US7957458B2 - Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device - Google Patents

Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device Download PDF

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US7957458B2
US7957458B2 US11/378,407 US37840706A US7957458B2 US 7957458 B2 US7957458 B2 US 7957458B2 US 37840706 A US37840706 A US 37840706A US 7957458 B2 US7957458 B2 US 7957458B2
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signal
jitter
measuring
test
under
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US20060182170A1 (en
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Kiyotaka Ichiyama
Masahiro Ishida
Takahiro Yamaguchi
Mani Soma
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Advantest Corp
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H04B17/364—Delay profiles

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  • the present invention relates to a jitter measuring apparatus and a jitter measuring method for measuring timing jitter of a signal-under-test and a testing apparatus for testing a device-under-test.
  • a method for comparing phase of a signal-under-test with that of a signal generated by delaying the signal-under-test by one period is known as a method for measuring jitter of a signal-under-test (T. Yamaguchi, “A Real-Time Jitter Measurement Board for High Performance Computer and Communication System”, ITC2004).
  • a method for measuring jitter of a signal-under-test T. Yamaguchi, “A Real-Time Jitter Measurement Board for High Performance Computer and Communication System”, ITC2004.
  • the above method outputs voltage corresponding to the amount of the period jitter of each cycle by inputting the signal-under-test and the delayed signal-under-test to a phase comparator. Further, by integrating the voltage output by the phase comparator using an integrator and the like, it is possible to measure the timing jitter of the signal-under-test in real-time.
  • the conventional method for measuring jitter requires delaying a signal-under-test accurately. For example, in case of measuring period jitter of the signal-under-test, it is required to delay the signal-under-test by one period accurately. However, in case there is an error in the delay time, the period jitter amount detected by the phase comparator becomes larger than a true period jitter amount due to the error in delay. Further, the error in measurement is accumulated by the integrator and the timing jitter output by the integrator is saturated before long.
  • the conventional method for measuring jitter requires a delay circuit in order to generate an accurate delay time.
  • it is difficult to make a delay circuit with highly accurate delay time for the conventional method for measuring jitter it is difficult to measure the jitter of the signal-under-test precisely without being affected by the delay time error.
  • the conventional measuring method compares phase of a signal-under-test with that of a delayed signal.
  • period-jitter amplitude of the signal-under-test is larger than one period of the signal-under-test, sometimes phases are compared between edges which do not correspond to each other and thus the jitter cannot be measured accurately.
  • a jitter measuring apparatus for measuring timing jitter of a signal-under-test, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for estimating the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
  • the jitter measuring apparatus may further include an integrator for outputting a signal-for-measuring-jitter whose signal level increases by a predetermined increasing rate while the signal output by the pulse generator shows H logic and decreases by a predetermined decreasing rate while the signal output by the pulse generator shows L logic, and the jitter measuring sub-unit may estimate the timing jitter on the basis of the signal level which the signal-for-measuring-jitter shows at timing of each edge of the pulse signal.
  • the jitter measuring sub-unit may estimate the timing jitter on the basis of each extreme value of variation in the signal level of the signal-for-measuring-jitter.
  • the integrator may generate the signal-for-measuring-jitter by the increasing and decreasing rates so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level in case no timing jitter generated in the signal-under-test, and the jitter measuring sub-unit may estimate the timing jitter on the basis of a difference between each extreme value of the signal-for-measuring-jitter and the predetermined signal level.
  • the jitter measuring apparatus may further include a control section for controlling the increasing and decreasing rates on the basis of the pulse width of the pulse signal and an interval between the edges under test in case no timing jitter generated in the signal-under-test so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level in case no timing jitter generated in the signal-under-test.
  • the control section may control the increasing and decreasing rates on the basis of a difference between the extreme value of the signal-for-measuring-jitter when a predetermined time passes from the time when the signal-for-measuring-jitter begins to be generated and the predetermined signal level.
  • Each of the increasing and decreasing rates can be set within a predetermined variable range, and the control section may set the increasing rate so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level in case no timing jitter generated in the signal-under-test, and, in case the increasing rate cannot be set within the variable range, further control the decreasing rate to make the increasing rate be within the variable range.
  • the jitter measuring apparatus may further include a control section for controlling the pulse width on the basis of the increasing and decreasing rates of the integrator and an interval between the edges under test in case no timing jitter generated in the signal-under-test so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level in case no timing jitter generated in the signal-under-test.
  • the integrator may include a current source for generating a source current determining the increasing rate; a current sink for generating a sink current determining the decreasing rate; a capacitor for generating a voltage level of the signal-for-measuring-jitter by being charged and discharge by the current source and the current sink; and a charge and discharge control section for charging the capacitor on the basis of the source current while the pulse signal shows the H logic and discharging the capacitor on the basis of the sink current while the pulse signal shows the L logic.
  • the jitter measuring apparatus may further include a control section for controlling the values of the source current and the sink current on the basis of the pulse width and the interval of the edges under test in case no timing jitter generated in the signal-under-test so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level in case no timing jitter generated in the signal-under-test.
  • the pulse generator may output the pulse signal for every edge of the signal-under-test.
  • the pulse generator may output the pulse signal for a rising edge or a falling edge of the signal-under-test.
  • the jitter measuring sub-unit may include an averaging circuit for eliminating the predetermined high frequency components from the signal-for-measuring-jitter output by the integrator.
  • the jitter measuring sub-unit may include a sample-and-hold circuit for passing the signal-for-measuring-jitter while the signal output by the pulse generator shows the H level and holding the signal level of the signal-for-measuring-jitter while the signal output by the pulse generator shows the L level.
  • the jitter measuring sub-unit may include a sampling circuit for sampling the signal level of the signal-for-measuring-jitter according to the pulse signal output by the pulse generator.
  • a jitter measuring method for measuring timing jitter of a signal-under-test includes: a pulse generating step of outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring step of estimating the timing jitter on the basis of a duty ratio of each cycle of the signal output in the pulse generating step.
  • a testing apparatus for testing a device-under-test
  • the testing apparatus includes: a jitter measuring apparatus for estimating timing jitter of a signal-under-test output by the device-under-test; and a determining section for determining pass/fail of the device-under-test on the basis of the timing jitter estimated by the jitter measuring apparatus
  • the jitter measuring apparatus includes: a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for estimating the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
  • an electronic device for outputting an output signal according to a received input signal.
  • the electronic device includes an operation circuit for receiving the input signal and outputting the output signal and a jitter measurement apparatus for measuring timing jitter of the output signal outputted by the operation circuit.
  • the jitter measurement apparatus includes a pulse generator for outputting a pulse signal with a predetermined pulse width for an edge under test to measure the timing jitter of a signal-under-test and a jitter calculator for calculating the timing jitter based on a duty ratio for each cycle of the signal outputted by the pulse generator.
  • FIG. 1 is a block diagram showing an example of the configuration of a testing apparatus 100 according to an embodiment of the present invention.
  • FIG. 2 shows an example of a waveform of a signal-for-measuring-jitter output by an integrator 20 for no timing jitter generated in a signal-under-test.
  • FIG. 3 shows an example of a waveform of a signal-for-measuring-jitter output by the integrator 20 for timing jitter generated in a signal-under-test.
  • FIG. 4 is a block diagram showing an example of the configuration of a jitter measuring apparatus 40 .
  • FIG. 5 shows an example of a waveform output by an averaging circuit 32 .
  • FIG. 6 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • FIG. 7 shows an example of a waveform output by a sample-and-hold circuit 36 .
  • FIG. 8 describes voltage held by the sample-and-hold circuit 36 in case skew is included between a pulse signal and a signal-for-measuring-jitter input to the sample-and-hold circuit 36 .
  • FIG. 9 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • FIG. 10 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • FIG. 11 shows an example of a waveform of a signal-for-measuring-jitter in a state where the pulse width of a pulse signal, the rates of increase and decrease of the signal-for-measuring-jitter are not controlled.
  • FIG. 12 is a flowchart showing a method for measuring timing jitter of a signal-under-test.
  • FIG. 13 is a block diagram showing an example of the configuration of an electronic device 300 according to an embodiment of the present invention.
  • FIG. 1 is a block diagram showing an example of the configuration of a testing apparatus 100 according to an embodiment of the present invention.
  • the testing apparatus 100 determines a device-under-test (“DUT”) pass/fail on the basis of a signal-under-test output by the DUT and includes a jitter measuring apparatus 40 and a determining section 50 .
  • DUT device-under-test
  • the jitter measuring apparatus 40 measures timing jitter of the signal-under-test. Further, the determining section 50 determines the DUT pass/fail on the basis of the timing jitter measured by the jitter measuring apparatus 40 . For example, the determining section 50 determines the DUT pass/fail according to whether or not the amount of the timing jitter measured by the jitter measuring apparatus 40 is larger than a predetermined threshold value.
  • the jitter measuring apparatus 40 consists of a pulse generator 10 , an integrator 20 , and a jitter measuring sub-unit 30 .
  • the pulse generator 10 receives the signal-under-test and outputs a pulse of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test.
  • the pulse generator 10 outputs pulses of a predetermined pulse width for every edge of the signal-under-test.
  • the pulse generator 10 may include a delay circuit 12 and an exclusive OR circuit 14 as shown in FIG. 1 .
  • the delay circuit 12 delays the signal-under-test by a predetermined delay time and outputs the delayed signal.
  • the exclusive OR circuit 14 outputs an exclusive OR of the signal-under-test and the delayed signal output by the delay circuit 12 .
  • the delay circuit 12 may include constant delay time uniformly over a measurement period and thus an actual delay time may have an error compared with the predetermined setting of delay time.
  • the pulse generator 10 may output a pulse for either a rising edge or a falling edge of the signal-under-test. In this case, it is possible to easily measure a period jitter between the rising edges or the falling edges. Further, the pulse generator 10 has a circuit configuration different from the configuration shown in FIG. 1 . It can be easily realized that the pulse generator 10 generates a pulse for the rising edge or the falling edge of the signal-under-test by changing the circuit configuration of the pulse generator 10 . In the following, it will be described on the case that the pulse generator 10 generates a pulse for all the edges of the signal-under-test.
  • the jitter measuring sub-unit 30 estimates (or measures) the timing jitter in the signal-under-test on the basis of a duty ratio of each cycle of the signal output by the pulse generator 10 .
  • the jitter measuring sub-unit 30 estimates the timing jitter in the signal-under-test on the basis of the ratio of the time interval over which the signal level is a H level to the time interval over which the signal level is an L level.
  • the duty ratio of the signal output by the pulse generator 10 is constant for each cycle.
  • the duty ratio of the signal output by the pulse generator 10 is not constant.
  • the timing jitter of each edge may be measured by comparing the mean value of the duty ratio averaged over the entire cycles and the duty ratio for each cycle.
  • the jitter measuring sub-unit 30 estimates the timing jitter in the signal-under-test on the basis of results of the integrator 20 integrating the pulses.
  • the integrator 20 outputs a signal-for-measuring-jitter of a triangle wave generated by integrating the pulses output by the pulse generator 10 .
  • the integrator 20 according to the present example outputs signal-for-measuring-jitter whose signal level increases by a predetermined increasing rate while the signal output by the pulse generator 10 shows H logic and decreases by a predetermined decreasing rate while the signal output by the pulse generator 10 shows L logic.
  • the H logic means that the signal level of the signal output by the pulse generator 10 is either the H or L level.
  • the L logic means that its signal level is different from that of the H logic. In the following, let the H logic be a state where the signal level is the H level and the L logic a state where the signal level is the L level.
  • the integrator 20 consists of a current source 22 , a current sink 26 , a capacitor 28 , and a charge and discharge control section 24 .
  • the current source 22 generates a source current, which determines the increasing rate of the signal-for-measuring-jitter
  • the current sink 26 generates a sink current, which determines the decreasing rate of the signal-for-measuring-jitter.
  • the capacitor 28 is charged or discharged by the current source 22 or the current sink 26 and thus generates the signal-for-measuring-jitter.
  • the charge and discharge control section 24 charges the capacitor on the basis of the current generated by subtracting the sink current from the source current while the pulse signal shows the H logic and discharges the capacitor on the basis of the sink current while the pulse signal shows the L logic.
  • FIG. 2 shows an example of a waveform of the signal-for-measuring-jitter output by the integrator 20 for no timing jitter included in the signal-under-test.
  • the timing of each edge of the signal-under-test coincides with the half period of the signal-under-test (0, T, 2T, . . . ).
  • the pulse generator 10 generates a pulse signal of the predetermined pulse width for each edge.
  • the duty ratio of each cycle of the signal output by the pulse generator 10 is constant.
  • the integrator 20 outputs the signal-for-measuring-jitter of a triangle wave, as described above. In case no timing jitter generated in the signal-under-test, the integrator 20 generates the signal-for-measuring-jitter showing a rate of increase or decrease so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level.
  • each of the local maximum value and the local minimum value in the signal-for-measuring-jitter shows a constant level.
  • FIG. 3 shows an example of a waveform of a signal-for-measuring-jitter output by the integrator 20 for timing jitter included in a signal-under-test.
  • the timing jitter included in the signal-under-test the timing of each edge of the signal-under-test does not coincide with the half period of the signal-under-test (0, T, 2T, . . . ) and the duty ratio of each cycle of the signal output by the pulse generator 10 is not constant.
  • extreme values of the signal-for-measuring-jitter output by the integrator 20 do not become a predetermined value.
  • the extreme values in signal-level variation of the signal-for-measuring-jitter deviate from a predetermined value by ( ⁇ V 1 , . . . , ⁇ V 3 , . . . ), which is obtained by multiplying the amount of jitter associated with the edge of the signal-under-test corresponding to the extreme value by the decreasing rate of the signal-for-measuring-jitter.
  • the jitter measuring sub-unit 30 may extract the timing jitter on the basis of difference between a predetermined signal level and each extreme value in the signal-for-measuring-jitter which shows the edge timing of the pulse signal.
  • the decreasing rate a 2 of the signal-for-measuring-jitter output by the integrator 20 is constant.
  • a downward inclined side of the signal-for-measuring-jitter is preferably a straight line.
  • the increasing rate a1 of the signal-for-measuring-jitter output by the integrator 20 may not be constant. That is, the signal-for-measuring-jitter is only required to show constant increase in signal level during the time interval W over which the pulse signal is the H logic.
  • the jitter measuring apparatus of the present example it is possible to easily extract the timing jitter of the signal-under-test. Further, even in case an error compared with the predetermined setting of delay time included in the delay circuit 12 , it is possible to measure the timing jitter of the signal-under-test without being affected by the error if the delay circuit 12 includes a constant delay time.
  • the configuration of the integrator 20 is not limited to the configuration shown in FIG. 1 .
  • the integrator 20 may input a pulse signal to a positive input terminal of an operational amplifier via a resistor and apply a biased voltage to a negative input terminal, and an output terminal of the operational amplifier may be connected with the positive input terminal via a capacitor.
  • This kind of integrating circuit can also generate a signal-for-measuring-jitter similarly. In this case, the rates of increase and decrease of the signal-for-measuring-jitter can be controlled by the biased voltage applied to the negative input terminal of the operational amplifier.
  • the jitter measuring sub-unit 30 may calculate period jitter of a signal-under-test by estimating difference sequence from timing jitters measured in time sequence. For example, it is possible to estimate period jitter of a signal-under-test by estimating each difference between timing jitters which are adjacent in time sequence.
  • FIG. 4 is a block diagram showing an example of the configuration of the jitter measuring apparatus 40 .
  • the jitter measuring apparatus 40 includes an averaging circuit 32 and a calculating unit 34 in the jitter measuring sub-unit 30 .
  • the averaging circuit 32 eliminates the predetermined high-frequency components from a signal-for-measuring-jitter.
  • the averaging circuit 32 may output a moving average value of timing jitter of a signal-for-measuring-jitter by averaging the signal-for-measuring-jitter over the time.
  • the averaging circuit 32 may output a moving average value of timing jitter by removing a component of a signal-for-measuring-jitter in case no timing jitter included in a signal-under-test from a signal-for-measuring-jitter output by the integrator 20 .
  • the averaging circuit 32 may realize the above function, for example, by using a low-pass filter.
  • FIG. 5 shows an example of a waveform output by the averaging circuit 32 .
  • a broken line shows a waveform of a signal-for-measuring-jitter output by the integrator 20 and a solid line shows a waveform output by the averaging circuit 32 .
  • the calculating unit 34 may estimate an rms value of the timing jitter and the like on the basis of the waveform.
  • FIG. 6 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • the jitter measuring apparatus includes a sample-and-hold circuit 36 and a calculating unit 34 in the jitter measuring sub-unit.
  • the sample-and-hold circuit 36 passes the signal-for-measuring-jitter to input to the calculating unit 34 while the signal output by the pulse generator 10 is the H logic, and holds the signal level of the signal-for-measuring-jitter to input to the calculating unit 34 while the signal output by the pulse generator 10 is the L logic.
  • FIG. 7 shows an example of a waveform output by the sample-and-hold circuit 36 .
  • a broken line shows a waveform of the signal-for-measuring-jitter output by the integrator 20 and the solid line shows a waveform output by the sample-and-hold circuit 36 .
  • the sample-and-hold circuit 36 holds the voltage of an extreme value of the signal-for-measuring-jitter. Since the voltage of the extreme value is in a linear relation with corresponding timing jitter of an edge of the signal-under-test, it is possible to estimate the timing jitter from the voltage of the extreme value. Further, since the voltage of the extreme value is held and input to the calculating unit 34 , the calculating unit 34 can easily detect the voltage of the extreme value.
  • FIG. 8 illustrates voltage held by the sample-and-hold-circuit 36 in case skew is included between the pulse signal and the signal-for-measuring-jitter input to the sample-and-hold circuit 36 .
  • the sample-and-hold circuit 36 holds each voltage of the signal-for-measuring-jitter, whose extreme values are shifted by timing ⁇ due to the skew.
  • error associated with the held voltage due to the timing offset is a constant value because of the decreasing rate of the signal-for-measuring-jitter. Therefore, the error does not affect on the linear relationship between the timing jitter of the signal-under-test and a measured value of the timing jitter.
  • the calculating unit 34 can extract the timing jitter of the signal-under-test easily and accurately.
  • FIG. 9 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • the jitter measuring apparatus 40 includes a sampling circuit 38 and a calculating unit 34 in the jitter measuring sub-unit 30 .
  • the sampling circuit 38 samples the signal level of the signal-for-measuring-jitter when the pulse signal is output by the pulse generator 10 .
  • the sampling circuit 38 may be an analog-to-digital converter for sampling the signal-for-measuring-jitter, for example, at timing of a rising edge of the pulse signal and inputting the value of the sampled voltage to the calculating unit 34 .
  • the voltage value input to the calculating unit 34 by the sampling circuit 38 is similar to the voltage value input to the calculating unit 34 by the sample-and-hold circuit 36 explained in FIG. 6 .
  • the calculating unit 34 can extract the timing jitter of the signal-under-test easily and accurately.
  • FIG. 10 is a block diagram showing another example of the configuration of the jitter measuring apparatus 40 .
  • the jitter measuring apparatus 40 of the present example further includes a control section 60 in addition to the configuration of the jitter measuring apparatus 40 explained in FIG. 1 .
  • the control section 60 controls pulse width of the pulse signal output by the pulse generator 10 , the increasing and decreasing rates of the signal-for-measuring-jitter output by the integrator 20 so that each extreme value of the signal-for-measuring-jitter becomes a predetermined signal level for no timing jitter included in the signal-under-test.
  • the control section 60 controls the increasing and decreasing rates of the signal-for-measuring-jitter on the basis of the pulse width and interval between edges-under-test in case no timing jitter included in the signal-under-test so that each extreme value of the signal-for-measuring-jitter becomes a predetermined signal level in case no timing jitter included in the signal-under-test.
  • the pulse width of the pulse signal may be measured by the control section 60 or estimated on the basis of the delay of the delay circuit 12 . Further, the interval between edges-under-test in case no timing jitter included in the signal-under-test may be applied to the control section 60 or estimated by the control section 60 by measuring an average period of the signal-under-test. By estimating the average period of the signal-under-test over a sufficiently long time interval, it is possible to reduce the influence of the timing jitter of the signal-under-test and estimate the average period accurately. Further, the interval between edges-under-test can be easily estimated from the average period.
  • the control section 60 controls the increasing and decreasing rates of the signal-for measuring-jitter on the basis of the estimated value so that the increasing and decreasing rates satisfy the equation (1). It is possible to adjust the increasing and decreasing rates, for example, by controlling the values of source current and sink current of the integrator 20 .
  • control section 60 controls the increasing and decreasing rates of the signal-for-measuring-jitter
  • each of the increasing and decreasing rates of the signal-for-measuring-jitter can be set within a predetermined variable range.
  • the control section 60 may further control the decreasing rate and thus make the increasing rate be within the variable range.
  • the control section 60 controls pulse width of the pulse signal output by the pulse generator 10 on the basis of the interval between edges-under-test and the given increasing and decreasing rates so that each extreme value of the signal-for-measuring-jitter is a predetermined signal level for no timing jitter included in the signal-under-test.
  • the increasing and decreasing rates of the signal-for-measuring-jitter can be easily estimated, for example, from the values of the source current and the sink current and capacity of the capacitor 28 .
  • the interval of edges-under-test can be estimated as described above.
  • the control section 60 controls the pulse width W so that the pulse width W satisfies the equation (1) on the basis the above estimated values.
  • the pulse width W can be easily adjusted, for example, by controlling the delay of the delay circuit 12 of the pulse generator 10 .
  • control section 60 may control the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter on the basis of the level difference between the extreme value of the signal-for-measuring-jitter and a predetermined signal level estimated by the jitter measuring sub-unit 30 without providing the pulse generator 10 with the signal-under-test for a sufficiently long time.
  • FIG. 11 shows an example of a waveform of the signal-for-measuring-jitter in a state where the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter are not controlled.
  • the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter are not controlled, the extreme value of the signal-for-measuring-jitter does not coincide with a predetermined signal level and the difference between the extreme value and the predetermined signal level is accumulated as shown in FIG. 11 .
  • the difference in level is caused by errors in setting the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter. Then, it is possible to estimate the difference in level generated per a cycle of the signal-for-measuring-jitter by dividing the difference in level by the number of cycles of the signal-for-measuring-jitter within the measurement period.
  • the control section 60 may determine values to which the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter are to be set from the difference in level generated per a cycle.
  • control section 60 may provide the pulse generator 10 with the signal-under-test until the signal level of the extreme vale of the signal-for-measuring-jitter is saturated. Since the signal level of the signal-for-measuring-jitter is generated by the capacitor 28 , the signal level of the signal-for-measuring-jitter is saturated according to the capacitance of the capacitor 28 .
  • the control section 60 may determine values to which the pulse width of the pulse signal, the increasing and decreasing rates of the signal-for-measuring-jitter are to be set on the basis of the difference in level between the extreme value of the signal-for-measuring-jitter and the predetermined signal level when the signal level of the signal-for-measuring-jitter is saturated and the time taken for the signal level of the signal-for-measuring-jitter to be saturated.
  • FIG. 12 is a flowchart showing a method for measuring timing jitter of a signal-under-test.
  • the method of measurement performs measurement of the timing jitter in the same way as the jitter measuring apparatus described in FIGS. 1 to 11 .
  • a pulse generating step S 200 a pulse of a predetermined pulse width is output for an edge of the signal-under-test, whose timing jitter is under test.
  • the detailed operation of the step S 200 is similar to that of the pulse generator 10 described in FIGS. 1 to 11 .
  • a jitter estimating step S 202 the pulse output in the pulse generating step S 200 is integrated and the timing jitter is extracted on the basis of the duty ratio of each cycle of the pulse generated in the pulse generating step S 200 .
  • the detailed operation of the step S 202 is similar with that of the integrator 20 , the jitter measuring sub-unit 30 , and the control section 60 described with respect to FIGS. 1 to 11 .
  • FIG. 13 is a block diagram showing an example of the configuration of an electronic device 300 according to an embodiment of the present invention.
  • the electronic device 300 includes an operation circuit 302 and a jitter measurement apparatus 40 .
  • the operation circuit 302 and the jitter measurement apparatus 40 may be provided on one semiconductor chip.
  • the operation circuit 302 may be a semiconductor circuit, which outputs an output signal according to the inputted input signal.
  • the jitter measurement apparatus 40 measures timing jitter of the output signal outputted by the operation circuit 302 .
  • the jitter measurement apparatus 40 may output outside the measurement result.
  • the electronic device 300 may include the test apparatus 100 instead of the jitter measurement apparatus 400 .
  • the test apparatus 100 determines pass/fail of the operation circuit based on the timing jitter of the output signal from the operation circuit 302 .
  • the test apparatus 100 may output outside the result.
  • the jitter measurement apparatus 40 may measure timing jitter of a signal generated inside the operation circuit 302 .
  • timing jitter of a signal-under-test easily and accurately. Further, even in delay error is generated in a delay circuit, it is possible to estimate timing jitter accurately.

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