WO1997017829B1 - Dispositif d'essai de composants a tension variable - Google Patents

Dispositif d'essai de composants a tension variable

Info

Publication number
WO1997017829B1
WO1997017829B1 PCT/US1996/018515 US9618515W WO9717829B1 WO 1997017829 B1 WO1997017829 B1 WO 1997017829B1 US 9618515 W US9618515 W US 9618515W WO 9717829 B1 WO9717829 B1 WO 9717829B1
Authority
WO
WIPO (PCT)
Prior art keywords
component
current
potential
electrical
limiting
Prior art date
Application number
PCT/US1996/018515
Other languages
English (en)
Other versions
WO1997017829A1 (fr
Filing date
Publication date
Priority claimed from US08/559,547 external-priority patent/US5677634A/en
Application filed filed Critical
Priority to KR1019980703635A priority Critical patent/KR19990067608A/ko
Priority to JP9519150A priority patent/JP2000500576A/ja
Priority to EP96940527A priority patent/EP0861443A1/fr
Publication of WO1997017829A1 publication Critical patent/WO1997017829A1/fr
Publication of WO1997017829B1 publication Critical patent/WO1997017829B1/fr

Links

Abstract

On soumet à des essais simultanés une pluralité de composants de circuits électriques (22) dotés d'une capacité, par exemple des condensateurs céramiques, à l'intérieur d'une pluralité correspondante de voies d'essai. Ces composants sont mis sous tension par une source de tension variable (10) qui peut délivrer un potentiel électrique sélectionné parmi une large gamme de potentiels, allant d'un potentiel faible à un potentiel élevé. Le courant de charge qui permet à un composant d'accumuler une charge est régulé, par un régulateur de courant (16), de façon à présenter un débit linéaire sélectionné. Des capteurs de tension (28) et des capteurs de courant (18) mesurent respectivement les charges accumulées et le courant de fuite. Le capteur de courant (18) peut être sélectivement sensibilisé à une pluralité de courants de fuite appartenant à une gamme de courants prévus. De plus, chacun des potentiels sélectionnés peut être appliqué aux composants (22) en une seule étape ou peut l'être, sous forme de rampe, au cours d'un laps de temps donné. On peut utiliser un processeur pour exécuter au moins un processus d'essai sur les composants (22), ledit processeur étant couplé fonctionnellement aux éléments ci-dessus, de façon à les réguler et à recevoir des signaux d'entrée de ces éléments.
PCT/US1996/018515 1995-11-16 1996-11-18 Dispositif d'essai de composants a tension variable WO1997017829A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019980703635A KR19990067608A (ko) 1995-11-16 1996-11-18 가변전압 컴포넌트 검사장치
JP9519150A JP2000500576A (ja) 1995-11-16 1996-11-18 可変電圧素子テスト装置
EP96940527A EP0861443A1 (fr) 1995-11-16 1996-11-18 Dispositif d'essai de composants a tension variable

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/559,547 1995-11-16
US08/559,547 US5677634A (en) 1995-11-16 1995-11-16 Apparatus for stress testing capacitive components

Publications (2)

Publication Number Publication Date
WO1997017829A1 WO1997017829A1 (fr) 1997-05-22
WO1997017829B1 true WO1997017829B1 (fr) 1997-07-31

Family

ID=24234010

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1996/018515 WO1997017829A1 (fr) 1995-11-16 1996-11-18 Dispositif d'essai de composants a tension variable

Country Status (6)

Country Link
US (1) US5677634A (fr)
EP (1) EP0861443A1 (fr)
JP (1) JP2000500576A (fr)
KR (1) KR19990067608A (fr)
TW (1) TW305024B (fr)
WO (1) WO1997017829A1 (fr)

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US7295031B1 (en) 2006-07-12 2007-11-13 Agilent Technologies, Inc. Method for non-contact testing of marginal integrated circuit connections
KR100825762B1 (ko) * 2006-08-07 2008-04-29 한국전자통신연구원 금속-절연체 전이(ｍｉｔ) 소자의 불연속 ｍｉｔ를연속적으로 측정하는 회로 및 그 회로를 이용한 ｍｉｔ센서
US20080129306A1 (en) * 2006-11-30 2008-06-05 Electro Scientific Industries, Inc. Multi-Point, Multi-Parameter Data Acquisition For Multi-Layer Ceramic Capacitor Testing
US7443179B2 (en) * 2006-11-30 2008-10-28 Electro Scientific Industries, Inc. Zero motion contact actuation
US7683630B2 (en) * 2006-11-30 2010-03-23 Electro Scientific Industries, Inc. Self test, monitoring, and diagnostics in grouped circuitry modules
US8461849B1 (en) 2006-11-30 2013-06-11 Electro Scientific Industries, Inc. Multivariate predictive insulation resistance measurement
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