JP7501547B2 - 設備状態監視システム - Google Patents

設備状態監視システム Download PDF

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Publication number
JP7501547B2
JP7501547B2 JP2022003330A JP2022003330A JP7501547B2 JP 7501547 B2 JP7501547 B2 JP 7501547B2 JP 2022003330 A JP2022003330 A JP 2022003330A JP 2022003330 A JP2022003330 A JP 2022003330A JP 7501547 B2 JP7501547 B2 JP 7501547B2
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JP
Japan
Prior art keywords
sensor
abnormality
sensor node
equipment
sensor data
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JP2022003330A
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English (en)
Japanese (ja)
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JP2023007350A (ja
JP2023007350A5 (enExample
Inventor
友二 小山
和明 馬渡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Priority to JP2022003330A priority Critical patent/JP7501547B2/ja
Priority to PCT/JP2022/025386 priority patent/WO2023276895A1/ja
Priority to CN202280046161.7A priority patent/CN117581085A/zh
Priority to EP22833042.9A priority patent/EP4365693A4/en
Priority to TW111124028A priority patent/TWI873433B/zh
Priority to TW113104449A priority patent/TWI890311B/zh
Priority to TW114101304A priority patent/TWI907245B/zh
Publication of JP2023007350A publication Critical patent/JP2023007350A/ja
Publication of JP2023007350A5 publication Critical patent/JP2023007350A5/ja
Priority to US18/522,748 priority patent/US20240094720A1/en
Priority to JP2024084888A priority patent/JP7772133B2/ja
Application granted granted Critical
Publication of JP7501547B2 publication Critical patent/JP7501547B2/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2223/00—Indexing scheme associated with group G05B23/00
    • G05B2223/02—Indirect monitoring, e.g. monitoring production to detect faults of a system

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Selective Calling Equipment (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • General Factory Administration (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP2022003330A 2021-06-30 2022-01-12 設備状態監視システム Active JP7501547B2 (ja)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP2022003330A JP7501547B2 (ja) 2021-06-30 2022-01-12 設備状態監視システム
CN202280046161.7A CN117581085A (zh) 2021-06-30 2022-06-24 设备状态监视系统
EP22833042.9A EP4365693A4 (en) 2021-06-30 2022-06-24 PLANT CONDITION MONITORING SYSTEM
PCT/JP2022/025386 WO2023276895A1 (ja) 2021-06-30 2022-06-24 設備状態監視システム
TW113104449A TWI890311B (zh) 2021-06-30 2022-06-28 設備狀態監視系統
TW114101304A TWI907245B (zh) 2021-06-30 2022-06-28 設備狀態監視系統
TW111124028A TWI873433B (zh) 2021-06-30 2022-06-28 設備狀態監視系統
US18/522,748 US20240094720A1 (en) 2021-06-30 2023-11-29 Facility state monitoring system
JP2024084888A JP7772133B2 (ja) 2021-06-30 2024-05-24 設備状態監視システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021109105 2021-06-30
JP2021109105 2021-06-30
JP2022003330A JP7501547B2 (ja) 2021-06-30 2022-01-12 設備状態監視システム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024084888A Division JP7772133B2 (ja) 2021-06-30 2024-05-24 設備状態監視システム

Publications (3)

Publication Number Publication Date
JP2023007350A JP2023007350A (ja) 2023-01-18
JP2023007350A5 JP2023007350A5 (enExample) 2023-06-08
JP7501547B2 true JP7501547B2 (ja) 2024-06-18

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JP2022003330A Active JP7501547B2 (ja) 2021-06-30 2022-01-12 設備状態監視システム
JP2024084888A Active JP7772133B2 (ja) 2021-06-30 2024-05-24 設備状態監視システム

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JP2024084888A Active JP7772133B2 (ja) 2021-06-30 2024-05-24 設備状態監視システム

Country Status (6)

Country Link
US (1) US20240094720A1 (enExample)
EP (1) EP4365693A4 (enExample)
JP (2) JP7501547B2 (enExample)
CN (1) CN117581085A (enExample)
TW (2) TWI890311B (enExample)
WO (1) WO2023276895A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230196217A1 (en) * 2021-12-22 2023-06-22 Ford Global Technologies, Llc Systems and methods for controlling pallets in a manufacturing environment using reinforcement learning
WO2025046738A1 (ja) * 2023-08-29 2025-03-06 三菱電機株式会社 金型保全システム、金型良否判定閾値生成装置、学習装置、金型良否判定方法およびプログラム
JP2025093519A (ja) * 2023-12-12 2025-06-24 横河電機株式会社 施設内で検出された音響データを処理する装置、方法、およびプログラム
JP2025125759A (ja) * 2024-02-16 2025-08-28 株式会社サンワ電装 回転機器の診断装置
CN119319579B (zh) * 2024-12-19 2025-04-22 广东美的制冷设备有限公司 机器人下线综合检测装置及其检测方法
CN120507716B (zh) * 2025-07-17 2025-09-26 北京普龙科技有限公司 挂轨式机器人定位方法及装置、电子设备、存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007201577A (ja) 2006-01-24 2007-08-09 Nec Tokin Corp センサノードおよびこれを用いたセンサネットワークシステム
JP2019159853A (ja) 2018-03-14 2019-09-19 ｉ Ｓｍａｒｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ株式会社 生産管理装置、生産管理システム、および生産管理方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5099777B2 (ja) * 2008-09-09 2012-12-19 公立大学法人会津大学 センサ装置、センシング情報収集システム、センシング機能代替方法およびセンシング機能代替プログラム
JP5293719B2 (ja) * 2010-10-01 2013-09-18 東京エレクトロン株式会社 基板処理装置のデータ取得方法及びセンサ用基板
JP5331916B2 (ja) * 2012-04-20 2013-10-30 シスメックス株式会社 検体分析装置
JP6140331B1 (ja) * 2016-04-08 2017-05-31 ファナック株式会社 主軸または主軸を駆動するモータの故障予知を学習する機械学習装置および機械学習方法、並びに、機械学習装置を備えた故障予知装置および故障予知システム
JP6818024B2 (ja) * 2016-06-13 2021-01-20 株式会社日立製作所 回転機診断装置、回転機診断方法及び回転機診断プログラム
JP2018091640A (ja) 2016-11-30 2018-06-14 株式会社デンソー 装置の検査装置、および、装置の検査方法
JP2019061628A (ja) * 2017-09-28 2019-04-18 ｉ Ｓｍａｒｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ株式会社 生産管理装置、生産管理システム、および生産管理方法
CA3081229A1 (en) * 2017-10-30 2019-05-09 Superior Industries, Inc. Conveyor idler monitoring apparatus, systems, and methods
JP7351054B2 (ja) * 2017-11-27 2023-09-27 トーヨーカネツ株式会社 搬送システム検査装置（ドクター物流）
CN112789492A (zh) * 2018-08-08 2021-05-11 克里奥瓦克公司 用于检测包装内部的气体的真空包装产品检验
JP6866335B2 (ja) * 2018-09-05 2021-04-28 東芝情報システム株式会社 検査装置及び検査用プログラム
JP2020052459A (ja) * 2018-09-21 2020-04-02 株式会社Ｙｅ Ｄｉｇｉｔａｌ 故障予知方法、故障予知装置および故障予知プログラム
JP6598103B1 (ja) * 2019-04-03 2019-10-30 パナソニックＩｐマネジメント株式会社 エナジーハーベスト端末
JP7319162B2 (ja) * 2019-10-02 2023-08-01 株式会社荏原製作所 搬送異常予測システム
TWM606780U (zh) * 2020-09-02 2021-01-21 國立虎尾科技大學 機台即時防護系統

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007201577A (ja) 2006-01-24 2007-08-09 Nec Tokin Corp センサノードおよびこれを用いたセンサネットワークシステム
JP2019159853A (ja) 2018-03-14 2019-09-19 ｉ Ｓｍａｒｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ株式会社 生産管理装置、生産管理システム、および生産管理方法

Also Published As

Publication number Publication date
JP2023007350A (ja) 2023-01-18
CN117581085A (zh) 2024-02-20
US20240094720A1 (en) 2024-03-21
EP4365693A4 (en) 2024-10-23
TW202422029A (zh) 2024-06-01
TW202517988A (zh) 2025-05-01
TW202319721A (zh) 2023-05-16
TWI890311B (zh) 2025-07-11
JP2024103555A (ja) 2024-08-01
WO2023276895A1 (ja) 2023-01-05
JP7772133B2 (ja) 2025-11-18
TWI873433B (zh) 2025-02-21
EP4365693A1 (en) 2024-05-08

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