US20200408512A1 - Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium - Google Patents

Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium Download PDF

Info

Publication number
US20200408512A1
US20200408512A1 US16/980,978 US201916980978A US2020408512A1 US 20200408512 A1 US20200408512 A1 US 20200408512A1 US 201916980978 A US201916980978 A US 201916980978A US 2020408512 A1 US2020408512 A1 US 2020408512A1
Authority
US
United States
Prior art keywords
light pattern
measured object
image
dimensional shape
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US16/980,978
Other languages
English (en)
Inventor
Shizuo Sakamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Assigned to NEC CORPORATION reassignment NEC CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SAKAMOTO, SHIZUO
Publication of US20200408512A1 publication Critical patent/US20200408512A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded

Definitions

  • the present invention relates to a three-dimensional shape measuring apparatus, a three-dimensional shape measuring method, a program, and a storage medium.
  • Patent Literatures 1 to 6 disclose a use of a sinusoidal pattern as a light pattern to be projected on a measured object.
  • a sinusoidal pattern for a light pattern to be projected on a measured object it is possible to identify the position on the measured object based on a phase of a projected light (luminance) as a clue and accurately detect a three-dimensional shape of the measured object.
  • a light pattern having periodicity such as a sinusoidal pattern is used as a light pattern projected on a measured object, since points shifted by N cycles may be a candidate due to the nature thereof, it is difficult to uniquely define a three-dimensional shape.
  • Patent Literature 1 and the like solve the ambiguity described above by adding one or more projectors that project light patterns or one or more cameras that capture a measured object to uniquely define a three-dimensional shape. Further, in Patent Literature 6 or the like, a three-dimensional shape is uniquely defined by projecting two types of sinusoidal patterns having different cycles, respectively, to solve the ambiguity described above.
  • the conventional method of resolving the ambiguity described above by projecting two types of sinusoidal patterns having different cycles, respectively, has a problem of requiring a long time for measurement because the projection period of the light pattern is doubled.
  • the present invention intends to provide a three-dimensional shape measuring apparatus, a three-dimensional shape measuring method, a program, and a storage medium that may measure the three-dimensional shape of an object at high accuracy and in a short time with a simpler system.
  • a three-dimensional shape measuring apparatus including: a single projector device that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; an image capture device that acquires an image of the measured object on which the first light pattern or the second light pattern is projected; and an image processing device that processes the image acquired by the image capture device, and the image processing device includes a relative phase value calculation unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels, an absolute phase value calculation unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels, and a three-dimensional coordinate calculation unit that
  • a three-dimensional shape measuring method including the steps of: projecting a first light pattern whose luminance changes at a first cycle on a measured object and acquiring an image of the measured object on which the first light pattern is projected; projecting a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on the measured object by the same projector device as a projector device used for projection of the first light pattern and acquiring an image of the measured object on which the second light pattern is projected; based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculating a relative phase value on each part of the measured object corresponding to each of the pixels; based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculating an absolute phase value on each the part of the measured object corresponding to each of the pixels; and based on the absolute phase value, calculating three-dimensional coordinates at
  • a program that causes a computer to function as: a unit that controls a single projector device to project a first light pattern whose luminance changes at a first cycle or a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; a unit that acquires an image of the measured object on which the first light pattern is projected and an image of the measured object on which the second light pattern is projected; a unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels; a unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels; and a unit that, based on the absolute phase value, calculates three-dimensional coordinate
  • FIG. 1 is a schematic diagram illustrating a configuration example of a three-dimensional shape measuring apparatus according to a first example embodiment of the present invention.
  • FIG. 2A is a diagram illustrating an example of a short cycle light pattern used in a three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 2B is a diagram illustrating an example of a short cycle light pattern used in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 2C is a diagram illustrating an example of a short cycle light pattern used in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 2D is a diagram illustrating an example of a short cycle light pattern used in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 3A is a diagram illustrating an example of a long cycle light pattern used in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 3B is a diagram illustrating an example of a long cycle light pattern used in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 4 is a graph illustrating a method of calculating an absolute phase value in the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 5 is a flowchart illustrating the three-dimensional shape measuring method according to the first example embodiment of the present invention.
  • FIG. 6A is a diagram illustrating an example of a long cycle light pattern used in a three-dimensional shape measuring method according to a second example embodiment of the present invention.
  • FIG. 6B is a diagram illustrating an example of a long cycle light pattern used in a three-dimensional shape measuring method according to the second example embodiment of the present invention.
  • FIG. 7 is a graph illustrating a method of capturing an absolute phase value in the three-dimensional shape measuring method according to the second example embodiment of the present invention.
  • FIG. 8 is a flowchart illustrating the three-dimensional shape measuring method according to the second example embodiment of the present invention.
  • FIG. 9A is a graph illustrating a result of inspection of an advantageous effect of the present invention inspected through a computer simulation.
  • FIG. 9B is a graph illustrating a result of inspection of an advantageous effect of the present invention inspected through a computer simulation.
  • FIG. 10 is a schematic diagram illustrating a configuration example of a three-dimensional shape measuring apparatus according to a third example embodiment of the present invention.
  • FIG. 11A is a diagram illustrating an example of a light pattern according to a modified example of the example embodiment of the present invention.
  • FIG. 11B is a diagram illustrating an example of a light pattern according to a modified example of the example embodiment of the present invention.
  • a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method according to a first example embodiment of the present invention will be described with reference to FIG. 1 to FIG. 5 .
  • FIG. 1 is a schematic diagram illustrating a configuration example of the three-dimensional shape measuring apparatus according to the present example embodiment.
  • FIG. 2A to FIG. 2D are diagrams each illustrating an example of a short cycle light pattern used in the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 3A and FIG. 3B are diagrams each illustrating an example of a long cycle light pattern used in the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 4 is a graph illustrating a calculation method of an absolute phase value in the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 5 is a flowchart illustrating the three-dimensional shape measuring method according to the present example embodiment.
  • a three-dimensional shape measuring apparatus 100 includes a projector device 20 , an image capture device 30 , and an image processing device 40 .
  • the image processing device 40 includes a projection pattern control unit 42 , an image acquisition unit 44 , a relative phase value calculation unit 46 , an absolute phase value calculation unit 48 , a three-dimensional coordinate calculation unit 50 , and a control unit 52 .
  • the projector device 20 is a device that projects a predetermined light pattern on a measured object 10 whose three-dimensional shape is to be measured.
  • the projector device 20 is not particularly limited and may be, for example, a digital light processing (DLP) projector, a liquid crystal projector, or the like.
  • DLP digital light processing
  • a DLP projector or a liquid crystal projector can project any light patterns at a high rate and is preferable for reducing time required for a three-dimensional shape measurement. Reduction in the measuring time is preferable for measuring a three-dimensional shape of an object that is moving (moving object) such as when face authentication of a person is performed, in particular. Note that details of the light pattern projected on the measured object 10 will be described later.
  • the measured object 10 may be a face, a head, a finger, a fingerprint, a ridge of a fingerprint, or other parts including a part of the body of a person but is not limited thereto.
  • the image capture device 30 is a device that captures an image of the measured object 10 on which a light pattern emitted from the projector device 20 is projected.
  • the image capture device 30 includes a solid-state image pickup device such as a charge coupled device (CCD) image sensor or a complementary metal-oxide-semiconductor (CMOS) image sensor. Further, the image capture device 30 includes an optical system that captures an image of a subject on a capturing plane of a solid-state image pickup device, a signal processing circuit that performs signal processing on the output of the solid-state image pickup device to obtain a luminance value on a pixel basis, and the like.
  • CCD charge coupled device
  • CMOS complementary metal-oxide-semiconductor
  • the image processing device 40 may be formed of a general purpose information processing device (computer) having a central processing unit (CPU), a memory device, a display, a storage device such as a hard disk, various interfaces for input/output, or the like. Further, the image processing device 40 has a program that causes the information processing device to perform a three-dimensional shape measuring method described later, and when the CPU executes the program, the function of each unit of the image processing device 40 can be implemented.
  • a general purpose information processing device computer having a central processing unit (CPU), a memory device, a display, a storage device such as a hard disk, various interfaces for input/output, or the like.
  • the image processing device 40 has a program that causes the information processing device to perform a three-dimensional shape measuring method described later, and when the CPU executes the program, the function of each unit of the image processing device 40 can be implemented.
  • the projection pattern control unit 42 has a function of generating a light pattern to be projected on the measured object 10 and storing the light pattern in the storage device in advance. Further, the projection pattern control unit 42 has a function of transmitting data of a light pattern stored in the storage device to the projector device 20 via a general purpose display interface such as a digital visual interface (DVI). Further, the projection pattern control unit 42 has a function of controlling the operation of the projector device 20 (turning on/off, dimming adjustment, or the like of a light source) via a general purpose communication interface such as RS232 or universal serial bus (USB).
  • a general purpose communication interface such as RS232 or universal serial bus (USB).
  • the image acquisition unit 44 has a function of acquiring image data captured by the image capture device 30 and storing the image data in a memory device. Further, the image acquisition unit 44 has a function of controlling of the operation of the image capture device 30 (a timing of capturing or the like) via a general purpose communication interface such as RS232 or USB. Further, the image acquisition unit 44 has a function of instructing the projection pattern control unit 42 to cause the projector device 20 to project a light pattern.
  • the relative phase value calculation unit 46 has a function of calculating a phase value in accordance with a luminance value (phase values ⁇ and ⁇ described later) on a pixel basis based on an image captured by the image capture device 30 . Note that details of a method of calculating a phase value will be described later.
  • the absolute phase value calculation unit 48 has a function of calculating an absolute phase value (an absolute phase value ⁇ described later) on a pixel basis based on a phase value calculated by the relative phase value calculation unit 46 . Note that details of a method of calculating a phase value will be described later.
  • the three-dimensional coordinate calculation unit 50 has a function of finding three-dimensional coordinates of a projection point P (X, Y, Z) on the measured object 10 corresponding to a point p(x, y) on an image by using calculation based on an absolute phase value of each pixel calculated by the absolute phase value calculation unit 48 .
  • the control unit 52 has a function of generally controlling the above units of the image processing device 40 .
  • the sinusoidal grating phase shift method is a method of projecting a sinusoidal grating light pattern as illustrated in FIG. 2A to FIG. 2D (hereafter, referred to as a sinusoidal pattern) on the measured object 10 while gradually shifting the phase and identifying the three-dimensional shape based on captured images of the measured object 10 on which the light pattern is projected.
  • FIG. 2A to FIG. 2D illustrate four sinusoidal patterns whose phases are each shifted by 1 ⁇ 4 wavelengths as an example.
  • Each drawing of FIG. 2A to FIG. 2D represents the luminance in a projection region of the light pattern in grayscale.
  • the luminance changes sinusoidally in the vertical direction of the drawing.
  • a variable t is here denoted as “time”, description is provided for a case of modulating the amplitude of the luminance.
  • time a vertical displacement of the phase when the light pattern of FIG. 2A is a reference is illustrated, and the projection timing of a light pattern can be changed regardless of the actual time. The same applies to FIG. 3A and FIG. 3B described later.
  • Equation (1) a luminance value I(x, y, t) at time t at (x, y) coordinates of an obtained image is expressed as Equation (1) below, where the amplitude of a sine wave is denoted as A, the phase value is denoted as ⁇ , and the bias (the center value of a sine wave) is denoted as B.
  • the phase value ⁇ at coordinates (x, y) can be calculated, the three-dimensional position corresponding to the coordinates (x, y) can be defined.
  • Equation (1) has three unknowns of the amplitude A, the phase value ⁇ , and the bias B, with at least three light pattern projection images, the phase value ⁇ can be calculated. When four or more light pattern projection images are captured, the phase value ⁇ can be calculated more accurately by using a least-squares method or the like.
  • Equation (6) to Equation (8) below are obtained by finding the amplitude A, the phase value ⁇ , and the bias B by using a least-squares method from Equation (2) to Equation (5).
  • the obtained phase value ⁇ ranges from ⁇ to ⁇ ( ⁇ ). Therefore, points indicating the same phase value ⁇ may be present, the number of which is the same as the number of cycles included in a projection region of a light pattern, and coordinates cannot be uniquely defined from the obtained phase value ⁇ .
  • a so-called multi-eye sinusoidal grating phase shift method in which images acquired by two image capture devices are used to solve the uncertainty is used.
  • the multi-eye sinusoidal grating phase shift method uses a plurality of projectors or a plurality of image capture devices and thus has a problem of system configuration or control being more complex or the like.
  • the three-dimensional shape measuring method is used as the light pattern to be projected on the measured object 10 .
  • These two types of light patterns are periodic light patterns whose numbers of repeating cycles are different from each other, which are distinguished here as a short cycle light pattern and a long cycle light pattern. That is, the three-dimensional shape measuring method according to the present example embodiment is to perform measurement of a phase value using a long cycle light pattern in addition to measurement of a phase value using a short cycle light pattern similar to the measurement by using the sinusoidal phase shift method described above.
  • a sinusoidal pattern is used as each of the short cycle light pattern and the long cycle light pattern.
  • the short cycle light pattern is a light pattern that determines the resolution of measurement. The greater the number of cycles of the short cycle light pattern included in the whole screen of an image captured by the image capture device 30 is, the higher the resolution of measurement is. Thus, it is desirable that the short cycle light pattern be a light pattern including multiple cycles of patterns in a whole screen of a captured image, as illustrated in FIG. 2A to FIG. 2D , for example. The number of cycles of a short cycle light pattern included in the whole screen can be suitably set in accordance with resolution required for measurement.
  • the long cycle light pattern is a light pattern used for identifying the absolute phase value ⁇ and desirably a light pattern including one or less cycle of pattern in the whole screen of an image captured by the image capture device 30 .
  • FIG. 3A and FIG. 3B for example, a light pattern including one cycle of pattern in the whole screen of a captured image can be applied to the long cycle light pattern.
  • Each drawing of FIG. 3A and FIG. 3B represents the luminance in the projection region of a light pattern in grayscale in the same manner as FIG. 2A to FIG. 2D .
  • the luminance changes sinusoidally in the vertical direction of the drawing.
  • the luminance value I(x, y, t) at time t at (x, y) coordinates of an obtained image is expressed as Equation (1) described above, where the amplitude is denoted as A, the phase value is denoted as ⁇ , and the bias is denoted as B.
  • Equation (2) the luminance value I (x, y, t) at the coordinates (x, y) is expressed as Equation (2) to Equation (5) described above.
  • Equation (6) to Equation (8) described above are obtained by finding the amplitude A, the phase value ⁇ , and the bias B by using a least-squares method from Equation (2) to Equation (5).
  • Equation (9) the luminance value J(x, y, t) at time t at (x, y) coordinates of an obtained image is expressed as Equation (9) below, where the amplitude is denoted as A′, the phase value is denoted as ⁇ , and the bias is denoted as B′.
  • Equation (10) the luminance value J(x, y, t) at the coordinates (x, y) is expressed as Equation (10) to Equation (13) below.
  • Equation (14) to Equation (16) below are obtained by finding the amplitude A′, the phase value ⁇ , and the bias B′ by using a least-squares method from Equation (10) to Equation (13).
  • the absolute phase value can be determined from the relative phase value found from around ⁇ 3 ⁇ , that is, (6/200) ⁇ 1 , namely, around 33 repeating sine waves.
  • a projector that can project any light pattern such as a liquid crystal projector or a DLP projector
  • the short cycle light pattern and the long cycle light pattern generated based on the light emitted from the same light source from the single projector device 20 are projected, it can be assumed that the basic physical characteristics of the projector device 20 at projection of these light patterns are the same. That is, when projection on the measured object 10 of the short cycle light pattern and the long cycle light pattern is performed by using the same projector device 20 , it is considered that Equation (17) below is met.
  • Equation (9) can be rewritten as Equation (18) and Equation (19) below, and the number of unknowns is not three, namely, the amplitude A′, the phase value ⁇ , and the bias B′ but is one, namely, only the phase value ⁇ . Accordingly, with at least only one time of capturing the measured object 10 on which the long cycle light pattern is projected, the phase value ⁇ can be found.
  • the short cycle light pattern and the long cycle light pattern emitted from the single projector device 20 are projected on the measured object 10 , which makes it possible to calculate the phase value ⁇ while reducing the number of times of projection on the measured object 10 . Accordingly, the three-dimensional shape of the measured object 10 can be measured in a short time.
  • Equation (22) By finding the phase value ⁇ from Equation (20) and Equation (21) by a least-squares method, Equation (22) below is obtained.
  • the uncertainty of the phase value ⁇ obtained by Equation (19) and Equation (22) is not a fraction divided from 2 ⁇ by an integer but a fraction divided from n by an integer (the range of the obtained phase value ⁇ is 0 ⁇ ). That is, it is required to project sine waves so that the whole image corresponds not to one cycle but to a half cycle. This means that the relative error of the phase value ⁇ becomes two times.
  • Equation (19) or Equation (22) used for finding the phase value ⁇ needs to be rewritten to be not a cosine function but an inverse function of a tangent function.
  • Equation (23) and Equation (24) the luminance value J(x, y, t) at the coordinates (x, y) is expressed by Equation (23) and Equation (24) below.
  • Equation (25) By finding the phase value ⁇ from Equation (23) and Equation (24) by a least-squares method, Equation (25) below is obtained.
  • the uncertainty of the phase value ⁇ obtained therefrom is a fraction divided from 2 ⁇ by an integer (the range of the obtained phase value ⁇ is ⁇ ).
  • phase value of the long cycle light pattern to be projected changes gradually in the whole image and thus is expected to have a good compatibility with noise removal such as smoothing or a median filter.
  • noise removal such as smoothing or a median filter.
  • the phase value ⁇ becomes a value for every one cycle of the short cycle light pattern, that is, a value from ⁇ to ⁇ . Therefore, to find an absolute phase value in a light pattern projected for multiple cycles, a process of estimating where a pattern of the order n (a value indicating the n-th cycle counted from one end to the other end) is located on each captured image is required.
  • the phase value ⁇ is used for the estimation of the order n of a short cycle light pattern.
  • FIG. 4 is a graph illustrating an example of the relationship between the relative phase value (the phase value ⁇ and the phase value ⁇ ) and the order n of a short cycle light pattern when the short cycle light pattern within a screen includes 10 cycles and the long cycle light pattern has one cycle.
  • the order n of the short cycle light pattern can be determined uniquely in accordance with a value of the phase value ⁇ .
  • the order n of a short cycle light pattern is two in a range of the phase value ⁇ being ⁇ /5 to 2 ⁇ /5, and the order n of a short cycle light pattern is seven in a range of the phase value ⁇ being ⁇ 4 ⁇ /5 to ⁇ 3 ⁇ /5.
  • the line obtained by connecting points having the same absolute phase value ⁇ on a captured image represents a shape of a cross section of the measured object 10 taken along a certain plane similar to a sectional line by a light-section method.
  • the three-dimensional shape of the measured object 10 (height information at each point of an image) can be measured by a triangulation principle.
  • the three-dimensional shape measuring method of the present example embodiment uses two light patterns, namely, the short cycle light pattern and the long cycle light pattern, the capturing time is longer than in the case where one type of the light pattern is used.
  • the capturing time can be sufficiently reduced for the absolute time.
  • it is expected to solve the problems of long calculation time of three-dimensional coordinates and inability of measurement if the positional relationship between the camera and the projector on the left and right becomes wrong, which are disadvantages of the multi-eye sinusoidal grating phase shift method described above.
  • the conventional method when two light patterns, namely, the short cycle light pattern and the long cycle light pattern are used, projection and capturing of the light patterns are required to be performed for at least three times, respectively, that is, six times in total.
  • projection and capturing of the light patterns need to be performed only for at least three times by using the short cycle light pattern and one time by using the long cycle light pattern, that is, four times in total. Therefore, according to the three-dimensional shape measuring method of the present example embodiment, the number of images to be projected can be reduced, and the capturing time can be shortened.
  • the three-dimensional shape measuring method according to the present example embodiment can be performed in accordance with step S 101 to step S 116 illustrated in FIG. 5 , for example.
  • step S 101 to step S 116 illustrated in FIG. 5 for example.
  • description is provided here for a case of calculating the amplitude A, the bias B, and the phase value ⁇ from an image of the measured object 10 on which the first light pattern, which is the short cycle light pattern, is projected and calculating the phase value ⁇ from an image of the measured object 10 on which the second light pattern, which is the long cycle light pattern, is projected, as an example.
  • the amplitude A′, the bias B′, and the phase value ⁇ may be calculated from an image of the measured object 10 on which the first light pattern, which is the long cycle light pattern, is projected and calculate the phase value ⁇ from an image of the measured object 10 on which the second light pattern, which is the short cycle light pattern, is projected. Projection of the second light pattern may be performed earlier than projection of the first light pattern.
  • step S 101 the number of projection times L for the first light pattern is set.
  • Measurement using the first light pattern is for determining the amplitude A, the bias B, and the phase value ⁇ , and the number of projection times L is greater than or equal to three.
  • the number of projection times L for the first light pattern is four.
  • step S 102 under the control of the projection pattern control unit 42 , the projector device 20 projects the first light pattern on the measured object 10 to be measured.
  • the first light pattern which is the short cycle light pattern
  • the pattern of FIG. 2A is applicable as the short cycle light pattern, for example.
  • step S 103 under the control of the image acquisition unit 44 , the image capture device 30 captures an image of the measured object 10 on which the first light pattern is projected.
  • step S 104 the number of projection times L for the first light pattern is decremented by one.
  • the number of projection times L represents the number of remaining projection times of the first light pattern.
  • step S 105 it is determined whether or not the number of projection times L of the first light pattern is zero, that is, whether or not the projection and capturing of the first light pattern have been performed for the number of projection times L set in step S 101 .
  • step S 106 if the number of projection times L is not zero (step S 105 , “No”), in step S 106 , the phase of the first light pattern projected on the measured object 10 is shifted, and the process returns to step S 102 .
  • the projection pattern control unit 42 sequentially prepares data of the short cycle light patterns having phases shifted stepwise by 1 ⁇ 4 wavelengths (see FIG. 2B , FIG. 2C , and FIG. 2D ) and transmits the data to the projector device 20 .
  • step S 105 if the number of projection times L is zero (step S 105 , “Yes”), the process proceeds to step S 107 .
  • step S 107 the relative phase value calculation unit 46 calculates the amplitude A, the bias B, and the phase value ⁇ , respectively, based on the luminance value I of each pixel of the L images captured in step S 103 .
  • the amplitude A, the bias B, and the phase value ⁇ can be calculated based on Equation (6) to Equation (8), for example.
  • step S 108 the number of projection times M for the second light pattern is set.
  • Measurement using the second light pattern is for determining the phase value ⁇ , and the number of projection times M is greater than or equal to one.
  • the number of projection times M for the second light pattern is two.
  • step S 109 under the control of the projection pattern control unit 42 , the projector device 20 projects the second light pattern on the measured object 10 to be measured.
  • the second light pattern that is the long cycle light pattern is projected on the measured object 10 .
  • the pattern of FIG. 3A is applicable as the long cycle light pattern, for example.
  • step S 110 under the control of the image acquisition unit 44 , the image capture device 30 captures an image of the measured object 10 on which the second light pattern is projected.
  • step S 111 the number of projection times M for the second light pattern is decremented by one.
  • the number of projection times M represents the number of remaining projection times of the second light pattern.
  • step S 112 it is determined whether or not the number of projection times M of the second light pattern is zero, that is, whether or not the projection and capturing of the second light pattern have been performed for the number of projection times M set in step S 108 .
  • step S 112 if the number of projection times M is not zero (step S 112 , “No”), in step S 113 , the phase of the second light pattern projected on the measured object 10 is shifted, and the process returns to step S 109 .
  • the projection pattern control unit 42 prepares data of the long cycle light patterns having phases shifted stepwise by 1 ⁇ 4 wavelengths (see FIG. 3B ) and transmits the data to the projector device 20 .
  • step S 112 if the number of projection times M is zero (step S 112 , “Yes”), the process proceeds to step S 114 .
  • step S 114 the relative phase value calculation unit 46 calculates the phase value ⁇ based on the amplitude A and the bias B calculated in step S 107 and the luminance value J of each pixel of the M images captured in step S 110 , respectively.
  • the phase value ⁇ can be calculated based on Equation (25), for example.
  • step S 115 the absolute phase value calculation unit 48 calculates the absolute phase value ⁇ based on the phase value ⁇ calculated in step S 107 and the phase value ⁇ calculated in step S 114 .
  • step S 116 based on the absolute phase value ⁇ calculated in step S 115 , the three-dimensional coordinate calculation unit 50 calculates the absolute coordinate values of the projection point on the measured object 10 in the three-dimensional space corresponding to each pixel of the captured image. Accordingly, the three-dimensional shape of the measured object 10 can be identified.
  • the three-dimensional measuring method according to the present example embodiment can measure the three-dimensional shape of a measured object by performing projection and capturing of light patterns for at least three times using the short cycle light pattern and once using the long cycle light pattern, namely, four times in total. Therefore, the three-dimensional measuring method according to the present example embodiment can reduce the number of projected images and thus can shorten the measuring time compared to the conventional method that requires projection and capturing of light patterns for at least three times using the short cycle light pattern and three times using the long cycle light pattern, namely, six times in total. It is required to complete the measurement in a short time when a three-dimensional shape of a moving measured target is measured, in particular, such as when face authentication of a person is performed, for example.
  • the three-dimensional measuring method according to the present example embodiment that enables accurate measurement within a shorter measuring time is significantly useful in accurately performing face authentication with a moving image, for example.
  • the three-dimensional measuring method according to the present example embodiment can perform projection of the short cycle light pattern and projection of the long cycle light pattern by using a single projector device and perform capturing a light pattern projected on a measured object by using a single image capture device. Therefore, with the three-dimensional measuring apparatus according to the present example embodiment, it is possible to simplify the system configuration or control compared to the conventional method using a plurality of projector devices or image capture devices.
  • the three-dimensional shape measuring method and apparatus may measure a three-dimensional shape of an object at high accuracy and in a short time with a simpler system.
  • a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method according to a second example embodiment of the present invention will be described with reference to FIG. 6A to FIG. 9B .
  • the same components as those of the three-dimensional shape measuring apparatus according to the first example embodiment will be labeled with the same references, and the description thereof will be omitted or simplified.
  • FIG. 6A and FIG. 6B are diagrams illustrating examples of a long cycle light pattern used in the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 7 is a graph illustrating a calculation method of an absolute phase value in the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 8 is a flowchart illustrating the three-dimensional shape measuring method according to the present example embodiment.
  • FIG. 9A and FIG. 9B are graphs illustrating results of inspection of an advantageous effect of the present invention through a computer simulation.
  • the sinusoidal pattern is used as a short cycle light pattern and a long cycle light pattern in the first example embodiment
  • the short cycle light pattern and the long cycle light pattern are not necessarily required to be a sinusoidal pattern and may be another periodic pattern.
  • various periodic patterns are applicable to the long cycle light pattern, because it is sufficient that the position is uniquely defined on the whole screen.
  • a sinusoidal pattern is used as the short cycle light pattern and a luminance slope pattern is used as the long cycle light pattern will be described.
  • FIG. 6A and FIG. 6B each illustrate an example of the luminance slope pattern.
  • FIG. 6A illustrates a luminance slope pattern in which the luminance increases at a fixed ratio from the upper part toward the lower part
  • FIG. 6B illustrates a luminance slope pattern in which the luminance decreases at a fixed ratio from the upper part toward the lower part.
  • Equation (26) the luminance value K(x, y, t) at time t at (x, y) coordinates of an obtained image is expressed as Equation (26) below.
  • A′′ denotes an amplitude
  • B′′ denotes a bias
  • ⁇ is a variable that changes linearly within a range ⁇ 1 ⁇ 1.
  • Equation (27) is met when the same projector device 20 is used for the short cycle light pattern and the long cycle light pattern. Therefore, if the measured object 10 on which the long cycle light pattern is projected is captured at least once only, the phase value ⁇ can be found.
  • variable ⁇ changes gradually in the whole screen and thus is expected to have a good compatibility with noise removal such as smoothing or a median filter. With design to have the same absolute phase determination accuracy as that when four-time capturing is performed, it may be possible to cancel the disadvantage caused by a reduction of the number of capturing times. Further, unlike the phase value, since the variable ⁇ is not a periodic value in a strict sense, a classical noise removal process can be utilized without change.
  • FIG. 7 is a graph illustrating a relationship between the relative phase value (phase value ⁇ ) and the variable ⁇ with respect to the order n of the short cycle light pattern when the short cycle light pattern includes 10 cycles and the long cycle light pattern (luminance slope pattern) includes 1 cycle within a screen.
  • the order n of the short cycle light pattern can be defined uniquely in accordance with the value of the variable ⁇ .
  • the order n of the short cycle light pattern is 2 in a range of the variable ⁇ from ⁇ 0.8 to ⁇ 0.6, and the order n of the short cycle light pattern is 7 in a range of the variable ⁇ from 0.2 to 0.4.
  • a line obtained by connecting points having the same absolute phase value ⁇ on the captured image represents the shape of a cross section of the measured object 10 taken along a certain plane in a similar manner to a sectional line by a light-section method.
  • the three-dimensional shape of the measured object 10 (height information at each point of an image) can be measured by a triangulation principle.
  • the three-dimensional shape measuring method according to the present example embodiment can be performed in accordance with step S 201 to step S 216 illustrated in FIG. 8 , for example.
  • step S 201 to step S 216 illustrated in FIG. 8 for example.
  • description is provided here for a case of calculating the amplitude A, the bias B, and the phase value ⁇ from an image of the measured object 10 on which the first light pattern, which is the short cycle light pattern, is projected and calculating the phase value ⁇ from an image of the measured object 10 on which the second light pattern, which is the long cycle light pattern, is projected as an example.
  • the amplitude A′, the bias B′, and the phase value ⁇ may be calculated from an image of the measured object 10 on which the first light pattern that is the long cycle light pattern is projected and calculate the phase value ⁇ from an image of the measured object 10 on which the second light pattern, which is the short cycle light pattern, is projected. Projection of the second light pattern may be performed earlier than projection of the first light pattern.
  • step S 101 to step S 107 of the three-dimensional shape measuring method according to the first example embodiment measurement using the first light pattern (short cycle light pattern) is performed. Thereby, based on the luminance value I of each pixel of L captured images, the amplitude A, the bias B, and the phase value ⁇ are calculated, respectively (step S 201 to step S 207 ).
  • step S 208 the number of projection times M for the second light pattern (the luminance slope pattern) is set.
  • Measurement using the second light pattern is for determining the variable ⁇ , and the number of projection times M is greater than or equal to one.
  • the number of projection times M for the second light pattern is two.
  • step S 209 under the control of the projection pattern control unit 42 , the projector device 20 projects the second light pattern, which is the luminance slope pattern, on the measured object 10 .
  • the pattern of FIG. 6A is applicable as the luminance slope pattern, for example.
  • step S 210 under the control of the image acquisition unit 44 , the image capture device 30 captures an image of the measured object 10 on which the second light pattern is projected.
  • step S 211 the number of projection times M for the second light pattern is decremented by one.
  • the number of projection times M represents the number of remaining projection times of the second light pattern.
  • step S 212 it is determined whether or not the number of projection times M of the second light pattern is zero, that is, whether or not the projection and capturing of the second light pattern have been performed for the number of projection times M set in step S 208 .
  • step S 212 if the number of projection times M is not zero (step S 212 , “No”), in step S 213 , the phase of the second pattern projected on the measured object 10 is shifted, and the process returns to step S 209 .
  • the projection pattern control unit 42 sequentially prepares data of the luminance slope patterns having an inversed luminance slope (see FIG. 6B ) and transmits the data to the projector device 20 .
  • step S 212 if the number of projection times M is zero (step S 212 , “Yes”), the process proceeds to step S 214 .
  • step S 214 the relative phase value calculation unit 46 calculates the variable ⁇ based on the amplitude A and the bias B calculated in step S 207 and the luminance value K of each pixel of the M images captured in step S 210 , respectively.
  • the variable ⁇ can be calculated based on Equation (32), for example.
  • step S 215 the absolute phase value calculation unit 48 calculates the absolute phase value ⁇ based on the phase value ⁇ calculated in step S 207 and the variable ⁇ calculated in step S 214 .
  • step S 216 based on the absolute phase value ⁇ calculated in step S 215 , the three-dimensional coordinate calculation unit 50 calculates the absolute coordinate values of the projection point on the measured object 10 in the three-dimensional space corresponding to each pixel of the captured image. Accordingly, the three-dimensional shape of the measured object 10 can be identified.
  • FIG. 9A and FIG. 9B each illustrate a result of inspection of the advantageous effect of the present invention through a computer simulation.
  • FIG. 9A illustrates a case of the first example embodiment in which sinusoidal patterns are used as the short cycle light pattern and the long cycle light pattern
  • FIG. 9B illustrates a case of the present example embodiment in which a sinusoidal pattern is used as the short cycle light pattern and a luminance slope pattern is used as the long cycle light pattern.
  • the number of projection times of the long cycle light pattern is two.
  • the luminance slope pattern is used as the long cycle light pattern
  • a measurement error can be reduced compared to the three-dimensional measuring method according to the first example embodiment using a sinusoidal pattern as a long cycle pattern. Accordingly, in addition that the advantageous effect provided by the first example embodiment is provided, measurement accuracy can be further improved.
  • the present example embodiment it is possible to realize the three-dimensional shape measuring method and apparatus that may measure the three-dimensional shape of an object at high accuracy and in a short time with a simpler system.
  • FIG. 10 is a schematic diagram illustrating a configuration example of the three-dimensional shape measuring apparatus according to the present example embodiment.
  • the three-dimensional shape measuring apparatus can be configured as illustrated FIG. 10 , for example. That is, the three-dimensional shape measuring apparatus 100 according to the present example embodiment has a single projector device 20 that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on the measured object 10 . Further, the three-dimensional shape measuring apparatus 100 has the image capture device 30 that acquires an image of the measured object 10 on which the first light pattern or the second light pattern is projected and the image processing device 40 that processes an image acquired by the image capture device 30 .
  • the image processing device 40 has the relative phase value calculation unit 46 that, based on a luminance value at each pixel of an image of the measured object 10 on which the first light pattern is projected, calculates a relative phase value on each part of the measured object 10 corresponding to each pixel. Further, the image processing device 40 has the absolute phase value calculation unit 48 that, based on the luminance value and the relative phase value at each pixel of an image of the measured object 10 on which the second light pattern is projected, calculates an absolute phase value at each part of the measured object 10 corresponding to each of the pixels. Further, the image processing device 40 has the three-dimensional coordinate calculation unit 50 that calculates three-dimensional coordinates on each part of the measured object 10 corresponding to each pixel based on the absolute phase value.
  • an example embodiment in which a part of the configuration of any of the example embodiments is added to another example embodiment or an example embodiment in which a part of the configuration of any of the example embodiments is replaced with a part of the configuration of another example embodiment is one of the example embodiments of the present invention.
  • the periodic light pattern is not limited to a sinusoidal pattern.
  • a periodic light pattern may be a saw-tooth wave pattern as illustrated in FIG. 11A or may be a triangular wave pattern as illustrated in FIG. 11B .
  • the luminance slope pattern illustrated in the second example embodiment is a waveform of one cycle of the saw-tooth wave pattern illustrated in FIG. 11A or a waveform of a half cycle of the triangular wave pattern illustrated in FIG. 11B .
  • the luminance slope pattern is handled as one of the periodic light patterns.
  • the three-dimensional shape measuring method and apparatus described in the above example embodiments can be applied to measurement of the shape of various objects, and the measured object 10 is not limited to a moving object.
  • each of the example embodiments further includes a processing method that stores, in a storage medium, a program that causes the configuration of each of the example embodiments to operate so as to implement the function of each of the example embodiments described above, reads the program stored in the storage medium as a code, and executes the program in a computer. That is, the scope of each of the example embodiments also includes a computer readable storage medium. Further, each of the example embodiments includes not only the storage medium in which the program described above is stored but also the program itself.
  • the storage medium for example, a floppy (registered trademark) disk, a hard disk, an optical disk, a magneto-optical disk, a CD-ROM, a magnetic tape, a nonvolatile memory card, or a ROM can be used.
  • a floppy (registered trademark) disk for example, a hard disk, an optical disk, a magneto-optical disk, a CD-ROM, a magnetic tape, a nonvolatile memory card, or a ROM
  • the scope of each of the example embodiments includes an example that operates on OS to perform a process in cooperation with another software or a function of an add-in board without being limited to an example that performs a process by an individual program stored in the storage medium.
  • a three-dimensional shape measuring apparatus comprising:
  • a single projector device that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object;
  • an image capture device that acquires an image of the measured object on which the first light pattern or the second light pattern is projected
  • an image processing device that processes the image acquired by the image capture device
  • the image processing device includes
  • the three-dimensional shape measuring apparatus according to supplementary note 1, wherein the image capture device acquires at least three images captured with different phases of the first light pattern projected on the measured object and acquires one image in which the measured object on which the second light pattern is projected is captured or two images captured with different phases of the second light pattern projected on the measured object.
  • the three-dimensional shape measuring apparatus according to supplementary note 1 or 2, wherein the first light pattern is a sinusoidal pattern.
  • the three-dimensional shape measuring apparatus according to any one of supplementary notes 1 to 3, wherein the second light pattern is a sinusoidal pattern.
  • the three-dimensional shape measuring apparatus according to any one of supplementary notes 1 to 3, wherein the second light pattern is a luminance slope pattern whose luminance changes linearly.
  • the three-dimensional shape measuring apparatus according to supplementary note 4 or 5, wherein the second light pattern is a pattern by which a whole screen of the image corresponds to one cycle.
  • the three-dimensional shape measuring apparatus according to any one of supplementary notes 1 to 6, wherein the projector device generates the first light pattern and the second light pattern from a light emitted from a single light source.
  • the three-dimensional shape measuring apparatus according to any one of supplementary notes 1 to 7, wherein the projector device is a DLP projector or a liquid crystal projector.
  • the three-dimensional shape measuring apparatus according to any one of supplementary notes 1 to 8, wherein the measured object is a moving object.
  • the three-dimensional shape measuring apparatus according to supplementary note 9, wherein the moving object is a face of a person.
  • a three-dimensional shape measuring method comprising the steps of:
  • one image in which the measured object on which the second light pattern is projected is captured or two images captured with different phases of the second light pattern projected on the measured object are acquired.
  • the three-dimensional shape measuring method according to supplementary note 11 or 12, wherein the first light pattern is a sinusoidal pattern.
  • the three-dimensional shape measuring method according to any one of supplementary notes 11 to 13, wherein the second light pattern is a sinusoidal pattern.
  • the three-dimensional shape measuring method according to any one of supplementary notes 11 to 13, wherein the second light pattern is a luminance slope pattern whose luminance changes linearly.
  • the three-dimensional shape measuring method according to supplementary note 14 or 15, wherein the second light pattern is a pattern by which a whole screen of the image corresponds to one cycle.
  • the three-dimensional shape measuring method according to any one of supplementary notes 11 to 16, wherein the projector device generates the first light pattern and the second light pattern from a light emitted from a single light source.
  • the three-dimensional shape measuring method according to any one of supplementary notes 11 to 17, wherein the projector device is a DLP projector or a liquid crystal projector.
  • the three-dimensional shape measuring method according to any one of supplementary notes 11 to 18, wherein the measured object is a moving object.
  • the three-dimensional shape measuring method is the three-dimensional shape measuring method.
  • the moving object is a face of a person.
  • a unit that acquires an image of the measured object on which the first light pattern is projected and an image of the measured object on which the second light pattern is projected;
  • a unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels;
  • a unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels;
  • a unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels.
  • a computer readable storage medium storing the program according to supplementary note 21 or 22.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
US16/980,978 2018-03-16 2019-03-13 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium Abandoned US20200408512A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018049546 2018-03-16
JP2018-049546 2018-03-16
PCT/JP2019/010414 WO2019177066A1 (ja) 2018-03-16 2019-03-13 ３次元形状計測装置、３次元形状計測方法、プログラム及び記録媒体

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2019/010414 A-371-Of-International WO2019177066A1 (ja) 2018-03-16 2019-03-13 ３次元形状計測装置、３次元形状計測方法、プログラム及び記録媒体

Related Child Applications (3)

Application Number Title Priority Date Filing Date
US17/591,020 Continuation US20220155056A1 (en) 2018-03-16 2022-02-02 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,910 Continuation US20220155057A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,923 Continuation US20220155058A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

Publications (1)

Publication Number Publication Date
US20200408512A1 true US20200408512A1 (en) 2020-12-31

Family

ID=67908282

Family Applications (4)

Application Number Title Priority Date Filing Date
US16/980,978 Abandoned US20200408512A1 (en) 2018-03-16 2019-03-13 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,020 Pending US20220155056A1 (en) 2018-03-16 2022-02-02 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,910 Pending US20220155057A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,923 Pending US20220155058A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

Family Applications After (3)

Application Number Title Priority Date Filing Date
US17/591,020 Pending US20220155056A1 (en) 2018-03-16 2022-02-02 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,910 Pending US20220155057A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
US17/591,923 Pending US20220155058A1 (en) 2018-03-16 2022-02-03 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

Country Status (4)

Country Link
US (4) US20200408512A1 (ja)
EP (1) EP3767227B1 (ja)
JP (2) JP6994165B2 (ja)
WO (1) WO2019177066A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022113583A1 (ja) * 2020-11-30 2022-06-02 日本電気株式会社 情報処理装置、情報処理方法、及び記録媒体

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3417377B2 (ja) 1999-04-30 2003-06-16 日本電気株式会社 三次元形状計測方法及び装置並びに記録媒体
JP3690212B2 (ja) * 1999-10-26 2005-08-31 松下電工株式会社 ３次元形状計測方法
JP2001283198A (ja) * 2000-03-31 2001-10-12 Nec Corp 特徴点採取方法と特徴点採取装置と記録媒体
JP2003269928A (ja) 2002-03-12 2003-09-25 Nec Corp ３次元形状計測方法および装置ならびにプログラム
JP2005249684A (ja) * 2004-03-05 2005-09-15 Ym Systems Kk ３次元形状測定装置、３次元形状測定方法および３次元形状測定プログラム
JP4429184B2 (ja) 2005-02-02 2010-03-10 Ｎｅｃエンジニアリング株式会社 三次元形状計測システム及び計測方法
JP4889373B2 (ja) * 2006-05-24 2012-03-07 ローランドディー．ジー．株式会社 ３次元形状測定方法およびその装置
JP2008009807A (ja) 2006-06-30 2008-01-17 Sanyo Electric Co Ltd 映像データベース構築装置、映像検索装置及び不明語検索装置
JP5123522B2 (ja) * 2006-12-25 2013-01-23 パナソニック株式会社 ３次元計測方法及びそれを用いた３次元形状計測装置
JP4830871B2 (ja) * 2007-01-26 2011-12-07 パナソニック電工株式会社 ３次元形状計測装置及び３次元形状計測方法
JP5032943B2 (ja) * 2007-11-06 2012-09-26 パナソニック株式会社 ３次元形状計測装置及び３次元形状計測方法
JP5480479B2 (ja) * 2008-08-04 2014-04-23 株式会社ミツトヨ 形状測定装置および形状測定装置の校正方法
JP5233850B2 (ja) 2009-06-08 2013-07-10 株式会社Ｌｉｘｉｌ 保水構造体
JP2010175554A (ja) * 2010-03-26 2010-08-12 Nec Engineering Ltd 三次元形状計測装置及び三次元形状計測方法
JP5709009B2 (ja) * 2011-11-17 2015-04-30 Ckd株式会社 三次元計測装置
FI125320B (en) * 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
JP5816773B2 (ja) * 2012-06-07 2015-11-18 ファロ テクノロジーズ インコーポレーテッド 取り外し可能なアクセサリーを備える座標測定マシン
JP6019886B2 (ja) * 2012-07-26 2016-11-02 株式会社豊田中央研究所 形状測定装置
JP5971050B2 (ja) * 2012-09-18 2016-08-17 富士通株式会社 形状計測装置及び形状計測方法
JP6109255B2 (ja) * 2015-07-14 2017-04-05 Ckd株式会社 三次元計測装置
JP2017110991A (ja) * 2015-12-16 2017-06-22 セイコーエプソン株式会社 計測システム、計測方法、ロボット制御方法、ロボット、ロボットシステムおよびピッキング装置
JP6694788B2 (ja) 2016-09-23 2020-05-20 富士通エフ・アイ・ピー株式会社 Ｖｍ環境コマンド実行管理プログラム、ｖｍ環境コマンド実行管理方法、ｖｍ環境コマンド実行管理装置およびｖｍ環境コマンド実行管理システム

Also Published As

Publication number Publication date
WO2019177066A1 (ja) 2019-09-19
US20220155058A1 (en) 2022-05-19
JPWO2019177066A1 (ja) 2021-01-14
US20220155056A1 (en) 2022-05-19
JP2022022326A (ja) 2022-02-03
JP6994165B2 (ja) 2022-01-14
EP3767227A4 (en) 2021-04-07
US20220155057A1 (en) 2022-05-19
JP7274111B2 (ja) 2023-05-16
EP3767227B1 (en) 2022-05-04
EP3767227A1 (en) 2021-01-20

Similar Documents

Publication Publication Date Title
EP2588836B1 (en) Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium
EP3594618B1 (en) Three-dimensional shape measurement device, three-dimensional shape measurement method, and program
US9714826B2 (en) Measurement apparatus and method thereof
JP2015210192A (ja) 計測装置およびその方法
JP2008157797A (ja) ３次元計測方法及びそれを用いた３次元形状計測装置
US20150138565A1 (en) Calibration method and shape measuring apparatus
JP2009115612A (ja) ３次元形状計測装置及び３次元形状計測方法
JP4516949B2 (ja) 三次元形状計測装置及び三次元形状計測方法
US9513114B2 (en) Measuring device, measuring method, and computer program product
US20220155057A1 (en) Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium
JP2008145139A (ja) 形状計測装置
JP5391053B2 (ja) ３次元形状計測方法および３次元形状計測装置
US11441896B2 (en) Inter-reflection detection apparatus and inter-reflection detection method
JP4797109B2 (ja) 三次元形状計測装置及び三次元形状計測方法
US10801834B2 (en) Fringe projection for determining topography of a body
US20190346542A1 (en) Apparatus and method
JP2010175554A (ja) 三次元形状計測装置及び三次元形状計測方法
CN112747686B (zh) 三维形貌测量装置
JP5968370B2 (ja) 三次元計測装置、三次元計測方法、及びプログラム
JP2016008837A (ja) 形状測定方法、形状測定装置、構造物製造システム、構造物製造方法、及び形状測定プログラム
JP2024065536A (ja) パターン画像の出力方法、プロジェクター、及びプログラム。

Legal Events

Date Code Title Description
STPP Information on status: patent application and granting procedure in general

Free format text: APPLICATION DISPATCHED FROM PREEXAM, NOT YET DOCKETED

AS Assignment

Owner name: NEC CORPORATION, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SAKAMOTO, SHIZUO;REEL/FRAME:054441/0218

Effective date: 20201107

STPP Information on status: patent application and granting procedure in general

Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION

STPP Information on status: patent application and granting procedure in general

Free format text: NON FINAL ACTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: FINAL REJECTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE AFTER FINAL ACTION FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: ADVISORY ACTION MAILED

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION