TWI869389B - 基板處理裝置及基板洗淨方法 - Google Patents
基板處理裝置及基板洗淨方法 Download PDFInfo
- Publication number
- TWI869389B TWI869389B TW109111589A TW109111589A TWI869389B TW I869389 B TWI869389 B TW I869389B TW 109111589 A TW109111589 A TW 109111589A TW 109111589 A TW109111589 A TW 109111589A TW I869389 B TWI869389 B TW I869389B
- Authority
- TW
- Taiwan
- Prior art keywords
- cleaning
- substrate
- skin layer
- cleaning liquid
- component
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/14—Wipes; Absorbent members, e.g. swabs or sponges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/34—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis parallel to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/36—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis orthogonal to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/40—Cleaning tools with integrated means for dispensing fluids, e.g. water, steam or detergents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/003—Cleaning involving contact with foam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/50—Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
- H10P70/54—Cleaning of wafer edges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/60—Cleaning only by mechanical processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0412—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019074012A JP7189827B2 (ja) | 2019-04-09 | 2019-04-09 | 基板処理装置および基板洗浄方法 |
| JP2019-074012 | 2019-04-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202044390A TW202044390A (zh) | 2020-12-01 |
| TWI869389B true TWI869389B (zh) | 2025-01-11 |
Family
ID=72751568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109111589A TWI869389B (zh) | 2019-04-09 | 2020-04-07 | 基板處理裝置及基板洗淨方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20210242015A1 (https=) |
| JP (1) | JP7189827B2 (https=) |
| KR (1) | KR20210147853A (https=) |
| CN (1) | CN113614885A (https=) |
| TW (1) | TWI869389B (https=) |
| WO (1) | WO2020209213A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250058524A1 (en) * | 2021-12-28 | 2025-02-20 | A. Raymond Et Cie | Method and apparatus to clean additively manufactured components |
| JP7813143B2 (ja) * | 2022-01-21 | 2026-02-12 | 株式会社荏原製作所 | 基板洗浄方法および基板洗浄装置 |
| JP7776349B2 (ja) * | 2022-02-28 | 2025-11-26 | 株式会社Screenホールディングス | 基板処理方法および基板処理システム |
| JP7814993B2 (ja) * | 2022-03-15 | 2026-02-17 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| US20230321696A1 (en) | 2022-04-07 | 2023-10-12 | Ebara Corporation | Substrate processing system and substrate processing method |
| JP2025043597A (ja) | 2023-09-19 | 2025-04-01 | 株式会社荏原製作所 | 基板処理モジュールおよび基板処理方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011218308A (ja) * | 2010-04-12 | 2011-11-04 | Asupu:Kk | 気体溶解液生成装置及び生成方法 |
| TW201509821A (zh) * | 2013-04-30 | 2015-03-16 | 奧璐佳瑙股份有限公司 | 銅露出基板之清洗方法及清洗系統 |
| US20170372893A1 (en) * | 2016-06-27 | 2017-12-28 | Ebara Corporation | Cleaning apparatus and substrate processing apparatus |
| JP2018056385A (ja) * | 2016-09-29 | 2018-04-05 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002043267A (ja) * | 2000-07-21 | 2002-02-08 | Ebara Corp | 基板洗浄装置、基板洗浄方法及び基板処理装置 |
| KR101579572B1 (ko) * | 2008-06-30 | 2015-12-22 | 아이온 가부시키가이샤 | 세정용 스폰지 롤러 |
| JP2012138498A (ja) * | 2010-12-27 | 2012-07-19 | Toshiba Corp | 洗浄方法 |
| CN107078046B (zh) | 2014-10-31 | 2020-11-27 | 株式会社荏原制作所 | 基板清洗辊、基板清洗装置及基板清洗方法 |
| JP6491908B2 (ja) * | 2015-03-09 | 2019-03-27 | 株式会社荏原製作所 | 基板洗浄装置、基板洗浄方法、および基板処理装置 |
| JP6643942B2 (ja) * | 2016-04-12 | 2020-02-12 | 株式会社荏原製作所 | 洗浄部材、基板洗浄装置及び基板処理装置 |
-
2019
- 2019-04-09 JP JP2019074012A patent/JP7189827B2/ja active Active
-
2020
- 2020-04-06 WO PCT/JP2020/015460 patent/WO2020209213A1/ja not_active Ceased
- 2020-04-06 CN CN202080003844.5A patent/CN113614885A/zh active Pending
- 2020-04-06 US US17/049,001 patent/US20210242015A1/en not_active Abandoned
- 2020-04-06 KR KR1020207037615A patent/KR20210147853A/ko not_active Ceased
- 2020-04-07 TW TW109111589A patent/TWI869389B/zh active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011218308A (ja) * | 2010-04-12 | 2011-11-04 | Asupu:Kk | 気体溶解液生成装置及び生成方法 |
| TW201509821A (zh) * | 2013-04-30 | 2015-03-16 | 奧璐佳瑙股份有限公司 | 銅露出基板之清洗方法及清洗系統 |
| US20170372893A1 (en) * | 2016-06-27 | 2017-12-28 | Ebara Corporation | Cleaning apparatus and substrate processing apparatus |
| JP2018056385A (ja) * | 2016-09-29 | 2018-04-05 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20210147853A (ko) | 2021-12-07 |
| JP7189827B2 (ja) | 2022-12-14 |
| US20210242015A1 (en) | 2021-08-05 |
| CN113614885A (zh) | 2021-11-05 |
| WO2020209213A1 (ja) | 2020-10-15 |
| JP2020174081A (ja) | 2020-10-22 |
| TW202044390A (zh) | 2020-12-01 |
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