US20180024688A1 - An apparatus and methods for sensing - Google Patents

An apparatus and methods for sensing Download PDF

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Publication number
US20180024688A1
US20180024688A1 US15/546,655 US201615546655A US2018024688A1 US 20180024688 A1 US20180024688 A1 US 20180024688A1 US 201615546655 A US201615546655 A US 201615546655A US 2018024688 A1 US2018024688 A1 US 2018024688A1
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Prior art keywords
sensor
circuitry
transistor
sensor cells
examples
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Markku Rouvala
Helena Pohjonen
Vuokko Lantz
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Nokia Technologies Oy
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Nokia Technologies Oy
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/04166—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving
    • G06F3/041661—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving using detection at multiple resolutions, e.g. coarse and fine scanning; using detection within a limited area, e.g. object tracking window
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/045—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H03K17/9625—Touch switches using a force resistance transducer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H03K17/964—Piezo-electric touch switches
    • H03K17/9643—Piezo-electric touch switches using a plurality of detectors, e.g. keyboard
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H03K17/9645—Resistive touch switches
    • H03K17/9647—Resistive touch switches using a plurality of detectors, e.g. keyboard
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H03K17/962—Capacitive touch switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96—Touch switches
    • H03K2217/9607—Capacitive touch switches
    • H03K2217/96071—Capacitive touch switches characterised by the detection principle
    • H03K2217/960715—Rc-timing; e.g. measurement of variation of charge time or discharge time of the sensor

Definitions

  • Examples of the disclosure relate to an apparatus and method of providing an apparatus for sensing.
  • they relate to an apparatus and method of providing an apparatus which may comprise a plurality of sensors.
  • Sensors which enable attributes such as user inputs and environmental parameters to be sensed are known. Such sensors may comprise a material which produces a measurable change in electrical properties in response to the attributes. It may be useful to arrange such sensors into an array comprising a plurality of sensor elements. This may enable a single apparatus to detect a plurality of different attributes. In some examples this may enable a single apparatus to detect the same attribute or attributes in a a plurality of locations and/or at a plurality of different times.
  • an apparatus comprising; a sensor arrangement comprising a plurality of sensor cells wherein a sensor cell comprises a transistor and a sensor coupled to the transistor; first selection circuitry configured to sequence a subset of sensor cells to which a gate input signal is provided, wherein the gate input signal is provided to the gate of the transistors within the sensor cells; second selection circuitry configured to sequence a subset of sensor cells from which an output signal is received; sensing signal circuitry configured to provide a sensing signal, wherein the sensors are provided between the sensing signal circuitry and the second selection circuitry such that the output signal provides an indication of the impedance of the sensors.
  • the second selection circuitry may comprise an analogue multiplexer configured to receive a complex output signal from the sensor cells.
  • the second selection circuitry may comprise the plurality of sensor cells are arranged in a plurality of rows and columns. The columns may be orthogonal to the rows.
  • the first selection circuitry may be configured to sequence through a series of different rows and the second selection circuitry may be configured to sequence through a series of different columns.
  • the first selection circuitry may be configured to sequence through a series of different columns and the second selection circuitry may be configured to sequence through a series of different rows.
  • the senor may be connected in series with the transistor within the sensor cell. In other examples the sensor may be connected in parallel with the transistor within the sensor cell.
  • the transistor may comprise a thin film transistor.
  • the data input signal may comprise an alternating current signal.
  • the senor may comprise a material which changes impedance in dependence on a sensed attribute.
  • the senor may comprise a material which changes resistance in response to the sensed attribute.
  • the senor may comprise a material which changes permittivity in response to the sensed attribute.
  • the apparatus may further comprise at least one transmitter configured to transmit information obtained from the output signal.
  • a communication device comprising an apparatus as described above.
  • a method comprising; providing a sensor arrangement comprising a plurality of sensor cells wherein a sensor cell comprises a transistor and a sensor coupled to the transistor; providing first selection circuitry configured to sequence a subset of sensor cells to which a gate input signal is provided, wherein the gate input signal is provided to the gate of the transistors within the sensor cells; providing second selection circuitry configured to sequence a subset of sensor cells from which an output signal is received; providing sensing signal circuitry configured to provide a sensing signal, wherein the sensors are provided between the sensing signal circuitry and the second selection circuitry such that the output signal provides an indication of the impedance of the sensors.
  • the second selection circuitry may comprise an analogue multiplexer configured to receive a complex output signal from the sensor cells.
  • the plurality of sensor cells may be arranged in a plurality of rows and columns. In some examples the columns may be orthogonal to the rows.
  • the first selection circuitry may be configured to sequence through a series of different rows and the second selection circuitry may be configured to sequence through a series of different columns. In other examples the first selection circuitry may be configured to sequence through a series of different columns and the second selection circuitry may be configured to sequence through a series of different rows.
  • the senor may be connected in series with the transistor within the sensor cell. In other examples the sensor may be connected in parallel with the transistor within the sensor cell.
  • the transistor may comprise a thin film transistor.
  • the data input signal may comprise an alternating current signal.
  • the senor may comprise a material which changes impedance in dependence on a sensed attribute.
  • the senor may comprise a material which changes resistance in response to the sensed attribute.
  • the senor may comprise a material which changes permittivity in response to the sensed attribute.
  • the method may further comprise providing at least one transmitter configured to transmit information obtained from the output signal.
  • FIG. 1 illustrates an apparatus
  • FIG. 2 illustrates another apparatus comprising read out electronics and a transmitter
  • FIG. 3 schematically illustrates a sensor arrangement
  • FIG. 4 schematically illustrates another sensor arrangement
  • FIG. 5 illustrates a method
  • FIG. 6 illustrates a plot of sensor sensitivity sampled with a first frequency
  • FIG. 7 illustrates another plot of sensor sensitivity sampled with a second frequency.
  • the Figures illustrate an apparatus 1 comprising; a sensor arrangement 3 comprising a plurality of sensor cells 35 wherein a sensor cell 35 comprises a transistor 31 and a sensor 33 coupled to the transistor 31 ; first selection circuitry 5 configured to sequence a subset of sensor cells 35 to which a gate input signal 6 is provided, wherein the gate input signal 6 is provided to the gate of the transistors 31 within the sensor cells 35 ; second selection circuitry 9 configured to sequence a subset of sensor cells 35 from which an output signal 8 is received; sensing signal circuitry 7 configured to provide a sensing signal 4 , wherein the sensors 33 are provided between the sensing signal circuitry 7 and the second selection circuitry 9 such that the output signal 8 provides an indication of the impedance of the sensors 33 .
  • Examples of the disclosure provide the technical effect of enabling the transistors 31 within the sensor arrangement 3 to be used as switches. This enables each of the sensor cells 35 to be addressed individually to enable the impedance of each sensor 33 to be measured separately. As only one transistor 31 is provided in each sensor cell 35 this ensures that the resistance within the sensor arrangement 3 is low enough to enable accurate measurements from the sensors 33 .
  • the apparatus 1 may be for sensing.
  • the apparatus 1 may be for sensing a plurality of different attributes.
  • FIG. 1 schematically illustrates an example apparatus 1 which may be provided in some examples of the disclosure.
  • the apparatus 1 comprises a sensor arrangement 3 , first selection circuitry 5 , second selection circuitry 9 and sensing signal circuitry 7 .
  • the sensor arrangement 3 may comprise a plurality of sensor cells 35 .
  • a sensor cell 35 may comprise a transistor 31 and a sensor 33 coupled to the transistor 31 .
  • each of the plurality of sensor cells 35 within the apparatus 1 may comprise a transistor 31 and a sensor 33 coupled to the transistor 31 .
  • only one transistor 31 may be provided within each sensor cell 35 .
  • the sensors 33 may be arranged within the sensor arrangement 3 so that they are positioned between the sensing signal circuitry 7 and the second selection circuitry 9 .
  • the sensors 33 may be arranged within the sensor arrangement 3 so that the output signal 8 provides a measurement of the electrical properties, such as impedance, of the sensors 33 .
  • FIGS. 3 and 4 Examples of sensor arrangements 3 which may be used in implementations of the disclosure are illustrated in FIGS. 3 and 4 . It is to be appreciated that other sensor arrangements 3 could be used in other examples.
  • the first selection circuitry 5 may comprise means for providing a gate input signal 6 to a selected subset of sensor cells 35 within the sensor arrangement 3 .
  • the first selection circuitry 5 may be configured to sequence the subset of sensor cells 35 to which the gate input signal 6 is provided.
  • the gate input signal 6 may be sequentially provided to the gates of the transistors 31 within each of the sensor cells 35 .
  • the second selection circuitry 9 may comprise means for sequencing a subset of sensor cells 35 from which an output signal 8 is received.
  • the second selection circuitry 9 may comprise a multiplexer.
  • the second selection circuitry 9 may comprise an analogue multiplexer.
  • the output signal 8 may comprise a complex signal which may comprise both real and imaginary components.
  • the second selection circuitry 9 may be coupled directly to the sensor arrangement 3 so that there is no processing or sampling of the output signal 8 before it is provided to the second selection circuitry 9 .
  • the sensing signal circuitry 7 may comprise means for providing a sensing signal 4 .
  • the sensing signal 4 may by an AC (alternating current) signal.
  • the frequency of the sensing signal 4 may be selected to optimise sensitivity of the sensors 33 within the sensor arrangement 3 .
  • the apparatus 3 may be configured so that the output signal 8 obtained by the second selection circuitry 9 can be used to obtain information from each of the sensors 33 within the sensor arrangement 3 .
  • each sensor cell 35 within the sensor arrangement 3 may be addressed individually. This may enable a measurement of the electrical properties, such as impedance, of each of the sensors 33 to be obtained. As the electrical properties of the sensors 33 are dependent on the sensed attributes these measurements provide information about the sensed attribute.
  • the output signal 8 which is obtained by the second selection circuitry 9 may be provided to analyzing circuitry 21 to enable information about the sensed attributes to be obtained.
  • FIG. 2 schematically illustrates another example apparatus 1 .
  • the example apparatus 1 of FIG. 2 is configured to process the output signal 8 and then enable the processed signal to be transmitted to another device.
  • the example apparatus 1 of FIG. 2 also comprises a sensor arrangement 3 , first selection circuitry 5 and second selection circuitry 9 .
  • the sensor arrangement 3 , first selection circuitry 5 and second selection circuitry 9 may be as described above in relation to FIG. 1 .
  • the example apparatus of FIG. 2 also comprises analyzing circuitry 21 , controlling circuitry 23 , one or more transmitters 25 , a power source 27 and a filter 29 .
  • the analyzing circuitry 21 may comprise any means which may be configured to analyse a signal 22 provided by the second selection circuitry 9 .
  • the analyzing circuitry 21 may be configured to analyse the signal 22 provided by the second selection circuitry 9 to determine the current impedance of the different sensor cells 35 within the sensor arrangement 3 .
  • the analyzing circuitry 21 is configured to act as sensing signal circuitry 7 and provide the input signal 4 to the sensor arrangement 3 .
  • the analyzing circuitry 21 may comprise a frequency generator which may be configured to provide the input signal 4 to the sensor arrangement 3 .
  • the input signal 4 is then provided to the sensors 33 within the sensor arrangement 3 so that the output signal 8 provides an indication of the impedance of the sensors 33 .
  • the output signal 8 is obtained by second selection circuitry 9 .
  • the signal which is provided by the second selection circuitry 9 to the analyzing circuitry 21 may be a complex signal which comprises both real components and imaginary components.
  • the signal 22 may comprise information relating to the impedance of a plurality of the sensors 33 within the sensor arrangement 3 .
  • an anti-aliasing filter 29 may be provided between the second selection circuitry 9 and the analyzing circuitry 21 .
  • the analyzing circuitry 21 may be configured to sample the signal 22 .
  • the analyzing circuitry 21 may comprise an analogue to digital converter which may be configured to sample the signal 22 .
  • the sampled signal may then be analyzed to provide a data indicative of the real and imaginary components of the signal 22 . For instance a discrete Fourier transform may be performed on the sampled signal. This data may be used to calculate the magnitude and/or phase of the impedance of each of the sensors 33 within the sensor arrangement 3 .
  • the analyzing circuitry 21 may comprise any suitable circuitry.
  • the analyzing circuitry 21 may comprise a vector network analyzer impedance converter or any other suitable circuitry.
  • the data which is obtained by the analyzing circuitry 21 may be provided to controlling circuitry 23 in a data signal 24 .
  • the controlling circuitry 23 may comprise means for controlling the apparatus 1 .
  • the controlling circuitry 23 may be configured to control the first selection circuitry 5 to control the sequencing of the gate input signal 6 .
  • the controlling circuitry 23 may also be configured to control the second selection circuitry 9 .
  • the controlling circuitry 23 may be configured to control the first selection circuitry 5 to control the sequencing of the subsets of the sensor cells 35 from which the output signal 8 is received.
  • the controlling circuitry 23 may be configured to synchronize the first selection circuitry 5 and the second selection circuitry 9 to synchronize the sequencing of the subsets of the sensor cells 35 so that each sensor cell 35 can be measured separately.
  • the controlling circuitry 23 may also be configured to process the data signal 24 which is received from the analyzing circuitry 21 .
  • the received data signal 24 comprises data indicative of the measured impedances.
  • the controlling circuitry 23 may be configured to use the received data signal 24 to determine the current impedance for different sensor cells 35 within the sensor arrangement 3 . This may enable information about different sensed attributes to be obtained.
  • the apparatus 1 also comprises one or more transmitters 25 .
  • the one or more transmitters 25 may comprise any means which enables the apparatus 1 to establish a communication connection with another device.
  • the transmitter 25 may enable the apparatus 1 to exchange information with the another device.
  • the another device could be another user device, such as a mobile phone or tablet computer, a server or any other suitable device.
  • the communication connection which is established by the transmitter 25 may comprise a wireless connection.
  • the wireless communication connection may comprise a connection such as near field communication (NFC), Bluetooth, wireless local area network (wireless LAN), Bluetooth low energy (BTLE) or any other suitable connection.
  • the connection may comprise a connection dedicated to the sensor so that only information associated with the sensor is transmitted using the connection.
  • the apparatus 1 may also comprise one or more receivers which may enable the apparatus 1 to receive information from other devices.
  • the one or more transmitters 25 may enable information which has been obtained from the sensor arrangement 3 to be transmitted to another device. This may enable information obtained by the sensors 33 in the sensor arrangement 3 to be transmitted to other devices.
  • the example apparatus 1 of FIG. 2 also comprises a power source 27 .
  • the power source may comprise any means which may be configured to provide power to the sensor arrangement 3 .
  • the power source 27 may comprise a battery or any other suitable means.
  • the power source 27 is arranged to provide voltages between the range of +2.7V and ⁇ 20V. It is to be appreciated that other ranges may be provided in other examples of the disclosure. In some examples the voltage range may depend on the gate voltage requirements of the transistors 31 within the sensor arrangement 3 .
  • the apparatus of FIGS. 1 and 2 may be provided within a communication device.
  • the communication device could be a handheld or wearable device which may be configured to be positioned close to the body of a user.
  • the apparatus 1 may enable information about the parameters of the environment and/or status of a user to be collected and transmitted to another device.
  • FIG. 3 illustrates a sensor arrangement 3 which may be used in some examples of the disclosure.
  • the example sensor arrangement 3 of FIG. 3 may be provided within apparatus 1 such as the apparatus of FIGS. 1 and 2 .
  • the sensors 33 are connected in series with the transistors 31 .
  • the sensor arrangement 3 may be coupled to first selection circuitry 5 and second selection circuitry 9 .
  • the first selection circuitry 5 and the second selection circuitry 9 may be as described above in relation to FIGS. 1 to 2 .
  • An input signal 4 may be provided by sensing signal circuitry 7 .
  • the second selection circuitry 9 may comprise a multiplexer as described above.
  • the sensor arrangement 3 comprises a plurality of sensor cells 35 .
  • sixteen sensor cells 35 are provided in a four by four array. It is to be appreciated that any number and/or arrangement of sensor cells 35 may be provided in other examples of the disclosure.
  • the sensor arrangement 3 comprises a distributed network of sensor cells 35 arranged as an array.
  • the array comprises a plurality of rows and a plurality of columns.
  • the array is a regular array comprising regularly spaced parallel rows and regularly spaced parallel columns.
  • the array is orthogonal in that the rows are orthogonal to the columns. It is to be appreciated that in some examples the array might not be regular and/or might not be orthogonal.
  • each of the sensor cells 35 comprises a transistor 31 coupled to a sensor 33 . Only one transistor 31 is provided in each of the sensor cells 35 . In the example of FIG. 3 the sensor 33 is connected in series to the transistor 31 . In the example of FIG. 3 there are no intervening components between the transistor 31 and the sensor 33 .
  • the transistors 31 are arranged within the sensor arrangement 3 so that they are positioned between the sensing signal circuitry 7 and the second selection circuitry 9 .
  • the transistors 31 are arranged to act as switches for the sensors 33 .
  • the transistors 31 are arranged so that the source input signal is received from the sensing signal circuitry 7 and the drain signal is provided to the second selection circuitry 9 .
  • the gate input signal 6 is received from the first selection circuitry 5 .
  • the first selection circuitry 5 is arranged so that, by providing a gate input signal 6 to different subsets of sensor cells 35 at different times the different sensor cells 35 can be made active at different times.
  • the transistors 31 may comprise any suitable transistors 31 .
  • the transistors 31 may comprise thin film transistors or other similar transistors.
  • the transistors 31 may comprise organic or inorganic thin film transistors.
  • the transistors 31 may be formed using any suitable technique.
  • the transistors 31 may be printed or deposited onto a substrate. Printed methods such as roll-to-roll printing, sheet to sheet printing, silk screen printing, or other printed electronics methods can be used depending on the materials used within the transistor 31 .
  • the sensors 33 may comprise any means which may produce a measurable change in an electrical property in response to a sensed attribute.
  • the sensors 33 are configured to produce a change in impedance.
  • the impedance of the sensor 33 is represented as a capacitance in parallel with a resistance which gives a time varying complex impedance.
  • the detected attribute which is sensed by the sensors 33 could be a user input such as a user touching the apparatus 1 or bending or deforming the apparatus 1 .
  • the detected attribute could comprise an environmental parameter, such as temperature, radiation the presence of chemicals or any other suitable attribute.
  • the materials which are used within the sensors 33 may be selected in dependence of the attribute which is to be sensed.
  • the sensor 33 may comprise graphene oxide. This may enable the sensor 33 to detect attributes such as humidity, temperature or other suitable environmental parameters.
  • sensors 33 comprising graphene may be used to detect attributes such as UV(ultraviolet) and IR (infra red) radiation, chemicals such as antigens or other contaminants.
  • graphene may be used to detect contaminants within water. This may enable the sensors 33 to be used in water purification systems or for ensuring water quality for food production and preparation or for any other suitable use.
  • sensors 33 comprising zinc oxide may be used to detect humidity or other environmental parameters such as gases or other chemicals.
  • the zinc oxide may be provided in nanostructures or any other suitable form.
  • the sensors 33 may comprise materials which have capacitive transduction mechanism such as polysiloxane and methacrylic polymers, polyimide, poly(vinyl pyrrolidone), poly(vinyl alcohol), ceramic materials or any other suitable material. If the material has a capacitive transduction mechanism then the environmental parameter or other attributes may change the permittivity of the material. Such materials may be used to detect attributes such as temperature, infrared radiation, contaminants such as gases or any other suitable parameters.
  • the senor 33 may comprise materials which may be configured to detect changes in shape or strain applied to the apparatus 1 . This may enable the sensor arrangement 3 to be used to detect user inputs such as a user bending or otherwise deforming the apparatus.
  • the sensors 33 may comprise carbon structures such as carbon nanotubes which may have an impedance which changes when the sensor 33 is deformed.
  • the sensors 33 may comprise a piezoelectric material such as PZT (lead zirconate titanate), Zinc Oxide or any other suitable material.
  • the sensors 33 are provided between the sensing signal circuitry 7 and the second selection circuitry 9 so that the output signal 8 provides a measurement of the impedance of the sensors 33 .
  • the apparatus 1 may be configured so that each of the sensor cells 35 in the sensor arrangement 3 may be separately measured.
  • the first selection circuitry 5 may be configured to direct the gate input signal 6 to a particular subset of sensor cells 35 .
  • the first selection circuitry 5 may be configured to direct the gate input signal 6 to a particular row of sensor cells 35 .
  • the gate input signal is provided to the gate of the transistors 31 to enable the transistors 31 to act as switches.
  • the second selection circuitry 9 may be configured to direct the output signal 8 from a particular subset of sensor cells 35 .
  • the second selection circuitry 9 may be configured to direct the output signal 8 from a particular column of sensor cells 35 .
  • the first selection circuitry 5 and the second selection circuitry 7 may be synchronised so that they simultaneously direct the gate input signal 6 to and direct the output signal 8 from, the same active sensor cell 35 .
  • the synchronization of the first selection circuitry 5 and the second selection circuitry 7 may be controlled by controlling circuitry 23 .
  • the first selection circuitry 5 may be configured to sequence the row to which the gate input signal 6 is provided through a series of different rows. Each row may be made active once in a given time period.
  • the second selection circuitry 9 may be configured to sequence the column from which the output signal 8 is received through a series of different columns. Each column may be made active once in the given time period.
  • the gate input signal 6 and the output signal 8 may have regular time sequences where each cell is addressed as frequently and for the same amount of time as all the other cells.
  • the signals may have an irregular time sequence so that some cells are addressed more frequently than others and/or for a longer period of time.
  • gate input signal 6 is provided to rows and the output signal 8 is taken from columns, this may be reversed.
  • the gate input signal 6 may be provided to columns and the output signal 8 may be taken from rows.
  • the terms “row” and “column” may therefore be interchanged.
  • FIG. 4 illustrates another sensor arrangement 3 which may be used in some examples of the disclosure.
  • the example sensor arrangement 3 of FIG. 4 may be provided within apparatus 1 such as the apparatus of FIGS. 1 and 2 .
  • the sensor arrangement 35 comprises a plurality of sensor cells 35 each comprising a transistor 31 and a sensor 33 .
  • the transistors 31 and the sensors 33 may be as described previously.
  • the sensor arrangement 3 of FIG. 4 differs from the sensor arrangement 3 of FIG. 3 in that, in FIG. 4 , the sensors 33 are connected in parallel with the transistors 31 rather than in series.
  • the first selection circuitry 5 is configured to enable the gate input signal 6 to be provided to different columns of the sensor arrangement 3 and the second selection circuitry 9 is configured to enable the output signal 8 to be taken from different rows. It is to be appreciated that the operation of the first selection circuitry 5 and the second selection circuitry 9 may be as described previously. It is also to be appreciated that other examples the gate input signal 6 may be provided to rows and the output signal 8 may be taken from columns.
  • FIG. 5 illustrates a method. The method may be used to provide apparatus such as the apparatus described above with reference to FIGS. 1 to 4 .
  • the method comprises, providing, at block 51 a sensor arrangement 3 comprising a plurality of sensor cells 35 wherein a sensor cell 35 comprises a transistor 31 and a sensor 33 coupled to the transistor 31 .
  • the method comprises providing first selection circuitry 5 configured to sequence a subset of sensor cells 35 to which a gate input signal 6 is provided, wherein the gate input signal 6 is provided to the gate of the transistors 31 within the sensor cells 35 .
  • the method also comprises providing, at block 55 , second selection circuitry 9 configured to sequence a subset of sensor cells 35 from which an output signal is received and providing at block 57 , sensing signal circuitry 7 configured to provide a sensing signal 4 , wherein the sensors 33 are provided between the sensing signal circuitry 7 and the second selection circuitry 9 such that the output signal provides an indication of the impedance of the sensors 33 .
  • FIG. 6 illustrates a plot of sensor sensitivity for an example device where the data is sampled with a first frequency.
  • Sensor sensitivity is plotted on the y axis and impedance Z is plotted on the x axis.
  • Sensor sensitivity (figure of merit) is given by d
  • the data plotted in FIG. 6 was obtained using 5 kHz sampling frequency.
  • the plot of FIG. 6 shows that sensitivity of the sensor cell 35 is good enough for reliable measurement when the impedance of the sensor 33 is in the range 20 k ⁇ to 200 k ⁇ .
  • the impedance of the transistor 31 should be significantly smaller than the resistance of the device under test (sensor 33 ).
  • the resistance of the device under test is larger than the impedances of the channel of the transistor 31 which are arranged as switches.
  • FIG. 7 illustrates another plot of sensor sensitivity where the data was sampled with a second frequency.
  • the sampling frequency was 100 Hz.
  • the use of the lower frequency increases the sensitivity of the sensor so that the detection range is widened to between 30 k ⁇ to 30M ⁇ .
  • sampling frequency which is used in examples of the disclosure may depend upon the sensors 33 and transistors 31 which are used.
  • Examples of the disclosure provide for a sensor arrangement 3 which only comprises a single transistor 31 in each of the sensor cells 35 . This reduces the number of connections needed to address each sensor cell individually.
  • the reduced number of connection lines needed may enable arrays comprising a large number of sensor cells 35 to be provided. For instance in some examples the array may comprise more than 100 sensors cells 35 in each column and/or row.
  • Having only a single transistor 31 in each of the sensor cells 35 may also reduce the resistance of each sensor cell and may enable a wider measurement range for the sensor 33 .
  • the resistance in series with the sensor 33 may be low enough to enable accurate measurements from the sensors 33 .
  • the resistance in parallel with the sensor 33 may be low enough to enable accurate measurements from the sensors 33 .
  • the sensor arrangement 3 may be formed by printing and may provide a small and compact sensing device.
  • the sensing device may be integrated into wearable electronics or into portable electronic devices such as mobile telephones. This may enable the sensor arrangement 3 to be used to be used to monitor the environment of the user. For instance it could be used to monitor a user's exposure to harmful or potentially harmful parameters such as heat, radiation such as UV radiation or IR radiation, contaminants which could be harmful to a user or any other suitable parameters.
  • the information which is obtained by the sensor arrangement could be provided to other devices via one or more transmitters. This may enable the other device to monitor the conditions to which the apparatus has been exposed and may enable a warning, or other action, to be enabled if the exposure exceeds a given threshold.
  • the sensor arrangement 3 could be configured to detect user inputs such as a user bending or otherwise deforming the apparatus 1 . This may enable the same components to be used to detect environmental parameters and also user inputs.
  • the controlling circuitry 23 previously described may be implemented using instructions that enable hardware functionality, for example, by using executable computer program instructions in a general-purpose or special-purpose processing circuitry that may be stored on a computer readable storage medium (disk, memory etc) to be executed by such processing circuitry.
  • a general-purpose or special-purpose processing circuitry may be stored on a computer readable storage medium (disk, memory etc) to be executed by such processing circuitry.
  • Processing circuitry may be configured to read from and write to memory circuitry.
  • the processing circuitry may also comprise an output interface via which data and/or commands are output by the processing circuitry and an input interface via which data and/or commands are input to the processing circuitry.
  • the memory circuitry may be configured to store a computer program comprising computer program instructions that control the operation of the apparatus 1 when loaded into the processing circuitry.
  • the computer program instructions provide the logic and routines that enable the apparatus to perform the methods described.
  • the processing circuitry by reading the memory circuitry is able to load and execute the computer program.
  • the apparatus 1 therefore comprises: processing circuitry and memory circuitry including computer program code, the at least one memory and the computer program code configured to, with the processing circuitry, cause the analysing circuitry 21 to perform as described.
  • the computer program may arrive at the apparatus 1 via any suitable delivery mechanism.
  • the delivery mechanism may be, for example, a non-transitory computer-readable storage medium, a computer program product, a memory device, a record medium such as a compact disc read-only memory (CD-ROM) or digital versatile disc (DVD), an article of manufacture that tangibly embodies the computer program.
  • the delivery mechanism may be a signal configured to reliably transfer the computer program.
  • the apparatus 1 may propagate or transmit the computer program as a computer data signal.
  • the memory circuitry may be implemented as a single component it may be implemented as one or more separate components some or all of which may be integrated/removable and/or may provide permanent/semi-permanent/dynamic/cached storage.
  • references to “computer-readable storage medium”, “computer program product”, “tangibly embodied computer program” etc. or a “controller”, “computer”, “processor” etc. should be understood to encompass not only computers having different architectures such as single/multi- processor architectures and sequential (Von Neumann)/parallel architectures but also specialized circuits such as field-programmable gate arrays (FPGA), application specific circuits (ASIC), signal processing devices and other processing circuitry.
  • References to computer program, instructions, code etc. should be understood to encompass software for a programmable processor or firmware such as, for example, the programmable content of a hardware device whether instructions for a processor, or configuration settings for a fixed-function device, gate array or programmable logic device etc.
  • circuitry refers to all of the following:
  • circuits and software such as (as applicable): (i) a combination of processor(s) or (ii) portions of processor(s)/software (including digital signal processor(s)), software, and memory(ies) that work together to cause an apparatus, such as a mobile phone or server, to perform various functions) and
  • circuits such as a microprocessor(s) or a portion of a microprocessor(s), that require software or firmware for operation, even if the software or firmware is not physically present.
  • circuitry applies to all uses of this term in this application, including in any claims.
  • circuitry would also cover an implementation of merely a processor (or multiple processors) or portion of a processor and its (or their) accompanying software and/or firmware.
  • circuitry would also cover, for example and if applicable to the particular claim element, a baseband integrated circuit or applications processor integrated circuit for a mobile phone or a similar integrated circuit in server, a cellular network device, or other network device.”
  • example or “for example” or “may” in the text denotes, whether explicitly stated or not, that such features or functions are present in at least the described example, whether described as an example or not, and that they can be, but are not necessarily, present in some of or all other examples.
  • example “for example” or “may” refers to a particular instance in a class of examples.
  • a property of the instance can be a property of only that instance or a property of the class or a property of a sub-class of the class that includes some but not all of the instances in the class. It is therefore implicitly disclosed that a features described with reference to one example but not with reference to another example, can where possible be used in that other example but does not necessarily have to be used in that other example.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5536932A (en) * 1995-02-10 1996-07-16 Xerox Corporation Polysilicon multiplexer for two-dimensional image sensor arrays
US20080217508A1 (en) * 2007-03-05 2008-09-11 Canon Kabushiki Kaisha Photoelectric conversion apparatus, photoelectric conversion system, and method of driving the same
US20110204247A1 (en) * 2008-10-28 2011-08-25 Konica Minolta Medical & Graphic, Inc. Scintillator panel, radiation detector, and method for manufacturing the same
US20140013865A1 (en) * 2012-07-13 2014-01-16 Nokia Corporation Apparatus for Sensing

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6416902A (en) * 1987-07-11 1989-01-20 Agency Ind Science Techn Tactile sensor
JP4137239B2 (ja) * 1998-08-03 2008-08-20 株式会社堀場製作所 Ｉｓｆｅｔアレイ
US6730909B2 (en) * 2000-05-01 2004-05-04 Bae Systems, Inc. Methods and apparatus for compensating a radiation sensor for temperature variations of the sensor
JP2005287773A (ja) * 2004-03-31 2005-10-20 Canon Inc 画像撮影装置及び画像撮影システム
US7683953B1 (en) * 2004-06-30 2010-03-23 Foveon, Inc. Intra-pixel fixed-pattern-noise cancellation circuit and method
JP4530034B2 (ja) * 2007-03-30 2010-08-25 株式会社イデアルスター ガスセンサー、そのための気体検知モジュール、およびこれらを用いた気体計測システム
JP4957597B2 (ja) * 2007-05-18 2012-06-20 セイコーエプソン株式会社 センシング回路、その駆動方法、表示装置および電子機器
JP4983661B2 (ja) * 2008-03-14 2012-07-25 富士通セミコンダクター株式会社 半導体装置の製造方法
JP4725608B2 (ja) * 2008-07-03 2011-07-13 ソニー株式会社 比較器、比較器の校正方法、固体撮像素子、およびカメラシステム
JP5417055B2 (ja) * 2009-06-15 2014-02-12 シャープ株式会社 Ａ／ｄ変換器、固体撮像装置、及び電子情報機器
JP2011174793A (ja) * 2010-02-24 2011-09-08 Fuji Electric Co Ltd 圧力センサ
US8419273B2 (en) * 2010-05-03 2013-04-16 Sharp Kabushiki Kaisha Array element for temperature sensor array circuit, temperature sensor array circuit utilizing such array element, and AM-EWOD device including such a temperature sensor array circuit
WO2012047515A1 (en) * 2010-09-28 2012-04-12 Laitram, L.L.C. System and method for detecting contamination of a conveyor
WO2013102850A1 (en) * 2012-01-04 2013-07-11 Insituto De Engenharia De Sistemas E Computadores Para Os Microsistemas E As Nanotecnologias Monolithic device combining cmos with magnetoresistive sensors
JP5789528B2 (ja) * 2012-01-19 2015-10-07 株式会社ジャパンディスプレイ 表示装置
CN102832927B (zh) * 2012-08-31 2016-04-13 华南理工大学 适合于cmos工艺实现的植入式am发射方法及系统
US20140176110A1 (en) * 2012-12-26 2014-06-26 Washington Lamar Output Driver Having Reduced Electromagnetic Susceptibility and Associated Methods
CN103954794A (zh) * 2014-05-13 2014-07-30 安徽理工大学 低频压电加速度传感器电荷放大及采集系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5536932A (en) * 1995-02-10 1996-07-16 Xerox Corporation Polysilicon multiplexer for two-dimensional image sensor arrays
US20080217508A1 (en) * 2007-03-05 2008-09-11 Canon Kabushiki Kaisha Photoelectric conversion apparatus, photoelectric conversion system, and method of driving the same
US20110204247A1 (en) * 2008-10-28 2011-08-25 Konica Minolta Medical & Graphic, Inc. Scintillator panel, radiation detector, and method for manufacturing the same
US20140013865A1 (en) * 2012-07-13 2014-01-16 Nokia Corporation Apparatus for Sensing

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US20210305984A1 (en) 2021-09-30
PH12017501398A1 (en) 2018-01-15
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MX2017010307A (es) 2017-12-04
EP3054597B1 (en) 2020-04-15

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