TWI794427B - 半導體裝置及其調整方法 - Google Patents
半導體裝置及其調整方法 Download PDFInfo
- Publication number
- TWI794427B TWI794427B TW108107120A TW108107120A TWI794427B TW I794427 B TWI794427 B TW I794427B TW 108107120 A TW108107120 A TW 108107120A TW 108107120 A TW108107120 A TW 108107120A TW I794427 B TWI794427 B TW I794427B
- Authority
- TW
- Taiwan
- Prior art keywords
- hall element
- vertical hall
- power supply
- current
- output
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/077—Vertical Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
- G01R33/0029—Treating the measured signals, e.g. removing offset or noise
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0052—Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/072—Constructional adaptation of the sensor to specific applications
- G01R33/075—Hall devices configured for spinning current measurements
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/101—Semiconductor Hall-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/80—Constructional details
- H10N52/85—Magnetic active materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018046888 | 2018-03-14 | ||
JP2018-046888 | 2018-03-14 | ||
JP2018230554A JP7239308B2 (ja) | 2018-03-14 | 2018-12-10 | 半導体装置及びその調整方法 |
JP2018-230554 | 2018-12-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201945752A TW201945752A (zh) | 2019-12-01 |
TWI794427B true TWI794427B (zh) | 2023-03-01 |
Family
ID=68064770
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108107120A TWI794427B (zh) | 2018-03-14 | 2019-03-04 | 半導體裝置及其調整方法 |
Country Status (3)
Country | Link |
---|---|
JP (2) | JP7239308B2 (ja) |
KR (2) | KR102632662B1 (ja) |
TW (1) | TWI794427B (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130342194A1 (en) * | 2012-06-22 | 2013-12-26 | Infineon Technologies Ag | Vertical hall sensor with series-connected hall effect regions |
US20140210461A1 (en) * | 2013-01-29 | 2014-07-31 | Infineon Technologies Ag | Vertical hall device with highly conductive opposite face node for electrically connecting first and second hall effect regions |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS582084A (ja) * | 1981-06-26 | 1983-01-07 | Toshiba Corp | ホ−ル素子装置 |
DE10150955C1 (de) | 2001-10-16 | 2003-06-12 | Fraunhofer Ges Forschung | Vertikaler Hall-Sensor |
JP2008008883A (ja) | 2006-06-02 | 2008-01-17 | Denso Corp | 磁気センサ及びセンサ |
CH699933A1 (de) | 2008-11-28 | 2010-05-31 | Melexis Technologies Sa | Vertikaler Hallsensor. |
CN102820860A (zh) | 2012-07-26 | 2012-12-12 | 上海新进半导体制造有限公司 | 霍尔电压传感器、放大器电路、测试电路及方法 |
JP5507744B2 (ja) | 2013-07-09 | 2014-05-28 | 旭化成エレクトロニクス株式会社 | ホール起電力検出装置および回転角度検出装置 |
JP2015078949A (ja) | 2013-10-18 | 2015-04-23 | 旭化成エレクトロニクス株式会社 | ホール起電力信号検出回路 |
JP6418965B2 (ja) | 2015-01-28 | 2018-11-07 | 日置電機株式会社 | ホール素子駆動回路およびセンサ回路 |
JP6618370B2 (ja) | 2015-03-05 | 2019-12-11 | エイブリック株式会社 | 磁気センサ回路 |
-
2018
- 2018-12-10 JP JP2018230554A patent/JP7239308B2/ja active Active
-
2019
- 2019-03-04 TW TW108107120A patent/TWI794427B/zh active
- 2019-03-13 KR KR1020190028888A patent/KR102632662B1/ko active IP Right Grant
-
2022
- 2022-12-20 JP JP2022202919A patent/JP7466617B2/ja active Active
-
2023
- 2023-08-02 KR KR1020230100957A patent/KR20230119084A/ko not_active Application Discontinuation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130342194A1 (en) * | 2012-06-22 | 2013-12-26 | Infineon Technologies Ag | Vertical hall sensor with series-connected hall effect regions |
US20140210461A1 (en) * | 2013-01-29 | 2014-07-31 | Infineon Technologies Ag | Vertical hall device with highly conductive opposite face node for electrically connecting first and second hall effect regions |
Also Published As
Publication number | Publication date |
---|---|
JP7466617B2 (ja) | 2024-04-12 |
JP2023029390A (ja) | 2023-03-03 |
KR20190108513A (ko) | 2019-09-24 |
JP2019164117A (ja) | 2019-09-26 |
JP7239308B2 (ja) | 2023-03-14 |
KR102632662B1 (ko) | 2024-02-01 |
KR20230119084A (ko) | 2023-08-16 |
TW201945752A (zh) | 2019-12-01 |
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