TWI731860B - 物體保持裝置、曝光裝置、平板顯示器之製造方法、以及元件製造方法 - Google Patents
物體保持裝置、曝光裝置、平板顯示器之製造方法、以及元件製造方法 Download PDFInfo
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- TWI731860B TWI731860B TW105116840A TW105116840A TWI731860B TW I731860 B TWI731860 B TW I731860B TW 105116840 A TW105116840 A TW 105116840A TW 105116840 A TW105116840 A TW 105116840A TW I731860 B TWI731860 B TW I731860B
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- Plasma & Fusion (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015108843 | 2015-05-28 | ||
JPJP2015-108843 | 2015-05-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201703189A TW201703189A (zh) | 2017-01-16 |
TWI731860B true TWI731860B (zh) | 2021-07-01 |
Family
ID=57393889
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW105116840A TWI731860B (zh) | 2015-05-28 | 2016-05-27 | 物體保持裝置、曝光裝置、平板顯示器之製造方法、以及元件製造方法 |
Country Status (6)
Country | Link |
---|---|
JP (2) | JP6791132B2 (ko) |
KR (1) | KR102625921B1 (ko) |
CN (1) | CN107615169B (ko) |
HK (1) | HK1246869A1 (ko) |
TW (1) | TWI731860B (ko) |
WO (1) | WO2016190423A1 (ko) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018181913A1 (ja) * | 2017-03-31 | 2018-10-04 | 株式会社ニコン | 物体保持装置、処理装置、フラットパネルディスプレイの製造方法、デバイス製造方法、及び物体保持方法 |
JP7023620B2 (ja) * | 2017-05-30 | 2022-02-22 | 株式会社オーク製作所 | 露光装置及び基板載置方法 |
JP7105482B2 (ja) * | 2018-04-03 | 2022-07-25 | 株式会社ブイ・テクノロジー | 石定盤の温度調整装置およびそれを備えた検査装置 |
CN109384062B (zh) | 2018-09-19 | 2020-02-18 | 武汉华星光电技术有限公司 | 一种曝光机及其传送基板的方法 |
KR20200085533A (ko) * | 2019-01-07 | 2020-07-15 | 삼성전자주식회사 | 디스플레이 장치 및 디스플레이 장치 제조 방법 |
CN112936021B (zh) * | 2021-01-20 | 2022-11-18 | 大连理工大学 | 一种薄壁大口径非球面碳纤维复材高性能零件磨削装备 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201006752A (en) * | 2008-08-05 | 2010-02-16 | Olympus Corp | Substrate floating device |
JP2011225355A (ja) * | 2010-04-22 | 2011-11-10 | Sumitomo Heavy Ind Ltd | エア浮上ユニット、ステージ装置、検査システム、露光システム及び塗布システム |
TWI436403B (zh) * | 2004-10-26 | 2014-05-01 | 尼康股份有限公司 | A cleaning method, a substrate processing method, an exposure apparatus, and an element manufacturing method |
JP2014118221A (ja) * | 2012-12-13 | 2014-06-30 | Toray Eng Co Ltd | 基板浮上装置 |
TWI456360B (zh) * | 2007-11-29 | 2014-10-11 | Tokyo Electron Ltd | 基板處理系統及基板處理方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09278181A (ja) * | 1996-04-11 | 1997-10-28 | Canon Inc | ワーク搬送装置及び搬送方法 |
JP2004273702A (ja) | 2003-03-07 | 2004-09-30 | Nikon Corp | 搬送装置及び搬送方法、露光装置 |
JP4033841B2 (ja) * | 2004-02-12 | 2008-01-16 | 東京エレクトロン株式会社 | 浮上式基板搬送処理方法及びその装置 |
US8699001B2 (en) * | 2009-08-20 | 2014-04-15 | Nikon Corporation | Object moving apparatus, object processing apparatus, exposure apparatus, object inspecting apparatus and device manufacturing method |
KR101187006B1 (ko) * | 2012-04-24 | 2012-09-28 | 이재성 | 대면적 패널용 반송플레이트 |
KR101773494B1 (ko) * | 2013-02-26 | 2017-08-31 | 가부시키가이샤 아이에이치아이 | 반송 장치 |
JP2014218342A (ja) * | 2013-05-09 | 2014-11-20 | オイレス工業株式会社 | 支持用エアプレートおよびその気体流抵抗器 |
-
2016
- 2016-05-27 TW TW105116840A patent/TWI731860B/zh active
- 2016-05-27 WO PCT/JP2016/065774 patent/WO2016190423A1/ja active Application Filing
- 2016-05-27 KR KR1020177037083A patent/KR102625921B1/ko active IP Right Grant
- 2016-05-27 CN CN201680030014.5A patent/CN107615169B/zh active Active
- 2016-05-27 JP JP2017520816A patent/JP6791132B2/ja active Active
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2018
- 2018-05-10 HK HK18106068.4A patent/HK1246869A1/zh unknown
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2020
- 2020-11-04 JP JP2020184434A patent/JP2021039362A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI436403B (zh) * | 2004-10-26 | 2014-05-01 | 尼康股份有限公司 | A cleaning method, a substrate processing method, an exposure apparatus, and an element manufacturing method |
TWI456360B (zh) * | 2007-11-29 | 2014-10-11 | Tokyo Electron Ltd | 基板處理系統及基板處理方法 |
TW201006752A (en) * | 2008-08-05 | 2010-02-16 | Olympus Corp | Substrate floating device |
JP2011225355A (ja) * | 2010-04-22 | 2011-11-10 | Sumitomo Heavy Ind Ltd | エア浮上ユニット、ステージ装置、検査システム、露光システム及び塗布システム |
JP2014118221A (ja) * | 2012-12-13 | 2014-06-30 | Toray Eng Co Ltd | 基板浮上装置 |
Also Published As
Publication number | Publication date |
---|---|
CN107615169A (zh) | 2018-01-19 |
KR20180013996A (ko) | 2018-02-07 |
TW201703189A (zh) | 2017-01-16 |
CN107615169B (zh) | 2021-02-23 |
JPWO2016190423A1 (ja) | 2018-03-15 |
KR102625921B1 (ko) | 2024-01-16 |
JP2021039362A (ja) | 2021-03-11 |
HK1246869A1 (zh) | 2018-09-14 |
JP6791132B2 (ja) | 2020-11-25 |
WO2016190423A1 (ja) | 2016-12-01 |
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