WO2002029359A1 - Appareil d'inspection de l'épaisseur de plaques - Google Patents

Appareil d'inspection de l'épaisseur de plaques Download PDF

Info

Publication number
WO2002029359A1
WO2002029359A1 PCT/JP2001/003666 JP0103666W WO0229359A1 WO 2002029359 A1 WO2002029359 A1 WO 2002029359A1 JP 0103666 W JP0103666 W JP 0103666W WO 0229359 A1 WO0229359 A1 WO 0229359A1
Authority
WO
WIPO (PCT)
Prior art keywords
plate thickness
inspecting apparatus
thickness inspecting
thickness
wood plate
Prior art date
Application number
PCT/JP2001/003666
Other languages
English (en)
French (fr)
Inventor
Jiro Yamamoto
Original Assignee
Meiken Lamwood Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US10/181,809 priority Critical patent/US6619137B2/en
Application filed by Meiken Lamwood Corporation filed Critical Meiken Lamwood Corporation
Priority to DE60121957T priority patent/DE60121957T2/de
Priority to EP01925994A priority patent/EP1298412B1/en
Priority to CA002390593A priority patent/CA2390593C/en
Publication of WO2002029359A1 publication Critical patent/WO2002029359A1/ja
Priority to NO20022549A priority patent/NO20022549L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/06—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/10—Sorting according to size measured by light-responsive means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Veneer Processing And Manufacture Of Plywood (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
PCT/JP2001/003666 2000-10-02 2001-04-26 Appareil d'inspection de l'épaisseur de plaques WO2002029359A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US10/181,809 US6619137B2 (en) 2000-10-02 2001-04-16 Plate thickness inspecting apparatus
DE60121957T DE60121957T2 (de) 2000-10-02 2001-04-26 Plattendicke-inspektionsapparat
EP01925994A EP1298412B1 (en) 2000-10-02 2001-04-26 Plate thickness inspecting apparatus
CA002390593A CA2390593C (en) 2000-10-02 2001-04-26 Apparatus for inspection of board thickness
NO20022549A NO20022549L (no) 2000-10-02 2002-05-29 Anordning for inspeksjon av bordtykkelse

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000-302320 2000-10-02
JP2000302320A JP3469544B2 (ja) 2000-10-02 2000-10-02 板厚検査装置

Publications (1)

Publication Number Publication Date
WO2002029359A1 true WO2002029359A1 (fr) 2002-04-11

Family

ID=18783692

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/003666 WO2002029359A1 (fr) 2000-10-02 2001-04-26 Appareil d'inspection de l'épaisseur de plaques

Country Status (10)

Country Link
US (1) US6619137B2 (ja)
EP (1) EP1298412B1 (ja)
JP (1) JP3469544B2 (ja)
AT (1) ATE335187T1 (ja)
CA (1) CA2390593C (ja)
DE (1) DE60121957T2 (ja)
DK (1) DK1298412T3 (ja)
NO (1) NO20022549L (ja)
RU (1) RU2256150C2 (ja)
WO (1) WO2002029359A1 (ja)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2207204C1 (ru) 2002-06-06 2003-06-27 ООО "Сорби стил" Способ оптимизации технологии производства проката
CN101790610A (zh) 2007-05-04 2010-07-28 魁北克工业研究中心 用于优化木质纤维素颗粒物质磨浆的系统和方法
JP4932003B2 (ja) * 2007-09-26 2012-05-16 三菱電機株式会社 長尺物の送り量計測装置
JP5149058B2 (ja) * 2008-04-09 2013-02-20 株式会社近畿エンジニアリング 木材の寸法検査装置
US8502180B2 (en) 2009-01-26 2013-08-06 Centre De Recherche Industrielle Du Quebec Apparatus and method having dual sensor unit with first and second sensing fields crossed one another for scanning the surface of a moving article
CN101566453B (zh) * 2009-05-31 2011-09-14 广州广电运通金融电子股份有限公司 厚度检测装置
JP5021014B2 (ja) * 2009-10-30 2012-09-05 日本碍子株式会社 積層体の形成方法
CA2714235C (en) 2010-04-27 2014-01-07 Centre De Recherche Industrielle Du Quebec Method and system for stabilizing dry-based density of wood chips to be fed to a chip refining process
US9151595B1 (en) * 2014-04-18 2015-10-06 Advanced Gauging Technologies, LLC Laser thickness gauge and method including passline angle correction
CN105479560A (zh) * 2015-12-24 2016-04-13 上海人造板机器厂有限公司 连续式预压机进口高度测量机构
BR112019024034A2 (pt) * 2017-05-17 2020-06-02 J's & J's Llc. Sistema de fixação de óculos a um usuário ou objeto
US10240911B2 (en) * 2017-06-12 2019-03-26 Advanced Gauging Technologies, LLC Laser gauge with full air gap measurement range
JP7044401B2 (ja) * 2020-05-02 2022-03-30 株式会社近畿エンジニアリング 木材加工装置、木材加工の良否判定方法、及び、木材加工の良否判定プログラム
CN114226273A (zh) * 2021-12-29 2022-03-25 信阳职业技术学院 一种建筑施工材料检测用厚度测量装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08334500A (ja) * 1995-06-09 1996-12-17 Yuasa Shoji Kk 板材検査装置
JPH0911203A (ja) * 1995-04-24 1997-01-14 Matsushita Electric Works Ltd 積層合板の欠陥検出方法及び装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3671726A (en) * 1969-05-23 1972-06-20 Morvue Inc Electro-optical apparatus for precise on-line measurement of the thickness of moving strip material
US3680215A (en) * 1970-10-30 1972-08-01 Black Clawson Co Continuous thickness measuring apparatus for veneer and other web material
JPS53144863A (en) 1977-05-25 1978-12-16 Ishikawajima Harima Heavy Ind Co Ltd Holder for rod-guide-trough in rod-material-extrusion-press
JPS5759107A (en) * 1980-09-26 1982-04-09 Hitachi Ltd Method and device for measuring plate thickness
US4720808A (en) * 1985-05-15 1988-01-19 Josef Repsch Method and apparatus for measuring sheet products
US4879752A (en) * 1987-11-18 1989-11-07 Macmillan Bloedel Limited Lumber optimizer
NO178909C (no) * 1993-04-19 1996-06-26 Toni Rydningen Måleanordning
NZ270892A (en) * 1994-08-24 1997-01-29 Us Natural Resources Detecting lumber defects utilizing optical pattern recognition algorithm
US5503024A (en) * 1994-12-22 1996-04-02 Metriguard Inc. Apparatus for testing lumber stiffness
US5581353A (en) * 1995-02-14 1996-12-03 Qualitek Ltd. Laser-based measurement apparatus and method for the on-line measurement of multiple corrugated board characteristics
JPH0933222A (ja) * 1995-07-18 1997-02-07 Dainippon Screen Mfg Co Ltd 膜厚測定装置
JPH1097662A (ja) 1996-09-24 1998-04-14 Nec Corp コイン計数機
JP4322380B2 (ja) * 1999-03-23 2009-08-26 株式会社山文電気 シート厚み又はうねり計測方法及び装置
US6396590B1 (en) * 1999-09-13 2002-05-28 The University Of Tennessee Research Corporation Process and system for determination of layer thickness swell of wood composites

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0911203A (ja) * 1995-04-24 1997-01-14 Matsushita Electric Works Ltd 積層合板の欠陥検出方法及び装置
JPH08334500A (ja) * 1995-06-09 1996-12-17 Yuasa Shoji Kk 板材検査装置

Also Published As

Publication number Publication date
DE60121957T2 (de) 2007-03-01
ATE335187T1 (de) 2006-08-15
EP1298412A4 (en) 2005-05-11
JP3469544B2 (ja) 2003-11-25
DK1298412T3 (da) 2006-12-04
US20030009894A1 (en) 2003-01-16
RU2256150C2 (ru) 2005-07-10
EP1298412A1 (en) 2003-04-02
NO20022549D0 (no) 2002-05-29
CA2390593C (en) 2005-12-06
EP1298412B1 (en) 2006-08-02
US6619137B2 (en) 2003-09-16
DE60121957D1 (de) 2006-09-14
CA2390593A1 (en) 2002-04-11
JP2002103306A (ja) 2002-04-09
NO20022549L (no) 2002-05-29

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