WO2002044241A1 - Composition liquide a base de resine epoxy pour materiau d'encapsulation - Google Patents

Composition liquide a base de resine epoxy pour materiau d'encapsulation Download PDF

Info

Publication number
WO2002044241A1
WO2002044241A1 PCT/JP2001/007950 JP0107950W WO0244241A1 WO 2002044241 A1 WO2002044241 A1 WO 2002044241A1 JP 0107950 W JP0107950 W JP 0107950W WO 0244241 A1 WO0244241 A1 WO 0244241A1
Authority
WO
WIPO (PCT)
Prior art keywords
epoxy resin
resin composition
encapsulating material
liquid epoxy
fluxing
Prior art date
Application number
PCT/JP2001/007950
Other languages
English (en)
French (fr)
Inventor
Nobuto Terada
Daisuke Itoh
Hideyuki Goto
Original Assignee
Harima Chemicals, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001072262A external-priority patent/JP2001329048A/ja
Application filed by Harima Chemicals, Inc. filed Critical Harima Chemicals, Inc.
Priority to AU2001286225A priority Critical patent/AU2001286225A1/en
Priority to JP2002546603A priority patent/JPWO2002044241A1/ja
Publication of WO2002044241A1 publication Critical patent/WO2002044241A1/ja

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/42Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Organic Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Medicinal Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Epoxy Resins (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
PCT/JP2001/007950 2000-11-28 2001-09-13 Composition liquide a base de resine epoxy pour materiau d'encapsulation WO2002044241A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU2001286225A AU2001286225A1 (en) 2000-11-28 2001-09-13 Liquid epoxy resin composition for encapsulating material
JP2002546603A JPWO2002044241A1 (ja) 2000-11-28 2001-09-13 封止充填剤用液状エポキシ樹脂組成物

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP2000-361145 2000-11-28
JP2000361145 2000-11-28
JP2001064984 2001-03-08
JP2001-64984 2001-03-08
JP2001-72262 2001-03-14
JP2001072262A JP2001329048A (ja) 2000-03-15 2001-03-14 封止充填剤用液状エポキシ樹脂組成物
JP2001-162805 2001-05-30
JP2001162805 2001-05-30

Publications (1)

Publication Number Publication Date
WO2002044241A1 true WO2002044241A1 (fr) 2002-06-06

Family

ID=27481822

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/007950 WO2002044241A1 (fr) 2000-11-28 2001-09-13 Composition liquide a base de resine epoxy pour materiau d'encapsulation

Country Status (3)

Country Link
JP (1) JPWO2002044241A1 (ja)
AU (1) AU2001286225A1 (ja)
WO (1) WO2002044241A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006505674A (ja) * 2002-11-05 2006-02-16 ヘンケル コーポレイション 有機酸含有組成物およびその使用方法
US7214561B2 (en) 2003-06-16 2007-05-08 Kabushiki Kaisha Toshiba Packaging assembly and method of assembling the same
JP2007180361A (ja) * 2005-12-28 2007-07-12 Toyota Motor Corp 半導体装置の検査方法および半導体装置
JP2010144150A (ja) * 2008-12-22 2010-07-01 Panasonic Electric Works Co Ltd 熱硬化性樹脂組成物
WO2011090038A1 (ja) * 2010-01-21 2011-07-28 積水化学工業株式会社 熱硬化性樹脂組成物、フリップチップ実装用接着剤、半導体装置の製造方法、及び、半導体装置
JP2013253135A (ja) * 2012-06-05 2013-12-19 Sumitomo Bakelite Co Ltd 樹脂組成物、半導体装置、多層回路基板および電子部品

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03115320A (ja) * 1989-09-29 1991-05-16 Shin Etsu Chem Co Ltd 液状エポキシ樹脂組成物
JPH11354555A (ja) * 1998-06-11 1999-12-24 Fujikura Ltd アンダーフィルの充填方法
WO2000049087A1 (en) * 1999-02-18 2000-08-24 Three Bond Co., Ltd. Epoxy resin composition
JP2000297202A (ja) * 1999-02-12 2000-10-24 Shin Etsu Chem Co Ltd フリップチップ型半導体装置用封止材

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03115320A (ja) * 1989-09-29 1991-05-16 Shin Etsu Chem Co Ltd 液状エポキシ樹脂組成物
JPH11354555A (ja) * 1998-06-11 1999-12-24 Fujikura Ltd アンダーフィルの充填方法
JP2000297202A (ja) * 1999-02-12 2000-10-24 Shin Etsu Chem Co Ltd フリップチップ型半導体装置用封止材
WO2000049087A1 (en) * 1999-02-18 2000-08-24 Three Bond Co., Ltd. Epoxy resin composition

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006505674A (ja) * 2002-11-05 2006-02-16 ヘンケル コーポレイション 有機酸含有組成物およびその使用方法
US7214561B2 (en) 2003-06-16 2007-05-08 Kabushiki Kaisha Toshiba Packaging assembly and method of assembling the same
JP2007180361A (ja) * 2005-12-28 2007-07-12 Toyota Motor Corp 半導体装置の検査方法および半導体装置
JP2010144150A (ja) * 2008-12-22 2010-07-01 Panasonic Electric Works Co Ltd 熱硬化性樹脂組成物
WO2011090038A1 (ja) * 2010-01-21 2011-07-28 積水化学工業株式会社 熱硬化性樹脂組成物、フリップチップ実装用接着剤、半導体装置の製造方法、及び、半導体装置
JP2013253135A (ja) * 2012-06-05 2013-12-19 Sumitomo Bakelite Co Ltd 樹脂組成物、半導体装置、多層回路基板および電子部品

Also Published As

Publication number Publication date
AU2001286225A1 (en) 2002-06-11
JPWO2002044241A1 (ja) 2004-04-02

Similar Documents

Publication Publication Date Title
US7966721B2 (en) Electronic component mounting method and electronic component mounting device
US7408264B2 (en) SMT passive device noflow underfill methodology and structure
US20020089025A1 (en) Package structure for image IC
WO2000054322A8 (en) Flip chip with integrated flux and underfill
WO2007054198A3 (de) Lotpasten mit harzfreien flussmitteln
WO2004112095A3 (en) Thermoplastic fluxing underfill composition and method
CN104022092A (zh) 半导体器件的制造方法
JPH1154556A (ja) 半導体装置とその製造方法
WO2001024968A1 (fr) Flux de soudure, pate de soudure et procede de soudage
JP2006114542A (ja) 電子部品実装方法
WO2002044241A1 (fr) Composition liquide a base de resine epoxy pour materiau d'encapsulation
EP1384738A4 (en) ONE-PARTICULAR HOT-HARDENING EPOXY RESIN COMPOSITION AND SEMICONDUCTOR ASSEMBLY FILLING MATERIAL
JP4134976B2 (ja) 半田接合方法
JP2001170798A (ja) はんだ付け用フラックス、はんだぺ一スト、電子部品装置、電子回路モジュール、電子回路装置、及び、はんだ付け方法
JP4055158B2 (ja) リードフレーム及びリードフレームを備えた半導体装置
JP4259445B2 (ja) 半田ペーストおよび半田接合方法
JPH02217193A (ja) インジウム系粉末状ハンダ
JP4259431B2 (ja) 半田ペーストおよび半田接合方法
JPH0280193A (ja) ソルダペースト
JP2003224163A (ja) フリップチップの実装構造
TWI714621B (zh) 助熔底部填充劑組合物
JP4010911B2 (ja) パワー半導体装置の製造方法
JP2823596B2 (ja) 半導体装置の製造方法
JP2007281276A (ja) 半導体装置
JP2012061508A (ja) 接合材料

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PH PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2002546603

Country of ref document: JP

REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

122 Ep: pct application non-entry in european phase
DPE2 Request for preliminary examination filed before expiration of 19th month from priority date (pct application filed from 20040101)