WO2001066460A1 - Nanotweezers and nanomanipulator - Google Patents
Nanotweezers and nanomanipulator Download PDFInfo
- Publication number
- WO2001066460A1 WO2001066460A1 PCT/JP2001/001803 JP0101803W WO0166460A1 WO 2001066460 A1 WO2001066460 A1 WO 2001066460A1 JP 0101803 W JP0101803 W JP 0101803W WO 0166460 A1 WO0166460 A1 WO 0166460A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- nanotubes
- nanotube
- protruding
- voltage
- tip
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J7/00—Micromanipulators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B9/00—Hand-held gripping tools other than those covered by group B25B7/00
- B25B9/02—Hand-held gripping tools other than those covered by group B25B7/00 without sliding or pivotal connections, e.g. tweezers, onepiece tongs
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C99/00—Subject matter not provided for in other groups of this subclass
- B81C99/0005—Apparatus specially adapted for the manufacture or treatment of microstructural devices or systems, or methods for manufacturing the same
- B81C99/002—Apparatus for assembling MEMS, e.g. micromanipulators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/16—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces applied through gearing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/03—Microengines and actuators
- B81B2201/032—Bimorph and unimorph actuators, e.g. piezo and thermo
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/12—STM or AFM microtips
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0118—Cantilevers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/724—Devices having flexible or movable element
- Y10S977/732—Nanocantilever
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
- Y10S977/742—Carbon nanotubes, CNTs
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/778—Nanostructure within specified host or matrix material, e.g. nanocomposite films
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/778—Nanostructure within specified host or matrix material, e.g. nanocomposite films
- Y10S977/78—Possessing fully enclosed nanosized voids or physical holes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/832—Nanostructure having specified property, e.g. lattice-constant, thermal expansion coefficient
- Y10S977/837—Piezoelectric property of nanomaterial
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/842—Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/858—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including positioning/mounting nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/863—Atomic force probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/875—Scanning probe structure with tip detail
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/875—Scanning probe structure with tip detail
- Y10S977/876—Nanotube tip
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/89—Deposition of materials, e.g. coating, cvd, or ald
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/901—Manufacture, treatment, or detection of nanostructure having step or means utilizing electromagnetic property, e.g. optical, x-ray, electron beamm
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/962—Specified use of nanostructure for carrying or transporting
Definitions
- the present invention relates to nanotweezers capable of grasping and releasing nano-sized materials (hereinafter, referred to as nano materials), and a nanomanipulator capable of assembling nano-sized components, nano-molecular depice, etc. by moving and stacking nano materials. Connect to equipment.
- FIG. 1 18 is a manufacturing process diagram of the nanotweezers.
- FIG. 16 is a side view of the front end of the glass tube 80 that has been tapered.
- the diameter of the front end is about 100 mm, and the rear end diameter (not shown) is 1 mm.
- Figure 7 shows the completed nanotweezers.
- Two gold electrodes 84a and 84b are formed on the peripheral surface of the glass tube 80 via an insulating portion 82.
- the carbon nanotubes 86a and S6b are fixed to the gold electrode film in a projecting manner, respectively, to complete the nanotweezers 88.
- Figure 18 is a schematic diagram of applying voltage to nanotweezers.
- Lead wires 92 a and 92 b are led out from the contacts 90 a and 90 b to the gold electrode films 84 a and 8, and are connected to both ends of the DC power supply 94.
- the voltage of the DC power supply 94 is applied, the carbon nanotubes 86 a are charged to the negative electrode, and the carbon nanotubes 86 b are charged to the negative electrode.
- the positive and negative electrostatic attraction causes the carbon nanotubes 86 a
- the tips of 8'6b are closed inward, and in between, the nanomaterials 96 can be sandwiched.
- the voltage is increased, the carbon nanotubes can pinch smaller nanomaterials because of the closing force.
- this nanotweezer 88 has the following disadvantages.
- the first disadvantage is that the glass tube 80 is tapered and its tip is finely processed to 100 tttn, so that it is weak in strength and brittle.
- the second disadvantage is that the gold electrode films 84a and 84b are formed along the entire length of the glass tube 80, and the contacts 90a and 90b are provided at the rear end where the diameter of the glass tube has increased. And is connected to the power source 94 via leads ⁇ 92 a and 92 b. That is, since the lead wire is quite thick, the electrical contact must be provided at the rear end of the glass tube where the diameter is enlarged. Therefore, it is difficult and inefficient to form the gold electrode film over the entire length of the glass tube.
- the third drawback is due to electrostatic nanotweezers.
- electrostatic nanotweezers store positive and negative electricity in carbon nanotubes and control the opening and closing of carbon nanotubes by their electrostatic attraction.
- the nanomaterial 96 is a magnetic insulator or a semiconductor
- electrostatic attraction can be used.
- the nanomaterial is a conductor
- both ends of the carbon nanotube are electrically short-circuited, and the electrostatic attraction is reduced. No effect.
- the fourth disadvantage is that it is composed of two carbon nanotubes.
- molecules have various shapes, and there are nanomaterials that two nanotubes cannot reliably hold.
- a flat nanomaterial can be gripped by two force nanotubes 86a and 86b, but a spherical nanomaterial or a rod-shaped nanomaterial is unstable when gripping two nanotubes. There is a risk of falling off.
- a first object of the present invention is to provide nanotweezers having high strength and relatively easy to process.
- a second object of the present invention is to provide a nanotweezer that can hold all nanomaterials of conductive / semiconductor * insulation without using an electrostatic method.
- a third object of the present invention is to provide a nanotweezer that can securely hold and control the transfer of nanomaterials of various shapes such as spherical nanomaterials and rod-shaped nanomaterials.
- nanomanipulator device capable of assembling nanostructures using these nanotweezers will be realized.
- a plurality of nanotubes protruding from the holder by fixing the base end thereof, a coating film for insulatingly covering the nanotube surface, and a lead connected to two of the nanotubes are provided.
- a nano-pipsette comprising a wire, and a voltage is applied between the lead wires so as to open and close between the tips of the two nanotubes by electrostatic attraction.
- the invention of claim 2 provides a pyramid part protruding from the cantilever, a plurality of nanotubes protruding with the base end fixed to the viramid part, and a lead wire connected to two of the nanotubes.
- a nanotweezer characterized in that a voltage is applied between the lead wires and the tip of the two nanotubes is provided to be openable and closable by electrostatic attraction.
- the invention according to claim 3 comprises a plurality of nanotubes protruding from the holder with the base end fixed, and a shrink film formed on the surface of at least one of the nanotubes.
- a nanotweezer characterized in that a voltage is applied to expand and contract a piezoelectric film to open and close the tip of the nanotube.
- the invention according to claim 4 is the nanotweezer according to claim 3, wherein the holder is a pyramid portion of a cantilever.
- the invention of claim 5 is directed to a plurality of deformable viramid pieces constituting a viramid portion of the cantilever, a nanotube fixed to the tip of the pyramid piece, and a piezoelectric film formed on a side surface of at least one vilamid piece.
- the nanopin set is characterized in that a voltage is applied to the voltage-depressing film to expand and contract the voltage-depressing film to make the viramid pieces flexible so as to open and close between the tips of the nanotubes.
- the invention according to claim 6 comprises three or more conductive nanotubes protruding from the holder with the base end fixed, and lead electrodes respectively connected to at least three or more conductive nanotubes.
- An electrostatic nanotweezer characterized in that a voltage is applied between these lead electrodes and the tip of the conductive nanotube is opened and closed freely by the electrostatic attraction.
- the invention according to claim 7 is characterized in that: a protruding portion protruding from the cantilever; three or more conductive nanotubes protruding from the protruding portion by fixing a base end portion; and at least three or more of these protruding portions.
- Electrostatic nanotweezers comprising lead electrodes respectively connected to conductive nanotubes, wherein a voltage is applied between these lead electrodes to open and close the tips of the conductive nanotubes by electrostatic attraction. It is.
- the invention of claim 8 comprises the nanotweezer according to claim 1, 2, 3, 4, 5, 6 or 7, and a three-dimensional drive mechanism for controlling the movement of the nanotweezer with respect to the sample in the XYZ directions.
- a nanomanipulator characterized in that nanomaterials are transported and controlled to a sample using nanotweezers.
- the invention according to claim 9 is the nanomanipulator device according to claim 8, wherein at least one nanotube constituting the nanotweezers is used as a probe for a scanning probe microscope.
- the present inventors have conducted intensive studies to develop durable nanotweezers. As a result, they have succeeded in improving the above-mentioned electrostatic attraction type nanotweezers using nanotubes, and have a higher productivity. The development of piezoelectric tweezers has also been successful.
- the weak point of the conventional electrostatic attraction nanotweezers is that when the nanomaterial to be gripped is conductive, the nanotubes are electrically short-circuited and the tweezers function is lost, which may cause breakage. .
- a nanotweezer that can form a coating film made of an insulating material on the nanotube surface to prevent short-circuiting during corrosion. If this coating film is formed not only on the nanotubes but also on other wiring portions, the insulation of the entire nanotweezers can be improved. This insulation treatment can be applied to electrostatic nanotweezers of any structure.
- the second weak point in the past is that the nanotubes are fixed in a tapered glass tube, so the strength is low. It is weak and brittle.
- AFM Anamic Force Microscopy
- the two inventions will be comprehensively described using a cantilever.
- the base ends of the two nanotubes are fixed near the top of the viramid, and the tips protrude.
- the coating film holds down the base end and firmly fixes the nanotube.
- a lead wire is wired to the base end of the nanotube.
- a nano tube, metal wiring by CVD (chemical vapor deposition), or the like can be used as a lead wire.
- nanotubes are a material with high strength and extremely high flexibility, and are available in various thicknesses and lengths, making them ideal as nano-sized lead wires.
- metal atoms can be minutely formed in a line by the CVD method.
- One end of the nano-tube lead wire is brought into contact with the base end, and this contact is irradiated with an electron beam to be integrally fixed to the pyramid by spot welding.
- the other end of the nanotube lead wire may be connected to another nanotube lead wire, or may be connected to an electrode film formed on the force chiller.
- the CVD lead wire can be formed while being fixed to the base end or the surface of the viramid.
- a coating of insulating material is formed on the nanotube surface, the base end region of the nanotubes, and the entire lead wire.
- a film on the nanotube surface By forming a film on the nanotube surface, a short circuit in the electrostatic method can be prevented.
- the entire nanotweezers can be protected from short-circuits and the like by forming a film on the entire wiring.
- the coating film can be formed by an electron beam irradiation method or a CVD method.
- the connection between the electrode film of the force chiller and the external power supply circuit can be performed under an optical microscope or an optical magnifier because the force fulcrum is relatively large.
- the external power supply circuit is It is composed of a pressure control circuit and an electric switch. By freely adjusting the applied voltage using a voltage control circuit, the degree of opening between the tips of the nanotubes can be adjusted arbitrarily, and the opening and closing of nanotweezers can be controlled according to the size of the nanomaterial.
- nano tweezers using a voltage-sensitive membrane method that is completely different from the electrostatic attraction method.
- the nanotubes are made flexible by the expansion and contraction of the piezoelectric film, thereby opening and closing between the tips of the nanotubes. Therefore, no current flows between the nanotubes, so that the nanotweezers can function regardless of the electrical properties of the nanomaterial.
- a probe used for a wide range of SPM scanning probe microscope
- STM scanning microscope
- SPM tips are considerably larger in size than nanotubes, and are large enough to hold two nanotubes.
- the most effective holder is the pyramid of the cantilever for AFM mentioned above. In the following, this cantilever is explained.
- the fixing method includes the above-mentioned coating method and fusion method. Either fixing method may be used.
- a piezoelectric film is formed on one of the surfaces of the two nanotubes.
- the piezoelectric film is also called a piezo element, and has a property of contracting when a voltage is applied.
- the voltage is made variable, the amount of contraction also changes.
- the piezoelectric film shrinks, the nanotubes to which it is attached flex to open. Therefore, the tip of the nanotube is initially closed, but a voltage is applied to open the tip, and the nanomaterial is gripped in this open state.
- the voltage is further increased and the opening is increased, nanomaterials are released. If the nanomaterial does not detach from the nanotube due to the intermolecular force, a voltage can be applied between the sample and the nanotweezers to electrically discharge the nanomaterial.
- One end of a nanotube lead wire may be connected to both ends of the piezoelectric film, and the other end may be connected to another nanotube lead wire, or may be connected to the electrode film of the cantilever as described above.
- CVD leads can also be used.
- the electrode film is connected to an external power supply circuit.
- the external power supply circuit is composed of a power supply, a voltage control circuit, and an electric switch, and the operation is as described above.
- a shrink film may be formed on two nanotubes. In this case, since two nanotubes can be bent by applying a voltage, the simplicity of the tip of the nanotube can be set larger, and the performance of the nanotweezers can be improved.
- a piezoelectric film is formed on the surface of the viramid instead of on the surface of the nanotube.
- the pyramid is cut into, for example, a convergent ion beam device, and divided into two pieces of pyramid through the notch.
- the thickness of each viramid piece is adjusted so as to have flexibility.
- One nanotube is projected on one pyramid piece, and a total of two nanotubes are projected so that the tips are in contact.
- a piezoelectric film is formed on the side surface of one or both viramid pieces, and a voltage is applied to both ends of the piezoelectric film to contract the piezoelectric film as described above. This contraction causes the pyramid pieces to flex, opening the nanotube tip. After that, it functions as nanotweezers by grasping and releasing nanomaterials.
- the nanotube used for the nanotweezers can be composed of two or more nanotubes in both the electrostatic attraction method and the piezoelectric film method. For example, if three nanotubes are used, these three will hold the nanomaterial.
- three tubes may be opened and closed, or two of the three tubes may be controlled to be opened and closed by an electrostatic attraction method.
- two piezoelectric films may be formed, and two may be opened and closed. If two of the three are opened and closed, the remaining one functions as an auxiliary nanotube.
- the three-tube nanotube method since three nano materials are gripped, it is possible to reliably hold nano materials of various shapes such as a sphere and a rod.
- the three-electrostatic method if two have the same polarity and one has a different polarity, the three will be attracted by electrostatic attraction, and the gripping of the irregular nanomaterial will be ensured.
- nanotubes of the present invention not only conductive carbon nanotubes but also general nanotubes such as insulating BCN-based nanotubes and carbon nanotubes can be used.
- Carbon nanotubes are also abbreviated as CNTs, and are manufactured using the arc discharge of carbon rods.
- BCN-based nanotubes are obtained by replacing some of the C atoms in CNT with ⁇ and ⁇ atoms, and ⁇ ⁇ -based nanotubes convert almost all of the C atoms into ⁇ and ⁇ atoms. It has been replaced.
- Conductive nanotubes include carbon nanotubes and insulating nanotubes with a conductive coating formed around them.
- FIG. 1 is a diagram illustrating the operation of a nano-epilator device using the nano-tweezers of the present invention.
- FIG. 2 is a schematic front view of the first embodiment of the nanotweezers according to the present invention.
- FIG. 3 is a schematic perspective view in which the nanotweezers of the first embodiment is arranged to face a sample.
- FIG. 4 is a schematic front view of the nanotweezer of the first embodiment holding a nanomaterial.
- FIG. 5 is a schematic configuration diagram of a nano-manipulator device according to the present invention.
- FIG. 6 is a schematic front view of a nanotweezer according to a second embodiment of the present invention.
- FIG. 7 is a schematic perspective view in which the nanotweezers of the second embodiment is arranged to face a sample.
- FIG. 8 is a schematic front view of a nanotweezer of the second embodiment holding a nanomaterial.
- FIG. 9 is a perspective view of a main part of a cantilever having a viramid portion.
- FIG. 10 is a schematic front view of a crane according to a third embodiment of the nanotweezers according to the present invention.
- FIG. 11 is a schematic front view of a nanotweezer of the third embodiment holding a nanomaterial.
- FIG. 12 is a schematic perspective view of a fourth embodiment of a nanotweezer (electrostatic nanotweezer) according to the present invention.
- FIG. 13 is an operation explanatory view of the fourth embodiment in which a spherical nanomaterial is gripped.
- FIG. 14 is an operation explanatory view of the fourth embodiment in which the rod-shaped nanomaterial is gripped.
- FIG. 15 is an operation explanatory view of the nanomanipulator device using the electrostatic nanotweezers of the fourth embodiment.
- FIG. 16 is a side view of a conventional tapered glass tube tip.
- FIG. 17 is a schematic explanatory view of a conventional nanotweezer.
- FIG. 18 is a schematic explanatory diagram for applying a voltage to a conventional nanotweezer.
- FIG. 1 is a diagram illustrating the operation of a nanomanipulator device using nanotweezers according to the present invention.
- the nanotweezers 2 are formed by projecting two nanotubes 8 and 9 on a pyramid 6 projecting from the tip of an AFM cantilever 4.
- Lead wires 10, 10 are provided at the base ends of these nanotubes 8, 9, and are connected to electrode films 12, 12 formed on the left and right side surfaces of the cantilever 4.
- the electrode films 12 and 12 are connected to an electric switch SW, a power supply P and a voltage control circuit VC, and apply an appropriate voltage to the nanotubes 8 and 9.
- the two nanotubes 8 and 9 are arranged close to the sample 14, and a large number of various nanomaterials 16 are arranged on the surface of the sample 14.
- the nanotube 8 protrudes downward longer than the nanotube 9. Therefore, the nanotube 8 can also be used as a probe for AFM.
- the nanotube 8 is scanned by a three-dimensional drive mechanism 17 as an AFM probe to confirm the position and shape of the nanomaterial 16 to be grasped.
- the opening and closing of the nanotubes 8 and 9 are controlled by applying a voltage, and the degree of opening is varied according to the magnitude of the voltage. Therefore, the nanotubes 8 and 9 are opened, the nanomaterial 16 which is registered by the AFM is gripped, and the three-dimensional driving device D moves the nanomaterials 16 along the direction of the arrow to the nanocircuit portion 18 so that the nanotubes 8 and 9 are opened. 9 is opened to the judge to release the nanomaterial 16. If the nanomaterial does not detach from the nanotube due to Van der Waals force, a voltage can be applied between the nanotweezer and the nanocircuit to release the nanomaterial by electrostatic attraction. By releasing the nanomaterial 16 into place in the nanocircuit section 18, the nanocircuit 18 is assembled into the desired structure.
- FIG. 2 is a schematic front view of the nanotweezers 2.
- a thin nanotube 8 and a thick and short nanotube 9 are arranged with their base ends 8b and 9b fixed.
- the tip 8a of the nanotube is protruded downward below the tip 9a, and the tip 8a is set so that it can be used as an AFM probe.
- the base ends 8b and 9b are exposed by electron beam irradiation to the periphery. 1 Covered with 1 and fixed.
- the nanotubes are connected to the upper ends of the base ends 8 b and 9 b as lead wires 10 and 10, and the other ends of the lead wires 10 and 10 are connected to the electrodes 12 and 12 in FIG. 12. Is done.
- coating films 11 and 11 are also formed on the surfaces of the nanotube leads # 10 and 10, and these leads are fixed to the pyramid 6.
- the coating film 1 1 is indicated by hatching.
- FIG. 3 is a schematic perspective view in which the nanotweezers 2 are arranged facing the sample 14.
- the irregularities on the surface of sample 14 represent surface atoms. Since the tip 8a of the nanotube 8 projects below the tip 9a of the nanotube 9, the tip 8a is used as an AFM probe to detect the concave t3 ⁇ 4 structure of the surface atoms. For example, the position and shape of a nano-poor placed on a sample 14 are detected.
- FIG. 4 is a schematic front view of the nanotweezers 2 holding the nanomaterial 16.
- a DC voltage is applied from the lead wires 10 and 10 to the nanotubes 8 and 9.
- Positive and negative charges can be stored in the tips 8a and 9a, and the tips 8a and 9a close with an opening corresponding to the applied voltage due to the electrostatic attraction of the positive and negative charges.
- the nanomaterial 16 to be gripped is the nanomaterial detected by AFM in FIG.
- FIG. 5 is a schematic configuration diagram of a nanomanipulator device according to the present invention.
- the nanotweezers 2 is composed of the cantilever 4, the substrates 5, the pyramids 6 and the nanotubes 8 and 9.
- the sample 14 is driven in a three-dimensional direction by a three-dimensional drive mechanism 17 composed of a photo diode. That is, the sample side is driven to drive the nanotubes 8 and 9 on the surface of the sample 14 in the XYZ directions.
- the nanotweezers 2 may be directly driven three-dimensionally. It is important that nano tweezers 2 and sample 14 can be driven three-dimensionally relative to each other.
- 20 is a semiconductor laser device
- 22 is a reflection mirror
- 24 is a two-segment photodetector
- 26 is a vertical axis detection circuit
- 28 is a display device
- 30 is an XYZ scanning circuit.
- the nanotubes 8 and 9 are made to approach the sample 14 in the Z-axis direction until a predetermined repulsion position is reached, and the necessary nano material 16 is gripped. Then, the three-dimensional drive mechanism 17 is scanned by the XYZ scanning circuit 30 to move the nanotubes 8 and 9 to a predetermined position. In this movement process, it is necessary to keep the distance between the nanotubes 8 and 9 and the sample surface constant, so it is necessary to control the position of the nanotube in the Z-axis direction so that the repulsive force received by the nanotube is always constant. There is.
- the laser beam LB is reflected by the cantilever 4 and reflected. It is introduced into a two-segment photodetector 24 via a mirror 22 and performs Z-axis control while detecting the deflection to the upper and lower detectors 24a and 24b.
- the Z-axis detection circuit 26 detects the Z position
- the XY-Z scanning circuit 30 detects the XY position
- the position information is displayed on the display device 28. That is, the display device 28 displays an uneven image of the sample surface.
- the nanotubes 8 and 9 move to predetermined positions
- the nanotubes 8 and 9 are opened to release the grasped nanomaterial 16 onto the sample surface.
- This operation is repeated to assemble a large number of nanomaterials at predetermined locations, for example, to constitute a nanocircuit 18.
- the nano-manipulator device of the present invention is a nano-robot that can freely configure a nano field.
- This nanomanipulator device can be used in various atmospheres including vacuum and air, and can be operated like a robot hand in a device such as an electron microscope.
- FIG. 6 is a schematic front view of the nano tweezers 2.
- the base ends 8b and 9b are fixed to the pyramid section 6 by the coating films 11 and 11 so that the tips 8a and 9a of the nanotubes 8 and 9 are in contact at the ends.
- a piezoelectric film 32 is formed on the surface of the tip 9a of the nanotube 9, and nanotube leads 10a and 10b are connected to its upper end 32a and lower end 32b.
- the nanotube lead wires 10a and 10b are fixed to the pyramid portion 6 at their intermediate points by spot-like coating films 13 and 13.
- FIG. 7 is a schematic perspective view in which the nanotweezers 2 are arranged to face the sample 14.
- Nanochu Pulido line 1 0 a, 1 0 1 3 of the other end 1 0 £;, 1 0 d is fixed to the electrode 1 2, 1 2 of the cantilever 4.
- Electrodes 12 and 12 are connected to an electric switch SW, a power supply P, and a voltage control circuit VC.
- the piezoelectric film 32 contracts when a voltage is applied to both ends, and the amount of contraction increases with the applied voltage.
- the surface of the sample 14 is subjected to AFM operation to detect the position and shape of the nanomaterial to be grasped.
- FIG. 8 is a schematic front view of the nanotweezers 2 holding the nanomaterial 16. Electric switches When the switch SW is turned on and a voltage is applied to the piezoelectric film 32, the nanotubes 9 bend in accordance with the contraction of the piezoelectric film 32, the space between the nanotubes 8 and 9 is opened, and the target nanomaterial 16 is gripped. Nano circuit :! Since the assembly of FIG. 8 is the same as that of FIG. 1, the description is omitted.
- the nanotweezer operation can be performed even in an electrolyte solution.
- FIG. 9 shows a third embodiment of the nanotweezers according to the present invention.
- FIG. 9 is a perspective view of a main part of the cantilever 4 having the pyramid portion 6.
- the cantilever 4 is generally used for AFM measurement, and the pyramid 6 is formed as a lump.
- the pyramid section 6 is carved by, for example, a focused ion beam device and is divided into two equal parts into two pyramid pieces 6a and 6b, and these pyramid pieces 6a and 6b are formed to be flexible.
- FIG. 10 is a schematic front view of the nanotweezers 2.
- the pyramid pieces 6a and 6b are flexibly opposed to the root 6d via the gap 6c.
- the base ends 8b and 9b are fixed to the pyramid pieces 6a and 6b by the coating films 11 and 11 so that the tips 8a and 9a of the nanotubes 8 and 9 come into contact at the tips.
- a piezoelectric film 32 is formed on a side surface of the pyramid piece 6a, and nano tuple lines 10a and 1Ob are connected to an upper end 32a and a lower end 32b thereof.
- These nanotube leads 10a, 10 are connected to the same power supply circuit as in the second embodiment via the electrodes 12, 12 of the cantilever 4.
- the surface of the sample 14 is subjected to AFM operation with the nanotube tip closed, and the position and shape of the nanomaterial to be grasped are detected.
- FIG. 11 is a schematic front view of a nanotweezer 2 holding a nanomaterial 16.
- the electric switch SW was turned on and a voltage was applied to the piezoelectric film 32, the piece 6a of the polyimide was bent in accordance with the contraction of the piezoelectric film 32, and the gap between the tips 8a and 9a of the nanotubes was opened. Grasp nano material 16.
- the assembly of the nanocircuit 18 using the nanomanipulator device is the same as that in FIG.
- the nanotubes and viramid pieces were configured in two pieces. Multiple configurations may be used.
- the piezoelectric film can be formed not only on one of the nanotubes or vilamid pieces but also on two opposing pieces.
- FIG. 12 is a schematic perspective view of a nanotweezer (electrostatic nanotweezer) according to a fourth embodiment of the present invention.
- the cantilever 102 is composed of a cantilever portion 104 and a protruding portion 10 formed at the tip thereof.
- the protruding end 106 e of the protruding portion 106 is formed substantially horizontally, and its peripheral surface is composed of four surfaces: a front end surface 106 a, side surfaces 106 b and 106 c, and a rear end surface 106 d.
- Three electrode films 112, 113, 114 having a required width are formed on the upper surface and side surfaces of the cantilever portion 104, respectively. ⁇ Formed to extend to sides 106b and 106c. On the front end surface 106a and the side surfaces 106b, 106c, the base ends 108b, 109b, 110b of the conductive nanotubes 108, 109, 110 are coated with the coating film 116, 106b. It is fixed by the coating of 117 and 118, respectively.
- the conductive nanotubes 108, 109, 110 are set to be electrically conductive with the electrode films 112, 113, 114, respectively.
- the tips 108 a, 109 a, 110 a of the conductive nanotubes 108, 109, 110 protrude below the projecting end 106 e of the projection 106, and these tips 108 a, 109 a, 110a constitutes the nano-tube gripper 111, and becomes a working claw capable of gripping and releasing the nanomaterial as a material.
- the nanotube gripper 111 is formed on the cantilever 102, and the electrostatic nanotweezer 120 according to the present invention is configured.
- the electrostatic nanotweezers according to this embodiment is characterized in that the nanotube gripper 111 is formed of three or more nanotubes.
- the nanotube gripper 111 is formed of three or more nanotubes.
- three nanotubes can stably and reliably grip nanomaterials of any shape.
- spherical nanomaterials and rod-like nanomaterials can be reliably gripped.
- This electrostatic nano tweezers 1 20 electrode film 1 1 2 1 1 3 The control circuit 121 is connected via 112a, 113a and 114a.
- the control circuit 121 includes a variable DC power supply 122, a ground 124, and a switch 126.
- the contacts 113a and 114a are connected to the ground, and the contact 112a is connected to the high potential. Connected. Accordingly, the electrode film 112 functions as a positive electrode, and the electrode films 113 and 114 function as negative electrodes.
- the nanotubes include conductive carbon nanotubes and insulating 1 "raw BN-based nanotubes (boron nitride) and BCN-based nanotubes (boron carbonitride).
- the conductive nanotubes used in this embodiment are as follows. As long as is a nanotube having electrical conductivity, a conductive nanotube or an insulating nanotube whose surface is coated with a conductive material is used, and a metal material is mainly suitable for the conductive material for coating.
- carbon nanotubes as an example of conductive nanotubes, their diameters range from about 111 to several tens of 11111, and their lengths are distributed from the nano-order to the micron-order.
- the aspect ratio (length / diameter) is It can reach more than 1 000.
- carbon nanotubes have a high degree of flexibility and toughness, they are suitable as a material for grasping and releasing nanomaterials by opening and closing the tip.
- the cantilever 102 used in the above embodiment is obtained by diverting a cantilever probe used for an atomic force microscope (AFM).
- This cantilever probe is made of silicon-silicon nitride and is processed and formed by using a semiconductor blanker technology. Therefore, it has high strength and excellent durability compared to conventional glass products.
- the protruding end 106e of the protruding portion 106 is not sharpened but formed on a flat surface. That is, the protruding portion 106 is not used as a needle, but is used as a holder for fixing the conductive nanotube.
- the organic gas is decomposed by an electron beam in an electron microscope, and this decomposition deposit is used as a coating film.
- the coating film becomes a carbon film
- the organic gas is a metal organic gas
- the coating film becomes a metal film.
- the metal film ensures more continuity between the conductive nanotubes 108, 109, 110 and the electrode films 112, 113, 114.
- the base end portion of the nanotube can be fused and fixed integrally with the protrusion by electron beam irradiation or electric heating.
- Ko The combined use of a fusion coating and fusing allows the nanotubes to be more firmly fixed, prevents the nanotubes from falling off, and improves the durability of the electrostatic nanotweezers.
- FIG. 13 is an explanatory diagram of the operation of the embodiment in which the spherical nano material is gripped.
- the length of the nanotube 108 is set slightly longer than the other nanotubes 109 and 110, and the tip 108a is arranged so as to protrude below the other tips 109a and 110a. Keep it.
- the tip 108a of the nanotube 108 as a probe, the location and position of the spherical nanomaterial 128 on the sample surface are detected and confirmed by AFM scanning.
- the nanotube gripper 1 1 1 1 is moved downward so that the spherical nano material 1 28 is included in the center of the three tips 108 a, 1 09 a, and 1 10 a and brought into contact with the sample surface. .
- the switch 12 & when the switch 12 & is turned on, the tip portions 108a, 1a of the conductive nanotubes 108, 1.09, 11,10 through the electrode films 112, '113, 114. Voltage is applied to 09a and 110a. That is, the first part 108a becomes the positive electrode, and the tip 109a and 110a become the negative electrode.
- FIG. 14 is an operation explanatory view of the above-described embodiment holding the rod-shaped nanomaterial.
- the nanotube gripper 111 is moved downward so that the rod-shaped nanomaterial 130 is disposed between the three tips 108a, 109a, and 110a, and is brought into contact with the sample surface.
- the switch 126 is turned on and the tips 108a, 109a, 110a are closed by electrostatic attraction, the rod-shaped nanomaterial 130 is gripped from the front and back.
- the nanotube holding portion 111 is moved upward, the rod-shaped nanomaterial 130 is reliably lifted as shown in the figure.
- the nanotube holding portion 111 of the electrostatic nanotweezers 120 is composed of three conductive nanotubes 108, 109, and 110.
- the nanotube gripper 111 can be composed of four nanotubes.
- the nanomaterial is gripped and released by opening and closing three or more nanotubes. This is an electrostatic nanotweezer that is characterized in that
- FIG. 15 is a diagram illustrating the operation of a nanomanipulator device using the electrostatic nanotweezers.
- a nanomanipulator device using the electrostatic nanotweezers.
- this nanomaterial is detected by the AFM operation of the electrostatic nanotweezers 120 and is gripped by the nanotube gripper 111.
- the electrostatic nanotweezers 120 are moved in the direction of arrow a and in the direction of arrow b by a three-dimensional drive device (not shown), and the thick material nanomaterial is released at a desired position of the nanostructures 134.
- a desired nanostructure 134 can be formed on the surface of the sample 132 using various nanomaterials as raw materials.
- the closing operation of the conductive nanotubes 108, 109, 110 is performed by the electrostatic attraction due to the application of a voltage through the electrode films 112, 113, 114. .
- the opening operation is performed by the elastic restoring force of the conductive nanotube by releasing the voltage.
- the movement control of the electrostatic nanotweezers 120 is realized by the movement control mechanism of AFM (atomic force microscope).
- an AFM movement control mechanism shown in FIG. 5 is used.
- a nanomanipulator device is configured by a combination of the movement control mechanism and the electrostatic nanopin set 120. Since FIG. 5 has already been explained in detail, the explanation is omitted here.
- the nanotube grasping portion 111 is moved to the position of the nanostructure, and the nanotube grasping portion 111 is opened to release the grasped nanomaterial onto the sample surface 132a. This operation is repeated to assemble the nanostructure.
- the nano-piper device of this embodiment is a nano pot that can freely configure a nano world.
- This nanomanipulator device can be used in various atmospheres including vacuum and air.
- the lead electrode for applying a voltage to the conductive nanotube is a can electrode.
- the required number of electrode films were formed on the chiller.
- a lead electrode can be formed by combining an electrode film with a lead wire, or by using only a lead wire.
- conductive nanotubes such as long carbon nano-tubes can be used as lead wires.
- a fusion method, a coating film method, or the like can be used for the bonding between nanotubes. The fusion method can be performed by methods such as electron beam irradiation, ion beam irradiation, and current heating.
- the present embodiment is an electrostatic nanotweezer that can hold a nanomaterial by electrostatic force between conductive nanotubes. Therefore, it is effective when the nanomaterial to be grasped is insulating, but may be short-circuited when it is a conductive nanomaterial. However, when the surface of the conductive nanotube is coated with an insulating film, even if the conductive nano material is gripped, there is no short circuit between the conductive nanotubes, so that the conductive nanotube functions effectively as a nanotweezer.
- a hydrocarbon film can be suitably used as the insulating film, and a film can be formed on the surface of the conductive nanotube by electron beam irradiation.
- other known materials and known methods can be used for the material and coating method of the insulating film.
- the surface of the nanotube is coated with an insulating material, no short circuit occurs even when closed by electrostatic attraction. Therefore, it is possible to perform a pin set operation on nanomaterials having all electrical properties.
- the present invention can be applied to all structures of the nano-tweezers of the electrostatic attraction method.
- the pyramid of the cantilever for AFM is used as a nanotube holder, the strength of the entire nanotweezers is high, and furthermore, since the wiring is composed of a nano-tuple-lead wire / CVD lead wire, etc. Fine nanoscale wiring is possible, and the circuit configuration can be compact.
- the nano material can be gripped irrespective of the electrical properties of the nano material, that is, the difference between the insulator, the semiconductor, and the conductor. It is possible to improve the performance over the electrostatic attraction method in that the insulating coating of the nanotube is not required.
- the pyramid portion of the cantilever is used as the holder of claim 3, the strength of the entire nanotweezer is high, and all the materials are gripped irrespective of the electrical properties of the target nanomaterial. And provide a nano-pinset having a wide range of applications.
- the piezoelectric film is easily formed on the pyramid piece having a large size instead of forming the conductive film on the nanotube.
- the size of the piezoelectric film is increased, so that workability such as connection of a nanotube lead wire to the piezoelectric film can be improved.
- conductive nanotubes are used as a member for gripping the nanomaterial, not only flat nanomaterials but also arbitrary shapes such as spherical nanomaterials and rod-shaped nanomaterials are used. Nanomaterials can be stably and reliably held.
- the opening and closing of the conductive nanotube can be performed by the electrostatic attraction by applying a voltage and the elastic restoring force by canceling the voltage, so the opening and closing operation is simple, and the nanomaterial can be easily gripped and moved.
- a semiconductor cantilever used for AFM measurement is used, a durable, high-strength electrostatic nanopin set can be provided.
- the nanomaterial is gripped by the nanotweezers or the electrostatic nanotweezers and moved to a desired position, And a nano-manipulator device that can assemble nano-structures of any shape can be realized.
- one nanotube selected from three or more conductive nanotubes constituting the electrostatic nanotweezer is used as a probe for a scanning probe microscope, so that the surface of the sample A nanomanipulator device capable of detecting physical property information can be realized.
- this nano-meulator allows the user to search for the position of the nano-substance on the sample surface, grasp, move, and release the nano-substance while checking the shape of the nano-substance. With excellent functions.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Robotics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Composite Materials (AREA)
- Health & Medical Sciences (AREA)
- Materials Engineering (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Manipulator (AREA)
- Micromachines (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020017013543A KR20020006708A (ko) | 2000-03-08 | 2001-03-08 | 나노핀셋 및 나노매니퓰레이터 |
EP01912179A EP1193216A4 (en) | 2000-03-08 | 2001-03-08 | NANOPINCES AND NANOMANIPULATOR |
US10/009,471 US6669256B2 (en) | 2000-03-08 | 2001-03-08 | Nanotweezers and nanomanipulator |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000112767A JP3706523B2 (ja) | 2000-03-08 | 2000-03-08 | ナノピンセット及びこれを用いたナノマニピュレータ装置 |
JP2000-112767 | 2000-03-08 | ||
JP2000404006A JP3973359B2 (ja) | 2000-12-07 | 2000-12-07 | 静電ナノピンセット及びこれを用いたナノマニピュレータ装置 |
JP2000-404006 | 2000-12-07 |
Related Child Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/009,471 A-371-Of-International US6669256B2 (en) | 2000-03-08 | 2001-03-08 | Nanotweezers and nanomanipulator |
US10/406,844 Division US6805390B2 (en) | 2000-03-08 | 2003-04-04 | Nanotweezers and nanomanipulator |
US10/406,845 Division US6802549B2 (en) | 2000-03-08 | 2003-04-04 | Nanotweezers and nanomanipulator |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001066460A1 true WO2001066460A1 (en) | 2001-09-13 |
Family
ID=26590097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/001803 WO2001066460A1 (en) | 2000-03-08 | 2001-03-08 | Nanotweezers and nanomanipulator |
Country Status (5)
Country | Link |
---|---|
US (3) | US6669256B2 (ja) |
EP (1) | EP1193216A4 (ja) |
KR (1) | KR20020006708A (ja) |
CN (1) | CN1315623C (ja) |
WO (1) | WO2001066460A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002016089A2 (en) * | 2000-08-25 | 2002-02-28 | Danmarks Tekniske Universitet | Fabrication and application of nano-manipulators with induced growth |
WO2003028065A2 (en) | 2001-09-24 | 2003-04-03 | Fei Company | Electrostatic manipulating apparatus |
US20150040690A1 (en) * | 2012-04-19 | 2015-02-12 | Nitto Denko Corporation | Particle adsorption probe |
Families Citing this family (61)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6036702A (en) * | 1997-04-23 | 2000-03-14 | Vascular Science Inc. | Medical grafting connectors and fasteners |
US6700550B2 (en) * | 1997-01-16 | 2004-03-02 | Ambit Corporation | Optical antenna array for harmonic generation, mixing and signal amplification |
JP3925610B2 (ja) * | 2001-02-13 | 2007-06-06 | 喜萬 中山 | 発熱プローブ及び発熱プローブ装置 |
JP2002340506A (ja) * | 2001-05-11 | 2002-11-27 | Seiko Instruments Inc | 位置検出装置及びこれを用いた時計針位置検出装置 |
US6593666B1 (en) * | 2001-06-20 | 2003-07-15 | Ambient Systems, Inc. | Energy conversion systems using nanometer scale assemblies and methods for using same |
CN1558868A (zh) * | 2001-11-29 | 2004-12-29 | �Ĺ���������ʽ���� | 纳米夹具及其制造方法 |
US6950296B2 (en) * | 2002-01-25 | 2005-09-27 | Nanolab, Inc. | Nanoscale grasping device, method for fabricating the same, and method for operating the same |
JP4047023B2 (ja) * | 2002-01-31 | 2008-02-13 | 喜萬 中山 | ダイオード型ナノピンセット及びこれを用いたナノマニピュレータ装置 |
US20070042667A1 (en) * | 2002-03-08 | 2007-02-22 | Chien-Min Sung | Diamond-like carbon energy conversion devices and methods thereof |
US20040022943A1 (en) * | 2002-04-12 | 2004-02-05 | Rudiger Schlaf | Carbon nanotube tweezer and a method of producing the same |
JP3797276B2 (ja) * | 2002-05-31 | 2006-07-12 | 株式会社日立製作所 | 磁性ナノチューブ |
US7183568B2 (en) * | 2002-12-23 | 2007-02-27 | International Business Machines Corporation | Piezoelectric array with strain dependant conducting elements and method therefor |
EP1439546A1 (en) * | 2003-01-16 | 2004-07-21 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | A nanotube based cantilever arm, a method of operating and manufacturing a nanotube based cantilever arm, and a storage device and a photonic crystal based on an array of nanotube based cantilever arms |
US6762073B1 (en) * | 2003-02-24 | 2004-07-13 | Donald P. Cullen | Method of fabricating electronic interconnect devices using direct imaging of dielectric composite material |
JP4024710B2 (ja) * | 2003-04-15 | 2007-12-19 | エスアイアイ・ナノテクノロジー株式会社 | 分割探針の製造方法 |
US20060122596A1 (en) * | 2003-04-17 | 2006-06-08 | Nanosys, Inc. | Structures, systems and methods for joining articles and materials and uses therefor |
US7074294B2 (en) * | 2003-04-17 | 2006-07-11 | Nanosys, Inc. | Structures, systems and methods for joining articles and materials and uses therefor |
US20050038498A1 (en) * | 2003-04-17 | 2005-02-17 | Nanosys, Inc. | Medical device applications of nanostructured surfaces |
US7056409B2 (en) * | 2003-04-17 | 2006-06-06 | Nanosys, Inc. | Structures, systems and methods for joining articles and materials and uses therefor |
US7972616B2 (en) * | 2003-04-17 | 2011-07-05 | Nanosys, Inc. | Medical device applications of nanostructured surfaces |
US7803574B2 (en) * | 2003-05-05 | 2010-09-28 | Nanosys, Inc. | Medical device applications of nanostructured surfaces |
US20040245224A1 (en) * | 2003-05-09 | 2004-12-09 | Nano-Proprietary, Inc. | Nanospot welder and method |
US7095645B2 (en) * | 2003-06-02 | 2006-08-22 | Ambient Systems, Inc. | Nanoelectromechanical memory cells and data storage devices |
US20040238907A1 (en) * | 2003-06-02 | 2004-12-02 | Pinkerton Joseph F. | Nanoelectromechanical transistors and switch systems |
US7199498B2 (en) | 2003-06-02 | 2007-04-03 | Ambient Systems, Inc. | Electrical assemblies using molecular-scale electrically conductive and mechanically flexible beams and methods for application of same |
US7148579B2 (en) | 2003-06-02 | 2006-12-12 | Ambient Systems, Inc. | Energy conversion systems utilizing parallel array of automatic switches and generators |
DE10362116B4 (de) * | 2003-09-17 | 2008-08-28 | Carl Zeiss Nts Gmbh | Verfahren zur Präparation einer Probe für elektronenmikroskopische Untersuchungen, sowie dabei verwendeter Greifer |
JP4652679B2 (ja) * | 2003-10-03 | 2011-03-16 | エスアイアイ・ナノテクノロジー株式会社 | ナノメータスケールの構造物の作製方法 |
US8025960B2 (en) | 2004-02-02 | 2011-09-27 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20110039690A1 (en) | 2004-02-02 | 2011-02-17 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20050238810A1 (en) * | 2004-04-26 | 2005-10-27 | Mainstream Engineering Corp. | Nanotube/metal substrate composites and methods for producing such composites |
US7261352B2 (en) * | 2004-07-13 | 2007-08-28 | Samsung Electronics Co., Ltd. | Electrostatically driven carbon nanotube gripping device |
WO2007024204A2 (en) | 2004-07-19 | 2007-03-01 | Ambient Systems, Inc. | Nanometer-scale electrostatic and electromagnetic motors and generators |
US8182491B2 (en) * | 2004-08-06 | 2012-05-22 | Depuy Spine, Inc. | Rigidly guided implant placement |
US8016835B2 (en) * | 2004-08-06 | 2011-09-13 | Depuy Spine, Inc. | Rigidly guided implant placement with control assist |
JP2006125846A (ja) * | 2004-10-26 | 2006-05-18 | Olympus Corp | カンチレバー |
US7461882B2 (en) * | 2004-11-12 | 2008-12-09 | Georgia Tech Research Corp. | Microfabricated mechanically actuated microtool and methods |
CN101061059B (zh) * | 2004-11-22 | 2012-08-29 | 国立大学法人香川大学 | 纳米镊子及其制造方法以及配备有该纳米镊子的扫描探针显微镜 |
US20070057522A1 (en) * | 2005-02-14 | 2007-03-15 | Keller Christpher G | Tool to pick up microparts |
US20070048160A1 (en) * | 2005-07-19 | 2007-03-01 | Pinkerton Joseph F | Heat activated nanometer-scale pump |
US7547038B2 (en) * | 2005-07-28 | 2009-06-16 | Autoliv Asp, Inc. | Inflatable curtain with multi-layered tab |
CN100349704C (zh) * | 2005-10-20 | 2007-11-21 | 中国科学技术大学 | 静电力驱动的三臂微型夹持装置 |
JP2009516198A (ja) * | 2005-11-18 | 2009-04-16 | プレジデント・アンド・フエローズ・オブ・ハーバード・カレツジ | 誘電泳動ピンセット装置および方法 |
US7554154B2 (en) * | 2006-07-28 | 2009-06-30 | Alpha Omega Semiconductor, Ltd. | Bottom source LDMOSFET structure and method |
US8385113B2 (en) | 2007-04-03 | 2013-02-26 | Cjp Ip Holdings, Ltd. | Nanoelectromechanical systems and methods for making the same |
JP2008311521A (ja) * | 2007-06-15 | 2008-12-25 | Aoi Electronics Co Ltd | パーティクル除去方法、微小ピンセット装置、原子間力顕微鏡および荷電粒子ビーム装置 |
US8319002B2 (en) * | 2007-12-06 | 2012-11-27 | Nanosys, Inc. | Nanostructure-enhanced platelet binding and hemostatic structures |
WO2009073854A1 (en) | 2007-12-06 | 2009-06-11 | Nanosys, Inc. | Resorbable nanoenhanced hemostatic structures and bandage materials |
US8021532B2 (en) | 2008-02-26 | 2011-09-20 | President And Fellows Of Harvard College | Dielectrophoretic tweezers apparatus and methods |
WO2011046602A1 (en) * | 2009-10-13 | 2011-04-21 | National Institute Of Aerospace Associates | Energy conversion materials fabricated with boron nitride nanotubes (bnnts) and bnnt polymer composites |
WO2012105800A2 (ko) * | 2011-01-31 | 2012-08-09 | 성균관대학교 산학협력단 | 나노전력발전소자 및 이의 제조방법 |
CN102179803A (zh) * | 2011-03-31 | 2011-09-14 | 西北工业大学 | 基于弧形梳齿的大位移静电驱动微夹持器 |
US8604446B2 (en) | 2011-08-08 | 2013-12-10 | The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of The University Of Oregon | Devices and methods for cryo lift-out with in situ probe |
WO2013074134A1 (en) | 2011-11-17 | 2013-05-23 | National Institute Of Aerospace Associates | Radiation shielding materials containing hydrogen, boron and nitrogen |
CN103295853B (zh) * | 2012-02-23 | 2015-12-09 | 清华大学 | 场发射电子源及应用该场发射电子源的场发射装置 |
CN103293341B (zh) * | 2012-02-23 | 2015-07-01 | 清华大学 | 原子力显微镜探针 |
RU2633425C2 (ru) * | 2015-10-22 | 2017-10-12 | Потемкин Александр Петрович | Нанопинцет для манипулирования частицами |
CN108839009B (zh) * | 2018-07-18 | 2020-12-01 | 北京工业大学 | 光致纳米机械手 |
CN109694035A (zh) * | 2019-02-25 | 2019-04-30 | 北京理工大学 | 一种制备复合纳米结构的方法 |
CN109956321B (zh) * | 2019-03-01 | 2020-09-08 | 北京理工大学 | 基于磁力驱动的微小目标抓取装置及其制备与抓取方法 |
TWI726831B (zh) * | 2020-12-03 | 2021-05-01 | 吉而特科技股份有限公司 | 精密夾持裝置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06238578A (ja) * | 1993-02-10 | 1994-08-30 | Olympus Optical Co Ltd | 微細物体操作装置 |
JPH0752072A (ja) * | 1993-08-20 | 1995-02-28 | Fuji Electric Corp Res & Dev Ltd | 静電駆動式マイクログリッパ |
WO1998005920A1 (en) * | 1996-08-08 | 1998-02-12 | William Marsh Rice University | Macroscopically manipulable nanoscale devices made from nanotube assemblies |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4666198A (en) * | 1984-09-06 | 1987-05-19 | Microflex Technology, Inc. | Piezoelectric polymer microgripper |
JPH0360988A (ja) * | 1989-07-27 | 1991-03-15 | Ckd Corp | 圧電式把持装置 |
JPH03154784A (ja) * | 1989-11-13 | 1991-07-02 | Hitachi Ltd | 支持機構、支持システム、それを用いた組立方法及び組立装置 |
JPH05244782A (ja) * | 1992-02-27 | 1993-09-21 | Nippon Telegr & Teleph Corp <Ntt> | マイクロアクチュエータ及びその作製法とマイクロハンド |
JPH07156082A (ja) * | 1993-11-30 | 1995-06-20 | Hitachi Ltd | マニピュレータ及びその操作方法 |
CN2223176Y (zh) * | 1994-02-24 | 1996-03-27 | 中国科学院上海光学精密机械研究所 | 用吸附针尖组装微小构件的装置 |
JPH0890431A (ja) * | 1994-09-27 | 1996-04-09 | Shimadzu Corp | マイクログリッパおよびその製造方法 |
JP2560262B2 (ja) * | 1994-11-09 | 1996-12-04 | 工業技術院長 | 二本指マイクロハンド機構 |
JPH08257926A (ja) * | 1995-03-29 | 1996-10-08 | Nikon Corp | ホルダー付きマイクログリッパー |
JPH09314484A (ja) * | 1996-03-29 | 1997-12-09 | Olympus Optical Co Ltd | マイクロマニピュレータ |
KR100363084B1 (ko) * | 1999-10-19 | 2002-11-30 | 삼성전자 주식회사 | 박막 구조를 위한 다중막을 포함하는 커패시터 및 그 제조 방법 |
US7294360B2 (en) * | 2003-03-31 | 2007-11-13 | Planar Systems, Inc. | Conformal coatings for micro-optical elements, and method for making the same |
-
2001
- 2001-03-08 CN CNB018004733A patent/CN1315623C/zh not_active Expired - Fee Related
- 2001-03-08 WO PCT/JP2001/001803 patent/WO2001066460A1/ja active Application Filing
- 2001-03-08 US US10/009,471 patent/US6669256B2/en not_active Expired - Fee Related
- 2001-03-08 EP EP01912179A patent/EP1193216A4/en not_active Withdrawn
- 2001-03-08 KR KR1020017013543A patent/KR20020006708A/ko unknown
-
2003
- 2003-04-04 US US10/406,844 patent/US6805390B2/en not_active Expired - Fee Related
- 2003-04-04 US US10/406,845 patent/US6802549B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06238578A (ja) * | 1993-02-10 | 1994-08-30 | Olympus Optical Co Ltd | 微細物体操作装置 |
JPH0752072A (ja) * | 1993-08-20 | 1995-02-28 | Fuji Electric Corp Res & Dev Ltd | 静電駆動式マイクログリッパ |
WO1998005920A1 (en) * | 1996-08-08 | 1998-02-12 | William Marsh Rice University | Macroscopically manipulable nanoscale devices made from nanotube assemblies |
Non-Patent Citations (1)
Title |
---|
See also references of EP1193216A4 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002016089A2 (en) * | 2000-08-25 | 2002-02-28 | Danmarks Tekniske Universitet | Fabrication and application of nano-manipulators with induced growth |
WO2002016089A3 (en) * | 2000-08-25 | 2002-06-13 | Univ Danmarks Tekniske | Fabrication and application of nano-manipulators with induced growth |
WO2003028065A2 (en) | 2001-09-24 | 2003-04-03 | Fei Company | Electrostatic manipulating apparatus |
EP1468437A2 (en) * | 2001-09-24 | 2004-10-20 | FEI Company | Electrostatic manipulating apparatus |
US20150040690A1 (en) * | 2012-04-19 | 2015-02-12 | Nitto Denko Corporation | Particle adsorption probe |
US9606041B2 (en) * | 2012-04-19 | 2017-03-28 | Nitto Denko Corporation | Particle adsorption probe |
Also Published As
Publication number | Publication date |
---|---|
US6669256B2 (en) | 2003-12-30 |
KR20020006708A (ko) | 2002-01-24 |
US20030189350A1 (en) | 2003-10-09 |
US6805390B2 (en) | 2004-10-19 |
EP1193216A4 (en) | 2006-06-07 |
US6802549B2 (en) | 2004-10-12 |
CN1364141A (zh) | 2002-08-14 |
CN1315623C (zh) | 2007-05-16 |
EP1193216A1 (en) | 2002-04-03 |
US20020158480A1 (en) | 2002-10-31 |
US20030189351A1 (en) | 2003-10-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2001066460A1 (en) | Nanotweezers and nanomanipulator | |
US7261352B2 (en) | Electrostatically driven carbon nanotube gripping device | |
US20020061662A1 (en) | Fabrication and application of nano-manipulators with induced growth | |
Yu et al. | Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope | |
US20040211271A1 (en) | Method for attaching rod-shaped nano structure to probe holder | |
JP3706523B2 (ja) | ナノピンセット及びこれを用いたナノマニピュレータ装置 | |
Mølhave et al. | Towards pick-and-place assembly of nanostructures | |
WO2000033052A1 (en) | Electronic device surface signal control probe and method of manufacturing the probe | |
US20100068124A1 (en) | Nanostructure devices and fabrication method | |
JP4047023B2 (ja) | ダイオード型ナノピンセット及びこれを用いたナノマニピュレータ装置 | |
JP2002350218A (ja) | ナノ物質の質量計測方法及びその装置 | |
JP2000249712A (ja) | 電子装置の表面信号操作用融着プローブ及びその製造方法 | |
JP3973359B2 (ja) | 静電ナノピンセット及びこれを用いたナノマニピュレータ装置 | |
JP2002301700A (ja) | ナノチューブ探針の製造方法 | |
JP4351655B2 (ja) | ナノピンセットの操作方法 | |
JP2003231074A (ja) | ナノピンセットの操作方法 | |
KR100482172B1 (ko) | 나노핀셋 및 나노매니퓰레이터 | |
JP2002214112A (ja) | 走査型プローブ顕微鏡 | |
Bartenwerfer et al. | Directed nanorobot-based handling of single nanowires | |
Nakabayashi et al. | Inexpensive two-tip nanomanipulator for a SEM | |
JP4405333B2 (ja) | ナノグリッパ | |
JP2001021478A (ja) | 走査プローブ顕微鏡用探針、その製造法および描画装置 | |
Nakabayashi et al. | Low-cost nanomanipulator for in situ experiments in a SEM | |
KR20060013025A (ko) | 정전기적으로 구동되는 나노 집게 | |
JP4035203B2 (ja) | 微細加工方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 01800473.3 Country of ref document: CN |
|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): CN KR US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1020017013543 Country of ref document: KR |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 10009471 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2001912179 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 2001912179 Country of ref document: EP |