KR20210147853A - 기판 처리 장치 및 기판 세정 방법 - Google Patents
기판 처리 장치 및 기판 세정 방법 Download PDFInfo
- Publication number
- KR20210147853A KR20210147853A KR1020207037615A KR20207037615A KR20210147853A KR 20210147853 A KR20210147853 A KR 20210147853A KR 1020207037615 A KR1020207037615 A KR 1020207037615A KR 20207037615 A KR20207037615 A KR 20207037615A KR 20210147853 A KR20210147853 A KR 20210147853A
- Authority
- KR
- South Korea
- Prior art keywords
- cleaning
- substrate
- cleaning member
- cleaning liquid
- skin layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- H01L21/67046—
-
- B08B1/001—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/14—Wipes; Absorbent members, e.g. swabs or sponges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/34—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis parallel to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/36—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis orthogonal to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/40—Cleaning tools with integrated means for dispensing fluids, e.g. water, steam or detergents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/003—Cleaning involving contact with foam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- H01L21/02052—
-
- H01L21/02096—
-
- H01L21/67051—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/50—Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
- H10P70/54—Cleaning of wafer edges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/60—Cleaning only by mechanical processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0412—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2019-074012 | 2019-04-09 | ||
| JP2019074012A JP7189827B2 (ja) | 2019-04-09 | 2019-04-09 | 基板処理装置および基板洗浄方法 |
| PCT/JP2020/015460 WO2020209213A1 (ja) | 2019-04-09 | 2020-04-06 | 基板処理装置および基板洗浄方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20210147853A true KR20210147853A (ko) | 2021-12-07 |
Family
ID=72751568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020207037615A Ceased KR20210147853A (ko) | 2019-04-09 | 2020-04-06 | 기판 처리 장치 및 기판 세정 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20210242015A1 (https=) |
| JP (1) | JP7189827B2 (https=) |
| KR (1) | KR20210147853A (https=) |
| CN (1) | CN113614885A (https=) |
| TW (1) | TWI869389B (https=) |
| WO (1) | WO2020209213A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250058524A1 (en) * | 2021-12-28 | 2025-02-20 | A. Raymond Et Cie | Method and apparatus to clean additively manufactured components |
| JP7813143B2 (ja) * | 2022-01-21 | 2026-02-12 | 株式会社荏原製作所 | 基板洗浄方法および基板洗浄装置 |
| JP7776349B2 (ja) * | 2022-02-28 | 2025-11-26 | 株式会社Screenホールディングス | 基板処理方法および基板処理システム |
| JP7814993B2 (ja) * | 2022-03-15 | 2026-02-17 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| US20230321696A1 (en) | 2022-04-07 | 2023-10-12 | Ebara Corporation | Substrate processing system and substrate processing method |
| JP2025043597A (ja) | 2023-09-19 | 2025-04-01 | 株式会社荏原製作所 | 基板処理モジュールおよび基板処理方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016067563A1 (ja) | 2014-10-31 | 2016-05-06 | 株式会社荏原製作所 | 基板洗浄ロール、基板洗浄装置、及び基板洗浄方法 |
| JP2017191827A (ja) | 2016-04-12 | 2017-10-19 | 株式会社荏原製作所 | 洗浄部材及び基板洗浄装置 |
| JP2018056385A (ja) | 2016-09-29 | 2018-04-05 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002043267A (ja) * | 2000-07-21 | 2002-02-08 | Ebara Corp | 基板洗浄装置、基板洗浄方法及び基板処理装置 |
| KR101579572B1 (ko) * | 2008-06-30 | 2015-12-22 | 아이온 가부시키가이샤 | 세정용 스폰지 롤러 |
| JP2011218308A (ja) * | 2010-04-12 | 2011-11-04 | Asupu:Kk | 気体溶解液生成装置及び生成方法 |
| JP2012138498A (ja) * | 2010-12-27 | 2012-07-19 | Toshiba Corp | 洗浄方法 |
| CN105340067B (zh) * | 2013-04-30 | 2018-07-06 | 奥加诺株式会社 | 铜露出基板的清洗方法和清洗系统 |
| JP6491908B2 (ja) * | 2015-03-09 | 2019-03-27 | 株式会社荏原製作所 | 基板洗浄装置、基板洗浄方法、および基板処理装置 |
| JP6640041B2 (ja) * | 2016-06-27 | 2020-02-05 | 株式会社荏原製作所 | 洗浄装置及び基板処理装置 |
-
2019
- 2019-04-09 JP JP2019074012A patent/JP7189827B2/ja active Active
-
2020
- 2020-04-06 WO PCT/JP2020/015460 patent/WO2020209213A1/ja not_active Ceased
- 2020-04-06 CN CN202080003844.5A patent/CN113614885A/zh active Pending
- 2020-04-06 US US17/049,001 patent/US20210242015A1/en not_active Abandoned
- 2020-04-06 KR KR1020207037615A patent/KR20210147853A/ko not_active Ceased
- 2020-04-07 TW TW109111589A patent/TWI869389B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016067563A1 (ja) | 2014-10-31 | 2016-05-06 | 株式会社荏原製作所 | 基板洗浄ロール、基板洗浄装置、及び基板洗浄方法 |
| JP2017191827A (ja) | 2016-04-12 | 2017-10-19 | 株式会社荏原製作所 | 洗浄部材及び基板洗浄装置 |
| JP2018056385A (ja) | 2016-09-29 | 2018-04-05 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7189827B2 (ja) | 2022-12-14 |
| US20210242015A1 (en) | 2021-08-05 |
| CN113614885A (zh) | 2021-11-05 |
| TWI869389B (zh) | 2025-01-11 |
| WO2020209213A1 (ja) | 2020-10-15 |
| JP2020174081A (ja) | 2020-10-22 |
| TW202044390A (zh) | 2020-12-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
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| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P11 | Amendment of application requested |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |