WO2003081361A1 - Regulateur de debit massique - Google Patents
Regulateur de debit massique Download PDFInfo
- Publication number
- WO2003081361A1 WO2003081361A1 PCT/JP2003/003387 JP0303387W WO03081361A1 WO 2003081361 A1 WO2003081361 A1 WO 2003081361A1 JP 0303387 W JP0303387 W JP 0303387W WO 03081361 A1 WO03081361 A1 WO 03081361A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- pressure
- flow
- control valve
- sensor
- controller
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
- G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
- G05D7/0629—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means
- G05D7/0635—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means
- G05D7/0641—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means using a plurality of throttling means
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
- G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
- G05D7/0629—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means
- G05D7/0635—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means
- G05D7/0641—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means using a plurality of throttling means
- G05D7/0647—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means using a plurality of throttling means the plurality of throttling means being arranged in series
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/7722—Line condition change responsive valves
- Y10T137/7758—Pilot or servo controlled
- Y10T137/7761—Electrically actuated valve
Definitions
- the present invention relates to a mass flow controller. More specifically, it relates to a mass flow controller that is not affected by pressure. Background art
- FIG. 4 is a diagram showing an example of a semiconductor manufacturing line 10 using a conventional mask controller.
- Each of the gas supply lines 13 a to 13 d is a mechanical pressure regulator 16 a to 16 d and a gauge 17 a to 7 d downstream of the pressure regulator 16 a to 6 d. And a mashuf controller 18a to l8d. Also, 19 a to 19 d are filters. Gas supply lines 13 a, 13 c is provided to a respective chamber 1 1, 12 a gas, the gas supply line 13 b, 1 3 d is to supplied to the chamber 1 1, 12 a gas G 2 respectively. That, and supplies a plurality of gases, the G 2 to a plurality of lines 13a ⁇ l 3 d o
- the pressure of G 2 is, although its at exit side is reduced to usually about 98 kP a, for example, the pressure by the pressure regulator 1 6 to l 6 d
- the mass flow controller 18a Prevents damage of ⁇ 18 d.
- the manager of the semiconductor manufacturing line controls the mass flow controller 18 a to l 8 d so that a predetermined flow rate of gas G !, G 2 flows through channels 11 and 1.2, and the gauge 17 a to l 7 gas supplied to the mass flow controller 18 a ⁇ 18 d by adjusting the check while the pressure regulator 1 6 to l 6 d a d d, appropriately adjusting the pressure of G 2.
- the flow rate in the mass flow controllers 18a to l8d will increase as the flow rate changes significantly. In some cases, the pressure on the inlet side and the outlet side of the control device fluctuated, and stable flow control force could not be achieved.
- the mechanical pressure regulators 16a to 16d can adjust the pressure properly when the flow rate is stable to some extent, but may not be able to cope with a sudden change in the flow rate.
- the pressure change at the inlet side caused by the steep control of the flow rate by the mass flow controllers 18a to 18d In some cases, the movement may hinder the stable flow control by the mass flow controllers 18a to 18d.
- a sudden change in the gas flow rate supplied by the gas supply line 13a may affect the pressure on the upstream side of the pressure regulator 16a, and another gas branched and connected to the pressure regulator 16a. It is also conceivable that the flow rate of the gas supplied by the supply line 13c may be disturbed.
- pipes are branched and connected from one pressure regulator 16a, 16b for the purpose of cost reduction, and multiple mass flow controllers 18a to 18d are connected.
- pressure regulator 16a, 16b for the purpose of cost reduction
- mass flow controllers 18a to 18d are connected.
- the influence of the pressure fluctuation becomes large.
- the present invention has been made in consideration of the above-described circumstances, and its purpose is to stably maintain a target flow rate regardless of pressure fluctuations on either the upstream side or the downstream side of the mass flow controller.
- An object of the present invention is to provide a mass flow controller capable of flowing. Disclosure of the invention
- a mass flow controller is a mass flow controller having a flow control valve and a flow sensor, and a pressure control valve disposed upstream of the flow control valve. It is characterized by having a pressure sensor disposed between the flow control valves, and a control unit that controls the pressure control valve by feeding back the output of the pressure sensor. Therefore, by using this mass flow controller, even if a pressure fluctuation occurs on the upstream side, the influence can be reliably removed by the pressure control valve feedback-controlled by the output of the pressure sensor, and the downstream side of the mass flow controller can be removed. Pressure fluctuations on the pressure side are reliably removed by the flow control valve, which is feedback controlled by the output of the flow sensor. You can leave.
- a stable flow rate control can be performed at all times regardless of the pressure fluctuation on either the upstream side or the downstream side of the mass mouth controller.
- the mass flow controller since the mass flow controller has a pressure adjustment function, the pressure on the inlet side of the flow control valve can always be kept constant, and its performance can be maximized. Therefore, flow accuracy and stability are also improved.
- the pressure sensor faces the flow path immediately before the flow rate sensor
- the pressure sensor faces the flow path required in the masochist controller. Since the pressure sensor is provided in the flow path immediately before the flow sensor, more stable flow control can be achieved by feed knock control using the flow sensor.
- FIG. 1 is a block diagram showing an example of the mass flow controller of the present invention.
- FIG. 2 is a view showing an actual measurement example of flow rate control using the above-mentioned mass storage controller.
- FIG. 3 shows an example of a semiconductor manufacturing line using the above-mentioned controller.
- FIG. 4 is a diagram showing an example of a semiconductor manufacturing line using a conventional mass flow controller.
- FIG. 5 is a diagram showing another example of a semiconductor manufacturing line using the conventional mass flow controller. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 is a block diagram showing an example of the mass flow controller 1 of the present invention.
- the mass flow controller 1 of the present embodiment includes a flow path block 3 forming a flow path 2 for flowing a fluid (a gas is used as a fluid in the following example, but the fluid is not limited to a gas).
- a pressure control valve 4 connected to the flow path block 3, a flow sensor 5, a flow control valve 6, two pressure sensors 7, a control unit 8 for controlling each part 4 to 6, a filter 9, Have 0
- the flow path 2 is formed, for example, so as to hollow out the flow path block 3, and includes first to third flow paths 2a to 2c. At the upstream end of the first flow path 2a and at the downstream end of the third flow path 2c, pipe mounting portions 3a and 3b are provided, respectively.
- the flow path 2 may be formed by excavation, a method using a ⁇ shape, or another method. When the second flow path 2b is formed by excavation or the like, the flow path 2 is formed by excavation.
- the road block 3 must be formed in at least one place so as to be separable, but in any case, gas leakage can be prevented by integrally forming the flow path blocks 3, 3a, and 3b as a whole. .
- the pressure control valve 4 comprises, for example, a diaphragm 4a abutting on a valve seat 3c formed on one side of the flow path block 3 and its actuator 4b, and a force.
- the opening for communicating and connecting a and 2b is configured to be controllable.
- the flow sensor 5 includes, for example, a rectifier 5a inserted into the second flow path 2b, a branch flow path 5b that branches from the second flow path 2b by a flow rate of a predetermined ratio 1 ZA, And a sensor body 5c provided in the path 5b, and outputs a flow path signal Sf indicating the total flow rate F.
- the flow control valve 6 is composed of a diaphragm 6a abutting on a valve seat 3d formed on one side of the flow path block 3 and its actuator 6b, for example.
- the opening that connects and connects 2b and 2c can be controlled.
- the pressure control valve 4, the flow sensor 5, and the flow control valve 6 are arranged side by side on one side surface (upper surface) of the flow path block 3. Can be kept small.
- the pressure sensor 7 has a first sensor 7a disposed on a side surface facing the first flow path 2a, and a second sensor 7b disposed on a side surface facing the second flow path 2b.
- the two pressure sensors 7a and 7b are provided on a surface different from the side surface on which the respective parts 4 to 5 are mounted (in this example, before the first flow path 2a in FIG. 1 and the flow rate).
- the sensor 5 is embedded in the second flow path located immediately before the rectifier 5a constituting the sensor 5). This allows the pressure sensor 7 to be installed without changing the overall size of the mass flow controller 1.
- the sensors 7a and 7b output pressure signals Sp and Spb indicating the pressures P 1 and Pc in the first flow path 2a and the second flow path 2b, respectively.
- an example in which the pressure sensors 7 are provided on the side surfaces of the sensors 7 a and 7 b is not limited as long as the pressure sensor 7 can be mounted so as to face the flow path 2. . That is, it goes without saying that it may be embedded in the lower surface of the flow path block 3 or may be embedded in the upper surface at a position where it does not interfere with the control valve 4, the flow sensor 5, and the flow control valve 6.
- the control unit 8 is provided with, for example, pressure signals S pa and S pb from the pressure sensor 7. (Output) is fed back to output the pressure control signal C p, and the control unit 8 a that performs feedback control of the pressure control valve 4, and the flow rate signal S f from the flow rate sensor 5 is fed back to control the flow rate control signal C f
- the control unit 8b performs feedback control of the flow control valve 6 by outputting the signal, and the interface 8c with the outside and the force.
- the control unit 8a performs feedback control of the flow control valve 6 according to an external signal, and outputs a control signal to the control unit 8a so that the pressure Pc immediately before the rectifier 5a becomes a predetermined pressure. Control.
- control unit 8 includes a display unit that displays the set values of the flow rate F and the temporary pressure Pc, and the values P,, Pc, and F measured by the sensors 5, 7a, and 7b. Have. Further, all of the values P 1, P c, and F measured by the sensors 5, 7a, 7b can be output to the outside via the interface 8c. It should be noted that the interface 8c may communicate digitally or may be an analog input / output unit.
- control units 8a and 8b are separately displayed in order to clearly show the control relationship, but the present invention is not limited to this point, and all are controlled by one control unit 8. Needless to say, the manufacturing cost may be reduced by controlling them collectively.
- control of the pressure control valve 4 by the controller 8b is not limited to the feedback control using only the output signal Spb of the pressure sensor 7b, but also the output signal Spa of the pressure sensor 7a. May be controlled.
- the pressure sensor 7a as shown in this example, it is possible to monitor the pressure of the gas input to the mass flow controller 1, but the pressure sensor 7a may be omitted. Needless to say.
- the control unit 8b controls the pressure control valve 4 by using the pressure signal Spb from the pressure sensor 7b to perform the feedback control so that the pressure becomes the specified pressure Pc. Enter controller 1 Even if the pressure P i on the mouth side fluctuates due to some influence, the mass flow controller 1 can perform stable control. Also, since the control unit 8a performs feedback control of the flow control valve 6 so that the flow rate F measured using the flow rate signal Sf from the flow rate sensor 5 becomes the set flow rate Fs, the outlet of the mass flow controller 1 is controlled. Even if the side pressure P 2 fluctuates, it is not affected.
- the mass flow controller 1 of the present invention does not need to provide the pressure regulators 16a to 16d in the previous stage at all.
- the masculine controller 1 of this example also has a filter 9 built-in, it is not necessary to connect and connect separate filters 19a to l9d as in the related art. That is, the gas supply line can be simplified accordingly, and the installation area can be reduced.
- the filter 9 is provided at the upstream end of the flow path 2 is shown, but the present invention does not limit the position of the filter 9. In some cases, the filter 9 can be omitted.
- the pressure sensor 7b faces the flow path 2b immediately before the flow rate sensor 5, and the pressure signal S pb of the pressure sensor 7b is transmitted. Since the pressure Pc is used to maintain the predetermined pressure Pc, the flow rate sensor 5 can more accurately measure the flow rate F while keeping the pressure Pc constant.
- the pressure control valve 4 and the flow rate sensor 5 are arranged side by side, and the second flow path 2b located therebetween is as short as possible, so that the opening control signal of the pressure control valve 4 is controlled.
- the time delay of the pressure Pc with respect to the output of Cp is made as small as possible, and the fluctuation of the pressure Pc in the flow sensor 5 can be made as small as possible.
- the pressure Pc which is less affected by turbulence and the like, can be measured. That is, the control accuracy and stability of the flow rate by the mass flow controller 1 can be improved accordingly.
- FIG. 2 is obtained from the set value F of the flow rate and the output signal S ⁇ ⁇ ⁇ ⁇ of the flow rate sensor 5 when the pressure P 2 on the upstream side of the mass flow controller 1 of the present invention and the pressure P 2 on the downstream side are varied.
- An example is shown in which the flow rate F and the control signals C ⁇ and C ⁇ are actually measured.
- the horizontal axis represents time (seconds), and the pressures ⁇ ,, ⁇ 2 are randomly varied approximately every 5 seconds.
- the upstream pressure ⁇ is 200 and rapidly varied in a range of ⁇ 5 0 k P a, and rapidly varying the pressure P 2 on the downstream side in the range of 0 ⁇ 3. 8 k P a.
- control signal Cp changes following the fluctuation of the pressure P, on the upstream side of the mouthpiece controller 1, whereby the control signal Cp is provided with the pressure sensor 7b. It can be seen that the pressure Fc in the two flow paths 2b is kept constant. Further, the control signal C f changes following the fluctuation of the pressure P 2 on the downstream side of the mass flow controller 1, thereby keeping the flow F flowing to the flow sensor 5 constant.
- a comparison between the flow rate F that actually flowed and the set value Fs of the flow rate shows that the flow rate F that actually flowed at the point in time when the pressures P i and P 2 suddenly changed. Although it fluctuates slightly in each case, it can be seen that the fluctuation width is very small, and the set value Fs is immediately obtained in a very short time. That is, by using the mass flow controller 1 of the present invention, any of the upstream pressure P i and the downstream pressure P 2 causes a rapid pressure fluctuation. It can be seen that even if this occurs, the specified flow rate can be kept flowing with extremely stable control.
- FIG. 3 shows an example in which the mass flow controller 1 is used to form a semiconductor manufacturing line having the same configuration as the conventional one shown in FIG.
- the portions denoted by the same reference numerals as those in FIG. 4 are the same portions, and thus detailed description thereof will be omitted.
- reference numerals 1a to 1d denote mass flow controllers 1 of the present invention, respectively.
- each of the gas supply lines 13a to 13d can be configured extremely simply, and the construction of the gas supply lines 13a to 13d is correspondingly simplified. It can be seen that such labor can be reduced. Further, the installation area of the gas supply lines 13a to 13d is reduced. Industrial applicability
- high-precision flow control can be performed with a reliable operation without being affected by pressure fluctuations on the upstream side and the downstream side. Also, since there is no need to provide a separate pressure regulator in front of the mass flow controller, cost performance can be improved accordingly.
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Flow Control (AREA)
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP20030712782 EP1489477B1 (en) | 2002-03-25 | 2003-03-20 | Mass flow controller |
KR10-2004-7014411A KR20040102040A (ko) | 2002-03-25 | 2003-03-20 | 매스 플로우 콘트롤러 |
DE60326033T DE60326033D1 (de) | 2002-03-25 | 2003-03-20 | Massenflusssteuerung |
US10/507,975 US20060037644A1 (en) | 2002-03-25 | 2003-03-20 | Mass flow controller |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002-82297 | 2002-03-25 | ||
JP2002082297A JP2003280745A (ja) | 2002-03-25 | 2002-03-25 | マスフローコントローラ |
Publications (1)
Publication Number | Publication Date |
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WO2003081361A1 true WO2003081361A1 (fr) | 2003-10-02 |
Family
ID=28449140
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/003387 WO2003081361A1 (fr) | 2002-03-25 | 2003-03-20 | Regulateur de debit massique |
Country Status (7)
Country | Link |
---|---|
US (1) | US20060037644A1 (ja) |
EP (1) | EP1489477B1 (ja) |
JP (1) | JP2003280745A (ja) |
KR (2) | KR20040102040A (ja) |
CN (1) | CN100422896C (ja) |
DE (1) | DE60326033D1 (ja) |
WO (1) | WO2003081361A1 (ja) |
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- 2003-03-20 US US10/507,975 patent/US20060037644A1/en not_active Abandoned
- 2003-03-20 KR KR10-2004-7014411A patent/KR20040102040A/ko active Search and Examination
- 2003-03-20 KR KR1020077013326A patent/KR20070070259A/ko not_active Application Discontinuation
- 2003-03-20 EP EP20030712782 patent/EP1489477B1/en not_active Expired - Fee Related
- 2003-03-20 CN CNB03806930XA patent/CN100422896C/zh not_active Expired - Fee Related
- 2003-03-20 WO PCT/JP2003/003387 patent/WO2003081361A1/ja active Application Filing
- 2003-03-20 DE DE60326033T patent/DE60326033D1/de not_active Expired - Fee Related
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1624355A2 (en) | 2004-07-01 | 2006-02-08 | The Boc Group, Inc. | Fluid flow control device |
EP1624355A3 (en) * | 2004-07-01 | 2006-02-22 | The Boc Group, Inc. | Fluid flow control device |
US11003198B2 (en) | 2011-08-20 | 2021-05-11 | Ichor Systems, Inc. | Controlled delivery of process gas using a remote pressure measurement device |
US10782165B2 (en) | 2011-08-20 | 2020-09-22 | Ichor Systems, Inc. | Flow control system, method, and apparatus |
US9958302B2 (en) | 2011-08-20 | 2018-05-01 | Reno Technologies, Inc. | Flow control system, method, and apparatus |
US10303189B2 (en) | 2016-06-30 | 2019-05-28 | Reno Technologies, Inc. | Flow control system, method, and apparatus |
US10782710B2 (en) | 2016-06-30 | 2020-09-22 | Ichor Systems, Inc. | Flow control system, method, and apparatus |
US11144075B2 (en) | 2016-06-30 | 2021-10-12 | Ichor Systems, Inc. | Flow control system, method, and apparatus |
US11815920B2 (en) | 2016-06-30 | 2023-11-14 | Ichor Systems, Inc. | Flow control system, method, and apparatus |
US10679880B2 (en) | 2016-09-27 | 2020-06-09 | Ichor Systems, Inc. | Method of achieving improved transient response in apparatus for controlling flow and system for accomplishing same |
US11424148B2 (en) | 2016-09-27 | 2022-08-23 | Ichor Systems, Inc. | Method of achieving improved transient response in apparatus for controlling flow and system for accomplishing same |
US10663337B2 (en) | 2016-12-30 | 2020-05-26 | Ichor Systems, Inc. | Apparatus for controlling flow and method of calibrating same |
US10838437B2 (en) | 2018-02-22 | 2020-11-17 | Ichor Systems, Inc. | Apparatus for splitting flow of process gas and method of operating same |
US11899477B2 (en) | 2021-03-03 | 2024-02-13 | Ichor Systems, Inc. | Fluid flow control system comprising a manifold assembly |
Also Published As
Publication number | Publication date |
---|---|
EP1489477A4 (en) | 2005-11-09 |
EP1489477B1 (en) | 2009-01-28 |
KR20070070259A (ko) | 2007-07-03 |
KR20040102040A (ko) | 2004-12-03 |
CN1643466A (zh) | 2005-07-20 |
JP2003280745A (ja) | 2003-10-02 |
CN100422896C (zh) | 2008-10-01 |
US20060037644A1 (en) | 2006-02-23 |
DE60326033D1 (de) | 2009-03-19 |
EP1489477A1 (en) | 2004-12-22 |
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