TWI895334B - 鍍敷處理方法及鍍敷處理裝置 - Google Patents
鍍敷處理方法及鍍敷處理裝置Info
- Publication number
- TWI895334B TWI895334B TW110102618A TW110102618A TWI895334B TW I895334 B TWI895334 B TW I895334B TW 110102618 A TW110102618 A TW 110102618A TW 110102618 A TW110102618 A TW 110102618A TW I895334 B TWI895334 B TW I895334B
- Authority
- TW
- Taiwan
- Prior art keywords
- liquid
- wafer
- substrate
- coating
- supply
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/06—Suspending or supporting devices for articles to be coated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/10—Agitating of electrolytes; Moving of racks
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/003—Electroplating using gases, e.g. pressure influence
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Automation & Control Theory (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-019042 | 2020-02-06 | ||
| JP2020019042 | 2020-02-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202140864A TW202140864A (zh) | 2021-11-01 |
| TWI895334B true TWI895334B (zh) | 2025-09-01 |
Family
ID=77200636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110102618A TWI895334B (zh) | 2020-02-06 | 2021-01-25 | 鍍敷處理方法及鍍敷處理裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230042744A1 (enExample) |
| JP (1) | JP7325550B2 (enExample) |
| KR (1) | KR20220139347A (enExample) |
| TW (1) | TWI895334B (enExample) |
| WO (1) | WO2021157504A1 (enExample) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060234508A1 (en) * | 2002-05-17 | 2006-10-19 | Mitsuhiko Shirakashi | Substrate processing apparatus and substrate processing method |
| WO2012050057A1 (ja) * | 2010-10-13 | 2012-04-19 | 東京エレクトロン株式会社 | テンプレート及び基板の処理方法 |
| TW201336030A (zh) * | 2012-01-20 | 2013-09-01 | 東京威力科創股份有限公司 | 支持基板及基板之處理方法 |
| TW201816195A (zh) * | 2016-09-09 | 2018-05-01 | 日商東芝股份有限公司 | 電氣鍍覆裝置、電氣鍍覆方法及半導體裝置之製造方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5270945A (en) * | 1975-12-10 | 1977-06-13 | Inoue Japax Res | Plating method |
| JPS5792191A (en) * | 1980-11-29 | 1982-06-08 | Nec Corp | Partial plating method |
| JP2004315889A (ja) * | 2003-04-16 | 2004-11-11 | Ebara Corp | 半導体基板のめっき方法 |
| JP2005133160A (ja) | 2003-10-30 | 2005-05-26 | Ebara Corp | 基板処理装置及び方法 |
| JP2007051362A (ja) * | 2005-07-19 | 2007-03-01 | Ebara Corp | めっき装置及びめっき液の管理方法 |
| US10472730B2 (en) * | 2009-10-12 | 2019-11-12 | Novellus Systems, Inc. | Electrolyte concentration control system for high rate electroplating |
| CN102286760B (zh) * | 2010-05-19 | 2016-10-05 | 诺发系统有限公司 | 用金属电化学填充高纵横比的大型凹入特征的方法、水溶液电镀槽溶液、电镀设备以及系统 |
-
2021
- 2021-01-25 TW TW110102618A patent/TWI895334B/zh active
- 2021-02-01 WO PCT/JP2021/003455 patent/WO2021157504A1/ja not_active Ceased
- 2021-02-01 US US17/760,120 patent/US20230042744A1/en active Pending
- 2021-02-01 JP JP2021575771A patent/JP7325550B2/ja active Active
- 2021-02-01 KR KR1020227030048A patent/KR20220139347A/ko active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060234508A1 (en) * | 2002-05-17 | 2006-10-19 | Mitsuhiko Shirakashi | Substrate processing apparatus and substrate processing method |
| WO2012050057A1 (ja) * | 2010-10-13 | 2012-04-19 | 東京エレクトロン株式会社 | テンプレート及び基板の処理方法 |
| TW201336030A (zh) * | 2012-01-20 | 2013-09-01 | 東京威力科創股份有限公司 | 支持基板及基板之處理方法 |
| TW201816195A (zh) * | 2016-09-09 | 2018-05-01 | 日商東芝股份有限公司 | 電氣鍍覆裝置、電氣鍍覆方法及半導體裝置之製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021157504A1 (ja) | 2021-08-12 |
| JPWO2021157504A1 (enExample) | 2021-08-12 |
| KR20220139347A (ko) | 2022-10-14 |
| TW202140864A (zh) | 2021-11-01 |
| JP7325550B2 (ja) | 2023-08-14 |
| US20230042744A1 (en) | 2023-02-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI857945B (zh) | 多層配線的形成方法及記憶媒體 | |
| US6176992B1 (en) | Method and apparatus for electro-chemical mechanical deposition | |
| JP6594445B2 (ja) | 半導体装置の製造装置及び製造方法 | |
| JP6910528B2 (ja) | 多層配線の形成方法および記憶媒体 | |
| TWI895334B (zh) | 鍍敷處理方法及鍍敷處理裝置 | |
| US7128821B2 (en) | Electropolishing method for removing particles from wafer surface | |
| US20080053486A1 (en) | Semiconductor substrate cleaning apparatus | |
| JP6789321B2 (ja) | 電解処理装置および電解処理方法 | |
| US20090095634A1 (en) | Plating method | |
| JP2009027133A (ja) | 半導体プロセスおよびウエット処理装置 | |
| JP4237908B2 (ja) | 半導体装置の製造方法 | |
| JP7399258B2 (ja) | めっき処理装置 | |
| US20070099426A1 (en) | Polishing method, polishing apparatus, and electrolytic polishing apparatus | |
| CN108886003A (zh) | 基板的制造方法及基板 | |
| JP6910480B2 (ja) | 多層配線の形成方法、多層配線形成装置および記憶媒体 | |
| US20010037943A1 (en) | Liquid treatment equipment and liquid treatment method | |
| JP2004149926A (ja) | 埋め込み配線の形成方法 | |
| JP2024087223A (ja) | めっき処理装置 | |
| JP6783317B2 (ja) | 電解処理治具及び電解処理方法 |