WO2002027776A1 - Procede et appareil de traitement de substrat - Google Patents

Procede et appareil de traitement de substrat Download PDF

Info

Publication number
WO2002027776A1
WO2002027776A1 PCT/JP2001/004962 JP0104962W WO0227776A1 WO 2002027776 A1 WO2002027776 A1 WO 2002027776A1 JP 0104962 W JP0104962 W JP 0104962W WO 0227776 A1 WO0227776 A1 WO 0227776A1
Authority
WO
WIPO (PCT)
Prior art keywords
gas
substrate
wet
feed
substrate processing
Prior art date
Application number
PCT/JP2001/004962
Other languages
English (en)
French (fr)
Inventor
Seiji Noda
Hideo Horibe
Makoto Miyamoto
Izumi Oya
Masaki Kuzumoto
Original Assignee
Mitsubishi Denki Kabushiki Kaisha
Spc Electronics Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Denki Kabushiki Kaisha, Spc Electronics Corporation filed Critical Mitsubishi Denki Kabushiki Kaisha
Priority to EP01936972A priority Critical patent/EP1255287A4/en
Priority to KR10-2002-7006775A priority patent/KR100458784B1/ko
Priority to US10/111,913 priority patent/US20030066549A1/en
Priority to JP2002531474A priority patent/JPWO2002027776A1/ja
Priority to TW090118120A priority patent/TW512456B/zh
Publication of WO2002027776A1 publication Critical patent/WO2002027776A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041—Cleaning
    • H01L21/02057—Cleaning during device manufacture
    • H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
    • H01L21/02071—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a delineation, e.g. RIE, of conductive layers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31127—Etching organic layers
    • H01L21/31133—Etching organic layers by chemical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
PCT/JP2001/004962 2000-09-28 2001-06-12 Procede et appareil de traitement de substrat WO2002027776A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP01936972A EP1255287A4 (en) 2000-09-28 2001-06-12 METHOD AND APPARATUS FOR TREATING SUBSTRATE
KR10-2002-7006775A KR100458784B1 (ko) 2000-09-28 2001-06-12 기판의 처리방법 및 처리 장치
US10/111,913 US20030066549A1 (en) 2000-09-28 2001-06-12 Substrate processing method, and apparatus therefor
JP2002531474A JPWO2002027776A1 (ja) 2000-09-28 2001-06-12 基板処理方法およびその装置
TW090118120A TW512456B (en) 2000-09-28 2001-07-25 Process and apparatus for treating substrate

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2000/006694 WO2002027775A1 (fr) 2000-09-28 2000-09-28 Procede et appareil de traitement de plaquettes
JPPCT/JP00/06694 2000-09-28

Publications (1)

Publication Number Publication Date
WO2002027776A1 true WO2002027776A1 (fr) 2002-04-04

Family

ID=11736531

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/JP2000/006694 WO2002027775A1 (fr) 2000-09-28 2000-09-28 Procede et appareil de traitement de plaquettes
PCT/JP2001/004962 WO2002027776A1 (fr) 2000-09-28 2001-06-12 Procede et appareil de traitement de substrat

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/JP2000/006694 WO2002027775A1 (fr) 2000-09-28 2000-09-28 Procede et appareil de traitement de plaquettes

Country Status (6)

Country Link
US (1) US20030066549A1 (ja)
EP (1) EP1255287A4 (ja)
JP (1) JPWO2002027776A1 (ja)
KR (1) KR100458784B1 (ja)
TW (2) TW501178B (ja)
WO (2) WO2002027775A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101272818B1 (ko) * 2008-09-15 2013-06-10 게부르. 쉬미트 게엠베하 기판 처리 방법, 기판 및 상기 방법을 수행하기 위한 처리 장치

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US20040159335A1 (en) * 2002-05-17 2004-08-19 P.C.T. Systems, Inc. Method and apparatus for removing organic layers
KR100487549B1 (ko) * 2002-09-26 2005-05-03 삼성전자주식회사 반도체 제조 설비를 위한 공기 공급 장치
DE10254990A1 (de) * 2002-11-26 2004-07-22 Technotrans Ag Verfahren zum Entfernen von organischen Rückständen von feinstrukturierten Oberflächen
KR100906634B1 (ko) * 2003-01-20 2009-07-10 삼성전자주식회사 패턴의 형성 방법 및 이를 적용한 액정 표시 장치의 박막트랜지스터 기판의 제조방법
US7235479B2 (en) * 2004-08-26 2007-06-26 Applied Materials, Inc. Organic solvents having ozone dissolved therein for semiconductor processing utilizing sacrificial materials
JP2008516419A (ja) * 2004-09-17 2008-05-15 エフエスアイ インターナショナル インコーポレイテッド ウェハー様物の加工のためのオゾンの使用
KR100666380B1 (ko) * 2005-05-30 2007-01-09 삼성전자주식회사 포토레지스트 제거방법 및 이를 이용한 반도체 소자의 제조방법.
SI1955335T1 (sl) * 2005-11-29 2011-09-30 Areva Np Gmbh Postopek za dekontaminacijo površine, ki ima oksidno plast, komponente ali sistema jedrske naprave
JP4786351B2 (ja) * 2006-01-20 2011-10-05 株式会社東芝 処理装置及び処理方法
US8603924B2 (en) * 2010-10-19 2013-12-10 Taiwan Semiconductor Manufacturing Company, Ltd. Methods of forming gate dielectric material
CN102610562A (zh) * 2012-03-23 2012-07-25 上海华力微电子有限公司 含碳薄膜中碳元素的去除方法以及SiOC控挡片的再生方法
JP6300139B2 (ja) * 2012-05-15 2018-03-28 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法および基板処理システム
EP3013434A1 (en) * 2013-06-28 2016-05-04 James D. Lee Methods and devices for protective filtration and delivery of respirable compounds
CN103646915A (zh) * 2013-11-28 2014-03-19 上海华力微电子有限公司 SiCN薄膜中C元素的去除方法及监控片再生工艺
JP6520490B2 (ja) * 2015-07-08 2019-05-29 信越化学工業株式会社 パターン形成方法
JP6779701B2 (ja) * 2016-08-05 2020-11-04 東京エレクトロン株式会社 基板処理装置、基板処理方法及び基板処理方法を実行させるプログラムが記録された記憶媒体
JP6811675B2 (ja) * 2017-04-28 2021-01-13 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法および基板処理装置
JP6995547B2 (ja) 2017-09-22 2022-01-14 株式会社Ｓｃｒｅｅｎホールディングス 薬液生成方法、薬液生成装置および基板処理装置
US20240050993A1 (en) * 2022-08-09 2024-02-15 Taiwan Semiconductor Manufacturing Company, Ltd. Onsite cleaning system and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05109686A (ja) * 1991-10-14 1993-04-30 Nippon Steel Corp シリコンウエーハの洗浄方法およびその装置
JPH0974080A (ja) * 1995-09-04 1997-03-18 Mitsubishi Gas Chem Co Inc 半導体基板のオゾン洗浄方法
JP2000150349A (ja) * 1998-11-13 2000-05-30 Mitsubishi Electric Corp フォトレジスト膜除去方法および装置

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JPH0724265B2 (ja) * 1988-04-13 1995-03-15 日本電気株式会社 半導体基板の洗浄装置
JPH05206021A (ja) * 1992-01-28 1993-08-13 Hitachi Ltd 半導体装置の製造方法およびその装置
JPH0741326B2 (ja) * 1992-04-10 1995-05-10 株式会社コスメック 金型の落下防止装置
JPH0684843A (ja) * 1992-09-02 1994-03-25 Matsushita Electric Ind Co Ltd 表面処理装置
KR940012061A (ko) * 1992-11-27 1994-06-22 가나이 쯔또무 유기물제거방법 및 그 방법을 이용하기 위한 유기물제거장치
US5589422A (en) * 1993-01-15 1996-12-31 Intel Corporation Controlled, gas phase process for removal of trace metal contamination and for removal of a semiconductor layer
US6701941B1 (en) * 1997-05-09 2004-03-09 Semitool, Inc. Method for treating the surface of a workpiece
US20020157686A1 (en) * 1997-05-09 2002-10-31 Semitool, Inc. Process and apparatus for treating a workpiece such as a semiconductor wafer
US6869487B1 (en) * 1997-05-09 2005-03-22 Semitool, Inc. Process and apparatus for treating a workpiece such as a semiconductor wafer
JP2003533865A (ja) * 1998-07-29 2003-11-11 シーエフエムテイ・インコーポレーテツド 電子構成要素の製造でオゾン含有プロセス流体を用いて電子構成要素を湿式処理する方法
JP3680577B2 (ja) * 1998-09-17 2005-08-10 セイコーエプソン株式会社 レジスト除去洗浄方法及び装置
JP3671389B2 (ja) * 1999-12-03 2005-07-13 三菱電機株式会社 基板処理方法および装置
KR20030019323A (ko) * 2000-03-13 2003-03-06 맷슨 테크날러지 아이피 전자부품을 처리하기 위한 공정 및 장치

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05109686A (ja) * 1991-10-14 1993-04-30 Nippon Steel Corp シリコンウエーハの洗浄方法およびその装置
JPH0974080A (ja) * 1995-09-04 1997-03-18 Mitsubishi Gas Chem Co Inc 半導体基板のオゾン洗浄方法
JP2000150349A (ja) * 1998-11-13 2000-05-30 Mitsubishi Electric Corp フォトレジスト膜除去方法および装置

Non-Patent Citations (1)

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Title
See also references of EP1255287A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101272818B1 (ko) * 2008-09-15 2013-06-10 게부르. 쉬미트 게엠베하 기판 처리 방법, 기판 및 상기 방법을 수행하기 위한 처리 장치

Also Published As

Publication number Publication date
JPWO2002027776A1 (ja) 2004-02-05
EP1255287A1 (en) 2002-11-06
TW501178B (en) 2002-09-01
EP1255287A4 (en) 2008-07-09
TW512456B (en) 2002-12-01
KR20020081213A (ko) 2002-10-26
US20030066549A1 (en) 2003-04-10
WO2002027775A1 (fr) 2002-04-04
KR100458784B1 (ko) 2004-12-03

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