TWI869389B - 基板處理裝置及基板洗淨方法 - Google Patents

基板處理裝置及基板洗淨方法 Download PDF

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Publication number
TWI869389B
TWI869389B TW109111589A TW109111589A TWI869389B TW I869389 B TWI869389 B TW I869389B TW 109111589 A TW109111589 A TW 109111589A TW 109111589 A TW109111589 A TW 109111589A TW I869389 B TWI869389 B TW I869389B
Authority
TW
Taiwan
Prior art keywords
cleaning
substrate
skin layer
cleaning liquid
component
Prior art date
Application number
TW109111589A
Other languages
English (en)
Chinese (zh)
Other versions
TW202044390A (zh
Inventor
石橋知淳
Original Assignee
日商荏原製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商荏原製作所股份有限公司 filed Critical 日商荏原製作所股份有限公司
Publication of TW202044390A publication Critical patent/TW202044390A/zh
Application granted granted Critical
Publication of TWI869389B publication Critical patent/TWI869389B/zh

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/10Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00Cleaning by methods involving the use of tools
    • B08B1/10Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B08B1/14Wipes; Absorbent members, e.g. swabs or sponges
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00Cleaning by methods involving the use of tools
    • B08B1/30Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • B08B1/34Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis parallel to the surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00Cleaning by methods involving the use of tools
    • B08B1/30Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • B08B1/36Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis orthogonal to the surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00Cleaning by methods involving the use of tools
    • B08B1/40Cleaning tools with integrated means for dispensing fluids, e.g. water, steam or detergents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/003Cleaning involving contact with foam
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/08Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/50Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
    • H10P70/54Cleaning of wafer edges
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/60Cleaning only by mechanical processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0412Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
TW109111589A 2019-04-09 2020-04-07 基板處理裝置及基板洗淨方法 TWI869389B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019074012A JP7189827B2 (ja) 2019-04-09 2019-04-09 基板処理装置および基板洗浄方法
JP2019-074012 2019-04-09

Publications (2)

Publication Number Publication Date
TW202044390A TW202044390A (zh) 2020-12-01
TWI869389B true TWI869389B (zh) 2025-01-11

Family

ID=72751568

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109111589A TWI869389B (zh) 2019-04-09 2020-04-07 基板處理裝置及基板洗淨方法

Country Status (6)

Country Link
US (1) US20210242015A1 (https=)
JP (1) JP7189827B2 (https=)
KR (1) KR20210147853A (https=)
CN (1) CN113614885A (https=)
TW (1) TWI869389B (https=)
WO (1) WO2020209213A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20250058524A1 (en) * 2021-12-28 2025-02-20 A. Raymond Et Cie Method and apparatus to clean additively manufactured components
JP7813143B2 (ja) * 2022-01-21 2026-02-12 株式会社荏原製作所 基板洗浄方法および基板洗浄装置
JP7776349B2 (ja) * 2022-02-28 2025-11-26 株式会社Screenホールディングス 基板処理方法および基板処理システム
JP7814993B2 (ja) * 2022-03-15 2026-02-17 株式会社荏原製作所 研磨方法および研磨装置
US20230321696A1 (en) 2022-04-07 2023-10-12 Ebara Corporation Substrate processing system and substrate processing method
JP2025043597A (ja) 2023-09-19 2025-04-01 株式会社荏原製作所 基板処理モジュールおよび基板処理方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011218308A (ja) * 2010-04-12 2011-11-04 Asupu:Kk 気体溶解液生成装置及び生成方法
TW201509821A (zh) * 2013-04-30 2015-03-16 奧璐佳瑙股份有限公司 銅露出基板之清洗方法及清洗系統
US20170372893A1 (en) * 2016-06-27 2017-12-28 Ebara Corporation Cleaning apparatus and substrate processing apparatus
JP2018056385A (ja) * 2016-09-29 2018-04-05 株式会社荏原製作所 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002043267A (ja) * 2000-07-21 2002-02-08 Ebara Corp 基板洗浄装置、基板洗浄方法及び基板処理装置
KR101579572B1 (ko) * 2008-06-30 2015-12-22 아이온 가부시키가이샤 세정용 스폰지 롤러
JP2012138498A (ja) * 2010-12-27 2012-07-19 Toshiba Corp 洗浄方法
CN107078046B (zh) 2014-10-31 2020-11-27 株式会社荏原制作所 基板清洗辊、基板清洗装置及基板清洗方法
JP6491908B2 (ja) * 2015-03-09 2019-03-27 株式会社荏原製作所 基板洗浄装置、基板洗浄方法、および基板処理装置
JP6643942B2 (ja) * 2016-04-12 2020-02-12 株式会社荏原製作所 洗浄部材、基板洗浄装置及び基板処理装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011218308A (ja) * 2010-04-12 2011-11-04 Asupu:Kk 気体溶解液生成装置及び生成方法
TW201509821A (zh) * 2013-04-30 2015-03-16 奧璐佳瑙股份有限公司 銅露出基板之清洗方法及清洗系統
US20170372893A1 (en) * 2016-06-27 2017-12-28 Ebara Corporation Cleaning apparatus and substrate processing apparatus
JP2018056385A (ja) * 2016-09-29 2018-04-05 株式会社荏原製作所 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ

Also Published As

Publication number Publication date
KR20210147853A (ko) 2021-12-07
JP7189827B2 (ja) 2022-12-14
US20210242015A1 (en) 2021-08-05
CN113614885A (zh) 2021-11-05
WO2020209213A1 (ja) 2020-10-15
JP2020174081A (ja) 2020-10-22
TW202044390A (zh) 2020-12-01

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