US20050202758A1 - Carrier for holding an object to be polished - Google Patents

Carrier for holding an object to be polished Download PDF

Info

Publication number
US20050202758A1
US20050202758A1 US11/074,481 US7448105A US2005202758A1 US 20050202758 A1 US20050202758 A1 US 20050202758A1 US 7448105 A US7448105 A US 7448105A US 2005202758 A1 US2005202758 A1 US 2005202758A1
Authority
US
United States
Prior art keywords
carrier
polished
holding
polishing
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/074,481
Other languages
English (en)
Inventor
Akira Yoshida
Toshikuni Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34824559&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=US20050202758(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Assigned to SPEEDFAM CO., LTD. reassignment SPEEDFAM CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YOSHIDA, AKIRA, SHIMIZU, TOSHIKUNI
Publication of US20050202758A1 publication Critical patent/US20050202758A1/en
Priority to US12/386,139 priority Critical patent/US20090203300A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • B24B41/067Work supports, e.g. adjustable steadies radially supporting workpieces
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61FFILTERS IMPLANTABLE INTO BLOOD VESSELS; PROSTHESES; DEVICES PROVIDING PATENCY TO, OR PREVENTING COLLAPSING OF, TUBULAR STRUCTURES OF THE BODY, e.g. STENTS; ORTHOPAEDIC, NURSING OR CONTRACEPTIVE DEVICES; FOMENTATION; TREATMENT OR PROTECTION OF EYES OR EARS; BANDAGES, DRESSINGS OR ABSORBENT PADS; FIRST-AID KITS
    • A61F7/00Heating or cooling appliances for medical or therapeutic treatment of the human body
    • A61F7/007Heating or cooling appliances for medical or therapeutic treatment of the human body characterised by electric heating
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/44Detecting, measuring or recording for evaluating the integumentary system, e.g. skin, hair or nails
    • A61B5/441Skin evaluation, e.g. for skin disorder diagnosis
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H23/00Percussion or vibration massage, e.g. using supersonic vibration; Suction-vibration massage; Massage with moving diaphragms
    • A61H23/02Percussion or vibration massage, e.g. using supersonic vibration; Suction-vibration massage; Massage with moving diaphragms with electric or magnetic drive
    • A61H23/0218Percussion or vibration massage, e.g. using supersonic vibration; Suction-vibration massage; Massage with moving diaphragms with electric or magnetic drive with alternating magnetic fields producing a translating or oscillating movement
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61FFILTERS IMPLANTABLE INTO BLOOD VESSELS; PROSTHESES; DEVICES PROVIDING PATENCY TO, OR PREVENTING COLLAPSING OF, TUBULAR STRUCTURES OF THE BODY, e.g. STENTS; ORTHOPAEDIC, NURSING OR CONTRACEPTIVE DEVICES; FOMENTATION; TREATMENT OR PROTECTION OF EYES OR EARS; BANDAGES, DRESSINGS OR ABSORBENT PADS; FIRST-AID KITS
    • A61F7/00Heating or cooling appliances for medical or therapeutic treatment of the human body
    • A61F7/007Heating or cooling appliances for medical or therapeutic treatment of the human body characterised by electric heating
    • A61F2007/0075Heating or cooling appliances for medical or therapeutic treatment of the human body characterised by electric heating using a Peltier element, e.g. near the spot to be heated or cooled
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61FFILTERS IMPLANTABLE INTO BLOOD VESSELS; PROSTHESES; DEVICES PROVIDING PATENCY TO, OR PREVENTING COLLAPSING OF, TUBULAR STRUCTURES OF THE BODY, e.g. STENTS; ORTHOPAEDIC, NURSING OR CONTRACEPTIVE DEVICES; FOMENTATION; TREATMENT OR PROTECTION OF EYES OR EARS; BANDAGES, DRESSINGS OR ABSORBENT PADS; FIRST-AID KITS
    • A61F7/00Heating or cooling appliances for medical or therapeutic treatment of the human body
    • A61F2007/0086Heating or cooling appliances for medical or therapeutic treatment of the human body with a thermostat
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61FFILTERS IMPLANTABLE INTO BLOOD VESSELS; PROSTHESES; DEVICES PROVIDING PATENCY TO, OR PREVENTING COLLAPSING OF, TUBULAR STRUCTURES OF THE BODY, e.g. STENTS; ORTHOPAEDIC, NURSING OR CONTRACEPTIVE DEVICES; FOMENTATION; TREATMENT OR PROTECTION OF EYES OR EARS; BANDAGES, DRESSINGS OR ABSORBENT PADS; FIRST-AID KITS
    • A61F7/00Heating or cooling appliances for medical or therapeutic treatment of the human body
    • A61F2007/0095Heating or cooling appliances for medical or therapeutic treatment of the human body with a temperature indicator
    • A61F2007/0096Heating or cooling appliances for medical or therapeutic treatment of the human body with a temperature indicator with a thermometer
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/01Constructive details
    • A61H2201/0157Constructive details portable
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/10Characteristics of apparatus not provided for in the preceding codes with further special therapeutic means, e.g. electrotherapy, magneto therapy or radiation therapy, chromo therapy, infrared or ultraviolet therapy
    • A61H2201/105Characteristics of apparatus not provided for in the preceding codes with further special therapeutic means, e.g. electrotherapy, magneto therapy or radiation therapy, chromo therapy, infrared or ultraviolet therapy with means for delivering media, e.g. drugs or cosmetics
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/16Physical interface with patient
    • A61H2201/1683Surface of interface
    • A61H2201/1685Surface of interface interchangeable
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/50Control means thereof
    • A61H2201/5007Control means thereof computer controlled
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/50Control means thereof
    • A61H2201/5023Interfaces to the user
    • A61H2201/5043Displays
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61HPHYSICAL THERAPY APPARATUS, e.g. DEVICES FOR LOCATING OR STIMULATING REFLEX POINTS IN THE BODY; ARTIFICIAL RESPIRATION; MASSAGE; BATHING DEVICES FOR SPECIAL THERAPEUTIC OR HYGIENIC PURPOSES OR SPECIFIC PARTS OF THE BODY
    • A61H2201/00Characteristics of apparatus not provided for in the preceding codes
    • A61H2201/50Control means thereof
    • A61H2201/5058Sensors or detectors
    • A61H2201/5082Temperature sensors

Definitions

  • the present invention relates to a carrier for holding an object to be polished (hereinafter referred to as “polishing object”), which is used in a double-sided polishing apparatus that simultaneously polishes both surfaces of the polishing object by holding the polishing object between upper and lower platens covered with abrasive cloth with the platens and the polishing object being in pressure contact with each other, and rotating at least one of the platens and the polishing object, the surface of the carrier being coated with diamond-like carbon, and to a method of manufacturing the carrier, and a method of polishing a polishing object using the carrier.
  • the invention relates to a diamond-like carbon coated carrier for holding a polishing object used for polishing both surfaces of a silicon wafer, a method of manufacturing the carrier, and a polishing method using the carrier.
  • the polishing object In polishing a silicon wafer, a compound semiconductor wafer, an aluminum-made magnetic disk substrate, a glass-made magnetic disk substrate, or a polishing object that is made of photomask glass, a crystal oscillator, metal, or the like, the polishing object is held by a carrier cut into a shape where a holding hole is formed in conformity to a shape of the polishing object and peripheral (outer) gear teeth are arranged at an outer edge so as to mesh with an internal gear and sun gear of a double-sided polishing machine.
  • the polishing object is driven together with the carrier.
  • the carrier is mainly used as a member of a polishing apparatus for lapping or polishing both surfaces of a silicon wafer, a magnetic disk substrate, or the like at a time. Hence, the thickness of the carrier member is set slightly smaller than that of the polishing object such as a wafer.
  • the thickness is adjusted by lapping or grinding, and the wafer is etched with an acid or alkali etchant, followed by polishing to attain a mirror-finished surface on one or both of front and rear sides of the wafer.
  • some objects to be polished which include the silicon wafer, undergo the double-sided polishing, in which the polishing was hitherto performed on only one side.
  • An indispensable condition for double-sided polishing is to use a carrier for holding a polishing object. In this case, what is important are an abrasion resistance and durability of a carrier itself, and whether or not heavy metal in the carrier causes any contamination.
  • a carrier made of, for example, a hard resin or a nonmetal material such as FRP is inferior in the abrasion resistance and durability, and thus falls short of practical applicability.
  • a carrier made of a metal material such as steel or stainless steel has a problem about the heavy metal contamination.
  • the substrate surface is coated with any material.
  • a ceramic-coated metal carrier as disclosed in JP 04-026177 A.
  • JP 2002-018707 A discloses an SK steel-made carrier whose surface is plated with metal. This offers by no means a solution to the problem in that the polishing object is contaminated with heavy metal, in particular, in polishing the semiconductor wafer.
  • JP 11-010530 A discloses a carrier given a dressing function, which is prepared by welding the ceramic particles to uneven upper and lower surfaces and in addition, coating the uneven surfaces with diamond-like carbon.
  • the document describes that the durability and the abrasion resistance are improved by the effect of the diamond-like carbon.
  • the carrier is devised for the purpose of preventing the ceramic particles functioning to dress the target from coming off from the surface, and thus differs from the carrier for holding the polishing object which is used for double-sided polishing.
  • the inventors of the present invention have made extensive studies with an aim to solve the problem regarding the durability, the abrasion resistance, and the heavy metal contamination in polishing both surfaces of the semiconductor material such as a silicon wafer. As a result, the inventors presupposed that the above-mentioned problems may be solved by coating an ordinary carrier with diamond-like carbon on its surface with high surface smoothness, and have worked on its development and research.
  • DLC diamond-like carbon
  • Sp 3 bond diamond structure
  • SP 2 bond graphite structure
  • the DLC can be easily formed into a thin film by plasma CVD etc. as disclosed in JP 10-046344 A.
  • the inventors of the present invention have concluded that a carrier produced by uniformly and firmly laminating the DLC thin film of the above performance thereon and a manufacturing method therefor would solve the above-mentioned problems.
  • the inventors of the present invention have found, as a result of extensive studies on the problem inherent in the aforementioned conventional double-sided polishing carrier, all or part of the carrier surface is coated with the uniform DLC thin film having a highly smooth surface, whereby it is possible to remarkably improve the abrasion resistance and durability of the carrier, to prevent heavy metal from eluting from the carrier to cause contamination, and to protect the surface to be polished against any scratches resulting from a coating material coming off from the carrier surface.
  • Another object of the present invention is to provide a manufacturing method for the carrier.
  • Still another object of the present invention is to provide a double-sided polishing method using the carrier.
  • the aforementioned object can be attained by a carrier for holding a polishing object, the carrier including a substrate whose entire surface is coated with DLC.
  • a polishing apparatus, in which the carrier of the present invention is used is a so-called double-sided polishing apparatus for polishing both surfaces of the polishing object at a time by holding the polishing object between upper and lower platens covered with abrasive cloth, the platens and the polishing object being in pressure contact with each other, and rotating at least one of the upper and lower platens and the polishing object.
  • a manufacturing method for a DLC-coated carrier for holding a polishing object relates to a manufacturing method for a carrier holding a polishing object, including: providing a surface coating apparatus using a plasma CVD method in which an anode electrode and a cathode electrode are arranged face to face in a vacuum chamber, a carrier substrate is interposed between the anode electrode and the cathode electrode, and RF power is applied between the anode electrode and the cathode electrode while supplying a material gas to form a diamond-like carbon film on the substrate surface; interposing a substrate between the anode electrode and the cathode electrode; and shifting a supporting position of the substrate during formation of the diamond-like carbon film or between current formation and next formation.
  • a so-called plasma CVD method is used, and the supporting position of the substrate is shifted as appropriate to thereby leave substantially no uncoated area.
  • the still other object of the present invention is attained by a polishing method for polishing both surfaces of a polishing object, including: mounting a carrier for holding a polishing object according to the present invention, between upper and lower platens covered with abrasive cloth; holding the polishing object in a holding hole in the carrier for holding the polishing object; rotating at least one of the upper and lower platens and the polishing object while supplying an abrasive slurry to a surface to be processed to polish both surfaces of the polishing object, wherein the abrasive cloth is made of one selected from the group consisting of sueded synthetic leather, polyurethane, and a composite prepared by binding non-woven cloth with polyurethane.
  • the carrier of the present invention overcomes all the problems inherent in the conventional carrier.
  • a carrier is shaped into a disk-like thin plate, and has a peripheral gear at its outermost edge and a holding hole for holding an object to be polished (hereinafter referred to as “polishing object”) in its inner position, and optionally a lightening hole.
  • a carrier size varies depending on an apparatus model but ranges from several centimeters to several ten centimeters; some carriers exceed 1 m in size by the model.
  • the carrier somewhat thinner than the polishing object is used.
  • silicon wafer has a thickness of about several hundred micrometers. Accordingly, the entire surface of a carrier substrate corresponds to the front and rear surfaces and a side surface (section along its thickness direction).
  • an area to be coated with DLC includes the side surface.
  • the carrier is thin in section along its thickness direction, and besides, meshes with an internal gear and sun gear of an apparatus or contacts the polishing object at the side surface portion.
  • a portion is most likely to receive a local stress and a large frictional force, and thus is more fragile than other portions. Even if not cracked, this portion will cause minute crack and heavy metal contamination resulting from wear.
  • a polishing object is held between upper and lower platens covered with abrasive cloth and polished while spraying an abrasive such as colloidal silica slurry.
  • an abrasive such as colloidal silica slurry.
  • a material of a substrate used for a carrier is not particular limited but is preferably any of steel, stainless steel, aluminum, an aluminum alloy, a resin, a fiber-reinforced resin, and a composite thereof.
  • a metal material such as steel, stainless steel, or an aluminum alloy as the material of the substrate.
  • a feature of the DLC resides in its structure in which a diamond structure (SP 3 bond) and a graphite structure (SP 2 bond) coexist, and which has a hardness of 1,000 to 4,000 kgf/mm 2 in terms of Vickers hardness, that is, a high hardness comparable with superhard ceramics or diamond.
  • the DLC is amorphous, not microcrystalline unlike diamond or superhard ceramics and thus is featured by its ability to form a uniform and highly smooth surface.
  • a feature of the DLC resides in its high hardness equivalent to diamond as well as high surface smoothness and low friction coefficient unlike diamond, in short, its extremely high sliding property. Accordingly, a feature of the carrier for holding a polishing object whose entire surface is coated with the DLC according to the present invention resides in less wear and damage in a sliding portion, and still less wear of the surface.
  • the entire surface of the carrier of the present invention is coated with the DLC as a nonmetal material, so even with the substrate made of metal, for example, steel, the carrier is free of elution due to a chemical reaction with acid or alkali in the abrasive composition, which enables protection against heavy metal contamination.
  • the carrier for holding the polishing object As a manufacturing method for the carrier for holding the polishing object according to the present invention, plasma CVD is employed as discussed above. With this method, the entire structure is exposed to plasma, making it possible to cover the entire surface with the uniform and dense DLC coating film.
  • the DLC coating film thickness can be controlled based on coating conditions and time.
  • the carrier of the present invention is relatively large when taking into account a material size treatable with conventional plasma CVD methods. It is necessary to support the carrier with any holding jig during the treatment, so the supported portion is not exposed to plasma during the treatment. As a result, part of the substrate surface remains untreated. Accordingly, a supporting position is shifted as appropriate, which leaves substantially no uncoated area, and the substantially uniform DLC thin film with the uniform thickness can be formed.
  • the substrate thickness uniform in advance of the DLC coating on the substrate surface. If the substrate thickness is not uniform, the wear proceeds concentratedly in the thick portion and a coating on this portion peels off.
  • a relative standard deviation of the thickness is preferably 0.4% or less, more preferably 0.2% or less.
  • lapping, cutting, or polishing may be adopted without any particular limitations; alternatively, those may be carried out in turn stepwise.
  • the DLC coating film thickness preferably ranges from 0.1 ⁇ m to 20 ⁇ m. With the thickness smaller than 0.1 ⁇ m, its frictional strength is a little inferior, while the thickness exceeding 20 ⁇ m requires much time to form the film and is disadvantageous in terms of cost performance. Also, for the purpose of protecting end surfaces of the polishing object during processing, a resin may be applied to surround the holding hole for holding the polishing object in the DLC coated carrier.
  • a polishing apparatus and conditions used in the examples of the present invention and comparative examples are summarized in Tables 1 and 3 below.
  • As the polishing apparatus a double-sided polishing apparatus (DSM-9B, available from SPEEDFAM Co., Ltd.) was used.
  • As the abrasive cloth As the abrasive cloth, SUBA 800 (available from Rodel Co., Ltd.) was used.
  • An abrasive, Rodel 12371 (available from Rodel Co., Ltd.) was prepared by adding 10 parts of pure water per part of concentrate solution.
  • An SUS-made carrier substrate which had been lapped into the thickness of 550 ⁇ m in advance, was coated with DLC into the thickness of 2.5 ⁇ m. After the substrate was coated with the DLC up to 1.0 ⁇ m under the film formation temperature set to 150° C., the supporting position was shifted to resume the deposition by 1.5 ⁇ m.
  • the resultant DLC coated carrier was polished under the conditions of Table 1 without holding the polishing object.
  • the diluted abrasive was recycled.
  • a wear rate was determined by calculating a difference between the thicknesses measured before and after the polishing with a micrometer. The durability was examined based on a visual test.
  • a carrier As a carrier, three types of carriers of an SUS-made carrier, a glass epoxy-resin-made (EG-made) carrier, and an FR-vinylon-made resin were used, none of which were coated with the DLC.
  • Example 1 The three types of carriers all had the thickness of about 550 ⁇ m.
  • the carriers were polished under the conditions of Table 1 without holding a polishing object as in Example 1.
  • the diluted abrasive was recycled. Polishing test results of Example 1 and Comparative Examples 1 to 3 are listed in Table 2 below.
  • Example 2 The DLC coated carrier produced in Example 1 was polished under the conditions of Table 3 with the carrier holding a 6-inch silicon wafer as a polishing object. In Example 2, the diluted abrasive was not recycled.
  • Comparative Examples 1 to 3 The three types of carriers used in Comparative Examples 1 to 3, that is, the SUS-made carrier, the glass-epoxy-resin-made (EG-made) carrier, and the FR-vinylon-made carrier were employed. Similar to Example 2, the carriers were polished under the conditions of Table 3, with the carriers holding the 6-inch silicon wafer. In Comparative Examples 1 to 3, the diluted abrasive was not recycled. Polishing test results of Example 2 and Comparative Examples 4 to 6 are listed in Table 4 below. TABLE 4 Comparative Comparative Comparative Example 1 Example 1 Example 2 Example 3 item DLC *1 SUS EG *2 FR-vinylon Fe 5 or lower 45 5 or lower 5 or lower Cu 5 or lower 8 5 or lower 5 or lower Cr 5 or lower 13 5 or lower 5 or lower
  • Example 1 As a result of comparing Example 1 with Comparative Examples 1 to 3, the wear rate is remarkably low in Example 1, and the carrier made of FR-vinylon (Comparative Example 3) prepared by binding glass fibers with vinylon shows the next lower wear rate.
  • FR-vinylon Comparative Example 3
  • a visual test was carried out to examine how far cracks occur in each carrier. As a result, the carrier of Example 1 subjected to the visual test over 10 hours showed no change.
  • the carriers of Comparative Examples 1 and 2 subjected to the same over 1 hour showed no change, but cracks occurred at the base of gear teeth of the carrier of Comparative Example 3.
  • Example 2 The silicon wafer surface polished in Example 2 and Comparative Examples 4 to 6 was rinsed with pure water, after which a mixture of nitric acid and hydrofluoric acid was used to dissolve the surface portion of the silicon wafer. Then, heavy metal in the solution was subjected to quantitative analysis with an ICP mass spectroscope to measure a contamination level of the silicon wafer surface with iron, copper, and chromium.
  • the carrier of Example 2 and carriers made of a nonmetal material involved less contamination with heavy metal.
  • the carrier produced by coating the metal substrate with DLC is comparable with nonmetal carriers in terms of the contamination with heavy metal.
  • Comparative Example 1 As has been described so far, in Comparative Example 1, the wear rate is high and the contamination with heavy metal is observed. In Comparative Example 2, the durability and the contamination with heavy metal fall within an allowable range, while the wear rate is high. In Comparative Example 3, the durability and the contamination with heavy metal fall within an allowable range, while the cracks occur at the base of gear teeth during the test over 1 hour. This reveals that its durability is far from practical.
  • the DLC coated carrier of the present invention as explained in Examples 1 and 2 excels in every item: wear resistance, durability, and heavy metal contamination.
  • the use of the DLC coated carrier according to the present invention can improve the durability and wear resistance of the carrier as expendables and significantly prolong the service life, so the carrier produces beneficial effects from the economical and qualitative points of view.
  • the metal surface is coated throughout, whereby even in polishing, heavy metal neither elutes nor spatters, which is highly advantageous for polishing a polishing object such as a silicon wafer extremely weak against contamination with heavy metal and actually producing the same.

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Mechanical Engineering (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Medical Informatics (AREA)
  • Dermatology (AREA)
  • Pathology (AREA)
  • Rehabilitation Therapy (AREA)
  • Physical Education & Sports Medicine (AREA)
  • Pain & Pain Management (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Vascular Medicine (AREA)
  • Epidemiology (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Chemical Vapour Deposition (AREA)
US11/074,481 2004-03-09 2005-03-08 Carrier for holding an object to be polished Abandoned US20050202758A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/386,139 US20090203300A1 (en) 2004-03-09 2009-04-14 Carrier for holding an object to be polished

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004-066013 2004-03-09
JP2004066013A JP4113509B2 (ja) 2004-03-09 2004-03-09 被研磨物保持用キャリア

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/386,139 Continuation US20090203300A1 (en) 2004-03-09 2009-04-14 Carrier for holding an object to be polished

Publications (1)

Publication Number Publication Date
US20050202758A1 true US20050202758A1 (en) 2005-09-15

Family

ID=34824559

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/074,481 Abandoned US20050202758A1 (en) 2004-03-09 2005-03-08 Carrier for holding an object to be polished
US12/386,139 Abandoned US20090203300A1 (en) 2004-03-09 2009-04-14 Carrier for holding an object to be polished

Family Applications After (1)

Application Number Title Priority Date Filing Date
US12/386,139 Abandoned US20090203300A1 (en) 2004-03-09 2009-04-14 Carrier for holding an object to be polished

Country Status (4)

Country Link
US (2) US20050202758A1 (enrdf_load_stackoverflow)
EP (1) EP1574289B2 (enrdf_load_stackoverflow)
JP (1) JP4113509B2 (enrdf_load_stackoverflow)
KR (1) KR101174143B1 (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070184662A1 (en) * 2004-06-23 2007-08-09 Komatsu Denshi Kinzoku Kabushiki Kaisha Double-side polishing carrier and fabrication method thereof
US20090104852A1 (en) * 2007-10-17 2009-04-23 Siltronic Ag Carrier, Method For Coating A Carrier, and Method For The Simultaneous Double-Side Material-Removing Machining Of Semiconductor Wafers
US20090139077A1 (en) * 2007-11-29 2009-06-04 Chan-Yong Lee Method of manufacturing wafer carrier
US20100243168A1 (en) * 2009-03-31 2010-09-30 Tokyo Electron Limited Device and method for supporting a substrate
US20100311312A1 (en) * 2009-06-03 2010-12-09 Masanori Furukawa Double-side polishing apparatus and method for polishing both sides of wafer
US20110104995A1 (en) * 2008-02-27 2011-05-05 Shin-Etsu Handotai Co., Ltd. Carrier for a double-side polishing apparatus, double-side polishing apparatus using this carrier, and double-side polishing method
US9076480B2 (en) 2010-03-29 2015-07-07 Hoya Corporation Method of producing glass substrate for information recording medium
DE102017102887A1 (de) * 2016-12-22 2018-06-28 Euromicron Werkzeuge Gmbh Polierplatte, Poliervorrichtung und Verfahren zum Polieren von Lichtwellenleitern

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006303136A (ja) * 2005-04-20 2006-11-02 Shin Etsu Handotai Co Ltd 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法
JP2008238287A (ja) * 2007-03-26 2008-10-09 Naoetsu Electronics Co Ltd 両面研磨装置用キャリア
KR100761446B1 (ko) 2007-06-04 2007-09-27 에스엠엘씨디(주) 웨이퍼 캐리어의 디엘씨코팅장치 및 웨이퍼 캐리어의 디엘씨코팅방법
JP5082113B2 (ja) * 2008-07-31 2012-11-28 トーカロ株式会社 被研磨物保持用キャリアおよびその製造方法
JP5082115B2 (ja) * 2008-07-31 2012-11-28 トーカロ株式会社 被研磨物保持用キャリアおよびその製造方法
JP5082114B2 (ja) * 2008-07-31 2012-11-28 トーカロ株式会社 被研磨物保持用キャリアの製造方法
JP4858507B2 (ja) * 2008-07-31 2012-01-18 トーカロ株式会社 被研磨物保持用キャリア
JP5082116B2 (ja) * 2008-07-31 2012-11-28 トーカロ株式会社 被研磨物保持用非金属製キャリアの製造方法
JP2010036288A (ja) * 2008-08-01 2010-02-18 Sumco Techxiv株式会社 研磨用治具
JP6104668B2 (ja) * 2013-03-28 2017-03-29 Hoya株式会社 情報記録媒体用ガラス基板の製造方法、及びキャリア
JP2015181082A (ja) * 2015-04-28 2015-10-15 旭硝子株式会社 磁気記録媒体用ガラス基板
DE102020101313B3 (de) 2020-01-21 2021-07-01 Lapmaster Wolters Gmbh Läuferscheibe, Doppelseitenbearbeitungsmaschine und Verfahren zum Bearbeiten mindestens eines Werkstücks in einer Doppelseitenbearbeitungsmaschine

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5308661A (en) * 1993-03-03 1994-05-03 The Regents Of The University Of California Pretreatment process for forming a smooth surface diamond film on a carbon-coated substrate
US5397428A (en) * 1991-12-20 1995-03-14 The University Of North Carolina At Chapel Hill Nucleation enhancement for chemical vapor deposition of diamond
US5731046A (en) * 1994-01-18 1998-03-24 Qqc, Inc. Fabrication of diamond and diamond-like carbon coatings
US6042688A (en) * 1997-06-25 2000-03-28 Shin-Etsu Handotai Co., Ltd. Carrier for double-side polishing
US6290584B1 (en) * 1999-08-13 2001-09-18 Speedfam-Ipec Corporation Workpiece carrier with segmented and floating retaining elements
US6582288B2 (en) * 2000-07-14 2003-06-24 Applied Materials, Inc. Diaphragm for chemical mechanical polisher
US6945861B2 (en) * 2001-05-31 2005-09-20 Samsung Electronics Co., Ltd. Polishing head of chemical mechanical polishing apparatus and polishing method using the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081421A (en) * 1990-05-01 1992-01-14 At&T Bell Laboratories In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
US5707492A (en) * 1995-12-18 1998-01-13 Motorola, Inc. Metallized pad polishing process
JP2000246512A (ja) * 1998-12-28 2000-09-12 Ngk Spark Plug Co Ltd ダイヤモンド類被覆切削工具
DE19905737C2 (de) 1999-02-11 2000-12-14 Wacker Siltronic Halbleitermat Verfahren zur Herstellung einer Halbleiterscheibe mit verbesserter Ebenheit
US6203417B1 (en) 1999-11-05 2001-03-20 Speedfam-Ipec Corporation Chemical mechanical polishing tool components with improved corrosion resistance
JP2001332609A (ja) * 2000-03-13 2001-11-30 Nikon Corp 基板保持装置及び露光装置
JP2001345297A (ja) * 2000-05-30 2001-12-14 Hitachi Ltd 半導体集積回路装置の製造方法及び研磨装置
US6632127B1 (en) * 2001-03-07 2003-10-14 Jerry W. Zimmer Fixed abrasive planarization pad conditioner incorporating chemical vapor deposited polycrystalline diamond and method for making same
US6939206B2 (en) * 2001-03-12 2005-09-06 Asm Nutool, Inc. Method and apparatus of sealing wafer backside for full-face electrochemical plating
JP2003025218A (ja) * 2001-07-13 2003-01-29 Tokyo Seimitsu Co Ltd ウエーハ研磨装置
DE10247200A1 (de) 2002-10-10 2004-04-29 Wacker Siltronic Ag Verfahren zur gleichzeitig beidseitigen Material abtragenden Bearbeitung von Halbleiterscheiben
US6918824B2 (en) * 2003-09-25 2005-07-19 Novellus Systems, Inc. Uniform fluid distribution and exhaust system for a chemical-mechanical planarization device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5397428A (en) * 1991-12-20 1995-03-14 The University Of North Carolina At Chapel Hill Nucleation enhancement for chemical vapor deposition of diamond
US5308661A (en) * 1993-03-03 1994-05-03 The Regents Of The University Of California Pretreatment process for forming a smooth surface diamond film on a carbon-coated substrate
US5731046A (en) * 1994-01-18 1998-03-24 Qqc, Inc. Fabrication of diamond and diamond-like carbon coatings
US6042688A (en) * 1997-06-25 2000-03-28 Shin-Etsu Handotai Co., Ltd. Carrier for double-side polishing
US6290584B1 (en) * 1999-08-13 2001-09-18 Speedfam-Ipec Corporation Workpiece carrier with segmented and floating retaining elements
US6582288B2 (en) * 2000-07-14 2003-06-24 Applied Materials, Inc. Diaphragm for chemical mechanical polisher
US6945861B2 (en) * 2001-05-31 2005-09-20 Samsung Electronics Co., Ltd. Polishing head of chemical mechanical polishing apparatus and polishing method using the same

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070184662A1 (en) * 2004-06-23 2007-08-09 Komatsu Denshi Kinzoku Kabushiki Kaisha Double-side polishing carrier and fabrication method thereof
US20090104852A1 (en) * 2007-10-17 2009-04-23 Siltronic Ag Carrier, Method For Coating A Carrier, and Method For The Simultaneous Double-Side Material-Removing Machining Of Semiconductor Wafers
DE102007049811A1 (de) 2007-10-17 2009-04-23 Siltronic Ag Läuferscheibe, Verfahren zur Beschichtung einer Läuferscheibe sowie Verfahren zur gleichzeitigen beidseitigen Material abtragenden Bearbeitung von Halbleiterscheiben
US9539695B2 (en) * 2007-10-17 2017-01-10 Siltronic Ag Carrier, method for coating a carrier, and method for the simultaneous double-side material-removing machining of semiconductor wafers
US20090139077A1 (en) * 2007-11-29 2009-06-04 Chan-Yong Lee Method of manufacturing wafer carrier
US20110104995A1 (en) * 2008-02-27 2011-05-05 Shin-Etsu Handotai Co., Ltd. Carrier for a double-side polishing apparatus, double-side polishing apparatus using this carrier, and double-side polishing method
US9327382B2 (en) 2008-02-27 2016-05-03 Shin-Etsu Handotai Co., Ltd. Carrier for a double-side polishing apparatus, double-side polishing apparatus using this carrier, and double-side polishing method
US8528889B2 (en) 2009-03-31 2013-09-10 Tokyo Electron Limited Device and method for supporting a substrate
US20100243168A1 (en) * 2009-03-31 2010-09-30 Tokyo Electron Limited Device and method for supporting a substrate
US20100311312A1 (en) * 2009-06-03 2010-12-09 Masanori Furukawa Double-side polishing apparatus and method for polishing both sides of wafer
US8485864B2 (en) * 2009-06-03 2013-07-16 Fujikoshi Machinery Corp. Double-side polishing apparatus and method for polishing both sides of wafer
US9076480B2 (en) 2010-03-29 2015-07-07 Hoya Corporation Method of producing glass substrate for information recording medium
DE102017102887A1 (de) * 2016-12-22 2018-06-28 Euromicron Werkzeuge Gmbh Polierplatte, Poliervorrichtung und Verfahren zum Polieren von Lichtwellenleitern

Also Published As

Publication number Publication date
JP4113509B2 (ja) 2008-07-09
EP1574289A2 (en) 2005-09-14
EP1574289B2 (en) 2019-11-06
EP1574289B1 (en) 2012-10-17
JP2005254351A (ja) 2005-09-22
EP1574289A3 (en) 2006-06-07
KR20060043488A (ko) 2006-05-15
US20090203300A1 (en) 2009-08-13
KR101174143B1 (ko) 2012-08-14

Similar Documents

Publication Publication Date Title
US20090203300A1 (en) Carrier for holding an object to be polished
US6042688A (en) Carrier for double-side polishing
US6368198B1 (en) Diamond grid CMP pad dresser
US11781244B2 (en) Seed crystal for single crystal 4H—SiC growth and method for processing the same
US8795776B2 (en) Method for providing a respective flat working layer on each of the two working disks of a double-side processing apparatus
JP5295868B2 (ja) 研磨布用ドレッサー及びその製造方法
US20070254566A1 (en) Contoured CMP pad dresser and associated methods
KR20040086082A (ko) 엣지 연마한 질화물 반도체 기판과 엣지 연마한 GaN자립 기판 및 질화물 반도체 기판의 엣지 가공 방법
KR101720228B1 (ko) 초경합금 대판 외주 절단날 및 그 제조방법
US20140154956A1 (en) Pad Conditioning and Wafer Retaining Ring and Manufacturing Method Thereof
US20090090066A1 (en) Grinding tool and manufacturing method thereof
WO2006115039A1 (ja) 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法
JP2008006526A (ja) 研磨キャリア
JP3679882B2 (ja) 研磨用クロスのドレッサー及びその製造方法
US6203417B1 (en) Chemical mechanical polishing tool components with improved corrosion resistance
WO2015006742A1 (en) Coated cmp retaining ring
JP4698178B2 (ja) 被研磨物保持用キャリア
JP2000094297A (ja) マルチワイヤーソー
US6123450A (en) Decorative element, in particular an element forming a part of a timepiece
JP2000127046A (ja) ポリッシャ研磨用電着ドレッサ
JP2003094332A (ja) Cmpコンディショナ
JPH11333703A (ja) ポリッシング加工機
JP2001150351A (ja) ドレッシング用電着砥石
JP2011235435A (ja) 研磨布用ドレッサー
JP2002283218A (ja) 研磨布用ドレッサ

Legal Events

Date Code Title Description
AS Assignment

Owner name: SPEEDFAM CO., LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:YOSHIDA, AKIRA;SHIMIZU, TOSHIKUNI;REEL/FRAME:016444/0453;SIGNING DATES FROM 20050317 TO 20050318

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION