TWI743449B - 單晶微波積體電路(mmic)冷卻結構 - Google Patents
單晶微波積體電路(mmic)冷卻結構 Download PDFInfo
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- TWI743449B TWI743449B TW108105616A TW108105616A TWI743449B TW I743449 B TWI743449 B TW I743449B TW 108105616 A TW108105616 A TW 108105616A TW 108105616 A TW108105616 A TW 108105616A TW I743449 B TWI743449 B TW I743449B
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Abstract
一種冷卻結構具有發熱電組件;散熱器,包括熱異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,發熱電組件之一表面被熱耦合至該散熱器,該所欲平面與該發熱電組件之該表面相交;及熱傳導基底,具有被熱耦合至該散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。
Description
本發明整體而言係關於單晶微波積體電路(Monolithic Microwave Integrated Circuit, MMIC)冷卻結構。
如此項技術中已知的,被使用來冷卻單晶微波積體電路(以下稱”MMIC”)的一種技術包含基板(諸如砷化鎵、氮化鎵、矽或碳化矽),其具有:主動發熱裝置(諸如電晶體),其形成在基板之上表面的半導體區域中;及被動裝置(諸如傳輸線、電阻器、電感器及電容器),其形成在基板之上表面上。MMIC基板之底部表面被接合且熱耦合至高熱傳導結構,諸如封裝基底/冷板,如在圖1A至1C中所展示的,其中MMIC(晶粒)被附接至熱傳導結構之頂部平坦表面,該平坦表面通常略大於該MMIC。在某些情況下,該MMIC使用熱介面材料(TIM)(諸如焊料)來直接地被固定(接合)至具有基底/冷板的熱傳導結構,如在圖1A中所展示的;然而,因為該MMIC及其他電路之表面處於大致上不同的水平,將該MMIC連接至這樣的電路元件,如例如藉由接合線,會產生不希望的射頻(RF)耦合、阻抗控制或高電感的問題。此外,將該MMIC直接地附接至封裝基底可能由於在該MMIC中所產生的高熱通量而不具有熱效率或可能限制重工選項。
另一種技術,如在圖1B中所展示的,其用以附接MMIC且附接具有如在圖1B中所展示的封裝基底/冷板配置的熱傳導結構。該技術允許重工且可調整熱傳導結構高度以改善MMIC與其他電路元件之間的平面性;然而,由於該MMIC與封裝基底之間的厚度增加以及由於增加的熱介面材料(TIM),此種配置可在某些配置中增加熱電阻。還有另一種技術,如在圖1C中所展示的,其提供單獨的冷板且將帶有附接的熱傳導結構之該MMIC安裝至封裝基底上,且接著將其附接至單獨的冷板上;然而會產生額外的熱介面電阻。
如此項熱裂解石墨片(PGS)技術中亦已知的,石墨已被使用為熱傳導結構,如在圖1D中所展示的。在此,該PGS石墨被安置在散熱片或冷板與熱源之間;該散熱片及熱源皆與PGS石墨熱耦合。該PGS石墨具有異向性熱傳導性質,用於在該PGS石墨之基面中來將熱量傳導通過。在此,基面被安置在平行於熱源之平坦上表面的平面中,該PGS石墨被附接在該平面上;意即,該PGS石墨之基面平行於熱源之上表面及散熱片之底部表面;因此,熱流通過PGS石墨的所欲方向係異向性熱傳導性質,用於沿著平行於熱源之上表面及散熱片之底部表面的方向來將熱量傳導通過。亦參見在2017年12月4日所發布的美國專利編號第7,303,005號,發明人係Reis等人。亦參見美國專利申請案公開第U.S 2003/0116312 A1號,公開日期為2003年6月26日。
如此項技術中已知的,經常使用諸如金剛石的超高導熱率熱傳導結構;然而,這些熱傳導結構係昂貴的且金剛石的低熱膨脹會在介面材料上產生不希望的機械應變及/或需要較低的熱執行應力吸收材料來處理從金剛石至通常較高膨脹的陶瓷(諸如在裝置側上的Si或SiC);及用於熱傳導基底的金屬(諸如銅或鋁)的熱膨脹失配。
依照本發明,提供了一種MMIC冷卻結構,包括:MMIC;散熱器,包括異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,該MMIC之該底部表面被熱耦合至該散熱器,該所欲平面與該MMIC之該底部表面相交;及熱傳導基底,具有被熱耦合至該散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。
在一實施例中,提供一種MMIC冷卻結構,包括:具有上表面及相對的底部表面的MMIC;散熱器,包括異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,該MMIC之該底部表面被熱耦合至該散熱器,此底部表面與該所欲平面相交;及熱傳導基底,具有被熱耦合至該散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。
在一實施例中,該冷卻結構包含第二MMIC,該第二MMIC具有熱耦合至該散熱器的表面,該所欲平面與該第二MMIC之該表面相交。
在一實施例中,該熱異向性材料被囊封在熱傳導材料內。
在一實施例中,該散熱器被埋設至該熱傳導基底之表面中。
在一實施例中,該散熱器具有基面,且其中該所欲平面位於該基面中。
在一實施例中,複數個主動發熱裝置位於該上表面中,此複數個主動發熱裝置被安置成一條直線,此直線與該所欲平面相交。
在一實施例中,該熱異向性材料通過該熱異向性材料外部的接合材料被接合至熱傳導囊封材料。
在一實施例中,該熱異向性材料被熱壓縮接合至熱傳導囊封材料。
在一實施例中,提供了一種MMIC冷卻結構,包括:MMIC;具有異向性熱傳導性質之散熱器,用於將熱沿著所欲平面傳導通過,該MMIC之底部表面藉由熱介面材料之第一層而被接合至該散熱器之上表面,該散熱器之該傳導性質用於將熱沿著與該MMIC之該底部表面相交之所欲平面傳導通過;及具有等向性熱傳導性質之熱傳導基底,該熱傳導基底在上表面中具有腔穴,其中,與該散熱器之該上表面不同的該散熱器的表面藉由熱介面材料之第二層被接合至該熱傳導基底之該腔穴的側壁表面上。
利用此種配置,該熱異向性高傳導性材料與封裝材料一起形成該散熱器,具有熱傳導性質,以最大化從該熱產生MMIC至該散熱片或該冷板中的熱傳遞。該囊封材料的機械性質,通常是該熱膨脹係數的機械性質,亦可藉由在任何給定實施例中選擇較佳的囊封材料或各種囊封材料來定制,以最小化在該MMIC冷卻結構中的熱應力及/或用於其整合至下一個更高的總成中。至於該熱異向性高傳導性材料,該高熱傳導基面被定向成不平行於該MMIC之該表面,而是被定向在與該MMIC之該表面相交的平面中。利用此種MMIC冷卻配置,增加該散熱器厚度以最大化與該熱傳導基底的接觸面積。因此,熱傳遞傳導性之面積被大大地增加,而不會減小超出該近似MMIC晶粒尺寸切口之其他電路的表面積,且不增加額外的熱介面。其亦允許重工且維持該MMIC互連與該晶片外電路的平面性,以改善RF效能。
在附圖及以下說明中陳述本發明的一或多個實施例的細節。根據說明及圖式以及申請專利範圍,本發明之其他特徵、目的及優點將係顯而易見的。
現在參照圖2、圖3及圖4A至4C,係展示用於MMIC 12之MMIC冷卻結構10。MMIC 12係任何習知的MMIC,其具有:基板14(圖3),諸如砷化鎵、氮化鎵、矽或碳化矽;其具有裝置15,更具體而言,係主動發熱裝置,諸如由標記15a所表示的電晶體,被配置成用以形成功率放大器,形成在基板14之上表面16的半導體區域中;及被動裝置,諸如傳輸線、電阻器、電感器及電容器,形成在基板14之上表面16上,其中主動及被動裝置15與微波傳輸線(未圖示)互連,形成在MMIC 12之基板14的上表面16上。MMIC 12之基板14的平坦底部表面18具有可選的接地平面導體20,諸如金或銅,以為MMIC 12提供接地平面導體。MMIC 12之接地平面導體20或底部表面18被接合至冷卻結構10之平坦的上表面22(圖2),冷卻結構10具有第一層26的熱介面材料(TIM);在此例如係焊料層26或熱傳導黏著劑。因此,如在圖2中所展示的,MMIC 12之上表面16及下表面18以及可選的接地平面導體20被安置在X-Y平面中。如以上所述,MMIC基板14係例如砷化鎵、氮化鎵。與許多普通金屬相比,矽或碳化矽具有低熱膨脹係數(CTE)。例如,與銅金屬相比,碳化矽的CTE在室溫下接近2.8 PPM/°C(攝氏每度之百萬分之部分),銅金屬在室溫下接近18 PPM/°C。
冷卻結構10包含:散熱器24,以將要描述的方式熱接合至基底40,在此係冷板或散熱片。在此可以說,散熱器24,在此,在此實例中,係立方形塊,包含熱異向性材料28,在此例如熱裂解石墨,其具有基面,由虛線30表示,在此實例中被安置在Y-Z平面中,意即在此實例中,係垂直於熱異向性材料28之上表面32及底部表面34。因此,散熱器24具有異向性熱傳導性質,以用於將熱沿著所欲平面(基面30)傳導通過。在此,基面30與MMIC 12之底部表面18相交,且因此亦與可選的接地平面導體20相交;在此係以九十度角相交。應注意,儘管在此實例中,熱異向性材料28之上表面或頂部表面及下表面或底部表面32、34處於 X-Y平面中,但是基面30可處於X-Z平面中,或者,基面的一部分可處於Y-Z平面中,而另一部分可處在X-Z平面中。在圖3中注意到,複數個主動發熱裝置,在此係裝置15a,沿著線L來安置,此線L與基面30相交,在此係垂直於基面30,如圖所展示的。儘管在此主動裝置15a係垂直於基面30對準,但是應理解其他主動裝置的佈局係可能的,例如,主動裝置可全部平行於基面30或在平行或垂直以外的角度下,例如,相對於基面45度。
散熱器24包含熱傳導材料36,在此係例如金屬(諸如銅),以包住熱異向性材料28的所有六個外表面(頂部、底部及四個側邊)。更具體而言,熱異向性材料28之六個外表面係使用合適的焊接材料38焊接至熱傳導材料36上,在此例如CuSil,係由位於英國郵遞區號SL4 1LP,溫莎伯克希爾高街Quadrant 55-57的摩根先進材料(Morgan Advanced Materials)所銷售的72%銀與28%銅(±1%)的合金;一種主要用於真空焊接的共晶合金。在另一種附接方法中,在熱異向性材料28與熱傳導材料36之間不使用任何外部接合劑;例如,使用熱及壓力,諸如熱壓縮接合或例如熱等靜壓。因此,熱傳導材料36係使用於囊封熱異向性材料28的囊封材料,且在本文中有時亦被稱之為囊封材料36。
另外,所有六個外表面不必由相同的囊封材料36製成,尤其係材料36之頂部表面,其在圖2中具有安置在其上的TIM層26,且可以係與剩餘的五個側邊(底部及四個側邊)不同材料。在一實例中,囊封材料36之頂部表面(其上安置有TIM層26)可由高熱傳導性但低CTE的金屬所製成,諸如鎢(4 PPM/℃)、鉬(5.5 PPM/℃)、銅-鎢之合金(5-10 PPM/°C)、銅-鉬之合金(6-10 PPM/℃)或其他此類的材料。在另一實例中,材料36之頂部表面可由陶瓷製成,例如,氮化鋁(4.5 PPM/℃)或氮化矽(3.5 PPM/℃),或其他,其亦具有高的熱傳導性及較低CTE的。在如此做時,與諸如銅(18 PPM/℃)的金屬相比,附接表面,意即,囊封材料36之頂部表面具有較低的CTE。由於MMIC基板14由例如具有較低CTE(2.8 PPM/℃)的碳化矽所製成,因此在囊封材料36之頂部表面上使用具有低CTE材料的高熱傳導性提供了良好的熱傳輸,係在MMIC基板14與下面的散熱器結構24之間具有改進的CTE匹配的傳輸。由此實現的MMIC 12與下面的散熱器結構24之間的更高程度的CTE匹配減少了當冷卻結構10在操作期間被曝露於溫度偏移時在MMIC 12與主動及被動裝置15a中的熱致應力。因此,改進的CTE匹配藉由降低熱致應力來改善冷卻結構10之機械可靠性。由此實現的更好程度的CTE匹配亦有助於增加得以被使用於TIM層26的材料的選擇,因為降低了TIM層26的應力。此進一步改善了從MMIC 12通過TIM層26至基底或冷板40中的熱傳遞。例如,若MMIC 12與散熱器24之頂部表面之間的CTE失配,更具體而言係囊裝材料36之頂部表面較高,僅有某種類型的材料可被使用於TIM層26,因為被安置在MMIC 12與散熱器24之囊封材料的頂部表面36之間,其等現在將受到更高的熱致應力。藉由MMIC 12與散熱器24之間更好的CTE匹配,變得得以選擇更多數量的更高熱執行TIM材料26。在此實例中,囊封的剩餘五個側邊、四個側邊及底部,可以由銅(18 PPM/°C)所製成的,且可與銅基底40完美地CTE匹配。因此,藉由採用囊封材料而不是單一材料的組合,在散佈器的所有側邊上實現改進的CTE匹配。根據給定應用的CTE匹配及熱傳遞需求,亦可對剩餘的五個側邊中的全部或一些採用不同的材料。因此,如上文所述,六個囊封側邊中的全部或任一者可由金屬或非金屬所製成。
如上文所述,冷卻結構10包含熱傳導基底,在此係冷板40。基底或冷板40在此具有等向性熱傳導性質的銅。如圖所展示的,基底40具有形成在上表面或頂部表面44中的凹部或腔穴42。如上文所述,在此實例中,散熱器24係立方體。因此,腔穴42形成有安置在X-Y平面中的底部表面46及安置在X-Z平面中的第一對相對的側邊表面47A、47B以及安置在Y-Z平面中的第二對相對的側邊表面47C、47D,如圖所展示的。因此,散熱器24之底部部分被埋設至熱傳導基底40中之腔穴42的上表面46中,如圖所展示的。應注意,側邊表面47A、47B在此垂直於基面30,如在圖4A及4C中更清楚地展示的。
如上文所述,異向性材料28之底部表面34(在此實例中,亦安置在X-Y平面中)在此係安置在平坦表面上且與之接合,在此係金屬包覆表面36A。如上文所述,此接合可使用外用劑38,例如CuSiL合金,或可利用熱壓縮促進附接。金屬包覆表面36B形成散熱器24之最底部表面,被安置在腔穴42之平面上表面或頂部表面46上且與之接合。更具體而言,散熱器24之底部表面36B係使用熱介面材料48(在此,係例如焊料)被接合至腔穴42之表面46上。因此,在此,熱異向性材料28被安置在熱傳導外殼或基底40內,在此例如係熱異向性材料,在此例如係金屬(諸如銅)。熱傳導基底40在基底40之上表面44中具有腔穴42,其中散熱器24之四個側邊的下部部分被接合至熱傳導基底40內的腔穴42的四個側邊47A、47B、47C及47D,熱傳導基底40具有第二層48的熱介面材料,在此例如係焊料。
換句話說,散熱器24之所有四個側邊分別地被接合至腔穴42之所有四個側邊47A、47B、47C及47D,且散熱器之底部表面36B係使用熱介面材料48(在此係例如焊料)被接合至腔穴42之頂部表面46。如上文所述,根據MMIC基板14之CTE且根據基底40之CTE來選擇在所有六個囊封側邊上的熱傳導囊封材料的CTE,以在MMIC 12之操作期間減少熱致機械應力,而不是在冷卻結構10之溫度上的變化。
現在亦參照圖5A至5E,熱流從熱源(在此係MMIC 12)至上文結合圖2、3及4A至4C來描述的MMIC冷卻結構10之基底或散熱片40的方向由箭頭來展示。如上文所述,側邊表面47A、47B在此垂直於基面30,如在圖4A及4C中更清楚地展示的。在圖5C中注意到,從MMIC12流至基底40的熱量係位於基面30中,且更具體而言,係流向與基面30垂直之基底40的側邊47A、47B,且因此側邊表面47A、47B被安置在與基面30相交的平面中;該熱流的所欲平面。
參照圖6,上文結合圖2、3及4A至4C來描述的MMIC冷卻結構10包含引線接合至MMIC 12之上表面上的裝置之電路50,如圖所展示的。值得注意的是,通常電路50不會散佈與MMIC一樣多的熱通量,因此其不需要散熱器,諸如像散熱器24。
現在參考圖7、7A至7C,其中展示MMIC冷卻結構10’之另一實施例。在此,結構10’被配置成用以冷卻一對MMIC 12a、12b;;MMIC 12a具有熱耦合至散熱器24之上表面之基板14a的底部表面18a,而MMIC 12b具有熱耦合至散熱器24之底部表面之基板14b的底部表面18b。注意到在此基底40a與上文所描述的基底40的材料相同,不同之處在於,基底40a不具有作為基底40的腔穴,而是具有熱接合至散熱器24之四個外側邊的四個側邊47A、47B、47C、47D,如圖所展示的。如上文所述,側邊表面47A、47B在此同樣垂直於基面30,如在圖7A及7C中更清楚地展示的。在圖7C中注意到,從MMIC 12a、12b兩者流至基底40a的熱量係位於基面30中,且更具體而言,係流向與基面30垂直之基底40a的側邊47A、47B,且因此側邊表面47A、47B被安置在與基面30相交的平面中;該熱流的所欲平面。因此,MMIC 12a與12b皆具有熱耦合至散熱器24的底部表面18a、18b,在此係散熱器24之相對表面,其中所欲平面(基面30)與MMIC 12a與12b兩者之底部表面相交。
參照圖8,上文結合圖7、7A至7C來描述的MMIC冷卻結構10’包含分別地引線接合至MMIC 12a、12b之上表面上的裝置之電路50a、50b,如圖所展示的。應注意,在此的基底40b與圖7中的基底40a的材料係相同的,除了冷卻劑流動通道54已經加工至圖7的基底40a中之外,基底40b成為能夠散熱的冷板,而不依賴於通過冷卻劑流動來移除熱量的外部添加裝置,例如,外部冷卻歧管。應注意,在圖8中所展示的冷卻系統可藉由各種安裝配置中的任一種被安裝在底盤內,諸如,例如,在機架安裝配置中垂直地安裝。
現在應理解,依照本發明之冷卻結構包含:發熱電組件;散熱器,包括熱異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,發熱電組件之一表面被熱耦合至散熱器,該所欲平面與發熱電組件之表面相交;及熱傳導基底,具有被熱耦合至散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。該冷卻結構可單獨地或組合地包含以下特徵中之一或多個,以包含:第二發熱電組件,該第二發熱電組件之一表面被熱耦合至該散熱器,該所欲平面與該第二發熱電組件之該第二表面相交;其中,該熱異向性材料被囊封在熱傳導材料中;其中,該熱異向性材料包含熱傳導接合層,用於將該熱異向性材料接合至熱傳導囊封材料;其中,該熱異向性材料利用溫度及壓力而被接合至熱傳導囊封材料;其中,該熱傳導囊封材料包括具有依照該發熱電組件之基板之熱膨脹係數而選擇之熱膨脹係數之材料;其中,該熱傳導囊封材料包括材料,該材料具有依照該熱傳導基底之熱膨脹係數而選擇之熱膨脹係數;其中,該熱傳導基底包括熱等向性材料;其中,該散熱器被埋設於該熱傳導基底之一表面中;其包含用於將該散熱器接合至該基底之熱介面層;其中,該散熱器具有基面,且其中,該所欲平面係在該基面中;其中,該發熱電組件係MMIC;第二MMIC,該MMIC之一表面被熱耦合至該散熱器,該所欲平面與該第二發熱電組件之該第二表面相交;其中,該熱異向性材料被囊封在熱傳導材料中;其中,該熱異向性材料包含熱傳導接合層,用於將該熱異向性材料接合至熱傳導囊封材料;其中,該熱異向性材料利用溫度及壓力而被接合至熱傳導囊封材料;其中,該熱傳導囊封材料包括具有依照該發熱電組件之基板之熱膨脹係數而選擇之熱膨脹係數之材料;其中,該熱傳導囊封材料包括具有依照該熱傳導基底之熱膨脹係數而選擇之熱膨脹係數之材料;其中,該熱傳導基底包括熱等向性材料;或其中,該散熱器被埋設於該熱傳導基底之一表面中;其包含用於將該散熱器接合至該基底之熱介面層。
現在亦應理解,依照本發明之冷卻結構包含:發熱電組件;具有異向性熱傳導性質之散熱器,用於將熱沿著所欲平面傳導通過,該發熱電組件之一表面藉由熱介面材料之第一層而被接合至該散熱器之上表面,該傳導性質用於將熱沿著與該發熱電組件之該表面相交之該所欲平面傳導通過;及熱傳導基底,其具有等向性熱傳導性質,該熱傳導基底具有熱耦合至該散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。該冷卻結構可單獨地或組合地包含該以下特徵中之一或多個,以包含:在該上表面中之複數個主動、發熱裝置,此複數個主動、發熱裝置被安置成沿著一直線,此直線與該所欲平面相交;或第二發熱電組件,該第二發熱電組件之一表面被熱耦合至該散熱器,該所欲平面與該第二發熱電組件之該第二表面相交;其中,該發熱電組件係MMIC;在該上表面中之複數個主動、發熱裝置,此複數個主動、發熱裝置被安置成沿著一直線,此直線與該所欲平面相交;或第二發熱電組件,該第二發熱電組件之一表面被熱耦合至該散熱器,該所欲平面與該第二發熱電組件之該第二表面相交。
現在亦應理解,依照本發明之冷卻結構包含:發熱電組件;具有異向性熱傳導性質之散熱器,用於將熱沿著所欲平面傳導通過,該發熱電組件之一表面藉由熱介面材料之第一層而被接合至該散熱器之上表面,該傳導性質用於將熱沿著與該發熱電組件之該表面相交之該所欲平面傳導通過;及熱傳導基底,其具有等向性熱傳導性質,該熱傳導基底具有位於上表面中之腔穴,其中,與該散熱器之該上表面不同之該散熱器之表面係藉由熱介面材料之第二層而被接合至該熱傳導基底之該腔穴的側壁表面。該冷卻結構可包含該特徵,其中,該發熱電組件係MMIC。
現在亦應理解,依照本發明之冷卻結構包含:發熱電組件;具有異向性熱傳導性質之散熱器,用於將熱沿著所欲平面傳導通過,該發熱電組件之一表面藉由熱介面材料之第一層而被接合至該散熱器之上表面,該傳導性質用於將熱沿著與該發熱電組件之該表面相交之該所欲平面傳導通過;及熱傳導基底,其具有等向性熱傳導性質,該基底具有位於上表面中之開口,其中,與該散熱器之上表面不同之該散熱器之表面係藉由熱介面材料之第二層而被接合至該熱傳導基底之該開口的側壁表面。該冷卻結構可包含該特徵,其中,該發熱電組件係MMIC。
現在亦應理解,依照本發明之冷卻結構包含:發熱電組件,其具有上表面及相對的底部表面,該發熱電組件具有形成於該上表面中的主動、發熱裝置;散熱器,包括異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,該發熱電組件之該底部表面被熱耦合至與該發熱電組件之該表面相交之該散熱器所欲平面;及熱傳導基底,其具有熱耦合至該散熱器的側邊部分,該側邊部分被安置在與所欲平面相交的平面中。該冷卻結構可包含該特徵,其中,該發熱電組件係MMIC。
現在亦應理解,依照本發明之冷卻結構包含:發熱電組件;具有異向性熱傳導性質之散熱器,用於將熱沿著所欲平面傳導通過,該發熱電組件之一表面被接合至該散熱器之上表面,該熱傳導性質用於將熱沿著與該發熱電組件之該表面相交之該所欲平面傳導通過;及熱傳導基底,其具有等向性熱傳導性質,該基底具有位於上表面中之開口,其中,與該散熱器之上表面不同之該散熱器之表面係藉由熱介面材料之第二層而被接合至該熱傳導基底之該開口的側壁表面。該冷卻結構可單獨地或組合地包含以下特徵中之一或多個,以包含:熱介面層,其用於將該散熱器接合至該基底;或其中,該熱傳導基底包括整合的冷卻劑流動通道;其中,該發熱電組件係MMIC;熱介面層,其用於將該散熱器接合至該基底;或其中,該熱傳導基底包括整合的冷卻劑流動通道。
現在亦應理解,依照本發明之結構包含:三維、熱傳導支撐結構,具有複數個側邊;及一對發熱組件,被接合及熱耦合至該三維、熱傳導支撐結構之不同側邊。該結構可單獨地或組合地包含該以下特徵中之一或多個,以包含:其中,該三維、熱傳導支撐結構包括散熱器,該散熱器包括熱異向性材料,此材料具有異向性熱傳導性質用於將熱沿著所欲平面傳導通過,此所欲平面與發熱組件之該三維、熱傳導支撐結構對的不同側邊相交,或其中,該對發熱組件被接合至該傳導支撐結構之相對側邊。
已經描述了本發明的許多實施例。然而,將瞭解,可在不背離本發明之精神及範疇之情況下進行各種修改。例如,儘管在此散熱器24之底部部分係方形的,但其可以係錐形的,或可以係在X-Y平面中具有方形或矩形表面的不同幾何形狀;或例如,包含五邊形、六邊形或八邊形的任何不規則封閉形式的圓形或橢圓形。
因此,其他實施例落在以下申請專利範圍之範疇內。
10‧‧‧冷卻結構
12‧‧‧單晶微波積體電路(MMIC)
12a‧‧‧單晶微波積體電路(MMIC)
12b‧‧‧單晶微波積體電路(MMIC)
14‧‧‧基板
14a‧‧‧基板
14b‧‧‧基板
15‧‧‧裝置
15a‧‧‧裝置
16‧‧‧上表面
18‧‧‧底部表面
18a‧‧‧底部表面
18b‧‧‧底部表面
20‧‧‧接地平面導體
22‧‧‧上表面
24‧‧‧散熱器
28‧‧‧熱異向性材料
30‧‧‧基面
32‧‧‧上表面
34‧‧‧底部表面
36‧‧‧熱傳導材料
36B‧‧‧金屬包覆表面
38‧‧‧焊接材料
40‧‧‧冷板
40a‧‧‧基底
40b‧‧‧基底
42‧‧‧腔穴
44‧‧‧頂部表面
46‧‧‧底部表面
47A‧‧‧側邊表面
47B‧‧‧側邊表面
47C‧‧‧側邊表面
47D‧‧‧側邊表面
48‧‧‧熱介面材料
50‧‧‧電路
50a‧‧‧電路
50b‧‧‧電路
54‧‧‧冷卻劑流動通道
圖1A至1C係依照現有技術之MMIC冷卻結構的橫截面示意概要圖;
圖1D係依照現有技術之使用熱裂解石墨片(PGS)石墨散熱器之冷卻系統的橫截面示意概要圖;
圖2係依照本發明之用於冷卻MMIC之冷卻結構的分解立體示意概要圖,其中其之若干元件的一部分被部分地剖開以展示這些元件之底部表面的部分;
圖3係依照本發明之圖2之MMIC冷卻結構之組裝的立體橫截面示意概要圖;
圖4A、4B及4C係依照本發明之圖2之MMIC冷卻結構的頂部及側部橫截面視圖;
圖5A至5E係熱流的示意圖,由箭頭表示,其中在圖5B中之符號「X」指示來自熱源(諸如MMIC)之熱流通過依照本發明之圖2之MMIC冷卻結構進入在圖5B中之紙面的平面中;圖5A係圖2之冷卻結構的立體圖;圖5B係在圖2之冷卻結構的X-Y平面中的俯視圖;圖5C及5D係在分別地通過在圖2之冷卻結構之圖5A中之線5C-5C及5D-5D的Y-Z及X-Z平面中的橫截面視圖;及圖5E係圖2之冷卻結構的側視圖,此種側視圖係沿著與圖5A中之Y軸線平行的方向;
圖6係依照本發明之圖2之MMIC冷卻結構之組裝的立體橫截面示意概要圖,其上安裝有附加電路且調適成用於連接至MMIC;
圖7係依照本發明之另一實施例之MMIC冷卻結構之組裝的立體橫截面示意概要圖,冷卻結構被調適成用以冷卻安裝至冷卻結構之相對側邊的一對MMIC;
圖7A、7B及7C係依照本發明之其他實施例之圖7之MMIC冷卻結構之頂部及側部橫截面視圖;
圖8係依照本發明之MMIC冷卻結構之組裝的立體橫截面示意概要圖,冷卻結構被調適成用以冷卻安裝至圖7之冷卻結構之相對側邊的一對MMIC,傳導基底具有整合的冷卻劑流動通道,以進一步促進從傳導基底(在此係冷板)來移除熱量。
在各種圖式中的相同參考符號是指示相同元件。
10‧‧‧冷卻結構
12‧‧‧單晶微波積體電路(MMIC)
15‧‧‧裝置
16‧‧‧上表面
18‧‧‧底部表面
20‧‧‧接地平面導體
22‧‧‧上表面
24‧‧‧散熱器
26‧‧‧TIM層
28‧‧‧熱異向性材料
30‧‧‧基面
32‧‧‧上表面
34‧‧‧底部表面
36‧‧‧熱傳導材料
36A‧‧‧金屬包覆表面
36B‧‧‧金屬包覆表面
38‧‧‧焊接材料
40‧‧‧冷板
42‧‧‧腔穴
44‧‧‧頂部表面
46‧‧‧底部表面
47A‧‧‧側邊表面
47B‧‧‧側邊表面
47C‧‧‧側邊表面
47D‧‧‧側邊表面
48‧‧‧熱介面材料
Claims (35)
- 一種冷卻結構,包括:第一發熱電組件;散熱器,其包括:熱異向性材料,用於沿著所欲平面傳導熱,該第一發熱電組件之一表面被設置於且熱耦合至該熱異向性材料之表面部位,該所欲平面與該發熱電組件之該表面相交;及熱傳導結構,囊封該熱異向性材料,熱傳導材料的內壁接合至並熱耦合至該熱異向性材料的外壁;及熱傳導基底,具有接合至並熱耦合至該熱傳導材料的外壁之側邊部分,該側邊部分被安置在與該所欲平面相交之平面上。
- 如申請專利範圍第1項之冷卻結構,其包含第二發熱電組件,其中該第一發熱電組件與該第二發熱電組件置於不同的、間隔的重疊平面上。
- 如申請專利範圍第1項之冷卻結構,其包含熱傳導接合層,用於將該熱異向性材料接合至同向性熱傳導囊封材料。
- 如申請專利範圍第1項之冷卻結構,其中,該熱異向 性材料利用溫度及壓力而被接合至熱傳導囊封材料。
- 如申請專利範圍第3項之冷卻結構,其中,該熱傳導囊封材料包括材料,該材料具有依照該發熱電組件之基板之熱膨脹係數而選擇之熱膨脹係數。
- 如申請專利範圍第3項之冷卻結構,其中,該熱傳導囊封材料包括材料,該材料具有依照該熱傳導基底之熱膨脹係數而選擇之熱膨脹係數。
- 如申請專利範圍第1項之冷卻結構,其中,該散熱器具有基面,且其中,該所欲平面係在該基面中。
- 如申請專利範圍第1項之冷卻結構,其中,該發熱電組件係MMIC(Monolithic Microwave Integrated Circuit,單晶微波積體電路)。
- 如申請專利範圍第8項之冷卻結構,包含第二MMIC,該MMIC之一表面被熱耦合至該散熱器,該所欲平面與該第二MMIC之該第二表面相交。
- 如申請專利範圍第8項之冷卻結構,其中,該熱異向性材料被囊封在熱傳導材料中。
- 如申請專利範圍第10項之冷卻結構,其中,該熱傳導材料包含熱傳導囊封材料,及熱傳導接合層,用於將該熱異向性材料接合至熱傳導囊封材料。
- 如申請專利範圍第10項之冷卻結構,其中,該熱傳導材料包含熱傳導囊封材料,且其中,該熱異向性材料利用溫度及壓力而被接合至熱傳導囊封材料。
- 如申請專利範圍第10項之冷卻結構,其中,該熱傳導囊封材料包括材料,該材料具有依照該發熱電組件之基板之熱膨脹係數而選擇之熱膨脹係數。
- 如申請專利範圍第10項之冷卻結構,其中,該熱傳導囊封材料包括材料,該材料具有依照該熱傳導基底之熱膨脹係數而選擇之熱膨脹係數。
- 如申請專利範圍第10項之冷卻結構,其中,該熱傳導基底包括熱等向性材料。
- 如申請專利範圍第8項之冷卻結構,其中,該散熱器被埋設於該熱傳導基底之一表面中。
- 如申請專利範圍第16項之冷卻結構,其包含用於將該散熱器接合至該基底之熱介面層。
- 如申請專利範圍第10項之冷卻結構,其中,該散熱器具有基面,且其中,該所欲平面係在該基面中。
- 一種冷卻結構,包括:發熱電組件;散熱器,包括:熱異向性材料,用於沿著所欲平面傳導熱,該發熱電組件之一表面設置於、接合至該熱異向性材料之表面部位,該所欲平面與該發熱電組件之該表面相交;及中空的、熱傳導的囊封結構,該熱異向性材料設置於該囊封結構之複數壁內,該複數壁之一者通過該熱異向性材料之該表面部位接合至、熱耦合至該發熱電組件之底表面;及熱傳導基底,該熱傳導基底具有熱耦合至該該囊封結構之其它壁之側邊部分,該其它壁的材料不同於該囊封結構之該複數壁之第一者,該側邊部分被安置在與該所欲平面相交之平面上。
- 如申請專利範圍第19項之冷卻結構,其中,該發熱電組件係MMIC。
- 如申請專利範圍第19項之冷卻結構,包含在該上表面中之複數個主動、發熱裝置,此複數個主動、發熱裝置被 安置成沿著一直線,此直線與該所欲平面相交。
- 如申請專利範圍第19項之冷卻結構,包含第二發熱電組件,該第二發熱電組件之一表面被熱耦合至該散熱器,該所欲平面與該第二發熱電組件之該第二表面相交。
- 一種冷卻結構,包括:發熱電組件;散熱器,具有表面部位,其包括異向性熱傳導性質,用於沿著所欲平面通過該表面部位傳導熱,該發熱電組件之一表面藉由熱介面材料之第一層而被接合至該散熱器之該表面部位,該傳導性質用於沿著與該發熱電組件之表面相交之該所欲平面通過該表面部位傳導熱;具有等向性熱傳導性質之熱傳導基底,該基底在上表面中具有開口,其中,該散熱器之不同於該散熱器之該表面部位的一表面藉由熱介面材料之第二層而被接合至該熱傳導基底之該開口的側壁表面。
- 如申請專利範圍第23項之冷卻結構,其中,該發熱電組件係MMIC。
- 一種冷卻結構,包括:發熱電組件,具有上表面及相對的底部表面,該發熱電組件具有形成在該上表面中之主動、發熱裝置; 散熱器,具有表面部位,其包括異向性材料,此材料具有異向性熱傳導性質,用於沿著所欲平面通過該表面部位傳導熱,該發熱電組件之該底部表面被安置於且熱耦合至該發熱電組件,該所欲平面與該發熱電組件之底表面相交;及熱傳導基底,具有被熱耦合至該散熱器之側邊部分,該側邊部分被安置在與該所欲平面相交之平面中。
- 如申請專利範圍第25項之冷卻結構,其中,該發熱電組件係MMIC。
- 一種冷卻結構,包括:發熱電組件;散熱器,具有表面部位,其包括異向性熱傳導性質,用於沿著所欲平面通過該表面部位傳導熱,該發熱電組件之一表面被接合至該散熱器之上表面,該熱傳導性質用於沿著與該發熱電組件之該表面相交之該所欲平面傳導通過該表面部位傳導熱;具有等向性熱傳導性質之熱傳導基底,該基底在上表面中具有開口,其中,該散熱器之不同於該散熱器之該上表面的一表面藉由熱介面材料之第二層而被接合至該熱傳導基底之該開口的側壁表面。
- 如申請專利範圍第27項之冷卻結構,其包含用於將該 散熱器接合至該基底之熱介面層。
- 如申請專利範圍第27項之冷卻結構,其中,該熱傳導基底包括整合的冷卻劑流動通道。
- 如申請專利範圍第27項之冷卻結構,其中,該發熱電組件係MMIC。
- 如申請專利範圍第30項之冷卻結構,其包含用於將該散熱器接合至該基底之熱介面層。
- 如申請專利範圍第30項之冷卻結構,其中,該熱傳導基底包括整合的冷卻劑流動通道。
- 一種冷卻結構,包括:三維、熱傳導支撐結構,包括散熱器,該散熱器包括熱異向性材料,此材料具有用於沿著所欲平面通過該散熱器傳導熱的異向性熱傳導性質,該三維、熱傳導支撐結構具有第一複數個側邊,該第一複數個側邊沿著第一方向彼此相對,和第二複數個側邊,沿著不同於第一方向的第二方向彼此相對;及一對發熱組件,該對發熱組件之每一者被接合並熱耦合至該三維、熱傳導支撐結構之不同於該第一複數個側邊的側邊的外表面。
- 如申請專利範圍第33項之結構,其中,該熱異向性材料用於沿著所欲平面通過該散熱器傳導熱,此所欲平面與發熱組件之該第一複數個側邊相交,且朝向該三維、熱傳導支撐結構的該第二複數個側邊導向此熱。
- 如申請專利範圍第33項之結構,其中,該對發熱組件被接合至該傳導支撐結構之相對側邊。
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US15/935,622 | 2018-03-26 |
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JP2021516457A (ja) | 2021-07-01 |
US20190295918A1 (en) | 2019-09-26 |
CA3092084C (en) | 2023-03-07 |
WO2019190628A2 (en) | 2019-10-03 |
TW201946237A (zh) | 2019-12-01 |
JP7105981B2 (ja) | 2022-07-25 |
IL277585A (en) | 2020-11-30 |
EP3776649A2 (en) | 2021-02-17 |
MX2020009356A (es) | 2020-11-25 |
WO2019190628A3 (en) | 2020-01-09 |
CA3092084A1 (en) | 2019-10-03 |
IL277585B1 (en) | 2023-05-01 |
IL277585B2 (en) | 2023-09-01 |
KR102429675B1 (ko) | 2022-08-05 |
US11152279B2 (en) | 2021-10-19 |
KR20200135503A (ko) | 2020-12-02 |
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