US6509804B2 - Low frequency quartz oscillator device with improved thermal characteristics - Google Patents

Low frequency quartz oscillator device with improved thermal characteristics Download PDF

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US6509804B2
US6509804B2 US09/734,474 US73447400A US6509804B2 US 6509804 B2 US6509804 B2 US 6509804B2 US 73447400 A US73447400 A US 73447400A US 6509804 B2 US6509804 B2 US 6509804B2
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resonator
frequency
mode
fundamental
oscillator device
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US09/734,474
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US20010004226A1 (en
Inventor
Silvio Dalla Piazza
Pinchas Novac
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ETA SA FABRIQUES D'EBAUCHES AND EM MICROELECTRONIC-MARIN SA
ETA SA Manufacture Horlogere Suisse
EM Microelectronic Marin SA
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EM Microelectronic Marin SA
Eta SA Fabriques dEbauches
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
    • H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
    • H03H9/21—Crystal tuning forks
    • H03H9/215—Crystal tuning forks consisting of quartz
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2202/00—Aspects of oscillators relating to reduction of undesired oscillations
    • H03B2202/01—Reduction of undesired oscillations originated from distortion in one of the circuit elements of the oscillator
    • H03B2202/017—Reduction of undesired oscillations originated from distortion in one of the circuit elements of the oscillator the circuit element being a frequency determining element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0307—Stabilisation of output, e.g. using crystal

Definitions

  • the present invention generally concerns a low frequency quartz oscillator device.
  • quartz oscillator device means an oscillator device including a quartz resonator associated with oscillating means, or an electronic circuit for maintaining the vibrations of the resonator.
  • quartz oscillator devices Those skilled in the art know various types of quartz oscillator devices. Those skilled in the art know, in particular, oscillator devices using a quartz resonator arranged to vibrate according to a flexural vibration mode. Such resonators typically have parabolic type thermal characteristics and are relatively sensitive to temperature variations.
  • oscillator devices cannot be used in cases where it is necessary to have an oscillation signal having not only a temperature stable frequency but also a frequency spectrum including only a low number of spectrum lines.
  • a signal having these properties is for example necessary in telecommunications to allow a synchronisation operation.
  • oscillators including a so-called AT cut quartz resonator with cubic type thermal characteristics and whose frequency is very stable as a function of the temperature.
  • this frequency is quite high, of the order of several MHz. Consequently, in order to use such an oscillator device to supply a low frequency oscillation signal, the oscillator needs to be fitted with a frequency divider circuit, which complicates and increases the cost of the device.
  • the electric power consumed by the frequency divider circuit is relatively significant because of the high frequency of the signal which it receives at its input, which proves to be a serious drawback when the power has to be supplied by an autonomous power source of small dimensions such as a wristwatch battery.
  • a general object of the present invention is thus to propose a quartz oscillator device which overcomes the aforementioned drawbacks, i.e. an oscillator device which generates an oscillation signal having good thermal characteristics and good spectral purity and which preferably consumes little power.
  • the present invention therefore concerns a quartz oscillator the features of which are listed in claim 1 .
  • the present invention thus proposes, firstly, using a torsional type quartz resonator, i.e. a resonator arranged to vibrate according to a torsional vibration mode.
  • this resonator is, in particular, a resonator of the type described in the article by Messrs. Roger Bourquin and Philippe Truchot entitled “Barreaux de quartz vibrant en mode de torsion, Application aux capteurs”, 6th European Chronometry Congress, Bienne, 17-18 October 1996, which is incorporated herein by reference.
  • FIG. 1 annexed hereto shows a non limiting example of such a torsional type resonator, globally indicated by the numerical reference 1 .
  • This resonator 1 has the shape of a tuning fork obtained by chemical etching or mechanical machining of a quartz plate along a determined cutting angle so that the branches of the resonator are oriented in the crystallographic plane YZ of the quartz crystal at a determined angle ⁇ as is shown clearly in FIG. 1 .
  • This type of resonator has the advantage of better thermal characteristics compared to conventional flexural vibrating resonators.
  • the thermal characteristics of this torsional vibrating resonator are determined by the cutting angle and by the thickness over width ratio (t/w) of the arm.
  • a torsional ⁇ vibrating tuning fork resonator made in accordance with the teaching of the aforementioned article allows better thermal stability to be obtained, of the order of a factor of 3, compared to a conventional flexural vibrating tuning fork resonator.
  • this resonator is characterised by two cutting angles and requires a more complex electrode structure.
  • the torsional vibrating resonator described in the aforementioned article by Messrs. Bourquin and Truchot thus constitutes a more advantageous solution.
  • a drawback of the torsional vibrating resonator described in the first aforementioned article resides in the fact that, in addition to the desired fundamental torsional vibrating mode, it has undesired flexural vibrating modes.
  • this type of resonator has, in particular, a fundamental flexural vibrating mode at a substantially lower frequency than the frequency of the desired torsional vibrating mode. Consequently, if a resonator of this type is associated with a conventional electronic maintenance circuit, the assembly will in practice oscillate according to this fundamental flexural mode and not according to the desired fundamental torsional mode.
  • the present invention thus also proposes to answer this drawback of the aforementioned torsional vibrating resonator, namely to provide an electronic maintenance circuit for the resonator vibrations assuring that the resonator actually vibrates according to the desired fundamental torsional vibrating mode.
  • the geometry of the resonator is selected so that the desired fundamental torsional vibrating mode is located substantially close to 393,216 kHz, i.e. 12 times the frequency of 32,768 kHz which is the typically frequency of a quartz resonator intended for horological applications.
  • FIG. 1 which has already been mentioned, shows an example of a torsional vibrating quartz resonator used within the scope of the present invention and taking the form of a tuning fork whose arms are oriented in crystallographic plane YZ;
  • FIG. 2 shows, in the case of a specific embodiment of the resonator of FIG. 1, the evolution of the frequency of three of its main vibrating modes as a function of the length of the resonator arm, these three vibrating modes being the fundamental torsional vibrating mode; the fundamental flexural vibrating mode; and the first flexural overtone;
  • FIG. 3 a shows schematically an inverter oscillator device used within the scope of the present invention
  • FIG. 3 b shows an example embodiment of the oscillator device of FIG. 3 a including a CMOS inverter
  • FIG. 4 shows an equivalent electric diagram of a quartz resonator
  • FIG. 5 is a graph illustrating the limit oscillation conditions g m,min and g m,max for each of the three main considered vibrating modes of the resonator used within the scope of the present invention as a function of the value of the feedback resistor R F of the electronic maintenance circuit.
  • the torsional vibrating quartz resonator is advantageously made in the form of a tuning fork obtained by mechanical machining or chemical etching of a quartz plate at a determined cutting angle. It will be noted that this particular embodiment is in no way limiting and that other geometries of the resonator can be envisaged. This resonator can thus alternatively be made in the form of a single bar or in the form of two bars mounted symmetrically and opposite to each other around a central fitting.
  • the tuning fork resonator of FIG. 1 includes two arms 1 a and 1 b of rectangular cross-section (thickness t, width w) and of length (L) oriented in the crystallographic plane YZ.
  • FIG. 1 also illustrates a referential (x 1 ; x 2 ; x 3 ) associated with resonator 1 so that length L is defined along the axis x 2 and the thickness t is defined along axis x 3 .
  • this referential (x 1 ; x 2 ; x 3 ) associated with resonator 1 is oriented with respect to crystallographic axes X, Y and Z so that axis x 1 is identical to crystallographic axis X, and axes x 2 and x 3 each form a determined angle ⁇ with respect to crystallographic axes Y and Z respectively.
  • Resonator 1 used within the scope of the present invention thus has a single cutting angle defined by a rotation at a determined angle ⁇ about crystallographic axis X of the quartz crystal.
  • the thermal characteristics of the resonator are determined by the angle of orientation of the resonator (angle ⁇ ) and by the thickness (t) over width (w) ratio, or cross-section ratio, of the resonator arm.
  • angle ⁇ the angle of orientation of the resonator
  • w width
  • cross-section ratio the thickness of the resonator arm
  • the angle of orientation ⁇ and the cross-section ratio are selected so that the first order thermal characteristics or linear coefficient is substantially zero. In practice, this result may for example be obtained, with an angle of orientation ⁇ of +32° and a cross-section ratio of the order of 0.6.
  • this resonator in addition to the desired fundamental torsional vibrating mode, also designated hereinafter the “fundamental torsional mode”, this resonator includes undesired flexural vibrating modes.
  • this resonator includes a first undesired mode, namely a fundamental flexural vibrating mode, also designated hereinafter by the term “fundamental flexural mode” located at a substantially lower frequency than the frequency of the desired fundamental torsional mode.
  • This resonator further includes another undesired vibrating mode which should also be considered, namely another flexural vibrating mode, designated hereinafter by the term “first flexural overtone”, located at a relatively close frequency to the frequency of the desired fundamental torsional mode.
  • the dimensions of the resonator namely the dimensions t, w and L of the resonator arm, are selected so that the desired fundamental torsional mode is located between the aforementioned fundamental flexural mode and the first flexural overtone mode. As will be seen in more detail hereinafter, this is preferable to ensure proper operation of the oscillator device according to the present invention.
  • the curve marked “a” illustrates the evolution of the frequency of the fundamental flexural mode
  • the curve marked “b” illustrates the evolution of the frequency of the fundamental torsional mode
  • the curve marked “c” illustrates the evolution of the frequency of the first flexural overtone.
  • the geometry of the tuning fork resonator of FIG. 1 is further selected so that the desired fundamental torsional mode is located substantially in proximity to 393,216 kHz, i.e. 12 times the frequency of 32,768 kHz which is the typical frequency of a quartz resonator intended for horological applications.
  • this result is for example obtained for an arm length L of approximately 1.68 mm.
  • the tuning fork resonator thus includes a desired fundamental torsional mode located substantially at 393,216 kHz.
  • this resonator further includes an undesired fundamental flexural mode, whose frequency is located substantially in proximity to 74 kHz, and a first flexural overtone, which is also undesired, whose frequency is located substantially in proximity to 435 kHz.
  • the maintenance circuits of the vibrations of the resonator are typically designed so that the oscillator device oscillates according to the first vibrating mode of the resonator, i.e. commonly the vibrating mode with the lowest frequency.
  • the resonator has a first vibrating mode, namely a fundamental flexural vibrating mode, which is an undesired mode.
  • FIG. 3 a shows schematically an oscillator device 10 including an inverting amplifier 2 having a transconductance value g m , a resonator 1 , connected in the feedback path of inverter 2 , a first load capacitor C 1 connected at input A of inverter 2 , and a second load capacitor C 2 connected at output B of inverter 2 .
  • Oscillator device 10 further includes a feedback resistor R F connected across input A and output B. Typically the value of this feedback resistor R F is selected to be very high and its influence on the operation of the oscillator device is generally ignored.
  • the oscillator device of FIG. 3 a may further include an additional resistor R 0 arranged across output B of inverter 2 and load capacitor C 2 .
  • This resistor is intended to ensure an improvement in the stability of the oscillator device.
  • inverting amplifier 2 is for example a CMOS inverter including a first p-type transistor 2 a and a second n-type transistor 2 b which are connected drain to drain across an earth potential V SS and a power supply potential V DD and whose gate terminals are connected to each other.
  • the transconductance g m of inverting amplifier 2 is equal to the sum of the transconductances of p-type and n-type transistors 2 a and 2 b.
  • resonator 1 can be represented by its equivalent electric circuit as illustrated in FIG. 4 .
  • resonator 1 includes a series branch including a large inductor L X , a small capacitor C X and a series resistor R X , and, connected in parallel with the series branch, a so-called static capacitor C X0 .
  • the equivalent circuit of FIG. 4 is valid close to a given vibrating mode of the resonator and that a specific series branch L X , C X , R X corresponds to each given vibrating mode of the resonator.
  • inductor L X and capacitor C X are representative of the dynamic behaviour of the vibrating mode of the resonator being considered and that series resistor R X represents the resonator losses. It will also be noted that the value of static capacitor C X0 is typically much higher than the value of capacitor C X of the series branch. It can thus be defined that the (angular) frequency of the oscillations of the device is substantially equal to: ⁇ ⁇ 1 L x ⁇ C x ( 1 )
  • ⁇ is the (angular) resonant frequency for the vibrating mode concerned and C 0 is the value of the capacitor present in parallel with resonator 1 and includes in particular the value of static capacitor C X0 of the resonator.
  • C 0 is estimated in this particular case to be 1 pF and the values of capacitors C 1 and C 2 are dimensioned so as to have values of 12 pF and 28 pF respectively.
  • transconductance g m As a complement to condition (2) expressed hereinabove, a second condition must be fulfilled by transconductance g m so that oscillation of the oscillator device occurs.
  • the value of the maximum transconductance g m,max is typically higher than the value of the critical transconductance g m,min .
  • the conditions for oscillation of the device may be summarised as follows: g m , min ⁇ g m ⁇ g m , max ( 4 )
  • condition (4) expressed above is simultaneously fulfilled for several vibrating modes, one knows that the device will only oscillate in practice according to the vibrating mode having the lowest critical transconductance g m,min .
  • the desired vibrating mode of the resonator namely the fundamental torsional vibrating mode
  • the desired vibrating mode of the resonator is located at a frequency (393,216 kHz) substantially higher than the frequency of the undesired fundamental flexural vibrating mode (at 74 kHz).
  • Critical transconductance g m,min of the undesired fundamental flexural mode is thus typically less than the critical transconductance g m,min of the desired fundamental torsional mode. Consequently, the device will typically only oscillate according to the undesired fundamental flexural mode.
  • critical transconductance g m,min decreases very substantially when the value of feedback resistor R F increases to quickly reach a substantially constant value determined by the characteristics of the resonator and load capacitors C 1 and C 2 .
  • values of feedback resistor R F such as: R F >> 1 ⁇ 2 ⁇ R x ⁇ ( C 0 + C 1 ⁇ C 2 C 1 + C 2 ) 2 ( 5 )
  • critical transconductance g m,min essentially depends, for each vibrating mode considered, on the factor ⁇ 2 R X . It is thus essentially the characteristics of the resonator, namely the frequency of the mode considered and the value of its series resistor which determine critical transconductance value g m,min .
  • maximum transconductance g m,max substantially decreases when the value of feedback resistor R F decreases to reach a value substantially proportional to the value of this feedback resistor R F .
  • values of feedback resistor R F such as: R F ⁇ ⁇ 1 ⁇ 2 ⁇ R X ⁇ C 0 2 ( 7 )
  • maximum transconductance value g m,max essentially depends, for each vibrating mode considered, on the factor ⁇ 2 R F . It is thus essentially the frequency of the mode considered and the value of feedback resistor R F which determine maximum transconductance g m,max . It can thus be seen that the lower the frequency of the vibrating mode considered, the lower maximum transconductance g m,max .
  • the particular embodiment of the resonator, mentioned hereinabove, used within the scope of the present invention namely the resonator having a fundamental flexural mode located close to 74 kHz, a fundamental torsional mode located substantially at 393,216 kHz and a first flexural overtone located close to 435 kHz.
  • the value of series resistors R X are estimated for each of these modes at a mean of approximately 56 k ⁇ , 8 k ⁇ and 23 k ⁇ respectively.
  • FIG. 5 shows a graph of the evolution of critical transconductance g m,min and maximum transconductance g m,max as a function of the value of feedback resistor R F .
  • the curves a 1 , b 1 and c 1 thus represent the evolution of critical transconductance g m,min for each of the aforementioned vibrating modes, namely respectively the fundamental flexural mode, the fundamental torsional mode and the first flexural overtone.
  • curves a 2 , b 2 and c 2 represent the evolution of maximum transconductance g m,max for each of the three vibrating modes considered.
  • transconductance g m of the device must first satisfy the general condition (4) set out above, i.e. in the particular case taken by way of example: g m , min 393 ⁇ ⁇ kHz ⁇ g m ⁇ g m , max 393 ⁇ ⁇ kHz ( 9 )
  • transconductance g m of the device must also be higher than maximum transconductance g m,max of the undesired fundamental flexural mode, i.e. in the particular case taken by way of example: g m , max 74 ⁇ ⁇ kHz ⁇ g m ( 10 )
  • critical transconductance g m,min of the desired fundamental torsional mode is less than critical transconductance g m,min of the first flexural overtone. Otherwise, the device would oscillate according to the first flexural overtone mode.
  • this condition can be expressed as follows: g m , min 393 ⁇ ⁇ kHz ⁇ g m , min 435 ⁇ ⁇ kHz ( 11 )
  • FIG. 5 shows, in grey zone A, all the transconductance values g m satisfying conditions (9) and (10) above.
  • Condition (11) is satisfied by a suitable selection of the resonator characteristics.
  • the resonator is preferably designed so that the frequency of the desired fundamental torsional mode is located below the frequency of the undesired first flexural overtone. Very particular attention should thus be paid to making the resonator and to ensuring that the values of series resistor R X of these vibrating modes are such that the equation (11) above remains satisfied.
  • an oscillator device is thus arranged to oscillate according to the fundamental torsional vibrating mode of the quartz resonator. Consequently, the temperature characteristics of the oscillator device according to the present invention are substantially improved with respect to a conventional oscillator device using a flexural vibrating quartz resonator.
  • the oscillator device may be provided with a divider circuit connected at the output B of the maintenance circuit.
  • this signal may advantageously be applied at the input of a divider-by-twelve circuit so as to derive an oscillation signal having a frequency substantially equal to 32,768 kHz, this signal being particularly useful for horological applications.
  • the resonator will be made so that the desired fundamental torsional vibrating mode is located at a frequency equal to a multiple of 32,768 kHz.
  • the oscillator device according to the present invention will also advantageously be made in the form of a single compact component including for example a ceramic, metal or plastic case in which the quartz resonator and the electronic vibration maintenance circuit are arranged.

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
US09/734,474 1999-12-21 2000-12-11 Low frequency quartz oscillator device with improved thermal characteristics Expired - Fee Related US6509804B2 (en)

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US (1) US6509804B2 (fr)
JP (1) JP2001203534A (fr)
KR (1) KR100717493B1 (fr)
CN (1) CN1183670C (fr)
CA (1) CA2327576C (fr)
HK (1) HK1038993A1 (fr)
TW (1) TW472438B (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060022764A1 (en) * 2004-01-09 2006-02-02 Aaron Partridge Frequency and/or phase compensated microelectromechanical oscillator
US20060255882A1 (en) * 2002-03-06 2006-11-16 Hirofumi Kawashima Electronic apparatus
US20140197849A1 (en) * 2013-01-17 2014-07-17 Em Microelectronic-Marin Sa Control system and method for sensor management

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7365478B2 (en) * 2003-12-17 2008-04-29 Piedek Technical Laboratory Piezoelectric crystal resonator, piezoelectric crystal unit having the crystal resonator and electronic apparatus having the crystal resonator
US7694734B2 (en) * 2005-10-31 2010-04-13 Baker Hughes Incorporated Method and apparatus for insulating a resonator downhole
FR2932333B1 (fr) * 2008-06-04 2010-08-13 Centre Nat Rech Scient Resonateur hbar a stabilite en temperature elevee
JP5936396B2 (ja) * 2012-03-16 2016-06-22 シチズンファインデバイス株式会社 水晶振動子
JP2016187153A (ja) * 2015-03-27 2016-10-27 セイコーエプソン株式会社 発振器、電子機器及び移動体

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US4320320A (en) 1978-12-01 1982-03-16 Kabushiki Kaisha Suwa Seikosha Coupled mode tuning fork type quartz crystal vibrator
US4437773A (en) * 1980-08-29 1984-03-20 Asulab S.A. Quartz thermometer
US4498025A (en) 1980-12-12 1985-02-05 Seiko Instruments & Electronics Ltd. Tuning fork
US4503353A (en) * 1982-07-14 1985-03-05 Centre Electronique Horloger S.A. Cut angles for tuning fork type quartz resonators
EP0657994A1 (fr) 1993-12-07 1995-06-14 Nec Corporation Circuit oscillateur oscillant également avec une tension d'alimentation basse

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JPS5575318A (en) * 1978-12-04 1980-06-06 Seiko Epson Corp Tuning fork type oscillator
JPS5853213A (ja) * 1981-09-25 1983-03-29 Seiko Instr & Electronics Ltd 音又型水晶振動子
JPS63219208A (ja) * 1987-03-06 1988-09-12 Mitsubishi Electric Corp 発振回路
JP3109676B2 (ja) * 1990-10-31 2000-11-20 株式会社沖マイクロデザイン 発振装置
JP3536665B2 (ja) * 1998-05-06 2004-06-14 セイコーエプソン株式会社 電圧制御圧電発振器調整システムおよび電圧制御圧電発振器調整方法
JP4401523B2 (ja) * 2000-03-09 2010-01-20 旭化成エレクトロニクス株式会社 水晶発振器

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GB2042796A (en) 1978-12-01 1980-09-24 Suwa Seikosha Kk Piezo-electric vibrator
US4320320A (en) 1978-12-01 1982-03-16 Kabushiki Kaisha Suwa Seikosha Coupled mode tuning fork type quartz crystal vibrator
US4437773A (en) * 1980-08-29 1984-03-20 Asulab S.A. Quartz thermometer
US4498025A (en) 1980-12-12 1985-02-05 Seiko Instruments & Electronics Ltd. Tuning fork
US4503353A (en) * 1982-07-14 1985-03-05 Centre Electronique Horloger S.A. Cut angles for tuning fork type quartz resonators
EP0657994A1 (fr) 1993-12-07 1995-06-14 Nec Corporation Circuit oscillateur oscillant également avec une tension d'alimentation basse

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060255882A1 (en) * 2002-03-06 2006-11-16 Hirofumi Kawashima Electronic apparatus
US20100308699A1 (en) * 2002-03-06 2010-12-09 Hirofumi Kawashima Electronic apparatus
US8127427B2 (en) * 2002-03-06 2012-03-06 Piedek Technical Laboratory Quartz crystal unit, quartz crystal oscillator having quartz crystal unit, and electronic apparatus having quartz crystal oscillator
US20060022764A1 (en) * 2004-01-09 2006-02-02 Aaron Partridge Frequency and/or phase compensated microelectromechanical oscillator
US20060033589A1 (en) * 2004-01-09 2006-02-16 Aaron Partridge Frequency and/or phase compensated microelectromechanical oscillator
US7221230B2 (en) 2004-01-09 2007-05-22 Robert Bosch Gmbh Frequency and/or phase compensated microelectromechanical oscillator
US7224236B2 (en) 2004-01-09 2007-05-29 Robert Bosch Gmbh Frequency and/or phase compensated microelectromechanical oscillator
US20140197849A1 (en) * 2013-01-17 2014-07-17 Em Microelectronic-Marin Sa Control system and method for sensor management
US9494542B2 (en) * 2013-01-17 2016-11-15 Em Microelectronic-Marin Sa Control system and method for sensor management

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US20010004226A1 (en) 2001-06-21
CA2327576C (fr) 2008-09-30
CN1183670C (zh) 2005-01-05
KR20010067389A (ko) 2001-07-12
KR100717493B1 (ko) 2007-05-14
CA2327576A1 (fr) 2001-06-21
CN1311563A (zh) 2001-09-05
HK1038993A1 (en) 2002-04-04
JP2001203534A (ja) 2001-07-27
TW472438B (en) 2002-01-11

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