw materials, for example, SBT, PZT, BST, LBT, and the like, in which arbitrary raw materials are used. Even in the case of a powerful raw material, the raw material and the solvent are gasified and decomposed while instantaneously atomizing, and the generation of fine particles is significantly reduced.
- the members around the flow path through which the raw material and the solvent and the high-temperature neutral or oxidizing gas pass are made of a material having high heat shielding properties. This is to keep the liquid temperature of the raw material and the solvent at a lower temperature until the moment when the MOCVD raw material and the solvent are atomized by a high-speed high-temperature gas stream, thereby preventing the evaporation of the solvent and the deterioration of the raw material.
- the SBT film was formed.
- the apparatus used is the apparatus shown in FIG.
- the raw material concentration of the abbreviated name (Sr / Ta) organometallic complex is 0.1 mol / L.
- the flow rate was 0.02 mL / min.
- the raw material concentration of the Bi organometallic complex was 0.2 mol / L, and the supply flow rate was 0.02 mL. Z min.
- a raw material solution was prepared using n-Hexane as a solvent.
- the supply rate was 0.2 mL / min for each raw material flow rate.
- the carrier gas was heated to 200 ° C. before being introduced into the passage.
- the flow rate is 210mL
- An SBT film was formed under conditions of force and strength, and the scattering of fine particles in the film was observed.
- an SBT film was formed in the same manner as in Example 1 except for the heating of the carrier gas, and the scattering of fine particles in the film was observed.
- Example 1 the amount of fine particles was reduced to 1Z50 or less as compared with the case of Comparative Example 1.
- the calorie heat temperature of the carrier gas is 50. C, 100. C, 150. C, 200. C, 250. C, 300
- the film was formed while changing the temperature to ° C.
- the number of fine particles was smaller than in Comparative Example 1.
- the number of fine particles rapidly decreased from 100 ° C, and became the smallest at 200 ° C.
- the use of the vaporizer according to the present invention makes it possible to prevent the generation of fine particles of 1 ⁇ m or less, which is a concern when a conventional vaporizer is used.
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/561,512 US20060160360A1 (en) | 2003-06-20 | 2004-06-21 | Evaporation method and evaporator |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003-177378 | 2003-06-20 | ||
JP2003177378A JP2005012134A (ja) | 2003-06-20 | 2003-06-20 | 気化方法及び気化器 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004114385A1 true WO2004114385A1 (ja) | 2004-12-29 |
Family
ID=33534956
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/008718 WO2004114385A1 (ja) | 2003-06-20 | 2004-06-21 | 気化方法及び気化器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20060160360A1 (ja) |
JP (1) | JP2005012134A (ja) |
KR (1) | KR20060023151A (ja) |
TW (1) | TW200503060A (ja) |
WO (1) | WO2004114385A1 (ja) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000192243A (ja) * | 1998-12-24 | 2000-07-11 | Nissin Electric Co Ltd | 気化器メンテナンス方法 |
JP2000226668A (ja) * | 1999-02-02 | 2000-08-15 | Ebara Corp | 気化装置 |
JP2000353700A (ja) * | 1999-06-14 | 2000-12-19 | Mitsubishi Electric Corp | 高誘電率薄膜の形成方法および半導体装置の製造方法 |
JP2001313271A (ja) * | 2000-04-27 | 2001-11-09 | Hitachi Ltd | 半導体製造方法 |
JP2001316822A (ja) * | 2000-05-01 | 2001-11-16 | Fujikura Ltd | Cvd用液体原料供給装置 |
WO2002058141A1 (fr) * | 2001-01-18 | 2002-07-25 | Kabushiki Kaisha Watanabe Shoko | Carburateur, dispositifs de divers types utilisant ce carburateur et procede de vaporisation |
JP2003105545A (ja) * | 2001-09-27 | 2003-04-09 | Japan Pionics Co Ltd | 気化供給方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6244575B1 (en) * | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
-
2003
- 2003-06-20 JP JP2003177378A patent/JP2005012134A/ja active Pending
-
2004
- 2004-06-21 TW TW093117893A patent/TW200503060A/zh unknown
- 2004-06-21 KR KR1020057024039A patent/KR20060023151A/ko not_active Application Discontinuation
- 2004-06-21 WO PCT/JP2004/008718 patent/WO2004114385A1/ja active Application Filing
- 2004-06-21 US US10/561,512 patent/US20060160360A1/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000192243A (ja) * | 1998-12-24 | 2000-07-11 | Nissin Electric Co Ltd | 気化器メンテナンス方法 |
JP2000226668A (ja) * | 1999-02-02 | 2000-08-15 | Ebara Corp | 気化装置 |
JP2000353700A (ja) * | 1999-06-14 | 2000-12-19 | Mitsubishi Electric Corp | 高誘電率薄膜の形成方法および半導体装置の製造方法 |
JP2001313271A (ja) * | 2000-04-27 | 2001-11-09 | Hitachi Ltd | 半導体製造方法 |
JP2001316822A (ja) * | 2000-05-01 | 2001-11-16 | Fujikura Ltd | Cvd用液体原料供給装置 |
WO2002058141A1 (fr) * | 2001-01-18 | 2002-07-25 | Kabushiki Kaisha Watanabe Shoko | Carburateur, dispositifs de divers types utilisant ce carburateur et procede de vaporisation |
JP2003105545A (ja) * | 2001-09-27 | 2003-04-09 | Japan Pionics Co Ltd | 気化供給方法 |
Also Published As
Publication number | Publication date |
---|---|
US20060160360A1 (en) | 2006-07-20 |
JP2005012134A (ja) | 2005-01-13 |
KR20060023151A (ko) | 2006-03-13 |
TW200503060A (en) | 2005-01-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0453107B1 (en) | Chemical deposition methods using supercritical fluid solutions | |
US5835677A (en) | Liquid vaporizer system and method | |
US8859931B2 (en) | Plasma synthesis of nanopowders | |
EP0948664A1 (en) | Liquid vaporizer system and method | |
US8132793B2 (en) | Method and apparatus for liquid precursor atomization | |
KR100654400B1 (ko) | 용액 기화식 cvd 장치 | |
GB2345298A (en) | Liquid delivery system for chemical vapour deposition method | |
WO2003079422A1 (fr) | Vaporisateur, differents dispositifs dans lesquels il intervient, et procede de vaporisation | |
KR20040078643A (ko) | 증기를 증착실에 공급하는 방법 및 화학 증착 기화기 | |
KR20020009454A (ko) | 화학기상증착 동안 반도체 웨이퍼 상으로 다양한 전구체재료들을 증발시켜 흘려보내는 헤드 | |
JP4391413B2 (ja) | 気化器、分散器、成膜装置、及び、気化方法 | |
JP5029966B2 (ja) | 成膜装置 | |
WO2004114385A1 (ja) | 気化方法及び気化器 | |
TWI744313B (zh) | HfN膜的製造方法及HfN膜 | |
JP2005286054A (ja) | 液体材料供給装置、液体材料供給装置のための制御方法 | |
JPH0285370A (ja) | 酸化物薄膜の製造方法 | |
JP2006303534A (ja) | Cvd用気化器、溶液気化式cvd装置及びcvd用気化方法 | |
WO2007036997A1 (ja) | 液体材料供給装置、液体材料供給装置のための制御方法 | |
WO2016159355A1 (ja) | Mocvd装置による窒化膜を成膜する成膜方法及び成膜装置、並びにシャワーヘッド | |
JP3845950B2 (ja) | Mocvd装置 | |
JP2020191463A (ja) | HfN膜の製造方法およびHfN膜 | |
JP2019183284A (ja) | Mocvd装置による窒化膜を成膜する成膜方法及び成膜装置、並びにシャワーヘッド | |
WO2005067016A1 (ja) | Cvd用気化器、溶液気化式cvd装置及びcvd用気化方法 | |
JP2004225123A (ja) | 基材表面に酸化物膜を形成する方法及び該方法に使用する装置 | |
JPH11128719A (ja) | 溶液気化装置及び成膜装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 1020057024039 Country of ref document: KR |
|
ENP | Entry into the national phase |
Ref document number: 2006160360 Country of ref document: US Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 10561512 Country of ref document: US |
|
WWP | Wipo information: published in national office |
Ref document number: 1020057024039 Country of ref document: KR |
|
122 | Ep: pct application non-entry in european phase | ||
WWP | Wipo information: published in national office |
Ref document number: 10561512 Country of ref document: US |