TWI823437B - 加熱處理裝置 - Google Patents

加熱處理裝置 Download PDF

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Publication number
TWI823437B
TWI823437B TW111123325A TW111123325A TWI823437B TW I823437 B TWI823437 B TW I823437B TW 111123325 A TW111123325 A TW 111123325A TW 111123325 A TW111123325 A TW 111123325A TW I823437 B TWI823437 B TW I823437B
Authority
TW
Taiwan
Prior art keywords
temperature control
workpiece
vapor chamber
chamber
heating
Prior art date
Application number
TW111123325A
Other languages
English (en)
Chinese (zh)
Other versions
TW202305992A (zh
Inventor
磯明典
高橋崇史
Original Assignee
日商芝浦機械電子裝置股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商芝浦機械電子裝置股份有限公司 filed Critical 日商芝浦機械電子裝置股份有限公司
Publication of TW202305992A publication Critical patent/TW202305992A/zh
Application granted granted Critical
Publication of TWI823437B publication Critical patent/TWI823437B/zh

Links

Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D99/00Subject matter not provided for in other groups of this subclass
    • F27D99/0001Heating elements or systems
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D21/00Arrangements of monitoring devices; Arrangements of safety devices
    • F27D21/0014Devices for monitoring temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67248Temperature monitoring
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D99/00Subject matter not provided for in other groups of this subclass
    • F27D99/0001Heating elements or systems
    • F27D2099/0061Indirect heating

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Control Of Resistance Heating (AREA)
  • Drying Of Solid Materials (AREA)
  • Furnace Details (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
TW111123325A 2021-07-29 2022-06-23 加熱處理裝置 TWI823437B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021-123920 2021-07-29
JP2021123920A JP7366086B2 (ja) 2021-07-29 2021-07-29 加熱処理装置

Publications (2)

Publication Number Publication Date
TW202305992A TW202305992A (zh) 2023-02-01
TWI823437B true TWI823437B (zh) 2023-11-21

Family

ID=85060178

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111123325A TWI823437B (zh) 2021-07-29 2022-06-23 加熱處理裝置

Country Status (4)

Country Link
JP (1) JP7366086B2 (ja)
KR (1) KR20230018314A (ja)
CN (1) CN115672686B (ja)
TW (1) TWI823437B (ja)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10112437A (ja) * 1996-10-04 1998-04-28 Hitachi Ltd 半導体基板処理装置
WO2019117250A1 (ja) * 2017-12-15 2019-06-20 芝浦メカトロニクス株式会社 有機膜形成装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002195755A (ja) * 2000-10-16 2002-07-10 Matsushita Electric Ind Co Ltd 熱処理装置
JP2006170534A (ja) * 2004-12-16 2006-06-29 Seiko Epson Corp 被加熱体の加熱方法、加熱炉、及びデバイスの製造方法
CN102633442B (zh) * 2012-04-19 2015-12-09 深圳市华星光电技术有限公司 温控针支撑基板进行配向膜预干燥的装置及方法
JP6240440B2 (ja) * 2013-08-30 2017-11-29 東京応化工業株式会社 チャンバー装置及び加熱方法
JP6773019B2 (ja) 2017-12-27 2020-10-21 京セラドキュメントソリューションズ株式会社 画像形成装置
KR102226624B1 (ko) * 2018-03-30 2021-03-12 시바우라 메카트로닉스 가부시끼가이샤 유기막 형성 장치, 및 유기막의 제조 방법
CN110391132B (zh) * 2018-04-16 2023-05-16 芝浦机械电子株式会社 有机膜形成装置
JP6940541B2 (ja) * 2018-04-16 2021-09-29 芝浦メカトロニクス株式会社 有機膜形成装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10112437A (ja) * 1996-10-04 1998-04-28 Hitachi Ltd 半導体基板処理装置
WO2019117250A1 (ja) * 2017-12-15 2019-06-20 芝浦メカトロニクス株式会社 有機膜形成装置

Also Published As

Publication number Publication date
CN115672686A (zh) 2023-02-03
TW202305992A (zh) 2023-02-01
KR20230018314A (ko) 2023-02-07
JP2023019295A (ja) 2023-02-09
CN115672686B (zh) 2024-06-11
JP7366086B2 (ja) 2023-10-20

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