TWI755467B - 研磨用組合物 - Google Patents
研磨用組合物 Download PDFInfo
- Publication number
- TWI755467B TWI755467B TW106146202A TW106146202A TWI755467B TW I755467 B TWI755467 B TW I755467B TW 106146202 A TW106146202 A TW 106146202A TW 106146202 A TW106146202 A TW 106146202A TW I755467 B TWI755467 B TW I755467B
- Authority
- TW
- Taiwan
- Prior art keywords
- water
- polishing
- polishing composition
- soluble
- soluble polymers
- Prior art date
Links
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016255099 | 2016-12-28 | ||
JP2016-255099 | 2016-12-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201829717A TW201829717A (zh) | 2018-08-16 |
TWI755467B true TWI755467B (zh) | 2022-02-21 |
Family
ID=62709419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106146202A TWI755467B (zh) | 2016-12-28 | 2017-12-28 | 研磨用組合物 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7077236B2 (ja) |
KR (1) | KR20190098142A (ja) |
CN (1) | CN110036086B (ja) |
TW (1) | TWI755467B (ja) |
WO (1) | WO2018124230A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020035870A (ja) * | 2018-08-29 | 2020-03-05 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
CN111378379B (zh) * | 2018-12-29 | 2022-08-05 | 安集微电子(上海)有限公司 | 一种化学机械抛光液及其应用 |
JP7433042B2 (ja) * | 2019-12-24 | 2024-02-19 | ニッタ・デュポン株式会社 | 研磨用組成物 |
JP2022155523A (ja) | 2021-03-30 | 2022-10-13 | 株式会社フジミインコーポレーテッド | 研磨用組成物、及び窒化ケイ素を選択的に除去する方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200914596A (en) * | 2007-09-28 | 2009-04-01 | Nitta Haas Inc | Polishing composition |
TW201615797A (zh) * | 2014-09-05 | 2016-05-01 | 卡博特微電子公司 | 漿液組合物、清洗組合物、基板拋光方法及清洗方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7524347B2 (en) * | 2004-10-28 | 2009-04-28 | Cabot Microelectronics Corporation | CMP composition comprising surfactant |
FR2917440B1 (fr) * | 2007-06-12 | 2010-09-24 | Comptoir Hydro Electro Thermiq | Cabine modulaire pour fumeurs et espaces fumeurs modulables resultant de l'assemblage de telles cabines. |
JP5371416B2 (ja) | 2008-12-25 | 2013-12-18 | 富士フイルム株式会社 | 研磨液及び研磨方法 |
JP2015205348A (ja) * | 2012-08-30 | 2015-11-19 | 日立化成株式会社 | 研磨剤、研磨剤セット及び基体の研磨方法 |
CN104603227B (zh) * | 2012-08-31 | 2017-03-08 | 福吉米株式会社 | 研磨用组合物和基板的制造方法 |
EP2826827B1 (en) * | 2013-07-18 | 2019-06-12 | Basf Se | CMP composition comprising abrasive particles containing ceria |
-
2017
- 2017-12-27 KR KR1020197017169A patent/KR20190098142A/ko not_active Application Discontinuation
- 2017-12-27 CN CN201780075054.6A patent/CN110036086B/zh active Active
- 2017-12-27 WO PCT/JP2017/047089 patent/WO2018124230A1/ja active Application Filing
- 2017-12-27 JP JP2018559610A patent/JP7077236B2/ja active Active
- 2017-12-28 TW TW106146202A patent/TWI755467B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200914596A (en) * | 2007-09-28 | 2009-04-01 | Nitta Haas Inc | Polishing composition |
TW201615797A (zh) * | 2014-09-05 | 2016-05-01 | 卡博特微電子公司 | 漿液組合物、清洗組合物、基板拋光方法及清洗方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20190098142A (ko) | 2019-08-21 |
CN110036086B (zh) | 2022-04-26 |
TW201829717A (zh) | 2018-08-16 |
WO2018124230A1 (ja) | 2018-07-05 |
JP7077236B2 (ja) | 2022-05-30 |
JPWO2018124230A1 (ja) | 2019-10-31 |
CN110036086A (zh) | 2019-07-19 |
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