TWI890311B - 設備狀態監視系統 - Google Patents

設備狀態監視系統

Info

Publication number
TWI890311B
TWI890311B TW113104449A TW113104449A TWI890311B TW I890311 B TWI890311 B TW I890311B TW 113104449 A TW113104449 A TW 113104449A TW 113104449 A TW113104449 A TW 113104449A TW I890311 B TWI890311 B TW I890311B
Authority
TW
Taiwan
Prior art keywords
sensor
sensor node
abnormality
data
monitoring system
Prior art date
Application number
TW113104449A
Other languages
English (en)
Chinese (zh)
Other versions
TW202422029A (zh
Inventor
小山友二
馬渡和明
Original Assignee
日商電裝股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商電裝股份有限公司 filed Critical 日商電裝股份有限公司
Publication of TW202422029A publication Critical patent/TW202422029A/zh
Application granted granted Critical
Publication of TWI890311B publication Critical patent/TWI890311B/zh

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2223/00—Indexing scheme associated with group G05B23/00
    • G05B2223/02—Indirect monitoring, e.g. monitoring production to detect faults of a system

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Selective Calling Equipment (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • General Factory Administration (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
TW113104449A 2021-06-30 2022-06-28 設備狀態監視系統 TWI890311B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2021109105 2021-06-30
JP2021-109105 2021-06-30
JP2022003330A JP7501547B2 (ja) 2021-06-30 2022-01-12 設備状態監視システム
JP2022-003330 2022-01-12

Publications (2)

Publication Number Publication Date
TW202422029A TW202422029A (zh) 2024-06-01
TWI890311B true TWI890311B (zh) 2025-07-11

Family

ID=84691429

Family Applications (2)

Application Number Title Priority Date Filing Date
TW113104449A TWI890311B (zh) 2021-06-30 2022-06-28 設備狀態監視系統
TW111124028A TWI873433B (zh) 2021-06-30 2022-06-28 設備狀態監視系統

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW111124028A TWI873433B (zh) 2021-06-30 2022-06-28 設備狀態監視系統

Country Status (6)

Country Link
US (1) US20240094720A1 (enExample)
EP (1) EP4365693A4 (enExample)
JP (2) JP7501547B2 (enExample)
CN (1) CN117581085A (enExample)
TW (2) TWI890311B (enExample)
WO (1) WO2023276895A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230196217A1 (en) * 2021-12-22 2023-06-22 Ford Global Technologies, Llc Systems and methods for controlling pallets in a manufacturing environment using reinforcement learning
WO2025046738A1 (ja) * 2023-08-29 2025-03-06 三菱電機株式会社 金型保全システム、金型良否判定閾値生成装置、学習装置、金型良否判定方法およびプログラム
JP2025093519A (ja) * 2023-12-12 2025-06-24 横河電機株式会社 施設内で検出された音響データを処理する装置、方法、およびプログラム
JP2025125759A (ja) * 2024-02-16 2025-08-28 株式会社サンワ電装 回転機器の診断装置
CN119319579B (zh) * 2024-12-19 2025-04-22 广东美的制冷设备有限公司 机器人下线综合检测装置及其检测方法
CN120507716B (zh) * 2025-07-17 2025-09-26 北京普龙科技有限公司 挂轨式机器人定位方法及装置、电子设备、存储介质

Citations (5)

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JP2007201577A (ja) * 2006-01-24 2007-08-09 Nec Tokin Corp センサノードおよびこれを用いたセンサネットワークシステム
JP2010066854A (ja) * 2008-09-09 2010-03-25 Univ Of Aizu センサ装置、センシング情報収集システム、センシング機能代替方法およびセンシング機能代替プログラム
JP2020027095A (ja) * 2017-11-27 2020-02-20 トーヨーカネツソリューションズ株式会社 搬送システム検査装置（ドクター物流）
TWM606780U (zh) * 2020-09-02 2021-01-21 國立虎尾科技大學 機台即時防護系統
WO2021065576A1 (ja) * 2019-10-02 2021-04-08 株式会社荏原製作所 搬送異常予測システム

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JP5293719B2 (ja) * 2010-10-01 2013-09-18 東京エレクトロン株式会社 基板処理装置のデータ取得方法及びセンサ用基板
JP5331916B2 (ja) * 2012-04-20 2013-10-30 シスメックス株式会社 検体分析装置
JP6140331B1 (ja) * 2016-04-08 2017-05-31 ファナック株式会社 主軸または主軸を駆動するモータの故障予知を学習する機械学習装置および機械学習方法、並びに、機械学習装置を備えた故障予知装置および故障予知システム
JP6818024B2 (ja) * 2016-06-13 2021-01-20 株式会社日立製作所 回転機診断装置、回転機診断方法及び回転機診断プログラム
JP2018091640A (ja) 2016-11-30 2018-06-14 株式会社デンソー 装置の検査装置、および、装置の検査方法
JP2019061628A (ja) * 2017-09-28 2019-04-18 ｉ Ｓｍａｒｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ株式会社 生産管理装置、生産管理システム、および生産管理方法
CA3081229A1 (en) * 2017-10-30 2019-05-09 Superior Industries, Inc. Conveyor idler monitoring apparatus, systems, and methods
JP7118399B2 (ja) 2018-03-14 2022-08-16 ｉ Ｓｍａｒｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ株式会社 生産管理装置、生産管理システム、および生産管理方法
CN112789492A (zh) * 2018-08-08 2021-05-11 克里奥瓦克公司 用于检测包装内部的气体的真空包装产品检验
JP6866335B2 (ja) * 2018-09-05 2021-04-28 東芝情報システム株式会社 検査装置及び検査用プログラム
JP2020052459A (ja) * 2018-09-21 2020-04-02 株式会社Ｙｅ Ｄｉｇｉｔａｌ 故障予知方法、故障予知装置および故障予知プログラム
JP6598103B1 (ja) * 2019-04-03 2019-10-30 パナソニックＩｐマネジメント株式会社 エナジーハーベスト端末

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007201577A (ja) * 2006-01-24 2007-08-09 Nec Tokin Corp センサノードおよびこれを用いたセンサネットワークシステム
JP2010066854A (ja) * 2008-09-09 2010-03-25 Univ Of Aizu センサ装置、センシング情報収集システム、センシング機能代替方法およびセンシング機能代替プログラム
JP2020027095A (ja) * 2017-11-27 2020-02-20 トーヨーカネツソリューションズ株式会社 搬送システム検査装置（ドクター物流）
WO2021065576A1 (ja) * 2019-10-02 2021-04-08 株式会社荏原製作所 搬送異常予測システム
TWM606780U (zh) * 2020-09-02 2021-01-21 國立虎尾科技大學 機台即時防護系統

Also Published As

Publication number Publication date
JP2023007350A (ja) 2023-01-18
CN117581085A (zh) 2024-02-20
US20240094720A1 (en) 2024-03-21
EP4365693A4 (en) 2024-10-23
TW202422029A (zh) 2024-06-01
TW202517988A (zh) 2025-05-01
TW202319721A (zh) 2023-05-16
JP2024103555A (ja) 2024-08-01
JP7501547B2 (ja) 2024-06-18
WO2023276895A1 (ja) 2023-01-05
JP7772133B2 (ja) 2025-11-18
TWI873433B (zh) 2025-02-21
EP4365693A1 (en) 2024-05-08

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